Статті в журналах: "Diffraction Microstructure Imaging"

1

Isabell, Thomas C., and Vinayak P. Dravid. "Electron Backscattered Diffraction (EBSD) with a Cold Held Emission Gun (cFEG) SEM: Resolution, Sensitivity and Applications." Microscopy and Microanalysis 3, S2 (August 1997): 557–58. http://dx.doi.org/10.1017/s1431927600009673.

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A thorough and complete assessment of microstructure of materials requires a wide variety of analytical techniques, which should be sensitive to at all length scales - from mms to atomic scale. While there have been rapid advances in imaging and spectroscopy techniques for microstructural analysis - at all length scales, techniques for crystallographic analysis of microstructure have primarily relied on bulk x-ray/neutron diffraction and TEM. X-ray and neutron diffraction techniques, though very powerful, are primarily bulk techniques and extraction of local crystallography is formidable if not impossible. On the other hand, TEM diffraction techniques provide precise crystallographic information, but at a much smaller length-scale and suffer from poor statistics and tedious specimen preparation procedures. With the advent of commercially available electron backscattered diffraction (EBSD) and orientational imaging (OIM) systems for SEM, and sophisticated pattern recognition procedures, it is now possible to bridge the length-scale gap between bulk and TEM diffraction techniques.

2

Sklenička, Vàclav, Petr Král, Jiří Dvořák, Marie Kvapilová, and Milan Svoboda. "Microstructure Evolution and Creep Behavior in ECAP Processed Metallic Materials." Materials Science Forum 783-786 (May 2014): 2689–94. http://dx.doi.org/10.4028/www.scientific.net/msf.783-786.2689.

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The creep behavior of high purity aluminum and copper, Al-0.2wt.%Sc and Cu-0.2wt.%Zr alloys was examined after processing by equal-channel angular pressing (ECAP) with an emphasis on the link between microstructure and creep. The microstructure was revealed by electron backscatter diffraction (EBSD) and analyzed by stereological methods. Representative microstructural parameters were obtained using orientation imaging microscopy and EBSD on the relationship between creep behavior and microstructure.

3

Adams, B. L. "Orientation imaging of microstructures." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 600–601. http://dx.doi.org/10.1017/s0424820100170736.

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The complexity of microstructures characteristic of polycrystalline materials presents the serious investigator with many challenges. The materials engineer hopes to associate the important technological properties of these materials with specific (quantifiable) attributes of the microstructure; however, microscopy presents an overwhelming myriad of details over a wide range of scales of inquiry. Thus, the persistent question becomes: What is important in the microstructure relative to a specific property or aspect of material performance? One particular viewpoint, which stems from the modern atomistic interpretation of the structure of solids, is that for polycrystalline materials it is the spatial placement of lattice orientation that is of essential interest.The past decade has seen some remarkable progress in microdiffraction technique in conjunction with the scanning electron microscope. This progress now makes it possible to vigorously pursue the aforementioned lattice-orientational viewpoint. Since 1987 modern SIT (silicon intensified target) vidicon and CCD (charge-coupled device) cameras have been used to capture the backscattered Kikuchi diffraction (BKD) formed in stationary spot mode in the scanning electron microscope.

4

Wiskel, J. Barry, Ry Karl, Maro Emakpor, Fateh Fazeli, Chad Cathcart, Tom Zhou, Saber Yu, Doug G. Ivey, and Hani Henein. "Development and Application of a Thermal Microstructure Model of Laminar Cooling of an API X70 Microalloyed Steel." Materials Science Forum 1105 (November 29, 2023): 7–12. http://dx.doi.org/10.4028/p-y88gpk.

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A thermal microstructure model of laminar cooling of X70 microalloyed steel skelp was developed to predict the effect of the laminar cooling temperature profile on the through thickness skelp microstructure. Plant trials using infrared video imaging were undertaken to establish the laminar cooling conditions prevalent in the industrial cooling system. The infrared video temperature measurements were used to develop a finite element thermal model of the skelp transiting the entire laminar cooling system. Dilatometer testing of the X70 steel with cooling rates ranging from 1 °C/s to 120 °C/s was undertaken to develop the CCT curve and to quantify austenite decomposition. The predicted thermal profile from the finite element model and the phase transformation behaviour were combined into a thermal microstructural model capable of predicting the phases that would develop through the skelp thickness as a function of the laminar cooling profile. The predicted through thickness microstructures were verified from electron backscattered diffraction (EBSD) phase analysis of industrially produced API X70 skelp.

5

Black, David R. "Microstructural characterization using x-ray diffraction imaging." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 504–5. http://dx.doi.org/10.1017/s0424820100148356.

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X-ray diffraction imaging, also known as x-ray topography, is a powerful tool to study the defect microstructure of single crystals. As the name implies, this technique is based on recording an image of the diffracted x-ray beam from a crystal. Contrast in the image results from point-to-point variation in the diffracted intensity through the crystal. An example of a diffraction image is shown in figure 1. That this image is in some way a topographic representation of the sample can be seen in the impression of differing elevations and textures in different parts of the image. However, since this image is a result of diffraction from the sample the interpretation of the image is much more complex.Diffraction contrast is usually separated into two types: mosaic contrast and extinction contrast. Mosaic contrast occurs for crystals considered to be formed from a collection of small perfect crystal blocks. These blocks have a well defined rocking curve width, the angular range over which they will diffract, and may be slightly misoriented with respect to each other and/or may have different lattice spacing.

6

Alvis, Roger, David Dingley, and David Field. "Observation of grain superstructure in thin aluminum films by orientation imaging microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 436–37. http://dx.doi.org/10.1017/s0424820100138555.

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The correlation of aluminum alloy reliability data to microstructure has long been the goal of those scientists seeking to model electromigration behavior of interconnects. Traditionally, microstructural information has been acquired through x-ray diffraction , and transmission electron microscopy (TEM). However, each of these techniques is capable of delivering only part of the characterization whole. We describe the application of orientation imaging microscopy (OIM) to thin aluminum alloy films and demonstrate its versatility in providing the key microstructural reliability parameters: namely texture and grain size, as well as providing insight to the microstructure of grain boundaries.OIM was performed on an electromigration test structure (figure 1). The Al-alloy was deposited on titanium and capped with an anti-reflective titanium nitride. Subsequently, the test structure was patterned and capped with a multilayer blanket consisting of silicon nitride (SiN), and SiO2. The structure was annealed after the SOG deposition at 450° C for 90 minutes, seeing no electrical stressing. The die was removed from the package and deprocessed before the OIM was acquired.

7

Falk, L. K. L. "SiAlON Microstructures." Key Engineering Materials 403 (December 2008): 265–68. http://dx.doi.org/10.4028/www.scientific.net/kem.403.265.

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This paper is focussed on the development of microstructure during liquid phase sintering and post-densification crystallisation heat treatment of ceramic materials based on the α- and β-Si3N4 structures. Grain shape and size distributions, assessed by quantitative microscopy in combination with stereological methods, and fine scale microstructures, investigated by electron diffraction and high resolution imaging and microanalysis in the transmission electron microscope, are discussed in relation to the fabrication process and the overall composition of the ceramic material.

