Статті в журналах з теми "Fluctuation electron microscopy"
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Kennedy, Ellis, Neal Reynolds, Luis Rangel DaCosta, Frances Hellman, Colin Ophus, and M. C. Scott. "Tilted fluctuation electron microscopy." Applied Physics Letters 117, no. 9 (August 31, 2020): 091903. http://dx.doi.org/10.1063/5.0015532.
Повний текст джерелаZjajo, Armin, Itai Matzkevich, Hongchu Du, Rafal Dunin-Borkowski, Aram Rezikyan, and Michael Treacy. "Reducing Decoherence in Fluctuation Electron Microscopy." Microscopy and Microanalysis 27, S1 (July 30, 2021): 1776–77. http://dx.doi.org/10.1017/s1431927621006498.
Повний текст джерелаVoyles, P. M., and D. A. Muller. "Fluctuation Microscopy in the STEM." Microscopy and Microanalysis 7, S2 (August 2001): 226–27. http://dx.doi.org/10.1017/s1431927600027203.
Повний текст джерелаRezikyan, A., Z. Jibben, B. Rock, G. Zhao, and M. Treacy. "Simulation of Decoherence in Fluctuation Electron Microscopy." Microscopy and Microanalysis 19, S2 (August 2013): 1592–93. http://dx.doi.org/10.1017/s1431927613009951.
Повний текст джерелаRezikyan, A., Z. Jibben, B. Rock, G. Zhao, and M. M. J. Treacy. "Simulation of Decoherence in Fluctuation Electron Microscopy." Microscopy and Microanalysis 20, S3 (August 2014): 150–51. http://dx.doi.org/10.1017/s1431927614002475.
Повний текст джерелаLi, J., and I. Anderson. "Rocking-Beam Variable Coherence Electron Microscopy: An Alternative Approach to Fluctuation Electron Microscopy." Microscopy and Microanalysis 12, S02 (July 31, 2006): 672–73. http://dx.doi.org/10.1017/s1431927606067316.
Повний текст джерелаMoriguchi, Sakumi, Hiroki Kurata, Seiji Isoda, and Takashi Kobayashi. "High Resolution Electron Microscopy in Organic Chemistry: 1-MEV Electron Microscope in Kyoto." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 140–41. http://dx.doi.org/10.1017/s0424820100179452.
Повний текст джерелаRezikyan, Aram, Zechariah J. Jibben, Bryan A. Rock, Gongpu Zhao, Franz A. M. Koeck, Robert F. Nemanich, and Michael M. J. Treacy. "Speckle Suppression by Decoherence in Fluctuation Electron Microscopy." Microscopy and Microanalysis 21, no. 6 (September 18, 2015): 1455–74. http://dx.doi.org/10.1017/s1431927615015135.
Повний текст джерелаLi, Jing, X. Gu, and T. C. Hufnagel. "Using Fluctuation Microscopy to Characterize Structural Order in Metallic Glasses." Microscopy and Microanalysis 9, no. 6 (November 21, 2003): 509–15. http://dx.doi.org/10.1017/s1431927603030459.
Повний текст джерелаStratton, W. G., and P. M. Voyles. "Comparison of fluctuation electron microscopy theories and experimental methods." Journal of Physics: Condensed Matter 19, no. 45 (October 24, 2007): 455203. http://dx.doi.org/10.1088/0953-8984/19/45/455203.
Повний текст джерелаJungk, Tobias, Thomas Walther, and Werner Mader. "Fluctuation Electron Microscopy on a-Ge and Polycrystalline Gold." Microscopy and Microanalysis 9, S03 (September 2003): 152–53. http://dx.doi.org/10.1017/s1431927603016143.
Повний текст джерелаRadić, Dražen, Sven Hilke, Martin Peterlechner, Matthias Posselt, Gerhard Wilde, and Hartmut Bracht. "Comparison of Experimental STEM Conditions for Fluctuation Electron Microscopy." Microscopy and Microanalysis 26, no. 6 (August 27, 2020): 1100–1109. http://dx.doi.org/10.1017/s143192762002440x.
Повний текст джерелаDe Hosson, Jeff Th M., Nicolai G. Chechenin, Daan-Hein Alsem, Tomas Vystavel, Bart J. Kooi, Antoni R. Chezan, and Dik O. Boerma. "Ultrasoft Magnetic Films Investigated with Lorentz Tranmission Electron Microscopy and Electron Holography." Microscopy and Microanalysis 8, no. 4 (August 2002): 274–87. http://dx.doi.org/10.1017/s1431927602020214.
