Дисертації з теми "High voltage fragmentation technology"
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Benmamas, Arezki Lotfi. "Valorisation des systèmes d’éclairage à LED en fin de cycle de vie." Thesis, Troyes, 2021. http://www.theses.fr/2021TROY0044.
Повний текст джерелаWhile solid-state lighting allows for a significant reduction in electricity consumption, the problem of the end-of-life of the LED-based devices remains. This thesis associated with the RECYLED project consisted in identifying and then developing methods and processes according to the typologies of the devices (lamps, tubes and luminaires) with a view to recovery and reuse of certain elementary components. The objective, through a comprehensive approach, including both technical, economic and environmental aspects, was to achieve a recycling rate of 80%. Three scenarios have been identified for the recycling of LED lamps and tubes, reuse, shredding and disassembly. Studies of waste and marketed products have been carried out in order to characterize the deposit and size the proposed treatment solutions and estimate the overall recovery potential. Regarding the disassembly identified as the blocking point, the technology of pulsed powers based on fragmentation is proposed. With regard to the tubes, purely mechanical solutions have been validated. The proposed methods make it possible to obtain a material recovery rate of 74% for the lamps and 94% for the tubes. These rates are to be linked with the forecasts estimated for 2030 as part of this work, which lead to a maximum annual deposit estimated for LED lamps at 2600 tons and for LED tubes and panels at 1600 tons
Farag, Bassem. "High Voltage DC Arc Detection Model." Thesis, Uppsala universitet, Institutionen för informationsteknologi, 2018. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-358478.
Повний текст джерелаBahnam, Nadeen. "Container closure integritytesting with High Voltage LeakDetection." Thesis, Uppsala universitet, Nanoteknologi och funktionella material, 2021. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-439566.
Повний текст джерелаJędrzejewski, Piotr. "Modelling the European High-voltage electricity transmission." Thesis, KTH, Energiteknik, 2020. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-284152.
Повний текст джерелаDetta examensarbetebeskriver modellering av Europas gränsöverskridande elektriska transmissionsnät. Under detta arbete utvecklades en utvidgning av Open Source Energy Model Base för Europeiska unionen (OSeMBE) för implementering av sammankopplingar med den redan existerande modellen. Modellen är byggd med hjälp av Open Source Energy Modeling System (OSeMOSYS). Syftet med modellen är att hitta en kostnadseffektiv form av Europas elsystem under modelleringsperioden 2015 till 2050. Modellen användes för att validera planer för utveckling av sammankoppling för elnätet, definierade av Europeiska unionen i listan över projekt av gemensamt intresse. Under denna avhandling modellerades fyra scenarier för det europeiska elsystemets framtida utveckling. Målet för scenarierna var att analysera för vilka gränser en ny sammankopplingskapacitet skulle vara till nytta, samt att testa påverkan av samtrafikutvecklingen på hela elsystemet, särskilt produktionskapacitet och koldioxidutsläpp. Därefter analyserades flödena av elektricitet vid varje gräns, och för att förenkla analysen delades området upp i fyra regioner. Regionerna är uppdelade i enlighet med de fyra prioriterade korridorerna för elektricitet, definierade i Transeuropeiska Nät för Energi (TEN-E). Det huvudsakligaresultatet i scenariot som optimerade kapaciteten för sammankopplingarna i Europa var att endast 16% av den kapacitet som planerades som PCI behöver byggas. De flesta av dessa kapaciteter bör utvecklas i norra Europa, särskilt vid havsgränserna Tyskland-Norge, Storbritannien-Norge, Polen-Litauen, men också Finland-Sverige och Danmark-Tyskland. Även användningsfaktorer för samtrafikledningarna analyserades i arbetet.
Aliahmad, Mehran. "High voltage circuits for short loop SLICs in a low voltage submicron BiCMOS technology." Thesis, National Library of Canada = Bibliothèque nationale du Canada, 1998. http://www.collectionscanada.ca/obj/s4/f2/dsk1/tape11/PQDD_0006/NQ41393.pdf.
Повний текст джерелаRashid, Suhail Jeremy. "High voltage packaging technology for wide bandgap power semiconductor devices." Thesis, University of Cambridge, 2008. https://www.repository.cam.ac.uk/handle/1810/252098.
Повний текст джерелаWallström, Stina. "Biofilms on silicone rubber for outdoor high voltage insulation." Doctoral thesis, KTH, Fiber- och polymerteknik, 2005. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-171.
Повний текст джерелаSalemi, Arash. "Silicon Carbide Technology for High- and Ultra-High-Voltage Bipolar Junction Transistors and PiN Diodes." Doctoral thesis, KTH, Integrerade komponenter och kretsar, 2017. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-197913.
Повний текст джерелаQC 20161209
Livermore, Luke. "Integration of offshore wind farms through High Voltage Direct Current networks." Thesis, Cardiff University, 2013. http://orca.cf.ac.uk/42892/.
Повний текст джерелаPanji, Arikson Heraldus. "Optimization of High Voltage Cable Dimension in Scania Electric Vehicle’s Systems." Thesis, KTH, Skolan för elektroteknik och datavetenskap (EECS), 2019. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-278073.
Повний текст джерелаEfterfrågan på elfordon ökar, och därmed ökar också efterfrågan på den elektriska komponenten. Därför är det viktigt att utveckla en metod för att optimera kabelstorleken så att kabeln är tekniskt robust och ekonomiskt effektiv. Syftet med detta projekt är att studera och utvärdera olika kablarnas konstruktioner för att hitta den optimala dimensionen för högspänningsklass (spänningsklass B) i elfordonssystemet. Tre viktiga tekniska aspekter vid utvärderingen av den optimala kabelstorleken är kabelns kapacitet, kortslutningsförmåga och spänningsfall.I detta projekt placeras kabeln i luften. Ampaciteten beräknas med hjälp av en analytisk metod baserad på IEC 60287 och en simulering med finita element metoden. Dessa resultat verifieras mot direkta mätningar med hjälp av en likströmskälla och elektrisk belastning. För DC-beräkning är likheten för alla tre metoderna mycket hög. Bildningen av kabeln påverkar också kabelns ampacitet. För DC-strömmar har den vertikala formationen en högre ampacitet än den horisontella formationen för nästan 2%. För växelströmmar har trefoilformationen en högre ampacitet än den horisontella och vertikala formationen med 6-9 %.Kortslutningsförmågan och spänningsfallberäkningen utfördes för att säkerställa kabelprestanda. En större CSA innebär högre kortslutningsförmåga och lägre spänningsfall. Spänningsfallberäkning utförs för att begränsa kabellängden för att säkerställa ett maximalt 3% spänningsfall vid kretsens laständsida. Spänningsfallet är en viktig faktor att beakta. Med hjälp av dessa tre faktorer beskrivs optimeringsprocessen med ett flödesschema.
Xu, Jing. "Technology for Planar Power Semiconductor Devices Package with Improved Voltage Rating." Diss., Virginia Tech, 2008. http://hdl.handle.net/10919/26373.
Повний текст джерелаPh. D.
