Книги з теми "Heat storage devices Testing"

H, Visser, Dijk, H. A. L. van., and Commission of the European Communities., eds. Test procedures for short term thermal stores. Dordrecht: Kluwer Academic Publishers, 1991.

Sharma, Ashok K. Semiconductor memories: Technology, testing, and reliability. Piscataway, N.J: IEEE Press, 1997.

Adams, R. Dean. High performance memory testing: Design principles, fault modeling, and self-test. Boston: Kluwer Academic, 2003.

Testing semiconductor memories: Theory and practice. Chichester: J. Wiley & Sons, 1991.

IEEE International Workshop on Memory Technology, Design, and Testing (1998 San Jose, California). Memory technology, design and testing: Proceedings : International Workshop on Memory Technology, Design, and Testing. Los Alamitos, California: IEEE Computer Society Press, 1998.

Sharma, Ashok K. Semiconductor memories: Technology, testing, and reliability. New York: IEEE, the Institute of Electrical and Electronics Engineers, 1997.

Reeves, George. Electric thermal storage applications guide and product directory. Palo Alto, Calif: EPRI, 1990.

IEEE International Workshop on Memory Technology, Design, and Testing (1997 San Jose, Calif.). Proceedings: International Workshop on Memory Technology, Design, and Testing. Los Alamitos, Calif: IEEE Computer Society Press, 1997.

Hamdioui, Said. Testing static random access memories: Defects, fault models, and test patterns. Boston: Kluwer Academic, 2004.

Andersson, Olof. Scaling and corrosion: Annex VI : environmental and chemical aspects of thermal energy storage in aquifers. Stockholm, Sweden: Swedish Council for Building Research, 1992.

Lennart, Sjöberg, Hallberg Rolf O, and Statens råd för byggnadsforskning (Sweden), eds. Leaching of rock fractures: Laboratory and field tests for borehole heat stores. Stockholm, Sweden: Swedish Council for Building Research, 1988.

IEEE International Workshop on Memory Technology, Design and Testing (12th 2004 San Jose, Calif.). MTDT 2004: Records of the 2004 International Workshop on Memory Technology, Design and Testing : 9-10 August, 2004, San Jose, California, USA. Los Alamitos, Calif: IEEE Computer Society, 2004.

Yervant, Zorian, IEEE Computer Society, IEEE Computer Society. Technical Committee on VLSI., IEEE Computer Society. Technical Council on Test Technology., and IEEE Solid-State Circuits Society, eds. Proceedings: 2001 IEEE International Workshop on Memory Technology, Design, and Testing : August 6-7, 2001, San Jose, California. Los Alamitos, Calif: IEEE Computer Society, 2001.

IEEE International Workshop on Memory Technology, Design and Testing (8th 2000 San Jose, Calif.). Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing: August 7-8, 2000, San Jose, California. Los Alamitos, Calif: IEEE Computer Society, 2000.

IEEE, International Workshop on Memory Technology Design and Testing (1994 San Jose Calif ). Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California. Los Alamitos, Calif: IEEE Computer Society Press, 1994.

IEEE International Workshop on Memory Technology, Design, and Testing (1999 San Jose, Calif.). Records of the 1999 IEEE International Workshop on Memory Technology, Design, and Testing, August 9-10, 1999, San Jose, California, USA. Los Alamitos, Calif: IEEE Computer Society Press, 1999.

Tom, Wit, Singh Adit, Rajsuman Rochit, IEEE Computer Society, IEEE Computer Society. Technical Committee on VLSI., IEEE Computer Society. Technical Council on Test Technology., and IEEE Solid-State Circuits Society, eds. Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing, 28-29 July, 2003, San Jose, California. Los Alamitos, Calif: IEEE Computer Society, 2003.

IEEE, International Workshop on Memory Technology Design and Testing (17th 2009 Hsinchu Taiwan). MTDT 2009: 2009 IEEE International Workshop on Memory Technology, Design, and Testing : proceedings, 31 August- 2 September 2009, Hsinchu, Taiwan. Los Alamitos, Calif: IEEE Computer Society, 2009.

Rochit, Rajsuman, and IEEE Computer Society. Test Technology Technical Committee., eds. Records of the 1993 IEEE International Workshop on Memory Testing, August 9-10, 1993, San Jose, California. Los Alamitos, Calif: IEEE Computer Society Press, 1993.

B, Courtois, Wik T, Zorian Yervant, IEEE Computer Society, IEEE Computer Society. Technical Committee on VLSI., IEEE Computer Society. Technical Council on Test Technology., and IEEE Solid-State Circuits Society, eds. Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France. Los Alamitos, Calif: IEEE Computer Society, 2002.

Rochit, Rajsuman, Rajkanan K, IEEE Computer Society. Test Technology Technical Committee., IEEE Computer Society. Technical Committee on VLSI., and IEEE Solid-State Circuits Council, eds. Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California. Los Alamitos, Calif: IEEE Computer Society Press, 1995.

