Статті в журналах з теми "Electron probe microanalysis EPMA"
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Willich, Peter, and Kirsten Schiffmann. "Electron probe microanalysis of borophosphosilicate coatings." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (August 12, 1990): 226–27. http://dx.doi.org/10.1017/s0424820100134739.
Повний текст джерелаLakis, Rollin E., Charles E. Lyman, and Joseph I. Goldstein. "Electron-probe microanalysis of porous materials." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1660–61. http://dx.doi.org/10.1017/s0424820100132935.
Повний текст джерелаMerlet, C., X. Llovet, S. Segui, J. M. Fernández-Varea, and F. Salvat. "Ionization Cross Sections for Quantitative Electron Probe Microanalysis." Microscopy and Microanalysis 7, S2 (August 2001): 672–73. http://dx.doi.org/10.1017/s1431927600029433.
Повний текст джерелаGoresh, S. "Industrial Applications of Electron Probe Microanalysis (EPMA)." Microscopy and Microanalysis 17, S2 (July 2011): 616–17. http://dx.doi.org/10.1017/s1431927611003953.
Повний текст джерелаSomlyo, A. P., and Avril V. Somlyo. "Electron Probe Analysis and Cell Physiology." Proceedings, annual meeting, Electron Microscopy Society of America 43 (August 1985): 2–5. http://dx.doi.org/10.1017/s0424820100117169.
Повний текст джерелаMatthews, Mike B., Ben Buse, and Stuart L. Kearns. "Electron Probe Microanalysis Through Coated Oxidized Surfaces." Microscopy and Microanalysis 25, no. 05 (July 16, 2019): 1112–29. http://dx.doi.org/10.1017/s1431927619014715.
Повний текст джерелаRo, Chul-Un. "Quantitative energy-dispersive electron probe X-ray microanalysis of individual particles." Powder Diffraction 21, no. 2 (June 2006): 140–44. http://dx.doi.org/10.1154/1.2204068.
Повний текст джерелаSomlyo, Avril V., and Andrew P. Somlyo. "Electron probe x-ray microanalysis of subcellular ion transport in situ." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 1 (August 1992): 16–17. http://dx.doi.org/10.1017/s0424820100120485.
Повний текст джерелаTakahashi, Hideyuki, Toshiaki Suzuki, and Charles Nielsen. "Application Ofthinfilm Method to Electronic Probe Microanalysis (EPMA)." Microscopy and Microanalysis 7, S2 (August 2001): 686–87. http://dx.doi.org/10.1017/s1431927600029500.
Повний текст джерелаRobertson, Vernon. "What Are the Advantages of a FE-EPMA or FE-SEM (Even When Not Analyzing Submicron Features at Low kV and High Beam Current)?" Microscopy Today 31, no. 6 (November 2023): 10–16. http://dx.doi.org/10.1093/mictod/qaad080.
Повний текст джерелаTan, Shuhui, Rencheng Li, Richard S. Vachula, Xinyue Tao, Mengdan Wen, Yizhi Liu, Haiyan Dong, and Lintong Zhou. "Electron probe microanalysis of the elemental composition of phytoliths from woody bamboo species." PLOS ONE 17, no. 7 (July 5, 2022): e0270842. http://dx.doi.org/10.1371/journal.pone.0270842.
Повний текст джерелаRinaldi, Romano, and Xavier Llovet. "Electron Probe Microanalysis: A Review of the Past, Present, and Future." Microscopy and Microanalysis 21, no. 5 (May 12, 2015): 1053–69. http://dx.doi.org/10.1017/s1431927615000409.
Повний текст джерелаSalvat, F., L. Sorbier, X. Llovet, and E. Acosta. "X-Ray Microanalysis with Penelope." Microscopy and Microanalysis 7, S2 (August 2001): 688–89. http://dx.doi.org/10.1017/s1431927600029512.
