Добірка наукової літератури з теми "FILM THICKNESS SIMULATION"
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Статті в журналах з теми "FILM THICKNESS SIMULATION"
Markov, A. B., A. V. Solovyov, E. V. Yakovlev, E. A. Pesterev, V. I. Petrov, and M. S. Slobodyan. "Computer simulation of temperature fields in the Cr (film)-Zr (substrate) system during pulsed electron-beam irradiation." Journal of Physics: Conference Series 2064, no. 1 (November 1, 2021): 012058. http://dx.doi.org/10.1088/1742-6596/2064/1/012058.
Повний текст джерелаGrigoriev, Fedor V., Vladimir B. Sulimov, and Alexander V. Tikhonravov. "Atomistic Simulation of Stresses in Growing Silicon Dioxide Films." Coatings 10, no. 3 (February 29, 2020): 220. http://dx.doi.org/10.3390/coatings10030220.
Повний текст джерелаDu, Run, Anying Zhang, Zhihua Du, and Xiaoyu Zhang. "Molecular Dynamics Simulation on Thin-Film Lubrication of a Mixture of Three Alkanes." Materials 13, no. 17 (August 20, 2020): 3689. http://dx.doi.org/10.3390/ma13173689.
Повний текст джерелаWang, Ben, Xiuhua Fu, Shigeng Song, Hin Chu, Desmond Gibson, Cheng Li, Yongjing Shi, and Zhentao Wu. "Simulation and Optimization of Film Thickness Uniformity in Physical Vapor Deposition." Coatings 8, no. 9 (September 16, 2018): 325. http://dx.doi.org/10.3390/coatings8090325.
Повний текст джерелаYan, Ying, Jiarun Li, Qiuyu Liu, and Ping Zhou. "Evaporation Effect on Thickness Distribution for Spin-Coated Films on Rectangular and Circular Substrates." Coatings 11, no. 11 (October 29, 2021): 1322. http://dx.doi.org/10.3390/coatings11111322.
Повний текст джерелаWang, Kaijie, Yongzhi Cao, Yaowen Cui, Aiying Ye, Shaofan Yi, and Zhenjiang Hu. "Study on Parameter Correlation of Thickness and Performance of Anodizing Film on 6061 Aluminum Alloy Frame in High Energy Laser System." Coatings 12, no. 12 (December 16, 2022): 1978. http://dx.doi.org/10.3390/coatings12121978.
Повний текст джерелаP, Ramesh, and James Gunasekaran E. "Numerical Simulation of Film Thickness Formation in a PFI Engine Under Motoring Conditions." Bonfring International Journal of Industrial Engineering and Management Science 9, no. 3 (September 30, 2019): 11–15. http://dx.doi.org/10.9756/bijiems.9032.
Повний текст джерелаHU, ZHAN-NING, and V. C. LO. "THICKNESS DEPENDENCE OF THE COERCIVE FIELD IN FERROELECTRIC THIN FILMS." International Journal of Modern Physics B 20, no. 22 (September 10, 2006): 3223–31. http://dx.doi.org/10.1142/s0217979206035424.
Повний текст джерелаKhaneft, Alexander V., Vadim A. Dolgachev, and Svyatoslav A. Rybin. "The Effect of Metal Film Thickness on Ignition of Organic Explosives with a Laser Pulse." Molecules 24, no. 24 (December 16, 2019): 4600. http://dx.doi.org/10.3390/molecules24244600.
Повний текст джерелаXiong, Min, Chuanxin Teng, Ming Chen, Yu Cheng, Shijie Deng, Fuwang Li, Hongchang Deng, Houquan Liu, and Libo Yuan. "Simulation Study of High Sensitivity Fiber SPR Temperature Sensor with Liquid Filling." Sensors 22, no. 15 (July 30, 2022): 5713. http://dx.doi.org/10.3390/s22155713.
