Увійти

Готові списки джерел за темами / High-Frequency acoustic microscopy / Статті в журналах

Щоб переглянути інші типи публікацій з цієї теми, перейдіть за посиланням: High-Frequency acoustic microscopy.

Статті в журналах з теми "High-Frequency acoustic microscopy"

Автор: Grafiati

Опубліковано: 11 січня 2025

Оформте джерело за APA, MLA, Chicago, Harvard та іншими стилями

Оберіть тип джерела:

Ознайомтеся з топ-50 статей у журналах для дослідження на тему "High-Frequency acoustic microscopy".

Біля кожної праці в переліку літератури доступна кнопка «Додати до бібліографії». Скористайтеся нею – і ми автоматично оформимо бібліографічне посилання на обрану працю в потрібному вам стилі цитування: APA, MLA, «Гарвард», «Чикаго», «Ванкувер» тощо.

Також ви можете завантажити повний текст наукової публікації у форматі «.pdf» та прочитати онлайн анотацію до роботи, якщо відповідні параметри наявні в метаданих.

Переглядайте статті в журналах для різних дисциплін та оформлюйте правильно вашу бібліографію.

1

Qiao, DongHai, ShunZhou Li, and ChengHao Wang. "High frequency acoustic microscopy with Fresnel zoom lens." Science in China Series G: Physics, Mechanics and Astronomy 50, no. 1 (February 2007): 41–52. http://dx.doi.org/10.1007/s11433-007-0002-5.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

2

Gailet, Jacqueline. "Scanning Acoustical Microscopy." Microscopy Today 2, no. 5 (August 1994): 26–28. http://dx.doi.org/10.1017/s155192950006630x.

Повний текст джерела

Анотація:

One of Olympus' not well known product in the American market is the UH3 Scanning Acoustic Microscope (SAM). This state of the art, highly versatile microscope has many applications from non-destructive imaging to biomedical analysis, to pharmaceutical applications to name a few areas of current industrial interest.The principle behind SAM is quite simple, and uses the basic physical laws of reflection. High frequency sound waves are mechanically produced by a piezoelectric crystal. A high voltage impulse spike starts the crystal vibrating at its preset resonant frequency emitting acoustical plane waves through a medium with a relatively high sound velocity such as sapphire. The waves are made to converge by a half-spherical lens at the bottom of the sapphire rod. The diameter of the lens is less than one millimeter and depends on the operating frequency. The lower the frequency, the larger is the diameter of the lens.

Стилі APA, Harvard, Vancouver, ISO та ін.

3

Kumon, R. E., I. Bruno, B. Heartwell, and E. Maeva. "Breast tissue characterization with high‐frequency scanning acoustic microscopy." Journal of the Acoustical Society of America 115, no. 5 (May 2004): 2376. http://dx.doi.org/10.1121/1.4780120.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

4

Anastasiadis, Pavlos, and Pavel V. Zinin. "High-Frequency Time-Resolved Scanning Acoustic Microscopy for Biomedical Applications." Open Neuroimaging Journal 12, no. 1 (December 31, 2018): 69–85. http://dx.doi.org/10.2174/1874440001812010069.

Повний текст джерела

Анотація:

High-frequency focused ultrasound has emerged as a powerful modality for both biomedical imaging and elastography. It is gaining more attention due to its capability to outperform many other imaging modalities at a submicron resolution. Besides imaging, high-frequency ultrasound or acoustic biomicroscopy has been used in a wide range of applications to assess the elastic and mechanical properties at the tissue and single cell level. The interest in acoustic microscopy stems from the awareness of the relationship between biomechanical and the underlying biochemical processes in cells and the vast impact these interactions have on the onset and progression of disease. Furthermore, ultrasound biomicroscopy is characterized by its non-invasive and non-destructive approach. This, in turn, allows for spatiotemporal studies of dynamic processes without the employment of histochemistry that can compromise the integrity of the samples. Numerous techniques have been developed in the field of acoustic microscopy. This review paper discusses high-frequency ultrasound theory and applications for both imaging and elastography.

Стилі APA, Harvard, Vancouver, ISO та ін.

5

Murray, Todd W., and Oluwaseyi Balogun. "A novel approach to high‐frequency laser‐based acoustic microscopy." Journal of the Acoustical Society of America 116, no. 4 (October 2004): 2617. http://dx.doi.org/10.1121/1.4785436.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

6

Brand, Sebastian, Eike C. Weiss, Robert M. Lemor, and Michael C. Kolios. "High Frequency Ultrasound Tissue Characterization and Acoustic Microscopy of Intracellular Changes." Ultrasound in Medicine & Biology 34, no. 9 (September 2008): 1396–407. http://dx.doi.org/10.1016/j.ultrasmedbio.2008.01.017.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

7

Korkh, Yu V., D. V. Perov, and A. B. Rinkevich. "Detection of subsurface microflaws using the high-frequency acoustic microscopy method." Russian Journal of Nondestructive Testing 51, no. 4 (April 2015): 198–209. http://dx.doi.org/10.1134/s1061830915040051.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

8

Mario, Poschgan, Maynollo Josef, and Inselsbacher Michael. "Inverted high frequency Scanning Acoustic Microscopy inspection of power semiconductor devices." Microelectronics Reliability 52, no. 9-10 (September 2012): 2115–19. http://dx.doi.org/10.1016/j.microrel.2012.06.064.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

9

Xu, Chunguang, Lei He, Dingguo Xiao, Pengzhi Ma, and Qiutao Wang. "A Novel High-Frequency Ultrasonic Approach for Evaluation of Homogeneity and Measurement of Sprayed Coating Thickness." Coatings 10, no. 7 (July 15, 2020): 676. http://dx.doi.org/10.3390/coatings10070676.