Повний текст джерелаRehbach, Werner P., and Peter Karduck. "Quantitative electron probe microanalysis of high-Tc superconducting materials." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1768–69. http://dx.doi.org/10.1017/s0424820100133473.
Повний текст джерелаClaus, Tamme, Jonas Bünger, and Manuel Torrilhon. "A Novel Reconstruction Method to Increase Spatial Resolution in Electron Probe Microanalysis." Mathematical and Computational Applications 26, no. 3 (July 14, 2021): 51. http://dx.doi.org/10.3390/mca26030051.
Повний текст джерелаMcGee, James J. "Progress in Electron-Probe Microanalysis of Boron in Geologic Samples." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 696–97. http://dx.doi.org/10.1017/s042482010016594x.
Повний текст джерелаSomlyo, Andrew P. "The Impact of Biological Microanalysis on Analytical Electron Microscopy." Microscopy and Microanalysis 4, S2 (July 1998): 170–71. http://dx.doi.org/10.1017/s1431927600020973.
Повний текст джерелаTsuji, K., Y. Murakami, K. Wagatsuma, and G. Love. "Surface studies by grazing-exit electron probe microanalysis (GE-EPMA)." X-Ray Spectrometry 30, no. 2 (2001): 123–26. http://dx.doi.org/10.1002/xrs.480.
Повний текст джерелаKarduck, Peter, та Norbert Ammann. "ϕ(ρz)-Determination for Advanced Applications of Electron Probe Microanalysis". Proceedings, annual meeting, Electron Microscopy Society of America 48, № 2 (12 серпня 1990): 14–15. http://dx.doi.org/10.1017/s0424820100133667.
Повний текст джерелаLakis, R. E., E. P. Vicenzi, and F. M. Allen. "Electron probe microanalysis of alumina-supported platinum catalysts." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 512–13. http://dx.doi.org/10.1017/s0424820100165021.
Повний текст джерелаLamontagne, Jérôme, Thierry Blay, and Ingrid Roure. "Microbeam Analysis of Irradiated Materials: Practical Aspects." Microscopy and Microanalysis 13, no. 3 (May 9, 2007): 150–55. http://dx.doi.org/10.1017/s143192760707033x.
Повний текст джерелаGoldstein, J. I. "Scanning Electron Microscopy And Electron Probe Microanalysis Of Extraterrestrial Materials." Microscopy and Microanalysis 5, S2 (August 1999): 2–3. http://dx.doi.org/10.1017/s1431927600013337.
Повний текст джерелаMerlet, C., X. Llovet, and F. Salvat. "Measurement And Simulation Of X-Ray Emission From Multilayered Structures In Electron Probe Microanalysis." Microscopy and Microanalysis 5, S2 (August 1999): 78–79. http://dx.doi.org/10.1017/s1431927600013714.
Повний текст джерелаConty, Claude. "Today’s and Tomorrow’s Instruments." Microscopy and Microanalysis 7, no. 2 (March 2001): 142–49. http://dx.doi.org/10.1007/s100050010077.
Повний текст джерелаKubo, Yugo, and Koji Kuramochi. "Observation of Fine Distribution of Minor Dopants in an Erbium-Doped Fiber Core using a Sample Thinning Technique for Field Emission Electron Probe Microanalysis." Microscopy and Microanalysis 21, no. 6 (November 17, 2015): 1398–405. http://dx.doi.org/10.1017/s1431927615015445.
Повний текст джерелаBuse, Ben, та Stuart Kearns. "Quantification of Olivine Using Fe Lα in Electron Probe Microanalysis (EPMA)". Microscopy and Microanalysis 24, № 1 (лютий 2018): 1–7. http://dx.doi.org/10.1017/s1431927618000041.
Повний текст джерелаGrover, V., P. Sengupta, K. Bhanumurthy, and A. K. Tyagi. "Electron probe microanalysis (EPMA) investigations in the CeO2–ThO2–ZrO2 system." Journal of Nuclear Materials 350, no. 2 (April 2006): 169–72. http://dx.doi.org/10.1016/j.jnucmat.2006.01.001.
