Статті в журналах з теми "HIGH-RESOLUTION TRANSMISSION ELECTON MICROSCOPE"
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Feuer, Helmut, Lothar Schröpfer, Hartmut Fuess, and David A. Jefferson. "High resolution transmission electron microscope study of exsolution in synthetic pigeonite." European Journal of Mineralogy 1, no. 4 (August 31, 1989): 507–16. http://dx.doi.org/10.1127/ejm/1/4/0507.
Повний текст джерелаKersker, M., C. Nielsen, H. Otsuji, T. Miyokawa, and S. Nakagawa. "The JSM-890 ultra high resolution Scanning Electron Microscope." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 88–89. http://dx.doi.org/10.1017/s0424820100152410.
Повний текст джерелаMöller, Lars, Gudrun Holland, and Michael Laue. "Diagnostic Electron Microscopy of Viruses With Low-voltage Electron Microscopes." Journal of Histochemistry & Cytochemistry 68, no. 6 (May 21, 2020): 389–402. http://dx.doi.org/10.1369/0022155420929438.
Повний текст джерелаGibson, J. M. "High Resolution Transmission Electron Microscopy." MRS Bulletin 16, no. 3 (March 1991): 27–33. http://dx.doi.org/10.1557/s0883769400057377.
Повний текст джерелаGamm, Björn, Holger Blank, Radian Popescu, Reinhard Schneider, André Beyer, Armin Gölzhäuser, and Dagmar Gerthsen. "Quantitative High-Resolution Transmission Electron Microscopy of Single Atoms." Microscopy and Microanalysis 18, no. 1 (December 12, 2011): 212–17. http://dx.doi.org/10.1017/s1431927611012232.
Повний текст джерелаSharma, Renu, Karl Weiss, Michael McKelvy, and William Glaunsinger. "Gas reaction chamber for gas-solid interaction studies by high-resolution TEM." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 494–95. http://dx.doi.org/10.1017/s0424820100170207.
Повний текст джерелаO'Keefe, Michael A., John H. Turner, John A. Musante, Crispin J. D. Hetherington, A. G. Cullis, Bridget Carragher, Ron Jenkins, et al. "Laboratory Design for High-Performance Electron Microscopy." Microscopy Today 12, no. 3 (May 2004): 8–17. http://dx.doi.org/10.1017/s1551929500052093.
Повний текст джерелаTonomura, Akira. "1-MV Field-Emission Transmission Electron Microscope." Microscopy and Microanalysis 7, S2 (August 2001): 918–19. http://dx.doi.org/10.1017/s143192760003066x.
Повний текст джерелаHiguchi, Tomohiro, Boping Liu, Hisayuki Nakatani, Nobuo Otsuka та Minoru Terano. "High resolution transmission electron microscope observation of α-TiCl3". Applied Surface Science 214, № 1-4 (травень 2003): 272–77. http://dx.doi.org/10.1016/s0169-4332(03)00517-8.
Повний текст джерелаSchatten, G., J. Pawley, and H. Ris. "Integrated microscopy resource for biomedical research at the university of wisconsin at madison." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 594–97. http://dx.doi.org/10.1017/s0424820100127451.
Повний текст джерелаO'Keefe, Michael A. "Letter to the Editor: Image Formation in the High-Resolution Transmission Electron Microscope." Microscopy and Microanalysis 10, no. 4 (August 2004): 397–99. http://dx.doi.org/10.1017/s1431927604211059.
Повний текст джерелаO'Keefe, Michael A. "The Optimum CS Condition for High-Resolution Transmission Electron Microscopy." Microscopy and Microanalysis 6, S2 (August 2000): 1036–37. http://dx.doi.org/10.1017/s1431927600037673.
Повний текст джерелаTAKAYANAGI, KUNIO, YOSHITAKA NAITOH, YOSHIFUMI OSHIMA, and MASANORI MITOME. "SURFACE TRANSMISSION ELECTRON MICROSCOPY ON STRUCTURES WITH TRUNCATION." Surface Review and Letters 04, no. 04 (August 1997): 687–94. http://dx.doi.org/10.1142/s0218625x97000687.
Повний текст джерелаSchneider, G. "High Resolution X-ray Microscopy of Frozen Hydrated Samples." Microscopy and Microanalysis 4, S2 (July 1998): 350–51. http://dx.doi.org/10.1017/s1431927600021875.
Повний текст джерелаNagatani, T. "High-resolution scanning electron microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 530–33. http://dx.doi.org/10.1017/s0424820100127244.
Повний текст джерелаO’Keefe, Michael A. "Alpha-Null Defocus: an Optimum Defocus Condition with Relevance for Focal-Series Reconstruction." Microscopy and Microanalysis 7, S2 (August 2001): 916–17. http://dx.doi.org/10.1017/s1431927600030658.
Повний текст джерелаIshikawa, Ryo, Yu Jimbo, Mitsuhisa Terao, Masashi Nishikawa, Yujiro Ueno, Shigeyuki Morishita, Masaki Mukai, Naoya Shibata, and Yuichi Ikuhara. "High spatiotemporal-resolution imaging in the scanning transmission electron microscope." Microscopy 69, no. 4 (April 3, 2020): 240–47. http://dx.doi.org/10.1093/jmicro/dfaa017.
