Статті в журналах з теми "Dielectric breakdown in Mott insulators"
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Eckstein, Martin, and Philipp Werner. "Dielectric breakdown of Mott insulators – doublon production and doublon heating." Journal of Physics: Conference Series 427 (March 27, 2013): 012005. http://dx.doi.org/10.1088/1742-6596/427/1/012005.
Повний текст джерелаSchilirò, Emanuela, Raffaella Lo Nigro, Fabrizio Roccaforte, and Filippo Giannazzo. "Recent Advances in Seeded and Seed-Layer-Free Atomic Layer Deposition of High-K Dielectrics on Graphene for Electronics." C — Journal of Carbon Research 5, no. 3 (September 2, 2019): 53. http://dx.doi.org/10.3390/c5030053.
Повний текст джерелаJunge, Paul, Moritz Greinacher, Delf Kober, Patrick Stargardt, and Christian Rupprecht. "Metastable Phase Formation, Microstructure, and Dielectric Properties in Plasma-Sprayed Alumina Ceramic Coatings." Coatings 12, no. 12 (November 29, 2022): 1847. http://dx.doi.org/10.3390/coatings12121847.
Повний текст джерелаRosch, A. "Breakdown of Luttinger's theorem in two-orbital Mott insulators." European Physical Journal B 59, no. 4 (October 2007): 495–502. http://dx.doi.org/10.1140/epjb/e2007-00312-3.
Повний текст джерелаTaguchi, Y., T. Matsumoto, and Y. Tokura. "Dielectric breakdown of one-dimensional Mott insulatorsSr2CuO3andSrCuO2." Physical Review B 62, no. 11 (September 15, 2000): 7015–18. http://dx.doi.org/10.1103/physrevb.62.7015.
Повний текст джерелаYamakawa, H., T. Miyamoto, T. Morimoto, T. Terashige, H. Yada, N. Kida, M. Suda, et al. "Mott transition by an impulsive dielectric breakdown." Nature Materials 16, no. 11 (August 21, 2017): 1100–1105. http://dx.doi.org/10.1038/nmat4967.
Повний текст джерелаKumagai, Shohei, Hiroaki Iguchi, Masahiro Yamashita, and Shinya Takaishi. "Thermally induced electron–hole dissociation dynamics in quasi-one-dimensional bromo-bridged palladium(iii) Mott-insulator [Pd(en)2Br](Suc-Cn)2·H2O (Cn-Y = dialkylsulfosuccinate; n = 5 and 6)." Physical Chemistry Chemical Physics 24, no. 13 (2022): 7978–82. http://dx.doi.org/10.1039/d2cp00051b.
Повний текст джерелаTerasaki, I., T. Takayanagi, M. Kogure, and T. Mizuno. "Out-of-plane dielectric response of the two-dimensional Mott insulators." Physica C: Superconductivity 357-360 (September 2001): 96–98. http://dx.doi.org/10.1016/s0921-4534(01)00174-5.
Повний текст джерелаAbou-Kandil, Ahmed I., Loai Nasrat, and EmanL Fareed. "High temperature vulcanized ethylene propylene diene rubber nanocomposites as high voltage insulators: Dielectric breakdown measurements and evaluation." Polymers and Polymer Composites 30 (January 2022): 096739112211325. http://dx.doi.org/10.1177/09673911221132593.
Повний текст джерелаFuertes, V., M. J. Cabrera, J. Seores, D. Muñoz, J. F. Fernández, and E. Enríquez. "Microstructural study of dielectric breakdown in glass-ceramics insulators." Journal of the European Ceramic Society 39, no. 2-3 (February 2019): 376–83. http://dx.doi.org/10.1016/j.jeurceramsoc.2018.08.044.
Повний текст джерелаKim, Taeyong, Simpy Sanyal, Seongho Jeon, and Junsin Yi. "Prediction of Dielectric Breakdown of OHTL Insulators Using Contact Angle Measurements." ECS Journal of Solid State Science and Technology 10, no. 12 (December 1, 2021): 123010. http://dx.doi.org/10.1149/2162-8777/ac3ff6.