Повний текст джерелаДисертації з теми "FILM THICKNESS SIMULATION"
Іващенко, Максим Миколайович, Максим Николаевич Иващенко, Maksym Mykolaiovych Ivashchenko, Олександр Дмитрович Погребняк, Александр Дмитриевич Погребняк, Oleksandr Dmytrovych Pohrebniak, S. N. Abdulla, and A. A. K. Muhammed. "Design and Fabrication Heterojunction Solarcell of Si-CdS-ZnO Thin Film." Thesis, Sumy State University, 2012. http://essuir.sumdu.edu.ua/handle/123456789/35487.
Повний текст джерелаŽonda, Peter. "Konstrukce simulátoru kyčelního kloubu." Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2016. http://www.nusl.cz/ntk/nusl-241896.
Повний текст джерелаPolnický, Vojtěch. "Konstrukce simulátoru kolenního kloubu." Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2017. http://www.nusl.cz/ntk/nusl-318786.
Повний текст джерелаSommer, Oliver. "Ein Beitrag zur Untersuchung des Verhaltens dünner Flüssigkeitsfilme nahe gekrümmten Substratoberflächen." Doctoral thesis, Universitätsbibliothek Chemnitz, 2014. http://nbn-resolving.de/urn:nbn:de:bsz:ch1-qucosa-154946.
Повний текст джерелаIn this study the behaviour of a thin liquid layer at a curved solid edge was examined by experimental coating investigations based on the laser-induced fluorescence technique and by numerical film simulations based on the Volume-of-Fluid multiphase flow model, respectively. The main motivation was to find optimal combinations of influencing quantities to reduce the fat-edge effect. Therefore a study of these quantities was performed, in which application parameters like edge radii of curvature and application layer thicknesses as well as determining liquid properties like viscosity and surface tension have been varied. Results are described qualitatively at corresponding fat-edge shapes and quantified by suitable fat-edge parameters, which had to be identified and selected. It could be shown that adverse and appropriate influencing parameter combinations exist, which generate conspicuous and less distinctive fat-edges, respectively - especially in laboratory experiments. The experimental findings and proportionalities regarding fat-edge shapes and dimensions are found to be physically plausible. Furthermore an order of significance of the influencing quantities established. Eventually, a dimensionless quantity was derived by dimensional analysis, which describes the fat-edge effect. Thus, the fat-edge effect has also been described by the application of similarity theory and the corresponding dimenionless number, respectively
Tsai, Dian-Yang, and 蔡典洋. "Simulation of Polysilicon Thin Film Transistor Characteristics with LDD and Field Plate Thickness Variation Design." Thesis, 2019. http://ndltd.ncl.edu.tw/handle/fs79pe.
Повний текст джерела逢甲大學
電子工程學系
107
Abstract Polycrystalline silicon thin-film transistors(Poly-Si) are widely used in various field ,including active-matrix liquid crystal displays(AM-LCDs), solar cells and three-dimensional(3-D) integrated circuit because they have high carrier mobility and driving current. It is widely known that the high electric field induced near the drain causes several undesirable effects in the device electrical characteristics, such as the large leakage current, kink effect, and hot carrier effect. In recent years,many groups which research TFTs have made efforts in the issue of electric field distribution. The non-ideal effects of high electric-field at drain were improved by various structure designs, including offset structure. This study was continued and changed the novel structure previously proposed by the laboratory with increasing the thickness of the field plate which will improve the dispersion of currents, avoid high electric fields, and reduce ion collisions. We use ISE-TCAD to simulate the electric field, electron current density, and impact ionization distributions of the novel -TFT to do analyses of the device performances. We found that the novel -TFT has a lower leakage current, higher breakdown voltage, and reduces impact ionization. Further more,it improves kink effect. Finally, our experimental results demonstrated novel-TFT effectively improved the kink effect and leakage current effects. In addition, for the device stability, the FPRSD-TFT degraded slower than conventional TFT, because of a combination of field plate and RSD.
