Дисертації з теми "Dielectrical properties"
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Silva, Igor. "Propriétés des matériaux isolants pour application dans les appareillages moyenne tension à tension continue." Electronic Thesis or Diss., Université Grenoble Alpes, 2024. http://www.theses.fr/2024GRALT043.
Повний текст джерелаRecent advancements in direct-current technology from the high-voltage transport and low-voltage consumption have brought medium-voltage DC (MVDC) to the forefront. This thesis delves into the insulating DC properties of two commonly used materials in distribution equipment: epoxy filled with silica and silicone rubber.In a monolayer configuration, each material underwent extensive investigation, focusing on water sorption characteristics and electrical conduction. Current measurements were conducted to analyze conduction under various fields, temperatures, and water uptake conditions. Additionally, the Laser Pressure Pulse (LIPP) method was employed for space charge measurements as a complementary technique. The study extended to a bilayer configuration, combining both materials, with insights from monolayer experiments informing the properties of the bilayer and predicting field distribution.The DC conduction in epoxy exhibited high dependence on water absorption, with moisture influencing non-linearity and altering the conduction mechanism. Conversely, silicone demonstrated electrode-limited conduction, with current variations tied to water sorption through a saturation-limited mechanism. In a hypothetical bilayer configuration, where epoxy represents a type-C bushing and silicone serves as the cable termination, the field is expected to concentrate in the epoxy in dry environments, shifting to silicone as humidity increases. The thesis concludes with discussions on material selection strategies and the design of multi-layer configurations
Hu, Chuan. "Study of the thermal properties of low k dielectric thin films /." Full text (PDF) from UMI/Dissertation Abstracts International, 2000. http://wwwlib.umi.com/cr/utexas/fullcit?p9992820.
Повний текст джерелаDuong, Danny. "The complex dielectric properties of aqueous ammonia from 2 GHz - 8.5 GHz in support of the NASA Juno mission." Thesis, Georgia Institute of Technology, 2011. http://hdl.handle.net/1853/42891.
Повний текст джерелаFarnsworth, Kimberly Dawn Richards. "Variable frequency microwave curing of polymer dielectrics." Diss., Georgia Institute of Technology, 1999. http://hdl.handle.net/1853/10928.
Повний текст джерелаPatel, Kaushal Sharad. "Technique for determining through-plane modulus of thin polymer dielectrics." Diss., Georgia Institute of Technology, 1998. http://hdl.handle.net/1853/10993.
Повний текст джерелаMoulart, Alexandre Marc. "High dielectric and conductive composites for electromagnetic crystals." Thesis, Georgia Institute of Technology, 2002. http://hdl.handle.net/1853/17092.
Повний текст джерелаManepalli, Rahul Nagaraj. "Electron beam curing of thin film polymer dielectrics." Diss., Georgia Institute of Technology, 2000. http://hdl.handle.net/1853/11036.
Повний текст джерелаTear, Gareth Richard. "Shock properties of homogeneous anisotropic dielectrics." Thesis, Imperial College London, 2016. http://hdl.handle.net/10044/1/53828.
Повний текст джерелаBoon, Dirk Francois. "The link between daily rainfall and satellite radar backscatter data from the ERS-2 scatterometer in the Free State Province, South Africa." Diss., Pretoria : [s.n.], 2007. http://upetd.up.ac.za/thesis/available/etd-10272008-132211.
Повний текст джерелаBen, ghzaiel Tayssir. "Synthèse, caractérisation et étude des propriétés magnétiques et diélectriques de nanocomposites Polyaniline/hexaferrite pour l'absorption des micro-ondes." Thesis, Université Paris-Saclay (ComUE), 2017. http://www.theses.fr/2017SACLN003/document.