Walford, Thomas. "Integration of an Electric Propulsion High Voltage Unit into the FLP2 SmallSat Testbench." Thesis, Luleå tekniska universitet, Rymdteknik, 2018. http://urn.kb.se/resolve?urn=urn:nbn:se:ltu:diva-67459.
Повний текст джерелаAfghari, Kamran. "A Study and Design of High Performance Voltage-Controlled Oscillators in 65nm CMOS Technology." Thesis, Linköpings universitet, Elektroniska komponenter, 2012. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-87278.
Повний текст джерелаYu, Xiaoxi. "Valorisation de la biomasse lignocellulosique humide par la mise en place de procédés d'extraction et de séparation des polyphénols et des protéines : cas des tiges de colza." Thesis, Compiègne, 2015. http://www.theses.fr/2015COMP2246.
Повний текст джерелаThis thesis work concerns the study and the evaluation of the extraction and the separation of valuable compounds from rapeseed residues. The impact of different treatments (grinding, pulsed electric fields, high voltage electrical discharges and ultrasound) on the enhancement of the extraction of polyphenols and proteins from rapeseed stems was compared. These treatments can damage cell membranes and 1 or cell walls mechanically, electrically or acoustically, thus facilitating the release of intracellular compounds to the surroundings. The extraction kinetics, yield of total polyphenols and proteins and energy consumption were mainly studied. In addition, influences of plant maturity on the efficiency of studied treatments for the extraction of polyphenols and proteins have been studied. The methods tested for the separation of extractives (polyphenols and proteins) include coagulation, membrane filtration and the combination of these two methods in order to reduce the consumption of organic solvents and the retention ofpolyphenols during separation. The separation of extractives was evaluated by means of analysis of purity and relative removal. Finally, positive effects of electrical treatment on the extractive separation step such as the increase ofpermeate flux and the decrease of membrane fouling have been observed
Espinosa, Pablo A. "Design of a high-efficiency, high-performance zero-voltage-switched battery charger-discharger for the NASA EOS space platform." Thesis, This resource online, 1994. http://scholar.lib.vt.edu/theses/available/etd-10312009-020419/.
Повний текст джерелаLinnet, Agnes. "Eliminating zero-missing phenomenon in long, high voltage, underground cables." Thesis, KTH, Skolan för elektroteknik och datavetenskap (EECS), 2019. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-253262.
Повний текст джерелаHögsta längden på en högspänning underjordisk kabel begränsas ofta av de kriteriersom kabeln inte kan ha mer än 50% reaktiv effektkompensation. Om denna gränsöverskrids kan strömmen i strömbrytaren inte ha noll genomgang efter aktivering,kallad noll saknad fenomen. Detta är problematiskt om ett fel inträffar strax efteraktivering. Under de senaste 10 åren har olika metoder föreslagits, vilket skullemöjliggöra större reaktiv effektkompensation. Dessa metoder hindrar antingen detnollbristande fenomenet (förebyggande metoder) eller ger ett sätt att öppna strömbrytarenom ett fel uppstår (hanteringsmetoder).En ny 200 km, 220 kV linje har föreslagits på Island kallad Sprengisandslína. Ettföreslaget alternativ för att den här linjen ska byggas är att bygga den som en OHLUGC-OHL-linje, eftersom spänningskriterierna inte är uppfyllda om Sprengisandslínaär byggt som en UGC med en 50% reaktiv effektkompensation. Syftet meddenna avhandling är att se huruvida det saknade fenomenet kan undvikas genomatt genomföra motåtgärder - detta ger ett preliminärt resultat om Sprengisandslínakan byggas som en UGC. I denna avhandling analyseras de fyra olika förebyggandemetoderna med en övergående studie för Sprengisandslína: (1) Förinsättningsresistor,(2) Synkroniserad samtidigkoppling, (3) Synkroniserad inkoppling där kabelnaktiveras före shuntreaktorn och (4) ) synkroniserad inkoppling där shuntreaktornaktiveras före kabeln.Preliminära steady state studier utförs för att bestämma det minsta antalet shuntreaktorersom behövs för att uppfylla spänningskriterierna. Resultaten visade att detminsta antalet som behövdes var tre förutsatt att de alla är lika stora som liggerjämnt längs kabeln (en i varje ände och en i mitten). Dessutom är det nödvändigtatt se om generatorer skulle bli underexiterad om kabeln är energiserad med 100%iiiivreaktiva effektkompensation eftersom det kan minska generatorns livslängd. Resultatenvisade att generatorer inte blev underexiterad.Motståndet för synkroniserad omkoppling där shuntreaktorn aktiveras före kabelnoch motmätningen av samtidig synkroniserad omkoppling visades för att elimineradet nollmissande fenomenet när kabeln aktiverades med 100% reaktiv effektkompensation.Synkroniserad omkoppling där shuntreaktorn aktiveras innan kabeln visadesig ha lägre omkopplingsvolymer, 21% högre än nominellt värde och den lägre inbrusningsströmmenpå 2,38 kA. Metoden för samtidig synkroniserad omkopplingär emellertid billigare och omkopplingsvolymen och inströmmen var inom en acceptabelmarginal (omkopplingsvolymer var 35; 9% högre än nominellt värde ochinströmningsströmmen var 4,01 kA).De resultaten av studien indikerar att Sprengisandslína kan energiseras som en UGCmed 100% reaktiv effektkompensation om antingen motspelet av samtidig synkroniseradomkoppling eller synkroniserad omkoppling där shuntreaktorn aktiveras innankabeln installeras. En detaljerad frekvensstudie måste dock utföras innan någon avmotåtgärderna kan rekommenderas.
Norgard, Peter. "Development of a gigawatt repetitive pulse modulator and high-pressure switch test stand and results from high-pressure switch tests." Diss., Columbia, Mo. : University of Missouri-Columbia, 2006. http://hdl.handle.net/10355/4584.
Повний текст джерелаThe entire dissertation/thesis text is included in the research.pdf file; the official abstract appears in the short.pdf file (which also appears in the research.pdf); a non-technical general description, or public abstract, appears in the public.pdf file. Title from title screen of research.pdf file (viewed on April 22, 2009) Includes bibliographical references.
Oder, Stephen, Paula Arinello, Peter Caron, Scott Crawford, Stephen McGoldrick, and Douglas Bajgot. "Development of a Variable Output Power, High Efficiency Programmable Telemetry Transmitter Using GaN Amplifier Technology." International Foundation for Telemetering, 2012. http://hdl.handle.net/10150/581842.
Повний текст джерелаBahat-Treidel, Eldad [Verfasser], and Günther [Akademischer Betreuer] Tränkle. "GaN Based HEMTs for High Voltage Operation. Design, Technology and Characterization / Eldad Bahat-Treidel. Betreuer: Günther Tränkle." Berlin : Universitätsbibliothek der Technischen Universität Berlin, 2012. http://d-nb.info/1022195859/34.
Повний текст джерелаYoon, Sangwoong. "LC-tank CMOS Voltage-Controlled Oscillators using High Quality Inductor Embedded in Advanced Packaging Technologies." Diss., Georgia Institute of Technology, 2004. http://hdl.handle.net/1853/4887.
