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Статті в журналах з теми "Fib-Sem-Dic"
Somov, Pavel A., Eugene S. Statnik, Yuliya Kan, Vladimir S. Pisarev, Svyatoslav I. Eleonsky, Dmitry Yu Ozherelkov, and Alexey I. Salimon. "FIB-DIC Residual Stress Evaluation in Shot Peened VT6 Alloy Validated by X-ray Diffraction and Laser Speckle Interferometry." Nanomaterials 12, no. 7 (April 6, 2022): 1235. http://dx.doi.org/10.3390/nano12071235.
Повний текст джерелаKeller, J., A. Gollhardt, Dietmar Vogel, E. Auerswald, N. Sabate, J. Auersperg, and Bernd Michel. "FibDAC - Residual Stress Determination by Combination of Focused Ion Beam Technique and Digital Image Correlation." Materials Science Forum 524-525 (September 2006): 121–26. http://dx.doi.org/10.4028/www.scientific.net/msf.524-525.121.
Повний текст джерелаMammadi, Y., A. Joseph, A. Joulain, J. Bonneville, C. Tromas, S. Hedan, and V. Valle. "Nanometric metrology by FIB-SEM-DIC measurements of strain field and fracture separation on composite metallic material." Materials & Design 192 (July 2020): 108665. http://dx.doi.org/10.1016/j.matdes.2020.108665.
Повний текст джерелаDang, Nhat Minh, Wen-Yen Lin, Zhao-Ying Wang, Sima Ahmad Alidokht, Richard R. Chromik, Terry Yuan-Fang Chen, and Ming-Tzer Lin. "Mechanical Properties and Residual Stress Measurement of TiN/Ti Duplex Coating Using HiPIMS TiN on Cold Spray Ti." Coatings 12, no. 6 (June 1, 2022): 759. http://dx.doi.org/10.3390/coatings12060759.
Повний текст джерелаChen, Terry Yuan-Fang, Yun-Chia Chou, Zhao-Ying Wang, Wen-Yen Lin, and Ming-Tzer Lin. "Using Digital Image Correlation on SEM Images of Strain Field after Ion Beam Milling for the Residual Stress Measurement of Thin Films." Materials 13, no. 6 (March 12, 2020): 1291. http://dx.doi.org/10.3390/ma13061291.
Повний текст джерелаДисертації з теми "Fib-Sem-Dic"
Mammadi, Younes. "Métrologie optique à petite échelle sous Microscope Électronique à Balayage : mesures de champs cinématiques en présence de discontinuités, par couplage FIB-MEB-CIN." Electronic Thesis or Diss., Poitiers, 2020. http://www.theses.fr/2020POIT2288.
Повний текст джерелаThis work is divided into three main parts. Initially, in order to order to carry out our studies at smaller scales such as micrometric scale, we must not only use a more complex means of observation, for example, scanning electron microscope "MEB-FEG" to obtain images usable in metrology optical, but also have to mark (speckle) on these scales. More recently, digital image correlation is the most widely used kinematic field measurement technique to study the mechanical behavior of materials and structures over an area of interest ranging from the meter scale to the millimeter one. This can be obtained by using a dual-focused ion beam technique. Furthermore, we have adopted a scientific approach by first developing an artificial speckle, with an engraving depth of the order of 100 nanometers. We also relied on statistical tools such as the range of gray levels, autocorrelation, the number of passes and the variation of magnification, which were necessary to validate the marking and to generate better results.In the second part, we coupled the DIC by utilizing the scanning electron microscope and the focused ion beam as the labelling techniques. In order to build a controlled and reliable metrological solution to observe and quantify the movements and deformations of matter at these scales. Several tests have been carried out on two metals ; Steel 304l and Inconel 718, toensure the repeatability and reproducibility of the procedure. In these tests, we proposed to calculate the horizontal and vertical displacements as well as the error related to these displacements.We demonstrate the same approach on the deformation fields. Different results have been obtained depending on the variation of the standard deviation found in the acquired data making it possible to quantify measurement errors as well as repeatability and drift over time.The last part of the proposed work is about the adaptation of measurement methods to the particular mechanisms of deformation at different scales, such as the location of fractures and damage. To study mechanical behavior and taking into account local fractures, we extract the deformations of a fractured material using a displacement field measurement method. The proposed approach consists of extracting the residual deformations of the first local gradients of H-DIC, the least disturbed by the fractures. Various tests have been carried out to assess the validity of this proposed new approach. An application to study the mechanical behavior of a metallic composite (Al / ω -Al-Cu-Fe) is proposed. Particular exploitation of all the fields lies in the good separation of the deformation fields and the cracked part. A discussion on the comparison between a conventional DIC analysis and its extension is presented on the zones without and with fractures
Частини книг з теми "Fib-Sem-Dic"
Mammadi, Y., A. Joseph, A. Joulain, J. Bonneville, C. Tromas, S. Hedan, and V. Valle. "Development of Optical Technique For Measuring Kinematic Fields in Presence of Cracks, FIB-SEM-DIC." In Advancements in Optical Methods & Digital Image Correlation in Experimental Mechanics, Volume 3, 67–74. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-30009-8_9.
Повний текст джерела