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Статті в журналах з теми "Impedance metrology"

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Автор: Grafiati

Опубліковано: 14 березня 2023

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Agustoni, Marco, and Frederic Overney. "Impedance Metrology: Bridging the LF–RF Gap." IEEE Transactions on Instrumentation and Measurement 70 (2021): 1–8. http://dx.doi.org/10.1109/tim.2020.3036062.

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Overney, Frédéric, Nathan E. Flowers-Jacobs, Blaise Jeanneret, Alain Rüfenacht, Anna E. Fox, Paul D. Dresselhaus, and Samuel P. Benz. "Dual Josephson impedance bridge: towards a universal bridge for impedance metrology." Metrologia 57, no. 6 (October 22, 2020): 065014. http://dx.doi.org/10.1088/1681-7575/ab948d.

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Rouane, Amar, and Paul Bru. "High frequency metrology for intracardiac ablation: in-vivo results." Metrology and Measurement Systems 19, no. 3 (October 1, 2012): 603–10. http://dx.doi.org/10.2478/v10178-012-0053-4.

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Abstract Cardiac Radiofrequency (RF) ablation is a commonly used clinical procedure for treating many cardiac arrhythmias. However, the efficacy of RF ablation may be limited by two factors: small ventricular lesions and impedance rise, leading to coagulum formation and desiccation of tissue. In this paper, a high frequency (HF) energy ablation system operating at 27.12 MHz based on an automated load matching system was developed. A HF energy matched probe associated to the automated impedance matching device ensures optimal transfer of the energy to the load. The aim of this study was to evaluate this energy for catheter ablation of the atrioventricular junction. In vivo studies were performed using 10 sheep to characterize the lesions created with the impedance matching system. No cardiac perforation was noted. No thrombus was observed at the catheter tip. Acute lesions ranged from 3 to 45 mm in diameter (mean ±SD = 10.3±10) and from 1 to 15 mm in depth (6.7±3.9), exhibiting a close relationship between HF delivered power level and lesion size. Catheter ablation using HF current is feasible and appears effective in producing a stable AV block when applied at the AV junction and large myocardial lesions at ventricular sites.

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Callegaro, Luca, Francesca Durbiano, Elena Orru, and Bruno Trinchera. "An Impedance Spectrometer for the Metrology of Electrolytic Conductivity." IEEE Transactions on Instrumentation and Measurement 62, no. 6 (June 2013): 1766–70. http://dx.doi.org/10.1109/tim.2012.2230731.

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Gonzalez-Raya, Tasio, and Mikel Sanz. "Coplanar Antenna Design for Microwave Entangled Signals Propagating in Open Air." Quantum 6 (August 23, 2022): 783. http://dx.doi.org/10.22331/q-2022-08-23-783.

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Open-air microwave quantum communication and metrology protocols must be able to transfer quantum resources from a cryostat, where they are created, to an environment dominated by thermal noise. Indeed, the states carrying such quantum resources are generated in a cryostat characterized by a temperature Tin≃50 mK and an intrinsic impedance Zin=50Ω. Then, an antenna-like device is required to transfer them with minimal losses into open air, characterized by an intrinsic impedance of Zout=377Ω and a temperature Tout≃300 K. This device accomplishes a smooth impedance matching between the cryostat and the open air. Here, we study the transmission of two-mode squeezed thermal states, developing a technique to design the optimal shape of a coplanar antenna to preserve the entanglement. Based on a numerical optimization procedure, we find the optimal shape of the impedance, and we propose a functional ansatz to qualitatively describe this shape. Additionally, this study reveals that the reflectivity of the antenna is very sensitive to this shape, so that small changes dramatically affect the outcoming entanglement, which could have been a limitation in previous experiments employing commercial antennae. This work is relevant in the fields of microwave quantum sensing and quantum metrology with special application to the development of the quantum radar, as well as any open-air microwave quantum communication protocol.

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Callegaro, Luca. "The metrology of electrical impedance at high frequency: a review." Measurement Science and Technology 20, no. 2 (December 17, 2008): 022002. http://dx.doi.org/10.1088/0957-0233/20/2/022002.

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Musioł, Krzysztof. "Experimental Study of Digitizers Used in High-Precision Impedance Measurements." Energies 15, no. 11 (May 31, 2022): 4051. http://dx.doi.org/10.3390/en15114051.

