Статті в журналах з теми "Hardware Under Test"
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Pomeranz, Irith. "Test Compaction by Test Removal Under Transparent Scan." IEEE Transactions on Very Large Scale Integration (VLSI) Systems 27, no. 2 (February 2019): 496–500. http://dx.doi.org/10.1109/tvlsi.2018.2878067.
Повний текст джерелаYin, Jiao, Hu Liu, Jun Wang, and Ke Li. "Control System Design of Pneumatic Conveying in Sand/Dust Environment Simulation Test." Applied Mechanics and Materials 442 (October 2013): 424–29. http://dx.doi.org/10.4028/www.scientific.net/amm.442.424.
Повний текст джерелаWan Jamaludin, Wan Shahmisufi, Tan Wei Ren, Bakhtiar Affendi Rosdi, Dahaman Ishak, Noor Hafizi Hanafi, and Muhammad Nasiruddin Mahyuddin. "Adopting Hardware-In-the-Loop for Testing Vehicle Instrument Panel using Economical Approach." Indonesian Journal of Electrical Engineering and Computer Science 10, no. 1 (April 1, 2018): 50. http://dx.doi.org/10.11591/ijeecs.v10.i1.pp50-58.
Повний текст джерелаZhang, Peng, Hou Jun Wang, Li Li, and Ping Wang. "Design and Implementation of Intermediate Frequency Generation and Analysis Module for Avionics Test." Advanced Materials Research 1049-1050 (October 2014): 1147–53. http://dx.doi.org/10.4028/www.scientific.net/amr.1049-1050.1147.
Повний текст джерелаTian, Zeng Hao. "MIMO Channel Research and Hardware Implementation." Applied Mechanics and Materials 543-547 (March 2014): 2581–84. http://dx.doi.org/10.4028/www.scientific.net/amm.543-547.2581.
Повний текст джерелаLarsson, E., and S. Edbom. "Test data truncation for test quality maximisation under ATE memory depth constraint." IET Computers & Digital Techniques 1, no. 1 (2007): 27. http://dx.doi.org/10.1049/iet-cdt:20050209.
Повний текст джерелаShi, Zhendong, Haocheng Ma, Qizhi Zhang, Yanjiang Liu, Yiqiang Zhao, and Jiaji He. "Test Generation for Hardware Trojan Detection Using Correlation Analysis and Genetic Algorithm." ACM Transactions on Embedded Computing Systems 20, no. 4 (June 2021): 1–20. http://dx.doi.org/10.1145/3446837.
Повний текст джерелаHan, Gu Jing, Meng Zou, and Wu Zhi Min. "Research on Deadbeat Control for Three-Phase Grid-Connected Inverter in Model Based Design." Applied Mechanics and Materials 241-244 (December 2012): 1159–63. http://dx.doi.org/10.4028/www.scientific.net/amm.241-244.1159.
Повний текст джерелаAlymova, E. V., and O. V. Khachkinaev. "Automation of Software and Hardware Systems Acceptance Testing in the Paradigm of Behavior-Driven Development." Informacionnye Tehnologii 29, no. 4 (April 18, 2023): 186–96. http://dx.doi.org/10.17587/it.29.189-196.
Повний текст джерелаWang, Zhi Shen, and Gang Yan Li. "Compensation Control Network and Test of Bus Air Brake System in Under-Pressure State." Applied Mechanics and Materials 711 (December 2014): 342–46. http://dx.doi.org/10.4028/www.scientific.net/amm.711.342.
Повний текст джерелаPikuza, M. O., and S. Yu Mikhnevich. "Testing a hardware random number generator using NIST statistical test suite." Doklady BGUIR 19, no. 4 (July 1, 2021): 37–42. http://dx.doi.org/10.35596/1729-7648-2021-19-4-37-42.
Повний текст джерелаPomeranz, I., and S. M. Reddy. "Test compaction methods for transition faults under transparent-scan." IET Computers & Digital Techniques 3, no. 4 (2009): 315. http://dx.doi.org/10.1049/iet-cdt.2008.0115.
Повний текст джерелаPomeranz, Irith. "Reducing the input test data volume under transparent scan." IET Computers & Digital Techniques 8, no. 1 (January 2014): 1–10. http://dx.doi.org/10.1049/iet-cdt.2013.0067.
