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Статті в журналах з теми "ESD physics"

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Автор: Grafiati

Опубліковано: 6 вересня 2023

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1

Jauhariyah, M. N. R., B. K. Prahani, K. Syahidi, U. A. Deta, N. A. Lestari, and E. Hariyono. "ESD for physics: how to infuse education for sustainable development (ESD) to the physics curricula?" Journal of Physics: Conference Series 1747, no. 1 (February 1, 2021): 012032. http://dx.doi.org/10.1088/1742-6596/1747/1/012032.

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2

Krabbenborg, Benno, Reinier Beltman, Philip Wolbert, and Ton Mouthaan. "Physics of electro-thermal effects in ESD protection devices." Journal of Electrostatics 28, no. 3 (September 1992): 285–99. http://dx.doi.org/10.1016/0304-3886(92)90077-7.

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3

Alvarez, D., M. J. Abou-Khalil, C. Russ, K. Chatty, R. Gauthier, D. Kontos, J. Li, C. Seguin, and R. Halbach. "Analysis of ESD failure mechanism in 65nm bulk CMOS ESD NMOSFETs with ESD implant." Microelectronics Reliability 46, no. 9-11 (September 2006): 1597–602. http://dx.doi.org/10.1016/j.microrel.2006.07.041.

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4

Paul, Milova, Christian Russ, B. Sampath Kumar, Harald Gossner, and Mayank Shrivastava. "Physics of Current Filamentation in ggNMOS Devices Under ESD Condition Revisited." IEEE Transactions on Electron Devices 65, no. 7 (July 2018): 2981–89. http://dx.doi.org/10.1109/ted.2018.2835831.

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5

Sinha, Dheeraj Kumar, and Amitabh Chatterjee. "SPICE level implementation of physics of filamentation in ESD protection devices." Microelectronics Reliability 79 (December 2017): 239–47. http://dx.doi.org/10.1016/j.microrel.2017.05.022.

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6

Xu, Ke, Xing Chen, and Zhenzhen Chen. "A Physics-based Transient Simulation and Modeling Method for Wide-frequency Electrical Overstress Including ESD." Applied Computational Electromagnetics Society 36, no. 5 (June 14, 2021): 505–12. http://dx.doi.org/10.47037/2020.aces.j.360503.

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Анотація:

Circuits design that meets various IEC electrical overstress (EOS) standards is still a challenge, for that different kinds of EOS are at different frequency bands. In this paper, a physics-based transient simulation and modeling method is proposed, which can simulate wide-frequency EOS including electrostatic discharge (ESD) and AC characteristics. In this method, the physical model is used to characterize the nonlinear semiconductor devices in the finite-difference time-domain (FDTD)-SPICE co-simulation. Moreover, the modeling and physical parameters extraction method of the ESD protect devices, the transient voltage suppressor diode, is demonstrated. Taking an EOS protection circuit for example, it is modeled and simulated by the proposed method. Moreover, the circuit is also simulated by the widely-used System-Efficient ESD Design (SEED) method, in which the TVS diode is modeled based on 100 ns Transmission Line Pulse (TLP) measurements. The experiments show that both this method and SEED method can characterize the IEC system-level ESD behaviors well. However, the error of the SEED is about 219.2% at 10 MHz AC characteristics, but the maximum error of the proposed method is only 7.8%. Hence, compared with the widely-used SEED method, this method is more accurate when characterizing the EOS event during AC operation and switching.

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7

Liu, Xiao Yu, Jiang Shao, Xing Hao Wang, and Feng Ming Lu. "Research Progress on Electrostatic Discharge Failure Models in Semiconductor Materials." Advanced Materials Research 548 (July 2012): 527–31. http://dx.doi.org/10.4028/www.scientific.net/amr.548.527.

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Анотація:

Electrostatic discharge (ESD) is a single, fast, high current transfer of electrostatic charge between two objects at different electrostatic potentials, and it is one of the most important failure mechanisms in integrated circuits due to their complex operation condition. The modes, mechanism, and models of the ESD failure were discussed. Firstly failure modes of ESD were classified and the failure mechanisms were described. Then three failure models including Wunsch and Bell model, Speakman model and Tasca model were summarized. The differences of the assumption and application area of these models were discussed in detail later. At last, suggestions for future studying ESD physics of failure model were proposed.

