Статті в журналах з теми "Electron microscopy Methodology"
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Iha, Luiz Cesar Nakao, Andre Aguillera, Flavio Faria, Cristiane Akemi Kasse, Oswaldo Laercio Mendonça Cruz, and Edna Frey Muller. "R147: Scanning Electron Microscopy: Alternatives in Methodology." Otolaryngology–Head and Neck Surgery 135, no. 2_suppl (August 2006): P156. http://dx.doi.org/10.1016/j.otohns.2006.06.901.
Повний текст джерелаDowning, Kenneth H. "Instrumentation and methodology for electron crystallography." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 420–21. http://dx.doi.org/10.1017/s0424820100086404.
Повний текст джерелаLiang, Alice F., Chris Petzold, Kristen Dancel-Manning, Yan Deng, and Michael Cammer. "Methodology Development at NYULMC Microscopy Core - Correlative Light and Electron Microscopy Applications." Microscopy and Microanalysis 21, S3 (August 2015): 879–80. http://dx.doi.org/10.1017/s143192761500519x.
Повний текст джерелаLeppard, GG, A. Heissenberger, and GJ Herndl. "Ultrastructure of marine snow. I. Transmission electron microscopy methodology." Marine Ecology Progress Series 135 (1996): 289–98. http://dx.doi.org/10.3354/meps135289.
Повний текст джерелаDanev, Radostin, Haruaki Yanagisawa, and Masahide Kikkawa. "Cryo-Electron Microscopy Methodology: Current Aspects and Future Directions." Trends in Biochemical Sciences 44, no. 10 (October 2019): 837–48. http://dx.doi.org/10.1016/j.tibs.2019.04.008.
Повний текст джерелаSicignano, A., and M. Vaez Iravani. "Methodology and practice of in situ differential scanning electron microscopy." Scanning 12, no. 2 (1990): 61–68. http://dx.doi.org/10.1002/sca.4950120203.
Повний текст джерелаAsher, Lucas, and Jessica Hata. "Platelet Electron Microscopy: Utilizing LEAN Methodology to Optimize Laboratory Workflow." Pediatric and Developmental Pathology 23, no. 5 (May 19, 2020): 356–61. http://dx.doi.org/10.1177/1093526620915361.
Повний текст джерелаKammers, A. D., and S. Daly. "Digital Image Correlation under Scanning Electron Microscopy: Methodology and Validation." Experimental Mechanics 53, no. 9 (July 11, 2013): 1743–61. http://dx.doi.org/10.1007/s11340-013-9782-x.
Повний текст джерелаMenteş, T. O., G. Zamborlini, A. Sala, and A. Locatelli. "Cathode lens spectromicroscopy: methodology and applications." Beilstein Journal of Nanotechnology 5 (October 27, 2014): 1873–86. http://dx.doi.org/10.3762/bjnano.5.198.
Повний текст джерелаYang, Jinfeng, and Yoichi Yoshida. "Relativistic Ultrafast Electron Microscopy: Single-Shot Diffraction Imaging with Femtosecond Electron Pulses." Advances in Condensed Matter Physics 2019 (May 2, 2019): 1–6. http://dx.doi.org/10.1155/2019/9739241.
Повний текст джерелаChudnovsky, A., K. Sehanobish, and S. Wu. "Methodology for Durability Analysis of HDPE Pipe." Journal of Pressure Vessel Technology 122, no. 2 (December 15, 1999): 152–55. http://dx.doi.org/10.1115/1.556165.
Повний текст джерелаKaushik, Madhu, Wei C. Chen, Theo G. M. van de Ven, and Audrey Moores. "An improved methodology for imaging cellulose nanocrystals by transmission electron microscopy." Nordic Pulp & Paper Research Journal 29, no. 1 (January 1, 2014): 77–84. http://dx.doi.org/10.3183/npprj-2014-29-01-p077-084.
Повний текст джерелаSmith, Paul, John Gannon, and Frank Eggert. "A New Methodology for Element Imaging in the Scanning Electron Microscope." Microscopy and Microanalysis 7, S2 (August 2001): 1054–55. http://dx.doi.org/10.1017/s1431927600031342.
Повний текст джерелаConforto, Egle, Nicolas Joguet, Pierre Buisson, Jean-Eudes Vendeville, Carine Chaigneau, and Thierry Maugard. "An optimized methodology to analyze biopolymer capsules by environmental scanning electron microscopy." Materials Science and Engineering: C 47 (February 2015): 357–66. http://dx.doi.org/10.1016/j.msec.2014.11.054.
