Статті в журналах з теми "Electrons – Diffraction"
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Qin, L. C., A. J. Garratt-Reed, and L. W. Hobbs. "Theory and practice of energy-filtered electron diffraction using the HB5 STEM." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 1 (August 1992): 350–51. http://dx.doi.org/10.1017/s0424820100122150.
Lyman, Charles. "Diffraction." Microscopy Today 20, no. 2 (February 28, 2012): 7. http://dx.doi.org/10.1017/s1551929512000107.
Schröder, Rasmus R., and Christoph Burmester. "Improvements in electron diffraction of frozen hydrated crystals by energy filtering and large-area single-electron detection." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 666–67. http://dx.doi.org/10.1017/s0424820100149167.
Bauer, R., W. Probst, and W.I. Miller. "Elemental imaging of thin specimens with an energy filtering electron microscope (EFEM)." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 524–25. http://dx.doi.org/10.1017/s0424820100104686.
Barckhaus, R. H., I. Fromm, H. J. Höhling, and L. Reimer. "Advantage of Electron Spectroscopic Diffraction on Calcified Tissue Sections." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (August 12, 1990): 362–63. http://dx.doi.org/10.1017/s0424820100135411.
VALERI, SERGIO, and ALESSANDRO di BONA. "MODULATED ELECTRON EMISSION BY SCATTERING-INTERFERENCE OF PRIMARY ELECTRONS." Surface Review and Letters 04, no. 01 (February 1997): 141–60. http://dx.doi.org/10.1142/s0218625x9700016x.
Lynch, D. F., and A. E. Smith. "Electron diffraction phenomena for very low energy electrons." Acta Crystallographica Section A Foundations of Crystallography 43, a1 (August 12, 1987): C246. http://dx.doi.org/10.1107/s0108767387078887.
Yang, Jie, Markus Guehr, Theodore Vecchione, Matthew S. Robinson, Renkai Li, Nick Hartmann, Xiaozhe Shen, et al. "Femtosecond gas phase electron diffraction with MeV electrons." Faraday Discussions 194 (2016): 563–81. http://dx.doi.org/10.1039/c6fd00071a.
Vincent, R. "Quantitative energy-filtered electron diffraction." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 992–93. http://dx.doi.org/10.1017/s0424820100172693.
Wang, Z. L. "Coupled thermal diffuse-atomic inner shell scattering in electron diffraction." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 994–95. http://dx.doi.org/10.1017/s042482010017270x.
Yao, Nan, and J. M. Cowley. "Acceleration voltage effect on electron surface channeling." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 530–31. http://dx.doi.org/10.1017/s0424820100154627.
Peng, L. M., and J. M. Cowley. "Reflection monolayer scattering and RHEED diffraction conditions." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 962–63. http://dx.doi.org/10.1017/s0424820100106879.
Eades, Alwyn. "Insights on Diffraction." Microscopy Today 10, no. 2 (March 2002): 34–35. http://dx.doi.org/10.1017/s1551929500057874.
Moodie, A. F., and J. C. H. Spence. "John Maxwell Cowley 1923 - 2004." Historical Records of Australian Science 17, no. 2 (2006): 227. http://dx.doi.org/10.1071/hr06012.
Issanova, M. K., S. K. Kodanova, T. S. Ramazanov, N. Kh Bastykova, Zh A. Moldabekov, and C. V. Meister. "Classical scattering and stopping power in dense plasmas: the effect of diffraction and dynamic screening." Laser and Particle Beams 34, no. 3 (June 27, 2016): 457–66. http://dx.doi.org/10.1017/s026303461600032x.
Ren, S. X., E. A. Kenik, K. B. Alexander, and A. Goyal. "Exploring Spatial Resolution in Electron Back-Scattered Diffraction Experiments via Monte Carlo Simulation." Microscopy and Microanalysis 4, no. 1 (February 1998): 15–22. http://dx.doi.org/10.1017/s1431927698980011.
Reimer, L. "Electron Spectroscopic Imaging and Diffraction in TEM." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (August 12, 1990): 66–67. http://dx.doi.org/10.1017/s0424820100133928.
Mayer, J. "Electron spectroscopic imaging and diffraction: applications II materials science." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1198–99. http://dx.doi.org/10.1017/s0424820100130626.
