Статті в журналах з теми "High-Resolution Patterning"
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Harriott, L. R., P. A. Polakos, and C. E. Rice. "High‐resolution patterning of highTcsuperconductors." Applied Physics Letters 55, no. 5 (July 31, 1989): 495–97. http://dx.doi.org/10.1063/1.102429.
Повний текст джерелаKern, D. P. "High resolution patterning of high Tc superconductors." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 9, no. 6 (November 1991): 2875. http://dx.doi.org/10.1116/1.585616.
Повний текст джерелаBertino, M. F., J. F. Hund, J. Sosa, G. Zhang, C. Sotiriou-Leventis, N. Leventis, A. T. Tokuhiro, and J. Terry. "High resolution patterning of silica aerogels." Journal of Non-Crystalline Solids 333, no. 1 (January 2004): 108–10. http://dx.doi.org/10.1016/j.jnoncrysol.2003.09.039.
Повний текст джерелаIvanov, Z. G., P. A. Nilsson, E. K. Andersson, and T. Claeson. "High resolution patterning of high Tcsuperconducting thin films." Superconductor Science and Technology 4, no. 1S (January 1, 1991): S112—S114. http://dx.doi.org/10.1088/0953-2048/4/1s/023.
Повний текст джерелаHang, Qingling, Yuliang Wang, Marya Lieberman, and Gary H. Bernstein. "Molecular patterning through high-resolution polymethylmethacrylate masks." Applied Physics Letters 80, no. 22 (June 3, 2002): 4220–22. http://dx.doi.org/10.1063/1.1481784.
Повний текст джерелаShea-Rohwer, Lauren E., and James E. Martin. "Patterning Surfaces for High Resolution Self Alignment." Journal of The Electrochemical Society 159, no. 3 (2012): H317—H322. http://dx.doi.org/10.1149/2.091203jes.
Повний текст джерелаDai, Junyan, Seung Wook Chang, Alyssandrea Hamad, Da Yang, Nelson Felix, and Christopher K. Ober. "Molecular Glass Resists for High-Resolution Patterning." Chemistry of Materials 18, no. 15 (July 2006): 3404–11. http://dx.doi.org/10.1021/cm052452m.
Повний текст джерелаLo, Yi-Chen, Dawen Li, Zhenzhong Sun, Shoieb Shaik, and Xing Cheng. "High-resolution nondestructive patterning of isolated organic semiconductors." Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 30, no. 6 (November 2012): 06FB04. http://dx.doi.org/10.1116/1.4757956.
Повний текст джерелаWang, D. Z., S. N. Jayasinghe, and M. J. Edirisinghe. "High resolution print-patterning of a nano-suspension." Journal of Nanoparticle Research 7, no. 2-3 (June 2005): 301–6. http://dx.doi.org/10.1007/s11051-004-7772-8.
Повний текст джерелаDe Silva, Anuja, Nelson M. Felix, and Christopher K. Ober. "Molecular Glass Resists as High-Resolution Patterning Materials." Advanced Materials 20, no. 17 (September 3, 2008): 3355–61. http://dx.doi.org/10.1002/adma.200800763.
Повний текст джерелаRaman, Ritu, Basanta Bhaduri, Mustafa Mir, Artem Shkumatov, Min Kyung Lee, Gabriel Popescu, Hyunjoon Kong, and Rashid Bashir. "High-Resolution Projection Microstereolithography for Patterning of Neovasculature." Advanced Healthcare Materials 5, no. 5 (December 22, 2015): 610–19. http://dx.doi.org/10.1002/adhm.201500721.
Повний текст джерелаLiu, Xiangyu, Mohit Kumar, Annalisa Calo’, Edoardo Albisetti, Xiaouri Zheng, Kylie B. Manning, Elisabeth Elacqua, Marcus Weck, Rein V. Ulijn, and Elisa Riedo. "High-throughput protein nanopatterning." Faraday Discussions 219 (2019): 33–43. http://dx.doi.org/10.1039/c9fd00025a.
Повний текст джерелаSirringhaus, H., T. Kawase, and R. H. Friend. "High-Resolution Ink-Jet Printing of All-Polymer Transistor Circuits." MRS Bulletin 26, no. 7 (July 2001): 539–43. http://dx.doi.org/10.1557/mrs2001.127.