LU, JYUN-HONG, and 盧俊宏. "Dynamically Monitoring the Thickness of Film using Envelope Analysis─The Preliminary Simulation of Uniformity of Large-Area Ta2O5 Thin Film Deposited by RF Magnetron Sputtering." Thesis, 2007. http://ndltd.ncl.edu.tw/handle/05507665771991951389.
Повний текст джерела輔仁大學
物理學系
95
It’s extremely important that getting a stably optical characteristic to coat a optical thin film, especially for the uniformity of large-area optical thin film. In this thesis, I use a self-made mode to move and roll the substrate. At the same time, I choose the specific programming language, called LabVIEW to code optical monitoring programs, which is based on envelope analysis. Furthermore, I build a wideband dynamic film thickness control system on RF magnetron sputtering coater and use the substrate, which is a disc in shape to simulate the large-area coating. In the end, I analyze the uniformity of film thickness and the reason of the inaccuracy.
GAUR, SHAILENDRA KUMAR. "HEAT & MASS TRANSFER ANALYSIS OF GOLD, TIN & INDIUM THIN LAYER DEPOSITION ON SURFACE." Thesis, 2016. http://dspace.dtu.ac.in:8080/jspui/handle/repository/14778.
Повний текст джерелаKuo-Wei, Huang, and 黃國瑋. "Dynamically Monitoring the Thickness of Film using Wideband Optical Monitoring –The Preliminary Simulation of Uniformity of Large-Area TiN and Si Thin Film Deposited by RF Magnetron Sputtering." Thesis, 2007. http://ndltd.ncl.edu.tw/handle/80265786159512487551.
Повний текст джерела輔仁大學
物理學系
96
Since the uniform of thickness is different in every position on the thin film, useful area maybe small in a large area thin film application. The main subject in this study is to construct an optical monitoring system in magnetron sputtering system. Using Wideband Optical Monitoring as the monitoring method, we decrease the thickness errors at modified ceased point. Moreover, we cooperate dynamic film thickness control device to coat TiN and Si thin film and discuss the uniform. The experiments proof that, we got success in using this monitoring method to control the thickness and coating uniform film.
Yu, Jia-Cong, and 余佳璁. "Dynamically Monitoring and Compensating the Thickness of Film using Turning Point Value Analysis-The Preliminary Simulation of Uniformity of Large-Area Ta2O5 Thin Film Deposited by RF Magnetron Sputtering." Thesis, 2008. http://ndltd.ncl.edu.tw/handle/07958095493905949383.
Повний текст джерела輔仁大學
物理學系
96
The thickness of film has to reach the specific degree of uniformity, because it effects optical characteristic directly by itself. However, the bigger size of the substrate is, the harder demand of uniformity reach. The thesis mainly concerns the situation of the uniformity in the thickness of Ta2O5 film being deposited on the circular substrate whose diameter is 180mm. The research method is to set up Dynamical Monitoring which optical monitors with turning point value analysis on RF magnetron sputtering coater. The major findings were as follow: (1)The fineness of the uniformity in the thickness of Ta2O5 films which are in the same radius and different degrees. (2)The whole thickness is thicker than the planned thickness, however, the researcher correct the inaccuracy through modifying the monitoring wavelength.
Chao, Wei-Siang, and 趙偉翔. "Effects of mainstream Reynolds number, boundary layer thickness, and turbulence intensity on film cooling with a fan-shaped hole by direct numerical simulation." Thesis, 2018. http://ndltd.ncl.edu.tw/handle/63287w.
