Книги з теми "Electron rays"
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Optical systems for soft X rays. New York: Plenum Press, 1986.
Знайти повний текст джерелаDyson, D. J. X-ray and electron diffraction studies in materials science. London: Maney for the Institute of Materials, Minerals, and Mining, 2004.
Знайти повний текст джерелаUnited States. National Aeronautics and Space Administration., ed. GRO: Red-shifted electron-positron annihilation gamma-rays from radiopulsars. [Washington, DC]: National Aeronautics and Space Administration, 1993.
Знайти повний текст джерелаUnited States. National Aeronautics and Space Administration., ed. GRO: Red-shifted electron-positron annihilation gamma-rays from radiopulsars. [Washington, DC]: National Aeronautics and Space Administration, 1993.
Знайти повний текст джерелаUnited States. National Aeronautics and Space Administration., ed. GRO: Red-shifted electron-positron annihilation gamma-rays from radiopulsars. [Washington, DC]: National Aeronautics and Space Administration, 1993.
Знайти повний текст джерелаGarratt-Reed, A. J. Energy-dispersive X-ray analysis in the electron microscope. Oxford: BIOS, 2003.
Знайти повний текст джерелаElectron dynamics by inelastic X-ray scattering. Oxford: Oxford University Press, 2007.
Знайти повний текст джерела1938-, Wiedemann Helmut, and North Atlantic Treaty Organization. Scientific Affairs Division., eds. Electron-photon interaction in dense media. Dordrecht: Kluwer Academic, 2002.
Знайти повний текст джерелаFlash of the cathode rays: A history of J.J. Thomson's electron. Bristol: Institute of Physics Pub., 1997.
Знайти повний текст джерелаK, Freund Andreas, Freund H. P, Howells Malcolm R, and Society of Photo-optical Instrumentation Engineers., eds. Coherent electron-beam x-ray sources : techniques and applications: 31 July-1 August 1997, San Diego, California. Bellingham, Washington: SPIE, 1997.
Знайти повний текст джерелаLone, M. A. Self-powered detector probes for electron and gamma-ray beam monitoring in high-power industrial accelerators. Chalk River, Ont: Chalk River Laboratories, 1992.
Знайти повний текст джерелаA search for muon neutrino to electron neutrino oscillations in the MINOS experiment. New York: Springer, 2011.
Знайти повний текст джерелаE, Seeger David, and Society of Photo-optical Instrumentation Engineers., eds. Emerging lithographic technologies: 10-11 March 1997, Santa Clara, California. Bellingham, Wash: SPIE, 1997.
Знайти повний текст джерела1934-, Rentzepis Peter M., ed. Time-resolved electron and X-Ray diffraction: 13-14 July 1995, San Diego, California. Bellingham, WA: SPIE, 1996.
Знайти повний текст джерелаCoppens, Philip. X-ray charge densities and chemical bonding. [Chester, England]: International Union of Crystallography, 1997.
Знайти повний текст джерелаScott, Mackay R., Society of Photo-optical Instrumentation Engineers., Semiconductor Equipment and Materials International., and International SEMATECH, eds. Emerging lithographic technologies VIII: 24-26 February, 2004, Santa Clara, California, USA. Bellingham, Wash., USA: SPIE, 2004.
Знайти повний текст джерелаSymposium B on Epitaxial Thin Film Growth and Nanostructures (1997 Strasbourg, France). Recent developments in thin film research: Epitaxial growth and nanostructures, electron microscopy, and x-ray diffraction : proceedings of Symposium B on Epitaxial Thin Film Growth and Nanostructures and proceedings of Symposium C on Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures of the 1997 ICAM/E-MRS Spring Conference, Strasbourg, France, June 16-20, 1997. Edited by Ritter G and Symposium C on Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures (1997 : Strasbourg, France). Amsterdam: Elsevier, 1997.
Знайти повний текст джерелаRochow, Theodore George. An Introduction to Microscopy by Means of Light, Electrons, X-Rays, or Ultrasound. Boston, MA: Springer US, 1995.