Повний текст джерелаBrauer, Patrik. "High-Frequency Voltage Distribution Modelling of a Slotless PMSM from a Machine Design Perspective." Thesis, KTH, Elkraftteknik, 2018. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-224174.
Повний текст джерелаNästa generations inverterare för styrning av elektriska maskiner, baserade på bredbandgaps komponenter, tillåter högre switchfrekvenser vilket skapar en energieffektivare drivlina. Nackdelen är att snabba spänningsflanker från den höga switchfrekvensen skapar överspänning på stators anslutningar och en ojämn spänningsfördelning i statorlindningen. Det är därför betydelsefullt att förstå hur dessa nya drivlinor påverkar lindningens spänningsfördelning. I denna rapport används en modell kapabel att simulera lindningens spänningsfördelning i det breda frekvensspektrumet 0-10 MHZ. Modellen är framtagen för en faslindning av en PMSM, utan statoröppning, som inkluderar både kapacitiva och induktiva kopplingar samt analytiskt beräknade lindningsförluster. Modellen används för att undersöka spänningsfördelningen i lindningen samt inverkan från designparametrar som isolationsmaterial och lindningsdistribution. Känslighetsanalysen visar att lindingsdistributionen har en signifikant påverkan på både impedansspektrumet och spänningsfördelningen. För den studerade maskintypen är det kapacitansen mellan varv som är dominerande för högfrekventa fenomen. Isolationsmaterial som påverkar denna koppling har en påverkan på impedansspektrumet men är liten för spänningsfördelningen.
Kito, Y., H. Okubo, N. Hayakawa, Y. Mita, and M. Yamamoto. "Development of a 6600 V/210 V kVA hybrid-type superconducting transformer." IEEE, 1991. http://hdl.handle.net/2237/6880.
Повний текст джерелаLindblom, Adam. "Inductive Pulse Generation." Doctoral thesis, Uppsala : Acta Universitatis Upsaliensis : Univ.-bibl. [distributör], 2006. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-6699.
Повний текст джерелаNing, Jing [Verfasser], Klaus [Akademischer Betreuer] Hofmann, and Rolf [Akademischer Betreuer] Jakoby. "Design of An Integrated High Voltage Controller in CMOS-Technology for Tunable Multiport Microwave Devices / Jing Ning. Betreuer: Klaus Hofmann ; Rolf Jakoby." Darmstadt : Universitäts- und Landesbibliothek Darmstadt, 2016. http://d-nb.info/1112269312/34.
Повний текст джерелаSuraparaju, Eswar Raju. "Wide Tuning Range I/Q DCO VCO and A High Resolution PFD implementation in CMOS 90 nm Technology." Wright State University / OhioLINK, 2015. http://rave.ohiolink.edu/etdc/view?acc_num=wright1451488990.
Повний текст джерелаAlbrecht, Martin. "Enabling socio-technical transitions – electric vehicles and high voltage electricity grids as focal points of low emission futures." Licentiate thesis, KTH, Miljöstrategisk analys (fms), 2017. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-206973.
Повний текст джерелаQC 20170512
Norstrat
Saint-Laurent, Martin. "Modeling and Analysis of High-Frequency Microprocessor Clocking Networks." Diss., Georgia Institute of Technology, 2005. http://hdl.handle.net/1853/7271.
Повний текст джерелаSporrong, Kristofer, and Mattias Harrysson. "Elektrisk integrering och projektering av förnybar energi i svagt lokalt elnät." Thesis, Högskolan i Halmstad, Sektionen för ekonomi och teknik (SET), 2012. http://urn.kb.se/resolve?urn=urn:nbn:se:hh:diva-19037.
Повний текст джерелаTo achieve a reliable and qualitative power conversion from the wind into electric power, a variety of factors and demands need to be obtained. Climatological and technological factors requires proper dimensioning and adjustment of the conversion technology, to harvest the greatest possible amount of energy and to be converted in a reliable and energy efficient way, that windmill owners, power grid owners require. The wind is as familiar an unpredictable power supply. The variations in intensity over time could mean a number of drive optimization problems with after-effects of the wind turbine, power grid and load. The consequences may depend on which type of technology that is installed in the different parts of the energy system. The area's power grid and varying power needs with characteristics over time, also has a significant importance. The turbulent wind gives deviations of voltage and power flow, especially in various extreme situations in weak power grids. Good interaction between the wind turbine and power grid with varying active and reactive power demand for the energy users, provides conditions for a good power quality and thus, an optimal and safe operation with few interruptions over time. It can be, and often is the mechanics, electro-technical choices in the wind turbine and associated electrical systems that play a critical role in how profitable installation is during the wind turbines technological life. The power grid owner strives for a good interaction between the power grid and electrical generation which rise for few faults between interruptions and errors. In the branch this is known as "Mean time between failures" MTBF. According to the Swedenergy, harmonics, slow and fast voltage variations including required short-circuit power should be investigated and compared with those requirements and terms that prevails with electrical integration of power into the grid. The feasibility study has concluded two suitable power connection proposals including wind mapping research, later in this report it is described and suggested two related Smart Grid variants with energy storage for the two power connection proposals in the existing weak local grid.
Judith Saari var betygsättare på muntlig presentation.
Rosenbaum, Tommy. "Performance prediction of a future silicon-germanium heterojunction bipolar transistor technology using a heterogeneous set of simulation tools and approaches." Thesis, Bordeaux, 2017. http://www.theses.fr/2017BORD0550/document.
