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Статті в журналах з теми "Defects - Single Crystalline Oxides"
Wittkämper, Florian, André Bikowski, Klaus Ellmer, Konrad Gärtner, and Elke Wendler. "Energy-Dependent RBS Channelling Analysis of Epitaxial ZnO Layers Grown on ZnO by RF-Magnetron Sputtering." Crystals 9, no. 6 (June 4, 2019): 290. http://dx.doi.org/10.3390/cryst9060290.
Повний текст джерелаTrimble, L. E., G. K. Celler, D. G. Schimmel, C. Y. Lu, S. Nakahara, and P. M. Fauchet. "The nature of residual stress, defects, and device characteristics for thick single-crystalline Si films on oxidized Si wafers." Journal of Materials Research 3, no. 3 (June 1988): 514–20. http://dx.doi.org/10.1557/jmr.1988.0514.
Повний текст джерелаWang, Z. L., Z. W. Pan, and Z. R. Dai. "Structures of Oxide Nanobelts and Nanowires." Microscopy and Microanalysis 8, no. 6 (December 2002): 467–74. http://dx.doi.org/10.1017/s1431927602010383.
Повний текст джерелаNandanapalli, Koteeswara Reddy, Devika Mudusu, and Sungwon Lee. "Defects-free single-crystalline zinc oxide nanostructures for efficient photoelectrochemical solar hydrogen generation." International Journal of Hydrogen Energy 45, no. 51 (October 2020): 27279–90. http://dx.doi.org/10.1016/j.ijhydene.2020.07.138.
Повний текст джерелаLocke, Christopher, Christopher L. Frewin, Jing Wang, and Stephen E. Saddow. "Growth of Single Crystal 3C-SiC(111) on a Poly-Si Seed Layer." Materials Science Forum 615-617 (March 2009): 157–60. http://dx.doi.org/10.4028/www.scientific.net/msf.615-617.157.
Повний текст джерелаWHITFIELD, PAMELA, and LYNDON MITCHELL. "X-RAY DIFFRACTION ANALYSIS OF NANOPARTICLES: RECENT DEVELOPMENTS, POTENTIAL PROBLEMS AND SOME SOLUTIONS." International Journal of Nanoscience 03, no. 06 (December 2004): 757–63. http://dx.doi.org/10.1142/s0219581x04002620.
Повний текст джерелаNyborg, M., Ilia Kolevatov, G. C. Vásquez, K. Bergum, and E. Monakhov. "Dominant defects and carrier transport in single crystalline cuprous oxide: A new attribution of optical transitions." Journal of Applied Physics 130, no. 17 (November 7, 2021): 175701. http://dx.doi.org/10.1063/5.0059406.
Повний текст джерелаLitovchenko, V. G., I. P. Lisovskyy, M. Voitovych, Andrey V. Sarikov, S. O. Zlobin, V. P. Kladko, and V. Machulin. "Study of the Mechanisms of Oxygen Precipitation in RTA Annealed Cz-Si Wafers." Solid State Phenomena 156-158 (October 2009): 279–82. http://dx.doi.org/10.4028/www.scientific.net/ssp.156-158.279.
Повний текст джерелаWebb, Matthew, Tao Ma, Allen H. Hunter, Sean McSherry, Jonathan Kaufman, Zihao Deng, William B. Carter, et al. "Geometric defects induced by strain relaxation in thin film oxide superlattices." Journal of Applied Physics 132, no. 18 (November 14, 2022): 185307. http://dx.doi.org/10.1063/5.0120176.
Повний текст джерелаMurshed, M. Mangir, Pei Zhao, Evgeny Alekseev, Ashfia Huq, and Thorsten Gesing. "Lattice thermal expansion of complex oxides with intrinsic anharmonicity." Acta Crystallographica Section A Foundations and Advances 70, a1 (August 5, 2014): C161. http://dx.doi.org/10.1107/s2053273314098386.