Повний текст джерела

Анотація:

A high-frequency ultrasonic approach for testing and evaluating sprayed coating thickness is proposed in this paper. This technique is based on the maximum frequency interval method of the magnitude spectrum of the acoustic pressure reflection coefficient that adopts Welch spectrum estimation. The acoustic propagation model was set up at normal incidence, and the relationship between the maximum frequency interval by the Welch power spectrum and the coating thickness was established to provide the principle for determining coating thickness. According to this principle, the thickness of a series of stainless steel coatings and ZrO2–Y2O3 (yttria-stabilized zirconia (YSZ)) coatings were detected by scanning acoustic microscopy. The relative error was less than 4% with the microscope method, indicating that the proposed ultrasonic method provides a reliable nondestructive way to measure sprayed coating thickness. The uniformity of the sprayed coating thickness could be intuitively observed from C-scan images by programming.

Стилі APA, Harvard, Vancouver, ISO та ін.

10

Briggs, Andrew, and Oleg Kolosov. "Acoustic Microscopy for Imaging and Characterization." MRS Bulletin 21, no. 10 (October 1996): 30–35. http://dx.doi.org/10.1557/s0883769400031614.

Повний текст джерела

Анотація:

Acoustic microscopy is useful for characterizing with high spatial resolution the elastic structure and properties of an object. A range of techniques is now available for doing this, which enables the user to select the method and instrument that is most appropriate for a particular requirement. For imaging the interior of structures such as electronic-component packaging, an acoustic microscope operating at a relatively modest frequency can provide advanced nondestructive testing. For characterizing surface coatings and layers that may be only a fraction of a micrometer thick, higher frequency quantitative techniques are needed. For a given application, three questions should be asked at the outset: (1) What depth of material do I wish to include in my inspection? (2) Do I wish to image structures and/or defects, or do I wish to characterize elastic properties? (3) What is the minimum size of a defect or inhomogeneity that I wish to resolve or characterize (at a given depth) during my inspection? Selection of the appropriate technique will depend on the answers.

Стилі APA, Harvard, Vancouver, ISO та ін.

11

Liu, Zhong Zhu, Chun Guang Xu, Xin Yu Zhao, and Xiang Hui Guo. "Development of a Practical Scanning Acoustic Microscopy." Advanced Materials Research 468-471 (February 2012): 1128–31. http://dx.doi.org/10.4028/www.scientific.net/amr.468-471.1128.

Повний текст джерела

Анотація:

Scanning acoustic microscopy (SAM) is a powerful non-destructive testing tool used in electronic, material and medical testing area. Commercial SAM products are generally too expensive to be extended to common users. Therefore, a practical SAM system had been developed using high-frequency ultrasonic focus transducers, a wide-band pulse transmitter/receiver, a high-speed data acquisition card, and a high-precision motion system. The SAM system's precision and function can meet the requirement of practical test adequately, and the cost is much lower compared to commercial products. Several kinds of imaging method were introduced, and the SAM system has the ability to accomplish full-wave data acquisition.

Стилі APA, Harvard, Vancouver, ISO та ін.

12

SAFVI, AMJAD A., HAROLD J. MEERBAUM, SCOTT A. MORRIS, CAROL L. HARPER, and WILLIAM D. O'BRIEN. "Acoustic Imaging of Defects in Flexible Food Packages." Journal of Food Protection 60, no. 3 (March 1, 1997): 309–14. http://dx.doi.org/10.4315/0362-028x-60.3.309.

Повний текст джерела

Анотація:

A study was conducted using a high-frequency acoustic imaging system: the scanning laser acoustic microscope (SLAM), operating at 100 MHz, to detect packaging defects to within the system's resolution limit of 20 μm. The purpose of the study was to assess the feasibility of high-frequency acoustic imaging to detect and classify channel defects that would have the potential for microbial contamination through visually undetected defects. The SLAM can characterize and image various materials and defects by exploiting the differences in acoustic (mechanical) transmission properties within different materials. Channel defects transverse to the heat-seal major axis were fabricated by sandwiching 10-, 16-, 25-, and 37-μm wire between two layers of either polyethylene or plastic retort-pouch laminate film which were then heat sealed. The wire was then pulled out, leaving a channel filled variously with saline solution, air, or both. The channel defects were then assessed using the SLAM and validated with confocal microscopy. The results indicate that the SLAM technology can readily detect channel defects as small as 10 μm, the smallest channel defects examined, which is one-half the imaging system stated resolution specification. This study has clearly demonstrated that acoustic microscopy can nondestructively image micrometer-scale channel defects in heat seals at and smaller than the SLAM's resolution limit.

Стилі APA, Harvard, Vancouver, ISO та ін.

13

Rohrbach, Daniel, and Jonathan Mamou. "Autoregressive Signal Processing Applied to High-Frequency Acoustic Microscopy of Soft Tissues." IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control 65, no. 11 (November 2018): 2054–72. http://dx.doi.org/10.1109/tuffc.2018.2869876.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

14

Weiss, Eike C., Pavlos Anastasiadis, Gotz Pilarczyk, Robert M. Lemor, and Pavel V. Zinin. "Mechanical Properties of Single Cells by High-Frequency Time-Resolved Acoustic Microscopy." IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control 54, no. 11 (November 2007): 2257–71. http://dx.doi.org/10.1109/tuffc.2007.530.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

15

Hesjedal, T., H. J. Fröhlich, and E. Chilla. "Force microscopy for the investigation of high-frequency surface acoustic wave devices." Applied Physics A: Materials Science & Processing 66, no. 7 (March 1, 1998): S325—S328. http://dx.doi.org/10.1007/s003390051155.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

16

Peng, Kai, Chun Guang Xu, Xiang Hui Guo, and Ding Guo Xiao. "Detection Resolution of Acoustic Microscopy in Micro-Scale." Applied Mechanics and Materials 455 (November 2013): 448–54. http://dx.doi.org/10.4028/www.scientific.net/amm.455.448.

