Добірка наукової літератури з теми "Geometrically necessary dislocation densities (GND)"
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Статті в журналах з теми "Geometrically necessary dislocation densities (GND)":
Rezvanian, O., M. A. Zikry, and A. M. Rajendran. "Statistically stored, geometrically necessary and grain boundary dislocation densities: microstructural representation and modelling." Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences 463, no. 2087 (August 14, 2007): 2833–53. http://dx.doi.org/10.1098/rspa.2007.0020.
Dunne, F. P. E., R. Kiwanuka, and A. J. Wilkinson. "Crystal plasticity analysis of micro-deformation, lattice rotation and geometrically necessary dislocation density." Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences 468, no. 2145 (May 2, 2012): 2509–31. http://dx.doi.org/10.1098/rspa.2012.0050.
Li, Qizhen. "Geometrically Necessary Dislocation Analysis of Deformation Mechanism for Magnesium under Fatigue Loading at 0 °C." Crystals 13, no. 3 (March 12, 2023): 490. http://dx.doi.org/10.3390/cryst13030490.
Chamma, Layal, Jean-Marc Pipard, Artem Arlazarov, Thiebaud Richeton, Jean-Sébastien Lecomte, and Stéphane Berbenni. "A combined EBSD/nanoindentation study of dislocation density gradients near grain boundaries in a ferritic steel." Matériaux & Techniques 110, no. 2 (2022): 203. http://dx.doi.org/10.1051/mattech/2022005.
Chamma, Layal, Jean-Marc Pipard, Artem Arlazarov, Thiebaud Richeton, Jean-Sébastien Lecomte, and Stéphane Berbenni. "A combined EBSD/nanoindentation study of dislocation density gradients near grain boundaries in a ferritic steel." Matériaux & Techniques 110, no. 2 (2022): 203. http://dx.doi.org/10.1051/mattech/2022005.
Chamma, Layal, Jean-Marc Pipard, Artem Arlazarov, Thiebaud Richeton, Jean-Sébastien Lecomte, and Stéphane Berbenni. "A combined EBSD/nanoindentation study of dislocation density gradients near grain boundaries in a ferritic steel." Matériaux & Techniques 110, no. 2 (2022): 203. http://dx.doi.org/10.1051/mattech/2022005.
Hansen, Landon T., Brian E. Jackson, David T. Fullwood, Stuart I. Wright, Marc De Graef, Eric R. Homer, and Robert H. Wagoner. "Influence of Noise-Generating Factors on Cross-Correlation Electron Backscatter Diffraction (EBSD) Measurement of Geometrically Necessary Dislocations (GNDs)." Microscopy and Microanalysis 23, no. 3 (March 6, 2017): 460–71. http://dx.doi.org/10.1017/s1431927617000204.
Demouchy, Sylvie, Manuel Thieme, Fabrice Barou, Benoit Beausir, Vincent Taupin, and Patrick Cordier. "Dislocation and disclination densities in experimentally deformed polycrystalline olivine." European Journal of Mineralogy 35, no. 2 (March 31, 2023): 219–42. http://dx.doi.org/10.5194/ejm-35-219-2023.
Seret, Anthony, Charbel Moussa, Marc Bernacki, Javier Signorelli, and Nathalie Bozzolo. "Estimation of geometrically necessary dislocation density from filtered EBSD data by a local linear adaptation of smoothing splines." Journal of Applied Crystallography 52, no. 3 (May 7, 2019): 548–63. http://dx.doi.org/10.1107/s1600576719004035.
Sedaghat, Omid, та Hamidreza Abdolvand. "Strain-Gradient Crystal Plasticity Finite Element Modeling of Slip Band Formation in α-Zirconium". Crystals 11, № 11 (12 листопада 2021): 1382. http://dx.doi.org/10.3390/cryst11111382.
Дисертації з теми "Geometrically necessary dislocation densities (GND)":
Ernould, Clément. "Développement et application d’une méthode à haute résolution angulaire pour la mesure des gradients d’orientation et des déformations élastiques par microscopie électronique à balayage." Electronic Thesis or Diss., Université de Lorraine, 2020. http://www.theses.fr/2020LORR0225.