Повний текст джерелаДисертації з теми "Defects - Single Crystalline Oxides"
Dicks, Oliver A. "Computational modelling of defects and charge trapping in amorphous and crystalline metal oxides." Thesis, University College London (University of London), 2018. http://discovery.ucl.ac.uk/10044113/.
Повний текст джерелаPark, Seung Chul. "Study of optical properties of multi-crystalline Si and of heavily dislocated single-crystalline Si." Thesis, King's College London (University of London), 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.314286.
Повний текст джерелаKokkaliaris, Stylianos. "Investigation of the vortex phase diagram and dynamics in single crystalline samples of the high temperature superconductor YBaâ†2Cuâ†3Oâ†7â†-â†#delta#." Thesis, University of Southampton, 2000. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.310294.
Повний текст джерелаBotura, Valdenir Aparecido. "Estudo de defeitos estruturais e dos fenômenos plásticos/frágeis em monocristais óxidos." Universidade de São Paulo, 1990. http://www.teses.usp.br/teses/disponiveis/54/54132/tde-13122013-150508/.
Повний текст джерелаWe used etching and microindentation techniques to study the structural defects, microplasticity and microhardness in Bi-Sr-Ca-Cu-O and LiNbO3 single crystals. To revel structural defects in Bi-Sr-Ca-Cu-O crystals was developed a suitable solution of HNO3 in the ratio 1:30. The results obtained showed that there are patterns of structural defects as dislocations, terraceds and bunches in these compounds. We also did an attempt to identify the actual compositions of these compounds using optical microscopy, x-ray diffraction, Laue pattern, X-ray fluorescence, resistivity, microhardness and etching techniques. In LiNbO3 single crystals we analyzed the dislocations distributions around the plastic deformations produced by indentation experiments. The behavior plastic/fragile in LiNbO3 crystals were studied on three different perpendicular directions: to the Z-axis, to the 128 and to the (01.0). Some of these results, as the structural defects revelation and the microhardness in Bi-Sr-Ca-Cu-O compounds as well, were obtained at the first time. Also, unusual fragile behavior isotropic of LiNbO3 grown in our laboratory was found
Hachet, Guillaume. "Multi-scale investigation of the consequences of hydrogen on the mechanical response of cyclically strained nickel single crystal." Thesis, La Rochelle, 2018. http://www.theses.fr/2018LAROS022/document.
Повний текст джерелаHydrogen in metals can lead to irreversible damages on engineering structures. Consequently, the effects of the solute on the mechanical properties and the plasticity mechanisms of these materials have to be clarified. The proposed study consists to investigate the effects of hydrogen on the mechanical response of nickel single crystal strained by fatigue from macroscopic scale down to the atomic scale. At macroscopic scale, cyclic tests are conducted on multi-slip oriented nickel with several hydrogen concentrations to evaluate its consequences on the cyclic hardening of the metal. Then, a microstructural characterisation of the heterogeneities developed by fatigue is conducted for several plastic deformation amplitudes on nickel with and without hydrogen. The deformation of the metal induces a microstructure in form of wall and channel phases, which partially depend on the elastic interactions between the stress state, hydrogen and the induced crystalline defects. Therefore, the impact of hydrogen of the elastic properties of nickel single crystal is investigated using atomic scale calculations and experiments. Further calculations at this length scale associated with analytical elastic models are conducted to evaluate the stability of fatigue induced dislocation structures in presence of the solute, vacancies and vacancy clusters. The main conclusions of this study arise from the analysis of the results obtained from macroscopic scale down to the atomic scale and from the combination of both numerical and experimental techniques. In particular, the incorporation of hydrogen leads to a hardening of the nickel intrinsically. However, the formation of vacancies and vacancy clusters by the incorporation of hydrogen counteracts the effects of the solute and participates in the competition between the softening and the hardening of cyclically strained nickel single crystal observed at macroscopic scale
Fanchon, Eric. "Etude structurale de conducteurs ioniques unidimensionnels de type hollandite." Grenoble 2 : ANRT, 1987. http://catalogue.bnf.fr/ark:/12148/cb37604938h.