Повний текст джерела

Анотація:

Scanning acoustic microscopy (SAM) is a powerful non-destructive testing tool used in the field of electronic package, micro-and nanomaterial and medication. The capability to distinct how minimum of defect is very important to detect the flaw in electronic packages. The detection resolution of SAM depends on the frequency of ultrasonic focus transducers. In this paper, the Multi-Gaussian Beam model to simulate the sound field of the focused transducers is discussed. Mainly the frequency domain imaging algorithm and 2D-Deconvolution method for better image quality and high resolution is analyzed. Finally, the calibration experiments for the detection resolution of 100MHZ transducer is carried out. In addition, the micro flaws with different dimensions are observed at different defocusing location. It is concluded that the detection resolution decreases with the deviating from focus plane, so the flaws should be sensitive on the focus area by precisely controlling the vertical position for better detection resolution.

Стилі APA, Harvard, Vancouver, ISO та ін.

17

Moore, Thomas M. "Acoustic microscopy techniques for the inspection of integrated circuit devices and packages." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 966–67. http://dx.doi.org/10.1017/s0424820100129462.

Повний текст джерела

Анотація:

In the last decade, a variety of characterization techniques based on acoustic phenomena have come into widespread use. Characteristics of matter waves such as their ability to penetrate optically opaque solids and produce image contrast based on acoustic impedance differences have made these techniques attractive to semiconductor and integrated circuit (IC) packaging researchers.These techniques can be divided into two groups. The first group includes techniques primarily applied to IC package inspection which take advantage of the ability of ultrasound to penetrate deeply and nondestructively through optically opaque solids. C-mode Acoustic Microscopy (C-AM) is a recently developed hybrid technique which combines the narrow-band pulse-echo piezotransducers of conventional C-scan recording with the precision scanning and sophisticated signal analysis capabilities normally associated with the high frequency Scanning Acoustic Microscope (SAM). A single piezotransducer is scanned over the sample and both transmits acoustic pulses into the sample and receives acoustic echo signals from the sample.

Стилі APA, Harvard, Vancouver, ISO та ін.

18

Endo, Tomio, Yasuo Sasaki, Takeshi Yamagishi, and Mitsugu Sakai. "Determination of Sound Velocities by High Frequency ComplexV(z) Measurement in Acoustic Microscopy." Japanese Journal of Applied Physics 31, S1 (January 1, 1992): 160. http://dx.doi.org/10.7567/jjaps.31s1.160.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

19

Sagar, S. Palit, C. Miyasaka, M. Ghosh, and B. R. Tittmann. "NDE of friction stir welds of Al alloys using high-frequency acoustic microscopy." Nondestructive Testing and Evaluation 27, no. 4 (April 25, 2012): 375–89. http://dx.doi.org/10.1080/10589759.2012.656638.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

20

Morsch, A., A. Quinten, S. Pangraz, W. Arnold, and P. Höller. "Recent progress in high-frequency ultrasonics in non-destructive testing and acoustic microscopy." Nuclear Engineering and Design 128, no. 1 (July 1991): 83–89. http://dx.doi.org/10.1016/0029-5493(91)90252-d.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

21

Saikouk, Hajar, Didier Laux, Emmanuel Le Clézio, Brigitte Lacroix, Karine Audic, Rodrigue Largenton, Eric Federici, and Gilles Despaux. "High frequency acoustic microscopy imaging of pellet cladding interface in nuclear fuel rods." Nuclear Engineering and Design 417 (February 2024): 112844. http://dx.doi.org/10.1016/j.nucengdes.2023.112844.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

22

Moore, Michael J., Filip Bodera, Christopher Hernandez, Niloufar Shirazi, Eric Abenojar, Agata A. Exner, and Michael C. Kolios. "The dance of the nanobubbles: detecting acoustic backscatter from sub-micron bubbles using ultra-high frequency acoustic microscopy." Nanoscale 12, no. 41 (2020): 21420–28. http://dx.doi.org/10.1039/d0nr05390b.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

23

Mnari, M., B. Cros, M. Amlouk, S. Belgacem, and D. Barjon. "Study of the elastic properties of sprayed SnO2 and SnS2 layers." Canadian Journal of Physics 77, no. 9 (February 1, 2000): 705–15. http://dx.doi.org/10.1139/p99-023.

Повний текст джерела

Анотація:

SnO2 and SnS2 thin films have been prepared by the spray pyrolysis technique for photovoltaic application purposes and characterized by high-frequency acoustic microscopy (570 MHz).The surface acoustic images reveal contrasts explained by differences in topography according to atomic force microscopy studies. The acoustic signature V(z) of the systemslayer/substrate were modelled and refined to fit with the experimental V(z). The acoustic parameters of the layers were calculated using the results of the final simulation. The values of Young's modulus deduced from the acoustic parameters, 401 and 56 GPa for SnO2 and SnS2, respectively, are discussed in relation with the chemical structure and bonding involved. PACS Nos.: 43.35Ns and 62.65

Стилі APA, Harvard, Vancouver, ISO та ін.

24

Ramanathan, Shriram, and David G. Cahill. "High-resolution picosecond acoustic microscopy for non-invasive characterization of buried interfaces." Journal of Materials Research 21, no. 5 (May 1, 2006): 1204–8. http://dx.doi.org/10.1557/jmr.2006.0141.