Повний текст джерелаThis thesis deals with the formulation of Polyaniline/hexaferrite nanocomposite for absorbing electromagnetic waves. The main idea is the process of composite materials based on polymers intrinsic conductors such as polyaniline that we doped with different types of acids (HCl, CSA, NSA, and ... TSA) and barium hexaferrite with magnetoplumbite structure with or without substitution according to desired stoichiometries. In the barium hexaferrite, the substitution of Fe 3+ is made by Al3+, Bi3+, Cr3+ and Mn3+ ions.The barium hexaferrite and its substitutions by different ions mentioned above were synthesized dynamic hydrothermal method by varying various parameters during the synthesis (pH, temperature, time, ratio [OH-]/[NO3-] ...).The elaboration of polyaniline/hexaferrite composite (pure or substituted) was carried out by oxidative polymerization using various synthesis techniques: Aqueous-Based Polymerisation with or without agitation (taking into account the nature of the acid used) (ABP) and Solid-Based Polymerization (SBP). The optimization of these various synthesis techniques after physicochemical (XRD, FTIR, TGA, SEM, EDX), dielectric (ε ', ε' ', σdc) and magnetic (Mr, Ms, Hc, Tc, µ', µ'') characterizations of the samples showed that the solid route is the easiest method, economical and environmentally friendly. It is also suitable for the production of composite Pani/BaFe12O19 with good structural, physical and magnetic properties.The study of the substitution of Fe 3+ in the BaFe12O19 by Al3+, Bi3+, Cr3+ and Mn3+ showed a strong dependence of the structural and magnetic properties with the distribution of these ions in the hexagonal crystal lattice. In fact, Al3+, Cr3+ and Mn3+ ions tend to occupy the tetrahedral sites, while the Bi3+ favoured the octahedral sites. An increase in Hc associated with the small crystallite size observed for particles substituted with Al and Cr and the enhancement magnetocristalline anisotropy (strong higher order term) for Bi and Mn due to their high ionic radius.The incorporation of the substituted hexaferrite in the polyaniline to obtain Pani/BaMeFe11O19 composite, where Me = Al, Bi, Cr and Mn, reveals a variation in electromagnetic properties in the frequency range from 1 to 18 GHz. In fact, these variations are due to the formation of dipoles between the substituting ion and surrounding O2- cations in the ferrite which are responsible for the ferromagnetic resonance, the magnetocrystalline anisotropy and the exchange interaction with the polymer. The composite Pani/BaFe12O19 shows absorption bands at the X-band that shift to the Ku-band with the substitution of iron, confirming the potential of these materials for microwave applications
Paz, Ana Marta. "The dielectric properties of solid biofuels." Doctoral thesis, Mälardalens högskola, Akademin för hållbar samhälls- och teknikutveckling, 2010. http://urn.kb.se/resolve?urn=urn:nbn:se:mdh:diva-10500.
Повний текст джерелаHawkes, J. J. "Hydration dependent dielectric properties of proteins." Thesis, Bucks New University, 1988. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.383159.
Повний текст джерелаRaj, N. "Dielectric and magnetic properties of superlattices." Thesis, University of Essex, 1988. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.381931.
Повний текст джерелаGiatti, Brandon. "Optical Properties of Nanostructured Dielectric Coatings." PDXScholar, 2014. https://pdxscholar.library.pdx.edu/open_access_etds/1940.
Повний текст джерелаCastro, Armando Josà Neves de. "Estudo das Propriedades DielÃtricas da Matriz CerÃmica FeNbTiO6:(ZnO)x para aplicaÃÃes em Radio-FrequÃncia (RF) e Micro-ondas." Universidade Federal do CearÃ, 2014. http://www.teses.ufc.br/tde_busca/arquivo.php?codArquivo=11535.
Повний текст джерелаNealon, Thomas Anthony. "The properties of ferroelectric relaxors." Thesis, University of Oxford, 1989. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.329982.
Повний текст джерелаButcher, Steven John. "Relaxor ferroelectricity in (Pbâ†xBaâ†1â†-â†x)(Mgâ†1â†/â†3Nbâ†2â†/â†3)Oâ†3 ceramics." Thesis, University of Leeds, 1989. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.329474.
Повний текст джерелаPayton, Gerald C. "An investigation into the dielectric properties of selenium." DigitalCommons@Robert W. Woodruff Library, Atlanta University Center, 1987. http://digitalcommons.auctr.edu/dissertations/2840.
Повний текст джерелаHinedi, Mohamad Fahd 1964. "HIGH FREQUENCY DIELECTRIC PROPERTIES OF POLYIMIDES FOR MULTILAYER INTERCONNECT STRUCTURES." Thesis, The University of Arizona, 1987. http://hdl.handle.net/10150/276497.
