Статті в журналах з теми "High refractive thin film"
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Zhang, Z. M., B. I. Choi, T. A. Le, M. I. Flik, M. P. Siegal, and J. M. Phillips. "Infrared Refractive Index of Thin YBa2Cu307 Superconducting Films." Journal of Heat Transfer 114, no. 3 (August 1, 1992): 644–52. http://dx.doi.org/10.1115/1.2911329.
Повний текст джерелаBRIDGES, A. S., R. GREEF, N. B. H. JONATHAN, A. MORRIS, and G. J. PARKER. "ELLIPSOMETRIC STUDIES OF VERY LOW PRESSURE THERMAL CVD GROWN SILICON NITRIDE THIN FILMS USING HYDRAZOIC ACID AND DICHLOROSILANE." Surface Review and Letters 01, no. 04 (December 1994): 573–76. http://dx.doi.org/10.1142/s0218625x94000692.
Повний текст джерелаWeng, L., and S. N. B. Hodgson. "Multicomponent tellurite thin film materials with high refractive index." Optical Materials 19, no. 3 (May 2002): 313–17. http://dx.doi.org/10.1016/s0925-3467(01)00228-2.
Повний текст джерелаDhanasekaran, V., T. Mahalingam, S. Rajendran, Jin Koo Rhee, and D. Eapen. "Electroplated CuO Thin Films from High Alkaline Solutions." Journal of New Materials for Electrochemical Systems 15, no. 1 (December 6, 2011): 49–55. http://dx.doi.org/10.14447/jnmes.v15i1.88.
Повний текст джерелаAl-Bataineh, Qais M., Mahmoud Telfah, Ahmad A. Ahmad, Ahmad M. Alsaad, Issam A. Qattan, Hakim Baaziz, Zoulikha Charifi, and Ahmad Telfah. "Synthesis, Crystallography, Microstructure, Crystal Defects, Optical and Optoelectronic Properties of ZnO:CeO2 Mixed Oxide Thin Films." Photonics 7, no. 4 (November 18, 2020): 112. http://dx.doi.org/10.3390/photonics7040112.
Повний текст джерелаSaekow, B., S. Porntheeraphat, Sakon Rahong, S. Jaruvanawat, and J. Nukeaw. "High Refractive Index Dielectric Prepared by Electron Beam Evaporation for Photonic Crystal Optical Biosensor Application." Advanced Materials Research 93-94 (January 2010): 545–48. http://dx.doi.org/10.4028/www.scientific.net/amr.93-94.545.
Повний текст джерелаWang, Sheng Zhao, Dan Zhang, Ming Ji Shi, Ying Peng Yin, Lan Li Chen, Peng Hui Luo, Yuan Xu, and Xin Feng Guo. "Sol-Gel Derived ZrO2-PVP Coatings with High Laser-Induced Damage Threshold." Solid State Phenomena 181-182 (November 2011): 370–73. http://dx.doi.org/10.4028/www.scientific.net/ssp.181-182.370.
Повний текст джерелаCheng, Ching Hsuang, Wan Yu Wu, and Jyh Ming Ting. "Nanoscaled Multilayer Thin Films Based on GZO." Journal of Nano Research 2 (August 2008): 61–67. http://dx.doi.org/10.4028/www.scientific.net/jnanor.2.61.
Повний текст джерелаATUCHIN, V. V., V. SH ALIEV, B. M. AYUPOV, and I. V. KOROLKOV. "DECREASED REFRACTIVE INDEX OF NANOCRYSTALLINE ZIRCONIUM OXIDE THIN FILMS." International Journal of Modern Physics B 26, no. 02 (January 20, 2012): 1250012. http://dx.doi.org/10.1142/s0217979211102101.
Повний текст джерелаKoo, Junmo, Jae Hyeok Jang, and Byeong-Soo Bae. "Preparation and characteristics of seeded epitaxial (Sr,Ba)Nb2O6 optical waveguide thin films using sol-gel method." Journal of Materials Research 16, no. 2 (February 2001): 430–36. http://dx.doi.org/10.1557/jmr.2001.0065.
Повний текст джерелаAbayli, D., and Nilgün Baydogan. "The variations of hydrophilic self-cleaning properties and refractive index dependence in the ZrO2 thin films by Gamma Irradiation." Characterization and Application of Nanomaterials 2, no. 2 (August 7, 2019): 42. http://dx.doi.org/10.24294/can.v2i2.627.
Повний текст джерелаCai, Haoyuan, Shihan Shan, and Xiaoping Wang. "High Sensitivity Surface Plasmon Resonance Sensor Based on Periodic Multilayer Thin Films." Nanomaterials 11, no. 12 (December 15, 2021): 3399. http://dx.doi.org/10.3390/nano11123399.
