Дисертації з теми "CdTe polycrystalline thin film"
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Attygalle, Muthuthanthrige Lilani Chandrawansha. "Theoretical modeling of polycrystalline thin-film photovoltaics." University of Toledo / OhioLINK, 2008. http://rave.ohiolink.edu/etdc/view?acc_num=toledo1204144362.
Повний текст джерелаBridge, Chris. "Optical electrical and microstructural characterisation of polycrystalline thin film CdTe/CdS heterojunction solar cells." Thesis, University of Manchester, 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.680179.
Повний текст джерелаEde, Anthony. "Studies of crystalline CdZnTe radiation detectors and polycrystalline thin film CdTe for X-ray imaging applications." Thesis, University of Surrey, 2002. http://epubs.surrey.ac.uk/843974/.
Повний текст джерелаArchbold, Martin David. "Polycrystalline CdS thin films and their role in CdS/CdTe photovoltaic devices." Thesis, Durham University, 2007. http://etheses.dur.ac.uk/2138/.
Повний текст джерелаInns, Daniel Photovoltaics & Renewable Energy Engineering Faculty of Engineering UNSW. "ALICIA polycrystalline silicon thin-film solar cells." Publisher:University of New South Wales. Photovoltaics & Renewable Energy Engineering, 2007. http://handle.unsw.edu.au/1959.4/43600.
Повний текст джерелаAttygalle, Muthuthanthrige Lilani C. "Theoretical modeling of polycrystalline thin-film photovoltaics /." Connect to full text in OhioLINK ETD Center, 2008. http://rave.ohiolink.edu/etdc/view?acc_num=toledo1204144362.
Повний текст джерелаDesai, Darshini. "Electrical characterization of thin film CdTe solar cells." Access to citation, abstract and download form provided by ProQuest Information and Learning Company; downloadable PDF file, 320 p, 2007. http://proquest.umi.com/pqdweb?did=1257806491&sid=6&Fmt=2&clientId=8331&RQT=309&VName=PQD.
Повний текст джерелаSugimoto, Yoshiharu. "Studies of CdTe electrodeposition." Thesis, University of Southampton, 1993. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.241263.
Повний текст джерелаMackay, Ian. "Thin film electroluminescence /." Online version of thesis, 1989. http://hdl.handle.net/1850/10551.
Повний текст джерелаTetali, Bhaskar Reddy. "Stability studies of CdTe/CdS thin film solar cells." [Tampa, Fla.] : University of South Florida, 2005. http://purl.fcla.edu/fcla/etd/SFE0001135.
Повний текст джерелаMeakin, Douglas Boyd. "Active devices in polycrystalline silicon." Thesis, University of Liverpool, 1992. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.240344.
Повний текст джерелаCoxon, Penelope Anne. "Polycrystalline silicon thin-film transistors for large-scale microelectronics." Thesis, University of Cambridge, 1990. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.358595.
Повний текст джерелаPalekis, Vasilios. "CdTe/CdS Thin Film Solar Cells Fabricated on Flexible Substrates." Scholar Commons, 2011. http://scholarcommons.usf.edu/etd/3280.
Повний текст джерелаLisco, Fabiana. "High rate deposition processes for thin film CdTe solar cells." Thesis, Loughborough University, 2015. https://dspace.lboro.ac.uk/2134/17965.
Повний текст джерелаGolego, Nickolay. "Thin-film polycrystalline titanium-oxygen semiconductors prepared by spray pyrolysis." Thesis, National Library of Canada = Bibliothèque nationale du Canada, 1998. http://www.collectionscanada.ca/obj/s4/f2/dsk2/ftp02/NQ33300.pdf.
Повний текст джерелаChow, Thomas. "A conduction model for intrinsic polycrystalline silicon thin film transistor based on discrete grains /." View abstract or full-text, 2009. http://library.ust.hk/cgi/db/thesis.pl?ECED%202009%20CHOW.