Повний текст джерелаRajgadkar, Ajay. "Characterization of Dielectric Films for Electrowetting on Dielectric Systems." Scholar Commons, 2010. http://scholarcommons.usf.edu/etd/3607.
Повний текст джерелаHinchcliffe, Claire. "Processing and properties of nanocomposite dielectric films." Thesis, University of Oxford, 2006. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.437011.
Повний текст джерелаLisachuk, G. V., R. V. Kryvobok, Y. M. Pitak, O. Lapuzina, N. A. Kryvobok, and N. S. Maystat. "Radio-absorbing materials with adjustable dielectric properties." Thesis, Chuiko Institute of Surface Chemistry of National Academy of Sciences of Ukraine, 2018. http://repository.kpi.kharkov.ua/handle/KhPI-Press/38982.
Повний текст джерелаChung, Colin. "Dielectrophoretic investigations of internal cell properties." Thesis, University of Edinburgh, 2015. http://hdl.handle.net/1842/10044.
Повний текст джерелаHumbert, William R. "A new technique for measuring the elctromagnetic properties of rotationally symmetric materials." Diss., Georgia Institute of Technology, 1997. http://hdl.handle.net/1853/14941.
Повний текст джерелаLi, Wensheng. "Dielectric properties and defects structure of lead tungstate crystal." HKBU Institutional Repository, 2000. http://repository.hkbu.edu.hk/etd_ra/222.
Повний текст джерелаXu, Jianwen. "Dielectric Nanocomposites for High Performance Embedded Capacitors in Organic Printed Circuit Boards." Diss., Georgia Institute of Technology, 2006. http://hdl.handle.net/1853/11525.
Повний текст джерелаMiller, Stuart M. "Electrical measurement of sucrose in sugar beet." Thesis, Cranfield University, 1995. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.294156.
Повний текст джерелаCalay, Rajnish Kaur. "Electromagnetic heating processes : analysis and simulations." Thesis, Cranfield University, 1994. http://dspace.lib.cranfield.ac.uk/handle/1826/9846.
Повний текст джерелаAl, Kabsh Asma. "Optical properties and energy applications of MoS2." OpenSIUC, 2018. https://opensiuc.lib.siu.edu/dissertations/1636.
Повний текст джерелаAl-Dhhan, Z. T. "Dielectric properties of thin films based on CeO2̲." Thesis, Brunel University, 1988. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.380605.
Повний текст джерелаTseng, Jung-Kai. "Enhanced Dielectric Properties of Multilayer Capacitor Film via Interfacial Polarization." Case Western Reserve University School of Graduate Studies / OhioLINK, 2016. http://rave.ohiolink.edu/etdc/view?acc_num=case1449137228.
Повний текст джерелаHasegawa, Keisuke. "The effect of geometry and surface morphology on the optical properties of metal-dielectric systems /." Connect to title online (Scholars' Bank) Connect to title online (ProQuest), 2008. http://hdl.handle.net/1794/8581.
Повний текст джерелаTypescript. Includes vita and abstract. Includes bibliographical references (leaves 127-133). Also available online in Scholars' Bank; and in ProQuest, free to University of Oregon users.
Dutta, Saikat Swapan. "Water absorption and dielectric properties of Epoxy insulation." Thesis, Norwegian University of Science and Technology, Department of Electrical Power Engineering, 2008. http://urn.kb.se/resolve?urn=urn:nbn:no:ntnu:diva-9723.