Повний текст джерелаMartone, Maryann E. "Bridging the Resolution Gap: Correlated 3D Light and Electron Microscopic Analysis of Large Biological Structures." Microscopy and Microanalysis 5, S2 (August 1999): 526–27. http://dx.doi.org/10.1017/s1431927600015956.
Повний текст джерелаWells, Oliver C., and P. C. Cheng. "High-resolution backscattered electron images in the scanning electron microscope." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1608–9. http://dx.doi.org/10.1017/s0424820100132674.
Повний текст джерелаLentzen, M., B. Jahnen, C. L. Jia, and K. Urban. "High-Resolution Imaging with an Aberration-Corrected Transmission Electron Micrscope." Microscopy and Microanalysis 7, S2 (August 2001): 904–5. http://dx.doi.org/10.1017/s1431927600030592.
Повний текст джерелаLentzen, M., B. Jahnen, C. L. Jia, A. Thust, K. Tillmann, and K. Urban. "High-resolution imaging with an aberration-corrected transmission electron microscope." Ultramicroscopy 92, no. 3-4 (August 2002): 233–42. http://dx.doi.org/10.1016/s0304-3991(02)00139-0.
Повний текст джерелаMitome, Masanori, Yoshio Bando, Dmitri Golberg, Keiji Kurashima, Yoshihiro Okura, Toshikatsu Kaneyama, Mikio Naruse, and Yoshiaki Honda. "Nanoanalysis by a high-resolution energy filtering transmission electron microscope." Microscopy Research and Technique 63, no. 3 (2004): 140–48. http://dx.doi.org/10.1002/jemt.20025.
Повний текст джерелаPonce, F. A., S. Suzuki, H. Kobayashi, Y. Ishibashi, Y. Ishida, and T. Eto. "Ultra-high-vacuum, high-resolution Transmission Electron Microscopy at 400 kV." Proceedings, annual meeting, Electron Microscopy Society of America 44 (August 1986): 606–9. http://dx.doi.org/10.1017/s0424820100144498.
Повний текст джерелаTakayanagi, Kunio. "High-Resolution UHV Electron Microscopy of Reconstructed and Adsorbed Surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 298–99. http://dx.doi.org/10.1017/s0424820100180240.
Повний текст джерелаGoode, Angela E., Alexandra E. Porter, Mary P. Ryan, and David W. McComb. "Correlative electron and X-ray microscopy: probing chemistry and bonding with high spatial resolution." Nanoscale 7, no. 5 (2015): 1534–48. http://dx.doi.org/10.1039/c4nr05922k.
Повний текст джерелаZhang, Zhen, Man Ping Liu, Ying Da Yu, Pål C. Skaret, and Hans Jørgen Roven. "Microstructural Characterization of an Al-Mg-Si Aluminum Alloy Processed by Equal Channel Angular Pressing." Materials Science Forum 745-746 (February 2013): 303–8. http://dx.doi.org/10.4028/www.scientific.net/msf.745-746.303.
Повний текст джерелаCosandey, F. "High Spatial Resolution EBSD Study of Nanosized Epitaxial Particles." Microscopy and Microanalysis 3, S2 (August 1997): 559–60. http://dx.doi.org/10.1017/s1431927600009685.
Повний текст джерелаvan der Krift, Theo, Ulrike Ziese, Willie Geerts, and Bram Koster. "Computer-Controlled Transmission Electron Microscopy: Automated Tomography." Microscopy and Microanalysis 7, S2 (August 2001): 968–69. http://dx.doi.org/10.1017/s1431927600030919.
Повний текст джерелаMori, Hideharu, Tomohiro Higuchi, Nobuo Otsuka, and Minoru Terano. "High resolution transmission electron microscope observation of industrial high performance Ziegler catalysts." Macromolecular Chemistry and Physics 201, no. 18 (December 1, 2000): 2789–98. http://dx.doi.org/10.1002/1521-3935(20001201)201:18<2789::aid-macp2789>3.0.co;2-i.
Повний текст джерелаPonce, F. A., and M. A. O'Keefe. "Achieving atomic resolution in the Transmission Electron Microscope." Proceedings, annual meeting, Electron Microscopy Society of America 44 (August 1986): 522–25. http://dx.doi.org/10.1017/s0424820100144127.
Повний текст джерелаCarmichael, Stephen W. "Sub-Ångstrom Resolution." Microscopy Today 11, no. 6 (December 2003): 3–7. http://dx.doi.org/10.1017/s1551929500053372.
Повний текст джерелаIshizuka, Kazuo. "New form of Transmission Cross Coefficient for High-Resolution Imaging." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 60–61. http://dx.doi.org/10.1017/s0424820100179051.
Повний текст джерелаZaluzec, Nestor J. "The Scanning Confocal Electron Microscope." Microscopy Today 11, no. 6 (December 2003): 8–13. http://dx.doi.org/10.1017/s1551929500053384.
