Дисертації з теми "Compact thermal modeling"
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Li, Xiaoming. "Compact thermal modeling for 3D IC design." Diss., Online access via UMI:, 2005.
Знайти повний текст джерелаOcak, Mustafa. "Conduction Based Compact Thermal Modeling For Thermal Analysis Of Electronic Components." Master's thesis, METU, 2010. http://etd.lib.metu.edu.tr/upload/12612100/index.pdf.
Повний текст джерелаNie, Qihong. "Experimentally validated multiscale thermal modeling of electronic cabinets." Diss., Atlanta, Ga. : Georgia Institute of Technology, 2008. http://hdl.handle.net/1853/26492.
Повний текст джерелаCommittee Chair: Joshi, Yogendra; Committee Member: Gallivan, Martha; Committee Member: Graham, Samuel; Committee Member: Yeung, Pui-Kuen; Committee Member: Zhang, Zhuomin. Part of the SMARTech Electronic Thesis and Dissertation Collection.
O'brien, Jonathan. "Medium Power, Compact Periodic Spiral Antenna." Scholar Commons, 2013. http://scholarcommons.usf.edu/etd/4926.
Повний текст джерелаRaghupathy, Arun Prakash. "Boundary-Condition-Independent Reduced-Order Modeling for Thermal Analysis of Complex Electronics Packages." University of Cincinnati / OhioLINK, 2009. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1240536463.
Повний текст джерелаD'Esposito, Rosario. "Electro-thermal characterization, TCAD simulations and compact modeling of advanced SiGe HBTs at device and circuit level." Thesis, Bordeaux, 2016. http://www.theses.fr/2016BORD0147/document.
Повний текст джерелаThis work is focused on the characterization of electro-thermal effects in advanced SiGe hetero-junction bipolar transistors (HBTs); two state of the art BiCMOS processes have been analyzed: the B11HFC from Infineon Technologies (130nm) and the B55 from STMicroelectronics (55nm).Special test structures have been designed, in order to evaluate the overall electro-thermal impact of the back end of line (BEOL) in single finger and multi-finger components. A complete DC and RF electrical characterization at small and large signal, as well as the extraction of the device static and dynamic thermal parameters are performed on the proposed test structures, showing a sensible improvement of the DC and RF figures of merit when metal dummies are added upon the transistor. The thermal impact of the BEOL has been modeled and experimentally verified in the time and frequency domain and by means of 3D TCAD simulations, in which the effect of the doping profile on the thermal conductivity is analyzed and taken into account.Innovative multi-finger transistor topologies are designed, which allow an improvement of the SOA specifications, thanks to a careful design of the drawn emitter area and of the deep trench isolation (DTI) enclosed area.A compact thermal model is proposed for taking into account the mutual thermal coupling between the emitter stripes of multi-finger HBTs in dynamic operation and is validated upon dedicated pulsed measurements and TCAD simulations.Specially designed circuit blocks have been realized and measured, in order to verify the accuracy of device compact models in electrical circuit simulators; moreover the impact on the circuit performances of mutual thermal coupling among neighboring transistors and the presence of BEOL metal dummies is evaluated and modeled
Xie, Jianyong. "Electrical-thermal modeling and simulation for three-dimensional integrated systems." Diss., Georgia Institute of Technology, 2013. http://hdl.handle.net/1853/50307.
Повний текст джерелаSahoo, Amit Kumar. "Electro-thermal Characterizations, Compact Modeling and TCAD based Device Simulations of advanced SiGe : C BiCMOS HBTs and of nanometric CMOS FET." Thesis, Bordeaux 1, 2012. http://www.theses.fr/2012BOR14557/document.
Повний текст джерелаAn extensive evaluation of different techniques for transient and dynamic electro-thermal behavior of microwave SiGe:C BiCMOS hetero-junction bipolar transistors (HBT) and nano-scale metal-oxide-semiconductor field-effect transistors (MOSFETs) have been presented. In particular, new and simple approach to accurately characterize the transient self-heating effect, based on pulse measurements, is demonstrated. The methodology is verified by static measurements at different ambient temperatures, s-parameter measurements at low frequency region and transient thermal simulations. Three dimensional thermal TCAD simulations are performed on different geometries of the submicron SiGe:C BiCMOS HBTs with fT and fmax of 230 GHz and 290 GHz, respectively. A comprehensive evaluation of device self-heating in time and frequency domain has been investigated. A generalized expression for the frequency-domain thermal impedance has been formulated and that is used to extract device thermal impedance below thermal cut-off frequency. The thermal parameters are extracted through transistor compact model simulations connecting electro-thermal network at temperature node. Theoretical works for thermal impedance modeling using different networks, developed until date, have been verified with our experimental results. We report for the first time the experimental verification of the distributed electrothermal model for thermal impedance using a nodal and recursive network. It has been shown that, the conventional single pole thermal network is not sufficient to accurately model the transient thermal spreading behavior and therefore a recursive network needs to be used. Recursive network is verified with device simulations as well as measurements and found to be in excellent agreement. Therefore, finally a scalable electro-thermal model using this recursive network is developed. The scalability has been verified through numerical simulations as well as by low frequency measurements and excellent conformity has been found in for various device geometries
Chen, Minghui. "DESIGN, FABRICATION, TESTING, AND MODELING OF A HIGH-TEMPERATURE PRINTED CIRCUIT HEAT EXCHANGER." The Ohio State University, 2015. http://rave.ohiolink.edu/etdc/view?acc_num=osu1431072434.