Повний текст джерелаAlfadhili, Fadhil K. "Development of Back Contacts for CdTe Thin Films Solar Cells." University of Toledo / OhioLINK, 2020. http://rave.ohiolink.edu/etdc/view?acc_num=toledo1588962981116943.
Повний текст джерелаBapanapalli, Srilatha. "Cds/cdte thin film solar cells with zinc stannate buffer layer." [Tampa, Fla.] : University of South Florida, 2005. http://purl.fcla.edu/fcla/etd/SFE0001004.
Повний текст джерелаMuthuswamy, Gokul. "Numerical modeling of CdS/CdTe thin film solar cell using MEDICI." [Tampa, Fla.] : University of South Florida, 2005. http://purl.fcla.edu/fcla/etd/SFE0001360.
Повний текст джерелаBabar, Shumaila. "Characterisation of surface treated CdZnTe and thin film CdTe based devices." Thesis, University of Surrey, 2016. http://epubs.surrey.ac.uk/810655/.
Повний текст джерелаYilmaz, Sibel. "Thin film CDTE solar cells deposited by pulsed DC magnetron sputtering." Thesis, Loughborough University, 2017. https://dspace.lboro.ac.uk/2134/31838.
Повний текст джерелаDiso, Dahiru Garba. "Research and development of CdTe based thin film PV solar cells." Thesis, Sheffield Hallam University, 2011. http://shura.shu.ac.uk/4941/.
Повний текст джерелаHesp, David. "Surface characterisation of contact materials for thin film CdTe solar cells." Thesis, University of Liverpool, 2015. http://livrepository.liverpool.ac.uk/2020780/.
Повний текст джерелаHodges, Deidra Ranel. "Development of CdTe thin film solar cells on flexible foil substrates." [Tampa, Fla] : University of South Florida, 2009. http://purl.fcla.edu/usf/dc/et/SFE0003210.
Повний текст джерелаMoffett, Christina. "Characterization of Tellurium Back Contact Layer for CdTe Thin Film Devices." Thesis, Colorado State University, 2018. http://pqdtopen.proquest.com/#viewpdf?dispub=10826197.
Повний текст джерелаCadmium Telluride (CdTe) thin film photovoltaic technology has shown favorable progress due to inexpensive and efficient processing techniques. However, efficiencies have yet to reach the overall projected CdTe device efficiency, with the back contact being a main source of CdTe performance limitations. Tellurium (Te) applied as a back contact has led to significant increases in fill factor and an overall progress in device efficiency. Devices deposited with Te show significant improvement in uniformity, even without intentional Cu doping, when compared to devices without Te. In current - density measurements, Te shows stability even at low temperatures, which is indicative of a low barrier developed at the CdTe/Te interface. X-ray and ultra-violet photoelectron spectroscopy were carried out to examine the valence band offset at the CdTe/Te back contact interface. The valence band offset was shown to be highly dependent on the Te thickness and was largely affected by oxidation and contamination at the surface. Capacitance measurements were carried out to study the effect Te has on the absorber depletion width. Data indicate a decreased depletion width with Te applied at the back of thin film CdTe devices, which agrees with increased device performance. Te thickness was varied in all studies to understand the effect of application thickness on device performance and material characteristics. With a thicker Te layer leading to overall improvement in device performance and favorable device characteristics.
Hsu, Chih-An. "Absorber and Window Study – CdSexTe1-x/CdTe Thin Film Solar Cells." Scholar Commons, 2019. https://scholarcommons.usf.edu/etd/7813.
Повний текст джерелаManiscalco, Bianca. "Microstructure and performance of CdTe solar devices." Thesis, Loughborough University, 2015. https://dspace.lboro.ac.uk/2134/16754.
Повний текст джерелаBhatti, Muhammad Tariq. "A novel method of production of CdS/CdTe thin film solar cells." Thesis, Northumbria University, 1993. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.356984.
Повний текст джерелаBayhan, Murat. "Preparation and characterisation of n-CdS/p-CdTe thin film solar cells." Thesis, Durham University, 1994. http://etheses.dur.ac.uk/1697/.