Understanding the deformation mechanisms in crystalline materials requires a fine characterization of microstructures. The precise measurement of lattice rotations and elastic strains in the scanning electron microscope is the aim of the so-called high-angular resolution methods. For this purpose, digital image correlation techniques are used in order to register electron diffraction patterns. In this thesis, an original registration approach is proposed. The displacement field across the whole scintillator is modelled by a linear homography. Such a shape function is often met is the field of computer vision to describe projective transformations. The homography between two patterns is measured from a single and large region of interest using a numerically efficient inverse-compositional Gauss-Newton algorithm. It integrates a correction of optical distortions caused by camera lenses and its convergence is ensured by a pre-alignment step of the patterns. The latter relies on global cross-correlation algorithms based on Fourier-Mellin and Fourier transforms. It fairly accounts for rotations up to approximately ten degrees with an accuracy typically between 0.1 and 0.5°. The homography is measured independently from the projection geometry, which is only considered afterwards to analytically deduce the rotations and elastic strains. The proposed method is validated numerically from simulated and optically distorted patterns showing disorientations up to 14° in the presence of elastic strains up to 5×10⁻². The accurate measurement of elastic strains between 1×10⁻⁴ and 2×10⁻³ requires a correction of radial distortion effects, even when the disorientation angle is small. Finally, the method is applied to patterns acquired by means of electron backscatter diffraction (EBSD) and in transmission using the new on-axis transmission Kikuchi diffraction (TKD) configuration. Plastically deformed polycrystalline metals as well as semiconductors are characterized. The method highlights fine details of the microstructure of a quenched and tempered martensitic steel and of an interstitial free steel deformed by 15% in tension, although plastic deformation deteriorates the diffraction contrast. The deformation structures in a nanostructured aluminium obtained by severe plastic deformation are also analysed by coupling the image registration method to the on-axis TKD configuration. This coupling allows a high spatial resolution (3 to 10 nm) and a high angular resolution (0.01 to 0.05°) to be reached simultaneously. Elastic strain maps are obtained at the nanoscale in a SiGe thin foil. The geometrically necessary dislocation densities in a GaN single crystal are mapped with a resolution of about 2.5×10⁻³ µm⁻¹ (i.e. 8×10¹² m⁻²)
Liu, Yue. "Precession Electron Diffraction Assisted Characterization of Deformation in α and α+β Titanium Alloys". Thesis, University of North Texas, 2015. https://digital.library.unt.edu/ark:/67531/metadc804946/.
Тези доповідей конференцій з теми "Geometrically necessary dislocation densities (GND)":
Wang, Youneng, Sinisa Vukelic, Jeffrey W. Kysar, and Y. Lawrence Yao. "Spatially Resolved Characterization of Geometrically Necessary Dislocation Dependent Deformation in Micro-Scale Laser Shock Peening." In ASME 2008 International Manufacturing Science and Engineering Conference collocated with the 3rd JSME/ASME International Conference on Materials and Processing. ASMEDC, 2008. http://dx.doi.org/10.1115/msec_icmp2008-72514.
Abu Al-Rub, Rashid K., and George Z. Voyiadjis. "A Dislocation Based Gradient Plasticity Theory With Applications to Size Effects." In ASME 2005 International Mechanical Engineering Congress and Exposition. ASMEDC, 2005. http://dx.doi.org/10.1115/imece2005-81384.
Medina-Almazán, A. Liliana, Lizandra S. Ovando-Ramírez, Rogelio Hernández-Callejas, and Gonzalo Galicia-Aguilar. "Hardness and Microstructural Evolution of a JRQ A533 Cl.1 Steel Submitted to Thermal Annealing." In ASME 2018 Pressure Vessels and Piping Conference. American Society of Mechanical Engineers, 2018. http://dx.doi.org/10.1115/pvp2018-84916.