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In the currently used primary impedance measuring systems, there is a need to compare standards with ratios different from 1:1, e.g., in order to transfer the value to multiples or submultiples of the basic quantity. Unfortunately, the commercial PXI sampling systems used to measure the voltage ratio in the impedance bridge, although they provide adequate resolution, show a considerable non-linearity of the measurement. This leads to significant error of the impedance ratio measurement. Experimental studies of commercial PXI digitizers used in primary impedance metrology are presented in the paper. The scope of the work includes presentation of the sampling measurement system hardware used in electronic synchronous impedance bridges and studies of the parameters that affect the applicability of PXI digitizers in high-precision measuring instruments. Nonlinearity errors of digitizers on boards NI PXI-4461 and NI PXI-4462 were measured and appropriate conclusions regarding possible corrections of the errors were drawn.

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Deleebeeck, Lisa, and Sune Veltzé. "Electrochemical impedance spectroscopy study of commercial Li‐ion phosphate batteries: A metrology perspective." International Journal of Energy Research 44, no. 9 (April 15, 2020): 7158–82. http://dx.doi.org/10.1002/er.5350.

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Amoah, Papa K., Christopher E. Sunday, Chukwudi Okoro, Jungjoon Ahn, Lin You, Dmitry Veksler, Joseph Kopanski, and Yaw Obeng. "(Invited) Towards the Physical Reliability of 3D-Integrated Systems: Broadband Dielectric Spectroscopic (BDS) Studies of Material Evolution and Reliability in Integrated Systems." ECS Meeting Abstracts MA2022-02, no. 17 (October 9, 2022): 859. http://dx.doi.org/10.1149/ma2022-0217859mtgabs.

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In this talk, we present an overview of our current research focus in developing non-destructive metrology for monitoring reliability issues in 3D-integrated electronic systems. Working closely with the semiconductor industry, we have been looking at various performance limiting phenomena in 3D-interconnects, the associated dielectrics, and advanced packaging for integrated circuits. The talk will identify some common reliability concerns, and identify some metrology gaps, for 3-D integrated systems. We will introduce a suite of microwave-based Broadband Dielectric Spectroscopic (BDS) techniques and show how these non-destructive metrologies can serve as early warning monitors for reliability issues. These techniques are based on the application of high frequency microwaves, to probe impedance changes due to material and structural changes in integrated circuits under various external stress. For example, we will also discuss the combination of BDS with scanning probe infrastructure to create the Scanning Microwave Microscopy (SMM) technique, which has been used to detect buried artifacts and characterize metallic contacts. We further illustrate the capabilities of the BDS-based techniques with case studies of three potential reliability issues in 3D IC. We conclude with a forward look at the future metrology and standards needs 3-D interconnects and the associated advanced packaging.

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Inglis, Barry D. "Arthur Melville Thompson 1917–2009." Historical Records of Australian Science 25, no. 2 (2014): 306. http://dx.doi.org/10.1071/hr14020.

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Arthur Melville (‘Mel') Thompson graduated from the University of Adelaide in 1938 with First Class Honours in Physics. After graduation he joined Australia's Council for Scientific and Industrial Research as one of the ‘founding fathers' of the National Standards Laboratory and embarked on a life-time career in metrology. His work in precision electrical measurement, ratio-arms transformer bridges and techniques for defining and measuring small capacitances is internationally renowned. He conceived the design of a calculable-capacitor, the Thompson-Lampard capacitor, which led to a new theorem in electrostatics and provided the basis for an absolute determination of the unit of resistance with an increase in accuracy of an order of magnitude. Beyond the calculable capacitor his work had a major impact in electrical impedance measurement in general and on other fields of metrology such as dilatometry and thermometry. Mel Thompson was an inspirational leader and his work facilitated the development of many scientific careers.

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Chae, Dong-Hun, Mattias Kruskopf, Jan Kucera, Jaesung Park, Ngoc Thanh Mai Tran, Dan Bee Kim, Klaus Pierz, et al. "Investigation of the stability of graphene devices for quantum resistance metrology at direct and alternating current." Measurement Science and Technology 33, no. 6 (March 9, 2022): 065012. http://dx.doi.org/10.1088/1361-6501/ac4a1a.

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Abstract Interlaboratory comparisons of the quantized Hall resistance (QHR) are essential to verify the international coherence of primary impedance standards. Here, we report on the investigation of the stability of p-doped graphene-based QHR devices at direct and alternating currents at CMI, KRISS, and PTB. To improve the stability of the electronic transport properties of the polymer-encapsulated devices, they were shipped in an over-pressurized transport chamber. The agreement of the quantized resistance with R K/2 at direct current was on the order of 1 nΩ Ω−1 between 3.5 and 7.5 T at a temperature of 4.2 K despite changes in the carrier density during the shipping of the devices. At alternating current, the quantized resistance was realized in a double-shielded graphene Hall device. Preliminary measurements with digital impedance bridges demonstrate the good reproducibility of the quantized resistance near the frequency of 1 kHz within 0.1 μΩ Ω−1 throughout the international delivery.