8

Blanton, Thomas N. "Applications of X-ray microdiffraction in the imaging industry." Powder Diffraction 21, no. 2 (June 2006): 91–96. http://dx.doi.org/10.1154/1.2204059.

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Characterization of materials used in the digital imaging industry has been performed using micro X-ray diffraction (microXRD) techniques. Case studies are described that demonstrate the use of microXRD for identification of phases, texture, and microstructure morphology of components used in imaging applications.

9

Dingley, D. J. "Further advances in orientation imaging microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 98–99. http://dx.doi.org/10.1017/s0424820100136866.

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Orientation Imaging Microscopy, OIM, is a relatively new technique which provides an image of the surface of polycrystalline material in which the grains are distinguished by their orientation differences, by the strain within them and the type of grain boundaries that separate them. The technique evolved from the work of Dingley and Venables on application of electron backscatter diffraction EBSD in the scanning electron microscope. In OIM, electron backscatter diffraction patterns are obtained successively at regularly spaced points on a sample surface. At each point, the diffraction pattern is captured, transferred to a computer and automatically indexed. Crystal orientation and diffraction line width are measured. Recent advances have been concerned with post data collection image processing.In the following illustration orientation imaging microscopy was used to investigate the microstructure of submicron aluminium, vapour deposited onto single crystal silicon coated with silicon dioxide. The experimental procedure described in reference 2 was adapted using a Philips XL 30 SEM fitted with a tungsten electron gun.

10

Zheng, Changlin, Holm Kirmse, Jianguo Long, David E. Laughlin, Michael E. McHenry, and Wolfgang Neumann. "Investigation of (Fe,Co)NbB-Based Nanocrystalline Soft Magnetic Alloys by Lorentz Microscopy and Off-Axis Electron Holography." Microscopy and Microanalysis 21, no. 2 (November 18, 2014): 498–509. http://dx.doi.org/10.1017/s1431927614013592.

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AbstractThe relationship between microstructure and magnetic properties of a (Fe,Co)NbB-based nanocrystalline soft magnetic alloy was investigated by analytical transmission electron microscopy (TEM). The microstructures of (Fe0.5Co0.5)80Nb4B13Ge2Cu1 nanocrystalline alloys annealed at different temperatures were characterized by TEM and electron diffraction. The magnetic structures were analyzed by Lorentz microscopy and off-axis electron holography, including quantitative measurement of domain wall width, induction, and in situ magnetic domain imaging. The results indicate that the magnetic domain structure and particularly the dynamical magnetization behavior of the alloys strongly depend on the microstructure of the nanocrystalline alloys. Smaller grain size and random orientation of the fine particles decrease the magneto-crystalline anisotropy and suggests better soft magnetic properties which may be explained by the anisotropy model of Herzer.

11

Janovec, Jozef, Ivona Černičková, and Pavol Priputen. "Complex Metallic Alloys – Microstructure Characterization." Key Engineering Materials 592-593 (November 2013): 483–88. http://dx.doi.org/10.4028/www.scientific.net/kem.592-593.483.

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The recent findings related to binary and ternary structurally complex phases in selected complex metallic alloys coming under Al-Pd-Co, Al-Cu-Co, and Al-Mn-Fe systems are presented. The phases were characterized by scanning electron microscopy, transmission electron microscopy, energy-dispersive X-ray spectroscopy, high-angle annular dark-field imaging, X-ray diffraction, and differential thermal analysis. There are highlighted some unusual features of phases D, U, T, and ε-family from both structural and compositional points of view.

12

Beard, Warren T., and Ronald W. Armstrong. "LM-ACT for Imaging RAM Devices in X-ray Diffraction Topographs." Advances in X-ray Analysis 32 (1988): 659–66. http://dx.doi.org/10.1154/s0376030800021030.

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Analysis of serai conductor material and associated integrated circuits (IC) is imperative for ensuring quality products. Currently, routine circuit testing is dominated by measurement of the optical and electrical material/device properties through final device performance and parametric testing.Characterization of the crystal microstructure still is not considered a routine process test. Structural characterization usually is based on double-crystal rocking curves, x-ray topography, or a combination of these techniques.

13

Greisukh, Grigoriy I., Viktor A. Danilov, Evgeniy G. Ezhov, Sergey V. Kazin, and Boris A. Usievich. "Highly Efficient Double-Layer Diffraction Microstructures Based on New Plastics and Molded Glasses." Photonics 8, no. 8 (August 11, 2021): 327. http://dx.doi.org/10.3390/photonics8080327.

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Within the framework of rigorous diffraction theory, the maximum possible incidence angles of radiation on two-layer sawtooth relief-phase microstructures in the visible (0.4 ≤ λ ≤ 0.7 μm) spectral range are compared. Optical materials for the layers of these microstructures are selected from a database of 47 plastics and 165 molded glasses. It is shown that when the ratio of the spatial period of the microstructure to the effective depth of the relief is greater than 20, the achievable angles within which the diffraction efficiency exceeds 0.95 lie in a wide range from 18.5° to 40.5° for single-relief structures and 7.5° to 22.3° for structures with two internal reliefs. The best results for purely plastic microstructures are obtained when the plastic CMT and the indium tin oxide nanocomposite in polymethylmethacrylate are used.

14

Trenkle, A., M. Syha, W. Rheinheimer, P. G. Callahan, L. Nguyen, W. Ludwig, W. Lenthe, et al. "Nondestructive evaluation of 3D microstructure evolution in strontium titanate." Journal of Applied Crystallography 53, no. 2 (February 21, 2020): 349–59. http://dx.doi.org/10.1107/s160057672000093x.

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Nondestructive X-ray diffraction contrast tomography imaging was used to characterize the microstructure evolution in a polycrystalline bulk strontium titanate specimen. Simultaneous acquisition of diffraction and absorption information allows for the reconstruction of shape and orientation of more than 800 grains in the specimen as well as porosity. Three-dimensional microstructure reconstructions of two coarsening states of the same specimen are presented alongside a detailed exploration of the crystallographic, topological and morphological characteristics of the evolving microstructure. The overall analysis of the 3D structure shows a clear signature of the grain boundary anisotropy, which can be correlated to surface energy anisotropy: the grain boundary plane distribution function shows an excess of 〈100〉-oriented interfaces with respect to a random structure. The results are discussed in the context of interface property anisotropy effects.

15

Martens, Isaac, Nikita Vostrov, Marta Mirolo, Jakub Drnec, Tobias Schulli, and Xiaobo Zhu. "Operando X-Ray Diffraction Nanoimaging of Advanced Cathodes." ECS Meeting Abstracts MA2022-01, no. 2 (July 7, 2022): 360. http://dx.doi.org/10.1149/ma2022-012360mtgabs.

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Techniques capable of probing active materials in situ are increasingly needed to link cell performance data with nanostructural evolution inside functional devices. Rapid improvements in spatial and temporal resolution of X-ray nanomicroscopy and high-energy diffraction facilitated by new 4th-gen synchrotrons offer a powerful platform for investigating phase transitions inside advanced cathode materials. We show how the latest methodologies can be used to evaluate the mechanism of phase transitions at the nanoscale, linked to degradation processes inside commercially relevant cells. "Single crystal" cathode active materials have garnered incredible academic and industrial interest in the past several years. Despite extensive electrochemical performance validation, there remain very few tools capable of evaluating the quality and consistency of these materials. Scanning X-ray nanodiffraction microscopy reveals the hidden microstructure and defects inside nominally single crystal cathode particles established during their fabrication. In situ nanodiffraction imaging provides further insight towards the link between this microstructure and functional properties such as high voltage stability inside individual crystallites during cycling.