Повний текст джерелаCharacterization of Epoxy (diglycidyl ether of Bis-phenol A cured with Tri ethylene Tetra amine) without fillers was done. The Water absorption test at 95°C shows that at saturation the epoxy contains a water concentration of 2.089%. The diffusion coefficient of absorption is calculated as 0.021 cm2/s. The diffusion coefficient of desorption is calculated as 0.0987 cm2/s. The diffusion is almost 5 times faster than absorption. Also the material looses weight as the hydrothermal aging progresses. The water in the sample leads to chain scission which leads to the weight loss. The weight loss is more incase of absorption followed by desorption than only absorption. The chain scission leads to decrease in the mechanical strength by around 45%. The diffusion of water from the samples doesnt affect the mechanical strength of the materials. The glass transition temperature reduces by 20°C with water inside the sample. The diffusion of water out of the sample only increases by around 10°C. The Dielectric response of the material shows that after the water absorption the sample shows high losses at lower frequencies. Also the increase in the real part of the permittivity increases with low frequency. The rapid increase in the real art of the permittivity of the material at lower frequencies can be attributed to a polarization at the electrode due both to accumulation of the charge carriers and to chain migrations. The breakdown test of the samples shows that with water in the sample the breakdown strength of the material decreases by 10 KV, but the material regains its dielectric strength when the water is diffused out. This shows that the chain scission and weight loss of the samples has no or minimum effect on the dielectric strength of the sample
Mallinson, Phillip Martin. "Perovskite Microwave Dielectric Ceramics: Structure, Properties and Processing." Thesis, University of Liverpool, 2007. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.490899.
Повний текст джерелаIeta, Adrian C. "Charge transfer & dielectric properties in hydrocarbon mixtures." Thesis, National Library of Canada = Bibliothèque nationale du Canada, 1999. http://www.collectionscanada.ca/obj/s4/f2/dsk2/ftp03/MQ39835.pdf.
Повний текст джерелаStevenson, Paul John. "High field dielectric properties of hard PZT ceramics." Thesis, University of Manchester, 1998. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.556653.
Повний текст джерелаFarsari, Maria. "Dielectric and optical properties of organic photorefractive materials." Thesis, Durham University, 1996. http://etheses.dur.ac.uk/5226/.
Повний текст джерелаKenmuir, S. V. J. "Dielectric properties of some oxide and oxynitride glasses." Thesis, Durham University, 1986. http://etheses.dur.ac.uk/7083/.
Повний текст джерелаWaters, Cecilia Anne. "Optical, spectroscopic and dielectric properties of metal nanoparticles." Thesis, University of Liverpool, 2006. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.433996.
Повний текст джерелаGroenewald, Nico Albert. "Measuring the dielectric properties of crushed copper ore." Thesis, Stellenbosch : University of Stellenbosch, 2010. http://hdl.handle.net/10019.1/5230.
Повний текст джерелаENGLISH ABSTRACT: Previous work has shown that microwave heating of mineral ores induces micro cracks within the ore structure, which can be attributed to the difference in the adsorption of microwaves amongst the different mineral phases. This reduces the energy required during subsequent grinding and enhances the liberation of valuable minerals. In order to design microwave applicators for this purpose, knowledge of the effective dielectric properties of the crushed ore is required. Of particular interest is the effective complex permittivity of the bulk crushed ore. The measurement of the effective permittivity of a large volume of crushed ore is most readily accomplished using the waveguide measurement technique. In this method a representative sample of the material is placed in a defined and fixed volume in a standard size rectangular section metallic waveguide. The magnitude and phase angle of the transmitted and reflected low power microwaves through and from the sample are measured. The complex permittivity can be extracted from these so-called scattering, or Sij parameters. In this study the effective complex permittivities for two porphyry copper ores and a copper carbonatite ore were determined as a function of particle size distribution (-26.5+2mm) using two sizes of waveguide (WR284 and WR340). The sample holders incorporate dielectric windows for the location of the material under test. The extraction of dielectric properties from Sij parameter measurements is problematic using standard algorithms in such cases. Accordingly a new Database Extraction (DBE) Algorithm has been developed. In this method, a database of scattering parameters is established through electromagnetic modelling of the measurement system. A search algorithm is used to determine the effective complex permittivity of the modelled load whose scattering parameters provide the best fit to the experimental data. The goodness of the experimental fit of the simulated to the measured Sij parameters is determined by a root mean squared deviation minimisation metric. Results show that the method can be used successfully to determine an effective complex permittivity for a bulk volume of the crushed material. It is concluded that the dielectric property extraction over the full operational frequency interval (2.3-3 GHz) is preferred as it has a larger degree of extraction confidence and hence reliability. Results show that with increasing particle size, the experimental fit between the simulated and measured Sij parameters becomes increasingly poor, as wall effect become more prominent. The effect is most prominent for the smaller WR284 waveguide size. It is shown that for a waveguide size of similar size to the particle size, the Sij parameter fitting is poorer compared to when a larger waveguide size is used. The extracted complex permittivity reproducibility between repeated dielectric property measurements is improved for the WR340 waveguide size, as the extractions in the WR284 waveguide is dominated by the combined particle size and wall-effects of the sample holder. Ore mineralogy is identified as a key parameter that influences the dielectric properties of the crushed ore. For ores with a dominant microwave absorbent mineral phase, the dielectric constant and loss factor is found to be larger, compared with ores with a more dominant microwave transparent gangue mineral phase.