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8

Rushby, Nick. "Editorial: Recent references." Education and Self Development 17, no. 1 (March 31, 2022): 6–7. http://dx.doi.org/10.26907/esd.17.1.01.

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In addition to editing Education & Self Development I am on the reviewer panel for other journals in the field. I never begrudge the work involved in reviewing: it gives me insights into what other researchers are thinking, long before their work reaches the stage of being published. It also gives me a way of moderating the reviewing activities of E&SD so that we are matching the standards of other journals. This piece was prompted by a discussion between the authors and reviewers of an article submitted to one of these journals. It concerned the recency of the references and I recalled that on several occasions over the past few months, submissions to E&SD had been criticised because many of the references were ‘old’ – that is, published more than ten years ago. It is a simple matter to read through the list of references and count the number that are more than, say, ten years old, but that does not necessarily mean that they do not have value. In contrast to high energy particle physics, our field of education and psychology moves relatively slowly.

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9

Rushby, Nick. "Editorial: Recent references." Education and Self Development 17, no. 1 (March 31, 2022): 8–9. http://dx.doi.org/10.26907/esd.17.1.01r.

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Анотація:

In addition to editing Education & Self Development I am on the reviewer panel for other journals in the field. I never begrudge the work involved in reviewing: it gives me insights into what other researchers are thinking, long before their work reaches the stage of being published. It also gives me a way of moderating the reviewing activities of E&SD so that we are matching the standards of other journals. This piece was prompted by a discussion between the authors and reviewers of an article submitted to one of these journals. It concerned the recency of the references and I recalled that on several occasions over the past few months, submissions to E&SD had been criticised because many of the references were ‘old’ – that is, published more than ten years ago. It is a simple matter to read through the list of references and count the number that are more than, say, ten years old, but that does not necessarily mean that they do not have value. In contrast to high energy particle physics, our field of education and psychology moves relatively slowly.

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10

Stadler, Wolfgang, Tilo Brodbeck, Reinhold Gärtner, and Harald Gossner. "Do ESD fails in systems correlate with IC ESD robustness?" Microelectronics Reliability 49, no. 9-11 (September 2009): 1079–85. http://dx.doi.org/10.1016/j.microrel.2009.07.029.

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11

Yang, Sen, and David J. Pommerenke. "Effect of Different Load Impedances on ESD Generators and ESD Generator SPICE Models." IEEE Transactions on Electromagnetic Compatibility 60, no. 6 (December 2018): 1726–33. http://dx.doi.org/10.1109/temc.2017.2785739.

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12

Gołek, F. "ESD thresholds for KCl." physica status solidi (b) 239, no. 2 (October 2003): 336–39. http://dx.doi.org/10.1002/pssb.200301841.

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13

Berikkhanova, Aiman, Zhanar Ibraimova, and Magripa Ibrayeva. "Collaborative Learning Environment in the Professional Training of Future Teachers." Education and Self Development 17, no. 2 (June 30, 2022): 144–56. http://dx.doi.org/10.26907/esd.17.2.13.

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The importance of this study is linked to the topic of increasing the quality of future teacher professional training by creating a collaborative learning environment. The purpose of this research is to conduct a theoretical analysis of the effectiveness of creating a collaborative learning environment in university and demonstrate its impact on the successful professional activity of future teachers. The paper presents the data of the experimental research in the form of Action Research, conducted among 1st and 2nd year students of pedagogical specialties in the natural sciences (chemistry, biology, physics, computer science). The core requirements of the personality-oriented, activity-based, systemic, environmental, axiological and competence-based approaches form the methodological foundation for building a collaborative learning environment. Students who are immersed in a collaborative learning environment have the opportunity to reflect on the level of formation of their own professional skills, the success of achieving educational goals, and the processes of self-realization, self-development, and self-actualization on a regular basis. This study examines the impact of collaborative learning on students’ communication skills, knowledge quality, assessment of educational achievements, and study time savings. The research findings are linked to the use of Action Research in the educational process, involving students in the process of professional self-improvement. The novelty of the research is characterized by the identification of developmental effect of a collaborative learning environment based on the concept of a zone of actual student professional growth. The practical significance of the research is the development of positive experience in structuring the educational process, with the prospect of applying this experience in future professional activities, such as working with students.