16

Wright, S. I., and D. P. Field. "Analysis of Multiphase Materials Using Electron Backscatter Diffraction." Microscopy and Microanalysis 3, S2 (August 1997): 561–62. http://dx.doi.org/10.1017/s1431927600009697.

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Image analysis techniques coupled with crystallography computer codes have been used to index electron backscatter diffraction patterns (EBSPs). The ability to automatically obtain the crystallographic orientation from EBSPs coupled with computer control of the electron beam (or stage) in a scanning electron microscope (SEM) provides a much more complete description of the spatial distribution of crystallographic orientation in polycrystalline materials than has been previously attainable using conventional metallography techniques. Orientation data obtained using this technique can be used to form images reflecting the spatial arrangement of crystallographic orientation in a microstructure. Such images enable the topological features of a microstructure to be linked with the orientation characteristics. The formation of these images, as well as the data collection technique, is sometimes termed Orientation Imaging Microscopy (OIM). The utility of this technique for exploring the property/structure relationship in polycrystalline material has been demonstrated by numerous researchers. However, as yet, this technique has almost exclusively been applied to single phase materials.

17

Zhang, Fan, Andrew Allen, Lyle Levine, Gabrielle Long, Jan Ilavsky, Joshua Hammons, and Pete Jemian. "In Situ Materials Characterization across Atomic and Microstructure Lengthscales." Acta Crystallographica Section A Foundations and Advances 70, a1 (August 5, 2014): C1072. http://dx.doi.org/10.1107/s205327331408927x.

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Advanced materials exhibit complex, hierarchical, and multiscale microstructures that control their performance. Today, optimization of these microstructures requires iterative, ex situ studies using multiple independent instruments with different samples. To address many of the grand challenges facing the material research community, it is desirable to correlate material performance under realistic processing and operating conditions with in situ characterization of material structures across atomic and microstructural length scales. To meet this need, we have made progress in recent years in developing a suite of materials-measurement techniques that combines ultra-small angle X-ray scattering, small-angle X-ray scattering, X-ray diffraction, X-ray photon correlation spectroscopy, and X-ray imaging. When making use of high energy x rays from a third generation synchrotron source, this combined suite of techniques not only enables investigation of thick, complex materials under real operating/ processing conditions, but also allows robust structural characterization over 7 decades of structural and microstructural feature sizes, from sub-angstrom to millimeters. Depending on the scattering characteristics of the material, it can cover an unprecedented 11 decades in scattering intensity. This arrangement also allows the combination of measurement techniques be determined solely by the user's needs, allowing an unparalleled flexibility in addressing any set of microstructure, structure and dynamics material-measurement requirements. In this presentation, we will focus on various considerations required to make this combined technique possible, and use data from a series of in situ studies of aluminum alloys as examples to demonstrate the unique capability of this instrument. We will also discuss the potential impact that multi-bend achromat lattice, a concept being embraced by the worldwide synchrotron community, has on this technique.

18

Sutliff, J. A., and B. P. Bewlay. "Orientation Imaging of A Nb-Ti-Si Directionally Solidified In-Situ Composite." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 350–51. http://dx.doi.org/10.1017/s0424820100164210.

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In this paper we report on the microstructural characterization of a directionally solidified (DS) Nb-Ti-Si alloy. The solidified ingot had a nominal composition of Nb-33 at%Ti-16 at% Si and was grown using the Czochralski technique with growth rate of 5 mm/min. The as-solidified ingot was approximately 50 mm long with a 10 mm diameter. The microstructure was examined using backscatter electron imaging and the microtexture of each of the phases was determined using the Electron BackScattering Pattern (EBSP) technique for electron diffraction in the scanning electron microscope. The details of the experiments are similar to those we have reported previously. Automated EBSP scans were acquired in order to map the local texture (microtexture) over most of a transverse cross-section through the ingot.Figure 1 is a backscattered electron image (BEI) of a transverse section of the as-solidified microstructure. In this image, the bcc-Nb phase is the lighter gray phase and has a dendritic structure. The dark gray phase is (Nb,Ti)3Si having a Ti3P crystal structure. The silicide phase appears as both multiply-faceted dendrites and irregularly bounded grains. A pattern of shading, due to Ti segregation, can be seen in figure 1 and suggests a cellular solidification structure. Figure 2 is a BEI taken at higher magnification to show a region that was analyzed by automated-EBSP. Figure 3 contains orientation images generated from the automated-EBSP data set. In Figure 3a, the color black signifies positions for which no Nb diffraction patterns could be indexed and other shades of gray signify specific Nb orientations, as described by a set of Euler angles. A similarly generated orientation image for the silicide phase is shown in Figure 3b. The greyscale image presented here is actually a rendering of a truecolor image based on a RGB triplet using the Euler angles.

19

Hunt, Emily M., John J. Granier, Keith B. Plantier, and Michelle L. Pantoya. "Nickel aluminum superalloys created by the self-propagating high-temperature synthesis of nanoparticle reactants." Journal of Materials Research 19, no. 10 (October 1, 2004): 3028–36. http://dx.doi.org/10.1557/jmr.2004.0389.

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Advancements in nanotechnology for material processing via combustion synthesis have spurred the development of superalloys that provide improved protective properties. Nanoscale reactant particles offer unique thermal properties and increased homogeneity that improve the microstructural features and macroscopic properties of the synthesized product. In this study nanoscale molybdenum trioxide (MoO3) particles were added to micron scale nickel (Ni) and aluminum (Al). The goal was to incorporate a nanoscale additive within the reactant matrix that would produce a superalloy by generating excessively high heating rates and creating controlled quantities of Al2O3 (a strengthening agent) within the microstructure of the alloy. Ignition and flame propagation were examined using a CO2 laser and imaging diagnostics that include a copper-vapor laser coupled with a high-speed camera. Product microstructure was examined using micro-x-ray diffraction analysis and scanning electron microscopy. Abrasion testing was performed to evaluate the wear resistance properties of the superalloy. Results show that adding MoO3 increases the flame temperature, results in greater ignition sensitivity, produces a more homogeneous microstructure, and increases the overall wear resistance of the product.

20

Šedivý, Ondřej, Viktor Beneš, Petr Ponížil, Petr Král, and Václav Sklenička. "QUANTITATIVE CHARACTERIZATION OF MICROSTRUCTURE OF PURE COPPER PROCESSED BY ECAP." Image Analysis & Stereology 32, no. 2 (June 27, 2013): 65. http://dx.doi.org/10.5566/ias.v32.p65-75.

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Orientation imaging microscopy (OIM) allows to measure crystallic orientations at the surface of the material. Digitalized data representing the orientations are processed to recognize the grain structure and they are visualized in crystal orientation maps. Analysis of the data firstly consists in recognition of grain boundaries followed by identification of grains themselves. Knowing the grain morphology it is possible to characterize the homogeneity of the structure and estimate structural parameters related to the physical properties of the material. The paper describes methods of imaging and quantitative characterization of the grain boundary structure in metals based on data from electron backscattered diffraction (EBSD).