Повний текст джерелаBipolar complementary metal-oxide-semiconductor (BiCMOS) processescan be considered as the most general solution for RF products, as theycombine the mature manufacturing tools of CMOS with the speed and drivecapabilities of silicon-germanium (SiGe) heterojunction bipolar transistors(HBTs). HBTs in turn are major contenders for partially filling the terahertzgap, which describes the range in which the frequencies generated bytransistors and lasers do not overlap (approximately 0.3THz to 30 THz). Toevaluate the capabilities of such future devices, a reliable prediction methodologyis desirable. Using a heterogeneous set of simulation tools and approachesallows to achieve this goal successively and is beneficial for troubleshooting.Various scientific fields are combined, such as technology computer-aided design(TCAD), compact modeling and parameter extraction.To create a foundation for the simulation environment and to ensure reproducibility,the used material models of the hydrodynamic and drift-diffusionapproaches are introduced in the beginning of this thesis. The physical modelsare mainly based on literature data of Monte Carlo (MC) or deterministicsimulations of the Boltzmann transport equation (BTE). However, the TCADdeck must be calibrated on measurement data too for a reliable performanceprediction of HBTs. The corresponding calibration approach is based onmeasurements of an advanced SiGe HBT technology for which a technology specific parameter set of the HICUM/L2 compact model is extracted for thehigh-speed, medium-voltage and high-voltage transistor versions. With thehelp of the results, one-dimensional transistor characteristics are generatedthat serve as reference for the doping profile and model calibration. By performingelaborate comparisons between measurement-based reference dataand simulations, the thesis advances the state-of-the-art of TCAD-based predictionsand proofs the feasibility of the approach.Finally, the performance of a future technology in 28nm is predicted byapplying the heterogeneous methodology. On the basis of the TCAD results,bottlenecks of the technology are identified
Bipolare komplementäre Metall-Oxid-Halbleiter (BiCMOS) Prozesse bietenhervorragende Rahmenbedingungen um Hochfrequenzanwendungen zurealisieren, da sie die fortschrittliche Fertigungstechnik von CMOS mit derGeschwindigkeit und Treiberleistung von Silizium-Germanium (SiGe) Heterostruktur-Bipolartransistoren (HBTs) verknüpfen. Zudem sind HBTs bedeutendeWettbewerber für die teilweise Überbrückung der Terahertz-Lücke, derFrequenzbereich zwischen Transistoren (< 0.3 THz) und Lasern (> 30 THz).Um die Leistungsfähigkeit solcher zukünftigen Bauelemente zu bewerten, isteine zuverlässige Methodologie zur Vorhersage notwendig. Die Verwendungeiner heterogenen Zusammenstellung von Simulationstools und Lösungsansätzenerlaubt es dieses Ziel schrittweise zu erreichen und erleichtert die Fehler-_ndung. Verschiedene wissenschaftliche Bereiche werden kombiniert, wie zumBeispiel der rechnergestützte Entwurf für Technologie (TCAD), die Kompaktmodellierungund Parameterextraktion.Die verwendeten Modelle des hydrodynamischen Simulationsansatzes werdenzu Beginn der Arbeit vorgestellt, um die Simulationseinstellung zu erläuternund somit die Nachvollziehbarkeit für den Leser zu verbessern. Die physikalischenModelle basieren hauptsächlich auf Literaturdaten von Monte Carlo(MC) oder deterministischen Simulationen der Boltzmann-Transportgleichung(BTE). Für eine zuverlässige Vorhersage der Eigenschaften von HBTs muss dieTCAD Kon_guration jedoch zusätzlich auf der Grundlage von Messdaten kalibriertwerden. Der zugehörige Ansatz zur Kalibrierung beruht auf Messungeneiner fortschrittlichen SiGe HBT Technologie, für welche ein technologiespezifischer HICUM/L2 Parametersatz für die high-speed, medium-voltage undhigh-voltage Transistoren extrahiert wird. Mit diesen Ergebnissen werden eindimensionaleTransistorcharakteristiken generiert, die als Referenzdaten fürdie Kalibrierung von Dotierungspro_len und physikalischer Modelle genutztwerden. Der ausführliche Vergleich dieser Referenz- und Messdaten mit Simulationengeht über den Stand der Technik TCAD-basierender Vorhersagenhinaus und weist die Machbarkeit des heterogenen Ansatzes nach.Schlieÿlich wird die Leistungsfähigkeit einer zukünftigen Technologie in28nm unter Anwendung der heterogenen Methodik vorhergesagt. Anhand derTCAD Ergebnisse wird auf Engpässe der Technologie hingewiesen
Freye, Claudius [Verfasser], Frank [Akademischer Betreuer] Jenau, and Thomas [Gutachter] Leibfried. "Methoden und Aspekte zur Leitfähigkeitsanalyse von Isolationsmaterialien der Kabeltechnologie und zur Isolationskoordination für Systeme der Hochspannungsgleichstromübertragung (HGÜ) : Methods and aspects for conductivity analysis of insulating materials in cable technology and for insulation coordination in high-voltage direct current transmission (HVDC) systems / Claudius Freye ; Gutachter: Thomas Leibfried ; Betreuer: Frank Jenau." Dortmund : Universitätsbibliothek Dortmund, 2020. http://d-nb.info/1214887627/34.
Повний текст джерелаFeinäugle, Peter. "Experimentelle und numerische Untersuchungen zu entladungsbasierten Elektronenstrahlquellen hoher Leistung." Doctoral thesis, Saechsische Landesbibliothek- Staats- und Universitaetsbibliothek Dresden, 2012. http://nbn-resolving.de/urn:nbn:de:bsz:14-qucosa-88973.
Повний текст джерелаDischarge-based, cold-cathode electron sources were routinely used as research tools at the end of the 19th century and facilitated then the discovery of the electron and of the x-rays. In recent time, they experience a renewed interest in science and industry due to their capability of generating high power electron beams for production processes (like welding, evaporation of materials for vapor deposition, and vacuum melt refining in metallurgy) relying on rugged mechanic designs as well as simple supply and control systems. Hence, discharge-based electron sources could provide an economically attractive alternative to the currently established electron beam guns with thermionic cathodes. Despite the long history and many empirical trials to utilize electron beam generation by gas discharges in several applications, the mechanisms governing this kind of electron sources are far from being well understood. Therefore, it was the purpose of the theoretical and experimental work performed for this thesis not only to investigate in the technological potentials and limitations of discharge-based electron beam guns but also to improve the knowledge of physical basic effects. At first, several cold-cathode beam sources existing at Fraunhofer FEP were analyzed. Regardless that they were designed for different applications, all were based on the same function principle: A high-voltage glow-discharge (HVGD) is sustained inside the device. Ions gain energy in the cathode fall, hit the cathode and release secondary electrons. These electrons will be accelerated towards the plasma then and can finally leave the beam source to perform the desired action at the process site. In order to optimize stability of the ions generating discharge, efficiency of the beam generation, beam power density and longevity of the cathode, different combinations of cathode materials and plasma forming gases have been investigated experimentally. The dependence of the cathode dark space width on current and discharge voltage was measured and could be explained by an analytic model. Emittance and brightness are important measures which quantify the quality of electron beams. In this work, both were determined for the beam originating from a HVGD based cold-cathode electron gun designed for welding following two approaches: First the emittance could be extracted from the envelope equation which analytically describes the evolution of the experimentally observed beam diameter along the propagation axis. Second the emittance was calculated from numerically simulated traces in the phase space. It was a core purpose of this work to develop and validate software tools capable of simulating the beam formation in various geometric configurations. This task was aimed at supporting the design and optimization of new discharge-based beam sources. Since commercially available software for modeling electron beam generation and transport do not consider the key mechanisms of plasma-based sources like the ion space charge or the ion-dependent production of free electrons, a new attempt was favored for this work: Particle-in-Cell (PIC) are being used in plasma research for studying nonlinear problems like instabilities. Therefore, a PIC simulation environment was utilized to numerically model the HVGD and the related beam generation. The simulation satisfactorily reproduces experimental findings, like the characteristics of the discharge, the emittance of the beam or the cathode dark space dimension. Finally, a discharge-based electron-beam sources of a new type was developed and characterized in the frame of this work. It merges the simplicity of known cold cathode devices with beneficial performance parameters, like high beam power density and low arcing rate, which have been reached so far with traditional thermionic electron sources only. The cathode of the new beam source consists of LaB6 - a material with a high secondary electron yield and a low thermionic work function - and was mounted thermally insulated against the holder. Then, an elevated operation temperature resulting in considerable thermionic emission was maintained by ions extracted from a HVGD. Besides to technically advantageous features, this so called “hybrid“ cathode mode of beam generation shows a physically interesting behaviour. Several new effects - not known from traditional cold-cathode discharges - could be observed, like a peculiar “N-shaped“ appearance of the pressure-current characteristic, the slowly and irregularly decreasing electron emission after a sudden discharge cutoff, a limitation of achievable beam current, and a multitude of possible cathode wear mechanisms. Physical models describing various features of the hybrid cathode discharge were elaborated and compared with the experimental findings
Ram, Prakash Ranjithh Raj. "Study of an Isolated and a Non-Isolated Modular DC/DC Converter : In Multi-Terminal HVDC/MVDC grid systems." Thesis, KTH, Skolan för elektroteknik och datavetenskap (EECS), 2019. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-278495.