Latychevskaia, Tatiana. "Holography and Coherent Diffraction Imaging with Low-(30–250 eV) and High-(80–300 keV) Energy Electrons: History, Principles, and Recent Trends." Materials 13, no. 14 (July 10, 2020): 3089. http://dx.doi.org/10.3390/ma13143089.
Völkl, E., L. F. Allard, B. Frost, and T. A. Nolan. "Quanitative aspects of electron diffraction using electron holography." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 616–17. http://dx.doi.org/10.1017/s0424820100139457.
March, N. H., and M. P. Tosi. "Diffraction and transport in dense plasmas: Especially liquid metals." Laser and Particle Beams 16, no. 1 (March 1998): 71–81. http://dx.doi.org/10.1017/s0263034600011782.
Slouf, Miroslav, Radim Skoupy, Ewa Pavlova, and Vladislav Krzyzanek. "Powder Nano-Beam Diffraction in Scanning Electron Microscope: Fast and Simple Method for Analysis of Nanoparticle Crystal Structure." Nanomaterials 11, no. 4 (April 9, 2021): 962. http://dx.doi.org/10.3390/nano11040962.
Michael, J. R., M. E. Schlienger, and R. P. Goehner. "Electron Backscatter Diffraction In The Sem: Is Electron Diffraction In The Tem Obsolete?" Microscopy and Microanalysis 3, S2 (August 1997): 879–80. http://dx.doi.org/10.1017/s1431927600011284.
Beeby, J. L. "Plasmon emission by electrons in reflection high energy electron diffraction." Surface Science 565, no. 2-3 (September 2004): 129–43. http://dx.doi.org/10.1016/j.susc.2004.06.175.
Winkelmann, Aimo, Koceila Aizel, and Maarten Vos. "Electron energy loss and diffraction of backscattered electrons from silicon." New Journal of Physics 12, no. 5 (May 5, 2010): 053001. http://dx.doi.org/10.1088/1367-2630/12/5/053001.
Katsap, Victor. "A novel thermionic crystal electron emission effect similar to Kikuchi lines." Journal of Vacuum Science & Technology B 41, no. 1 (January 2023): 010602. http://dx.doi.org/10.1116/6.0002375.
Li, Huawang. "Double-slit interference and single-slit diffraction experiments on electrons." Physics Essays 35, no. 3 (September 3, 2022): 313–19. http://dx.doi.org/10.4006/0836-1398-35.3.313.
Reimer, L., and I. Fromm. "Electron spectroscopic diffraction at (111) silicon foils." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 382–83. http://dx.doi.org/10.1017/s0424820100153889.
Wang, Z. L. "Diffraction theory of phonon-scattered electrons." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 788–89. http://dx.doi.org/10.1017/s0424820100088257.
Ascolani, H., R. O. Barrachina, M. M. Guraya, and G. Zampieri. "Diffraction of electrons at intermediate energies." Physical Review B 46, no. 8 (August 15, 1992): 4899–908. http://dx.doi.org/10.1103/physrevb.46.4899.
Lehman, J. L., J. Mayer, and W. Probst. "Application of the Omega spectrometer TEM." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1042–43. http://dx.doi.org/10.1017/s042482010012984x.
Fant, G. Y. "Multislice calculation of Kikuchi patterns." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 52–53. http://dx.doi.org/10.1017/s0424820100152239.
Tivol, W. F., J. N. Turner, and D. L. Dorset. "Ab initio structure analysis of copper perbromophthalocyanine." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1446–47. http://dx.doi.org/10.1017/s0424820100131863.
Mei, Kaili, Kejia Zhang, Jungu Xu, and Zhengyang Zhou. "The Application of 3D-ED to Distinguish the Superstructure of Sr1.2Ca0.8Nb2O7 Ignored in SC-XRD." Crystals 13, no. 6 (June 8, 2023): 924. http://dx.doi.org/10.3390/cryst13060924.
Qin, L. C., and L. D. Marks. "Electron diffraction contrast of fluxons." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 1102–3. http://dx.doi.org/10.1017/s0424820100089822.
Vincent, R. "Analysis of multiple diffraction contrast." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 48–51. http://dx.doi.org/10.1017/s0424820100125270.
Sakakura, Terutoshi, Takahiro Nakano, Hiroyuki Kimura, Yukio Noda, Yoshihisa Ishikawa, Yasuyuki Takenaka, Kiyoaki Tanaka, Shunji Kishimoto, Yoshinori Tokura, and Shigeki Miyasaka. "Importance of multiple diffraction avoidance for charge density observation." Acta Crystallographica Section A Foundations and Advances 70, a1 (August 5, 2014): C280. http://dx.doi.org/10.1107/s2053273314097198.
