Статті в журналах з теми "Fast scanning probe"
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Аkhmetova, А., and I. Yaminskiy. "Fast-scanning probe microscopy." Nanoindustry Russia 11, no. 7-8 (2018): 530–33. http://dx.doi.org/10.22184/1993-8578.2018.11.7-8.530.533.
Повний текст джерелаBoedo, J., D. Gray, L. Chousal, R. Conn, B. Hiller, and K. H. Finken. "Fast scanning probe for tokamak plasmas." Review of Scientific Instruments 69, no. 7 (July 1998): 2663–70. http://dx.doi.org/10.1063/1.1148995.
Повний текст джерелаTabak, F. C., E. C. M. Disseldorp, G. H. Wortel, A. J. Katan, M. B. S. Hesselberth, T. H. Oosterkamp, J. W. M. Frenken, and W. M. van Spengen. "MEMS-based fast scanning probe microscopes." Ultramicroscopy 110, no. 6 (May 2010): 599–604. http://dx.doi.org/10.1016/j.ultramic.2010.02.018.
Повний текст джерелаWatkins, J. G., J. Salmonson, R. Moyer, R. Doerner, R. Lehmer, L. Schmitz, and D. N. Hill. "A fast scanning probe for DIII–D." Review of Scientific Instruments 63, no. 10 (October 1992): 4728–30. http://dx.doi.org/10.1063/1.1143621.
Повний текст джерелаDENG, Tijian, Tao LAN, Mingsheng TAN, Junfeng ZHU, Jie WU, Hangqi XU, Chen CHEN, et al. "Fast radial scanning probe system on KTX." Plasma Science and Technology 22, no. 4 (January 13, 2020): 045602. http://dx.doi.org/10.1088/2058-6272/ab5b1a.
Повний текст джерелаBoedo, J. A., N. Crocker, L. Chousal, R. Hernandez, J. Chalfant, H. Kugel, P. Roney, and J. Wertenbaker. "Fast scanning probe for the NSTX spherical tokamak." Review of Scientific Instruments 80, no. 12 (December 2009): 123506. http://dx.doi.org/10.1063/1.3266065.
Повний текст джерелаTokarev, V. A., V. K. Gusev, N. A. Khromov, M. I. Patrov, Yu V. Petrov, N. V. Sakharov, V. B. Minaev, et al. "Fast scanning probe for the Globus-M2 tokamak." Journal of Physics: Conference Series 1400 (November 2019): 077019. http://dx.doi.org/10.1088/1742-6596/1400/7/077019.
Повний текст джерелаKlapetek, Petr, Anna Charvátová Campbell, and Vilma Buršíková. "Fast mechanical model for probe–sample elastic deformation estimation in scanning probe microscopy." Ultramicroscopy 201 (June 2019): 18–27. http://dx.doi.org/10.1016/j.ultramic.2019.03.010.
Повний текст джерелаWen, Yongbing, Jianmin Song, Xinjian Fan, Danish Hussain, Hao Zhang, and Hui Xie. "Fast Specimen Boundary Tracking and Local Imaging with Scanning Probe Microscopy." Scanning 2018 (2018): 1–11. http://dx.doi.org/10.1155/2018/3979576.
Повний текст джерелаTsois, N., C. Dorn, G. Kyriakakis, M. Markoulaki, M. Pflug, G. Schramm, P. Theodoropoulos, P. Xantopoulos, and M. Weinlich. "A fast scanning Langmuir probe system for ASDEX-Upgrade divertor." Journal of Nuclear Materials 266-269 (March 1999): 1230–33. http://dx.doi.org/10.1016/s0022-3115(98)00569-8.
Повний текст джерелаCarotenuto, R., G. Caliano, A. Caronti, A. Savoia, and M. Pappalardo. "Fast scanning probe for ophthalmic echography using an ultrasound motor." IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control 52, no. 11 (November 2005): 2039–46. http://dx.doi.org/10.1109/tuffc.2005.1561673.
Повний текст джерелаKnebel, D., M. Amrein, K. Voigt, and R. Reichelt. "A fast and versatile scan unit for scanning probe microscopy." Scanning 19, no. 4 (June 1997): 264–68. http://dx.doi.org/10.1002/sca.4950190403.
Повний текст джерелаDremov, Vyacheslav, Vitaly Fedoseev, Pavel Fedorov, and Artem Grebenko. "Fast and reliable method of conductive carbon nanotube-probe fabrication for scanning probe microscopy." Review of Scientific Instruments 86, no. 5 (May 2015): 053703. http://dx.doi.org/10.1063/1.4921323.