Повний текст джерелаFor interconnection of multi-terminal HVDC systems involving point-to-point links, aDC-DC converter is the only possible way to interconnect. Therefore, the issues of voltagematching and DC fault current limiting in high voltage DC systems are undergoing extensiveresearch and are the focus of this thesis. Starting with analyzing the state of the art highvoltage DC-DC converter topologies for interconnection of multi-terminal HVDC systems andbenchmarking each converter topology based on different functionalities. A basic non-isolatedDC-DC converter topology is analyzed in terms of design, cost, sizing, losses and power controlcapability. First, starting with the mathematical modeling and then the numerical analysis isdone for different operating regions. Next, it is compared with the two-phase non-isolated DCconverter based on energy storage, maximum DC power transfer, and total losses. Simulation oftwo-phase and three-phase non-isolated DC converter is done in PSCAD incorporating differenttypes of controllers. Then, an isolated converter topology is taken and analyzed in detail startingfrom mathematical modeling to validation using simulation results. Different types of faultsanalysis for both isolated and non-isolated converter topology is done. Finally, analyzing the DCfault in different possible connection of the converter in the multi-terminal grid, i.e. monopole,bipole in both symmetric and asymmetric configurations.
Pallon, Love. "Polyethylene/metal oxide nanocomposites for electrical insulation in future HVDC-cables : probing properties from nano to macro." Doctoral thesis, KTH, Polymera material, 2016. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-193591.
Повний текст джерелаNanokompositer av polyeten och metalloxidpartiklar anses vara möjliga material att använda i morgondagens isolationshölje till högspänningskablar för likström. För att nå en transmissionsspänning på 1 MV behövs isolationsmaterial som i jämförelse med dagens polyeten har lägre elektrisk ledningsförmåga, högre styrka mot elektriskt genomslag och som kan kontrollera ansamling av rymdladdningar. De senaste årens forskning har visat att kompositer av polyeten med nanopartiklar av metalloxider har potential att nå dessa egenskaper. I det här arbetet har kompositer av polyeten och nanopartiklar av MgO för elektrisk isolation producerats och karaktäriserats. Nanopartiklar av MgO har framställts från en vattenbaserad utfällning med efterföljande calcinering, vilket resulterade i polykristallina partiklar med en mycket stor specifik ytarea (167m2 g-1). MgO-nanopartiklarna ytmodifierades i n-heptan genom att kovalent binda oktyl(trietoxi)silan och oktadekyl(trimetoxi)silan till partiklarna för att skapa en hydrofob och skyddande yta. Extrudering av de ytmodifierade MgO nanopartiklarna tillsammans med polyeten resulterade i en utmärkt dispergering med jämnt fördelad partiklar i hela kompositen, vilket ska jämföras med de omodifierade partiklarna som till stor utsträckning bildade agglomerat i polymeren. Alla kompositer med låg fyllnadsgrad (1–3 vikt% MgO) visade upp till 100 gånger lägre elektrisk konduktivitet jämfört med värdet för ofylld polyeten. Vid högre koncentrationer av omodifierade MgO förbättrades inte de isolerande egenskaperna på grund av för stor andel agglomerat, medan kompositerna med de ytmodifierade fyllmedlen som var väl dispergerade behöll en kraftig reducerad elektrisk konduktivitet upp till 9 vikt% fyllnadshalt. Den minsta interaktionsradien för MgO-nanopartiklarna för att minska den elektriska konduktiviten i kompositerna fastställdes med bildanalys och simuleringar till ca 800 nm. Den teoretiskt beräknade interaktionsradien kompletterades med observation av en experimentell interaktionsradie genom att mäta laddningsfördelningen över en Al2O3-nanopartikle i en polyetenfilm med intermodulation (frekvens-mixning) elektrostatisk kraftmikroskop (ImEFM), vilket är en ny AFM-metod för att mäta ytpotentialer. Genom att lägga på en spänning på AFM-kantilevern kunde det visualiseras hur laddningar, både injicerades och extraherades, från nanopartiklarna men inte från polyeten. Det tolkades som att extra energinivåer skapades på och runt nanopartiklarna som fungerar för att fånga in laddningar, ekvivalent med den gängse tolkningen att nanopartiklar introducera extra elektronfällor i den polymera matrisen i nanokompositer. Nanotomografi användes för att avbilda elektriska träd i tre dimensioner. Avbildningen av det elektriska trädet visade att tillväxten av trädet hade skett genom bildning av håligheter framför den framväxande trädstrukturen. Håligheterna leder till försvagning av materialet framför det propagerande trädet och förenklar på det sättet fortsatt tillväxt. Bildningen av håligheter framför trädstrukturen uppvisar en analogi till propagering av sprickor vid mekanisk belastning, i enlighet med Griffiths koncept.
QC 20161006
Wang, Chung-Sheng, and 王忠勝. "A Study of High Voltage MOSFET in CMOS Technology." Thesis, 2000. http://ndltd.ncl.edu.tw/handle/38867609814747863929.
Повний текст джерела國立交通大學
電子工程系
88
The thesis uses the SVX (Smart Voltage Extension) approach to implement the high-voltage devices without modifying the processing steps of a standard, low-voltage n-well CMOS (Complementary Metal Oxide Semiconductor) technology. Through the special layout techniques, high-voltage n-type MOS transistor is usually capable to sustain about 10 times the nominal voltage of the 0.6-micrometer standard CMOS technique provided by TSMC. In order to investigate the forward and breakdown characteristics of n type high-voltage transistors sustained voltage above 30volts with various ranges of layout parameters, two approaches are adopted. First, TCAD (Technology Computer-Aided Design) is utilized to simulate devices' processes and electrical characteristics. The other is the measurement about static characteristics of the high-voltage devices. At last, third level and BSIM SPICE models were also derived for the high-voltage transistors by the device's parameter exactor (AURORA). Beside, it will be mentioned that high-voltage transistor are dedicated to applications of circuit level, such as level shifters and ESD(Electrostatic Discharge) circuits.
Wu, Ping-Chen, and 吳秉宸. "Development and Improvement of GaN-based High-Voltage LED Technology." Thesis, 2017. http://ndltd.ncl.edu.tw/handle/47162728991316068565.
Повний текст джерелаHsu, Che-Lun, and 許哲綸. "Study of Electrostatic Discharge Protection Devices in High-Voltage BCD Technology." Thesis, 2009. http://ndltd.ncl.edu.tw/handle/15421955459637229479.
