Статті в журналах з теми "Crystallographic Orientation Determination"
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Lan, Yucheng, Mobolaji Zondode, Hua Deng, Jia-An Yan, Marieme Ndaw, Abdellah Lisfi, Chundong Wang, and Yong-Le Pan. "Basic Concepts and Recent Advances of Crystallographic Orientation Determination of Graphene by Raman Spectroscopy." Crystals 8, no. 10 (September 21, 2018): 375. http://dx.doi.org/10.3390/cryst8100375.
Повний текст джерелаWang, W. H., X. Sun, G. D. Köhlhoff, and K. Lücke. "Orientation Determination by Continuous Etching Patterns in Copper and Copper Alloys." Textures and Microstructures 24, no. 4 (January 1, 1995): 199–219. http://dx.doi.org/10.1155/tsm.24.199.
Повний текст джерелаCheredov, V. N., and A. E. Petrakov. "Determination of the orientation of internal linear defects in isotropic optical crystals." Industrial laboratory. Diagnostics of materials 85, no. 2 (March 1, 2019): 29–32. http://dx.doi.org/10.26896/1028-6861-2019-85-2-29-32.
Повний текст джерелаOlejnak, Juraj, Petr Sedlak, Hanus Seiner, Kristyna Zoubkova, Pavla Stoklasova, and Tomas Grabec. "Generalized inverse problems in resonant ultrasound spectroscopy." Journal of the Acoustical Society of America 152, no. 4 (October 2022): A88. http://dx.doi.org/10.1121/10.0015638.
Повний текст джерелаEsaka, Hisao, and Kei Shinozuka. "Determination of Crystallographic Orientation near a Chill Zone Using Ghost Lines." Materials Science Forum 879 (November 2016): 514–17. http://dx.doi.org/10.4028/www.scientific.net/msf.879.514.
Повний текст джерелаBachmann, Florian, Ralf Hielscher, Peter E. Jupp, Wolfgang Pantleon, Helmut Schaeben, and Elias Wegert. "Inferential statistics of electron backscatter diffraction data from within individual crystalline grains." Journal of Applied Crystallography 43, no. 6 (October 1, 2010): 1338–55. http://dx.doi.org/10.1107/s002188981003027x.
Повний текст джерелаCalvert, G., S. Swider, F. Ruta, G. Rossman, and R. S. Feigelson. "Determination of the crystallographic orientation of SrI2 crystals." Journal of Crystal Growth 498 (September 2018): 263–68. http://dx.doi.org/10.1016/j.jcrysgro.2018.06.030.
Повний текст джерелаLloyd, G. E., N. H. Schmidt, D. Mainprice, and D. J. Prior. "Crystallographic textures." Mineralogical Magazine 55, no. 380 (September 1991): 331–45. http://dx.doi.org/10.1180/minmag.1991.055.380.04.
Повний текст джерелаZhang, Yu Dong, Shi Ying Wang, Claude Esling, Xiang Zhao, and Liang Zuo. "Determination of Crystallographic Elements (Dislocation and Surface Plane) from Automated TEM Orientation Determination." Materials Science Forum 702-703 (December 2011): 866–71. http://dx.doi.org/10.4028/www.scientific.net/msf.702-703.866.
Повний текст джерелаWeiland, H., D. P. Field, and B. L. Adams. "In situ observation of orientation changes on metallic surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 246–47. http://dx.doi.org/10.1017/s0424820100137604.
Повний текст джерелаFilman, D. J., M. W. Wien, J. A. Cunningham, J. M. Bergelson, and J. M. Hogle. "Structure Determination of Echovirus 1." Acta Crystallographica Section D Biological Crystallography 54, no. 6 (November 1, 1998): 1261–72. http://dx.doi.org/10.1107/s0907444998002790.
Повний текст джерелаAngel, Ross, Sula Milani, Matteo Alvaro, and Fabrizio Nestola. "OrientXplot: a program to analyse and display relative crystal orientations." Journal of Applied Crystallography 48, no. 4 (July 18, 2015): 1330–34. http://dx.doi.org/10.1107/s160057671501167x.
Повний текст джерелаAyyer, Kartik, Hugh T. Philipp, Mark W. Tate, Jennifer L. Wierman, Veit Elser, and Sol M. Gruner. "Determination of crystallographic intensities from sparse data." IUCrJ 2, no. 1 (January 1, 2015): 29–34. http://dx.doi.org/10.1107/s2052252514022313.
