Статті в журналах з теми "Fringe Effect Analytical Model"
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Fang, Yu Ming, Jia Jia Yu, Wen Wen Fu, De Bo Wang, and Pu Li. "An Analytical Model for Dynamic Pull-In of Electrostatic Perforated Plate Actuators." Applied Mechanics and Materials 614 (September 2014): 160–63. http://dx.doi.org/10.4028/www.scientific.net/amm.614.160.
Повний текст джерелаSun, Yabin, Ziyu Liu, Xiaojin Li, Jiaqi Ren, Fanglin Zheng, and Yanling Shi. "Analytical gate fringe capacitance model for nanoscale MOSFET with layout dependent effect and process variations." Journal of Physics D: Applied Physics 51, no. 27 (June 19, 2018): 275104. http://dx.doi.org/10.1088/1361-6463/aac7d0.
Повний текст джерелаLi, Fuqian, and Wenjing Chen. "Phase Error Analysis and Correction for Crossed-Grating Phase-Shifting Profilometry." Sensors 21, no. 19 (September 28, 2021): 6475. http://dx.doi.org/10.3390/s21196475.
Повний текст джерелаMobarak, Youssef Ahmed, and Moamen Atef. "Effect of Novel Nanocomposite Materials for Enhancing Performance of Thin Film Transistor TFT Model." International Journal of Advances in Applied Sciences 5, no. 1 (March 1, 2016): 1. http://dx.doi.org/10.11591/ijaas.v5.i1.pp1-12.
Повний текст джерелаKumar, Arun, P. S. T. N. Srinivas, Shiv Bhushan, Sarvesh Dubey, Yatendra Kumar Singh, and Pramod Kumar Tiwari. "Threshold Voltage Modeling of Double Gate-All-Around Metal-Oxide-Semiconductor Field-Effect-Transistors (DGAA MOSFETs) Including the Fringing Field Effects." Journal of Nanoelectronics and Optoelectronics 14, no. 11 (November 1, 2019): 1555–64. http://dx.doi.org/10.1166/jno.2019.2658.
Повний текст джерелаWang, Jinglei, Yixuan Li, Yifan Ji, Jiaming Qian, Yuxuan Che, Chao Zuo, Qian Chen, and Shijie Feng. "Deep Learning-Based 3D Measurements with Near-Infrared Fringe Projection." Sensors 22, no. 17 (August 27, 2022): 6469. http://dx.doi.org/10.3390/s22176469.
Повний текст джерелаDwivedi, Apoorva, and Gargi Khanna. "A microelectromechanical system (MEMS) capacitive accelerometer-based microphone with enhanced sensitivity for fully implantable hearing aid: a novel analytical approach." Biomedical Engineering / Biomedizinische Technik 65, no. 6 (November 18, 2020): 735–46. http://dx.doi.org/10.1515/bmt-2017-0183.
Повний текст джерелаManyo, Edem Yawo, Benoit Picoux, Philippe Reynaud, Rémi Tautou, Daniel Nelias, Fatima Allou, and Christophe Petit. "Approach of Pavement Surface Layer Degradation Caused by Tire Contact Using Semi-Analytical Model." Materials 14, no. 9 (April 22, 2021): 2117. http://dx.doi.org/10.3390/ma14092117.
Повний текст джерелаPöller, Franziska, Félix Salazar Bloise, Martin Jakobi, Jie Dong, and Alexander W. Koch. "Extension and Limits of Depolarization-Fringe Contrast Roughness Method in Sub-Micron Domain." Sensors 21, no. 16 (August 19, 2021): 5572. http://dx.doi.org/10.3390/s21165572.
Повний текст джерелаWang, Wen, Wenjun Qiu, He Yang, Haimei Wu, Guang Shi, Zhanfeng Chen, Keqing Lu, Kui Xiang, and Bingfeng Ju. "An Improved Capacitive Sensor for Detecting the Micro-Clearance of Spherical Joints." Sensors 19, no. 12 (June 14, 2019): 2694. http://dx.doi.org/10.3390/s19122694.
Повний текст джерелаKalayeh, Kourosh, and Panos Charalambides. "A Non-Linear Model of an All-Elastomer, in-Plane, Capacitive, Tactile Sensor Under the Application of Normal Forces." Sensors 18, no. 11 (October 24, 2018): 3614. http://dx.doi.org/10.3390/s18113614.