AFRIKAANSE OPSOMMING: Navorsing toon dat die verhitting van mineraal erts, met mikrogolwe, mikroskaal frakture in die mineraalstruktuur teweeg bring weens die verskil in die adsorpsie van mikrogolwe in die verskillende mineraalfases. Gevolglik verminder die energievereiste vir die vergruising van die erts en verbeter die vrystelling van waardevolle minerale wat vasgevang is in die mineraalmatriks. Vir die ontwerp van mikrogolfapplikators vir dié doel, word die effektiewe diëlektriese eienskappe van die vergruisde erts benodig. Van spesifieke belang is die effektiewe komplekse permittiwiteit van die erts. Die effektiewe permittiwiteit van `n vergruisde materiaal monster word met behulp van die golfgeleier tegniek gemeet. Vir dié tegniek word `n verteenwoordigende monster van die materiaal in `n rigiede volume in `n standaard grootte reghoekige golfgeleier geplaas. Die grootte en fasehoek komponente van die deurgelate en weerkaatste mikrogolwe deur en van die oppervlak van die materiaal word gemeet. Die komplekse permittiwiteit van die vergruisde materiaal kan geëkstrakteer word vanaf hierdie sogenaamde verspreide, of Sij parameters. In hierdie studie word die effektiewe permitiwiteit van twee porforie koper ertse en `n koper karbonatiet erts bepaal as funksie van partikel grootte (-26.5+2 mm) deur gebruik te maak van twee standaard grootte golfgeleiers. Die monster houers inkorporeer diëlektriese vensters om die vergruisde materiaal monster in posisie te hou. In so `n geval is die ekstraksie van die diëlektriese eienskappe vanuit die Sij parameter metings problematies. Gevolglik is ‘n nuwe Databasis Ekstraksie Algoritme ontwikkel wat `n databasis van verspreide parameters opstel deur die elektromagnetiese simulasie van die metingsisteem. `n Soek-algoritme word gebruik om die effektiewe komplekse permitiwiteit van die gesimuleerde monster te bepaal wat die beste ooreenstem met dié van die gemete eksperimentele Sij parameter data. Die mate van ooreenstemming tussen die parameters, word bepaal aan die hand van die minimaliserings prosedure. Resultate toon dat dié metode geskik is vir die bepaling van die effektiewe komplekse permitiwiteit van die vergruisde monster. Dit word vasgestel dat die betroubaarheid van die geëkstraeerde Sij parameters, en gevolglik die diëlektriese eienskappe van die erts, toeneem indien die algoritme oor `n groter frekwensie band uitgevoer word. Resultate toon verder dat met toenemende partikel grootte, die mate waartoe die absolute grootte en fasehoek komponente van die gesimuleerde en gemete Sij parameters ooreenstem, versleg. Dit word toegeskryf aan wand-effekte. Hierdie verskynsel is veral opmerklik vir die kleiner grootte golfgeleier. Dit word getoon dat vir metings waar die golfgeleier dieselfde orde grootte geometriese afmetings het as die vergruisde erts self, die passing tussen die gesimuleerde en gemete Sij parameters swakker is, wanneer dit vergelyk word met metings waar dit nie die geval is nie. Die reproduseerbaarheid van die geëkstraeerde diëlektriese eienskap waardes verbeter vir lesings wat uitgevoer word in `n groter grootte golfgeleier. Laasgenoemde word toegeskryf aan die meer dominante wand-effekte wat kenmerklik is vir `n kleiner golfgeleier. Erts mineralogie word geïdentifiseer as `n sleutel parameter wat die diëlektriese eienskappe van die vergruisde materiaal beïnvloed. Beide die diëlektriese konstante en verliesfaktor is groter vir ertse met `n oorheersende mikrogolf absorberende mineraalfase.