21

Muntifering, Brittany, Rémi Dingreville, Khalid Hattar, and Jianmin Qu. "Electron Beam Effects during In-Situ Annealing of Self-Ion Irradiated Nanocrystalline Nickel." MRS Proceedings 1809 (2015): 13–18. http://dx.doi.org/10.1557/opl.2015.499.

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ABSTRACTTransmission electron microscopy (TEM) is a valuable methodology for investigating radiation-induced microstructural changes and elucidating the underlying mechanisms involved in the aging and degradation of nuclear reactor materials. However, the use of electrons for imaging may result in several inadvertent effects that can potentially change the microstructure and mechanisms active in the material being investigated. In this study, in situ TEM characterization is performed on nanocrystalline nickel samples under self-ion irradiation and post irradiation annealing. During annealing, voids are formed around 200 °C only in the area illuminated by the electron beam. Based on diffraction patterns analyses, it is hypothesized that the electron beam enhanced the growth of a NiO layer resulting in a decrease of vacancy mobility during annealing. The electron beam used to investigate self-ion irradiation ultimately significantly affected the type of defects formed and the final defect microstructure.

22

Darbal, A. D., M. Gemmi, J. Portillo, E. Rauch, and S. Nicolopoulos. "Nanoscale Automated Phase and Orientation Mapping in the TEM." Microscopy Today 20, no. 6 (November 2012): 38–42. http://dx.doi.org/10.1017/s1551929512000818.

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The limitation of spatial resolution in orientation imaging via electron backscattered diffraction analysis in the scanning electron microscope (SEM) makes it difficult to investigate the microstructure of nanocrystalline materials. The use of the recently developed transmission electron microscope (TEM) based product, known as ASTAR, offers the possibility of reliable orientation/phase mapping with a spatial resolution below 3 nm. In ASTAR, a nanoprobe electron beam is scanned over the specimen, and spot diffraction patterns are collected. The electron beam is precessed to reduce dynamical effects and improve pattern quality. Using template matching, the diffraction patterns are indexed automatically.

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Szpunar, Jerzy A., and Bae Kyun Kim. "High Temperature Oxidation of Steel; New Description of Structure and Properties of Oxide." Materials Science Forum 539-543 (March 2007): 223–27. http://dx.doi.org/10.4028/www.scientific.net/msf.539-543.223.

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The quality of steel sheets is strongly affected by the surface defects that can be generated during hot rolling and are often related to scales removal operation. These defects are related to rather complex high temperature oxidation processes. In order to reduce an occurrence of the defects, it is necessary to understand better the formation of iron oxides during high temperature oxidation, the structure of the interfaces with the substrate and between different oxide phases. However, due to the lack of good experimental research tools details of iron oxide microstructures were not investigated. Conventional methods, such as backscattered electron images or fractography can only provide general characteristics of microstructures like grain morphology and grain size. In this paper the microstructure, phase distribution and texture in oxide formed during high temperature oxidation of iron and low carbon steels are investigated. The oxide microstructures are characterized by orientation imaging microscopy (OIM) on the cross-sectional area of the oxide layers. It is demonstrated that OIM using electron backscattered diffraction (EBSD) techniques, can be used to distinguish grains having different phase composition and orientation and can become invaluable tool for visualizing the oxide microstructure, texture and also can be used to study oxide defects. The three different iron oxides phases can be distinguished and the characteristics of oxides with different oxidation histories compared The characteristics of high temperature oxidation microstructure of iron are presented with description of iron oxide defects and cracking as well as the illustration of the interfacial microstructure between the layered iron oxides.

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Qin, Lanlan, Changjun Chen, Min Zhang, Kai Yan, Guangping Cheng, Hemin Jing, and Xiaonan Wang. "The microstructure and mechanical properties of deposited-IN625 by laser additive manufacturing." Rapid Prototyping Journal 23, no. 6 (October 17, 2017): 1119–29. http://dx.doi.org/10.1108/rpj-05-2016-0081.

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Purpose Laser additive manufacturing (LAM) technology based on powder bed has been used to manufacture complex geometrical components. In this study, IN625 superalloys were fabricated by high-power fiber laser without cracks, bounding errors or porosity. Meanwhile, the objectives of this paper are to systemically investigate the microstructures, micro-hardness and the precipitated Laves phase of deposited-IN625 under different annealing temperatures. Design/methodology/approach The effects of annealing temperatures on the microstructure, micro-hardness and the precipitated Laves phase were studied by optical microscope (OM), scanning electron microscopy (SEM), X-ray diffraction (XRD), energy dispersive spectrometer (EDS), selected area electron diffraction (SAED), backscattered electron (BSE) imaging in the SEM and transmission electron microscopy (TEM), respectively. The thermal stability of the dendritic morphology about IN625 superalloys was investigated through annealing at temperatures range from 1,000°C to 1,200°C. Findings It is found that the microstructure of deposited-IN625 was typical dendrite structure. Besides, some Laves phase precipitated in the interdendritic region results in the segregation of niobium and molybdenum. The thermal stability indicate that the morphology of dendrite can be stable up to 1,000°C. With the annealing temperatures increasing from 1,000 to 1,200°C, the Laves phase partially dissolves into the γ-Ni matrix, and the morphology of the remaining Laves phase is changing from irregular shape to rod-like or block-like shape. Research limitations/implications The heat treatment used on the IN625 superalloys is helpful for knowing the evolution of microstructures and precipitated phases thermal stability and mechanical properties. Practical implications Due to the different kinds of application conditions, the original microstructure of the IN625 superalloys fabricated by LAM may not be ideal. So exploring the influence of annealing treatment on IN625 superalloys can bring theory basis and guidance for actual production. Originality/value This study continues valuing the fabrication of IN625 by LAM. It shows the effect of annealing temperatures on the shape, size and distribution of Laves phase and the microstructures of deposited-IN625 superalloys.

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Suyama, Yoko, Yoshitsugu Tomokiyo, and Kunihiro Terasaka. "Grain boundary structure of A ZnO-Bi2O3-CoO varistor." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 4 (August 1990): 374–75. http://dx.doi.org/10.1017/s0424820100175004.

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The nonhomic property of ZnO-based varistors has been considered to depend on grain boundary structures. The microstructures of ulticomponent varistors are very complicated and quite sensitive to concentration and thermal history. It is not clear which microstructures play an important role for the electrical properties such as nonlinear coefficient and varistor voltage, and for the degradiation. In the present paper the microstructure of ZnO varistor was investigated by means of analytical electron microscopy to elucidate the relation between the microstructures and the electrical properties. In order to obtain local information on the microstructures of grain boundary and multiple junction, we combined the various TEM techniques such as high-resolution imaging (HREM), microprobe diffraction (μ ED), convergent-beam electron diffraction (CBED) and energy dispersive x-ray spectroscopy (EDX).ZnO varistor samples with addition of 0.5molZ% Bi2O3 + 0∼0.5molZ% CoO were prepared by conventional mixed-oxide ceramic technology. The thin foils prepared from the samples sintered at 800, 900 and 1000 °C were examined either by an analytical TEM, JEM-2000FX at 200 kV or a high resolution TEM, JEM-4000EX at 400 kV. The diameters of electron probe were less than 10 nm for μ ED and about 20 nm for EDX and 10∼20 nm for CBED.