Повний текст джерелаKrakow, Robert, Robbie J. Bennett, Duncan N. Johnstone, Zoja Vukmanovic, Wilberth Solano-Alvarez, Steven J. Lainé, Joshua F. Einsle, Paul A. Midgley, Catherine M. F. Rae, and Ralf Hielscher. "On three-dimensional misorientation spaces." Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences 473, no. 2206 (October 2017): 20170274. http://dx.doi.org/10.1098/rspa.2017.0274.
Повний текст джерелаZaefferer, Stefan. "New developments of computer-aided crystallographic analysis in transmission electron microscopy." Journal of Applied Crystallography 33, no. 1 (February 1, 2000): 10–25. http://dx.doi.org/10.1107/s0021889899010894.
Повний текст джерелаZeng, Lingxiao, Wei Ding, and Quan Hao. "Using cryo-electron microscopy maps for X-ray structure determination." IUCrJ 5, no. 4 (May 11, 2018): 382–89. http://dx.doi.org/10.1107/s2052252518005857.
Повний текст джерелаLi, Zongbin, Yudong Zhang, Claude Esling, Xiang Zhao, and Liang Zuo. "Determination of the orientation relationship between austenite and 5M modulated martensite in Ni–Mn–Ga alloys." Journal of Applied Crystallography 44, no. 6 (November 12, 2011): 1222–26. http://dx.doi.org/10.1107/s0021889811043366.
Повний текст джерелаLi, W., J. Coulson, P. Marrow, R. J. Smith, S. J. Lainé, M. Clark, and S. D. Sharples. "Crystallographic Orientation Determination of Hexagonal Structure Crystals by Laser Ultrasonic Technique." Journal of Physics: Conference Series 684 (January 2016): 012001. http://dx.doi.org/10.1088/1742-6596/684/1/012001.
Повний текст джерелаHuang, X., and Q. Liu. "Determination of crystallographic and macroscopic orientation of planar structures in TEM." Ultramicroscopy 74, no. 3 (August 1998): 123–30. http://dx.doi.org/10.1016/s0304-3991(98)00033-3.
Повний текст джерелаVerhoeven, J. D., and E. D. Gibson. "Determination of crystallographic orientation of YBa2Cu3Oxgrains from their optical twin patterns." Applied Physics Letters 52, no. 14 (April 4, 1988): 1190–92. http://dx.doi.org/10.1063/1.99672.
Повний текст джерелаGlowka, Marek, Malgorzata Szczesio, and Andrzej Olczak. "Crystallographic approach to determination of active conformations of LCAPs." Acta Crystallographica Section A Foundations and Advances 70, a1 (August 5, 2014): C1697. http://dx.doi.org/10.1107/s2053273314083028.
Повний текст джерелаZhang, Xinming, Jorgen F. Rufner, Thomas LaGrange, Ricardo H. R. Castro, Julie M. Schoenung, Geoffrey H. Campell, and Klaus van Benthem. "Determination of Reliable Grain Boundary Orientation using Automated Crystallographic Orientation Mapping in the Transmission Electron Microscope." Microscopy and Microanalysis 21, S3 (August 2015): 1663–64. http://dx.doi.org/10.1017/s1431927615009095.
Повний текст джерелаChoi, Yun, Keunui Kim, Soo Yeon Lim, Jungcheol Kim, Je Myoung Park, Jung Hwa Kim, Zonghoon Lee, and Hyeonsik Cheong. "Complete determination of the crystallographic orientation of ReX2 (X = S, Se) by polarized Raman spectroscopy." Nanoscale Horizons 5, no. 2 (2020): 308–15. http://dx.doi.org/10.1039/c9nh00487d.
Повний текст джерелаLi, Wenqi, Steve D. Sharples, Richard J. Smith, Matt Clark, and Michael G. Somekh. "Determination of crystallographic orientation of large grain metals with surface acoustic waves." Journal of the Acoustical Society of America 132, no. 2 (August 2012): 738–45. http://dx.doi.org/10.1121/1.4731226.
Повний текст джерелаStojakovic, Dejan. "Electron backscatter diffraction in materials characterization." Processing and Application of Ceramics 6, no. 1 (2012): 1–13. http://dx.doi.org/10.2298/pac1201001s.