Ayoob, Raed. "Dielectric properties of hexagonal boron nitride polymer nanocomposites." Thesis, University of Southampton, 2017. https://eprints.soton.ac.uk/417272/.
Повний текст джерелаLiu, Huijin. "The elastic and dielectric properties of structural ceramics." Thesis, University of Bath, 1999. https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.285312.
Повний текст джерелаAbbas, Zulkifly. "Determination of the dielectric properties of materials at microwave frequencies using rectangular dielectric waveguide." Thesis, University of Leeds, 2000. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.569541.
Повний текст джерелаBorthakur, Swarnal Ho P. S. "The effects of post-ash cleaning and chemical treatments on the dielectric properties and reliability of Cu/low-k interconnect structures." 2005. http://repositories.lib.utexas.edu/bitstream/handle/2152/1826/borthakurs44073.pdf.
Повний текст джерелаBorthakur, Swarnal. "The effects of post-ash cleaning and chemical treatments on the dielectric properties and reliability of Cu/low-k interconnect structures." Thesis, 2005. http://hdl.handle.net/2152/1826.
Повний текст джерелаJayanthi, S. "Dielectric Titanate Ceramics : Contributions From Uncommon Substituents And Microstructural Modifications." Thesis, 2006. https://etd.iisc.ac.in/handle/2005/392.
Повний текст джерелаJayanthi, S. "Dielectric Titanate Ceramics : Contributions From Uncommon Substituents And Microstructural Modifications." Thesis, 2006. http://hdl.handle.net/2005/392.
Повний текст джерелаSheu, Jeng-Dong, and 許正東. "A Study of the Properties of Plasma-Deposited Fluorine-Doped SiO2 for Low Dielectric Constant Interlevel Dielectrics." Thesis, 1996. http://ndltd.ncl.edu.tw/handle/18848492960420935220.
Повний текст джерела國立交通大學
電子研究所
84
We have studied the properties of fluorine-doped silicon dioxide (SiOF)deposited by adding CF4 to conventional tetraethylorthosilicate(TEOS)-basedplasma-enhanced chemical vapor deposition (PECVD). Dielectric constants of SiOF films are reduced from 3.8 to 3.2 by the addition of CF4. Si-F bond formation in the films is detected by chemical bonding structural studies using Fourier Transform Infrared Spectroscopy (FTIR). Low dielectric constants are caused by Si-F bond formation. The reduction of the dielectric constant apparently results from a decrease of the ionic polarization. As thefluorine content increases, the SiOF films becomes more unstable to moistureabsorption. The moisture absorption of SiOF with high fluorine content are caused by the porosity and formation of Si-F2 in the films. The thermal stability of SiOF films is investigated by rapid thermal annealing (RTA). The fluorine contents of SiOF films decrease with increasing RTA temperature.However, the dielectric constants of the SiOF films remain the same up to 600C under low moisture absorption condition. Atomic force microscopic(AFM)pictures reveal the densification and the reduction in surface roughness ofSiOF films after RTA treatments. In order to stabilize dielectric constants of SiOF films which increase with the increase of moisture absorption, a surface oxynitridation is required. We find that N2O-plasma annealing in an effective way to block moisture. The dielectric constants of SiOF films treated by the N2O-plasma annealing rarely change.
"Studies on thermal stabilities of transparent dielectrics/ZnO heterostructures." 2007. http://library.cuhk.edu.hk/record=b5893211.
Повний текст джерелаThesis (M.Phil.)--Chinese University of Hong Kong, 2007.
Includes bibliographical references (leaves 130-134).
Abstracts in English and Chinese.
Wang, Ranshi = Tou ming dian jie zhi/yang hua xin yi zhi jie re wen ding xing de yan jiu / Wang Ranshi.