Повний текст джерелаWoo, Jemin, Bongsu Hahn, and Changsun Ahn. "Position Estimator Design for a MEMS Top-Drive Electrostatic Rotary Actuator." Sensors 20, no. 24 (December 10, 2020): 7081. http://dx.doi.org/10.3390/s20247081.
Повний текст джерелаWang, Wen, He Yang, Min Zhang, Zhanfeng Chen, Guang Shi, Keqing Lu, Kui Xiang, and Bingfeng Ju. "A Novel Method for the Micro-Clearance Measurement of a Precision Spherical Joint Based on a Spherical Differential Capacitive Sensor." Sensors 18, no. 10 (October 9, 2018): 3366. http://dx.doi.org/10.3390/s18103366.
Повний текст джерелаHammer, Hanno. "Analytical Model for Comb-Capacitance Fringe Fields." Journal of Microelectromechanical Systems 19, no. 1 (February 2010): 175–82. http://dx.doi.org/10.1109/jmems.2009.2037833.
Повний текст джерелаBansal, Aditya, Bipul C. Paul, and Kaushik Roy. "An Analytical Fringe Capacitance Model for Interconnects Using Conformal Mapping." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 25, no. 12 (December 2006): 2765–74. http://dx.doi.org/10.1109/tcad.2006.882489.
Повний текст джерелаChoi, Yunn-Hong, and Mikhail Skliar. "Quantitative Measurements of Dielectric Spectra with Microdielectric Fringe-Effect Sensors." Analytical Chemistry 76, no. 14 (July 2004): 4143–49. http://dx.doi.org/10.1021/ac049838l.
Повний текст джерелаMulkerns, Niall M. C., William H. Hoffmann, Ian D. Lindsay, and Henkjan Gersen. "Shedding Light on Capillary-Based Backscattering Interferometry." Sensors 22, no. 6 (March 10, 2022): 2157. http://dx.doi.org/10.3390/s22062157.
Повний текст джерелаChoi, Yunn-Hong, and Mikhail Skliar. "Standard-Independent Estimation of Dielectric Permittivity with Microdielectric Fringe-Effect Sensors." Analytical Chemistry 77, no. 3 (February 2005): 871–77. http://dx.doi.org/10.1021/ac048723e.
Повний текст джерелаSon, Myungwoo, Hangil Ki, Kihyeun Kim, Sunki Chung, Woong Lee, and Moon-Ho Ham. "Gate capacitance model for the design of graphene nanoribbon array field-effect transistors." RSC Advances 5, no. 68 (2015): 54861–66. http://dx.doi.org/10.1039/c5ra06546a.
Повний текст джерелаChoi, Yunn-Hong, Prashant Tathireddy, and Mikhail Skliar. "Method for Measuring Thickness of Dielectric Films Using Microdielectric Fringe-Effect Sensors." Analytical Chemistry 78, no. 10 (May 2006): 3242–48. http://dx.doi.org/10.1021/ac050770z.
Повний текст джерелаSantare, M. H., B. J. O’Toole, and E. M. Patton. "Two-Dimensional Crack Inclusion Interaction Effects: Analysis and Experiments." Journal of Pressure Vessel Technology 113, no. 3 (August 1, 1991): 392–97. http://dx.doi.org/10.1115/1.2928772.
Повний текст джерелаWeng, Jiawen, Weishuai Zhou, Simin Ma, Pan Qi, and Jingang Zhong. "Model-Free Lens Distortion Correction Based on Phase Analysis of Fringe-Patterns." Sensors 21, no. 1 (December 31, 2020): 209. http://dx.doi.org/10.3390/s21010209.
Повний текст джерелаTian, Wenbin, Xiaofeng Liang, Xiaolei Qu, Jiangtao Sun, Shuo Gao, Lijun Xu, and Wuqiang Yang. "Investigation of Multi-Plane Scheme for Compensation of Fringe Effect of Electrical Resistance Tomography Sensor." Sensors 19, no. 14 (July 16, 2019): 3132. http://dx.doi.org/10.3390/s19143132.
Повний текст джерелаPennarubia, Florian, Alison V. Nairn, Megumi Takeuchi, Kelley W. Moremen, and Robert S. Haltiwanger. "Modulation of the NOTCH1 Pathway by LUNATIC FRINGE Is Dominant over That of MANIC or RADICAL FRINGE." Molecules 26, no. 19 (September 30, 2021): 5942. http://dx.doi.org/10.3390/molecules26195942.