Повний текст джерела國立交通大學
機械工程系所
106
The aim of this thesis is to investigate film cooling problems with a fan-shaped cooling hole. In order to simulate this subject realistically, the viscosity and compressibility of the gas are taken into consideration simultaneously. Several methods, such as Roe scheme, preconditioning and dual time stepping matching the LUSGS method, are adopted in the current CFD code to solve compressible flow problems. Firstly, the mainstream Reynolds number is varied to study its effect on film cooling. Results indicate that the blow-off phenomenon happens when the mainstream Reynolds number equals to 480. On the contrary, at the higher Reynolds number, the coolant jet is deflected by the mainstream fluid. Thus, a better film cooling performance is achieved with higher mainstream Reynolds number (Re=3200). A detailed comparison of the vortex structure is presented in this study. Secondly, the Boundary layer thickness is varied to study its influence on film cooling. Results reveal that a horseshoe vortex appears with a thicker mainstream boundary layer, and thus the lateral coverage of the coolant fluid is increased significantly. Also, the increase of turbulence intensity eliminates the blow-off phenomenon, which happens in a thin mainstream boundary layer condition.
Частини книг з теми "FILM THICKNESS SIMULATION"
Peter, Johannes M. F., and Markus J. Kloker. "Numerical Simulation of Film Cooling in Supersonic Flow." In Notes on Numerical Fluid Mechanics and Multidisciplinary Design, 79–95. Cham: Springer International Publishing, 2020. http://dx.doi.org/10.1007/978-3-030-53847-7_5.
Повний текст джерелаPotyka, Johanna, Johannes Kromer, Muyuan Liu, Kathrin Schulte, and Dieter Bothe. "Modelling and Numerical Simulation of Binary Droplet Collisions Under Extreme Conditions." In Fluid Mechanics and Its Applications, 127–47. Cham: Springer International Publishing, 2022. http://dx.doi.org/10.1007/978-3-031-09008-0_7.
Повний текст джерелаMoroz, L. I., E. M. Veselova, and A. G. Maslovskaya. "Simulation of Thickness-Dependent Polarization Switching in Ferroelectric Thin Films Using COMSOL Multiphysics." In SMART Automatics and Energy, 49–57. Singapore: Springer Singapore, 2022. http://dx.doi.org/10.1007/978-981-16-8759-4_6.
Повний текст джерелаErkkilä, Anna-Leena, Jukka Räbinä, Ilkka Pölönen, Timo Sajavaara, Esa Alakoski, and Tero Tuovinen. "Using Wave Propagation Simulations and Convolutional Neural Networks to Retrieve Thin Film Thickness from Hyperspectral Images." In Intelligent Systems, Control and Automation: Science and Engineering, 261–75. Cham: Springer International Publishing, 2021. http://dx.doi.org/10.1007/978-3-030-70787-3_17.
Повний текст джерелаMo, Guowei, Yunxian Cui, Junwei Yin, Pengfei Gao, and Babak Safaei. "Design and Simulation of Smart Bolt Based on Zno Piezoelectric Thin Film Sensor." In Proceedings of the 2022 International Conference on Smart Manufacturing and Material Processing (SMMP2022). IOS Press, 2022. http://dx.doi.org/10.3233/atde220828.
Повний текст джерелаRaniero, Walter, Gianantonio Della Mea, and Matteo Campostrini. "Functionalization of Surfaces with Optical Coatings Produced by PVD Magnetron Sputtering." In Research Perspectives on Functional Micro- and Nanoscale Coatings, 170–207. IGI Global, 2016. http://dx.doi.org/10.4018/978-1-5225-0066-7.ch007.
Повний текст джерелаXu, Fangwei, and Xiaojian Liu. "Dynamic Texture Design Method Based on Fresnel Optical Principle." In Frontiers in Artificial Intelligence and Applications. IOS Press, 2023. http://dx.doi.org/10.3233/faia220709.
Повний текст джерелаTchangnwa Nya, Fridolin, and Guy Maurel Dzifack Kenfack. "Thin-Film Solar Cells Performances Optimization: Case of Cu (In, Ga) Se2-ZnS." In Solar Cells [Working Title]. IntechOpen, 2021. http://dx.doi.org/10.5772/intechopen.93817.