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Amoah, Papa K., Christopher E. Sunday, Chukwudi Okoro, Jungjoon Ahn, Lin You, Dmitry Veksler, Joseph Kopanski, and Yaw Obeng. "(Invited) Towards the Physical Reliability of 3D-Integrated Systems: Broadband Dielectric Spectroscopic (BDS) Studies of Material Evolution and Reliability in Integrated Systems." ECS Transactions 109, no. 2 (September 30, 2022): 41–49. http://dx.doi.org/10.1149/10902.0041ecst.

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In this paper, we present an overview of our current research focus in developing non-destructive metrology for monitoring reliability issues in 3D- integrated electronic systems. We introduce a suite of non-destructive metrologies that can serve as early warning monitors for reliability issues. These Broadband Dielectric Spectroscopic (BDS) techniques are based on the application of high frequency microwaves (up to 40 GHz) to devices under various external stress, to probe impedance changes due to material and structural changes in integrated circuits. We illustrate the capabilities of the techniques with four case studies of potential reliability issues in 3D-IC interconnects.

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Vasjanov, Aleksandr, and Vaidotas Barzdenas. "Reduced-Reflection Multilayer PCB Microstrip with Discontinuity Characterization." Electronics 9, no. 9 (September 9, 2020): 1473. http://dx.doi.org/10.3390/electronics9091473.

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In the era of technology and communication, printed circuit boards (PCBs) can be found in a myriad of devices—from ordinary household items, to state of the art custom metrology equipment. Different types of component for wireless communications are available and come in various packages, supplied by multiple manufacturers. The signal landpads for some high-frequency connectors and components, encapsulated in larger packages, are usually wider than the controlled impedance trace, thereby introducing unwanted impedance mismatch and resulting in signal reflections. The component land pad and microstrip width a discrepancy issue can be found in both complex high-density industrial devices and system-level academic research papers. This paper addresses the topic of compensating discontinuities, introduced by signal pads, which are wider than the target impedance microstrip, characterizes the difference between the compensated and uncompensated microstrip with discontinuity, and proposes a generalized guideline on compensating for the introduced impedance change in multilayer PCBs. The compensation method is based upon carefully designing the stackup of the PCB allowing for a reference plane cutout under the discontinuity to even out the impedance mismatch. A 6-layer PCB with IT180A dielectric material containing three structures has been manufactured and characterized using an Agilent E8363B vector network analyzer (VNA). A 4–12 dB improvement in S11 response in the whole frequency range up to 10 GHz, compared to that when no compensation has been applied, was observed.

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Horibe, M., and N. M. Ridler. "Comparison Between Two National Metrology Institutes of Diameters and Characteristic Impedance of Coaxial Air Lines." IEEE Transactions on Instrumentation and Measurement 58, no. 4 (April 2009): 1084–89. http://dx.doi.org/10.1109/tim.2008.2008465.

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Kampik, M., and K. Musioł. "Investigations of the high-performance source of digitally synthesized sinusoidal voltage for primary impedance metrology." Measurement 168 (January 2021): 108308. http://dx.doi.org/10.1016/j.measurement.2020.108308.

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Aydin, Mesut, Fatma Aydin, Murat Yuksel, Abdulkadir Yildiz, Nihat Polat, Mehmet A. Akil, Mehmet Z. Bilik, Abdurrahman Akyuz, Ibrahim Batmaz, and Sait Alan. "Visceral Fat Reflects Disease Activity in Patients with Ankylosing Spondylitis." Clinical & Investigative Medicine 37, no. 3 (June 1, 2014): 186. http://dx.doi.org/10.25011/cim.v37i3.21385.