26

Arai, Yasuhiko. "Role of Phase Information Propagation in the Realisation of Super-Resolution Based on Speckle Interferometry." Photonics 10, no. 12 (November 26, 2023): 1306. http://dx.doi.org/10.3390/photonics10121306.

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Super-resolution technology is important not only in bio-related fields but also in nanotechnology, particularly in the semiconductor industry, where fine patterning is required and super-resolution is essential. However, observing microstructures beyond the diffraction limit proposed by Abbe and Rayleigh is considered impossible because of diffraction in traditional optical microscopy observation techniques. However, in recent years, it has been possible to observe microstructures beyond the Rayleigh criterion by analysing the phase distribution of light. This study investigated the physical reasons why phase analysis makes this new analysis technique possible using simulations. The results confirmed that the phase component of the zero-order diffracted light reflected from the microstructure and able to pass through the lens system contained phase information related to the shape of the measured object. Analysis of this information demonstrates the possibility of realising super-resolution based on speckle interferometry.

27

Kiran, Abhilash, Martina Koukolíková, Jaroslav Vavřík, Miroslav Urbánek, and Jan Džugan. "Base Plate Preheating Effect on Microstructure of 316L Stainless Steel Single Track Deposition by Directed Energy Deposition." Materials 14, no. 18 (September 7, 2021): 5129. http://dx.doi.org/10.3390/ma14185129.

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The microstructural morphology in additive manufacturing (AM) has a significant influence on the building structure. High-energy concentric heat source scanning leads to rapid heating and cooling during material deposition. This results in a unique microstructure. The size and morphology of the microstructure have a strong directionality, which depends on laser power, scanning rate, melt pool fluid dynamics, and material thermal properties, etc. The grain structure significantly affects its resistance to solidification cracking and mechanical properties. Microstructure control is challenging for AM considering multiple process parameters. A preheating base plate has a significant influence on residual stress, defect-free AM structure, and it also minimizes thermal mismatch during the deposition. In the present work, a simple single track deposition experiment was designed to analyze base plate preheating on microstructure. The microstructural evolution at different preheating temperatures was studied in detail, keeping process parameters constant. The base plate was heated uniformly from an external heating source and set the stable desired temperature on the surface of the base plate before deposition. A single track was deposited on the base plate at room temperature and preheating temperatures of 200 °C, 300 °C, 400 °C, and 500 °C. Subsequently, the resulting microstructural morphologies were analyzed and compared. The microstructure was evaluated using electron backscattered diffraction (EBSD) imaging in the transverse and longitudinal sections. An increase in grain size area fraction was observed as the preheating temperature increased. Base plate preheating did not show influence on grain boundary misorientation. An increase in the deposition depth was noticed for higher base plate preheating temperatures. The results were convincing that grain morphology and columnar grain orientation can be tailored by base plate preheating.

28

Karthik, Chinnathambi, Joshua Kane, Darryl P. Butt, William E. Windes, and Rick Ubic. "Microstructural Characterization of Next Generation Nuclear Graphites." Microscopy and Microanalysis 18, no. 2 (January 23, 2012): 272–78. http://dx.doi.org/10.1017/s1431927611012360.

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AbstractThis article reports the microstructural characteristics of various petroleum and pitch based nuclear graphites (IG-110, NBG-18, and PCEA) that are of interest to the next generation nuclear plant program. Bright-field transmission electron microscopy imaging was used to identify and understand the different features constituting the microstructure of nuclear graphite such as the filler particles, microcracks, binder phase, rosette-shaped quinoline insoluble (QI) particles, chaotic structures, and turbostratic graphite phase. The dimensions of microcracks were found to vary from a few nanometers to tens of microns. Furthermore, the microcracks were found to be filled with amorphous carbon of unknown origin. The pitch coke based graphite (NBG-18) was found to contain higher concentration of binder phase constituting QI particles as well as chaotic structures. The turbostratic graphite, present in all of the grades, was identified through their elliptical diffraction patterns. The difference in the microstructure has been analyzed in view of their processing conditions.

29

Li, S. F., and R. M. Suter. "Adaptive reconstruction method for three-dimensional orientation imaging." Journal of Applied Crystallography 46, no. 2 (March 14, 2013): 512–24. http://dx.doi.org/10.1107/s0021889813005268.

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An adaptive orientation reconstruction algorithm is developed for near-field high-energy X-ray diffraction microscopy. When combined with a spatially adaptive extension the algorithm results in a factor of 10–1000 speed-up over the existing forward modeling reconstruction method while preserving most of the spatial and orientation resolution characteristics. Tests of the reconstruction code based on simulated structures and real data on a complex microstructure are presented. Simulated structures include intra-granular orientation gradients and noisy detector images. It is shown that resolution in both real space and orientation space degrades gracefully as complexity and detector noise increase.

30

Voigt-Martin, Ingrid Gisela, Heinz Durst, Volker Brzezinski, Herbert Krug, Willi Kreuder, and Helmut Ringsdorf. "Microstructure of a Discotic Polymer as Revealed by Electron Diffraction and High-Resolution Imaging." Angewandte Chemie International Edition in English 28, no. 3 (March 1989): 323–25. http://dx.doi.org/10.1002/anie.198903231.

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31

Krezhov, Kiril, Tatyana Koutzarova, Borislava Georgieva, Svetoslav Kolev, Daniela Kovacheva, Benedicte Vertruyen, Raphael Closset, Lan Maria Tran, Michał Babij, and Anatoliy Senyshyn. "Influence of nonmagnetic cation substitution on magnetic order temperature in Y-type hexaferrites: Ba_0.5Sr_1.5Zn₂Fe₁₂O₂₂ and Ba_0.5Sr_1.5Zn₂Al_0.08Fe_11.92O₂₂." EPJ Web of Conferences 286 (2023): 05006. http://dx.doi.org/10.1051/epjconf/202328605006.

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With a view to the proven multiferroic properties of the title representatives of the Y-type hexaferrites as single crystals we present here a comparative study of their microstructure and magnetic properties for powders. The polycrystalline materials of Ba0.5Sr1.5Zn2Fe12O22 (S1) and its doped with aluminium derivative Ba0.5Sr1.5Zn2Al0.08Fe11.92O22 (S2) were synthesized by two different techniques: citric-acid sol-gel auto-combustion and sonochemical co-precipitation. Their atomic-level structure determination was checked by X-ray and neutron diffraction, electron diffraction and imaging methods, and their physical characterization was carried out by magnetometry. SEM images show that the microstructure strongly depends on the method of synthesis: non-uniform hexagonal grans are formed in case of auto-combustion whereas particles of nearly perfect hexagonal shape are observed in case of sonochemical co-precipitation. With lowering the temperature to 5 K several magnetic phase transitions were observed, more clearly pronounced in S2 powders. Neutron diffraction data in vicinity and above room temperature help in revealing the effect of magnetic dilution on the observed magnetic properties.