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14

Vashchenko, V. A., and P. Hopper. "Bipolar SCR ESD devices." Microelectronics Reliability 45, no. 3-4 (March 2005): 457–71. http://dx.doi.org/10.1016/j.microrel.2004.12.013.

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15

Verhaege, Koen. "Component level ESD testing." Microelectronics Reliability 38, no. 1 (February 1998): 115–28. http://dx.doi.org/10.1016/s0026-2714(97)00068-1.

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16

Colvin, J. "ESD failure analysis methodology." Microelectronics Reliability 38, no. 11 (November 1998): 1705–14. http://dx.doi.org/10.1016/s0026-2714(98)00173-5.

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17

Ohsawa, A., and N. Ichikawa. "ESD detection by transient earth voltage." Journal of Physics: Conference Series 418 (March 22, 2013): 012054. http://dx.doi.org/10.1088/1742-6596/418/1/012054.

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18

Smallwood, Jeremy. "ESD in industry - present and future." Journal of Physics: Conference Series 646 (October 26, 2015): 012018. http://dx.doi.org/10.1088/1742-6596/646/1/012018.

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19

Gajewski, A. "Multichannel measurement of ESD." Journal of Electrostatics 67, no. 2-3 (May 2009): 271–74. http://dx.doi.org/10.1016/j.elstat.2009.02.006.

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20

Rhoades, William T. "System ESD immunity design." Journal of Electrostatics 24, no. 2 (February 1990): 131–48. http://dx.doi.org/10.1016/0304-3886(90)90004-f.

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21

Kitagawa, Mitsuhiko, Ken-ichi Matsushita, and Akio Nakagawa. "High-Voltage Emitter Short Diode (ESD)." Japanese Journal of Applied Physics 35, Part 1, No. 12A (December 15, 1996): 5998–6002. http://dx.doi.org/10.1143/jjap.35.5998.

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22

Ker, Ming-Dou, Tung-Yang Chen, and Chung-Yu Wu. "Substrate-triggered ESD clamp devices for use in power-rail ESD clamp circuits." Solid-State Electronics 46, no. 5 (May 2002): 721–34. http://dx.doi.org/10.1016/s0038-1101(01)00317-3.

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23

WU, E., and XIAO-AN ZHANG. "DYNAMICS OF PAIRWISE ENTANGLEMENT IN THE THREE-QUBIT HEISENBERG XX SPIN CHAIN." International Journal of Quantum Information 07, no. 08 (December 2009): 1447–58. http://dx.doi.org/10.1142/s0219749909005985.

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Анотація:

For a three-qubit Heisenberg XX spin chain with the uniform magnetic field and magnetic impurity, dynamic evolution of pairwise entanglement are studied. We show that the phenomenon of entanglement sudden death (ESD) occurs in the evolution of entanglement for some initial states. We also find that magnetic impurity cannot only eliminate the phenomenon of ESD but also induce the ESD effects, which is different from the case of uniform magnetic field where the ESD can be depressed but cannot be eliminated by introducing the uniform magnetic field.

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24

Vassilev, Vesselin, and Wolfgang Stadler. "Editorial ESD reliability special section." Microelectronics Reliability 49, no. 12 (December 2009): 1405–6. http://dx.doi.org/10.1016/j.microrel.2009.10.013.

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25

Gieser, Horst A. "On-chip electrostatic discharge ESD." Microelectronics Reliability 43, no. 7 (July 2003): 985–86. http://dx.doi.org/10.1016/s0026-2714(03)00122-7.