Повний текст джерела

Анотація:

Non-destructive investigation of buried interfaces at high-resolution is critical for integrated circuit and advanced packaging research and development. In this letter, we present a novel non-contact microscopy technique using ultrahigh frequency (GHz range) longitudinal acoustic pulses to form images of interfaces and layers buried deep inside a silicon device. This method overcomes fundamental limitations of conventional scanning acoustic microscopy by directly generating and detecting the acoustic waves on the surface of the sample using an ultrafast pump-probe optical technique. We demonstrate our method by imaging copper lines buried beneath a 6-μm silicon wafer; the lateral spatial resolution of 3 μm is limited by the laser spot size. In addition to the high lateral spatial resolution, the technique has picosecond (ps) time resolution and therefore will enable imaging individual interconnect layers in multi-layer stacked devices.

Стилі APA, Harvard, Vancouver, ISO та ін.

25

Cruz Valeriano, Edgar, José Juan Gervacio Arciniega, Christian Iván Enriquez Flores, Susana Meraz Dávila, Joel Moreno Palmerin, Martín Adelaido Hernández Landaverde, Yuri Lizbeth Chipatecua Godoy, Aime Margarita Gutiérrez Peralta, Rafael Ramírez Bon, and José Martín Yañez Limón. "Stochastic excitation for high-resolution atomic force acoustic microscopy imaging: a system theory approach." Beilstein Journal of Nanotechnology 11 (May 4, 2020): 703–16. http://dx.doi.org/10.3762/bjnano.11.58.

Повний текст джерела

Анотація:

In this work, a high-resolution atomic force acoustic microscopy imaging technique is developed in order to obtain the local indentation modulus at the nanoscale level. The technique uses a model that gives a qualitative relationship between a set of contact resonance frequencies and the indentation modulus. It is based on white-noise excitation of the tip–sample interaction and uses system theory for the extraction of the resonance modes. During conventional scanning, for each pixel, the tip–sample interaction is excited with a white-noise signal. Then, a fast Fourier transform is applied to the deflection signal that comes from the photodiodes of the atomic force microscopy (AFM) equipment. This approach allows for the measurement of several vibrational modes in a single step with high frequency resolution, with less computational cost and at a faster speed than other similar techniques. This technique is referred to as stochastic atomic force acoustic microscopy (S-AFAM), and the frequency shifts of the free resonance frequencies of an AFM cantilever are used to determine the mechanical properties of a material. S-AFAM is implemented and compared with a conventional technique (resonance tracking-atomic force acoustic microscopy, RT-AFAM). A sample of a graphite film on a glass substrate is analyzed. S-AFAM can be implemented in any AFM system due to its reduced instrumentation requirements compared to conventional techniques.

Стилі APA, Harvard, Vancouver, ISO та ін.

26

Guo, Xiang Hui, Chun Guang Xu, Liu Yang, and Kai Peng. "Detection Resolution Analysis of Scanning Acoustic Microscopy Used in Electronic Packaging." Applied Mechanics and Materials 536-537 (April 2014): 272–75. http://dx.doi.org/10.4028/www.scientific.net/amm.536-537.272.

Повний текст джерела

Анотація:

Scanning Acoustic Microscopy (SAM) has been a powerful non-destructive testing tool used in electronic packaging and material characterization. With the development of 3D electronic packaging, internal dimensions of electronic packaging are getting more and more smaller, and the detection accuracy of existing non-destructive testing technology is far behind the requirements of manufacturing technology. In this study, a set of practical SAM system was developed independently by our Lab. And its detection resolution was analyzed using high frequency focused transducers with center frequency ranging from 20 MHz to 100MHz. The experimental results show that the lateral resolution of the ultrasonic transducer with 100MHz central frequency can reach about 40 microns, which is consistent with calculated resolution. Comparing with Sparrow criteria, Rayleigh criteria is more coherent with the experimental results.

Стилі APA, Harvard, Vancouver, ISO та ін.

27

Weiss, Eike C., Robert M. Lemor, Götz Pilarczyk, Pavlos Anastasiadis, and Pavel V. Zinin. "Imaging of Focal Contacts of Chicken Heart Muscle Cells by High-Frequency Acoustic Microscopy." Ultrasound in Medicine & Biology 33, no. 8 (August 2007): 1320–26. http://dx.doi.org/10.1016/j.ultrasmedbio.2007.01.016.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

28

Juntarapaso, Yada, and Richard L. Tutwiler. "Simulations for investigating contrast mechanism of biological cells with high‐frequency scanning acoustic microscopy." Journal of the Acoustical Society of America 127, no. 3 (March 2010): 1732. http://dx.doi.org/10.1121/1.3383455.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

29

Zinin, P. V., I. B. Kutuza, and S. A. Titov. "Near-Field Defects Imaging in Thin DLC Coatings Using High-Frequency Scanning Acoustic Microscopy." Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques 12, no. 6 (November 2018): 1285–93. http://dx.doi.org/10.1134/s1027451018050737.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

30

Roshchupkin, D. "Status of X-ray Acoustooptics at the Institute of Microelectronics Technology Russian Academy of Sciences." Journal of Physics: Conference Series 2657, no. 1 (November 1, 2023): 012002. http://dx.doi.org/10.1088/1742-6596/2657/1/012002.

Повний текст джерела

Анотація:

Abstract The electrical measurement method, scanning electron microscopy method and high-resolution X-ray diffraction method have been used to investigate the process of the surface acoustic wave (SAW) propagation in a LiNbO3 ferroelectric crystal. Measurement of the amplitude-frequency response provides information on the losses in the acoustoelectronic device during the process of the SAW propagation. The scanning electron microscopy method permits to visualize the SAW on the surface of piezoelectric crystals in the real-time mode and to observe diffraction phenomena in acoustic beam. The X-ray diffraction method is sensitive to the crystal lattice distortions by surface acoustic wave and allows determining the SAW amplitudes.

Стилі APA, Harvard, Vancouver, ISO та ін.

31

Miyasaka, C., and B. R. Tittmann. "Recent Advances in Acoustic Microscopy for Nondestructive Evaluation." Journal of Pressure Vessel Technology 122, no. 3 (April 12, 2000): 374–78. http://dx.doi.org/10.1115/1.556195.