Повний текст джерелаWoo, Seung A., Ji Young Park, Su Min Kim, and Jin-Baek Kim. "Interface imaging process for high resolution and high aspect ratio patterning." European Polymer Journal 49, no. 6 (June 2013): 1707–13. http://dx.doi.org/10.1016/j.eurpolymj.2013.03.013.
Повний текст джерелаOcola, Leonidas E., Chad Rue, and Diederik Maas. "High-resolution direct-write patterning using focused ion beams." MRS Bulletin 39, no. 4 (April 2014): 336–41. http://dx.doi.org/10.1557/mrs.2014.56.
Повний текст джерелаMichel, Bruno, André Bernard, Alexander Bietsch, Emmanuel Delamarche, Mattias Geissler, David Juncker, Hannes Kind, et al. "Printing Meets Lithography: Soft Approaches to High-Resolution Patterning." CHIMIA International Journal for Chemistry 56, no. 10 (October 1, 2002): 527–42. http://dx.doi.org/10.2533/000942902777680207.
Повний текст джерелаFarjam, Nazanin, Tae H. Cho, Neil P. Dasgupta, and Kira Barton. "Subtractive patterning: High-resolution electrohydrodynamic jet printing with solvents." Applied Physics Letters 117, no. 13 (September 28, 2020): 133702. http://dx.doi.org/10.1063/5.0021038.
Повний текст джерелаNoguchi, Nobuaki, and Ikuo Suemune. "High-Resolution Patterning of Luminescent Porous Silicon with Photoirradiation." Japanese Journal of Applied Physics 33, Part 1, No. 1B (January 30, 1994): 590–93. http://dx.doi.org/10.1143/jjap.33.590.
Повний текст джерелаLercel, M. J. "High-resolution silicon patterning with self-assembled monolayer resists." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 14, no. 6 (November 1996): 4085. http://dx.doi.org/10.1116/1.588596.
Повний текст джерелаMichel, B., A. Bernard, A. Bietsch, E. Delamarche, M. Geissler, D. Juncker, H. Kind, et al. "Printing meets lithography: Soft approaches to high-resolution patterning." IBM Journal of Research and Development 45, no. 5 (September 2001): 697–719. http://dx.doi.org/10.1147/rd.455.0697.
Повний текст джерелаHu, J., J. Shi, F. Zhang, L. Lei, X. Li, L. Wang, L. Liu, and Y. Chen. "High resolution and hybrid patterning for single cell attachment." Microelectronic Engineering 87, no. 5-8 (May 2010): 726–29. http://dx.doi.org/10.1016/j.mee.2009.12.022.
Повний текст джерелаInglis, William, Martyn C. Davies, Clive J. Roberts, Saul J. B. Tendler, and Philip M. Williams. "Micro-Patterning of Polymers for High Resolution Microscopy Analysis." Microscopy and Microanalysis 7, S2 (August 2001): 128–29. http://dx.doi.org/10.1017/s1431927600026714.
Повний текст джерелаVieu, C., J. Gierak, H. Launois, T. Aign, P. Meyer, J. P. Jamet, J. Ferré, C. Chappert, V. Mathet, and H. Bernas. "High resolution magnetic patterning using Focused Ion Beam irradiation." Microelectronic Engineering 53, no. 1-4 (June 2000): 191–94. http://dx.doi.org/10.1016/s0167-9317(00)00294-x.
Повний текст джерелаChen, Yiqin, Quan Xiang, Zhiqin Li, Yasi Wang, Yuhan Meng, and Huigao Duan. "“Sketch and Peel” Lithography for High-Resolution Multiscale Patterning." Nano Letters 16, no. 5 (April 18, 2016): 3253–59. http://dx.doi.org/10.1021/acs.nanolett.6b00788.
Повний текст джерелаFallica, Roberto, Robert Kirchner, Helmut Schift, and Yasin Ekinci. "High-resolution grayscale patterning using extreme ultraviolet interference lithography." Microelectronic Engineering 177 (June 2017): 1–5. http://dx.doi.org/10.1016/j.mee.2017.01.007.