Повний текст джерела國立交通大學
電子工程系所
98
High-voltage (HV) transistors in smart power technologies have been extensively used for display driver integrated circuits (ICs), power supplies, power management and automotive electronics. However, the process complexity and the difficulty to guarantee the reliability of HV devices are greatly increased for the sake of sustaining such high operating voltage in HV ICs. As a result, the electrostatic discharge (ESD) reliability becomes challenging due to the severe latch-up threat in such a harsh environment. The ESD protection design with high efficiency is vital to the HV ICs for the requirement of reliability. To ensure the effectiveness and reliability of an ESD protection design, it has been generally approved that the I-V characteristics of ESD protection devices should locate within the ESD protection design window which defines the trigger voltage (Vt1) of ESD protection devices to be lower than the both junction and gate-oxide breakdown voltages of internal circuits (VBD,internal) and the snapback holding voltage (Vhold) larger than the power supply voltage (VDD). In HV technology, bipolar junction transistors, HV MOSFET and silicon controlled rectifier (SCR) have been used as on-chip ESD protection devices. Among the ESD protection devices, the SCR device is attractive and applicable for ESD protection because it exhibits extremely high failure current and low dynamic on-resistance with occupying the smallest layout area. Unfortunately, the impact of extremely low holding voltage resulted from double-carrier injection and inherent regenerative feedback mechanism causes SCR to be susceptible to quasi-static latch-up or transient-induced latch-up (TLU) danger under normal circuit operating condition, especially while SCR is used in the power-rail ESD clamp circuit. Consequently, ESD design effort is usually focused on boosting the holding voltage of ESD protection devices and minimizing the latch-up risk in HV ICs. Several ESD protection structures aimed at increasing the latch-up immunity have been investigated and reported in HV ICs. One way is to increase the holding voltage of ESD protection devices to be larger than the power supply voltage, and the other way is to increase the trigger or holding current of ESD protection devices above certain minimum latch-up triggered current to prevent latch-up during normal circuit operating condition. In addition, the ESD protection devices immunity against latch-up referred to the transmission-line-pulsing (TLP)-measured holding voltage, holding current and trigger current is insufficient because the latch-up event is a reliability test with the time duration longer than millisecond. Therefore, the holding voltage, holding current and trigger current measured from a dc curve tracer is more convincing than that measured by the TLP system while judging the validity of latch-up susceptibility. In this thesis, the ESD protection devices with high latch-up immunity have been designed and developed, and successfully verified in a 0.5-�慆 16-V bipolar CMOS DMOS (BCD) processes. The SCR devices are adopted as ESD protection devices in this work because of their superior ESD performance. From the dc experimental results, the high holding currents of the single SCR devices are accomplished by the implantation of N+-buried layer (NBL). Besides, the high immunity against transient-induced latch-up can be realized by the stacked configuration of SCR devices.
YUN-JUNG, LIN, and 林昀融. "Study on 60V High Voltage LDMOS base on UHV BCD Technology." Thesis, 2017. http://ndltd.ncl.edu.tw/handle/483r5z.
Повний текст джерела亞洲大學
資訊工程學系
105
Because of electronic technologies products performance increase day by day, for Power supply needed also increasing, so for the device electricity efficiency related technologies are more important than before. In all electronic products will having DC to DC, DC to AC, AC to DC or AC to AC switching. How to reduce the power loss on device switching to let device achieve more energy efficiency become the most focus part of the electronic product. But some international manufacturers company have lot of technology and patents because they go into the research of High Voltage device more earlier and Taiwan's device company only recently began to enter this area now. BCD technology, which is mean integration for three different components: Bipolar, CMOS and DMOS on the one chip. Was proposed by STMicroelectronics in 1984 and called BCD1. The BCD1 is based on 4μm 60V VDMOS and till now they evolve to the 10th generation called BCD10. Which is based on now most popular technology of 90nm BCD process integration. In this study, HV LDMOS design base on 5th generation BCD5 0.6μm process technology. Because for the low cost and can for some 6” and 8” analog device fab to upgrade their product with using current equipment and process technology to help the old fab to transformation. In this study will using T-CAD simulation tool with 0.6μm process technology to design a 60V HVLDMOS device under 500V UHV device process for process integration. Because of using 0.6μm technology, in the design will using LOCOS process for isolation. First, because the isolation oxide will having lot of effect for our device spec, we will explore for the different LOCOS oxidation model in our T-CAD simulation to fit the silicon result. After that we will using the Poly-Buffered LOCOS process technology to reduce the Bird’s Beak for our device about 40%. Then we will take the best model put into our HVLDMOS design and fit the device same with the device produce from fab. Because of the demand for automotive electronic components are increasing day by day, so in this study we will design our 60V HV LDMOS base on 500V UHV device process. Only fix our 60V NLDMOS and 60V PLDMOS implant process and structure design slightly. As application on the switching device or energy management components. The specifications of this study are based on Fairchild's 60V high-voltage components as a reference. Finally, our 60V NLDMOS’s breakdown is about 13V higher than the Fairchild component and Idsat was nearly 100% increase compare to Fairchild component. In the PLDMOS part, because PLDMOS is more difficult to develop. In this study, for PLDMOS specification although BVD almost same like Fairchild's, but Idsat still have 100% increase with Fairchild’s. So this 60V LDMOS device can application on switching device or energy management component very well. Keyword: HVNLDMOS, HVPLDMOS, BCD integration, UHV device process, P-well.
Dai, Chia-Tsen, and 戴嘉岑. "ESD Protection Design and Latchup Prevention in High-Voltage BCD Technology." Thesis, 2017. http://ndltd.ncl.edu.tw/handle/5gzb89.
Повний текст джерела國立交通大學
電子研究所
106
Nowadays, the smart power technology has been developed and used to fabricate the display driver circuits, power switch, motor control systems, and so on. However, the process complexity and the reliability of high-voltage (HV) devices have become more challenging compared with the low-voltage (LV) devices. Among the various reliability specifications, on-chip electrostatic discharge (ESD) protection has been known as one of the important issues in HV integrated circuits (ICs). ESD is an inevitable event during fabrication, packaging and testing processes of integrated circuits. ESD protection design is therefore necessary to protect ICs from being damaged by ESD stress energies. In Chapter 2, the modified silicon-controlled rectifier (SCR) fabricated in a 0.25-μm HV Bipolar-CMOS-DMOS (BCD) technology has been proposed to seek for both effective ESD protection and latchup immunity. Experimental results show that one of the proposed SCRs has a high holding voltage of up to ~30 V in the 100-ns Transmission- line-pulsing (TLP) measurement results. However, through the experimental verification by using transient-induced latchup (TLU) test, the holding voltage of such proposed device decreases to ~20V. It is due to the increased bipolar junction transistor (BJT) current gains of the SCR path induced by the Joule heating effect in the long-term measurement. Such phenomenon is an unavoidable issue that should be carefully taken into consideration when applying SCR device for ESD protection in the HV applications. In Chapter 3, an on-chip ESD protection solution has been proposed in a 0.25-μm HV BCD process by using LV devices with stacked configuration For HV applications. Experimental results in silicon chip have verified that the proposed design can successfully protect the 60-V pins of a battery-monitoring IC against over 8-kV human-body-model (HBM) ESD stress. Moreover, stacked LV devices with sharing path technique can be more area-efficient to implement the whole-chip ESD protection in the HV CMOS ICs. In Chapter 4, the optimization of guard ring structures to improve latchup immunity in an HV double-diffused drain MOS (DDDMOS) process with the DDDMOS transistors has been investigated in a silicon test chip. The measurement results demonstrated that the test devices isolated with the specific guard ring structure of n-buried layer can highly improve the latchup immunity. In Chapter 5, the latchup path which may potentially exist at the interface between HV and LV circuits in a HV BCD technology has been investigated. Owing to the multiple well structures used to realize the HV device in the BCD process, the expected latchup path in the test structure was hardly triggered. However, a parasitic SCR path featuring a very low holding voltage is found in the experiment silicon chip. It may influence the ESD robustness of CMOS IC products with the HV and LV circuits integrated together. Thus, the layout rules at HV and LV interface should be carefully defined to avoid the occurrence of unexpected parasitic path. Chapter 6 summarizes the main results of this dissertation, where the future works based on the new proposed designs and test structures are discussed as well. The related works in this dissertation have been published in several international journals or conferences.