32

Boland, Jim N., Xing S. Li, Roger P. Rassool, Colin M. MacRae, N. C. Wilson, S. Elbracht, Vladimir Luzin, Paolo Imperia, and B. Sobott. "Wear Resistance and Microstructural Study of Diamond Coated WC Tools." Materials Science Forum 654-656 (June 2010): 2527–30. http://dx.doi.org/10.4028/www.scientific.net/msf.654-656.2527.

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Diamond composite materials are classified as superhard and exhibit exceptional abrasive resistance. Cemented tungsten carbide tools with a thick coating of diamond composite material (PCD) are finding increased usage in materials cutting operations in manufacturing, mining, minerals, gas and petroleum exploration and civil construction industries. Two major advantages derived from these coated tools are: (a) increased wear resistance and hence increased life-span of these tools and (b) their proven ability to handle “difficult-to-machine” materials as well as high-strength, extremely abrasive materials such as quartz-rich rocks, granites and basalts. In this research, the variability of the wear resistance of PCD coated tungsten carbide is correlated with microstructural variations. A detailed study of the microstructure and distribution of phases was performed using SEM, cathodoluminescence (CL) imaging, direct x-ray imaging, Raman spectroscopy as well as residual stress measurements using neutron diffraction.

33

Sun, Haiping, and Xiaoqing Pan. "Microstructure of ZnO shell on Zn nanoparticles." Journal of Materials Research 19, no. 10 (October 1, 2004): 3062–67. http://dx.doi.org/10.1557/jmr.2004.0402.

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When exposed to air at room temperature, Zn nanoparticles oxidize gradually to form crystalline ZnO shells with a thickness of a few nanometers. Electron diffraction and high-resolution lattice imaging revealed that the ZnO layer on the Zn {0001} surface is composed of many epitaxial domains with small rotation angles relative to the lattice of the Zn core. The oxidized Zn particle bends when irradiated by the electron beam in a transmission electron microscope. This is due to the increase of internal stress in the ZnO layer as a result of the realignment of adjacent domains under electron beam irradiation. Corrosion of Zn nanoparticles was observed and the scaling and spalling start to occur on the {1010} prismatic faces.

34

Hemmati, I., J. C. Rao, V. Ocelík, and J. Th M. De Hosson. "Electron Microscopy Characterization of Ni-Cr-B-Si-C Laser Deposited Coatings." Microscopy and Microanalysis 19, no. 1 (January 25, 2013): 120–31. http://dx.doi.org/10.1017/s1431927612013839.

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AbstractDuring laser deposition of Ni-Cr-B-Si-C alloys with high amounts of Cr and B, various microstructures and phases can be generated from the same chemical composition that results in heterogeneous properties in the clad layer. In this study, the microstructure and phase constitution of a high-alloy Ni-Cr-B-Si-C coating deposited by laser cladding were analyzed by a combination of several microscopy characterization techniques including scanning electron microscopy in secondary and backscatter imaging modes, energy dispersive spectroscopy (EDS), electron backscatter diffraction (EBSD), and transmission electron microscopy (TEM). The combination of EDS and EBSD allowed unequivocal identification of micron-sized precipitates as polycrystalline orthorhombic CrB, single crystal tetragonal Cr5B3, and single crystal hexagonal Cr7C3. In addition, TEM characterization showed various equilibrium and metastable Ni-B, Ni-Si, and Ni-Si-B eutectic products in the alloy matrix. The findings of this study can be used to explain the phase formation reactions and to tune the microstructure of Ni-Cr-B-Si-C coatings to obtain the desired properties.

35

Aguiar, Isabela Viegas, Diana Pérez Escobar, Dagoberto Brandão Santos, and Paulo J. Modenesi. "Microstructure characterization of a duplex stainless steel weld by electron backscattering diffraction and orientation imaging microscopy techniques." Matéria (Rio de Janeiro) 20, no. 1 (March 2015): 212–26. http://dx.doi.org/10.1590/s1517-707620150001.0022.

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This paper describes the electron backscatter diffraction (EBSD) technique used to characterize the microstructure (especially the morphology and constitution) of the base metal (BM), the heat-affected zone (HAZ) and the fusion zone (FZ) on a lean duplex stainless steel (LDX). This technique provides advantages due to its simplicity of use and greater depth of information, thereby increasing the amount of information obtained by traditional characterization techniques such as optical microscopy (OM), scanning electron microscopy (SEM), and transmission electron microscopy (TEM). The use of EBSD together with orientation imaging microscopy (OIM) as a tool to understand phase transformation paths and ferrite-austenite variant selection was discussed. Vickers microhardness measurements were performed and no significance difference between the different zones was found. Orientation distribution function (ODF) results show that there are no significant changes on the crystallographic texture of the samples after welding. The advantages of using SEM together with EBSD for microstructure analyzing and texture development were also discussed.

36

Srinivasan, Narayanan, S. Senthil Kumaran, and D. Venkateswarlu. "Anodic Polarization Behavior of Cold-Worked Austenitic Stainless Steel: A Newer Approach." Materials Science Forum 969 (August 2019): 16–21. http://dx.doi.org/10.4028/www.scientific.net/msf.969.16.

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The anodic potentiodynamic polarization behavior of various grades of cold-worked (rolling and machining) austenitic stainless steels were studied. Deformed specimens were characterized by Electron backscattered diffraction (EBSD) and Fourier transform infrared spectroscopy (FTIR)-imaging. The FTIR-imaging was used to quantify chromium oxide (Cr2O3) spectra. It was observed, average area under Cr2O3 spectra was decreased with increase in cold -working. The certain regions in deformed microstructure showed higher value of area under Cr2O3 spectra, indicated stability of passivation film that needs to be explored. There was no microstructurally different between machined specimens.

37

Menasche, D. B., P. A. Shade, and R. M. Suter. "Accuracy and precision of near-field high-energy diffraction microscopy forward-model-based microstructure reconstructions." Journal of Applied Crystallography 53, no. 1 (February 1, 2020): 107–16. http://dx.doi.org/10.1107/s1600576719016005.

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The accuracy of the near-field high-energy diffraction microscopy (nf-HEDM) technique is evaluated by directly comparing an nf-HEDM reconstructed microstructure with an electron backscatter diffraction (EBSD) characterization of the same microstructure. A high-purity gold oligocrystal was chosen for characterization in order to facilitate direct one-to-one comparison between the reconstructions given by each technique. By using the comparatively high spatial resolution of the EBSD reconstruction as the ground truth for the grain-boundary network's morphology, it is determined that nf-HEDM locates internal grain boundaries with an accuracy on average better than the resolution of the imaging detector used or within the reconstruction voxel size, whichever is larger. By taking the intragranular misorientation in well ordered grains as a proxy for orientation resolution, it is determined that standard data collection procedures determine crystallographic orientations to better than 0.1°. The effects of various modified data collection procedures are also examined.

38

Zeng, Hu, Yang, Xu, Li, and Guo. "Evolution of the Microstructure and Properties of Pre-Boronized Coatings During Pack-Cementation Chromizing." Coatings 10, no. 2 (February 9, 2020): 159. http://dx.doi.org/10.3390/coatings10020159.