Chapter I. --- Abstract
Chapter II. --- Acknowledgement
Chapter III. --- Table of contents
Chapter IV. --- List of figures
Chapter V. --- List of tables
Chapter 1 --- Introduction
Chapter 1.1 --- Motivations
Chapter 1.2 --- Outline of thesis
Chapter 2 --- Experimental Conditions and Techniques Used
Chapter 2.1 --- Sample preparation
Chapter 2.1.1 --- Radio frequency magnetic sputtering
Chapter 2.1.2 --- ITO glass
Chapter 2.1.3 --- Thermal evaporation
Chapter 2.1.4 --- Thermal annealing
Chapter 2.2 --- Optical characterization of ZnO
Chapter 2.2.1 --- Photoluminescence (PL) measurement
Chapter 2.2.2 --- SEM and cathodoluminescence spectroscopy
Chapter 2.3 --- Time-of-FIight Secondary Ion Mass Spectroscopy (TOF-SIMS )
Chapter 2.4 --- Electrical measurements
Chapter 3 --- Calibrations
Chapter 3.1 --- Sample Thickness
Chapter 3.2 --- Calibrations of cathodeluminescence measurements
Chapter 3.2.1 --- Probe current and specimen current
Chapter 3.2.2 --- Sample uniformity in CL measurement
Chapter 3.2.3 --- Mirror position
Chapter 3.2.4 --- Non-linear relation between CL emission and current
Chapter 3.2.5 --- CL band-edge emission stability
Chapter 3.2.6 --- Effect of magnification
Chapter 3.2.7 --- Effect of electron beam shift
Chapter 3.2.8 --- Conclusions
Chapter 3.3 --- C-V measurement
Chapter 4 --- Experimental Results and Data Analysis
Chapter 4.1 --- Optical properties
Chapter 4.1.1 --- Luminescence of ZnO
Chapter 4.1.2 --- Light emitting thermal stability of A10x (MgO) capped ZnO film
Chapter 4.1.2.1 --- Emission degradations in annealing treatment by PL
Chapter 4.1.2.2 --- Evidence about the interface degradation
Chapter 4.1.2.3 --- CL studies of the emission from sample surface
Chapter 4.2 --- Secondary Ion Mass Spectroscopy (SIMS) studies of AIOx-capped ZnO
Chapter 4.2.1 --- Data processing
Chapter 4.2.2 --- Diffusion width
Chapter 4.3 --- Simulation of Zn out diffusion to the dielectric layer
Chapter 4.3.1 --- Structure and assumptions
Chapter 4.3.2 --- Calculations of diffusion by Fick's Law
Chapter 4.3.3 --- Simulation of PL reduction from diffusion
Chapter 4.3.4 --- Short-time PL
Chapter 4.4 --- Simulation of defects generation in emission reduction process
Chapter 4.4.1 --- Some calculations of continuity equation
Chapter 4.4.2 --- First order equation for defect generation
Chapter 4.5 --- Electrical measurements
Chapter 4.5.1 --- Theory of C-V measurement for MOS structure
Chapter 4.5.1.1 --- MOS Structure
Chapter 4.5.1.2 --- Discussions about surface charge and energy level in C-V experiments of MOS
Chapter 4.5.1.3 --- Useful formulations
Chapter 4.5.2 --- Experimental results of C-V and parameter extraction
Chapter 4.5.2.1 --- Effect of series resistance correction
Chapter 4.5.2.2 --- Effect of thermal annealing to C-V curves on dielectric/ZnO/ITO
Chapter 4.5.2.3 --- Doping concentration (ND)
Chapter 4.5.2.4 --- Discussion about the fixed and mobile charge
Chapter 4.5.3 --- Simulation of C-V relation in dielectric/ZnO
Chapter 4.5.4 --- Current-voltage (I-V) measurements
Chapter 4.5.5 --- Conductance-voltage measurements (G-V) and interface trap density
Chapter 4.5.6 --- DLTS measurements for extracting interface trap density
Chapter 5 --- Discussions and Conclusion
Chapter 5.1 --- Mechanism
Chapter 5.2 --- Conclusions
Chapter 5.3 --- Future plan
Chapter 6 --- References
"Dielectric microspheres as optical cavities." Chinese University of Hong Kong, 1988. http://library.cuhk.edu.hk/record=b5885964.
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