Повний текст джерелаPopovici, D., and M. Meunier. "Focusing method and apparatus for high-resolution projection patterning." Review of Scientific Instruments 72, no. 2 (2001): 1435. http://dx.doi.org/10.1063/1.1340019.
Повний текст джерелаHofmann, Mario, Ya-Ping Hsieh, Allen L. Hsu, and Jing Kong. "Scalable, flexible and high resolution patterning of CVD graphene." Nanoscale 6, no. 1 (2014): 289–92. http://dx.doi.org/10.1039/c3nr04968j.
Повний текст джерелаvan der Drift, E., B. A. C. Rousseeuw, J. Romijn, E. C. M. Pennings, and F. H. Groen. "High resolution patterning of aluminumoxide for intedrated optical devices." Microelectronic Engineering 9, no. 1-4 (May 1989): 499–502. http://dx.doi.org/10.1016/0167-9317(89)90109-3.
Повний текст джерелаWiesner, Markus, and Jürgen Ihlemann. "High resolution patterning of sapphire by F2-laser ablation." Applied Physics A 103, no. 1 (March 3, 2011): 51–58. http://dx.doi.org/10.1007/s00339-011-6347-7.
Повний текст джерелаKoslovsky, O., S. Yochelis, N. Livneh, M. G. Harats, R. Rapaport, and Y. Paltiel. "Simple Method for Surface Selective Adsorption of Semiconductor Nanocrystals with Nanometric Resolution." Journal of Nanomaterials 2012 (2012): 1–5. http://dx.doi.org/10.1155/2012/938495.
Повний текст джерелаKrasnoperova, Azalia A. "A novel technique for high aspect ratio high resolution patterning of membranes." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 13, no. 6 (November 1995): 3061. http://dx.doi.org/10.1116/1.588322.
Повний текст джерелаShimada, Hisayuki, Shigeki Shimomura, Kouichi Hirose, and Tadahiro Ohmi. "High-Sensitivity and High-Resolution Contact Hole Patterning by Enhanced-Wettability Developer." Japanese Journal of Applied Physics 32, Part 1, No. 1B (January 30, 1993): 347–51. http://dx.doi.org/10.1143/jjap.32.347.
Повний текст джерелаPark, Won-Tae, and Yong-Young Noh. "A self-aligned high resolution patterning process for large area printed electronics." Journal of Materials Chemistry C 5, no. 26 (2017): 6467–70. http://dx.doi.org/10.1039/c7tc01590a.
Повний текст джерелаRuhmer, Klaus, Philippe Cochet, Roger McCleary, and Nelson Chen. "High Resolution Patterning Technology to enable Panel Based Advanced Packaging." International Symposium on Microelectronics 2014, no. 1 (October 1, 2014): 000129–36. http://dx.doi.org/10.4071/isom-ta53.
Повний текст джерелаChen, Y., F. Carcenac, F. Rousseaux, A. M. Haghiri, and H. Launois. "High Resolution X-ray Lithography: Features of Two-dimensional Patterning." Journal of Photopolymer Science and Technology 10, no. 4 (1997): 619–23. http://dx.doi.org/10.2494/photopolymer.10.619.
Повний текст джерелаMüller, J., R. Perrone, K. H. Drüe, R. Stephan, J. Trabert, M. Hein, D. Schwanke, et al. "Comparison of High-Resolution Patterning Technologies for LTCC Microwave Circuits." Journal of Microelectronics and Electronic Packaging 4, no. 3 (July 1, 2007): 99–104. http://dx.doi.org/10.4071/1551-4897-4.3.99.
Повний текст джерелаNewman, T. H. "High resolution patterning system with a single bore objective lens." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 5, no. 1 (January 1987): 88. http://dx.doi.org/10.1116/1.583934.
Повний текст джерелаOleksak, Richard P., Rose E. Ruther, Feixiang Luo, Kurtis C. Fairley, Shawn R. Decker, William F. Stickle, Darren W. Johnson, Eric L. Garfunkel, Gregory S. Herman, and Douglas A. Keszler. "Chemical and Structural Investigation of High-Resolution Patterning with HafSOx." ACS Applied Materials & Interfaces 6, no. 4 (February 17, 2014): 2917–21. http://dx.doi.org/10.1021/am405463u.