Повний текст джерела

Анотація:

Driven by new demands from industry, the field of acoustic imaging is rapidly evolving new approaches to meet the demands. The current trend toward micro and nano-technology has been pushing the operating frequency of scanning acoustic microscopes (SAM), from MHz to GHz. To become a useful tool for nondestructive evaluation (NDE), the SAM must give high resolution and also maintain reasonable depth of field below the sample surface, while overcoming the effects of surface roughness. A recent trend of needs for the SAM is to enhance resolution for detecting defects (e.g., microcracks, inclusions, debondings, delaminations), and develop a capability and an accuracy for obtaining quantitative data (e.g., velocities of waves, attenuation) for measuring residual stress, anisotropy, thickness of thin films, or the like. Furthermore, the SAM is to be modified to use in various environments. In this paper, a principle and some applications for both a practical shear wave lens and a noncontact lens will be summarized. [S0094-9930(00)02503-8]

Стилі APA, Harvard, Vancouver, ISO та ін.

32

Anastasiadis, Pavlos, Kristina D. A. Mojica, John S. Allen, and Michelle L. Matter. "Detection and quantification of bacterial biofilms combining high-frequency acoustic microscopy and targeted lipid microparticles." Journal of Nanobiotechnology 12, no. 1 (2014): 24. http://dx.doi.org/10.1186/1477-3155-12-24.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

33

SEEMANN, K. M., F. KRONAST, A. HÖRNER, S. VALENCIA, A. WIXFORTH, A. V. CHAPLIK, and P. FISCHER. "ATTENUATION OF SURFACE ACOUSTIC WAVES BY SPIN–WAVE EXCITATIONS IN Co60Fe20B20." SPIN 04, no. 01 (March 2014): 1440005. http://dx.doi.org/10.1142/s2010324714400050.

Повний текст джерела

Анотація:

The acousto-magnetic attenuation of surface acoustic waves (SAW) in an Co 60 Fe 20 B 20 exchange spring magnet is evidenced experimentally. By high-resolution magnetic imaging using photo-excitation electron microscopy (XPEEM) and magnetometry measurements, the deflection of the ferromagnet from its equilibrium state is visualized. Along a harmonic oscillator model with damping term, the experimental observation of SAW attenuation is attributed to low-frequency spin wave generation in a magnetic exchange spring. Measuring the SAW attenuation at four eigenfrequencies generated via on-chip higher-harmonic generation, we obtain a sub-GHz resonance at f0 = 538 MHz.

Стилі APA, Harvard, Vancouver, ISO та ін.

34

Von Knorring, Terese, Niels Møller Israelsen, Vilde Ung, Julie L. Formann, Mikkel Jensen, Merete Hædersdal, Ole Bang, Gabriella Fredman, and Mette Mogensen. "Differentiation Between Benign and Malignant Pigmented Skin Tumours Using Bedside Diagnostic Imaging Technologies: A Pilot Study." Acta Dermato-Venereologica 102 (January 26, 2022): adv00634. http://dx.doi.org/10.2340/actadv.v101.571.

Повний текст джерела

Анотація:

Rapid diagnosis of suspicious pigmented skin lesions is imperative; however, current bedside skin imaging technologies are either limited in penetration depth or resolution. Combining imaging methods is therefore highly relevant for skin cancer diagnostics. This pilot study evaluated the ability of optical coherence tomography, reflectance confocal microscopy, photo-acoustic imaging and high-frequency ultrasound to differentiate malignant from benign pigmented skin lesions. A total of 41 pigmented skin tumours were scanned prior to excision. Morphological features and blood vessel characteristics were analysed with reflectance confocal microscopy, optical coherence tomography, high-frequency ultrasound and photoacoustic imaging images, and the diagnostic accuracy was assessed. Three novel photoacoustic imaging features, 7 reflectance confocal microscopy features, and 2 optical coherence tomography features were detected that had a high correlation with malignancy; diagnostic accuracy > 71%. No significant features were found in high-frequency ultrasound. In conclusion, optical coherence tomography, reflectance confocal microscopy and photoacoustic imaging in combination enable image-guided bedside evaluation of suspicious pigmented skin tumours. Combining these advanced techniques may enable more efficient diagnosis of skin cancer.

Стилі APA, Harvard, Vancouver, ISO та ін.

35

Morokov, Egor, Vadim Levin, Tatyana Ryzhova, Evgeny Dubovikov, Yulia Petronyuk, and Igor Gulevsky. "Bending damage evolution from micro to macro level in CFRP laminates studied by high-frequency acoustic microscopy and acoustic emission." Composite Structures 288 (May 2022): 115427. http://dx.doi.org/10.1016/j.compstruct.2022.115427.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

36

Yu, Xiaonan, Hairun Huang, Wanlong Xie, Jiefei Gu, Ke Li, and Lei Su. "Simulation Research on Sparse Reconstruction for Defect Signals of Flip Chip Based on High-Frequency Ultrasound." Applied Sciences 10, no. 4 (February 14, 2020): 1292. http://dx.doi.org/10.3390/app10041292.

Повний текст джерела

Анотація:

Flip chip technology has been widely used in various fields. As the density of the solder balls in flip chip technology is increasing, the pitch among solder balls is narrowing, and the size effect is more significant. Therefore, the micro defects of the solder balls are more difficult to detect. In order to ensure the reliability of the flip chip, it is very important to detect and evaluate the micro defects of solder balls. High-frequency ultrasonic testing technology is an effective micro-defect detection method. In this paper, the interaction mechanism between high-frequency ultrasonic pulse and micro defects is analyzed by finite element simulation. A transient simulation model for the whole process of ultrasonic scanning of micro defects is established to simulate scanning in acoustic microscopy imaging. The acoustic propagation path map is obtained for analyzing acoustic energy transmission during detection, and the edge blurring effect in micro-defect imaging detection is clarified. The processing method of the time-domain signal and cross-section image signal of micro defects based on sparse reconstruction is studied, which can effectively improve the accuracy of detection and the signal-to-noise ratio.