Повний текст джерелаZulkifeli, M. A., S. N. Sabki, S. Taking, N. A. Azmi, and S. S. Jamuar. "The Effect of Different Dielectric Materials in Designing High-Performance Metal-Insulator-Metal (MIM) Capacitors." International Journal of Electrical and Computer Engineering (IJECE) 7, no. 3 (June 1, 2017): 1554. http://dx.doi.org/10.11591/ijece.v7i3.pp1554-1561.
Повний текст джерелаKolodzey, J., E. A. Chowdhury, T. N. Adam, Guohua Qui, I. Rau, J. O. Olowolafe, J. S. Suehle, and Yuan Chen. "Electrical conduction and dielectric breakdown in aluminum oxide insulators on silicon." IEEE Transactions on Electron Devices 47, no. 1 (2000): 121–28. http://dx.doi.org/10.1109/16.817577.
Повний текст джерелаCorraze, B., E. Janod, L. Cario, P. Moreau, L. Lajaunie, P. Stoliar, V. Guiot, et al. "Electric field induced avalanche breakdown and non-volatile resistive switching in the Mott Insulators AM4Q8." European Physical Journal Special Topics 222, no. 5 (July 2013): 1046–56. http://dx.doi.org/10.1140/epjst/e2013-01905-1.
Повний текст джерелаSohail, Muhammad, Salman Amin, Yasir Butt, and Muhammad Bin Zubaid Ramay. "Aging Performance of Low-Density Polyethylene/Silicone Rubber Blends Insulators Under Contaminated Conditions." Pakistan Journal of Engineering and Technology 5, no. 1 (March 10, 2022): 29–34. http://dx.doi.org/10.51846/vol5iss1pp29-34.
Повний текст джерелаLockwitz, S., and H. Jostlein. "A study of dielectric breakdown along insulators surrounding conductors in liquid argon." Journal of Instrumentation 11, no. 03 (March 22, 2016): P03026. http://dx.doi.org/10.1088/1748-0221/11/03/p03026.
Повний текст джерелаTanaka, Yasuhiro, and Kenji Yonemitsu. "Current-voltage characteristics and breakdown mechanism in one-dimensional band and mott insulators attached to electrodes." Journal of the Korean Physical Society 62, no. 12 (June 2013): 2164–67. http://dx.doi.org/10.3938/jkps.62.2164.
Повний текст джерелаUGAJIN, R., S. HIRATA, and Y. MORI. "FERROMAGNETIC AND MOTT TRANSITIONS MODULATED BY VARYING FRACTAL DIMENSIONS IN FRACTAL–SHAPED NANOSTRUCTURES." International Journal of Modern Physics B 15, no. 14 (June 10, 2001): 2025–44. http://dx.doi.org/10.1142/s0217979201006550.
Повний текст джерелаMorita, Kenji, Hiroshi Nozaki, and Kisato Tone. "The Dielectric Breakdown Mechanism of Suspension Insulators due to the Steep Impulse Voltage." IEEJ Transactions on Power and Energy 116, no. 11 (1996): 1415–21. http://dx.doi.org/10.1541/ieejpes1990.116.11_1415.
Повний текст джерелаNeusel, C., H. Jelitto, and G. A. Schneider. "Electrical conduction mechanism in bulk ceramic insulators at high voltages until dielectric breakdown." Journal of Applied Physics 117, no. 15 (April 21, 2015): 154902. http://dx.doi.org/10.1063/1.4917208.
Повний текст джерелаLefort Borges, Cícero, and Manuel Luís Barreira Martinez. "Using radio frequency and ultrasonic antennas for inspecting pin-type insulators on medium-voltage overhead distribution lines." Ingeniería e Investigación 33, no. 2 (May 1, 2013): 63–69. http://dx.doi.org/10.15446/ing.investig.v33n2.39519.