Повний текст джерелаYao, Yu, Zhengjiang Tang, Ruichao Du, and Changbo Jiang. "A Semi-Analytical Model on Wave-Induced Setup over Fringing Reefs with a Shallow Reef Crest." Journal of Disaster Research 11, no. 5 (October 1, 2016): 948–56. http://dx.doi.org/10.20965/jdr.2016.p0948.
Повний текст джерелаChen, Qili, Mengqi Han, Ye Wang, and Wenjing Chen. "An Improved Circular Fringe Fourier Transform Profilometry." Sensors 22, no. 16 (August 12, 2022): 6048. http://dx.doi.org/10.3390/s22166048.
Повний текст джерелаZhu, Xinjun, Limei Song, Hongyi Wang, and Qinghua Guo. "Assessment of Fringe Pattern Decomposition with a Cross-Correlation Index for Phase Retrieval in Fringe Projection 3D Measurements." Sensors 18, no. 10 (October 22, 2018): 3578. http://dx.doi.org/10.3390/s18103578.
Повний текст джерелаCARUNTU, DUMITRU I., and MARTIN KNECHT. "ON NONLINEAR RESPONSE NEAR-HALF NATURAL FREQUENCY OF ELECTROSTATICALLY ACTUATED MICRORESONATORS." International Journal of Structural Stability and Dynamics 11, no. 04 (August 2011): 641–72. http://dx.doi.org/10.1142/s0219455411004282.
Повний текст джерелаLv, Shanshan, Mingshun Jiang, Chenhui Su, Lei Zhang, Faye Zhang, Qingmei Sui, and Lei Jia. "Phase Demodulation Method for Fringe Projection Measurement Based on Improved Variable-Frequency Coded Patterns." Sensors 21, no. 13 (June 29, 2021): 4463. http://dx.doi.org/10.3390/s21134463.
Повний текст джерелаMangla, R., and S. Kumar. "DEM Construction using DInSAR." ISPRS - International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences XL-8 (November 28, 2014): 817–20. http://dx.doi.org/10.5194/isprsarchives-xl-8-817-2014.
Повний текст джерелаSadek, A., S. E. D. Habib, and K. Ismail. "Analytical model of field-effect transistors." Solid-State Electronics 38, no. 11 (November 1995): 1969–71. http://dx.doi.org/10.1016/0038-1101(95)00116-b.
Повний текст джерелаJames, Daniel F. V. "The effect of spatial coherence of sources on synthetic aperture mapping." International Astronomical Union Colloquium 131 (1991): 10–14. http://dx.doi.org/10.1017/s0252921100012999.
Повний текст джерелаZhang, Lixin, and Quanlin Dong. "Analytical analysis and simulation on fringe field effect of deflector plates applied in ultrafast electron microscopy." Micron 126 (November 2019): 102751. http://dx.doi.org/10.1016/j.micron.2019.102751.
Повний текст джерелаYu, Ji, Xue, and Wang. "Fringe Phase-Shifting Field Based Fuzzy Quotient Space-Oriented Partial Differential Equations Filtering Method for Gaussian Noise-Induced Phase Error." Sensors 19, no. 23 (November 27, 2019): 5202. http://dx.doi.org/10.3390/s19235202.
Повний текст джерелаLiu, Long, Guang Meng, and Hai Huang. "Damage Detection Based on ESPI and SVM." Key Engineering Materials 324-325 (November 2006): 1309–12. http://dx.doi.org/10.4028/www.scientific.net/kem.324-325.1309.
Повний текст джерелаMeng, Xiangyu, Huaina Yu, Yong Wang, Junchao Ren, Chaofan Xue, Shuimin Yang, Zhi Guo, Jun Zhao, Yanqing Wu, and Renzhong Tai. "Analysis of partially coherent light propagation through the soft X-ray interference lithography beamline at SSRF." Journal of Synchrotron Radiation 28, no. 3 (April 14, 2021): 902–9. http://dx.doi.org/10.1107/s1600577521003398.
Повний текст джерелаZhao, F. M., Z. Liu, and F. R. Jones. "Photoelastic Determination of Interfacial Shear Stresses in Model Composites." Key Engineering Materials 334-335 (March 2007): 289–92. http://dx.doi.org/10.4028/www.scientific.net/kem.334-335.289.