Повний текст джерелаXin, Yan, John Kynoch, Ke Han, Zhiyong Liang, Peter J. Lee, David C. Larbalestier, Yi-Feng Su, Kohei Nagahata, Toshihiro Aoki, and Paolo Longo. "Facility Implementation and Comparative Performance Evaluation of Probe-Corrected TEM/STEM with Schottky and Cold Field Emission Illumination." Microscopy and Microanalysis 19, no. 2 (March 5, 2013): 487–95. http://dx.doi.org/10.1017/s1431927612014298.
Повний текст джерелаScheinfein, M. R., J. S. Drucker, and J. K. Weiss. "The origins of high-resolution secondary-electron microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 766–67. http://dx.doi.org/10.1017/s0424820100149660.
Повний текст джерелаYoung, Richard, Todd Templeton, Laurent Roussel, Ingo Gestmann, Gerard van Veen, Trevor Dingle, and Sander Henstra. "Extreme High-Resolution SEM: A Paradigm Shift." Microscopy Today 16, no. 4 (July 2008): 24–29. http://dx.doi.org/10.1017/s1551929500059745.
Повний текст джерелаShimojo, Masayuki, Kazutaka Mitsuishi, M. Tanaka, M. Song, and Kazuo Furuya. "Electron Beam-Induced Nano-Deposition Using a Transmission Electron Microscope." Materials Science Forum 480-481 (March 2005): 129–32. http://dx.doi.org/10.4028/www.scientific.net/msf.480-481.129.
Повний текст джерелаMacLaren, Ian, Magnus Nord, Chengge Jiao, and Emrah Yücelen. "Liftout of High-Quality Thin Sections of a Perovskite Oxide Thin Film Using a Xenon Plasma Focused Ion Beam Microscope." Microscopy and Microanalysis 25, no. 1 (January 30, 2019): 115–18. http://dx.doi.org/10.1017/s1431927618016239.
Повний текст джерелаSinclair, Robert. "In situ High-Resolution Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 638–39. http://dx.doi.org/10.1017/s0424820100155165.
Повний текст джерелаVanderlinde, William. "Breaking the Resolution Barrier in the Scanning Electron Microscope." Microscopy Today 16, no. 6 (November 2008): 28–35. http://dx.doi.org/10.1017/s1551929500062350.
Повний текст джерелаDeRose, J. A., and J. P. Revel. "Examination of Atomic (Scanning) Force Microscopy Probe Tips with the Transmission Electron Microscope." Microscopy and Microanalysis 3, no. 3 (May 1997): 203–13. http://dx.doi.org/10.1017/s143192769797015x.
Повний текст джерелаBleeker, Arno J., and J. Murray Gibson. "Objective-lens design for high resolution ultra high vacuum EM." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 1 (August 1992): 292–93. http://dx.doi.org/10.1017/s0424820100121867.
Повний текст джерелаSmith, David J., M. Gajdardziska-Josifovska, and M. R. McCartney. "Surface studies with a UHV-TEM." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 1 (August 1992): 326–27. http://dx.doi.org/10.1017/s0424820100122034.
Повний текст джерелаHowe, J. M. "Quantitative in situ hot-stage high-resolution Transmission Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 758–59. http://dx.doi.org/10.1017/s0424820100171523.
Повний текст джерелаBentley, J., N. D. Evans, and E. A. Kenik. "Measurement of Scanning Electron Microscope resolution." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 1044–45. http://dx.doi.org/10.1017/s0424820100172954.
Повний текст джерелаChapman, J. N. "High resolution imaging of magnetic structures in the transmission electron microscope." Materials Science and Engineering: B 3, no. 4 (September 1989): 355–58. http://dx.doi.org/10.1016/0921-5107(89)90140-2.
Повний текст джерелаKuramochi, K., T. Yamazaki, N. Nakanishi, I. Hashimoto, and K. Watanabe. "Shape effect of microtwins on high-resolution transmission electron microscope images." physica status solidi (a) 205, no. 7 (May 26, 2008): 1602–5. http://dx.doi.org/10.1002/pssa.200723491.
Повний текст джерелаMorishita, Shigeyuki, Ryo Ishikawa, Yuji Kohno, Hidetaka Sawada, Naoya Shibata, and Yuichi Ikuhara. "Attainment of 40.5 pm spatial resolution using 300 kV scanning transmission electron microscope equipped with fifth-order aberration corrector." Microscopy 67, no. 1 (December 22, 2017): 46–50. http://dx.doi.org/10.1093/jmicro/dfx122.
Повний текст джерелаNguyen, Thao A., Linn W. Hobbs, and Peter R. Buseck. "High-Resolution Observation of Twinning in Fe1-XS Crystals." Proceedings, annual meeting, Electron Microscopy Society of America 43 (August 1985): 224–25. http://dx.doi.org/10.1017/s0424820100118047.
Повний текст джерелаGnauck, Peter, Claus Burkhardt, Erich Plies, and Wilfried Nisch. "In-Situ Ion Milling in the Transmission Electron Microscope (TEM) Outlook to a New Preparation Technique." Microscopy and Microanalysis 7, S2 (August 2001): 932–33. http://dx.doi.org/10.1017/s1431927600030737.
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