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The effect of chromizing time on the microstructure and properties of B–Cr duplex-alloyed coating prepared by a two-step pack-cementation process was investigated. The phases, microstructure, and element distribution of three coatings obtained were characterized by X-ray diffraction (XRD), secondary electron imaging (SEI), backscattering electron imaging (BSEI), and energy dispersive spectroscopy (EDS), respectively. The results show that as the chromizing time increases, the net-like Fe2B and rod-like CrFeB phases in the coating gradually disappear, and finally completely transform into the block-like Cr2B and CrxCy (Cr7C3 and Cr23C6) phases. The growth kinetics analysis shows that interface reaction dominates the coating growth during the early stage of chromizing, while atomic diffusion gradually controls the coating growth at the later stage. The evolution mechanism of the B-Cr duplex-alloyed coating was also discussed.

39

Heidarzadeh, Akbar, Mousa Javidani та Lyne St-Georges. "Crystallographic Orientation Relationship between α and β Phases during Non-Equilibrium Heat Treatment of Cu-37 wt. % Zn Alloy". Crystals 12, № 1 (13 січня 2022): 97. http://dx.doi.org/10.3390/cryst12010097.

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The crystallographic orientation relationship between α and β phases during the non-equilibrium heat treatment of a Cu-37 wt. % Zn alloy was investigated. With this aim, Cu-37 wt. % Zn alloy plates with a thickness of 2 mm were heated at 810 °C for 1 h and then were quenched in water. The microstructure and texture of heat-treated samples were analyzed using optical microscopy and electron backscattered diffraction. By this non-equilibrium heat treatment, β phase was formed on both the grain boundaries and grain interiors. In addition, the Σ3 twin boundaries acted as preferred areas for α→β transformation. The orientation imaging microscopy results revealed a Kurdjumov–Sachs (K–S) orientation relationship between α and β phases. Furthermore, the details of microstructural evolution and texture analysis were discussed.

40

Bunge, H. J., H. Klein, L. Wcislak, U. Garbe, W. Weiß, and J. R. Schneider. "High-Resolution Imaging of Texture and Microstructure by the Moving Detector Method." Textures and Microstructures 35, no. 3-4 (January 1, 2003): 253–71. http://dx.doi.org/10.1080/07303300310001642638.

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In order to describe texture and microstructure of a polycrystalline material completely, crystal orientation g={ϕ1Φϕ2} must be known in all points x={x1 x2 x3} of the material. This can be achieved by locationresolved diffraction of high-energy, i.e. short-wave, X-rays from synchrotron sources. Highest resolution in the orientation- as well as the location-coordinates can be achieved by three variants of a detector “sweeping” technique in which an area detector is continuously moved during exposure. This technique results in two-dimensionally continuous images which are sections and projections of the six-dimensional “orientation– location” space. Further evaluation of these images depends on whether individual grains are resolved in them or not. Because of the high penetration depth of high-energy synchrotron radiation in matter, this technique is also, and particularly, suitable for the investigation of the interior of big samples.

41

Babout, L., J. Quinta Da Fonseca, and Michael Preuss. "Local Strain Imaging during Mechanical Loading of Lamellar Microstructures in Titanium Based Alloys." Applied Mechanics and Materials 1-2 (September 2004): 159–64. http://dx.doi.org/10.4028/www.scientific.net/amm.1-2.159.

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In this work optical microscopy in situ tensile testing has been carried out to study the localisation of surface strain in fully lamellar titanium alloys. The localised strain was measured by analysing the recorded optical micrographs using image correlation, and the orientation of the a lamellae colony was determined by using Electron Back Scatter Diffraction (EBSD). The results show a localisation of strain, which seems to depend on the crystallographic orientation of the a lamellae colony in the lamellar microstructure. No significant strain was observed in the former b grain boundary region.

42

Crozier, P. A., and M. R. McCartney. "Application of energy-filtered imaging to the characterization of heterogeneous catalysts." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 724–25. http://dx.doi.org/10.1017/s0424820100149453.

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Heterogeneous metal catalysts often consist of one or more metal species distributed over a highly porous oxide support. In many cases, there is not a clear understanding of the relationship between the microstructure of such systems and their catalytic properties. Indeed, the systems often possess complex morphologies with domains containing many different phases. To build up a clear picture of the microstructure of these materials it is essential to have an accurate representation of the distribution of elements over reasonably large areas of the sample. Here we employed a Zeiss EM 912 fitted with an omega filter to determine elemental distributions over large areas in amination catalysts.The microscope, which operates at 120 kV, is interfaced to a Gatan slow-scan CCD camera (10242 pixels) which can be used to acquire images, diffraction patterns and energy-loss spectra from regions of the sample. At present our machine is fitted with a W filament as an electron source which gives high beam current but limits the usable energy resolution to about 2 eV.

43

Núñez, Andrés, Xavier Llovet, and Juan F. Almagro. "Analysis of Chemical Changes and Microstructure Characterization during Deformation in Ferritic Stainless Steel." Microscopy and Microanalysis 19, no. 4 (April 29, 2013): 959–68. http://dx.doi.org/10.1017/s143192761300024x.

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AbstractUni- and biaxial tension deformation tests, with different degrees of deformation, have been done on AISI 430 (EN 1.4016) ferritic stainless steel samples, which had both different chemical compositions and had undergone different annealing treatments. The initial and deformed materials were characterized by using electron backscatter diffraction and backscatter electron imaging in a scanning electron microscope together with electron probe microanalysis. The correlation observed among the chemical compositions, annealing treatment, and strain level obtained after deformation is discussed.

44

Viegers, M. P. A., D. M. de Leeuw, C. A. H. A. Mutsaers, H. A. M. van Hal, H. C. A. Smoorenburg, J. H. T. Hengst, J. W. C. de Vries, and P. C. Zalm. "Oxygen content, microstructure, and superconductivity of YBa2Cu3O7−x." Journal of Materials Research 2, no. 6 (December 1987): 743–49. http://dx.doi.org/10.1557/jmr.1987.0743.

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The influence of preparation conditions and microstructure on the superconductive properties of single-phase poly-crystalline YBa2Cu3O7−x was investigated by electron probe microanalysis, transmission electron microscopy (TEM), and x-ray powder diffraction as a function of temperature in various ambients supplemented by resistivity and susceptibility measurements. Leaching of Ba was observed when samples were brought in contact with water. The TEM imaging revealed that individual grains have an extremely defect-rich outer shell and an inner core with a domain structure with a and b axes interchanged. The transition temperature Tc was found to decrease with increasing quench temperature in the range 400–900°C. The Tc was observed to be linearly proportional to the difference in the orthorhombic cell parameters (b-a). Further implications are discussed.

45

Hilton, M. R., G. Jayaram, and L. D. Marks. "Microstructure of cosputter-deposited metal- and oxide-MoS2 solid lubricant thin films." Journal of Materials Research 13, no. 4 (April 1998): 1022–32. http://dx.doi.org/10.1557/jmr.1998.0143.

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The effect of cosputtering small amounts of Ni (3%, 9%) and SbOx (20%) on the final microstructure of MoS2 lubricant thin films has been studied using a combination of scanning and transmission electron microscopy imaging, and electron and x-ray diffraction techniques. The early-growth, near-interface microstructure of both MoS2 and 3% Ni–MoS2 cosputtered films is revealed to be a mixture of (002) basal and elongated, large-size (100) and (110) edge islands. Cosputtering with 9% Ni induces a dramatic change in the microstructure, i.e., primarily basal domains with very small isolated regions of edge islands, while cosputtering with 20% SbOx produces films having no long-range order. The results are compared with and are consistent with previously published x-ray absorption fine structure data. The impact of film morphology on tribological performance is discussed.