Повний текст джерелаJokanović, Vukoman, Božana Čolović, Miloš Nenadović, Anka Trajkovska Petkoska, Miodrag Mitrić, Bojan Jokanović, and Ilija Nasov. "Ultra-High and Near-Zero Refractive Indices of Magnetron Sputtered Thin-Film Metamaterials Based on TixOy." Advances in Materials Science and Engineering 2016 (2016): 1–9. http://dx.doi.org/10.1155/2016/4565493.
Повний текст джерелаMahdi, Safaa Mohsin. "Morphological and optical properties of V2O5:TiO2 thin film prepared by PLD technique." Iraqi Journal of Physics (IJP) 17, no. 43 (November 29, 2019): 67–76. http://dx.doi.org/10.30723/ijp.v17i43.464.
Повний текст джерелаKRISHNA, M. GHANASHYAM, and A. K. BHATTACHARYA. "THICKNESS AND OXYGEN PRESSURE DEPENDENT OPTICAL PROPERTIES OF NIOBIUM OXIDE THIN FILMS." International Journal of Modern Physics B 13, no. 04 (February 10, 1999): 411–18. http://dx.doi.org/10.1142/s0217979299000266.
Повний текст джерелаTakafuji, Makoto, Maino Kajiwara, Nanami Hano, Yutaka Kuwahara, and Hirotaka Ihara. "Preparation of High Refractive Index Composite Films Based on Titanium Oxide Nanoparticles Hybridized Hydrophilic Polymers." Nanomaterials 9, no. 4 (April 2, 2019): 514. http://dx.doi.org/10.3390/nano9040514.
Повний текст джерелаLee, Hanbin, Minjeong Park, Minhyon Jeon, and Byeongcheol Kim. "Multi-Layer Anti-Reflection Film Based on SiOx and NbOx by DC Pulse Sputter System with Inductively Coupled Plasma Source." Crystals 10, no. 6 (May 26, 2020): 424. http://dx.doi.org/10.3390/cryst10060424.
Повний текст джерелаPhelan, P. E., G. Chen, and C. L. Tien. "Thickness-Dependent Radiative Properties of Y-Ba-Cu-O Thin Films." Journal of Heat Transfer 114, no. 1 (February 1, 1992): 227–33. http://dx.doi.org/10.1115/1.2911251.
Повний текст джерелаChau, Joseph Lik Hang, Yu-Ming Lin, Ai-Kang Li, Wei-Fang Su, Kuo-Shin Chang, Steve Lien-Chung Hsu, and Tung-Lin Li. "Transparent high refractive index nanocomposite thin films." Materials Letters 61, no. 14-15 (June 2007): 2908–10. http://dx.doi.org/10.1016/j.matlet.2007.01.088.
Повний текст джерелаKayani, Zohra Nazir, Maryam Iqbal, Saira Riaz, Rehana Zia, and Shahzad Naseem. "Fabrication and properties of zinc oxide thin film prepared by sol-gel dip coating method." Materials Science-Poland 33, no. 3 (September 1, 2015): 515–20. http://dx.doi.org/10.1515/msp-2015-0085.
Повний текст джерелаTallant, David R., Karen L. Higgins, and Alan F. Stewart. "Application of Waveguide Raman Spectroscopy to High-Index Dielectric Films." Applied Spectroscopy 42, no. 2 (February 1988): 326–30. http://dx.doi.org/10.1366/0003702884428211.
Повний текст джерелаZhang, Gong, Xiuhua Fu, Shigeng Song, Kai Guo, and Jing Zhang. "Influences of Oxygen Ion Beam on the Properties of Magnesium Fluoride Thin Film Deposited Using Electron Beam Evaporation Deposition." Coatings 9, no. 12 (December 7, 2019): 834. http://dx.doi.org/10.3390/coatings9120834.
Повний текст джерелаRemashan, K., J. H. Jang, D. K. Hwang, and S. J. Park. "ZnO-based thin film transistors having high refractive index silicon nitride gate." Applied Physics Letters 91, no. 18 (October 29, 2007): 182101. http://dx.doi.org/10.1063/1.2804566.
Повний текст джерелаMöls, Kristel, Lauri Aarik, Hugo Mändar, Aarne Kasikov, Taivo Jõgiaas, Aivar Tarre та Jaan Aarik. "Influence of α-Al2O3 Template and Process Parameters on Atomic Layer Deposition and Properties of Thin Films Containing High-Density TiO2 Phases". Coatings 11, № 11 (21 жовтня 2021): 1280. http://dx.doi.org/10.3390/coatings11111280.
Повний текст джерелаTing, Chu Chi, and Sie Ping Chang. "Structural and Optical Properties of ZnO Nanorods Thin Films by Solution-Growth Method." Advanced Materials Research 225-226 (April 2011): 597–600. http://dx.doi.org/10.4028/www.scientific.net/amr.225-226.597.