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26

SUWANNATA, NATTAWOOT, and APIRAT SIRITARATIWAT. "ELECTROSTATIC DISCHARGE EFFECTS ON GMR RECORDING HEADS USING A WAVELET TRANSFORM APPROACH." International Journal of Modern Physics B 23, no. 17 (July 10, 2009): 3567–72. http://dx.doi.org/10.1142/s0217979209062980.

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Анотація:

Electrostatic Discharge (ESD) effects have been identified as one of the most dangerous causes of giant magnetoresistive (GMR) recording head damage. These phenomena have been studied at all levels of hard-disk drive manufacturing 1. The head gimbal assembly (HGA) is mainly studied because of its exposure to the environment. The standard models are typically based on the human body model (HBM), the machine model (MM) and the charged device model (CDM) where research and practical tests are incompatible. In production, one or more ESD models are normally effective while the other is undergone under a separate model. In addition, tests in the time domain are more accurate than those in the frequency domain. However, picosecond measurements are taken with difficulty where the frequency domain measurement provides non-real time results. Therefore, this is the first report of serial ESD detection using the new technique of wavelet transform. It has been found that the glitch occurs when the ESD level of HBM – MM and HBM – CDM serial ESD on GMR heads are in the ranges of 1.2-2.6 V and 12-15 V respectively.

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27

Gorlov, M. I., V. A. Emel?yanov, I. I. Rubtsevich, and D. Yu Smirnov. "Parts screening for ESD susceptibility." Russian Microelectronics 34, no. 1 (January 2005): 22–29. http://dx.doi.org/10.1007/s11180-005-0003-x.

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28

Liang, Z., H. Zhang, S. Wang, L. Zhang, C. Zhu, H. Jin, and C. Guo. "Comparative research of electrospark deposited Tungsten alloy coating in two kinds of gas." Digest Journal of Nanomaterials and Biostructures 16, no. 3 (July 2021): 793–800. http://dx.doi.org/10.15251/djnb.2021.163.793.

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A W alloy was used as an electrode to prepare a coating on a CrNi3MoVA steel substrate by means of electrospark deposition (ESD) technique. The mass transfer coefficient (MTC) from the electrode to the substrate was calculated through measuring the mass change by employing an electronic balance in air and in argon, respectively, and the morphologies, composition and phase structure were analyzed by utilizing scanning electron microscopy (SEM), energy dispersive X-ray spectrum (EDS) and X-ray diffraction(XRD). The results showed that the ambient gas has an obvious influence on the surface morphology, microstructure, phase structure and MTC of the ESD W alloy coating. Although the MTC in argon has a high value in the ESD process, the whole W alloy coating can’t keep thickening as the ball-like bulges grow up on the surface, which will make the coating rough with the deposition time goes on.

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29

Saragih, L., Riandi, and R. Solihat. "The implementation of ESD into Biology learning to equip students with ESD competencies of systemic thinking and problem-solving." Journal of Physics: Conference Series 1806, no. 1 (March 1, 2021): 012158. http://dx.doi.org/10.1088/1742-6596/1806/1/012158.

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30

Zhou, Jianchi, Kaustav Ghosh, Shaojie Xiang, Xin Yan, Ahmad Hosseinbeig, Jongsung Lee, and David Pommerenke. "Characterization of ESD Risk for Wearable Devices." IEEE Transactions on Electromagnetic Compatibility 60, no. 5 (October 2018): 1313–21. http://dx.doi.org/10.1109/temc.2017.2780056.

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31

Jiang, yibo, Hui Bi, Zhihao Xu, Wei Zhao, Yuanyuan Zhang, and Xiaolei Wang. "Polysilicon devices as a highly compatible ESD protection with modulable voltage and low capacitance." International Journal of Modern Physics B 35, no. 04 (February 2, 2021): 2150052. http://dx.doi.org/10.1142/s0217979221500521.