Повний текст джерелаCosandey, F., P. Markondeya Raj, and W. R. Cannon. "Texture Determination of Ceramic Materials by EBSD." Microscopy and Microanalysis 5, S2 (August 1999): 224–25. http://dx.doi.org/10.1017/s1431927600014446.
Повний текст джерелаZuo, Liang, Zong Bin Li, Yu Dong Zhang, Claude Esling, and Xiang Zhao. "Extensions of Electron Diffraction Based Techniques in Crystallographic Characterization." Materials Science Forum 753 (March 2013): 11–16. http://dx.doi.org/10.4028/www.scientific.net/msf.753.11.
Повний текст джерелаLangelaan, G., S. Deprez, Ignaas Verpoest, and Paul van Houtte. "Determination of Morphological Textures of the Fibres in Composite Materials Made from Textiles of Carbon Fibres." Materials Science Forum 495-497 (September 2005): 1675–80. http://dx.doi.org/10.4028/www.scientific.net/msf.495-497.1675.
Повний текст джерелаGevorkov, Yaroslav, Anton Barty, Wolfgang Brehm, Thomas A. White, Aleksandra Tolstikova, Max O. Wiedorn, Alke Meents, Rolf-Rainer Grigat, Henry N. Chapman, and Oleksandr Yefanov. "pinkIndexer – a universal indexer for pink-beam X-ray and electron diffraction snapshots." Acta Crystallographica Section A Foundations and Advances 76, no. 2 (January 10, 2020): 121–31. http://dx.doi.org/10.1107/s2053273319015559.
Повний текст джерелаBERTOLOTTO, S., S. SZENKNECT, S. LALLEMAN, R. PODOR, L. CLAPAREDE, A. MAGNALDO, P. RAISON, A. MESBAH, B. ARAB-CHAPELET, and N. DACHEUX. "First determination of dissolution rates of oriented UO2 single crystals." MRS Advances 5, no. 1-2 (2020): 19–26. http://dx.doi.org/10.1557/adv.2020.41.
Повний текст джерелаIsaenkova, Margarita, and Yuriy Perlovich. "Distribution of Dislocation Density in Tubes from Zr-Based Alloys by X-Ray Data." Solid State Phenomena 105 (July 2005): 89–94. http://dx.doi.org/10.4028/www.scientific.net/ssp.105.89.
Повний текст джерелаSarrao, J. L., S. R. Chen, W. M. Visscher, Ming Lei, U. F. Kocks, and A. Migliori. "Determination of the crystallographic orientation of a single crystal using resonant ultrasound spectroscopy." Review of Scientific Instruments 65, no. 6 (June 1994): 2139–40. http://dx.doi.org/10.1063/1.1144712.
Повний текст джерелаSinha, V., M. J. Mills, and J. C. Williams. "Determination of crystallographic orientation of dwell-fatigue fracture facets in Ti-6242 alloy." Journal of Materials Science 42, no. 19 (October 2007): 8334–41. http://dx.doi.org/10.1007/s10853-006-0252-z.
Повний текст джерелаNeubeck, S., Y. M. You, Z. H. Ni, P. Blake, Z. X. Shen, A. K. Geim, and K. S. Novoselov. "Direct determination of the crystallographic orientation of graphene edges by atomic resolution imaging." Applied Physics Letters 97, no. 5 (August 2, 2010): 053110. http://dx.doi.org/10.1063/1.3467468.
Повний текст джерелаWang, S. C., and M. J. Starink. "A simple approach to the determination of the crystallographic orientation: applications and accuracy." Journal of Microscopy 211, no. 2 (August 2003): 130–36. http://dx.doi.org/10.1046/j.1365-2818.2003.01206.x.
Повний текст джерелаMichael, J. R. "All You Need to Know About Electron Backscatter Diffraction: Orientation is Only the Tip of the Iceberg." Microscopy and Microanalysis 3, S2 (August 1997): 387–88. http://dx.doi.org/10.1017/s1431927600008825.
Повний текст джерелаZolotoyabko, Emil. "Determination of the degree of preferred orientation within the March–Dollase approach." Journal of Applied Crystallography 42, no. 3 (May 15, 2009): 513–18. http://dx.doi.org/10.1107/s0021889809013727.
Повний текст джерелаSharma, Hemant, Richard M. Huizenga, and S. Erik Offerman. "A fast methodology to determine the characteristics of thousands of grains using three-dimensional X-ray diffraction. II. Volume, centre-of-mass position, crystallographic orientation and strain state of grains." Journal of Applied Crystallography 45, no. 4 (July 14, 2012): 705–18. http://dx.doi.org/10.1107/s0021889812025599.