Повний текст джерелаMartins, Olivier. "Méthodologie d'analyse thermique multi niveaux de systèmes électroniques par des modèles compacts." Grenoble INPG, 2010. https://theses.hal.science/tel-00569192.
Повний текст джерелаOver the past few years, the size of transistors has drastically decreased which enables to design smaller components and to add more and more components in electronic Systems. The transistor technology réduction and the rise of the operating frequency hâve caused a dramatic increase of power density in Integrated Circuits and a high température rise of the component that can affect its performances. The aim of the thesis is to suggest a new methodology to build boundary condition independent compact thermal models of complex electronic Systems. This methodology enables to split the Systems in éléments, to build a compact thermal model of each élément and to connect them to model the thermal behaviour of the whole System. The Flex-CTM methodology enables to perform a thermal analysis at an early stage of a system's design flow and has numerous advantages than existing thermal models
Pye, John Downing Mechanical & Manufacturing Engineering Faculty of Engineering UNSW. "System modelling of the compact linear Fresnel reflector." Publisher:University of New South Wales. Mechanical & Manufacturing Engineering, 2008. http://handle.unsw.edu.au/1959.4/41244.
Повний текст джерелаDia, Cheikh Tidiane. "Génération de modeles compacts thermiques dynamiques de composants electroniques via les algorithmes genetiques." Thesis, Paris 10, 2015. http://www.theses.fr/2015PA100172/document.
Повний текст джерелаThis thesis is dedicated to the generation of behavioral thermal model for electronic component having multiple active sensitive chips. This innovative study focuses on the necessary improvements of the concept of steady-state and dynamic compact model in order to elaborate pertinent and accurate modeling practical techniques. To help the electronic designer to early identify the overheated electronic components, the purpose is to generate simplified models, capable to mimic the thermal behavior of sophisticated detailed models. These simplified or compact models using well-known thermal resistances network replicate the thermal path from the most sensitive elements to the external package surfaces and enable to accurately predict their temperatures as well as the case heat flow rates. Preliminary evaluations performed on the popular, plastic Quad Flat-pack No lead package family showed that the simplest network definition, restricted to the heating source and two external surfaces, is always insufficient to properly characterize the thermal response of real device. So our development of steady-state compact thermal model (CTM) for electronic component is based on a process flow defined by the European project DELPHI which was revised by the presented work to address multi-chip components. DELPHI style compact thermal model presents an enlarged node number, especially for the component external surfaces which are divided in a set of relevant areas
Habra, Wasim. "Développement de modèles thermiques compacts en vue de la modélisation électrothermique des composants de puissance." Phd thesis, Université Paul Sabatier - Toulouse III, 2007. http://tel.archives-ouvertes.fr/tel-00159791.
Повний текст джерелаBoukelia, Ahmed. "Modélisations physique et numérique des géostructures énergétiques." Thesis, Université de Lorraine, 2016. http://www.theses.fr/2016LORR0241/document.