Повний текст джерелаNeff, H., A. N. Lima, E. K. Melcher, C. Moreira, A. S. Barreto Neto, and J. Precker. "An electro-thermal approach to dielectric breakdown in solids: application to crystalline polymer insulators." IEEE Transactions on Dielectrics and Electrical Insulation 17, no. 3 (June 2010): 872–80. http://dx.doi.org/10.1109/tdei.2010.5492261.
Повний текст джерелаSUÑE, JORDI, DAVID JIMENEZ, and ENRIQUE MIRANDA. "BREAKDOWN MODES AND BREAKDOWN STATISTICS OF ULTRATHIN SiO2 GATE OXIDES." International Journal of High Speed Electronics and Systems 11, no. 03 (September 2001): 789–848. http://dx.doi.org/10.1142/s0129156401001003.
Повний текст джерелаKhan, Saadat Ullah, Muhammad Rafiq, and Kashif Imdad. "Temporal Effects of Thermal Stresses on Solid Dielectric Materials under Diverse Voltage Conditions." Pakistan Journal of Engineering and Technology 5, no. 2 (June 15, 2022): 11–16. http://dx.doi.org/10.51846/vol5iss2pp11-15.
Повний текст джерелаNesenyuk, T. A. "TESTING OF PROTOTYPE SIGNALING DEVICES FOR INSULATOR CONTROL." World of Transport and Transportation 16, no. 3 (June 28, 2018): 36–49. http://dx.doi.org/10.30932/1992-3252-2018-16-3-4.
Повний текст джерелаStark, S. "On the size dependence of the dielectric breakdown strength of solid insulators at room temperature." Journal of the European Ceramic Society 42, no. 2 (February 2022): 462–71. http://dx.doi.org/10.1016/j.jeurceramsoc.2021.10.023.
Повний текст джерелаYoneda, Kenji, Yoshihiro Todokoro, and Morio Inoue. "Thin silicon dioxide and nitrided oxide using rapid thermal processing for trench capacitors." Journal of Materials Research 6, no. 11 (November 1991): 2362–70. http://dx.doi.org/10.1557/jmr.1991.2362.
Повний текст джерелаMitrovic, Ivona Z., Harry Finch, Leanne A. H. Jones, Vinod R. Dhanak, Adrian N. Hannah, Reza Valizadeh, Arne Benjamin B. Renz, Vishal Ajit Shah, Peter Michael Gammon, and P. A. Mawby. "(Invited) Rare Earth Oxides on Wide Band Gap Semiconductors." ECS Meeting Abstracts MA2022-01, no. 19 (July 7, 2022): 1072. http://dx.doi.org/10.1149/ma2022-01191072mtgabs.
Повний текст джерелаCajetan, Okolo Chidiebere, Ezechukwu O.A., Olisakwe C.O., Ezendokwelu C.E., and Umunna Chike. "CHARACTERIZATION OF ELECTRICAL PORCELAIN INSULATORS FROM LOCAL CLAYS." International Journal of Research -GRANTHAALAYAH 3, no. 1 (January 31, 2015): 26–36. http://dx.doi.org/10.29121/granthaalayah.v3.i1.2015.3050.
Повний текст джерелаMitra, Kalyan Yoti, Enrico Sowade, Christoph Sternkiker, Carme Martínez-Domingo, Eloi Ramon, Jordi Carrabina, and Reinhard R. Baumann. "Investigation on Electrical Stress over Metal-Insulator-Metal (MIM) Structures Based on Compound Dielectrics for the Inkjet-Printed OTFT Stability." Applied Mechanics and Materials 748 (April 2015): 129–33. http://dx.doi.org/10.4028/www.scientific.net/amm.748.129.
Повний текст джерелаLima, A. M. N., A. G. S. Barreto Neto, E. U. K. Melcher, and H. Neff. "Refined dielectric breakdown model for crystalline organic insulators: electro-thermal instability coupled to interband impact ionization." IEEE Transactions on Dielectrics and Electrical Insulation 18, no. 4 (August 2011): 1038–45. http://dx.doi.org/10.1109/tdei.2011.5976093.