Повний текст джерелаYan, Wenhua, Xudong Ren, Minkang Zhou, and Zhongkun Hu. "Precision Magnetic Field Sensing with Dual Multi-Wave Atom Interferometer." Sensors 23, no. 1 (December 24, 2022): 173. http://dx.doi.org/10.3390/s23010173.
Повний текст джерелаRodrigo, Pablo, and Ignacio J. Duran. "Why Does Context Really Matter? Understanding Companies’ Dialogue with Fringe Communities." Sustainability 13, no. 2 (January 19, 2021): 999. http://dx.doi.org/10.3390/su13020999.
Повний текст джерелаGalietti, U., K. Genovese, L. Lamberti, and D. Posa. "A simple projection moiré system to measure displacements of aircraft structures." Journal of Strain Analysis for Engineering Design 42, no. 6 (August 1, 2007): 477–95. http://dx.doi.org/10.1243/03093247jsa167.
Повний текст джерелаGigliotti, M., Frédéric Jacquemin, J. Molimard, and A. Vautrin. "Transition Saddle-Cylinder Shape of Thin Unsymmetric [0/90] Square Plates under Hygrothermal Loads: Fringe Projection Method and Variational Approach." Applied Mechanics and Materials 3-4 (August 2006): 217–22. http://dx.doi.org/10.4028/www.scientific.net/amm.3-4.217.
Повний текст джерелаMa, Yang-Bin, Nikola Novak, Karsten Albe, and Bai-Xiang Xu. "Optimized electrocaloric effect by field reversal: Analytical model." Applied Physics Letters 109, no. 20 (November 14, 2016): 202906. http://dx.doi.org/10.1063/1.4968006.
Повний текст джерелаCoffie, Robert. "Analytical Field Plate Model for Field Effect Transistors." IEEE Transactions on Electron Devices 61, no. 3 (March 2014): 878–83. http://dx.doi.org/10.1109/ted.2014.2300115.
Повний текст джерелаNg, R., F. Udrea, and G. Amaratunga. "An analytical model for the 3D-RESURF effect." Solid-State Electronics 44, no. 10 (October 2000): 1753–64. http://dx.doi.org/10.1016/s0038-1101(00)00133-7.
Повний текст джерелаJayatilaka, C. J., and R. W. Gillham. "A deterministic-empirical model of the effect of the capillary fringe on near-stream area runoff 1. Description of the model." Journal of Hydrology 184, no. 3-4 (October 1996): 299–315. http://dx.doi.org/10.1016/0022-1694(95)02985-0.
Повний текст джерелаYin, Zhuoyi, Cong Liu, Chuang Zhang, Xiaoyuan He, and Fujun Yang. "Point-Wise Phase Estimation Method in Fringe Projection Profilometry under Non-Sinusoidal Distortion." Sensors 22, no. 12 (June 13, 2022): 4478. http://dx.doi.org/10.3390/s22124478.
Повний текст джерелаCheng, Xu, Xingjian Liu, Zhongwei Li, Kai Zhong, Liya Han, Wantao He, Wanbing Gan, Guoqing Xi, Congjun Wang, and Yusheng Shi. "High-Accuracy Globally Consistent Surface Reconstruction Using Fringe Projection Profilometry." Sensors 19, no. 3 (February 6, 2019): 668. http://dx.doi.org/10.3390/s19030668.
Повний текст джерелаJagtap, Sarika Madhukar, and Vitthal Janardan Gond. "Modeling of 7 Nano Meter Fin Field Effect Transistor for Evaluation of Fringe & Oxide Capacitance." Trends in Sciences 19, no. 2 (January 15, 2022): 2051. http://dx.doi.org/10.48048/tis.2022.2051.
Повний текст джерелаRoss, J. L., J. Blangero, M. C. Goldstein, and S. Schuler. "Proximate determinants of fertility in the Kathmandu valley, Nepal: an anthropological case study." Journal of Biosocial Science 18, no. 2 (April 1986): 179–96. http://dx.doi.org/10.1017/s0021932000016114.
Повний текст джерелаArgyriou, Ioannis, Martyn Wells, Alistair Glasse, David Lee, Pierre Royer, Bart Vandenbussche, Eliot Malumuth, et al. "The nature of point source fringes in mid-infrared spectra acquired with the James Webb Space Telescope." Astronomy & Astrophysics 641 (September 2020): A150. http://dx.doi.org/10.1051/0004-6361/202037535.
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