Повний текст джерелаТези доповідей конференцій з теми "FILM THICKNESS SIMULATION"
Washizu, Hitoshi, Shuzo Sanda, Shi-Aki Hyodo, Toshihide Ohmori, Noriaki Nishino, and Atsushi Suzuki. "All-Atom Molecular Dynamics Simulation of Submicron Thickness EHL Oil Film." In ASME/STLE 2007 International Joint Tribology Conference. ASMEDC, 2007. http://dx.doi.org/10.1115/ijtc2007-44179.
Повний текст джерелаWang, Xinwei, and Cecil Lawrence. "Molecular Dynamics Simulation of Thermal Conductivity of Silicon Films Using Environment-Dependent Interatomic Potential." In ASME 2004 Heat Transfer/Fluids Engineering Summer Conference. ASMEDC, 2004. http://dx.doi.org/10.1115/ht-fed2004-56725.
Повний текст джерелаMartini, A., Y. Liu, R. Q. Snurr, and Q. Wang. "Integration of a Molecular Viscosity Model and a Continuum EHL Solution for Simulation of Thin Film Lubrication." In World Tribology Congress III. ASMEDC, 2005. http://dx.doi.org/10.1115/wtc2005-63091.
Повний текст джерелаSverdlov, Viktor, Oskar Baumgartner, Thomas Windbacher, Franz Schanovsky, and Siegfried Selberherr. "Thickness Dependence of the Effective Masses in a Strained Thin Silicon Film." In 2009 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD). IEEE, 2009. http://dx.doi.org/10.1109/sispad.2009.5290252.
Повний текст джерелаJi, Pengfei, Mengzhe He, Yiming Rong, Yuwen Zhang, and Yong Tang. "Multiscale Investigation of Thickness Dependent Melting Thresholds of Nickel Film Under Femtosecond Laser Heating." In ASME 2018 International Mechanical Engineering Congress and Exposition. American Society of Mechanical Engineers, 2018. http://dx.doi.org/10.1115/imece2018-86947.
Повний текст джерелаLiu, Qi-Xin, Pei-Xue Jiang, and Heng Xiang. "Molecular Dynamics Simulation of Non-Fourier Heat Conduction." In 2007 First International Conference on Integration and Commercialization of Micro and Nanosystems. ASMEDC, 2007. http://dx.doi.org/10.1115/mnc2007-21151.
Повний текст джерелаKakimpa, B., H. P. Morvan, and S. Hibberd. "The Numerical Simulation of Multi-Scale Oil Films Using Coupled VOF and Eulerian Thin-Film Models." In ASME Turbo Expo 2016: Turbomachinery Technical Conference and Exposition. American Society of Mechanical Engineers, 2016. http://dx.doi.org/10.1115/gt2016-56747.
Повний текст джерелаLan, H., M. Friedrich, B. F. Armaly, and J. A. Drallmeier. "Three-Dimensional Shear Driven Thin Liquid Film in a Duct." In ASME 2006 International Mechanical Engineering Congress and Exposition. ASMEDC, 2006. http://dx.doi.org/10.1115/imece2006-15113.
Повний текст джерелаHuang, Zhengxing, Zhenan Tang, Suyuan Bai, and Jun Yu. "Temperature Dependence of Thermal Conductivity of Amorphous and Crystal Thin Film by Molecular Dynamics Simulation." In ASME 2007 5th International Conference on Nanochannels, Microchannels, and Minichannels. ASMEDC, 2007. http://dx.doi.org/10.1115/icnmm2007-30085.
Повний текст джерелаGada, Vinesh H., and Atul Sharma. "Simulation of Multi-Mode Film Boiling Using Level Set Method." In ASME 2009 International Mechanical Engineering Congress and Exposition. ASMEDC, 2009. http://dx.doi.org/10.1115/imece2009-11161.
Повний текст джерела