Повний текст джерелаDouglas, Mark, and Niels Kuster. "Comment on Liu et al. “Discrepancies of Measured SAR between Traditional and Fast Measuring Systems.” Int. J. Environ. Res. Public Health, 2020, 17, 2111." International Journal of Environmental Research and Public Health 17, no. 14 (July 14, 2020): 5045. http://dx.doi.org/10.3390/ijerph17145045.
Повний текст джерелаKindt, Johannes H., Georg E. Fantner, Jackie A. Cutroni, and Paul K. Hansma. "Rigid design of fast scanning probe microscopes using finite element analysis." Ultramicroscopy 100, no. 3-4 (August 2004): 259–65. http://dx.doi.org/10.1016/j.ultramic.2003.11.009.
Повний текст джерелаSeo, Yongho, June H. Park, Jin B. Moon, and Wonho Jhe. "Fast-scanning shear-force microscopy using a high-frequency dithering probe." Applied Physics Letters 77, no. 26 (December 25, 2000): 4274–76. http://dx.doi.org/10.1063/1.1334646.
Повний текст джерелаZhuang, Jian, Zhiwu Wang, Zeqing Li, Pengbo Liang, and Mugubo Vincent. "Smart Scanning Ion-Conductance Microscopy Imaging Technique Using Horizontal Fast Scanning Method." Microscopy and Microanalysis 24, no. 3 (June 2018): 264–76. http://dx.doi.org/10.1017/s1431927618000375.
Повний текст джерелаValiūnienė, Aušra, Jurate Petroniene, Inga Morkvenaite-Vilkonciene, Georgi Popkirov, Almira Ramanaviciene, and Arunas Ramanavicius. "Redox-probe-free scanning electrochemical microscopy combined with fast Fourier transform electrochemical impedance spectroscopy." Physical Chemistry Chemical Physics 21, no. 19 (2019): 9831–36. http://dx.doi.org/10.1039/c9cp00187e.
Повний текст джерелаKenton, Brian J., Andrew J. Fleming, and Kam K. Leang. "Compact ultra-fast vertical nanopositioner for improving scanning probe microscope scan speed." Review of Scientific Instruments 82, no. 12 (December 2011): 123703. http://dx.doi.org/10.1063/1.3664613.
Повний текст джерелаMajstrzyk, W., A. Ahmad, Tzv Ivanov, A. Reum, T. Angelow, M. Holz, T. Gotszalk, and I. W. Rangelow. "Thermomechanically and electromagnetically actuated piezoresistive cantilevers for fast-scanning probe microscopy investigations." Sensors and Actuators A: Physical 276 (June 2018): 237–45. http://dx.doi.org/10.1016/j.sna.2018.04.028.
Повний текст джерелаMcMurray, H. N., A. J. Coleman, G. Williams, Andreas Afseth, and Geoff M. Scamans. "Scanning Kelvin Probe Studies of Cosmetic (Filiform) Corrosion on AA6016." Materials Science Forum 519-521 (July 2006): 679–86. http://dx.doi.org/10.4028/www.scientific.net/msf.519-521.679.
Повний текст джерелаTiwari, Aarti, Vikram Singh, Debaprasad Mandal, and Tharamani C. Nagaiah. "Nitrogen containing carbon spheres as an efficient electrocatalyst for oxygen reduction: Microelectrochemical investigation and visualization." Journal of Materials Chemistry A 5, no. 37 (2017): 20014–23. http://dx.doi.org/10.1039/c7ta05503j.
Повний текст джерелаIshikawa, Ryo, Yu Jimbo, Mitsuhisa Terao, Masashi Nishikawa, Yujiro Ueno, Shigeyuki Morishita, Masaki Mukai, Naoya Shibata, and Yuichi Ikuhara. "High spatiotemporal-resolution imaging in the scanning transmission electron microscope." Microscopy 69, no. 4 (April 3, 2020): 240–47. http://dx.doi.org/10.1093/jmicro/dfaa017.
Повний текст джерелаLi, Zhenhua, Tielin Shi, and Qi Xia. "An optimized harmonic probe with tailored resonant mode for multifrequency atomic force microscopy." Advances in Mechanical Engineering 10, no. 11 (November 2018): 168781401881120. http://dx.doi.org/10.1177/1687814018811200.
Повний текст джерелаKim, Na Hee, Junho Lee, Sungnam Park, Junyang Jung, and Dokyoung Kim. "A Schiff Base Fluorescence Enhancement Probe for Fe(III) and Its Sensing Applications in Cancer Cells." Sensors 19, no. 11 (May 31, 2019): 2500. http://dx.doi.org/10.3390/s19112500.