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Purpose: Response to infliximab treatment diminishes as body mass index (BMI) increases in patients with ankylosing spondylitis (AS). The purpose of the study was to determine if diminished response to infliximab treatment in patients with AS could be associated with increased visceral adipose tissue rather than increased BMI. Methods: Twenty six AS patients (21 males and five females) who fulfilled the modified New York criteria and who were currently receiving infliximab treatment were enrolled in the study. Pain was measured by the visual analogue scale (VAS). The disease activity and functional status were assessed by the Bath AS Disease Activity Index (BASDAI) and the Bath AS Functional Index (BASFI). The Bath AS Metrology Index (BASMI) was used to evaluate mobility restrictions. Weight and visceral body composition were measured without shoes in light indoor clothes using a bio-impedance meter. Results: There was a significant correlation between visceral adipose tissue amount and disease activity under infliximab treatment. In correlation analysis, visceral fat showed significant correlations between BASDAI (r=0.545, p=0.004) and VAS (r=0.458, p=0.019). Total body fat also showed a significant correlation with BASDAI (r=0.463, p=0.017). Conclusion: A significant correlation was found between visceral adipose tissue amount and disease activity in patients with AS.

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Supadee, Laddawan, Santi Chatruprachewin, Chaba Suriya-Amaranont, and Wisut Titiroongruang. "Corrosion Characterization of High Moment Magnetic Material Coated with Diamond-Like Carbon." Advanced Materials Research 811 (September 2013): 171–76. http://dx.doi.org/10.4028/www.scientific.net/amr.811.171.

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In order to increase data storage density of hard drive, DLC overcoat thickness was decreased to allow read/write head to come closer to magnetic alloy of the disk, andwith maintaining the main purpose of the overcoat to provide good corrosion and mechanical protection for the underlying magnetic recording film under unfavorably environmental conditions and occasional reactions. Base on that the edges of topography will be weak point for deposition films cause of shadow effect during the process, its hard that deposition atomic will stay at the concave and convex of topography. DLC coverage performance at the edge of 3D topography becomes high sensitive with limited DLC films thickness. Currently the 3D profile of magnetic material that needs to protect with DLC, is about 2 nanometers with subnanometres DLC thickness. The enormous of data shrew corrosion pattern was usually happened at the edge of topography. Thus, the accelerated test or indirect methodology was applied for DLC integrity. This investigation was explore the methodology to verify the weakness of DLC films especially at the topography edges which is difficult for any direct metrology tools can pursue. With pore resistance, which related to the film structure, the electrochemical impedance indicated that DLC/Si3N4 is a suitable choice to against corrosion. However topography surface influence to DLC coverage. Controllable surface for DLC deposition also needed well defined. Two types of step height was created as 1 nm and 2 nm on (100) silicon substrate. The 20Å DLC film thickness was deposited on the silicon substrate with promised technique, Filtered Cathodic Vacuum Arch (FCVA). After this process the aluminum (Al) was deposited on the surface of DLC film by using evaporation technique. The silicon substrate was driven to Al surface thro pin holes on the DLC film at 577OC. To detect the pin holes on the DLC film, the aluminum layer was removed by using wet etch chemical process. The SEM image indicates that the square pitting at the edge of DLC film obtained for 2nm step height was around 2nm depth. The latest experiment in this investigation to characterize 2.3 T magnetic moment material degradation with DLC/Si3N4 coating, was performed with electrochemical impedance spectroscopy and AFM. The material with DLC overcoat after exposed to H2SO4 for 30 min, polarization resistance was increased for 2 times from uncoated material. Alternative charge transfer capacitance was reduced as desirable charge current.

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Prakoso, Aziz Eko, Alex Farachniamala, Pitri Andayani, Opta Muzaki Effendi, Mohtar Yunianto, and Malinda Sabrina. "Pembuatan Alat Impedance Tube dan Simulasi Pengukuran Koefisien Serap Menggunakan Software MATLAB R2013A." POSITRON 7, no. 1 (May 26, 2017): 08. http://dx.doi.org/10.26418/positron.v7i1.20828.

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Telah dilakukan pembuatan alat impedance tube sesuai dengan standar ISO 10534-2: 1998 [2] yaitu dimensi tabung 10 cm, ketebalan tabung 5 mm, jarak antara sumber suara dengan microphone terdekat 70 cm, jarak antara sampel dengan microphone terdekat 21 cm, jarak antar microphone 9 cm, frekuensi batas atas pengukuran 2000 Hz dan frekuensi batas bawah pengukuran 125 Hz. Pada penelitian ini digunakan metode impedance tube 2 microphone untuk melakukan pengukuran koefisien serap material. Prinsip kerja dari metode ini adalah dengan membandingkan hasil pengukuran tekanan pada kedua microphone yang kemudian digunakan untuk melakukan perhitungan fungsi transfer. Setelah fungsi transfer diketahui nilainya, maka dilakukan perhitungan nilai koefisien refleksi dan nilai koefisien serap.Simulasi perhitungan koefisien absorbsi alat impedance tube menggunakan software Matlab R2013a. Script perhitungan yang digunakan dalam simulasi merupakan pengembangan dari lecture Acoustic Metrologi The Catholic Univesity of America karya Diego Turo, Joseph Vignola, dan Aldo Glean [12]. Pengembangan yang dilakukan yaitu dengan melakukan perulangan perhitungan nilai fungsi transfer, dan koefisien refleksi sehingga nilai dari koefisien serap dapat ditampilkan dalam bentuk tabel dan grafik pada beberapa frekuensi. Pada penelitian ini digunakan styrofoam sebagai material yang akan di simulasikan nilai koefisien serapnya.