Повний текст джерелаLi Jiang, Qiang Xu, K. Chakrabarty, and T. M. Mak. "Integrated Test-Architecture Optimization and Thermal-Aware Test Scheduling for 3-D SoCs Under Pre-Bond Test-Pin-Count Constraint." IEEE Transactions on Very Large Scale Integration (VLSI) Systems 20, no. 9 (September 2012): 1621–33. http://dx.doi.org/10.1109/tvlsi.2011.2160410.
Повний текст джерелаCHEN, CHENG-HSIEN, and CHEN-YI LEE. "REDUCE THE MEMORY BANDWIDTH OF 3D GRAPHICS HARDWARE WITH A NOVEL RASTERIZER." Journal of Circuits, Systems and Computers 11, no. 04 (August 2002): 377–91. http://dx.doi.org/10.1142/s0218126602000525.
Повний текст джерелаVannahme, Anna, Jonas Busch, Mathias Ehrenwirth, and Tobias Schrag. "Experimental Study of District Heating Substations in a Hardware-in-the-Loop Test Rig." Resources 12, no. 4 (March 26, 2023): 43. http://dx.doi.org/10.3390/resources12040043.
Повний текст джерелаParlato, Aldo, Elio Tomarchio, Cristiano Calligaro, and Calogero Pace. "The methodology for active testing of electronic devices under the radiations." Nuclear Technology and Radiation Protection 33, no. 1 (2018): 53–60. http://dx.doi.org/10.2298/ntrp1801053p.
Повний текст джерелаKerzérho, V., P. Cauvet, S. Bernard, F. Azaïs, M. Renovell, M. Comte, and O. Chakib. "ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator." VLSI Design 2008 (April 30, 2008): 1–8. http://dx.doi.org/10.1155/2008/482159.
Повний текст джерелаQian, Zheng Xiang, and Yong Xin Shi. "Design and Realization of Test System for UAV Aeronautic Electronic Equipment." Applied Mechanics and Materials 644-650 (September 2014): 1158–61. http://dx.doi.org/10.4028/www.scientific.net/amm.644-650.1158.
Повний текст джерелаNiu, Ruibin. "Mechanical Vibration Test Based on the Wireless Vibration Monitoring System." Security and Communication Networks 2022 (August 25, 2022): 1–8. http://dx.doi.org/10.1155/2022/9022128.
Повний текст джерелаLv, Zhao, Shuming Chen, and Yaohua Wang. "Simulation-Based Hardware Verification with a Graph-Based Specification." Mathematical Problems in Engineering 2018 (2018): 1–10. http://dx.doi.org/10.1155/2018/6398616.
Повний текст джерелаHazen, John, and L. Scorsone. "Infrared Sensor Calibration Facility." Journal of the IEST 35, no. 1 (January 1, 1992): 33–40. http://dx.doi.org/10.17764/jiet.2.35.1.d536816582691754.
Повний текст джерелаZhi, Chuan. "Research on the Physical Training under the Internet Environment." Applied Mechanics and Materials 687-691 (November 2014): 2875–78. http://dx.doi.org/10.4028/www.scientific.net/amm.687-691.2875.
Повний текст джерелаSalman, Muhammad, Antoine Ligot, and Mauro Birattari. "Concurrent design of control software and configuration of hardware for robot swarms under economic constraints." PeerJ Computer Science 5 (September 30, 2019): e221. http://dx.doi.org/10.7717/peerj-cs.221.
Повний текст джерелаSiddiqui, Atif, Muhammad Yousuf Irfan Zia, and Pablo Otero. "A Universal Machine-Learning-Based Automated Testing System for Consumer Electronic Products." Electronics 10, no. 2 (January 10, 2021): 136. http://dx.doi.org/10.3390/electronics10020136.
Повний текст джерелаSiddiqui, Atif, Muhammad Yousuf Irfan Zia, and Pablo Otero. "A Universal Machine-Learning-Based Automated Testing System for Consumer Electronic Products." Electronics 10, no. 2 (January 10, 2021): 136. http://dx.doi.org/10.3390/electronics10020136.