Повний текст джерелаWATT, FRANK, XIAO CHEN, CE-BELLE CHEN, CHAMMIKA NB UDALAGAMA, MINQIN REN, G. PASTORIN, and ANDREW BETTIOL. "FAST ION BEAM MICROSCOPY OF WHOLE CELLS." COSMOS 09, no. 01 (December 2013): 65–74. http://dx.doi.org/10.1142/s0219607713500055.
Повний текст джерелаHuang, K. Y., and C. J. Lee. "Design and Development of a Piezoelectric Actuator for the Scanning Probe Microscope Used in Ultrahigh Vacuum." Journal of Mechanics 23, no. 2 (June 2007): 117–26. http://dx.doi.org/10.1017/s1727719100001143.
Повний текст джерелаLopukhin, Aleksei, Konstantin Boltar, Vladimir Akimov, and Maksim Arbuzov. "Distribution of sensitivity along the area of FPA pixel, limited by the diffraction limit of the scanning mask." Applied Physics, no. 5 (November 18, 2021): 44–52. http://dx.doi.org/10.51368/1996-0948-2021-5-44-52.
Повний текст джерелаFan, Kuang Chao, and Y. J. Chen. "A Study on the Mechanism of a New High Speed Scanning Miniature Nano-Measurement Probe." Key Engineering Materials 295-296 (October 2005): 71–76. http://dx.doi.org/10.4028/www.scientific.net/kem.295-296.71.
Повний текст джерелаXu, Shou-Zhen, Shi-Meng Xie, Dan Wu, Zi-Hui Chi, and Lin Huang. "Ultrasound/photoacoustic dual-modality imaging based on acoustic scanning galvanometer." Acta Physica Sinica 71, no. 5 (2022): 050701. http://dx.doi.org/10.7498/aps.71.20211394.
Повний текст джерелаMasuzaki, Suguru, Noriyasu Ohno, Makoto Takagi, and Shuichi Takamura. "Generation of High Heat Flux Plasma and its Diagnostic System Using Fast Scanning Probe." IEEJ Transactions on Fundamentals and Materials 112, no. 11 (1992): 913–21. http://dx.doi.org/10.1541/ieejfms1990.112.11_913.
Повний текст джерелаAcosta, Juan Camilo, Jérôme Polesel-Maris, François Thoyer, Hui Xie, Sinan Haliyo, and Stéphane Régnier. "Gentle and fast atomic force microscopy with a piezoelectric scanning probe for nanorobotics applications." Nanotechnology 24, no. 6 (January 22, 2013): 065502. http://dx.doi.org/10.1088/0957-4484/24/6/065502.
Повний текст джерелаde Voogd, J. M., M. A. van Spronsen, F. E. Kalff, B. Bryant, O. Ostojić, A. M. J. den Haan, I. M. N. Groot, T. H. Oosterkamp, A. F. Otte, and M. J. Rost. "Fast and reliable pre-approach for scanning probe microscopes based on tip-sample capacitance." Ultramicroscopy 181 (October 2017): 61–69. http://dx.doi.org/10.1016/j.ultramic.2017.05.009.
Повний текст джерелаDinarelli, S., F. Mura, C. Mancini, G. La Penna, T. Rinaldi, and M. Rossi. "Comparison of different correlative AFM-SEM workflows on calcite moonmilk." IOP Conference Series: Materials Science and Engineering 1265, no. 1 (November 1, 2022): 012011. http://dx.doi.org/10.1088/1757-899x/1265/1/012011.
Повний текст джерелаBell, David C., Anthony J. Garratt-Reed, and Linn W. Hobbs. "RDF Analysis of Radiation-Amorphized SiC using a field Emission Scanning Electron Microscope." Microscopy and Microanalysis 4, S2 (July 1998): 700–701. http://dx.doi.org/10.1017/s143192760002362x.
Повний текст джерелаMagonov, Sergei. "Phase Contrast Imaging in Atomic Force Microscopy." Microscopy and Microanalysis 3, S2 (August 1997): 1275–76. http://dx.doi.org/10.1017/s143192760001326x.
Повний текст джерелаCheng, Jun, Cheng Yu, Shuai Xu, Jinhao Qiu, Toshiyuki Takagi, and Dezhang Xu. "Measurement of directionality in carbon fiber reinforced plastic composite with eddy current testing." International Journal of Applied Electromagnetics and Mechanics 64, no. 1-4 (December 10, 2020): 1207–15. http://dx.doi.org/10.3233/jae-209438.