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Weikle, Robert M., N. Scott Barker, Arthur W. Lichtenberger, Matthew F. Bauwens, and Naser Alijabbari. "Heterogeneous Integration and Micromachining Technologies for Terahertz Devices and Components." Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2015, DPC (January 1, 2015): 002041–81. http://dx.doi.org/10.4071/2015dpc-tha31.

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Terahertz electronics has been a topic of research and development for many years, motivated largely by the technological needs of the radio astronomy and remote sensing scientific communities. Over the past decade, however, this field has experienced dramatic growth and intense, renewed interest from academic researchers and federal agencies, as well as from industry. This interest has arisen, in part, from recent funding initiatives from the federal government (such as DARPA's Terahertz Electronics Program), but is also largely due to the establishment of a commercial infrastructure that has made test and measurement instrumentation available to the engineers and scientists working at these frequencies. Moreover, the emergence of CMOS as a potential submillimeter-wave device technology has greatly expanded access to this spectral region by providing circuit designers with a platform for realizing terahertz circuits without need for specialized fabrication facilities or processes. The recent and rapid progress in terahertz electronics has created a demand for improved approaches to packaging and integration, as well as a need for new measurement instrumentation for characterizing emerging terahertz devices. This paper focuses on two recent research developments aimed at addressing these needs and broadening the technology base for both terahertz system implementation and terahertz metrology. These developments include (1) the development of a direct-contact probe technology that permits on-wafer scattering-parameter characterization and measurement of planar integrated devices at frequencies to 1 THz and beyond, and (2) the establishment of processing technologies that permit fabrication of highly-integrated submillimeter-wave diode-based circuits, such as heterodyne receivers and frequency multipliers, that are based on heterogeneous integration of III-V semiconductor devices with thin silicon membranes as a support and integration substrate. The technical foundation for each of these efforts is micromachining of silicon that allow the formation of mechanically-robust and low-loss membrane carriers to support terahertz devices and circuitry. Two examples of heterogeneous integration with silicon as an approach to packaging terahertz components are detailed in this paper. These include development of micromachined probes for on-wafer measurements of devices and circuits in the WR-1.0 waveguide band (0.75 – 1.1 THz). The probe design concept will be presented and methods for characterizing the probe described. Measurements demonstrate that the probes exhibit an insertion loss of less than 7 dB and return loss of greater than 15 dB over 750—1100 GHz band, yielding the first demonstration of on-wafer probe operating above 1 THz. In addition, an example of heterogeneous integration/packaging of a submillimeter-wave frequency quadrupler operating at 160 GHz with efficiency of 30% and corresponding output power of 70 mW will be discussed. The quadrupler design includes two frequency doubler stages in cascade and is based on a balanced circuit architecture that addresses degradation issues often arising from impedance mismatches between multiplier stages. A unique quasi-vertical diode fabrication process consisting of transfer of GaAs epitaxy to the thin silicon support substrate is used to implement the quadrupler, resulting in an integrated drop-in chip module that incorporates 18 varactors, matching networks and beamleads for mounting.

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Kaczmarek, Janusz, Massimo Ortolano, Oliver Power, Jan Kucera, Luca Callegaro, Vincenzo D'Elia, Martina Marzano, Robert Walsh, Miroslaw Koziol, and Ryszard Rybski. "Virtual Training Laboratory for Primary Impedance Metrology." IEEE Transactions on Instrumentation and Measurement, 2022, 1. http://dx.doi.org/10.1109/tim.2022.3223140.

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Marzano, Martina, Yaowaret Pimsut, Mattias Kruskopf, Yefei Yin, Marco Kraus, Vincenzo D'Elia, Luca Callegaro, Massimo Ortolano, Stephan Bauer, and Ralf Behr. "PTB-INRIM comparison of novel digital impedance bridges with graphene impedance quantum standards." Metrologia, September 13, 2022. http://dx.doi.org/10.1088/1681-7575/ac9187.