46

Halin, Dewi Suriyani Che, Kamrosni Abdul Razak, Mohd Arif Anuar Mohd Salleh, Mohd Izrul Izwan Ramli, Mohd Mustafa Al Bakri Abdullah, Ayu Wazira Azhari, Kazuhiro Nogita, Hideyuki Yasuda, Marcin Nabiałek, and Jerzy J. Wysłocki. "Microstructure Evolution of Ag/TiO2 Thin Film." Magnetochemistry 7, no. 1 (January 16, 2021): 14. http://dx.doi.org/10.3390/magnetochemistry7010014.

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Ag/TiO2 thin films were prepared using the sol-gel spin coating method. The microstructural growth behaviors of the prepared Ag/TiO2 thin films were elucidated using real-time synchrotron radiation imaging, its structure was determined using grazing incidence X-ray diffraction (GIXRD), its morphology was imaged using the field emission scanning electron microscopy (FESEM), and its surface topography was examined using the atomic force microscope (AFM) in contact mode. The cubical shape was detected and identified as Ag, while the anatase, TiO2 thin film resembled a porous ring-like structure. It was found that each ring that coalesced and formed channels occurred at a low annealing temperature of 280 °C. The energy dispersive X-ray (EDX) result revealed a small amount of Ag presence in the Ag/TiO2 thin films. From the in-situ synchrotron radiation imaging, it was observed that as the annealing time increased, the growth of Ag/TiO2 also increased in terms of area and the number of junctions. The growth rate of Ag/TiO2 at 600 s was 47.26 µm2/s, and after 1200 s it decreased to 11.50 µm2/s and 11.55 µm2/s at 1800 s. Prolonged annealing will further decrease the growth rate to 5.94 µm2/s, 4.12 µm2/s and 4.86 µm2/s at 2400 s, 3000 s and 3600 s, respectively.

47

Ludwig, Wolfgang, Erik Mejdal Lauridsen, Soeren Schmidt, Henning Friis Poulsen, and José Baruchel. "High-resolution three-dimensional mapping of individual grains in polycrystals by topotomography." Journal of Applied Crystallography 40, no. 5 (September 5, 2007): 905–11. http://dx.doi.org/10.1107/s002188980703035x.

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By orienting a crystal grain with its diffraction vector along the sample rotation axis, it is possible to use powerful tomographic and topographic imaging techniques to reconstruct the three-dimensional grain shape inside a polycrystalline sample. The acquisition and reconstruction can be performed from projection images with the detector positioned either in the diffracted-beam or in the direct-beam position. In the first case, the projection data consist of a series of integrated, monochromatic beam X-ray diffraction topographs of the grain under investigation. In the second case, the corresponding diffraction contrast in the transmitted beam may be interpreted as an additional contribution to the X-ray attenuation coefficient of the material. This latter variant is restricted to grains with small orientation spread but offers the possibility to characterize simultaneously the three-dimensional grain shape and the absorption microstructure of the surrounding sample material. The contrast mechanism is sensitive to local strain fields and can, in certain cases, reveal details of the grain microstructure, such as the presence of second-phase inclusions. The methodology is successfully demonstrated on an aluminium polycrystal, with a resulting three-dimensional mapping accuracy better than 7 µm. The possibilities and limitations of the technique are listed and its performance relative to other three-dimensional mapping techniques is discussed.

48

Zheng, Anqi, Kuibo Yin, Rui Pan, Mingyun Zhu, Yuwei Xiong, and Litao Sun. "Research Progress on Metal–Organic Frameworks by Advanced Transmission Electron Microscopy." Nanomaterials 13, no. 11 (May 26, 2023): 1742. http://dx.doi.org/10.3390/nano13111742.

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Metal–organic frameworks (MOFs), composed of metal nodes and inorganic linkers, are promising for a wide range of applications due to their unique periodic frameworks. Understanding structure–activity relationships can facilitate the development of new MOFs. Transmission electron microscopy (TEM) is a powerful technique to characterize the microstructures of MOFs at the atomic scale. In addition, it is possible to directly visualize the microstructural evolution of MOFs in real time under working conditions via in situ TEM setups. Although MOFs are sensitive to high-energy electron beams, much progress has been made due to the development of advanced TEM. In this review, we first introduce the main damage mechanisms for MOFs under electron-beam irradiation and two strategies to minimize these damages: low-dose TEM and cryo-TEM. Then we discuss three typical techniques to analyze the microstructure of MOFs, including three-dimensional electron diffraction, imaging using direct-detection electron-counting cameras, and iDPC-STEM. Groundbreaking milestones and research advances of MOFs structures obtained with these techniques are highlighted. In situ TEM studies are reviewed to provide insights into the dynamics of MOFs induced by various stimuli. Additionally, perspectives are analyzed for promising TEM techniques in the research of MOFs’ structures.

49

Evans, Paul G., Samuel D. Marks, Stephan Geprägs, Maxim Dietlein, Yves Joly, Minyi Dai, Jiamian Hu, et al. "Resonant nanodiffraction x-ray imaging reveals role of magnetic domains in complex oxide spin caloritronics." Science Advances 6, no. 40 (October 2020): eaba9351. http://dx.doi.org/10.1126/sciadv.aba9351.

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Spin electronic devices based on crystalline oxide layers with nanoscale thicknesses involve complex structural and magnetic phenomena, including magnetic domains and the coupling of the magnetism to elastic and plastic crystallographic distortion. The magnetism of buried nanoscale layers has a substantial impact on spincaloritronic devices incorporating garnets and other oxides exhibiting the spin Seebeck effect (SSE). Synchrotron hard x-ray nanobeam diffraction techniques combine structural, elemental, and magnetic sensitivity and allow the magnetic domain configuration and structural distortion to be probed in buried layers simultaneously. Resonant scattering at the Gd L2 edge of Gd3Fe5O12 layers yields magnetic contrast with both linear and circular incident x-ray polarization. Domain patterns facet to form low-energy domain wall orientations but also are coupled to elastic features linked to epitaxial growth. Nanobeam magnetic diffraction images reveal diverse magnetic microstructure within emerging SSE materials and a strong coupling of the magnetism to crystallographic distortion.

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Góral, Anna, Marek Nowak, and Joanna Wojewoda-Budka. "Microstructure of Ni/Al₂O₃ Electrodeposited Coatings Studied with XRD and SEM Techniques." Solid State Phenomena 203-204 (June 2013): 133–36. http://dx.doi.org/10.4028/www.scientific.net/ssp.203-204.133.

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Our interests are focused on the Ni/Al2O3 nanocomposite coatings electrochemically deposited in modified Watt’s-type baths into which α-Al2O3 nanopowder is added on steel substrates. The effect of different amounts of α-Al2O3 phase in the electrolyte baths on microstructure of electrodeposited Ni/Al2O3 coatings is investigated. In order to study the coatings the non-destructive X-ray diffraction techniques are applied. As indirect techniques, they are supported by imaging methods, especially scanning electron microscopy.

Статті в журналах з теми "Diffraction Microstructure Imaging"

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