Знайти повний текст джерелаA history of the electron: J.J. and G.P. Thomson. Cambridge: Cambridge University Press, 2012.
Знайти повний текст джерелаGreat Britain. Health and Safety Executive., ed. Safety in the design and use of gamma and electron irradiation facilities. 2nd ed. Sudbury: HSE Books, 1998.
Знайти повний текст джерелаL, Engelstad Roxann, Society of Photo-optical Instrumentation Engineers., Semiconductor Equipment and Materials International., and International SEMATECH, eds. Emerging lithographic technologies VII: 25-27 February, 2003, Santa Clara, California, USA. Bellingham, Wash: SPIE, 2003.
Знайти повний текст джерелаAnn, Dobisz Elizabeth, Society of Photo-optical Instrumentation Engineers., Semiconductor Equipment and Materials International, and International SEMATECH, eds. Emerging lithographic technologies V: 27 February-1 March, 2001, Santa Clara, [California], USA. Bellingham, Wash: SPIE, 2001.
Знайти повний текст джерелаYuli, Vladimirsky, Society of Photo-optical Instrumentation Engineers., and Semiconductor Equipment and Materials International, eds. Emerging lithographic technologies III: 15-17 March, 1999, Santa Clara, California. Bellingham, Wash: SPIE, 1999.
Знайти повний текст джерелаAnn, Dobisz Elizabeth, Society of Photo-optical Instrumentation Engineers., Semiconductor Equipment and Materials International., and International SEMATECH, eds. Emerging lithographic technologies IV: 28 February-1 March, 2000, Santa Clara, USA. Bellingham, Wash: SPIE, 2000.
Знайти повний текст джерелаKaiyou, Chen, Columbia Astrophysics Laboratory (Columbia University), and United States. National Aeronautics and Space Administration., eds. "Pair production and gamma-ray emission in the outer magnetospheres of rapidly spinning young pulsars": Final technical report for NAG 5-3797, report period--1 December 1996 - 30 November 1997. [Washington, DC: National Aeronautics and Space Administration, 1997.
Знайти повний текст джерелаThe power of [alpha]: Electron elementary particle generation with [alpha]-quantized lifetimes and masses. Hackensack, N.J: World Scientific, 2007.
Знайти повний текст джерелаAdams, Bernhard W. Nonlinear Optics, Quantum Optics, and Ultrafast Phenomena with X-Rays: Physics with X-Ray Free-Electron Lasers. Boston, MA: Springer US, 2003.
Знайти повний текст джерелаW, Adams Bernhard, ed. Nonlinear optics, quantum optics, and ultrafast phenomena with X-rays: Physics with X-ray free-electron lasers. Boston: Kluwer Academic Publishers, 2003.
Знайти повний текст джерелаUnited States. National Aeronautics and Space Administration., ed. Correlative analysis of hard and soft X-ray emissions in solar flares using CGRO/BATSE and YOHKOH: Final report, NASS-32791. [Washington, DC: National Aeronautics and Space Administration, 1996.
Знайти повний текст джерела1969-, Lercel Michael J., Society of Photo-optical Instrumentation Engineers., and International SEMATECH, eds. Emerging lithographic technologies X: 21-23 February, 2006, San Jose, California, USA. Bellingham, Wash: SPIE, 2006.
Знайти повний текст джерелаDamage to VUV, EUV, and X-Ray Optics (Conference) (4th 2013 Prague, Czech Republic). Damage to VUV, EUV, and X-Ray Optics IV ; and, EUV and X-ray Optics: Synergy Between Laboratory and Space III: 15-18 April 2013, Prague, Czech Republic. Edited by Juha Libor editor, Bajt Saša editor, London Richard A. editor, Hudec R. editor, Pina Ladislav editor, SPIE (Society), HiPER (Project), et al. Bellingham, Washington: SPIE, 2013.
Знайти повний текст джерелаPapanikolaou, N. Handbook of calculated electron momentum distributions, compton profiles, and x-ray form factors of elemental solids. Boca Raton: CRC Press, 1991.