Повний текст джерелаWu, Chunyan, Li Yang, Zai Luo, and Wensong Jiang. "Linear Laser Scanning Measurement Method Tracking by a Binocular Vision." Sensors 22, no. 9 (May 7, 2022): 3572. http://dx.doi.org/10.3390/s22093572.
Повний текст джерелаSikora, Andrzej, and Lukasz Bednarz. "The accuracy of an optically supported fast approach solution for scanning probe microscopy (SPM)-measuring devices." Measurement Science and Technology 22, no. 9 (August 8, 2011): 094015. http://dx.doi.org/10.1088/0957-0233/22/9/094015.
Повний текст джерелаHashimoto, Ken-ya, Nan Wu, Tatsuya Omori, and Masatsune Yamaguchi. "Phase-sensitive and fast-scanning laser probe system for diagnosis of high frequency acoustic wave devices." Procedia Engineering 5 (2010): 846–49. http://dx.doi.org/10.1016/j.proeng.2010.09.241.
Повний текст джерелаBahn, Sebin, Soo Bong Choi, Woongkyu Park, Hae-Yong Jeong, and Kyung-Ho Park. "Fabrication of Si-based AFM Probe with High Q-factor for Fast Non-Contact Mode Scanning." Journal of the Korean Physical Society 74, no. 2 (January 2019): 94–97. http://dx.doi.org/10.3938/jkps.74.94.
Повний текст джерелаCastro, Pollyana S., Alex S. Lima, Tiago L. Ferreira, and Mauro Bertotti. "Scanning Electrochemical Microscopy as a Tool for the Characterization of Dental Erosion." International Journal of Electrochemistry 2011 (2011): 1–6. http://dx.doi.org/10.4061/2011/952470.
Повний текст джерелаWang, Lei, Si-Di Gong, Jing Wen, and Ci Hui Yang. "An Improved Electrical Switching and Phase-Transition Model for Scanning Probe Phase-Change Memory." Journal of Nanomaterials 2016 (2016): 1–5. http://dx.doi.org/10.1155/2016/8078165.
Повний текст джерелаLiu, Zicheng, Djamel Allal, Maurice Cox, and Joe Wiart. "Discrepancies of Measured SAR between Traditional and Fast Measuring Systems." International Journal of Environmental Research and Public Health 17, no. 6 (March 22, 2020): 2111. http://dx.doi.org/10.3390/ijerph17062111.
Повний текст джерелаKim, Jun Hee, and Yoon-Myoung Gimm. "Measurement Data Comparison of Fast SAR Measurement System by Probe Arrays with Robot Scanning SAR Measurement System." Journal of electromagnetic engineering and science 14, no. 4 (December 30, 2014): 336–41. http://dx.doi.org/10.5515/jkiees.2014.14.4.336.
Повний текст джерелаReinecke, T., L. Hagemeier, S. Ahrens, Y. Doroschenko, M. Klintschar, and S. Zimmermann. "A novel coplanar probe design for fast scanning of edema in human brain tissue via dielectric measurements." Sensors and Actuators B: Chemical 220 (December 2015): 522–27. http://dx.doi.org/10.1016/j.snb.2015.06.002.
Повний текст джерелаKelley, Kyle P., Maxim Ziatdinov, Liam Collins, Michael A. Susner, Rama K. Vasudevan, Nina Balke, Sergei V. Kalinin, and Stephen Jesse. "Fast Scanning Probe Microscopy via Machine Learning: Non‐Rectangular Scans with Compressed Sensing and Gaussian Process Optimization." Small 16, no. 37 (August 11, 2020): 2002878. http://dx.doi.org/10.1002/smll.202002878.
Повний текст джерелаYan, Mingfei, Yasuo Wakabayashi, Yoshie Otake, Yujiro Ikeda, Atsushi Taketani, Takao Hashiguchi, Sheng Wang, et al. "Reconstruction on fast neutron CT for concrete structure inspection with a pixel-type detector by applying linear scanning method." EPJ Web of Conferences 231 (2020): 05008. http://dx.doi.org/10.1051/epjconf/202023105008.
Повний текст джерелаD'Agostino, Francesco, Flaminio Ferrara, Claudio Gennarelli, Rocco Guerriero, and Massimo Migliozzi. "Near-Field/Far-Field Transformation with Helicoidal Scanning from Irregularly Spaced Data." International Journal of Antennas and Propagation 2010 (2010): 1–8. http://dx.doi.org/10.1155/2010/859396.
Повний текст джерелаSomlyo, Avril V., and Andrew P. Somlyo. "Electron probe x-ray microanalysis of subcellular ion transport in situ." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 1 (August 1992): 16–17. http://dx.doi.org/10.1017/s0424820100120485.
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