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Анотація:

The electronic circuits fabricated in a variety of technologies for different applications are all vulnerable to the electrostatic discharge (ESD) event. In this paper, polysilicon devices are investigated as ESD protection because of the noticeable advantages such as compatibility with several technologies, low parasitical capacitance, and little noise coupling. By forming the p-i-n diode in the polysilicon layer and stacking them together, the single polysilicon diode (SPD) and cascaded polysilicon diode (CasPD) are implemented in the 0.35 [Formula: see text] high voltage diffusion process. Through DC IV/CV, transmission line pulse (TLP), and zipping test, the CasPD presents as ESD protection for an S-band RF power amplifier, with high process-compatibility, modulable voltage, low leakage current and parasitic capacitance.

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32

Chen, Shih-Hung, and Ming-Dou Ker. "Active ESD protection circuit design against charged-device-model ESD event in CMOS integrated circuits." Microelectronics Reliability 47, no. 9-11 (September 2007): 1502–5. http://dx.doi.org/10.1016/j.microrel.2007.07.095.

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33

Ker, Ming-Dou, Bing-Jye Kuo, and Yuan-Wen Hsiao. "Optimization of broadband RF performance and ESD robustness by -model distributed ESD protection scheme." Journal of Electrostatics 64, no. 2 (February 2006): 80–87. http://dx.doi.org/10.1016/j.elstat.2005.03.086.

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34

Lin, Changgui, Erik Kjellström, Renate Anna Irma Wilcke, and Deliang Chen. "Present and future European heat wave magnitudes: climatologies, trends, and their associated uncertainties in GCM-RCM model chains." Earth System Dynamics 13, no. 3 (August 25, 2022): 1197–214. http://dx.doi.org/10.5194/esd-13-1197-2022.

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Abstract. This study investigates present and future European heat wave magnitudes, represented by the Heat Wave Magnitude Index-daily (HWMId), for regional climate models (RCMs) and the driving global climate models (GCMs) over Europe. A subset of the large EURO-CORDEX ensemble is employed to study sources of uncertainties related to the choice of GCMs, RCMs, and their combinations. We initially compare the evaluation runs of the RCMs driven by ERA-interim reanalysis to E-OBS (observation-based estimates), finding that the RCMs can capture most of the observed spatial and temporal features of HWMId. With their higher resolution compared to GCMs, RCMs can reveal spatial features of HWMId associated with small-scale processes (e.g., orographic effects); moreover, RCMs represent large-scale features of HWMId satisfactorily (e.g., by reproducing the general pattern revealed by E-OBS with high values at western coastal regions and low values at the eastern part). Our results indicate a clear added value of the RCMs compared to the driving GCMs. Forced with the emission scenario RCP8.5, all the GCM and RCM simulations consistently project a rise in HWMId at an exponential rate. However, the climate change signals projected by the GCMs are generally attenuated when downscaled by the RCMs, with the spatial pattern also altered. The uncertainty in a simulated future change of heat wave magnitudes following global warming can be attributed almost equally to the difference in model physics (as represented by different RCMs) and to the driving data associated with different GCMs. Regarding the uncertainty associated with RCM choice, a major factor is the different representation of the orographic effects. No consistent spatial pattern in the ensemble spread associated with different GCMs is observed between the RCMs, suggesting GCM uncertainties are transformed by RCMs in a complex manner due to the nonlinear nature of model dynamics and physics. In summary, our results support the use of dynamical downscaling for deriving regional climate realization regarding heat wave magnitudes.

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35

Jiang, Yibo, Hui Bi, and Hui Li. "Low trigger voltage bulk FinFET silicon controlled rectifier in nanotechnology." Modern Physics Letters B 32, no. 34n36 (December 30, 2018): 1840072. http://dx.doi.org/10.1142/s0217984918400729.

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Анотація:

The bulk fin field-effect transistor (FinFET) has been the primary semiconductor technology in nanotechnology. To protect low supply voltage circuits based on FinFET, trigger voltage [Formula: see text] of the silicon controlled rectifier (SCR) which acts as electrostatic discharge (ESD) protection device should be lowered further. In this paper, in order to lower the [Formula: see text] an extra implant technique is proposed to form bridging well low trigger voltage FinFET SCR (FinFET BRLVTSCR). The experiments demonstrate that the trigger voltage can be lowered effectively. Moreover, the TCAD simulations bring an in-depth physical understanding of ESD current conduction and failure mechanism during ESD protection. Finally, the turn-on characteristic demonstrates proposed novel SCRs are fast and effective under TLP and very fast TLP (VFTLP) stress.