Повний текст джерелаHarries, Dennis. "Homogeneity testing of microanalytical reference materials by electron probe microanalysis (EPMA)." Geochemistry 74, no. 3 (October 2014): 375–84. http://dx.doi.org/10.1016/j.chemer.2014.01.001.
Повний текст джерелаWilliams, D. B. "The Impact of EDS In Materials Science Microanalysis." Microscopy and Microanalysis 4, S2 (July 1998): 168–69. http://dx.doi.org/10.1017/s1431927600020961.
Повний текст джерелаWalters, Jesse B. "MinPlot: A mineral formula recalculation and plotting program for electron probe microanalysis." Mineralogia 53, no. 1 (January 1, 2022): 51–66. http://dx.doi.org/10.2478/mipo-2022-0005.
Повний текст джерелаCheng, Lining, Chao Zhang, Xiaoyan Li, Renat R. Almeev, Xiaosong Yang, and Francois Holtz. "Improvement of Electron Probe Microanalysis of Boron Concentration in Silicate Glasses." Microscopy and Microanalysis 25, no. 4 (June 18, 2019): 874–82. http://dx.doi.org/10.1017/s1431927619014612.
Повний текст джерелаBünger, Jonas, Silvia Richter, and Manuel Torrilhon. "A Model for Characteristic X-Ray Emission in Electron Probe Microanalysis Based on the (Filtered) Spherical Harmonic () Method for Electron Transport." Microscopy and Microanalysis 28, no. 2 (April 2022): 454–68. http://dx.doi.org/10.1017/s1431927622000083.
Повний текст джерелаNgo, H., J. Ruben, J. Arends, D. White, G. J. Mount, M. C. R. B. Peters, R. V. Faller, and A. Pfarrer. "Electron Probe Microanalysis and Transverse Microradiography Studies of Artificial Lesions in Enamel and Dentin: A Comparative Study." Advances in Dental Research 11, no. 4 (November 1997): 426–32. http://dx.doi.org/10.1177/08959374970110040801.
Повний текст джерелаCochrane, Nathan J., Youichi Iijima, Peiyan Shen, Yi Yuan, Glenn D. Walker, Coralie Reynolds, Colin M. MacRae, Nicholas C. Wilson, Geoffrey G. Adams, and Eric C. Reynolds. "Comparative Study of the Measurement of Enamel Demineralization and Remineralization Using Transverse Microradiography and Electron Probe Microanalysis." Microscopy and Microanalysis 20, no. 3 (April 24, 2014): 937–45. http://dx.doi.org/10.1017/s1431927614000622.
Повний текст джерелаSchomisch Moravec, Christine, and Meredith Bond. "Subcellular Calcium (Ca2+) Redistribution During Cardiac Muscle Contraction by Electron Probe Microanalysis (EPMA)." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (August 12, 1990): 136–37. http://dx.doi.org/10.1017/s0424820100134272.
Повний текст джерелаNihtianova, D. D., I. T. Ivanov, J. J. Macicek, and I. K. Georgieva. "Crystallographic data for BaMnSiO4: A new phase in the system BaO-MnO-SiO2." Powder Diffraction 12, no. 3 (September 1997): 167–70. http://dx.doi.org/10.1017/s0885715600009659.
Повний текст джерелаChong, Saehwa, Jared O. Kroll, Jarrod V. Crum, and Brian J. Riley. "Synthesis and crystal structure of a neodymium borosilicate, Nd3BSi2O10." Acta Crystallographica Section E Crystallographic Communications 75, no. 5 (April 25, 2019): 700–702. http://dx.doi.org/10.1107/s2056989019005024.
Повний текст джерелаSchulz, Bernhard, Joachim Krause, and Wolfgang Dörr. "A Protocol for Electron Probe Microanalysis (EPMA) of Monazite for Chemical Th-U-Pb Age Dating." Minerals 14, no. 8 (August 12, 2024): 817. http://dx.doi.org/10.3390/min14080817.