Повний текст джерелаLogin, G. R., W. B. Stavinoha, and A. M. Dvorak. "Ultrafast microwave energy fixation for electron microscopy." Journal of Histochemistry & Cytochemistry 34, no. 3 (March 1986): 381–87. http://dx.doi.org/10.1177/34.3.3950387.
Повний текст джерелаDrab, Marek, Janusz Krajniak, and Krzysztof P. Grzelakowski. "The New Methodology and Chemical Contrast Observation by Use of the Energy-Selective Back-Scattered Electron Detector." Microscopy and Microanalysis 22, no. 6 (December 2016): 1369–73. http://dx.doi.org/10.1017/s1431927616012514.
Повний текст джерелаBaumann, Frieder, Pradip Sairam Pichumani, and Christopher Torcedo. "Innovative Grounding Methodology for Epoxy Impregnated Semiconductor Cross Sections for Electron Microscopy Inspection." Microscopy and Microanalysis 26, S2 (July 30, 2020): 370–72. http://dx.doi.org/10.1017/s1431927620014415.
Повний текст джерелаTufvesson, Bertil, and Torsten Johnsson. "IMMUNOELECTROOSMOPHORESIS FOR DETECTION OF REO-LIKE VIRUS: METHODOLOGY AND COMPARISON WITH ELECTRON MICROSCOPY." Acta Pathologica Microbiologica Scandinavica Section B Microbiology 84B, no. 4 (August 15, 2009): 225–28. http://dx.doi.org/10.1111/j.1699-0463.1976.tb01929.x.
Повний текст джерелаYurtsever, Aycan, Renske M. van der Veen, and Ahmed H. Zewail. "Subparticle Ultrafast Spectrum Imaging in 4D Electron Microscopy." Science 335, no. 6064 (January 5, 2012): 59–64. http://dx.doi.org/10.1126/science.1213504.
Повний текст джерелаZehbe, Rolf, Astrid Haibel, Heinrich Riesemeier, Ulrich Gross, C. James Kirkpatrick, Helmut Schubert, and Christoph Brochhausen. "Going beyond histology. Synchrotron micro-computed tomography as a methodology for biological tissue characterization: from tissue morphology to individual cells." Journal of The Royal Society Interface 7, no. 42 (March 25, 2009): 49–59. http://dx.doi.org/10.1098/rsif.2008.0539.
Повний текст джерелаTakizawa, Toshihiro, and John M. Robinson. "FluoroNanogold Is a Bifunctional Immunoprobe for Correlative Fluorescence and Electron Microscopy." Journal of Histochemistry & Cytochemistry 48, no. 4 (April 2000): 481–85. http://dx.doi.org/10.1177/002215540004800405.
Повний текст джерелаCastroviejo, R., E. Berrezueta, and R. Lastra. "Microscopic digital image analysis of gold ores: a critical test of methodology, comparing reflected light and electron microscopy." Mining, Metallurgy & Exploration 19, no. 2 (May 2002): 102–9. http://dx.doi.org/10.1007/bf03403263.
Повний текст джерелаDejgaard, Selma Yilmaz, Ayesha Murshid, Kristina M. Dee, and John F. Presley. "Confocal Microscopy-based Linescan Methodologies for Intra-Golgi Localization of Proteins." Journal of Histochemistry & Cytochemistry 55, no. 7 (March 19, 2007): 709–19. http://dx.doi.org/10.1369/jhc.6a7090.2007.
Повний текст джерелаSakamoto, Hirotaka, and Mitsuhiro Kawata. "Ultrahigh Voltage Electron Microscopy Links Neuroanatomy and Neuroscience/Neuroendocrinology." Anatomy Research International 2012 (December 8, 2012): 1–5. http://dx.doi.org/10.1155/2012/948704.
Повний текст джерелаGoheen, Michael P., Marilyn S. Bartlett, and James W. Smith. "Immunogold labeling of Pneumocystis carinii for Electron microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 270–71. http://dx.doi.org/10.1017/s0424820100085654.
Повний текст джерелаHayakawa, Eri H., and Hiroyuki Matsuoka. "Detailed methodology for high resolution scanning electron microscopy (SEM) of murine malaria parasitized-erythrocytes." Parasitology International 65, no. 5 (October 2016): 539–44. http://dx.doi.org/10.1016/j.parint.2016.03.006.
Повний текст джерелаStoeck, Thorsten, William H. Fowle, and Slava S. Epstein. "Methodology of Protistan Discovery: from rRNA Detection to Quality Scanning Electron Microscope Images." Applied and Environmental Microbiology 69, no. 11 (November 2003): 6856–63. http://dx.doi.org/10.1128/aem.69.11.6856-6863.2003.
