Добірка наукової літератури з теми "F noise spectroscopy"
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Статті в журналах з теми "F noise spectroscopy"
Kale, Uma, and Edward Voigtman. "Gated Integration of Transient Signals in 1/f Noise." Applied Spectroscopy 46, no. 11 (November 1992): 1636–43. http://dx.doi.org/10.1366/0003702924926916.
Повний текст джерелаLübbe, Jannis, Matthias Temmen, Philipp Rahe, and Michael Reichling. "Noise in NC-AFM measurements with significant tip–sample interaction." Beilstein Journal of Nanotechnology 7 (December 1, 2016): 1885–904. http://dx.doi.org/10.3762/bjnano.7.181.
Повний текст джерелаAchtenberg, Krzysztof, Janusz Mikołajczyk, Zbigniew Bielecki, and Jacek Wojtas. "Cross-correlation method for noise measurements of photodetectors used for laser absorption spectroscopy." Bulletin of the Military University of Technology 69, no. 4 (December 31, 2020): 73–83. http://dx.doi.org/10.5604/01.3001.0015.3826.
Повний текст джерелаStadler, Adam, and Andrzej Dziedzic. "Virtual instruments in low-frequency noise spectroscopy experiments." Facta universitatis - series: Electronics and Energetics 28, no. 1 (2015): 17–28. http://dx.doi.org/10.2298/fuee1501017s.
Повний текст джерелаKawahara, Toshio, Satarou Yamaguchi, Yasuhide Ohno, Kenzo Maehashi, Kazuhiko Matsumoto, Shin Mizutani, and Kenji Itaka. "Diameter dependence of 1/f noise in carbon nanotube field effect transistors using noise spectroscopy." Applied Surface Science 267 (February 2013): 101–5. http://dx.doi.org/10.1016/j.apsusc.2012.08.003.
Повний текст джерелаMonnig, Curtis A., and Gary M. Hieftje. "An Investigation of Noise Amplitude Spectra Produced by a Direct-Current Plasma." Applied Spectroscopy 43, no. 5 (July 1989): 742–46. http://dx.doi.org/10.1366/0003702894202283.
Повний текст джерелаStadler, Adam Witold, Zbigniew Zawiślak, Andrzej Dziedzic, and Damian Nowak. "NOISE SPECTROSCOPY OF RESISTIVE COMPONENTS AT ELEVATED TEMPERATURE." Metrology and Measurement Systems 21, no. 1 (March 1, 2014): 15–26. http://dx.doi.org/10.2478/mms-2014-0002.
Повний текст джерелаLebedev, Alexander A., Vitalii V. Kozlovski, Leonid Fursin, Anatoly M. Strel'chuk, Mikhail E. Levinshtein, Pavel A. Ivanov, and Alexander V. Zubov. "Impact of Proton Irradiation on Power 4H-SiC MOSFETs." Materials Science Forum 1004 (July 2020): 1074–80. http://dx.doi.org/10.4028/www.scientific.net/msf.1004.1074.
Повний текст джерелаHolmberg, Måns, and Nikku Madhusudhan. "Exoplanet spectroscopy with JWST NIRISS: diagnostics and case studies." Monthly Notices of the Royal Astronomical Society 524, no. 1 (July 4, 2023): 377–402. http://dx.doi.org/10.1093/mnras/stad1580.
Повний текст джерелаZheng-Chao, Dong. "Spin-Polarized Tunneling Spectroscopy and Shot Noise in Ferromagnet/ f -Wave Superconductor Junctions." Communications in Theoretical Physics 41, no. 5 (May 15, 2004): 775–80. http://dx.doi.org/10.1088/0253-6102/41/5/775.
Повний текст джерелаДисертації з теми "F noise spectroscopy"
Andreev, Alexey. "Šumová spektroskopie detektorů záření." Doctoral thesis, Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií, 2008. http://www.nusl.cz/ntk/nusl-233425.
Повний текст джерелаHassis, Wala. "Etude de structures avancées pour la détection IR quantique à haute température." Thesis, Grenoble, 2014. http://www.theses.fr/2014GRENY013/document.