Повний текст джерелаTang, Yan Kun, Kun Yang, Yan Nan Zhai, and Hui Zhang. "A Design of Safety Lock Testing Instrument Based on 89S52 Singlechip and LabVIEW." Applied Mechanics and Materials 347-350 (August 2013): 1549–52. http://dx.doi.org/10.4028/www.scientific.net/amm.347-350.1549.
Повний текст джерелаBai, Yang, Xin Zhang, Qiang Yang, Yong Yang, Weibo Deng, and Di Yao. "Multi-Channel Data Acquisition Card under New Acquisition and Transmission Architecture of High Frequency Ground Wave Radar." Sensors 21, no. 4 (February 5, 2021): 1128. http://dx.doi.org/10.3390/s21041128.
Повний текст джерелаTestori, Marcello, Olivier Lamquet, and Giuliano Matli. "Real-Time hardware-in-the-loop grid simulator to test generating units’ speed governors under islanding operating conditions." IFAC-PapersOnLine 49, no. 27 (2016): 188–94. http://dx.doi.org/10.1016/j.ifacol.2016.10.681.
Повний текст джерелаEdemsky, Dmitry, Alexei Popov, Igor Prokopovich, and Vladimir Garbatsevich. "Airborne Ground Penetrating Radar, Field Test." Remote Sensing 13, no. 4 (February 12, 2021): 667. http://dx.doi.org/10.3390/rs13040667.
Повний текст джерелаSchoberer, Thomas, Jan Weyr, Gernot Steindl, Gregor Görtler, and Werner Stutterecker. "Comparison of the Energy Performance of a Heat Pump under Various Conditions by Using a Hardware-in-the-Loop (HIL) Test Method." Applied Mechanics and Materials 887 (January 2019): 622–32. http://dx.doi.org/10.4028/www.scientific.net/amm.887.622.
Повний текст джерелаHoren, Y., A. Kuperman, Z. Vainer, S. Tapuchi, and M. Averbukh. "Emulating time varying nonlinear uncertainties and disturbances in linear time invariant systems." SIMULATION 88, no. 12 (September 26, 2012): 1499–507. http://dx.doi.org/10.1177/0037549712459788.
Повний текст джерелаWeyr, Jan, Thomas Schoberer, and Werner Stutterecker. "Communication Analysis of Hardware-in-the-Loop Test Method for Heat Pumps and Chillers." Applied Mechanics and Materials 887 (January 2019): 587–96. http://dx.doi.org/10.4028/www.scientific.net/amm.887.587.
Повний текст джерелаMarinissen, E. J., B. Vermeulen, H. Hollmann, and R. G. Bennetts. "Minimizing pattern count for interconnect test under a ground bounce constraint." IEEE Design & Test of Computers 20, no. 2 (March 2003): 8–18. http://dx.doi.org/10.1109/mdt.2003.1188257.
Повний текст джерелаPorobic, Vlado, Evgenije Adzic, and Milan Rapaic. "HIL evaluation of control unit in grid-tied coverters." Thermal Science 20, suppl. 2 (2016): 393–406. http://dx.doi.org/10.2298/tsci150928025p.
Повний текст джерелаWang, Weizheng, Zhuo Deng, and Jin Wang. "Enhancing Sensor Network Security with Improved Internal Hardware Design." Sensors 19, no. 8 (April 12, 2019): 1752. http://dx.doi.org/10.3390/s19081752.
Повний текст джерелаWang, Jun, and Xiao Lu Li. "Dynamic Temperature Test for PTC Material Used to Heat Diesel." Applied Mechanics and Materials 321-324 (June 2013): 158–62. http://dx.doi.org/10.4028/www.scientific.net/amm.321-324.158.
Повний текст джерелаPomeranz, I., and S. M. Reddy. "Test generation for embedded circuits under the transparent-scan approach." IEE Proceedings - Computers and Digital Techniques 152, no. 6 (2005): 713. http://dx.doi.org/10.1049/ip-cdt:20045151.
Повний текст джерелаLiu, Mengnan, Chuiquan Wei, and Liyou Xu. "Development of Cooperative Controller for Dual-Motor Independent Drive Electric Tractor." Mathematical Problems in Engineering 2020 (November 11, 2020): 1–12. http://dx.doi.org/10.1155/2020/4826904.