Повний текст джерелаBykov, Yury S., Nir Cohen, Natalia Gabrielli, Hetty Manenschijn, Sonja Welsch, Petr Chlanda, Wanda Kukulski, Kiran R. Patil, Maya Schuldiner, and John A. G. Briggs. "High-throughput ultrastructure screening using electron microscopy and fluorescent barcoding." Journal of Cell Biology 218, no. 8 (July 9, 2019): 2797–811. http://dx.doi.org/10.1083/jcb.201812081.
Повний текст джерелаKang, J., M. Jain, D. S. Wilkinson, and J. D. Embury. "Microscopic Strain Mapping Using Scanning Electron Microscopy Topography Image Correlation at Large Strain." Journal of Strain Analysis for Engineering Design 40, no. 6 (August 1, 2005): 559–70. http://dx.doi.org/10.1243/030932405x16151.
Повний текст джерелаArnold, Christopher, Christoph Pobel, Fuad Osmanlic, and Carolin Körner. "Layerwise monitoring of electron beam melting via backscatter electron detection." Rapid Prototyping Journal 24, no. 8 (November 12, 2018): 1401–6. http://dx.doi.org/10.1108/rpj-02-2018-0034.
Повний текст джерелаTaheri, Shima, Martin Ams, Heriberto Bustamante, Louisa Vorreiter, Michael Withford, and Simon Martin Clark. "A practical methodology to assess corrosion in concrete sewer pipes." MATEC Web of Conferences 199 (2018): 06010. http://dx.doi.org/10.1051/matecconf/201819906010.
Повний текст джерелаDuan, Heng-Zhi, Hong-Yan Zeng, Hua-Miao Xiao, Chao-Rong Chen, Gao-Fei Xiao, and Quan Zhao. "Optimization of ammonia nitrogen removal by SO42− intercalated hydrotalcite using response surface methodology." RSC Advances 6, no. 54 (2016): 48329–35. http://dx.doi.org/10.1039/c6ra08321h.
Повний текст джерелаRzepiejewska-Malyska, K. A., W. M. Mook, M. Parlinska-Wojtan, J. Hejduk, and J. Michler. "In situ scanning electron microscopy indentation studies on multilayer nitride films: Methodology and deformation mechanisms." Journal of Materials Research 24, no. 3 (March 2009): 1208–21. http://dx.doi.org/10.1557/jmr.2009.0139.
Повний текст джерелаStanley, Shena M., Amartya Chakrabarti, Joshua J. DeMuth, Vanessa E. Tempel, and Narayan S. Hosmane. "Catalyst-Free Bottom-Up Synthesis of Few-Layer Hexagonal Boron Nitride Nanosheets." Journal of Nanomaterials 2015 (2015): 1–8. http://dx.doi.org/10.1155/2015/304295.
Повний текст джерелаda Silva, Marcelo A., José Claudio G. Teixeira, Ari Sauer Guimarães, Ivani S. Bott, and Hector R. M. Costa. "A Methodology for Evaluation of Life Fraction Using Cr-Mo Steel under Creep Conditions." Materials Science Forum 758 (June 2013): 57–63. http://dx.doi.org/10.4028/www.scientific.net/msf.758.57.
Повний текст джерелаWang, Haifeng, Jason Fang, Jason Arjavac, and Rudy Kellner. "Scanning Transmission Electron Microscopy for Critical Dimension Monitoring in Wafer Manufacturing." Microscopy Today 16, no. 1 (January 2008): 24–27. http://dx.doi.org/10.1017/s1551929500054298.
Повний текст джерелаBaker, T. S., and D. A. Winkelmann. "Methodology for determining the three-dimensional crystal structure of myosin Sl from electron microscopy of orthogonal thin sections." Proceedings, annual meeting, Electron Microscopy Society of America 44 (August 1986): 26–29. http://dx.doi.org/10.1017/s0424820100141895.
Повний текст джерелаCone, Kim A., Richard F. Wendlandt, Katharina Pfaff, and Omero F. Orlandini. "Texture constraints on crystal size distribution methodology: An application to the Laki fissure eruption." American Mineralogist 105, no. 5 (May 1, 2020): 585–98. http://dx.doi.org/10.2138/am-2020-7007.