Повний текст джерелаVerma, Navneet C., Chethana Rao, Ashutosh Singh, Neha Garg, and Chayan K. Nandi. "Dual responsive specifically labelled carbogenic fluorescent nanodots for super resolution and electron microscopy." Nanoscale 11, no. 14 (2019): 6561–65. http://dx.doi.org/10.1039/c9nr00457b.
Повний текст джерелаTreacy, M., A. Rougee, and P. Buseck. "Fluctuation Electron Microscopy of Shungite, a Disordered Natural Carbonaceous Material." Microscopy and Microanalysis 12, S02 (July 31, 2006): 588–89. http://dx.doi.org/10.1017/s1431927606066128.
Повний текст джерелаYi, F., WG Stratton, and PM Voyles. "Model of Fluctuation Electron Microscopy for a Nanocrystal /Amorphous Composite." Microscopy and Microanalysis 14, S2 (August 2008): 914–15. http://dx.doi.org/10.1017/s1431927608086133.
Повний текст джерелаLee, Bong-Sub, Stephen G. Bishop, and John R. Abelson. "Fluctuation Transmission Electron Microscopy: Detecting Nanoscale Order in Disordered Structures." ChemPhysChem 11, no. 11 (July 7, 2010): 2311–17. http://dx.doi.org/10.1002/cphc.201000153.
Повний текст джерелаZhao, Chao, Ren Bo Song, Lei Feng Zhang, Fu Qiang Yang, and Shuai Qin. "Research on Fluctuations in Work Hardening Rate of a Fe-Mn-Al-C Steel." Materials Science Forum 817 (April 2015): 288–92. http://dx.doi.org/10.4028/www.scientific.net/msf.817.288.
Повний текст джерелаChen, X., J. M. Gibson, and J. Sullivan. "Fluctuation Microscopy Studies of Amorphous Diamond-Like Carbon Films." Microscopy and Microanalysis 6, S2 (August 2000): 432–33. http://dx.doi.org/10.1017/s1431927600034656.
Повний текст джерелаHwang, Jinwoo, and P. M. Voyles. "Variable Resolution Fluctuation Electron Microscopy on Cu-Zr Metallic Glass Using a Wide Range of Coherent STEM Probe Size." Microscopy and Microanalysis 17, no. 1 (December 2, 2010): 67–74. http://dx.doi.org/10.1017/s1431927610094109.
Повний текст джерелаBiswas, Parthapratim, Raymond Atta-Fynn, S. Chakraborty, and D. A. Drabold. "Real space information from fluctuation electron microscopy: applications to amorphous silicon." Journal of Physics: Condensed Matter 19, no. 45 (October 24, 2007): 455202. http://dx.doi.org/10.1088/0953-8984/19/45/455202.
Повний текст джерелаRyan, Joseph V., and Carlo G. Pantano. "Medium-range order in silicon oxycarbide glass by fluctuation electron microscopy." Journal of Physics: Condensed Matter 19, no. 45 (October 24, 2007): 455205. http://dx.doi.org/10.1088/0953-8984/19/45/455205.
Повний текст джерелаKwon, Min-Ho, Bong-Sub Lee, Stephanie N. Bogle, Lakshmi N. Nittala, Stephen G. Bishop, John R. Abelson, Simone Raoux, Byung-ki Cheong, and Ki-Bum Kim. "Nanometer-scale order in amorphous Ge2Sb2Te5 analyzed by fluctuation electron microscopy." Applied Physics Letters 90, no. 2 (January 8, 2007): 021923. http://dx.doi.org/10.1063/1.2430067.
Повний текст джерелаZhao, Gongpu, Michael M. J. Treacy, and Peter R. Buseck. "Fluctuation electron microscopy of medium-range order in ion-irradiated zircon." Philosophical Magazine 90, no. 35-36 (December 14, 2010): 4661–77. http://dx.doi.org/10.1080/14786431003630876.
Повний текст джерелаKennedy, Ellis, Alejandro Ceballos, Frances Hellman, Colin Ophus, and Mary Scott. "Tilted Fluctuation Electron Microscopy Characterization of Magnetically Anisotropic Amorphous Metal Films." Microscopy and Microanalysis 25, S2 (August 2019): 1886–87. http://dx.doi.org/10.1017/s143192761901016x.
Повний текст джерелаVoyles, Paul M., and John R. Abelson. "Medium-range order in amorphous silicon measured by fluctuation electron microscopy." Solar Energy Materials and Solar Cells 78, no. 1-4 (July 2003): 85–113. http://dx.doi.org/10.1016/s0927-0248(02)00434-8.