Повний текст джерелаKim, Do Heung, Wontae Jang, Keonwoo Choi, Ji Sung Choi, Jeffrey Pyun, Jeewoo Lim, Kookheon Char, and Sung Gap Im. "One-step vapor-phase synthesis of transparent high refractive index sulfur-containing polymers." Science Advances 6, no. 28 (July 2020): eabb5320. http://dx.doi.org/10.1126/sciadv.abb5320.
Повний текст джерелаATUCHIN, V. V., T. KHASANOV, V. A. KOCHUBEY, L. D. POKROVSKY та T. A. GAVRILOVA. "STRUCTURAL AND OPTICAL PROPERTIES OF γ-MO2N THIN FILMS DEPOSITED BY DC REACTIVE MAGNETRON SPUTTERING". International Journal of Modern Physics B 23, № 23 (20 вересня 2009): 4817–23. http://dx.doi.org/10.1142/s0217979209053813.
Повний текст джерелаChu, Ann Kuo, and Wei Chen Tien. "Conductive Distributed Bragg Reflector Fabricated at Low Temperature." Applied Mechanics and Materials 421 (September 2013): 364–68. http://dx.doi.org/10.4028/www.scientific.net/amm.421.364.
Повний текст джерелаTien, Chuen-Lin, Kuan-Po Chen, and Hong-Yi Lin. "Internal Stress Prediction and Measurement of Mid-Infrared Multilayer Thin Films." Materials 14, no. 5 (February 26, 2021): 1101. http://dx.doi.org/10.3390/ma14051101.
Повний текст джерелаBASANTAKUMAR SHARMA, H. "STRUCTURAL AND OPTICAL PROPERTIES OF SOL-GEL DERIVED BARIUM TITANATE THIN FILM." International Journal of Modern Physics B 21, no. 11 (April 30, 2007): 1837–49. http://dx.doi.org/10.1142/s0217979207037028.
Повний текст джерелаZarchi, Meysam, Shahrokh Ahangarani, and Maryam Zare Sanjari. "Properties of Silicon Dioxide Film Deposited By PECVD at Low Temperature/Pressure." Metallurgical and Materials Engineering 20, no. 2 (July 30, 2014): 89–96. http://dx.doi.org/10.5937/metmateng1402089m.
Повний текст джерелаTao, Longbiao, Shuo Deng, Hongyun Gao, Haifei Lv, Xiaoyan Wen, and Min Li. "Experimental Investigation of the Dielectric Constants of Thin Noble Metallic Films Using a Surface Plasmon Resonance Sensor." Sensors 20, no. 5 (March 9, 2020): 1505. http://dx.doi.org/10.3390/s20051505.
Повний текст джерелаNi, Jia Miao, and Qi Bin Gu. "Optimization of Optical Properties of SiO2/TiO2/SiO2 Multilayer Films." Key Engineering Materials 509 (April 2012): 294–302. http://dx.doi.org/10.4028/www.scientific.net/kem.509.294.
Повний текст джерелаEl-Nahhas, M. M., H. Abdel-Khalek, and E. Salem. "Structural and Optical Properties of Nanocrystalline 3,4,9,10-Perylene-Tetracarboxylic-Diimide Thin Film." Advances in Condensed Matter Physics 2012 (2012): 1–7. http://dx.doi.org/10.1155/2012/698934.
Повний текст джерелаWang, Sheng Zhao, Li Na Zhang, Chun Juan Nan, and Da Yong Huang. "Effect of Precursor Concentration on the Ideal ZrO2 Sols and Thin Films." Key Engineering Materials 538 (January 2013): 69–72. http://dx.doi.org/10.4028/www.scientific.net/kem.538.69.
Повний текст джерелаTien, Chuen-Lin, Tzu-Chi Mao, and Chi-Yuan Li. "Lossy Mode Resonance Sensors Fabricated by RF Magnetron Sputtering GZO Thin Film and D-Shaped Fibers." Coatings 10, no. 1 (January 1, 2020): 29. http://dx.doi.org/10.3390/coatings10010029.
Повний текст джерелаFu, Xiu Hua, Yong Gang Pan, Dong Mei Liu, Jing Zhang, and Xiao Juan Wang. "Research of Thin Film for Laser Polarization Beam Splitter." Key Engineering Materials 645-646 (May 2015): 381–87. http://dx.doi.org/10.4028/www.scientific.net/kem.645-646.381.
Повний текст джерелаPotter, B. G., D. Dimos, and M. B. Sinclair. "Waveguide refractometry as a probe of thin film optical uniformity." Journal of Materials Research 12, no. 2 (February 1997): 546–51. http://dx.doi.org/10.1557/jmr.1997.0078.