Повний текст джерелаCalvert, Jeffrey M. "Deep ultraviolet patterning of monolayer films for high resolution lithography." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 9, no. 6 (November 1991): 3447. http://dx.doi.org/10.1116/1.585820.
Повний текст джерелаLiu, Juan, Qi Wei, and Liyuan Wang. "An i-line molecular glass photoresist for high resolution patterning." RSC Advances 3, no. 48 (2013): 25666. http://dx.doi.org/10.1039/c3ra45130e.
Повний текст джерелаFelix, N. M., K. Tsuchiya, and C. K. Ober. "High-Resolution Patterning of Molecular Glasses Using Supercritical Carbon Dioxide." Advanced Materials 18, no. 4 (February 17, 2006): 442–46. http://dx.doi.org/10.1002/adma.200501802.
Повний текст джерелаLiu, Xuying, Masayuki Kanehara, Chuan Liu, Kenji Sakamoto, Takeshi Yasuda, Jun Takeya, and Takeo Minari. "Spontaneous Patterning of High-Resolution Electronics via Parallel Vacuum Ultraviolet." Advanced Materials 28, no. 31 (May 17, 2016): 6568–73. http://dx.doi.org/10.1002/adma.201506151.
Повний текст джерелаJin, Xiaofan, and Ingmar H. Riedel-Kruse. "Biofilm Lithography enables high-resolution cell patterning via optogenetic adhesin expression." Proceedings of the National Academy of Sciences 115, no. 14 (March 19, 2018): 3698–703. http://dx.doi.org/10.1073/pnas.1720676115.
Повний текст джерелаLiu, Xuying, Masayuki Kanehara, Chuan Liu, Kenji Sakamoto, Takeshi Yasuda, Jun Takeya, and Takeo Minari. "High-Resolution Electronics: Spontaneous Patterning of High-Resolution Electronics via Parallel Vacuum Ultraviolet (Adv. Mater. 31/2016)." Advanced Materials 28, no. 31 (August 2016): 6768. http://dx.doi.org/10.1002/adma.201670218.
Повний текст джерелаJohnston, Lucy, Jiong Yang, Jialuo Han, Kourosh Kalantar-Zadeh, and Jianbo Tang. "Intermetallic wetting enabled high resolution liquid metal patterning for 3D and flexible electronics." Journal of Materials Chemistry C 10, no. 3 (2022): 921–31. http://dx.doi.org/10.1039/d1tc04877e.
Повний текст джерелаZhao, Xiang, Jiankang He, Fangyuan Xu, Yaxiong Liu, and Dichen Li. "Electrohydrodynamic printing: a potential tool for high-resolution hydrogel/cell patterning." Virtual and Physical Prototyping 11, no. 1 (January 2, 2016): 57–63. http://dx.doi.org/10.1080/17452759.2016.1139378.
Повний текст джерелаLin, Li, Yiyu Ou, Martin Aagesen, Flemming Jensen, Berit Herstrøm, and Haiyan Ou. "Time-Efficient High-Resolution Large-Area Nano-Patterning of Silicon Dioxide." Micromachines 8, no. 1 (January 4, 2017): 13. http://dx.doi.org/10.3390/mi8010013.
Повний текст джерелаJin, Hongzheng, and James C. Sturm. "Super-high-resolution transfer printing for full-color OLED display patterning." Journal of the Society for Information Display 18, no. 2 (2010): 141. http://dx.doi.org/10.1889/jsid18.2.141.
Повний текст джерелаKusaka, Yasuyuki, Masayoshi Koutake, and Hirobumi Ushijima. "High-resolution patterning of silver conductive lines by adhesion contrast planography." Journal of Micromechanics and Microengineering 25, no. 9 (August 6, 2015): 095002. http://dx.doi.org/10.1088/0960-1317/25/9/095002.
Повний текст джерелаStaver, A. Carla, Gregory P. Asner, Ignacio Rodriguez-Iturbe, Simon A. Levin, and Izak P. J. Smit. "Spatial patterning among savanna trees in high-resolution, spatially extensive data." Proceedings of the National Academy of Sciences 116, no. 22 (May 13, 2019): 10681–85. http://dx.doi.org/10.1073/pnas.1819391116.
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