Повний текст джерелаHung, Wei-Jie, and 洪偉傑. "Fabrication of Transparent Conductive Oxides for Single-Crystalline n-type Silicon Hetero-Junction Solar Cells." Thesis, 2010. http://ndltd.ncl.edu.tw/handle/50732695248536570600.
Повний текст джерела華梵大學
機電工程學系博碩專班
98
This paper is aimed to improve the efficiencies of silicon solar cell using semiconductor fabrication technologies. The research first adopts n-type (100) silicon wafers as substrates, and applies KOH etching in the photolithography process to form inverted pyramid structures. The density of the inverse pyramid structures is varied to investigate its impact factor on the reflectivity for the solar cells. In addition, the paper performs high-density plasma chemical vapor deposition to fabricate amorphous silicon thin films. Then, the author can study solar cells performances with single crystal / hydrogenised amorphous silicon heterojunctions, the effects of p-type amorphous silicon films deposited over p-type single crystal films, as well as the influences from p-type amorphous silicon layers and intrinsic layers. Also, the research executes ion implantation to fabricate BSF layers, which are intended to decrease the carrier recombination rate within the interfacing regions, and to improve the minority carrier collection rates. Furthermore, this research employes RF sputtering system to fabricate AZO transparent conductive thin films, and then learns the effects of adjusted processing parameters to the electrical and optical film properties. In the end, hydrogen plasma is used to perform the film post-processing, and the conductive films are then utilized as solar cell electrodes. After using a semiconductor parameter analyzer to perform a series of experimental measurements, the obtained IV curves suggest that the prototyped solar cells can obtain an open circuit voltage Voc = 0.60V, a short circuit current Jsc = 30mA/cm2, a fill factor FF of 62.08%, and an actual efficiency is about 11.13%.
Частини книг з теми "Defects - Single Crystalline Oxides"
GUSTAFSSON, TORGNY, ERIC GARFUNKEL, LYUDMILA GONCHAROVA, DMITRI STARODUB, ROBIN BARNES, MATEUS DALPONTE, GENNADI BERSUKER, et al. "STRUCTURE, COMPOSITION AND ORDER AT INTERFACES OF CRYSTALLINE OXIDES AND OTHER HIGH-K MATERIALS ON SILICON." In Defects in High-k Gate Dielectric Stacks, 349–60. Dordrecht: Springer Netherlands, 2006. http://dx.doi.org/10.1007/1-4020-4367-8_28.
Повний текст джерелаDispinar, Derya. "Melt Quality Assessment." In Encyclopedia of Aluminum and Its Alloys. Boca Raton: CRC Press, 2019. http://dx.doi.org/10.1201/9781351045636-120052503.
Повний текст джерела"Single crystalline PZT films and the impact of extended structural defects on the ferroelectric properties." In Handbook of Advanced Dielectric, Piezoelectric and Ferroelectric Materials. CRC Press, 2008. http://dx.doi.org/10.1201/9781439832882.ch23.
Повний текст джерелаVrejoiu, I., D. Hesse, and M. Alexe. "Single crystalline PZT films and the impact of extended structural defects on the ferroelectric properties." In Handbook of Advanced Dielectric, Piezoelectric and Ferroelectric Materials, 695–723. Elsevier, 2008. http://dx.doi.org/10.1533/9781845694005.6.695.
Повний текст джерелаWang, Jingyi, Hui Xiao, and Huaxin Wang. "Modification Strategies of Titanium Dioxide." In Updates on Titanium Dioxide [Working Title]. IntechOpen, 2023. http://dx.doi.org/10.5772/intechopen.111636.
Повний текст джерелаBogomol, Iurii, and Petro Loboda. "Directionally Solidified Ceramic Eutectics for High-Temperature Applications." In MAX Phases and Ultra-High Temperature Ceramics for Extreme Environments, 303–22. IGI Global, 2013. http://dx.doi.org/10.4018/978-1-4666-4066-5.ch010.