Huang, Lai-De, and 黃來得. "Single-Photon Avalanche Diode Fabricated with Standard CMOS High Voltage Technology." Thesis, 2015. http://ndltd.ncl.edu.tw/handle/25548709771133298730.
Повний текст джерела國立交通大學
電子工程學系 電子研究所
104
In this work, we investigate single-photon avalanche diodes (SPADs) in standard 0.18-m high-voltage CMOS technology provided by TSMC. The SPADs with various kinds of P-N junctions have been designed, fabricated, and characterized. Device simulation and afterward analysis are performed with Sentaurus-TCAD tool. Among the studied devices, 20-m-diameter SPADs formed with deep p-typed well (DPW) and n-typed buried layer (NBL) have the best performance including low dark count rate (DCR), high photon detection efficiency (PDE), low jitter and reduced breakdown voltage comparing with the previous ones in our group. Possible reasons for the improvement are discussed and explained by the simulation on revised doping profiles of the layers. However, the dependence of jitter on the photon wavelength exhibits unusual behavior around 720 nm and calls for further studies in the future.
Mota, José Diogo Pereira Filgueiras da. "Optimised Design of High Voltage Lattice Transmission Towers." Dissertação, 2017. https://hdl.handle.net/10216/106196.
Повний текст джерелаMota, José Diogo Pereira Filgueiras da. "Optimised Design of High Voltage Lattice Transmission Towers." Master's thesis, 2017. https://hdl.handle.net/10216/106196.
Повний текст джерелаHuang, Jing Wen, and 黃靖文. "Gd2O3/La2O3 of High Breakdown Voltage GaN HEMT with Field-Plate Technology." Thesis, 2011. http://ndltd.ncl.edu.tw/handle/10577731565006749369.
Повний текст джерела長庚大學
電子工程學系
99
Gallium nitride is a binary III / V direct bandgap semiconductor. It’s wide band gap of 3.4 eV, high-power and high-frequency devices. GaN can work at much hotter temperatures and run at much higher voltages than gallium arsenide transistors. They are perfect materials for power amplifiers at microwave frequencies. The high breakdown is 140V of La2O3. On the other hand, Gmax is 132mS/mm of La2O3. The paper consists of several parts : introduction, analysis materials and current characteristic for oxide layers (Gd2O3/La2O3), electrostatic discharge test, and so on. We implanted different oxide layers on GaN. In this case, we’re particularly interested in improving the power performance by inserting the thin lanthanum/gadolinium oxide layer on the bottom of conventional Ni/Au gate in AlGaN/GaN HEMT fabrication. The dielectric constant of Gd2O3/La2O3 are about 21.49/30.45 which provide a high channel control ability in FET. Study on measurement of results and ESD. We found gold plating process, the ESD damages could be prevented.
Lin, Ruei-Ping, and 林芮萍. "Implementing Short-channel High-voltage Transistors Using Low-temperature a-InGaZnO Technology." Thesis, 2017. http://ndltd.ncl.edu.tw/handle/f3chp2.
Повний текст джерела國立交通大學
電子研究所
106
Recently, metal oxide semiconductors such as amorphous InGaZnO (a-IGZO) known as n-type semiconductors have been attracting significant attentions because of a variety of merits; in addition to good mobility、high device on/off current ratio and good uniformity, low processing temperature of a-IGZO thin-film transistors (TFTs) is important for flexible electronic devices and is compatible to the BEOL (Back End of Line) processes of CMOS logic circuits. As the CMOS technology aggressively scales, the voltage of power supply is continuously reduced to about 1V for low-power circuits. However, many applications such as automobile electronics, displays and home electronics still require high driving voltages. Thus, realizing on-chip bridging I/O circuits between high- and low-voltage devices becomes critical. The device for realizing high/low-voltage bridging I/O circuits typically operates at two different modes: high VG with low VD (Type-I) and low VG with high VD (Type-II). a-IGZO with a wide band gap oxide semiconductor is a good candidate for high-voltage device. On-chip bridging I/O circuits using the concept of monolithic three-dimensional (3D) integration of the a-IGZO technology in the BEOL process of logic circuits could potentially increase the integration density and reduce the cost. The figure of merit (FOM) of a high-voltage power device can be improved by increasing the device breakdown voltage (BV) and by reducing the device on-resistance (RON). Hence, scaling channel length of the a-IGZO TFT to reduce the RON is necessary. In this thesis, we successfully demonstrated short-channel devices using low-temperature a-IGZO to reduce the device RON and investigated the mechanism of on-current degradation in short-channel a-IGZO TFTs operated at high voltage. We observed that the threshold voltage (VTH) shifted toward more negatively as the channel length reduced or as VD in short-channel devices increased. This VTH shift phenomenon depended not only on the type of Schottky contacts, but also the oxidation of titanium contact. The oxidation of titanium generated a large number of oxygen vacancies and free electrons in a-IGZO and thus increased the conductivity of the a-IGZO channel. Another problem of short-channel a-IGZO TFTs is the reduced breakdown voltage at high VD. In contrast to long-channel devices, short-channel devices possess higher lateral electric field when applying the same VD, and the large portion of lateral voltage drops on the contact regions where channel and oxide breakdown could occur. Furthermore, we also observed an asymmetric degradation behavior of on-current in forward- and reverse-read modes before device breakdown. We also found two trends in the degradation of on-current under high VD: One was caused by the drift of oxygen ions toward drain and the other was induced by trapping/detrapping of electron at TiOx, which was oxidized from the Ti metal at the drain contact region. The influences of electron trapping/detrapping and drift of oxygen ion were more severe in short and long stress times in a-IGZO TFTs, respectively. Finally, the increased contact resistance induced by the drift of oxygen ions led to increased lateral electric field located near the drain contact and triggered the subsequent breakdown. The breakdown was not directly triggered by oxide breakdown, but was related to the hot carrier effect located at the drain contact. The reliability issues raised in this thesis should be continuously improved to enable the future high-voltage a-IGZO TFT technology.
Chen, Tzong-Liang, and 陳宗良. "The Fabrication and Characterization of Tunable Holding voltage Electrostatic Discharge (ESD) Protection Device for High Voltage Integrated Circuit Technology." Thesis, 2002. http://ndltd.ncl.edu.tw/handle/81601514683119457603.