Стилі APA, Harvard, Vancouver, ISO та ін.

37

Chen, Jian, Xiaolong Bai, Keji Yang, and Bing-Feng Ju. "Angular measurement of acoustic reflection coefficients by the inversion of V(z, t) data with high frequency time-resolved acoustic microscopy." Review of Scientific Instruments 83, no. 1 (January 2012): 014901. http://dx.doi.org/10.1063/1.3677327.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

38

Zhang, Yan-nan, Wei Zhou, and Peng-fei Zhang. "Quasi-static indentation damage and residual compressive failure analysis of carbon fiber composites using acoustic emission and micro-computed tomography." Journal of Composite Materials 54, no. 2 (July 4, 2019): 229–42. http://dx.doi.org/10.1177/0021998319861140.

Повний текст джерела

Анотація:

In present research, the internal damage evolution and failure characteristics of carbon fiber woven composites under indentation and residual compressive loads were studied by using acoustic emission technology and X-ray micro-computed tomography. Real-time acoustic emission signals originating from internal damage of composites under applied loads were obtained and analyzed by the k-means clustering algorithm. Moreover, the internal damage characteristics were observed by the reconstructed three-dimensional model and the slice images of composite specimens. The results showed that the higher the indentation force reading, the more acoustic emission signals with high amplitude and frequency (over 300 kHz) are generated. Furthermore, the early acoustic emission signals with high-frequency were observed under residual compressive loads. It can be attributed to serious failures of fibers with the increase of static indentation loads. In addition, the internal damages such as delamination, debonding, crack and fiber breakage can be clearly characterized by micro-computed tomography and scanning electron microscopy observation. The complementary technology combing acoustic emission with micro-computed tomography can provide a better understanding of internal damages and evolution behaviors of the composites.

Стилі APA, Harvard, Vancouver, ISO та ін.

39

Marchetti, Mara, Didier Laux, Fabiola Cappia, M. Laurie, P. Van Uffelen, V. V. Rondinella, T. Wiss, and G. Despaux. "High Frequency Acoustic Microscopy for the Determination of Porosity and Young’s Modulus in High Burnup Uranium Dioxide Nuclear Fuel." IEEE Transactions on Nuclear Science 63, no. 3 (June 2016): 1520–25. http://dx.doi.org/10.1109/tns.2016.2552241.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

40

Morokov, Egor, Vadim Levin, Andrey Chernov, and Alexander Shanygin. "High resolution ply-by-ply ultrasound imaging of impact damage in thick CFRP laminates by high-frequency acoustic microscopy." Composite Structures 256 (January 2021): 113102. http://dx.doi.org/10.1016/j.compstruct.2020.113102.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

41

Juntarapaso, Yada, Chiaki Miyasaka, Richard L. Tutwiler, and Pavlos Anastasiadis. "Contrast Mechanisms for Tumor Cells by High-frequency Ultrasound." Open Neuroimaging Journal 12, no. 1 (December 31, 2018): 105–19. http://dx.doi.org/10.2174/1874440001812010105.

Повний текст джерела

Анотація:

Scanning Acoustic Microscopy (SAM) is a powerful technique for both the non-destructive determination of mechanical and elastic properties of biological specimens and for the ultrasonic imaging at a micrometer resolution. The implication of biomechanical properties during the onset and progression of disease has been established rendering a profound understanding of the relationship between mechanoelastic and biochemical signaling at a molecular level crucial. Computer simulation algorithms were developed for the generation of images and the investigation of contrast mechanisms in high-frequency and ultra-high frequency SAM. Furthermore, we determined the mechanical and elastic properties of HeLa and MCF-7 cells. Algorithms for simulatingV(z)responses were developed based on the ray and wave theory (angular spectrum). Theoretical simulations for high-frequency SAM array designs were performed with the Field II software. In these simulations, we applied phased array beam formation and dynamic apodization and focusing. The purpose of our transducer simulations was to explore volumetric imaging capabilities. The novel transducer arrays designed in this research aim at improving the performance of SAM systems by introducing electronic steering and hence, allowing for the 4D imaging of cells and tissues.

Стилі APA, Harvard, Vancouver, ISO та ін.

42

Cao, Pengxin, Xiaoqing Li, and Mingyue Ding. "A Fusion Method for Atomic Force Acoustic Microscopy Cell Imaging Based on Local Variance in Non-Subsampled Shearlet Transform Domain." Applied Sciences 10, no. 21 (October 22, 2020): 7424. http://dx.doi.org/10.3390/app10217424.

Повний текст джерела

Анотація:

Atomic force acoustic microscopy (AFAM) is a measurement method that uses the probe and acoustic wave to image the surface and internal structures of different materials. For cellular material, the morphology and phase images of AFAM reflect the outer surface and internal structures of the cell, respectively. This paper proposes an AFAM cell image fusion method in the Non-Subsampled Shearlet Transform (NSST) domain, based on local variance. First, NSST is used to decompose the source images into low-frequency and high-frequency sub-bands. Then, the low-frequency sub-band is fused by the weight of local variance, while a contrast limited adaptive histogram equalization is used to improve the source image contrast to better express the details in the fused image. The high-frequency sub-bands are fused using the maximum rule. Since the AFAM image background contains a lot of noise, and improved segmentation algorithm based on the Otsu algorithm is proposed to segment the cell region, and the image quality metrics based on the segmented region will make the evaluation more accurate. Experiments with different groups of AFAM cell images demonstrated that the proposed method can clearly show the internal structures and the contours of the cells, compared with traditional methods.