Повний текст джерелаAbdurakhmanov, Sh, Zh Chyngysheva, B. Musaliev, and E. Tilekov. "Results of the Controlled Clinical Test of Intraoperative Blood Reinfusion Hardware, Assembled From the Abdominal Cavity in Conditions of Slow and Fast Modes." Bulletin of Science and Practice 6, no. 2 (February 15, 2020): 111–17. http://dx.doi.org/10.33619/2414-2948/51/08.
Повний текст джерелаZhang, Wei Xin, Wei Bing Bai, Chao Xu, Wei Yuan Chen, and Rui Jiang. "A Facial Recognition System Based on Integral Image." Applied Mechanics and Materials 687-691 (November 2014): 3905–8. http://dx.doi.org/10.4028/www.scientific.net/amm.687-691.3905.
Повний текст джерелаKladovščikov, Leonid, Marijan Jurgo, and Romualdas Navickas. "Design of an Oscillation-Based BIST System for Active Analog Integrated Filters in 0.18 µm CMOS." Electronics 8, no. 7 (July 20, 2019): 813. http://dx.doi.org/10.3390/electronics8070813.
Повний текст джерелаLeibfritz, M. M., M. D. Blech, F. M. Landstorfer, and T. F. Eibert. "A comparison of software- and hardware-gating techniques applied to near-field antenna measurements." Advances in Radio Science 5 (June 12, 2007): 43–48. http://dx.doi.org/10.5194/ars-5-43-2007.
Повний текст джерелаLiu, Yanjiang, Yiqiang Zhao, Jiaji He, and Ruishan Xin. "A Statistical Test Generation Based on Mutation Analysis for Improving the Hardware Trojan Detection." Journal of Circuits, Systems and Computers 29, no. 03 (June 3, 2019): 2050049. http://dx.doi.org/10.1142/s0218126620500498.
Повний текст джерелаHIGAMI, Yoshinobu, Hiroshi TAKAHASHI, Shin-ya KOBAYASHI, and Kewal K. SALUJA. "Test Generation for Delay Faults on Clock Lines under Launch-on-Capture Test Environment." IEICE Transactions on Information and Systems E96.D, no. 6 (2013): 1323–31. http://dx.doi.org/10.1587/transinf.e96.d.1323.
Повний текст джерелаBalike, M., S. Rakheja, and S. V. Hoa. "STUDY OF AN ENERGY DISSIPATING UNDER-RIDE GUARD USING HARDWARE-IN-THE-LOOP SIMULATION." Transactions of the Canadian Society for Mechanical Engineering 23, no. 2 (June 1999): 307–20. http://dx.doi.org/10.1139/tcsme-1999-0021.
Повний текст джерелаMuhammad, Moiz, Holger Behrends, Stefan Geißendörfer, Karsten von Maydell, and Carsten Agert. "Power Hardware-in-the-Loop: Response of Power Components in Real-Time Grid Simulation Environment." Energies 14, no. 3 (January 25, 2021): 593. http://dx.doi.org/10.3390/en14030593.
Повний текст джерелаDelgado, María Luisa, Jorge E. Jiménez-Hornero, and Francisco Vázquez. "Design, Implementation and Validation of a Hardware-in-the-Loop Test Bench for Heating Systems in Conventional Coaches." Applied Sciences 13, no. 4 (February 9, 2023): 2212. http://dx.doi.org/10.3390/app13042212.
Повний текст джерелаIman-Eini, Hossein, and Sarath B. Tennakoon. "Investigation of a cascaded H-bridge photovoltaic inverter under non-uniform insolation conditions by hardware-in-the-loop test." International Journal of Electrical Power & Energy Systems 105 (February 2019): 330–40. http://dx.doi.org/10.1016/j.ijepes.2018.08.017.
Повний текст джерелаGarzia, Fabio, Johannes Rossouw van der Merwe, Alexander Rügamer, Santiago Urquijo, and Wolfgang Felber. "HDDM Hardware Evaluation for Robust Interference Mitigation." Sensors 20, no. 22 (November 13, 2020): 6492. http://dx.doi.org/10.3390/s20226492.
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