Книги з теми "FIELD EMISSION OF ELECTRONS"

Mesi︠a︡t︠s︡, G. A. Explosive electron emission. Ekaterinburg: URO-Press, 1998.

Egorov, Nikolay, and Evgeny Sheshin. Field Emission Electronics. Cham: Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-319-56561-3.

Brodusch, Nicolas, Hendrix Demers, and Raynald Gauvin. Field Emission Scanning Electron Microscopy. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-4433-5.

Fleck, Roland A., and Bruno M. Humbel. Biological Field Emission Scanning Electron Microscopy. Chichester, UK: John Wiley & Sons, Ltd, 2019. http://dx.doi.org/10.1002/9781118663233.

Tan ji bo mo zhi bei ji chang zhi dian zi fa she: Tanji bomo zhibei ji changzhi dianzi fashe. Zhengzhou Shi: Zhengzhou da xue chu ban she, 2009.

Fursey, George. Field emission in vacuum microelectronics. New York, NY: Kluwer Academic/Plenum Publishers, 2004.

Archer, Anthony David. Spectroscopic studies of field-induced electron emission from isolated microstructures. Birmingham: Aston University. Department of Electrical Engineering and Applied Physics, 1992.

Prasad, Ghatak Kamakhya, ed. Fowler-Nordheim field emission: Effects in semiconductor nanostructures. Heidelberg: Springer, 2012.

Kapustin, Vladimir, Aleksandr Sigov, Illarion Li, and Vladimir Mel'nikov. Point defects in oxides and emission properties. ru: INFRA-M Academic Publishing LLC., 2022. http://dx.doi.org/10.12737/1846464.

Hill, D. A. Detection of quasi-static electric fields radiated by electrically small emitters. [Gaithersburg, Md.]: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2000.

1938-, Cavcey Kenneth H., and National Institute of Standards and Technology (U.S.), eds. Detection of quasi-static electric fields radiated by electrically small emitters. [Gaithersburg, Md.]: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2000.

Hill, D. A. Detection of quasi-static electric fields radiated by electrically small emitters. [Gaithersburg, Md.]: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2000.

Hill, D. A. Detection of quasi-static electric fields radiated by electrically small emitters. [Gaithersburg, Md.]: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2000.

Hill, D. A. Detection of quasi-static electric fields radiated by electrically small emitters. [Gaithersburg, Md.]: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2000.

Hill, D. A. Detection of quasi-static electric fields radiated by electrically small emitters. [Gaithersburg, Md.]: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2000.

1938-, Cavcey Kenneth H., and National Institute of Standards and Technology (U.S.), eds. Detection of quasi-static electric fields radiated by electrically small emitters. [Gaithersburg, Md.]: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2000.

Hill, D. A. Detection of quasi-static electric fields radiated by electrically small emitters. [Gaithersburg, Md.]: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2000.

Fielding, Trevor Joseph. An investigation of the field electron emission processes responsible for the flashover of high voltage vacuum devices. Birmingham: Aston University. Department of Electrical and Electronic Engineering, 1986.

United States. General Accounting Office., ed. Protest Of NASA Contract Award For Field Emission Scanning Electron Microscope... 158967, B-277160... U.S. GAO... July 2, 1997. [S.l: s.n., 1998.

1945-, Hasselkamp D., ed. Particle induced electron emission II. Berlin: Springer-Verlag, 1992.

Jahnke, J. A. Continuous emission monitoring. New York: Van Nostrand Reinhold, 1993.

Gomer, Robert. Field emission and field ionization. New York: American Institute of Physics, 1993.

Gomer, R. Field emission and field ionization. New York: American Institute of Physics, 1993.

Ion-induced electron emission from crystalline solids. Berlin: Springer, 2002.

Bhattacharya, Sitangshu, and Kamakhya Prasad Ghatak. Fowler-Nordheim Field Emission. Berlin, Heidelberg: Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-20493-7.

1951-, DuBois R. D., and Rivarola R. D. 1949-, eds. Electron emission in heavy-ion-atom collisions. Berlin: Springer, 1997.