Стилі APA, Harvard, Vancouver, ISO та ін.

43

Kumon, Ronald E., John T. Bonhomme, Corneliu I. Rablau, and Timothy A. Stiles. "Design of a scanning acoustic and photoacoustic microscopy system using open-source hardware and software components." Journal of the Acoustical Society of America 151, no. 4 (April 2022): A246. http://dx.doi.org/10.1121/10.0011209.

Повний текст джерела

Анотація:

We have designed and started construction of an instrument that will be able to operate as both a scanning acoustic microscope and photoacoustic microscope. To keep costs down, we are using open-source hardware and software components wherever possible. The system is designed to scan specimens that are approximately 2 cm × 2 cm in lateral dimensions with lateral steps of 1 micron or less. When operating as a scanning acoustic microscope, the specimen will be water-coupled to a high-frequency ultrasound transducer operating in pulse-echo mode. When operating as a photoacoustic microscope, short light pulses infrared laser diode located under the specimen will generate ultrasound pulses thermoelastically, which will then be received by a confocal high-frequency transducer. In both cases, the specimen will be raster-scanned under the transducer by a moving stage. The mechanical scanning system was designed and built using a spring-loaded microscope stage, micrometers, stepper motors, a shield board used for 3D printers, an Arduino Mega microcontroller, and a Raspberry Pi 4 microcomputer. A graphical user interface has been written in Python using Tkinter to send the motion control commands to the stage. Future work will include incorporation of the laser and transducer control systems.

Стилі APA, Harvard, Vancouver, ISO та ін.

44

Oberhoff, S., K. Goetz, K. Trojan, M. Zoeller, and J. Glueck. "Application of high frequency scanning acoustic microscopy for the failure analysis and reliability assessment of MEMS sensors." Microelectronics Reliability 64 (September 2016): 656–59. http://dx.doi.org/10.1016/j.microrel.2016.07.108.

Повний текст джерела

Стилі APA, Harvard, Vancouver, ISO та ін.

45

Chu, Zhaodong, Lu Zheng, and Keji Lai. "Microwave Microscopy and Its Applications." Annual Review of Materials Research 50, no. 1 (July 1, 2020): 105–30. http://dx.doi.org/10.1146/annurev-matsci-081519-011844.

Повний текст джерела

Анотація:

Understanding the nanoscale electrodynamic properties of a material at microwave frequencies is of great interest for materials science, condensed matter physics, device engineering, and biology. With specialized probes, sensitive detection electronics, and improved scanning platforms, microwave microscopy has become an important tool for cutting-edge materials research in the past decade. In this article, we review the basic components and data interpretation of microwave imaging and its broad range of applications. In addition to the general-purpose mapping of permittivity and conductivity, microwave microscopy is now exploited to perform quantitative measurements on semiconductor devices, photosensitive materials, ferroelectric domains and domain walls, and acoustic-wave systems. Implementation of the technique in low-temperature and high-magnetic-field chambers has also led to major discoveries in quantum materials with strong correlation and topological order. We conclude the review with an outlook of the ultimate resolution, operation frequency, and future industrial and academic applications of near-field microwave microscopy.

Стилі APA, Harvard, Vancouver, ISO та ін.

46

Upendran, Anoop, and Krishnan Balasubramanian. "The influence of edge waves in local surface skimming longitudinal wave generation using a focused PVDF transducer." Journal of Applied Physics 132, no. 12 (September 28, 2022): 124501. http://dx.doi.org/10.1063/5.0100161.

Повний текст джерела

Анотація:

Acoustic microscopy is extensively used for high-frequency imaging and material characterization. In a focused ultrasonic transducer, the presence of edge waves from the edge of the transducer is usually considered a disadvantage. For high-frequency imaging applications, the edge waves adversely affect the quality of the image. This paper discusses edge wave's influence on generating a surface wave in bulk metal samples using a limited aperture PVDF transducer. Acoustic microscopy-based defocusing experiments are conducted on aluminum, stainless steel, copper, and brass samples. A detailed wave-path analysis is done to understand the different wave components in a signal as obtained from defocusing experiments. The travel path of each wave component is analytically obtained and compared with the experimental results. The different wave modes observed in the experiments are identified by overlaying the analytical plots on the experimentally obtained B-scans. A good correlation is obtained between the experimental and analytical results. The surface wave velocity of the samples is calculated using the time-resolved method, and the percentage of error in the measurement is estimated. The challenges for using this method in measuring surface wave velocities in samples with bulk longitudinal velocities [Formula: see text] are also discussed.

Стилі APA, Harvard, Vancouver, ISO та ін.

47

Strohm, Eric M., Di Wu, Dina Malounda, Rohit Nayak, Mikhail G. Shapiro, and Michael C. Kolios. "Pressure estimation of ultra-high frequency ultrasound using gas vesicles." Journal of the Acoustical Society of America 156, no. 6 (December 1, 2024): 4193–201. https://doi.org/10.1121/10.0034438.

Повний текст джерела

Анотація:

Acoustic microscopy uses ultra-high frequency (UHF) ultrasound transducers over 80 MHz to perform high-resolution imaging. The pressure output of these transducers is unknown, as commercial calibrated hydrophones can measure pressure for transducers with frequencies only up to 80 MHz. This study used gas vesicle nanostructures (GVs) that collapse at 571 kPa to estimate the pressure of UHF transducers at 40, 80, 200, and 375 MHz. Agarose phantoms containing GVs were made, and a baseline ultrasound image was performed at low pressure to prevent GV collapse. Sections within the phantom were scanned at varying voltage to determine the GV collapse threshold. The pressure at full driving voltage was then calculated, assuming a linear relation between transducer voltage and pressure. The pressure calculated for the 40 MHz transducer was 2.2 ± 0.1 MPa at 21 °C. Using a hydrophone, the measured pressure was 2.1 ± 0.3 MPa, a difference of <2%, validating the method at this frequency. The pressure calculated for the other transducers was 2.0 ± 0.1 MPa (80 MHz), 1.2 ± 0.1 (200 MHz), and 1.05 ± 0.17 (375 MHz at 37 °C). This study addresses the challenge of estimating pressure output from UHF ultrasound transducers, demonstrating that the pressure output in the 40–400 MHz frequency range can be quantified.