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36

Hyvonen, Sami, Sopan Joshi, and Elyse Rosenbaum. "Comprehensive ESD protection for RF inputs." Microelectronics Reliability 45, no. 2 (February 2005): 245–54. http://dx.doi.org/10.1016/j.microrel.2004.05.012.

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37

Wolf, Heinrich, Horst Gieser, Detlef Bonfert, and Markus Hauser. "ESD Susceptibility of Submicron Air Gaps." Microelectronics Reliability 46, no. 9-11 (September 2006): 1587–90. http://dx.doi.org/10.1016/j.microrel.2006.07.039.

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38

Notermans, Guido, Olivier Quittard, Anco Heringa, Željko Mrčarica, Fabrice Blanc, Hans van Zwol, Theo Smedes, Thomas Keller, and Peter de Jong. "ESD robust high-voltage active clamps." Microelectronics Reliability 49, no. 12 (December 2009): 1433–39. http://dx.doi.org/10.1016/j.microrel.2009.06.055.

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39

Vassilev, Vesselin. "Advances in ESD protection for ICs." Microelectronics Reliability 53, no. 2 (February 2013): 183. http://dx.doi.org/10.1016/j.microrel.2013.01.002.

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40

Jacob, P., and U. Thiemann. "New ESD challenges in RFID manufacturing." Microelectronics Reliability 76-77 (September 2017): 395–99. http://dx.doi.org/10.1016/j.microrel.2017.06.048.

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41

Jiang, Lingli, Hang Fan, Ming Qiao, Bo Zhang, and Zhaoji Li. "ESD characterization of a 190V LIGBT SOI ESD power clamp structure for plasma display panel applications." Microelectronics Reliability 53, no. 5 (May 2013): 687–93. http://dx.doi.org/10.1016/j.microrel.2013.02.002.

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42

Liu, Wei, Xiao-ming Ren, Rui-zhen Xie, Lan Liu, Ke-xin Yu, Xiang-fei Ji, Wei Ren, and En-yi Chu. "Fabrication and performance of a nickel-chromium (NiCr) igniter integrated with TVS diode for ESD protection." AIP Advances 13, no. 3 (March 1, 2023): 035207. http://dx.doi.org/10.1063/5.0137883.

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The NiCr igniter is a key element of MEMS-based electro-explosive device (mEED), while electrostatic discharge (ESD) may excite the igniter accidentally. To protect the NiCr igniter from damage by ESD, a novel NiCr igniter by integrating the igniter onto a TVS diode based substrate was designed and fabricated through semiconductor technology. The microscope photograph, resistivity, breakdown voltage, firing performance, and ESD protection ability were tested. The results show that the surface of the chip is smooth, the edges of key structures are clear, and there are no major scratches, cracks, and other phenomena on the whole device. The resistivity of all the TVS-mNiCr igniters is between 5 and 7 Ω, and the TVS diode resistance value is normal. The breakdown voltages of the eight types of TVS diodes with different structures are all between 3.5 and 5 V, and the TVS-mNiCr igniters can fire reliably at a constant current of 2 A. After the ESD test, the microscope of the igniter does not change significantly, meaning that the TVS-mNiCr igniter chip has a certain ability of ESD protection. It is of vital importance to guide the design of electrostatic tolerant ability for the MEMS-based electro-explosive device.

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43

JUTONG, NUTTACHAI, APIRAT SIRITARATIWAT, DUANGPORN SOMPONGSE, and PORNCHAI RAKPONGSIRI. "ELECTROSTATIC DISCHARGE EFFECT ON TMR RECORDING HEAD: A FLEX ON SUSPENSION CAPACITANCE APPROACH." International Journal of Modern Physics B 23, no. 17 (July 10, 2009): 3586–90. http://dx.doi.org/10.1142/s0217979209063018.