Повний текст джерелаBokstein, Boris S., Mikhail I. Mendelev, and David J. Srolovitz. "Diffusion." In Thermodynamics and Kinetics in Materials Science. Oxford University Press, 2005. http://dx.doi.org/10.1093/oso/9780198528036.003.0012.
Повний текст джерелаТези доповідей конференцій з теми "Defects - Single Crystalline Oxides"
Bundhoo, Fayik M., and Soundaranathan Kasivisvanatha. "A Novel Fault Isolation Technique for Identifying Deep Sub-Micron Defects." In ISTFA 2003. ASM International, 2003. http://dx.doi.org/10.31399/asm.cp.istfa2003p0465.
Повний текст джерелаGalindo, Felippe de Oliveira, Lucas Pires Gomes Oliveira, José Roberto Ribeiro Bortoleto, Nilson C. da Cruz, Elidiane C. Rangel, and Steven F. Durrant. "Hole transport layers deposited by magnetron sputtering." In III SEVEN INTERNATIONAL MULTIDISCIPLINARY CONGRESS. Seven Congress, 2023. http://dx.doi.org/10.56238/seveniiimulti2023-028.
Повний текст джерелаSankur, H., W. Southwell, R. Hall, and W. J. Gunning. "Rugate Filter Deposition by the OMVPE Technique." In Optical Interference Coatings. Washington, D.C.: Optica Publishing Group, 1992. http://dx.doi.org/10.1364/oic.1992.otub5.
Повний текст джерелаLi, Li, Andrew Gouldstone, and Sanjay Sampath. "Intrinsic Properties of Thermal Sprayed Single Splats on Substrates." In ITSC2004, edited by Basil R. Marple and Christian Moreau. ASM International, 2004. http://dx.doi.org/10.31399/asm.cp.itsc2004p1098.
Повний текст джерелаLin, Hung-Sung, Tung-Hung Chen, and Wen-Cheng Shu. "Applications of C-AFM and CBED Techniques to the Characterization of Substrate Dislocations Causing SRAM Soft Single-Column Failure Contained in a Wafer with (001) Plane/[100] Notch." In ISTFA 2008. ASM International, 2008. http://dx.doi.org/10.31399/asm.cp.istfa2008p0260.
Повний текст джерелаChen, C. Q., P. T. Ng, S. P. Neo, P. K. Tan, A. C. T. Quah, and J. Zhu. "Application of Nanoprobing on Subtle Defects in the Embedded Non-Volatile Memory Device." In ISTFA 2019. ASM International, 2019. http://dx.doi.org/10.31399/asm.cp.istfa2019p0336.
Повний текст джерелаBunin, I., and N. Anashkina. "High-power nanosecond electromagnetic pulses and dielectric barrier discharge in air consequences on structural and structure sensitive properties of ilmenite surface." In 8th International Congress on Energy Fluxes and Radiation Effects. Crossref, 2022. http://dx.doi.org/10.56761/efre2022.c3-p-004001.
Повний текст джерелаMoldovan, Grigore, Shark Lotharukpong, and Peter Wilshaw. "Automated Defect Analysis in Solar Cells Using EBIC." In ISTFA 2014. ASM International, 2014. http://dx.doi.org/10.31399/asm.cp.istfa2014p0156.
Повний текст джерелаAloy, A. S., R. A. Soshnikov, D. B. Lopukh, D. F. Bickford, C. C. Herman, E. W. Holtzsheiter, and R. W. Goles. "Vitrification of DOE Simulated Radioactive Waste by Induction-Heated Cold-Crucible Melter Technology." In ASME 2003 9th International Conference on Radioactive Waste Management and Environmental Remediation. ASMEDC, 2003. http://dx.doi.org/10.1115/icem2003-4907.
Повний текст джерелаSoref, Richard A., та J. P. Lorenzo. "Epitaxial silicon guided-wave optical components for ̩λ = 1.3 µm". У Integrated and Guided Wave Optics. Washington, D.C.: Optica Publishing Group, 1986. http://dx.doi.org/10.1364/igwo.1986.wdd5.
Повний текст джерела