Повний текст джерелаStratton, W. G., J. Hamann, J. H. Perepezko, P. M. Voyles, X. Mao, and S. V. Khare. "Aluminum nanoscale order in amorphous Al92Sm8 measured by fluctuation electron microscopy." Applied Physics Letters 86, no. 14 (April 4, 2005): 141910. http://dx.doi.org/10.1063/1.1897830.
Повний текст джерелаSarac, B., C. Gammer, L. Deng, E. Park, Y. Yokoyama, M. Stoica, and J. Eckert. "Elastostatic reversibility in thermally formed bulk metallic glasses: nanobeam diffraction fluctuation electron microscopy." Nanoscale 10, no. 3 (2018): 1081–89. http://dx.doi.org/10.1039/c7nr06891c.
Повний текст джерелаLi, Tian T., Stephanie N. Bogle, and John R. Abelson. "Quantitative Fluctuation Electron Microscopy in the STEM: Methods to Identify, Avoid, and Correct for Artifacts." Microscopy and Microanalysis 20, no. 5 (July 17, 2014): 1605–18. http://dx.doi.org/10.1017/s1431927614012756.
Повний текст джерелаJungk, T., T. Walther, and W. Mader. "Critical assessment of the speckle statistics in fluctuation electron microscopy and comparison to electron diffraction." Ultramicroscopy 104, no. 3-4 (October 2005): 206–19. http://dx.doi.org/10.1016/j.ultramic.2005.04.003.
Повний текст джерелаWatanabe, S. "Direct Observation of Nanostructural Fluctuation during Radiation-Induced Amorphization." Materials Science Forum 561-565 (October 2007): 2021–24. http://dx.doi.org/10.4028/www.scientific.net/msf.561-565.2021.
Повний текст джерелаIijima, Sumio. "A direct measurement of diffusion jump frequency in amorphous materials using VTR-high resolution electron microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 126–27. http://dx.doi.org/10.1017/s0424820100152604.
Повний текст джерелаBornhöfft, Manuel, Tobias Saltzmann, Julia Benke, Paul M. Voyles, Ulrich Simon, Matthias Wuttig, and Joachim Mayer. "Nano-diffraction in STEM and fluctuation electron microscopy of phase-change material." Acta Crystallographica Section A Foundations and Advances 71, a1 (August 23, 2015): s286. http://dx.doi.org/10.1107/s2053273315095637.
Повний текст джерелаRadić, Dražen, Sven Hilke, Martin Peterlechner, Matthias Posselt, and Hartmut Bracht. "Fluctuation electron microscopy on silicon amorphized at varying self ion-implantation conditions." Journal of Applied Physics 126, no. 9 (September 7, 2019): 095707. http://dx.doi.org/10.1063/1.5107494.
Повний текст джерелаKennedy, Ellis, Alejandro Ceballos, Frances Hellman, Colin Ophus, and Mary Scott. "Characterizing Magnetic Anisotropy in Amorphous Metal Films Using Tilted Fluctuation Electron Microscopy." Microscopy and Microanalysis 24, S1 (August 2018): 204–5. http://dx.doi.org/10.1017/s1431927618001514.
Повний текст джерелаTreacy, M. M. J. "When structural noise is the signal: Speckle statistics in fluctuation electron microscopy." Ultramicroscopy 107, no. 2-3 (February 2007): 166–71. http://dx.doi.org/10.1016/j.ultramic.2006.07.001.
Повний текст джерелаStratton, W. G., and P. M. Voyles. "A phenomenological model of fluctuation electron microscopy for a nanocrystal/amorphous composite." Ultramicroscopy 108, no. 8 (July 2008): 727–36. http://dx.doi.org/10.1016/j.ultramic.2007.11.004.
Повний текст джерелаCheng, Ju-Yin, J. M. Gibson, and D. C. Jacobson. "Observations of structural order in ion-implanted amorphous silicon." Journal of Materials Research 16, no. 11 (November 2001): 3030–33. http://dx.doi.org/10.1557/jmr.2001.0416.
Повний текст джерелаHwang, J., Z. H. Melgarejo, Y. E. Kalay, M. J. Kramer, D. S. Stone, and P. M. Voyles. "Computational Structure Refinement by Hybrid Reverse Monte Carlo Simulation Incorporating Fluctuation Electron Microscopy." Microscopy and Microanalysis 19, S2 (August 2013): 794–95. http://dx.doi.org/10.1017/s1431927613005965.