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Electrostatic discharge (ESD) effects on GMR recording heads have been reported as the major cause of head failure. Since the information density in hard-disk drives has dramatically increased, the GMR head will be no longer in use. The tunneling magnetoresistive (TMR) read heads are initially introduced for a 100 Gbit/in2 density or more. Though the failure mechanism of ESD in GMR recording heads has not been explicitly understood in detail, a study to protect from this effect has to be done. As the TMR head has been commercially started, the ESD effect must be considered. This is the first time that the TMR equivalent circuit has been reported in order to evaluate the ESD effect. A standard human body model (HBM) is discharged across R+ and R- where the capacitances of flex on suspension (FOS) are varied. It is intriguingly found that the electrical characteristics of the TMR head during the discharge period depend on the discharge position. This may be explained in terms of the asymmetry impedance of TMR by using adapted Thevenin's theory. The effect of FOS components on TMR recording heads is also discussed.

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44

Zhu, Zhihua, Zhaonian Yang, Xiaomei Fan, Yingtao Zhang, Juin Jei Liou, and Wenbing Fan. "Optimization of Tunnel Field-Effect Transistor-Based ESD Protection Network." Crystals 11, no. 2 (January 28, 2021): 128. http://dx.doi.org/10.3390/cryst11020128.

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The tunnel field-effect transistor (TFET) is a potential candidate for replacing the reverse diode and providing a secondary path in a whole-chip electrostatic discharge (ESD) protection network. In this paper, the ESD characteristics of a traditional point TFET, a line TFET and a Ge-source TFET are investigated using technology computer-aided design (TCAD) simulations, and an improved TFET-based whole-chip ESD protection scheme is proposed. It is found that the Ge-source TFET has a lower trigger voltage and higher failure current compared to the traditional point and line TFETs. However, the Ge-source TFET-based secondary path in the whole-chip ESD protection network is more vulnerable compared to the primary path due to the low thermal instability. Simulation results show that choosing the proper germanium mole fraction in the source region can balance the discharge ability and thermal failure risk, consequently enhancing the whole-chip ESD robustness.

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45

Nikolenko, S. V., S. N. Khimukhin, and P. S. Gordienko. "Alumo Matrix Composite Materials for Electro Spark Deposition on Carbon Steel." Solid State Phenomena 316 (April 2021): 745–51. http://dx.doi.org/10.4028/www.scientific.net/ssp.316.745.

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The article presents the research results on the problem of the influence of the electric spark discharge parameters and electrode alloys, based on metal matrix materials, used for electro spark deposition (ESD) on the physicochemical and operational characteristics of the coating layer. Experimental dependences of the cathode weight gain, erosion resistance of the anode materials, mass transfer coefficient, wear resistance of the coating, and their mathematical expressions with a reliability criterion of at least R2> 0.9044, are obtained. It is established that, after steel 45 sample has been treated by ESD with metal-matrix materials, the hardness of its surface increases 6 times on the average and the wear resistance – 2 times. The best values of wear resistance at all the modes under investigation have been obtained for the anode material NiO-Zr-TiO2-Al. Data series of cathode weight gain (ƩΔc), erosion resistance of anode materials (ƩΔа), mass transfer coefficient Кmt, coating wear resistance after ESD (Ʃcwr), coating formation efficiency (γcfe), ESD energy efficiency (γeef), are also obtained. These data can be recommended for achieving the required parameters of the ESD on steels using metal-matrix materials.

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46

Kuznetsov, Vadim. "HBM, MM, and CBM ESD Ratings Correlation Hypothesis." IEEE Transactions on Electromagnetic Compatibility 60, no. 1 (February 2018): 107–14. http://dx.doi.org/10.1109/temc.2017.2700492.

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47

Gao, Y., O. B. Malyshev, R. Valizadeh, J. Wang, A. Hannah, Y. C. Hu, J. Zhang, Q. Y. Sun, Q. Y. Si, and S. Wang. "Effect of the film thickness on electron stimulated desorption yield from Ti-Zr-V coating." Journal of Instrumentation 17, no. 08 (August 1, 2022): P08025. http://dx.doi.org/10.1088/1748-0221/17/08/p08025.