Повний текст джерелаZhang, Jianwei, Hongguang Wang, Yongdong Li, Chunliang Liu, Wei Luo, and Jiawei Zhang. "Evolution of vacuum surface flashover for angled dielectric insulators with particle-in-cell simulation." Physics of Plasmas 29, no. 4 (April 2022): 043506. http://dx.doi.org/10.1063/5.0082530.
Повний текст джерелаKovalchuk, N. S., A. A. Omelchenko, V. A. Pilipenko, V. A. Solodukha, S. V. Demidovich, V. V. Kolos, V. A. Filipenia, and D. V. Shestovski. "Research of Electrophysical Properties of Thin Gate Dielectrics Obtained by Rapid Thermal Processing Method." Doklady BGUIR 20, no. 4 (June 29, 2022): 44–52. http://dx.doi.org/10.35596/1729-7648-2022-20-4-44-52.
Повний текст джерелаMuangpratoom, Pichai, Issaraporn Khonchaiyaphum, and Wanwilai Vittayakorn. "Improvement of the Electrical Performance of Outdoor Porcelain Insulators by Utilization of a Novel Nano-TiO2 Coating for Application in Railway Electrification Systems." Energies 16, no. 1 (January 3, 2023): 561. http://dx.doi.org/10.3390/en16010561.
Повний текст джерелаWajanasoonthon, Kanin, and Amnart Suksri. "Long Term Thermal Performance of Palm Oil and Nano Graphene Filler in Nanofluids Application on Transformer Insulating Oil and Electrical Breakdown Voltage." Key Engineering Materials 931 (September 9, 2022): 9–15. http://dx.doi.org/10.4028/p-bhz05b.
Повний текст джерелаGolovko, Sergey Vladimirovich, and Julia Aleksandrovna Golovko. "Software and hardware complex based on technical vision for diagnosing electrical insulators." Vestnik of Astrakhan State Technical University. Series: Management, computer science and informatics 2022, no. 3 (July 29, 2022): 30–37. http://dx.doi.org/10.24143/2072-9502-2022-3-30-37.
Повний текст джерелаSe-Ondoua, MuD Malec, N. Zebouchi, and Hoang-The-Giam. "Study of space charge effect on dielectric DC breakdown of synthetic insulators with the pressure wave propagation method." Journal of Electrostatics 40-41 (June 1997): 355–61. http://dx.doi.org/10.1016/s0304-3886(97)00070-3.
Повний текст джерелаZheng, Jianjun, Shaojian He, Jiaqi Wang, Wenxuan Fang, Yang Xue, Liming Xie, and Jun Lin. "Performance of Silicone Rubber Composites Filled with Aluminum Nitride and Alumina Tri-Hydrate." Materials 13, no. 11 (May 29, 2020): 2489. http://dx.doi.org/10.3390/ma13112489.
Повний текст джерелаEckstein, J. N., I. Bozovic, and G. F. Virshup. "Atomic Layer-by-Layer Engineering of High Tc Materials and Heterostructure Devices." MRS Bulletin 19, no. 9 (September 1994): 44–50. http://dx.doi.org/10.1557/s0883769400047989.
Повний текст джерелаMukherjee, Kalparupa, Carlo De Santi, Matteo Borga, Shuzhen You, Karen Geens, Benoit Bakeroot, Stefaan Decoutere, Gaudenzio Meneghesso, Enrico Zanoni, and Matteo Meneghini. "Use of Bilayer Gate Insulator in GaN-on-Si Vertical Trench MOSFETs: Impact on Performance and Reliability." Materials 13, no. 21 (October 23, 2020): 4740. http://dx.doi.org/10.3390/ma13214740.
Повний текст джерелаLiu, Chang, Yiwen Xu, Daoguang Bi, Bing Luo, Fuzeng Zhang, Tingting Wang, Yingbang Yao, Shengguo Lu, and Wenrong Xu. "The Effects of Aluminum-Nitride Nano-Fillers on the Mechanical, Electrical, and Thermal Properties of High Temperature Vulcanized Silicon Rubber for High-Voltage Outdoor Insulator Applications." Materials 12, no. 21 (October 30, 2019): 3562. http://dx.doi.org/10.3390/ma12213562.