Стилі APA, Harvard, Vancouver, ISO та ін.

48

Pham, Van Hiep, Le Hai Tran, Jaeyeop Choi, Hoanh-Son Truong, Tan Hung Vo, Dinh Dat Vu, Sumin Park, and Junghwan Oh. "Novel Water Probe for High-Frequency Focused Transducer Applied to Scanning Acoustic Microscopy System: Simulation and Experimental Investigation." Sensors 24, no. 16 (August 10, 2024): 5179. http://dx.doi.org/10.3390/s24165179.

Повний текст джерела

Анотація:

A scanning acoustic microscopy (SAM) system is a common non-destructive instrument which is used to evaluate the material quality in scientific and industrial applications. Technically, the tested sample is immersed in water during the scanning process. Therefore, a robot arm is incorporated into the SAM system to transfer the sample for in-line inspection, which makes the system complex and increases time consumption. The main aim of this study is to develop a novel water probe for the SAM system, that is, a waterstream. During the scanning process, water was supplied using a waterstream instead of immersing the sample in the water, which leads to a simple design of an automotive SAM system and a reduction in time consumption. In addition, using a waterstream in the SAM system can avoid contamination of the sample due to immersion in water for long-time scanning. Waterstream was designed based on the measured focal length calculation of the transducer and simulated to investigate the internal flow characteristics. To validate the simulation results, the waterstream was prototyped and applied to the TSAM-400 and W-FSAM traditional and fast SAM systems to successfully image some samples such as carbon fiber-reinforced polymers, a printed circuit board, and a 6-inch wafer. These results demonstrate the design method of the water probe applied to the SAM system.

Стилі APA, Harvard, Vancouver, ISO та ін.

49

Jung, Seung-Chan, Wonjun Jang, Byeongji Beom, Jong-Keon Won, Jihoon Jeong, Yu-Jeong Choi, Man-Ki Moon, Eou-Sik Cho, Keun-A. Chang, and Jae-Hee Han. "Synthesis of Highly Porous Graphene Oxide–PEI Foams for Enhanced Sound Absorption in High-Frequency Regime." Polymers 16, no. 21 (October 24, 2024): 2983. http://dx.doi.org/10.3390/polym16212983.

Повний текст джерела

Анотація:

High-frequency noise exceeding 1 kHz has emerged as a pressing public health issue in industrial and occupational settings. In response to this challenge, the present study explores the development of a graphene oxide–polyethyleneimine (GO-PEI) foam (GPF) featuring a hierarchically porous structure. The synthesis and optimization of GPF were carried out using a range of analytical techniques, including Raman spectroscopy, scanning electron microscopy (SEM), Braunauer–Emmett–Teller (BET) analysis, X-ray diffraction (XRD), and Fourier-transform infrared spectroscopy (FT-IR). To evaluate its acoustic properties, GPF was subjected to sound absorption tests over the 1000–6400 Hz frequency range, where it was benchmarked against conventional melamine foam. The findings demonstrated that GPF with a GO-to-PEI composition ratio of 1:3 exhibited enhanced sound absorption performance, with improvements ranging from 15.0% to 118%, and achieved a peak absorption coefficient of 0.97. Additionally, we applied the Johnson–Champoux–Allard (JCA) model to further characterize the foam’s acoustic behavior, capturing key parameters such as porosity, flow resistivity, and viscous/thermal losses. The JCA model exhibited a superior fit to the experimental data compared to traditional models, providing a more accurate prediction of the foam’s complex microstructure and sound absorption properties. These findings underscore GPF’s promise as an efficient solution for mitigating high-frequency noise in industrial and environmental applications.

Стилі APA, Harvard, Vancouver, ISO та ін.

50

Zhou, Xuhang, Qiulin Tan, Xiaorui Liang, Baimao Lin, Tao Guo, and Yu Gan. "Novel Multilayer SAW Temperature Sensor for Ultra-High Temperature Environments." Micromachines 12, no. 6 (May 31, 2021): 643. http://dx.doi.org/10.3390/mi12060643.

Повний текст джерела

Анотація:

Performing high-temperature measurements on the rotating parts of aero-engine systems requires wireless passive sensors. Surface acoustic wave (SAW) sensors can measure high temperatures wirelessly, making them ideal for extreme situations where wired sensors are not applicable. This study reports a new SAW temperature sensor based on a langasite (LGS) substrate that can perform measurements in environments with temperatures as high as 1300 °C. The Pt electrode and LGS substrate were protected by an AlN passivation layer deposited via a pulsed laser, thereby improving the crystallization quality of the Pt film, with the function and stability of the SAW device guaranteed at 1100 °C. The linear relationship between the resonant frequency and temperature is verified by various high-temperature radio-frequency (RF) tests. Changes in sample microstructure before and after high-temperature exposure are analyzed using scanning electron microscopy (SEM) and X-ray diffraction (XRD). The analysis confirms that the proposed AlN/Pt/Cr thin-film electrode has great application potential in high-temperature SAW sensors.

Стилі APA, Harvard, Vancouver, ISO та ін.

Ми пропонуємо знижки на всі преміум-плани для авторів, чиї праці увійшли до тематичних добірок літератури. Зв'яжіться з нами, щоб отримати унікальний промокод!