Повний текст джерелаBogle, Stephanie N., Paul M. Voyles, Sanjay V. Khare, and John R. Abelson. "Quantifying nanoscale order in amorphous materials: simulating fluctuation electron microscopy of amorphous silicon." Journal of Physics: Condensed Matter 19, no. 45 (October 24, 2007): 455204. http://dx.doi.org/10.1088/0953-8984/19/45/455204.
Повний текст джерелаYi, Feng, and P. M. Voyles. "Analytical and computational modeling of fluctuation electron microscopy from a nanocrystal/amorphous composite." Ultramicroscopy 122 (November 2012): 37–47. http://dx.doi.org/10.1016/j.ultramic.2012.07.022.
Повний текст джерелаLi, Tian T., Kristof Darmawikarta, and John R. Abelson. "Quantifying nanoscale order in amorphous materials via scattering covariance in fluctuation electron microscopy." Ultramicroscopy 133 (October 2013): 95–100. http://dx.doi.org/10.1016/j.ultramic.2013.06.017.
Повний текст джерелаMaldonis, Jason, Pei Zhang, Li He, Ankit Gujral, Mark D. Ediger, and Paul M. Voyles. "Fluctuation Electron Microscopy and Computational Structure Refinement for the Structure of Amorphous Materials." Microscopy and Microanalysis 22, S3 (July 2016): 486–87. http://dx.doi.org/10.1017/s1431927616003287.
Повний текст джерелаHruszkewycz, S. O., T. Fujita, Mingwei W. Chen, and Todd C. Hufnagel. "Selected area nanodiffraction fluctuation electron microscopy for studying structural order in amorphous solids." Scripta Materialia 58, no. 4 (February 2008): 303–6. http://dx.doi.org/10.1016/j.scriptamat.2007.10.009.
Повний текст джерелаKrivanek, O. L., N. Dellby, A. J. Gubbens, M. K. Kundmann, M. L. Leber, D. A. Ray, and K. V. Truong. "Advances in Parallel-Detection EELS." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (August 12, 1990): 76–77. http://dx.doi.org/10.1017/s0424820100133977.
Повний текст джерелаStratton, W. G., P. M. Voyles, J. Hamann, and J. H. Perepezko. "Medium-Range Order in High Al-content Amorphous Alloys Measured by Fluctuation Electron Microscopy." Microscopy and Microanalysis 10, S02 (August 2004): 788–89. http://dx.doi.org/10.1017/s1431927604880838.
Повний текст джерелаAshida, Koji, Daichi Dojima, Satoshi Torimi, Norihito Yabuki, Yusuke Sudo, Takuya Sakaguchi, Satoru Nogami, Makoto Kitabatake, and Tadaaki Kaneko. "Rearrangement of Surface Structure of 4o Off-Axis 4H-SiC (0001) Epitaxial Wafer by High Temperature Annealing in Si/Ar Ambient." Materials Science Forum 924 (June 2018): 249–52. http://dx.doi.org/10.4028/www.scientific.net/msf.924.249.
Повний текст джерелаChen, Lian-Yi, Qing-Ping Cao, J. Z. Jiang, and Jing-Wei Deng. "Reply to the comments of Y.H. Liu: Ion sputter erosion in metallic glass—A response to “Comment on: Homogeneity of Zr64.13Cu15.75Ni10.12Al10 bulk metallic glass” by L-Y. Chen, Y-W. Zeng, Q-P. Cao, B-J. Park, Y-M. Chen, K. Hono, U. Vainio, Z-L. Zhang, U. Kaiser, X-D. Wang,and J-Z Jiang [J. Mater. Res. 24, 3116 (2009)]." Journal of Materials Research 25, no. 3 (March 2010): 602–4. http://dx.doi.org/10.1557/jmr.2010.0079.
Повний текст джерелаZhu, Guang, Xiao Ping Zou, Jin Cheng, Mao Fa Wang, and Yi Su. "Synthesis of Straight Y-Shaped Silica Nanorods." Advanced Materials Research 47-50 (June 2008): 367–70. http://dx.doi.org/10.4028/www.scientific.net/amr.47-50.367.
Повний текст джерелаZhang, Qian, Qiu Xiang Wang, Hong Zhou Dong, and Li Feng Dong. "Synthesis and Characterization of Exotic Carbon Fibers with Branched Spurs Using Nickel Catalyst Precursor." Advanced Materials Research 645 (January 2013): 3–9. http://dx.doi.org/10.4028/www.scientific.net/amr.645.3.
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