Повний текст джерелаGrigoriev, F. V., V. B. Sulimov, and A. V. Tikhonravov. "Structure and properties of the low-energy deposited TiO2 thin films: results of the molecular dynamics simulation." Journal of Physics: Conference Series 2015, no. 1 (November 1, 2021): 012051. http://dx.doi.org/10.1088/1742-6596/2015/1/012051.
Повний текст джерелаLI, HONGXIA, XIN WU, RENGUO SONG, and JIYANG WANG. "OPTICAL WAVEGUIDE FABRICATION AND REFRACTIVE INDEX CHARACTERIZATION OF Nd:LuVO4 THIN FILMS BY PULSED LASER DEPOSITION." Surface Review and Letters 14, no. 06 (December 2007): 1079–82. http://dx.doi.org/10.1142/s0218625x07010652.
Повний текст джерелаTien, Chuen-Lin, Hong-Yi Lin, and Shu-Hui Su. "High Sensitivity Refractive Index Sensor by D-Shaped Fibers and Titanium Dioxide Nanofilm." Advances in Condensed Matter Physics 2018 (2018): 1–6. http://dx.doi.org/10.1155/2018/2303740.
Повний текст джерелаLiu, Wen Ting, and Zheng Tang Liu. "Spectroscopic Ellipsometry Study on HfO2 Thin Films Deposited at Different RF Powers." Advanced Materials Research 287-290 (July 2011): 2165–68. http://dx.doi.org/10.4028/www.scientific.net/amr.287-290.2165.
Повний текст джерелаWelser, Roger E., Adam W. Sood, Jaehee Cho, E. Fred Schubert, Jennifer L. Harvey, Nibir K. Dhar, and Ashok K. Sood. "Nanostructured Transparent Conductive Oxides for Photovoltaic Applications." MRS Proceedings 1493 (2013): 23–28. http://dx.doi.org/10.1557/opl.2013.30.
Повний текст джерелаKashuba, A. I., B. Andriyevsky, I. V. Semkiv, H. A. Ilchuk, R. Y. Petrus, and Ya M. Storozhuk. "First-principle calculations of band energy structure of CdSe0.5S0.5 solid state solution thin films." Physics and Chemistry of Solid State 23, no. 1 (January 27, 2022): 52–56. http://dx.doi.org/10.15330/pcss.23.1.52-56.
Повний текст джерелаPrince and M. Zulfequar. "Study of optical properties of photo annealed solution based As2S3 chalcogenide glass thin films." IOP Conference Series: Materials Science and Engineering 1221, no. 1 (March 1, 2022): 012032. http://dx.doi.org/10.1088/1757-899x/1221/1/012032.
Повний текст джерелаIshino, Yuichi, and Hatsuo Ishida. "Grazing Angle Metal-Overlayer Infrared ATR Spectroscopy." Applied Spectroscopy 42, no. 7 (September 1988): 1296–302. http://dx.doi.org/10.1366/0003702884429959.
Повний текст джерелаKhemasiri, Narathon, Chanunthorn Chananonnawathorn, Mati Horprathum, Yossawat Rayanasukha, Darinee Phromyothin, Win Bunjongpru, Supanit Porntheeraphat, and Jiti Nukeaw. "Effect of Operated Pressure on Anticorrosive Behavior of Ta2O5 Thin Film Grown by D.C. Reactive Magnetron Sputtering System." Advanced Materials Research 802 (September 2013): 242–46. http://dx.doi.org/10.4028/www.scientific.net/amr.802.242.
Повний текст джерелаHammad, Abdel-wahab, Vattamkandathil, and Ansari. "Growth and Correlation of the Physical and Structural Properties of Hexagonal Nanocrystalline Nickel Oxide Thin Films with Film Thickness." Coatings 9, no. 10 (September 26, 2019): 615. http://dx.doi.org/10.3390/coatings9100615.
Повний текст джерелаCui, Zhichao, Haigang Hou, Shahid Hussain, Guiwu Liu, and Guanjun Qiao. "Study on Innovative Flexible Design Method for Thin Film Narrow Band-Pass Filters." Journal of Nanoelectronics and Optoelectronics 17, no. 1 (January 1, 2022): 112–20. http://dx.doi.org/10.1166/jno.2022.3176.
Повний текст джерелаŠtrbac, D. D., G. R. Strbac, G. Stojanovic, S. R. Lukic, and D. D. Petrovic. "Modification of some Optical and Mechanical Properties of Amorphous As-S-Se Thin Films by Copper Introduction." Advanced Materials Research 856 (December 2013): 267–71. http://dx.doi.org/10.4028/www.scientific.net/amr.856.267.
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