Повний текст джерелаLucchini, Francesco, Nicolò Marconato, and Paolo Bettini. "Automatic Optimization of Gas Insulated Components Based on the Streamer Inception Criterion." Electronics 10, no. 18 (September 17, 2021): 2280. http://dx.doi.org/10.3390/electronics10182280.
Повний текст джерелаKannan, V. C. "Fresnel fringe contrast in the TEM: Application to study the microstructure of amorphous silicon." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 1000–1001. http://dx.doi.org/10.1017/s0424820100089317.
Повний текст джерелаXayyavong, Mingkhouan, Kittipong Tonmitr, Norrawit Tonmitr, and Eiji Kaneko. "The Scrutiny of the Insulation Breakdown Strength for the Nanocomposite Oxide Doped Epoxy Resin Insulator with Different Electrodes by Using Positive Impulse Voltage." Key Engineering Materials 705 (August 2016): 63–67. http://dx.doi.org/10.4028/www.scientific.net/kem.705.63.
Повний текст джерелаLiu, Yunpeng, Wanxian Wang, Hechen Liu, Mingjia Zhang, Jie Liu, and Junwei Qi. "Blending Modification of Alicyclic Resin and Bisphenol A Epoxy Resin to Enhance Salt Aging Resistance for Composite Core Rods." Polymers 14, no. 12 (June 13, 2022): 2394. http://dx.doi.org/10.3390/polym14122394.
Повний текст джерелаPinterić, M., T. Ivek, M. Čulo, O. Milat, M. Basletić, B. Korin-Hamzić, E. Tafra, A. Hamzić, M. Dressel та S. Tomić. "What is the origin of anomalous dielectric response in 2D organic dimer Mott insulators κ-(BEDT-TTF)2Cu[N(CN)2]Cl and κ-(BEDT-TTF)2Cu2(CN)3". Physica B: Condensed Matter 460 (березень 2015): 202–7. http://dx.doi.org/10.1016/j.physb.2014.11.071.
Повний текст джерелаRenz, Arne Benjamin Benjamin, Oliver J. Vavasour, Peter Michael Gammon, Fan Li, Tianxiang Dai, Guy W. C. Baker, Nicholas E. Grant, et al. "(Invited, Digital Presentation) Improved Reliability of 4H-SiC Metal-Oxide-Semiconductor Devices Utilising Atomic Layer Deposited Layers with Enhanced Interface Quality." ECS Meeting Abstracts MA2022-01, no. 19 (July 7, 2022): 1065. http://dx.doi.org/10.1149/ma2022-01191065mtgabs.
Повний текст джерелаRashid, Arooj, Jawad Saleem, Muhammad Amin, and Sahibzada Muhammad Ali. "Long-term aging characteristics of co-filled nano-silica and micro-ATH in HTV silicone rubber composite insulators." Polymers and Polymer Composites 29, no. 1 (January 26, 2020): 40–56. http://dx.doi.org/10.1177/0967391120901421.
Повний текст джерелаRaicevic, Nebojsa B., and Nikola Raicevic. "Reducing the impact of ELF electromagnetic fields of HV power cables on the environment by modeling the cable accessories." COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering 34, no. 4 (July 6, 2015): 1016–28. http://dx.doi.org/10.1108/compel-10-2014-0251.
Повний текст джерелаSchadler, Linda S., Wei Chen, L. Catherine Brinson, Ravishankar Sundararaman, Prajakta Prabhune, and Akshay Iyer. "(Invited) Combining Machine Learning, DFT, EFM, and Modeling to Design Nanodielectric Behavior." ECS Meeting Abstracts MA2022-01, no. 19 (July 7, 2022): 1068. http://dx.doi.org/10.1149/ma2022-01191068mtgabs.
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