Повний текст джерелаThe IR sensor makes quantum conventionally involves the absorption of photons in the semiconductor CdHgTe II -VI material . This alloy has a feature to allow an adjustment of the gap of the semiconductor at wavelengths covering the whole IR range by simply varying the composition of the alloy, which makes it a material of choice . However, small gaps at stake here impose a focal cooling to cryogenic temperatures generally planes ( typically hundred Kelvins ) . This cooling naturally represents an important limitation in the operation , the size and cost of such detectors .One of the great challenges ahead in the field of quantum IR detection is the detection at higher temperatures . A figure of merit for popular review the operation of these sensors is the dark current , which reflects its sound , in the case of a noise-limited current ( shot noise) detector. However, because the electrical properties of the semiconductor material used , the dark current increases sharply with the heating of the detector and makes it impossible to use at high temperature . In addition, another phenomenon also appears to limit the functionality of our photo-detectors: high temperature appears on the 1 / f noise whose origin is not fully understood today ( or bulk material interfaces , the debate remains open ... ) .To understand the physical phenomena governing the 1 / f noise in HgCdTe photodiodes through the variation this thesis aims to lots of physical and geometrical parameters in order to highlight the correlations or noise with these variants
Guinedor, Pierre. "Etude des bruits basse fréquence et des défauts électriquement actifs dans les détecteurs infrarouge refroidis." Thesis, Université Grenoble Alpes (ComUE), 2019. http://www.theses.fr/2019GREAT120.
Повний текст джерелаThe current trend in the infrared market is to address HOT (High Operating Temperature) applications, which exacerbates the impact of low frequency noises (Random Telegraph Signal (RTS) and 1/f) and then degrades the image quality of cooled HgCdTe detectors. In this work, the focus was laid on the analysis of defects at the root of these noises to, eventually, improve the image quality. Two paths are introduced: the electro-optical characterization of low frequency noises and the spectroscopic characterization of electrically active defects in the material. First generalities on infrared detection and spectroscopic techniques used in this work are described. Then low frequency noises characterizations are realized to refine the comprehension of their physical mechanisms. Finally DLTS (Deep Level Transient Spectroscopy) studies are performed on two technologies for SWIR (Short Wave InfraRed, λc = 2.5 µm) and MWIR blue ((Mid Wave Infrared, λc = 4.2 µm) bands in order to get to the root of low frequency noises
Частини книг з теми "F noise spectroscopy"
MIHAILA, Mihai. "LATTICE VIBRATIONS IN SILICON BY 1/f NOISE SPECTROSCOPY." In Noise in Physical Systems and 1/f Noise 1985, 433–35. Elsevier, 1986. http://dx.doi.org/10.1016/b978-0-444-86992-0.50096-5.
Повний текст джерелаТези доповідей конференцій з теми "F noise spectroscopy"
Mann, J. Adin. "Some Fundamentals of Surface Fluctuation Spectroscopy." In Photon Correlation and Scattering. Washington, D.C.: Optica Publishing Group, 1996. http://dx.doi.org/10.1364/pcs.1996.saa.4.
Повний текст джерелаWerle, P., F. Slemr, M. Gehrtz, and C. Brauchle. "High frequency modulation spectroscopy with a lead salt diode laser." In OSA Annual Meeting. Washington, D.C.: Optica Publishing Group, 1989. http://dx.doi.org/10.1364/oam.1989.thnn1.
Повний текст джерелаRentz, J. H., J. A. Gargas, and C. R. Schwarze. "A Phase-Based Metrology System for Measuring Trace-Gas Concentration." In Laser Applications to Chemical and Environmental Analysis. Washington, D.C.: Optica Publishing Group, 1998. http://dx.doi.org/10.1364/lacea.1998.lmc.5.
Повний текст джерелаFouks, B. I. "Theory of Single Slow Interface Traps in Submicron Metal-Oxide-Electron Field Effect Transistors (MOSFETs) and Single-Electron Spectroscopy of the Traps." In Chemistry and Physics of Small-Scale Structures. Washington, D.C.: Optica Publishing Group, 1997. http://dx.doi.org/10.1364/cps.1997.csud.4.
Повний текст джерела