Повний текст джерелаLi, Zongbin, Yudong Zhang, Claude Esling, Xiang Zhao, Yandong Wang, and Liang Zuo. "New approach to twin interfaces of modulated martensite." Journal of Applied Crystallography 43, no. 3 (April 30, 2010): 617–22. http://dx.doi.org/10.1107/s002188981000868x.
Повний текст джерелаSitepu, Husin, Brian H. O'Connor, and Deyu Li. "Comparative evaluation of the March and generalized spherical harmonic preferred orientation models using X-ray diffraction data for molybdite and calcite powders." Journal of Applied Crystallography 38, no. 1 (January 19, 2005): 158–67. http://dx.doi.org/10.1107/s0021889804031231.
Повний текст джерелаFundenberger, J. J., M. J. Philippe, C. Esling, P. Lequeu, and B. Chenal. "Calculation of Yield Surfaces and Determination of Forming Limit Diagrams of Aluminium Alloys." Textures and Microstructures 21, no. 2-3 (January 1, 1993): 93–108. http://dx.doi.org/10.1155/tsm.21.93.
Повний текст джерелаLi, Zongbin, Zhenzhuang Li, Bo Yang, Yudong Zhang, Claude Esling, Xiang Zhao, and Liang Zuo. "Crystallographic correlation between 5M and 7M martensite in an Ni–Mn–Ga alloy." Journal of Applied Crystallography 49, no. 2 (March 1, 2016): 507–12. http://dx.doi.org/10.1107/s1600576716002223.
Повний текст джерелаScherf, A., A. Kauffmann, S. Kauffmann-Weiss, T. Scherer, X. Li, F. Stein, and M. Heilmaier. "Orientation relationship of eutectoid FeAl and FeAl2." Journal of Applied Crystallography 49, no. 2 (February 24, 2016): 442–49. http://dx.doi.org/10.1107/s1600576716000911.
Повний текст джерелаVorlı́ček, V., V. Železný, A. N. Tiwari, M. Krejci, and H. Zogg. "Determination of the crystallographic orientation of CuInSe2 thin films by Raman and infrared spectroscopy." Journal of Applied Physics 82, no. 11 (December 1997): 5484–87. http://dx.doi.org/10.1063/1.365576.
Повний текст джерелаYoung, K. H., T. W. James, McD Robinson, A. H. Cardona, H. Suzuki, H. Kurosawa, T. Yamashita та T. Hirai. "Electron channeling pattern determination of crystallinity and crystallographic orientation in YBa2Cu3O7−δ thin films". Thin Solid Films 206, № 1-2 (грудень 1991): 369–73. http://dx.doi.org/10.1016/0040-6090(91)90453-5.
Повний текст джерелаMorales, M. P., N. O. Nuñez, R. Pozas, M. Ocaña, and C. J. Serna. "Determination of the Orientation of the Crystallographic Axes in Anisometric Particles by Infrared Spectroscopy." Applied Spectroscopy 56, no. 2 (February 2002): 200–204. http://dx.doi.org/10.1366/0003702021954674.
Повний текст джерелаGallego, Samuel V., Emre S. Tasci, Gemma de la Flor, J. Manuel Perez-Mato, and Mois I. Aroyo. "Magnetic symmetry in the Bilbao Crystallographic Server: a computer program to provide systematic absences of magnetic neutron diffraction." Journal of Applied Crystallography 45, no. 6 (November 15, 2012): 1236–47. http://dx.doi.org/10.1107/s0021889812042185.
Повний текст джерелаMeng, Yifei, and Jian-Min Zuo. "Three-dimensional nanostructure determination from a large diffraction data set recorded using scanning electron nanodiffraction." IUCrJ 3, no. 5 (July 4, 2016): 300–308. http://dx.doi.org/10.1107/s205225251600943x.
Повний текст джерелаGrigull, S. "Tensile Deformation Induced Texture Transformation in Austenitic Stainless Steel." Textures and Microstructures 35, no. 3-4 (January 1, 2003): 153–62. http://dx.doi.org/10.1080/07303300310001628616.
Повний текст джерелаBaggethun, P., and H. Weiland. "Orientation Imaging Microscopy in the TEM." Microscopy and Microanalysis 5, S2 (August 1999): 204–5. http://dx.doi.org/10.1017/s1431927600014343.
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