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Abstract This paper describes an onsite comparison of two different digital impedance bridges when performing measurements on a quantum Hall resistance standard with the purpose of realizing the SI unit of capacitance, the farad. In the EMPIR Joint Research Project 18SIB07 GIQS, graphene impedance quantum standards, the Physikalisch-Technische Bundesanstalt (PTB), Germany, developed a Josephson impedance bridge, and the Istituto Nazionale di Ricerca Metrologica (INRIM) and the Politecnico di Torino (POLITO), Italy, developed an electronic digital impedance bridge. The former is based on Josephson waveform generators and the latter on an electronic waveform synthesizer. The INRIM-POLITO impedance bridge was moved to PTB and the two bridges were compared by measuring both temperature-controlled standards and a graphene AC quantized Hall resistance standard. The uncertainties for the calibration of 10 nF capacitance standards at 1233 Hz are within 1 × 10-8 for the PTB’s bridge and around 1 × 10-7 for the INRIM-POLITO’s bridge. The comparison mutually validates the two bridges within the combined uncertainty. The result confirms that digital impedance bridges allow the realization of the SI farad from the quantized Hall resistance with uncertainties comparable with the best calibration capabilities of the BIPM and the major National Metrology Institutes.

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Suastiyanti, Dwita, Pathya Rupajati, and Marlin Wijaya. "Non Linear Dielectric Phenomenon in BaTiO3 - Bi (Ti1-xMgx)O3 . Ceramic Material." Asian Journal of Applied Sciences 10, no. 4 (August 31, 2022). http://dx.doi.org/10.24203/ajas.v10i4.7036.

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The distinguishing characteristic of an insulator is its resistivity. An insulator has a higher resistivity than a semiconductor or conductor and has high dielectric properties. The adjustable dielectric property is characterized by a change in the permittivity of the dielectric under an applied electric field, this phenomenon is called "dielectric nonlinearity" (dielectric tunability properties). With these properties, a new phenomenon will arise adjustable dielectric properties in dielectric ceramic materials. The aim of this research is to observe the non-linear dielectric phenomenon in BaTiO3-Bi(Ti1-xMgx)O3 ceramic material with x= 0.5, 0.6, 0.7, 0.8 and 0.9. Ceramic materials were synthesized using the sol-gel method which produced nano-sized powders. Impedance data was measured using an impedance analyzer (Solartron SI 1260, Solartron Metrology, West Sussex, UK) in a frequency range of 100 Hz to 500 Hz with an ac measuring voltage of 0.1 V. Dielectric tunability properties were measured from 0oC to 250oC using an automatic component analyzer. at 10 kHz. All samples show the phenomenon of dielectric tunability with different maximum permittivity. The highest permittivity was obtained at x= 0.6 but the highest transition temperature where non-linear phenomena occurred was found in the sample with x= 0.5.

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Bajek, D., and M. A. Cataluna. "Megahertz scan rates enabled by optical sampling by repetition-rate tuning." Scientific Reports 11, no. 1 (November 26, 2021). http://dx.doi.org/10.1038/s41598-021-02502-w.

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AbstractWe demonstrate, for the first time, optical sampling by repetition-rate tuning (OSBERT) at record megahertz scan rates. A low-cost, tunable and extremely compact 2-section passively mode-locked laser diode (MLLD) is used as the pulsed laser source, whose repetition rate can be modulated electronically through biasing of the saturable absorber section. The pulsed output is split into two arms comparable to an imbalanced Michelson interferometer, where one arm is significantly longer than the other (a passive delay line, or PDL). The resulting electronic detuning of the repetition rate gives rise to a temporal delay between pulse pairs at a detector; the basis for time-resolved spectroscopy. Through impedance-matching, we developed a new system whereby a sinusoidal electrical bias could be applied to the absorber section of the MLLD via a signal generator, whose frequency could be instantly increased from sub-hertz through to megahertz modulation frequencies, corresponding to a ground-breaking megahertz optical sampling scan rate, which was experimentally demonstrated by the real-time acquisition of a cross-correlation trace of two ultrashort optical pulses within just 1 microsecond of real time. This represents scan rates which are three orders of magnitude greater than the recorded demonstrations of OSBERT to date, and paves the way for highly competitive scan rates across the field of time-resolved spectroscopy and applications therein which range from pump probe spectroscopy to metrology.

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