Повний текст джерелаEnergy geostructures are civil engineering structures equipped with energy exchanger elements in order to store heat seasonally. The aim of this study is the use of compacted soil to store energy through installation of horizontal exchangers in an embankment. During the soil compaction, two parameters were controlled: the water content w and the dry density ρd. This parameters as well as the soil nature, the mechanical load path and the cyclic temperature variation may affect the storage capacity and the system stability. This work includes an experimental part and a modeling part. In the experimental part, the impact of the temperature variation is studied on the thermal and mechanical properties of the compacted soil. The Plaisir loam (PL) extracted from the Paris region was investigated through laboratory tests at a temperatures range of 20 to 50°C. The results showed that the thermal properties of the compacted soils increased on the dry side of the compaction curve. This evolution was clearly confirmed for higher temperatures. The application of cyclic temperature variations showed reversible evolutions in the thermal properties after one cycle. The results of unconfined compressive tests and pressuremeter tests showed that heating induces a softening of the material whereas several temperature cycles induce a stiffening of the material. Thereafter, a coupled thermo-hydraulic modeling of an embankment made of the compacted Plaisir loam is performed in order to optimize the storage system. The comparison of different modelling results, fixed the temperature sensors spacing that minimizes the interactions between them, and the optimal distance between the last sensors and the bottom of the slope. It is shown that if an appropriate thermal program is chosen, the heat storage in the embankment could be possible. A better efficiency of the storage capacity can be reached by introducing 3 temperature sensors rows in the storage and by covering the storage with a thermal insulation. The simulation of this scenario over 10 years including temperature cycles shows a heating of the embankment for several years, until to reach an equilibrium state after the 7th year
Garci, Maroua. "Simulation multi-physiques de circuits intégrés pour la fiabilité." Thesis, Strasbourg, 2016. http://www.theses.fr/2016STRAD020/document.
Повний текст джерелаThis thesis was carried out under the theme of the microelectronics Integrated Circuits Reliability. The aim of our work was to develop a multi-physics simulation tool for the design of reliable integrated circuits. This tool has the following innovative features : • (i) The integration in a standard microelectronics design environment, such as the Cadence® environment ;• (ii) The possibility of efficient simulation, over long periods, of analog CMOS circuits taking into account the aging henomenon ; • (iii) The simulation of multiple physical behaviours of ICs (electrical-thermalmechanical) coupled in the same environment using the direct simulation method. This work was carried out through three main stages detailed in the three parts of this Manuscript
Huang, Wei. "Hotspot : a chip and package compact thermal modeling methodology for VLSI design /." 2007. http://wwwlib.umi.com/dissertations/fullcit/3239977.
Повний текст джерелаYang, Wen-Hao, and 楊文皓. "Dynamic Compact Thermal Modeling and Transient Analysis on Smartphone by Resistor-Capacitor Ladder Network." Thesis, 2018. http://ndltd.ncl.edu.tw/handle/d42w2a.
Повний текст джерела國立交通大學
電信工程研究所
107
High temperatures caused by dramatically increasing integration density and power consumption of VLSI circuits have several significant impacts on chips and handheld devices. To avoid overheating, an effective temperature estimation mechanism is important. In this thesis, we propose a compact thermal RC network method for predicting transient temperatures that enables accurate and fast thermal analysis at specific points. The method is based on Cauer RC ladder network, Particle Swarm Optimization (PSO), Modified Nodal Analysis (MNA), and technique of Backward Euler. This method is capable of handling most power inputs and is suitable for single and multiple heat sources. In addition, we validate the case studies of the smartphone structure, and compare the temperature profiles generated between the RC ladder network and the computational fluid dynamics (CFD) tool, then calculate their root mean square (RMS) error. The experimental results show that our modeling method and parameter extraction mechanism have good performance.
Hsu, Jen-Chieh, and 徐仁杰. "Thermal Conductivity Modeling of Compacted Nanocomposites Using Phonon Boltzmann Model Equation." Thesis, 2008. http://ndltd.ncl.edu.tw/handle/93015156713513685141.
Повний текст джерела國立臺灣大學
應用力學研究所
96
The equation of phonon radiative transfer (EPRT) is a nonlinear, integral, differential equation with many variables. It is difficult for us to solve the equation directly. If we simplify the relaxation time of collision term by Bhatnagar- -Gross-Krook Equation. The equation will become easily to cope with. In this paper, we deal with phase space where the discrete ordinate method is used for angular discretization; and using upwind scheme the deal with spatial discretization. Nanocomposites in superlattices are observed that may realize a similar thermal conductivity reduction and thermoelectric efficiency enhancements. So it provides us a way to increase the benefits of the nanoscale effects to thermoelectric materials in bulk form. If there are two species of nanocomposites, one is a material in the form of nanowires embedded in another host matrix material; the other is a discrete mixture of two different kinds of nanowires that are compacted. At the same stoichiometry, a nanocomposite in the form of discrete mixtures of nanowires does not have a continuous phase of material, so its thermal conductivity is lower than composites with nanowires embedded in a host material. In this paper, using EPRT with the discrete ordinate method to investigate simulation about the density of interface of one dimension superlattice, nanocomposites of nanowires embedded in another host matrix material, and nanocomposites of compacted silicon and germanium nanowire mixtures nanocompacted. Results show that the thermal conductivity of composites in the form of compacted silicon and germanium nanowire mixtures is lower than the composites with silicon nanowires embedded in a germanium matrix at the same atomic composition and characteristic size of the nanowires. Finally, we will take our data to compare with the other study which simulation by Direct Monte Carlo Method.