Повний текст джерелаNachlas, William, Suzanne Baldwin, Jay Thomas, and Michael Ackerson. "Investigation of N in Ammonium-bearing Silicates with Electron Probe Microanalysis (EPMA)." Microscopy and Microanalysis 26, S2 (July 30, 2020): 42–43. http://dx.doi.org/10.1017/s1431927620013203.
Повний текст джерелаTsuji, Kouichi. "Grazing-exit electron probe X-ray microanalysis (GE-EPMA): Fundamental and applications." Spectrochimica Acta Part B: Atomic Spectroscopy 60, no. 11 (November 2005): 1381–91. http://dx.doi.org/10.1016/j.sab.2005.08.013.
Повний текст джерелаDuque, Laura, Fernanda Guimarães, Helena Ribeiro, Raquel Sousa, and Ilda Abreu. "Elemental characterization of the airborne pollen surface using Electron Probe Microanalysis (EPMA)." Atmospheric Environment 75 (August 2013): 296–302. http://dx.doi.org/10.1016/j.atmosenv.2013.04.040.
Повний текст джерелаTormey, J. McD, and E. S. Wheeler-Clark. "Electron Probe X-Ray Microanalysis of Cardiac Muscle: Progress Report." Proceedings, annual meeting, Electron Microscopy Society of America 43 (August 1985): 18–21. http://dx.doi.org/10.1017/s0424820100117200.
Повний текст джерелаCazaux, Jacques. "About the Mechanisms of Charging in EPMA, SEM, and ESEM with Their Time Evolution." Microscopy and Microanalysis 10, no. 6 (December 2004): 670–84. http://dx.doi.org/10.1017/s1431927604040619.
Повний текст джерелаRemond, G., R. H. Packwood, C. Gilles, and S. Chryssoulis. "Layered and ion implantation specimens as possible reference materials for the electron-probe microanalysis." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1652–53. http://dx.doi.org/10.1017/s0424820100132893.
Повний текст джерелаChia, V. K. F., R. J. Bleiler, C. L. Anderson, and R. W. Odom. "Quantitative Trace Element Analysis of Micro-Samples by SIMS." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (August 12, 1990): 360–61. http://dx.doi.org/10.1017/s042482010013540x.
Повний текст джерелаKeil, K., R. Fitzgerald, and KFJ Heinrich. "Celebrating 40 years of energy dispersive X-ray spectrometry in electron probe microanalysis (EPMA)." Microscopy and Microanalysis 14, S2 (August 2008): 1152–53. http://dx.doi.org/10.1017/s1431927608081221.
Повний текст джерелаCarpenter, PK. "Electron-Probe Microanalysis (EPMA): An Overview for Beginners and a Status Report for Experts." Microscopy and Microanalysis 14, S2 (August 2008): 1150–51. http://dx.doi.org/10.1017/s1431927608088806.
Повний текст джерелаSong, Jian Li, Qi Lin Deng, C. Y. Chen, and De Jin Hu. "Experimental Study on the Laser Direct Fabrication of Stainless Steel Components." Key Engineering Materials 315-316 (July 2006): 239–43. http://dx.doi.org/10.4028/www.scientific.net/kem.315-316.239.
Повний текст джерелаSomlyo, A. P. "Where Art Thou, Calcium?" Microscopy and Microanalysis 3, S2 (August 1997): 913–14. http://dx.doi.org/10.1017/s1431927600011454.
Повний текст джерелаVykhodets, V. B., Tatiana Eugenievna Kurennykh, and N. U. Tarenkova. "Study of Distribution of Impurity Atoms in Metallurgical Macrodefects." Defect and Diffusion Forum 273-276 (February 2008): 707–12. http://dx.doi.org/10.4028/www.scientific.net/ddf.273-276.707.
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