S, MacRae Gregory, and United States. National Aeronautics and Space Administration., eds. Requirements for long-life operation of inert gas hollow cathodes--preliminary report. [Washington, DC: National Aeronautics and Space Administration, 1990.

Thierry, Lemogne, Montes Henri, and United States. National Aeronautics and Space Administration., eds. Aluminum work function: Effect of oxidation, mechanical scraping, and ion bombardment. [Washington, DC]: National Aeronautics and Space Administration, 1985.

Vsesoi͡uznai͡a konferent͡sii͡a po ėmissionnoĭ ėlektronike (10th 1987 Kiev, Ukraine). Tezisy dokladov XX Vsesoi͡uznoĭ konferent͡sii po ėmissionnoĭ ėlektronike. Kiev: In-t fiziki AN USSR, 1987.

S, MacRae Gregory, and United States. National Aeronautics and Space Administration., eds. Requirements for long-life operation of inert gas hollow cathodes--preliminary report. [Washington, DC: National Aeronautics and Space Administration, 1990.

S, MacRae Gregory, and United States. National Aeronautics and Space Administration., eds. Requirements for long-life operation of inert gas hollow cathodes--preliminary report. [Washington, DC: National Aeronautics and Space Administration, 1990.

International Vacuum Microelectronics Conference (11th 1998 Asheville, North Carolina). IVMC'98: Eleventh International Vacuum Microelectronics Conference : July 19-24, 1998, the Grove Park Inn, Asheville, NC, USA. Piscataway, New Jersey: IEEE, 1998.

Lazutin, Leonid L. X-Ray Emission of Auroral Electrons and Magnetospheric Dynamics. Edited by Theodore J. Rosenberg. Berlin, Heidelberg: Springer Berlin Heidelberg, 1986. http://dx.doi.org/10.1007/978-3-642-70398-0.

X-ray emission of auroral electrons and magnetospheric dynamics. Berlin: Springer-Verlag, 1986.

Brodie, Ivor, and Paul Schwoebel, eds. Field Emission in Vacuum Microelectronics. Boston, MA: Springer US, 2005. http://dx.doi.org/10.1007/b139052.

Field emission in vacuum microelectronics. New York: Kluwer Academic/Plenum Publishers, 2003.

Praprotnik, Boštjan. Emissionsverhalten von Flüssigmetall-Ionen-\-Elektronen-Emittern. Berlin: Köster, 1995.

Evtukh, Anatoliy. Vacuum nanoelectronic devices: Novel electron sources and applications. Chichester, West Sussex, United Kingdom: John Wiley & Sons, Inc., 2015.

International Field Emission Symposium (38th 1991 Vienna). Field emission '91: Proceedings of the 38th International Field Emission Symposium, Vienna, Austria, 5-9 August 1991. Edited by Mitterauer Johannes. Amsterdam: North-Holland, 1992.

Gundel, Hartmut W. Electron emission from ferroelectrics: A new generation of pulsed electron beam sources. Aachen: Shaker, 1996.

Fīrudo emisshon disupurei: Development of field emission display. Tōkyō: Shīemushī Shuppan, 2009.

Atomic and free electrons in a strong light field. Singapore: World Scientific, 1997.

Egorov, Nikolay, and Evgeny Sheshin. Field Emission Electronics. Springer, 2018.

Field Emission Electronics. Springer, 2017.

Liang, Shi-Dong. Quantum Tunneling and Field Electron Emission Theories. World Scientific Publishing Co Pte Ltd, 2013.

Field, Thermionic and Secondary Electron Emission Spectroscopy. Springer, 2013.

Fleck, Roland A., and Bruno M. Humbel. Biological Field Emission Scanning Electron Microscopy. Wiley & Sons, Incorporated, John, 2019.

Fleck, Roland A., and Bruno M. Humbel. Biological Field Emission Scanning Electron Microscopy. Wiley & Sons, Limited, John, 2019.

Fleck, Roland A., and Bruno M. Humbel. Biological Field Emission Scanning Electron Microscopy. Wiley & Sons, Limited, John, 2019.

Fleck, Roland A., and Bruno M. Humbel. Biological Field Emission Scanning Electron Microscopy. Wiley & Sons, Incorporated, John, 2019.