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Abstract With the benefits of evenly distributed pumping, low thermal outgassing rate and low photon-/electron-/ion stimulated desorption yields, non-evaporable getter (NEG) coating has been widely used in particle accelerators for many years. Our earlier work has demonstrated the different thickness of Ti-Zr-V coating in the range of 0.1–1 μm affects its pumping properties. In this study, the electron stimulated desorption (ESD) yields were studied for Ti-Zr-V coating deposited from a twisted target with its thickness less than 0.5 μm, while an uncoated sample was also measured as a reference. The ESD yields for H2, CH4, CO and CO2 were measured as a function of electron accumulated dose up to ∼2 × 1024 e-/m2 followed bakeout/activation by heating to 80, 120, 140, 180 and 250°C. After each ESD experiment the samples were full saturated with a mix of H2, CO and CO2. Both NEG coated samples demonstrate lower values in comparison to the uncoated one after heating/activation to temperatures up to 180°C for H2, up to 250°C for CH4, up to 140°C for CO and 120°C for CO2. The activation to 140°C is the most efficient way to reach lower pressure and avoid quick aging of the NEG coating. The thinner NEG coating provides a significantly lower ESD yield in comparison to the thicker one only after activation to 180°C, while their ESD yields are almost identical for each gas at the lower temperature.

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48

Sadiek, Gehad, Wiam Al-Dress, Salwa Shaglel, and Hala Elhag. "Asymptotic Entanglement Sudden Death in Two Atoms with Dipole–Dipole and Ising Interactions Coupled to a Radiation Field at Non-Zero Detuning." Entropy 23, no. 5 (May 18, 2021): 629. http://dx.doi.org/10.3390/e23050629.

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We investigate the time evolution and asymptotic behavior of a system of two two-level atoms (qubits) interacting off-resonance with a single mode radiation field. The two atoms are coupled to each other through dipole–dipole as well as Ising interactions. An exact analytic solution for the system dynamics that spans the entire phase space is provided. We focus on initial states that cause the system to evolve to entanglement sudden death (ESD) between the two atoms. We find that combining the Ising and dipole–dipole interactions is very powerful in controlling the entanglement dynamics and ESD compared with either one of them separately. Their effects on eliminating ESD may add up constructively or destructively depending on the type of Ising interaction (Ferromagnetic or anti-Ferromagnetic), the detuning parameter value, and the initial state of the system. The asymptotic behavior of the ESD is found to depend substantially on the initial state of the system, where ESD can be entirely eliminated by tuning the system parameters except in the case of an initial correlated Bell state. Interestingly, the entanglement, atomic population and quantum correlation between the two atoms and the field synchronize and reach asymptotically quasi-steady dynamic states. Each one of them ends up as a continuous irregular oscillation, where the collapse periods vanish, with a limited amplitude and an approximately constant mean value that depend on the initial state and the system parameters choice. This indicates an asymptotic continuous exchange of energy (and strong quantum correlation) between the atoms and the field takes place, accompanied by diminished ESD for these chosen setups of the system. This system can be realized in spin states of quantum dots or Rydberg atoms in optical cavities, and superconducting or hybrid qubits in linear resonators.

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49

Ker, Ming-Dou, and Tang-Kui Tseng. "Active Electrostatic Discharge (ESD) Device for On-Chip ESD Protection in Sub-Quarter-Micron Complementary Metal-Oxide Semiconductor (CMOS) Process." Japanese Journal of Applied Physics 43, no. 1A/B (December 19, 2003): L33—L35. http://dx.doi.org/10.1143/jjap.43.l33.

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50

Voldman, Steven H. "A review of latchup and electrostatic discharge (ESD) in BiCMOS RF silicon germanium technologies: Part I—ESD." Microelectronics Reliability 45, no. 2 (February 2005): 323–40. http://dx.doi.org/10.1016/j.microrel.2004.10.017.

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