Nordell, Bo. A borehole heat store in rock at the University of Luleå: The Lulevärme Project, 1982-1988. Stockholm, Sweden: Swedish Council for Building Research, 1990.

Huber, Georg. Wärmflaschen, Wärmesteine, Wärmepfannen: Zur Geschichte der Wärmespender von 1500 bis heute. Husum: Husum, 2000.

International, Test Conference (34th 2003 Charlotte N. C. ). Proceedings: Board and system test track. Washington, D.C: International Test Conference, 2003.

Galen, E. van. Recommendations for European solar storage test methods for sensible and latent heat storage devices: Results of special tasks carried out by the individual group members. Luxembourg: Commission of the European Communities, 1985.

International Test Conference (34th 2003 Charlotte, N.C.). Proceedings International Test Conference 2003: [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA. Washington, D.C: International Test Conference, 2003.

1943-, Agrawal Vishwani D., ed. Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits. Boston: Kluwer Academic, 2000.

American Society of Heating, Refrigerating and Air-Conditioning Engineers. and American National Standards Institute, eds. Method of testing thermal storage devices with electrical input and thermal output based on thermal performance. Atlanta, GA: American Society of Heating, Refrigerating and Air-Conditioning Engineers, 2006.

Method of Testing Active Latent Heat Storage Devices Based on Thermal Performance (Ashrae Standards, 94.1-1985). Amer Society of Heating, 1992.

Method of Testing Active Latent Heat Storage Devices Based on Thermal Performance (Ashrae Standards, No 94.1-1985). Amer Society of Heating, 1986.

Method of Testing Active Latent-Heat Storage Devices Based on Thermal Performance (ANSI/ASHRAE Standard 94.1-2002 (RA 2006)) Reaffirmation of ANSI/ASHRAE Standard 94.1-2002. Amer Society of Heating, 2005.

Adams, R. Dean. High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing). Springer, 2002.

Thermal Energy Storage Technologies for Sustainability: Systems Design, Assessment and Applications. Elsevier Science & Technology Books, 2014.

Kalaiselvam, S., and R. Parameshwaran. Thermal Energy Storage Technologies for Sustainability: Systems Design, Assessment and Applications. Elsevier Science & Technology Books, 2014.

Sharma, Ashok K. Semiconductor Memories: Technology, Testing, and Reliability. Wiley-IEEE Press, 2002.

Adams, R. Dean. High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test. Springer, 2013.

Adams, R. Dean. High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test. Springer London, Limited, 2006.

United States. National Aeronautics and Space Administration., ed. Parametric studies of phase change thermal energy storage canisters for Space Station Freedom. [Washington, DC]: National Aeronautics and Space Administration, 1992.

Hamdioui, Said. Testing Static Random Access Memories: Defects, Fault Models and Test Patterns (Frontiers in Electronic Testing). Springer, 2004.

E, Lisano Michael, and United States. National Aeronautics and Space Administration., eds. Thermal Storage Advanced Thruster System (TSATS) experimental program. [Washington, DC]: National Aeronautics and Space Administration, 1991.

Thermal storage advanced thruster system (TSATS) experimental program: Final report. [Auburn, Ala.]: Space Power Institute, Auburn University, 1991.

Modeling void growth and movement with phase change in thermal energy storage canisters. [Washington, DC]: National Aeronautics and Space Administration, 1993.

Modeling void growth and movement with phase change in thermal energy storage canisters. [Washington, DC]: National Aeronautics and Space Administration, 1993.

Proceedings: International Workshop on Memory Technology, Design, and Testing. IEEE Computer Society Press, 1997.

(Editor), F. Lombardi, R. Rajsuman (Editor), and T. Wik (Editor), eds. International Workshop on Memory Technology, Design and Testing: Proceedings. Institute of Electrical & Electronics Enginee, 1997.

Hamdioui, Said. Testing Static Random Access Memories: "Defects, Fault Models And Test Patterns". Springer, 2010.

Hamdioui, Said. Testing Static Random Access Memories: Defects, Fault Models and Test Patterns. Springer London, Limited, 2013.

Space station thermal storage/refrigeration system research and development: Final report. Huntsville, Ala: Lockheed Missiles & Space Co., Inc., 1993.

(Editor), Hiroshi Ishiwara, Masanori Okuyama (Editor), and Yoshihiro Arimoto (Editor), eds. Ferroelectric Random Access Memories: Fundamentals and Applications (Topics in Applied Physics). Springer, 2004.

Arimoto, Yoshihiro, Masanori Okuyama, and Hiroshi Ishiwara. Ferroelectric Random Access Memories: Fundamentals and Applications. Springer Berlin / Heidelberg, 2010.