Повний текст джерела國立清華大學
電子工程研究所
90
A novel SCR-like (Silicon-Controlled Rectifier) device, called tunable holding voltage SCR device, for latchup-free and on-chip protection against electrostatic discharge (ESD) stress at output pad of LCD driver is presented. This device’s structure consists of a parasitic SCR and a P-I-N diode. The holding voltage ( ) of this device is tunable and determined by the layout dimension between anode and floating- . The holding voltage ( ) ranges from 10.4 V to 15.6 V as the spacing increases from 0 mm to 4 mm. The capability of a protection circuit using this novel device is demonstrated the human-body mode (HBM) ESD failure threshold of an output buffer is larger than 7000 V.
Zheng, Zhiliang. "Low power high resolution data converter in digital CMOS technology." Thesis, 1999. http://hdl.handle.net/1957/33633.
Повний текст джерелаGraduation date: 1999
Chang, Hsiuang-Chung, and 張湘忠. "Design and Research of High Voltage P-channel Lateral DMOSFET in CMOS Technology." Thesis, 1998. http://ndltd.ncl.edu.tw/handle/32403611941623064445.
Повний текст джерела國立清華大學
電機工程研究所
86
The high-voltage lind driving function in most telecommunication systems and planar display circuits is performed by dedicated HVICs or external discrete high voltage components. However, high-voltage line drivers, when integrated with low-voltage signal processing circuits on a single chip, can eliminate most of the external circuitry and reduce power consumption while increasing reliability. Such advantages become more appealing when an advanced technology is empowered with high voltage capability providing both complex DSP and line driving function on single chip. To promote the performance of systems, Rsp and BV of high voltage devices are the major concerns in HVIC. The purpose of this work was to develop high performance 60V rated HVMOSFET employing RESURF principle and using as much of the existing conventional 1.0um CMOS process steps as possible. Here emphasis is on a methodology of developing a high performance HVMOSFET in a low-voltage logic circuit process. An up front modeling study using Medici and Tsuprem4 was completed to look at device performance vs. fabrication variables. The simulation results help the formation of the window of process parameters and the various geometry ranges of devices. The relationship of trade-off between BV and Rsp are certified by measured data from hardware. Response Surface Analysis was applied to help us to get a more sensitive view in relationship between performance of devices and process parameters and cell geometry
Hong, Bing-San, and 洪秉杉. "The Investigation of High Breakdown Voltage AlGaN/GaN HEMT with Field-Plate Technology." Thesis, 2008. http://ndltd.ncl.edu.tw/handle/p856b9.
Повний текст джерела長庚大學
電子工程學研究所
96
Pr2O3 high-k dioxide replacement materials have been demonstrated as the gate dielectric materials in AlGaN/GaN HEMT. The dielectric constant of and Pr2O3 are about 9.78 which provide a high channel control ability in FET. In this study, we are particularly interested in improving the power performance by inserting a thin praseodymium oxide (Pr2O3) layer on the bottom of conventional Ni/Au gate in AlGaN/GaN HEMT fabrication. It exhibits prolonged turn-on voltage, demonstrating its high swing probability, as compared with the conventional ones. The PAE enhances from 32.4% to 36.6%. And output power maximum enhances from 21.45 dBm to 21.48 dBm. A low-k benzocyclobutene (BCB) bridged and passivated layer for AlGaN/GaN high electron mobility transistors (HEMTs) with high reliability and linearity has been developed and characterized. In this study, we applied a low-k BCB-bridged interlayer to replace the conventional air-bridged process and the SiNx passivation technology of the 1 mm-wide power device fabrication. Furthermore, this novel technology has been qualified by using the 85–85 industrial specification (temperature = 85 oC, humidity = 85%) for 500 h. These results demonstrate a robust HEMT power device with a BCB passivation and bridged technology of future power device applications.
Peng, Chih-Hsiang, and 彭志翔. "Novel Voltage-Controlled Oscillators and High Performance Self-Oscillating Mixer Constructed with CMOS Technology." Thesis, 2006. http://ndltd.ncl.edu.tw/handle/67194518497801317422.
Повний текст джерела長庚大學
電子工程研究所
94
This thesis proposes three circuits and they are designed, implemented, and measured. These circuits include two complementary simplified cross–coupled VCOs and a self–oscillating mixer fabricated in TSMC 0.18 μm 1P6M CMOS process. The Ku–band oscillator at the center frequency of 15 GHz associated with about –5 dBm output power. Measured phase noise is –103.11 dBc/Hz at 1 MHz offset. The Ku–band VCO achieves the FOM of –178.2 dBc/Hz. The dual–band VCO core draws 2 mA of current from 1.5 V power supply voltage. Measured phase noise at 1 MHz offset is –117.94 dBc/Hz and –111.09 dBc/Hz in the 2.14 GHz and 4.5 GHz band. The dual–band VCO achieves FOMs of –179.8 and –179.4 dBc/Hz, respectively. The conversion gain of the self–oscillating mixer (SOM) is about 6 dB at 9.2 GHz RF frequency. Measured LO phase noise is –135.6 dBc/Hz at 1 MHz offset. The SOM achieves the FOM of –198.609 dBc/Hz.
Chang, Chia-Hung, and 張家宏. "A60-volt down to 5-volt DC Switching Converter using high-voltage CMOS technology." Thesis, 2016. http://ndltd.ncl.edu.tw/handle/93168278969829598886.
Повний текст джерела國立中興大學
電機工程學系所
104
The applications of portable electronic products are wide in the market, and consumers’ demands on the portable electronic products focuses on the smaller size, lighter weight and longer battery life. In order to fulfill all the consumers’ requirements, we need to integrate system into wafer. We reduce the power consumption of the system and use the voltage conversion circuit to supply different voltages required by the system to make the battery life longer. In facts, people usually use the portable electronic products in a particular time, it means only a little time the portable electronic product operates at heavy load current conditions, and most of the time portable electronic products are maintained in a standby mode and operates at light load conditions. To fulfill people’s behavior on using portable electronic products, we will design a system to reduce the power consumption when electronic products are operating at both light and heavy load current conditions and enhance the conversion efficiency of the overall system. The main purpose of this research is to achieve an applied voltage control mode buck converter regulator on portable electronic products. The regulator is available to various circuits of different voltages and when the system load changes, the regulator can automatically adjust the two power transistors’ switching time in order to make the system work efficiently and make the battery life of portable electronic products longer. Regulators simulation is the use of TSMC0.25um high-pressure processes to achieve circuit, the input voltage of 60V, an output voltage of 5V signals, the operating frequency of 400KHz, and the load current is 1A.
Kelly, Roger James. "The integration of a high voltage cable fault location instrument with modern information technology." Thesis, 2002. http://hdl.handle.net/10321/2853.
Повний текст джерелаModern society as a whole seems destined to have an ever-increasing demand for power for both industrial and domestic use, as continued population growth means that cities, suburbs and industrial areas become larger and denser. At the same time the trend toward increased productivity in all segments of industry is influencing the development and techniques employed at locating faults in power cables and networks to ensure only limited downtime and reduced direct and indirect costs associated with the location of faults
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