Повний текст джерелаYi, Hong, Rahmat Peijper, and Jan LM Leunissen. "Methodology Advancements in Electron Microscopy Immunolabeling of Hydrated Brain Tissue Using Subnanometer Colloidal Gold Conjugates." Microscopy and Microanalysis 8, S02 (August 2002): 126–27. http://dx.doi.org/10.1017/s1431927602101644.
Повний текст джерелаEbrahimi, Shamsi, Coswald Stephen Sipaut@ Mohd Nasri, and Sazmal Effendi Bin Arshad. "Hydrothermal synthesis of hydroxyapatite powders using Response Surface Methodology (RSM)." PLOS ONE 16, no. 5 (May 20, 2021): e0251009. http://dx.doi.org/10.1371/journal.pone.0251009.
Повний текст джерелаHonary, Soheila, Hamed Barabadi, Pouneh Ebrahimi, Farzaneh Naghibi, and Ahad Alizadeh. "Development and Optimization of Biometal Nanoparticles by Using Mathematical Methodology: A Microbial Approach." Journal of Nano Research 30 (March 2015): 106–15. http://dx.doi.org/10.4028/www.scientific.net/jnanor.30.106.
Повний текст джерелаSteven, Alasdair C. "Breakthroughs and breakdowns: the portrayal of biological macromolecules in computer-processed images of negatively stained specimens." Proceedings, annual meeting, Electron Microscopy Society of America 44 (August 1986): 62–65. http://dx.doi.org/10.1017/s0424820100142025.
Повний текст джерелаFaas, Frank G. A., M. Cristina Avramut, Bernard M. van den Berg, A. Mieke Mommaas, Abraham J. Koster, and Raimond B. G. Ravelli. "Virtual nanoscopy: Generation of ultra-large high resolution electron microscopy maps." Journal of Cell Biology 198, no. 3 (August 6, 2012): 457–69. http://dx.doi.org/10.1083/jcb.201201140.
Повний текст джерелаWen, Haiming, Yaojun Lin, David N. Seidman, Julie M. Schoenung, Isabella J. van Rooyen, and Enrique J. Lavernia. "An Efficient and Cost-Effective Method for Preparing Transmission Electron Microscopy Samples from Powders." Microscopy and Microanalysis 21, no. 5 (September 9, 2015): 1184–94. http://dx.doi.org/10.1017/s1431927615014695.
Повний текст джерелаPaterson, Gary W., Gavin M. Macauley, Stephen McVitie, and Yoshihiko Togawa. "Parallel Mode Differential Phase Contrast in Transmission Electron Microscopy, I: Theory and Analysis." Microscopy and Microanalysis 27, no. 5 (September 20, 2021): 1113–22. http://dx.doi.org/10.1017/s1431927621012551.
Повний текст джерелаHuh, PilHo, and Seong-Cheol Kim. "Nanostructured ZnO Arrays with Self-ZnO Layer Created Using Simple Electrostatic Layer-by-Layer Assembly." Journal of Nanomaterials 2012 (2012): 1–6. http://dx.doi.org/10.1155/2012/131672.
Повний текст джерелаKarimi Sabet, Javad, Cyrus Ghotbi, and Farid Dorkoosh. "Application of Response Surface Methodology for Optimization of Paracetamol Particles Formation by RESS Method." Journal of Nanomaterials 2012 (2012): 1–15. http://dx.doi.org/10.1155/2012/340379.
Повний текст джерелаBatuk, Dmitry, Maria Batuk, Artem M. Abakumov, and Joke Hadermann. "Synergy between transmission electron microscopy and powder diffraction: application to modulated structures." Acta Crystallographica Section B Structural Science, Crystal Engineering and Materials 71, no. 2 (March 31, 2015): 127–43. http://dx.doi.org/10.1107/s2052520615005466.
Повний текст джерелаGAJDARDZISKA-JOSIFOVSKA, M., M. H. MALAY, and DAVID J. SMITH. "REFLECTION ELECTRON MICROSCOPY METHODOLOGY FOR QUANTIFICATION OF CLUSTER GROWTH: INDIUM CLUSTERS ON THE InP(110) SURFACE." Surface Review and Letters 04, no. 04 (August 1997): 655–69. http://dx.doi.org/10.1142/s0218625x97000651.
Повний текст джерелаLin, Wan-Hsien, Uwe Jahn, Hanno Küpers, Esperanza Luna, Ryan B. Lewis, Lutz Geelhaar, and Oliver Brandt. "Efficient methodology to correlate structural with optical properties of GaAs nanowires based on scanning electron microscopy." Nanotechnology 28, no. 41 (September 13, 2017): 415703. http://dx.doi.org/10.1088/1361-6528/aa8394.
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