Mancuso, James F., Leo A. Fama, William B. Maxwell, Jerry L. Lehman, Hasso Weiland, and Ronald R. Biederman. "Effect of energy filtering on micro-diffraction in the SEM." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 604–5. http://dx.doi.org/10.1017/s042482010017075x.
Lee, M. R. "Transmission electron microscopy (TEM) of Earth and planetary materials: A review." Mineralogical Magazine 74, no. 1 (February 2010): 1–27. http://dx.doi.org/10.1180/minmag.2010.074.1.1.
ZHANG, S. Y., Y. K. HO, Z. CHEN, Y. J. XIE, Z. YAN, and J. J. XU. "DYNAMIC TRAJECTORIES OF RELATIVISTIC ELECTRONS INJECTED INTO TIGHTLY-FOCUSED INTENSE LASER FIELDS." Journal of Nonlinear Optical Physics & Materials 13, no. 01 (March 2004): 103–12. http://dx.doi.org/10.1142/s0218863504001785.
Wang, Z. L. "Towards quantitative simulations of inelastic electron diffraction patterns and images." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1170–71. http://dx.doi.org/10.1017/s0424820100130481.
He, Y., L. M. Yu, P. A. Thiry, and R. Caudano. "Negative Ion Resonance Evidenced by Vibrationally Resolved Electron Diffraction On the H/Si(111) Surface." Surface Review and Letters 05, no. 01 (February 1998): 63–67. http://dx.doi.org/10.1142/s0218625x98000141.
Zou, Xiaodong, and Sven Hovmöller. "Structure Determination at Atomic Resolution by Electron Crystallography." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 44–45. http://dx.doi.org/10.1017/s0424820100178975.
Takubo, Kou, Samiran Banu, Sichen Jin, Misaki Kaneko, Wataru Yajima, Makoto Kuwahara, Yasuhiko Hayashi, et al. "Generation of sub-100 fs electron pulses for time-resolved electron diffraction using a direct synchronization method." Review of Scientific Instruments 93, no. 5 (May 1, 2022): 053005. http://dx.doi.org/10.1063/5.0086008.
BONDARCHUCK, O., S. GOYSA, I. KOVAL, P. MEL'NIK, and M. NAKHODKIN. "SHORT-RANGE ORDER OF DISORDERED SOLID SURFACES FROM ELASTICALLY SCATTERED ELECTRON SPECTRA." Surface Review and Letters 04, no. 05 (October 1997): 965–67. http://dx.doi.org/10.1142/s0218625x97001139.
Li, Pen-Xin, Ai-Yun Yang, Lang Xin, Biao Xue, and Chun-Hao Yin. "Photocatalytic Activity and Mechanism of Cu2+ Doped ZnO Nanomaterials." Science of Advanced Materials 14, no. 10 (October 1, 2022): 1599–604. http://dx.doi.org/10.1166/sam.2022.4363.
Yang, Jinfeng, Kazuki Gen, Nobuyasu Naruse, Shouichi Sakakihara, and Yoichi Yoshida. "A Compact Ultrafast Electron Diffractometer with Relativistic Femtosecond Electron Pulses." Quantum Beam Science 4, no. 1 (January 20, 2020): 4. http://dx.doi.org/10.3390/qubs4010004.
Gerchikov, Leonid G., Peotr V. Efimov, Valerii M. Mikoushkin, and Andrey V. Solov'yov. "Diffraction of Fast Electrons on the FullereneC60Molecule." Physical Review Letters 81, no. 13 (September 28, 1998): 2707–10. http://dx.doi.org/10.1103/physrevlett.81.2707.
Ran, Ke, Jian-Min Zuo, Qing Chen, and Zujin Shi. "Electrons for single molecule diffraction and imaging." Ultramicroscopy 119 (August 2012): 72–77. http://dx.doi.org/10.1016/j.ultramic.2011.11.007.
Pierce, Jordan, Cameron Johnson, and Benjamin McMorran. "Corrected Off-axis Diffraction Holograms for Electrons." Microscopy and Microanalysis 26, S2 (July 30, 2020): 426–27. http://dx.doi.org/10.1017/s1431927620014634.