Знайти повний текст джерелаWorkshop on Single Pass, High Gain FELs Starting from Noise, Aiming at Coherent X-Rays (1997 Garda Lake, Italy). Towards X-ray free electron lasers: Workshop on Single Pass, High Gain FELs Starting from Noise, Aiming at Coherent X-Rays; Garda Lake, Italy, June 1997. Edited by Bonifacio R and Barletta W. A. Woodbury, N.Y: American Institute of Physics, 1997.
Знайти повний текст джерелаJames, Howe, and SpringerLink (Online service), eds. Transmission Electron Microscopy and Diffractometry of Materials. 4th ed. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013.
Знайти повний текст джерелаYen, Anthony, Alek C. Chen, and Burn Lin. Lithography Asia 2008: 4-6 November 2008, Taipei, Taiwan. Edited by SPIE (Society) and Taiwan Semiconductor Industry Association. Bellingham, Wash: SPIE, 2008.
Знайти повний текст джерелаYuli, Vladimirsky, Society of Photo-optical Instrumentation Engineers., Semiconductor Equipment and Materials International, and SEMATECH (Organization), eds. Emerging lithographic technologies II: 23-25 February 1998, Santa Clara, California. Bellingham, Wash: SPIE, 1998.
Знайти повний текст джерела1969-, Lercel Michael J., Society of Photo-optical Instrumentation Engineers., and SEMATECH (Organization), eds. Emerging lithographic technologies XI: 27 February- 1 March 2007, San Jose, California, USA. Bellingham, Wash: SPIE, 2007.
Знайти повний текст джерела1969-, Lercel Michael J., Society of Photo-optical Instrumentation Engineers., and SEMATECH (Organization), eds. Emerging lithographic technologies XI: 27 February- 1 March 2007, San Jose, California, USA. Bellingham, Wash: SPIE, 2007.
Знайти повний текст джерелаEurope, SPIE, Akademie věd České republiky. Fyzikální ústav, and SPIE (Society), eds. Harnessing relativistic plasma waves as novel radiation sources from terahertz to x-rays and beyond: 21-23 April 2009, Prague, Czech Republic. Bellingham, Wash: SPIE, 2009.
Знайти повний текст джерелаDeGroot, Rodney C. Sem X-ray microanalysis of tracheid cell walls in southern yellow pine sapwood treated with water-dispersible pentachlorophenol. Madison, WI: USDA, Forest Service, Forest Products Laboratory, 1986.
Знайти повний текст джерелаAkkerman, A. F. Vtorichnoe ėlektronnoe izluchenie iz tverdykh tel pod deĭstviem gamma-kvantov. Moskva: Ėnergoatomizdat, 1986.
Знайти повний текст джерелаScanning electron microscopy and x-ray microanalysis. 3rd ed. New York, NY: Kluwer Academic/Plenum Publishers, 2004.
Знайти повний текст джерелаGoldstein, Joseph, L. C. Sawyer, Dale E. Newbury, Charles E. Lyman, Eric Lifshin, J. R. Michael, David C. Joy, and Patrick Echlin. Scanning Electron Microscopy and X-ray Microanalysis. 3rd ed. Springer, 2003.
Знайти повний текст джерелаScanning Electron Microscopy and X-ray Microanalysis. Springer My Copy UK, 2003.
Знайти повний текст джерелаScanning Electron Microscopy and X-Ray Microanalysis. Springer, 2017.
Знайти повний текст джерелаUniting Electron Crystallography And Powder Diffraction. Springer, 2013.
Знайти повний текст джерелаBell, Les, and Garrett-Reed. Energy Dispersive X-Ray Analysis in the Electron Microscope. Taylor & Francis Group, 2003.
Знайти повний текст джерелаScanning Electron Microscopy and X-Ray Microanalysis: Third Edition. Springer London, Limited, 2012.
Знайти повний текст джерелаScanning Electron Microscopy and X-Ray Microanalysis: Third Edition. Springer, 2013.
Знайти повний текст джерелаHuang, Zhirong, Kwang-Je Kim, and Ryan Lindberg. Synchrotron Radiation and Free-Electron Lasers: Principles of Coherent X-Ray Generation. Cambridge University Press, 2017.
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