Повний текст джерелаSamantilleke, Anura Priyajith. "Electrodeposition of ZnSe, CdSe and CdTe thin film materials and optoelectronic devices." Thesis, Sheffield Hallam University, 1998. http://shura.shu.ac.uk/20319/.
Повний текст джерелаZhao, Hehong. "Impurity and back contact effects on CdTe/CdS thin film solar cells." [Tampa, Fla] : University of South Florida, 2008. http://purl.fcla.edu/usf/dc/et/SFE0002377.
Повний текст джерелаViswanathan, Vijay. "Study Of Cu free back contacts to thin film CdTe solar cells." [Tampa, Fla.] : University of South Florida, 2004. http://purl.fcla.edu/fcla/etd/SFE0000348.
Повний текст джерелаEchendu, Obi Kingsley. "Thin film solar cells using all-electrodeposited ZnS, CdS and CdTe materials." Thesis, Sheffield Hallam University, 2014. http://shura.shu.ac.uk/19597/.
Повний текст джерелаBittau, Francesco. "Analysis and optimisation of window layers for thin film CDTE solar cells." Thesis, Loughborough University, 2017. https://dspace.lboro.ac.uk/2134/32642.
Повний текст джерелаZhao, Hehong. "Impurity and Back Contact Effects on CdTe/CdS Thin Film Solar Cells." Scholar Commons, 2007. https://scholarcommons.usf.edu/etd/580.
Повний текст джерелаKunz, Oliver Photovoltaics & Renewable Energy Engineering Faculty of Engineering UNSW. "Evaporated solid-phase crystallised poly-silicon thin film solar cells on glass." Publisher:University of New South Wales. Photovoltaics & Renewable Energy Engineering, 2009. http://handle.unsw.edu.au/1959.4/43644.
Повний текст джерелаStraub, Axel Electrical Engineering & Telecommunications Faculty of Engineering UNSW. "Polycrystalline silicon thin-film solar cells on glass by ion-assisted deposition." Awarded by:University of New South Wales. School of Electrical Engineering and Telecommunications, 2005. http://handle.unsw.edu.au/1959.4/22435.
Повний текст джерелаHe, Song Photovoltaics & Renewable Energy Engineering Faculty of Engineering UNSW. "Evaporated polycrystalline silicon thin-film solar cells by aluminium-induced crytallization solid-phase epitaxy." Awarded By:University of New South Wales. Photovoltaics & Renewable Energy Engineering, 2009. http://handle.unsw.edu.au/1959.4/44888.
Повний текст джерелаShi, Lei Photovoltaics & Renewable Energy Engineering Faculty of Engineering UNSW. "Contact resistance study on polycrystalline silicon thin-film solar cells on glass." Publisher:University of New South Wales. Photovoltaics & Renewable Energy Engineering, 2008. http://handle.unsw.edu.au/1959.4/41425.
Повний текст джерелаPohl, John E. T. "The electrical properties of bulk polycrystalline and thin film high temperature superconductors." Thesis, University of Nottingham, 1992. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.315041.
Повний текст джерелаRicciardo, Rebecca Ann. "Chemical, Magnetic, and Orbital Order of Polycrystalline and Thin film Double Perovskites." The Ohio State University, 2009. http://rave.ohiolink.edu/etdc/view?acc_num=osu1250277883.
Повний текст джерелаLee, Jinwoo. "Metastability of copper indium gallium diselenide polycrystalline thin film solar cell devices /." Connect to title online (Scholars' Bank) Connect to title online (ProQuest), 2008. http://hdl.handle.net/1794/8588.
Повний текст джерелаTypescript. Includes vita and abstract. Includes bibliographical references (leaves 112-117). Also available online in Scholars' Bank; and in ProQuest, free to University of Oregon users.
Lee, Jinwoo 1973. "Metastability of copper indium gallium diselenide polycrystalline thin film solar cell devices." Thesis, University of Oregon, 2008. http://hdl.handle.net/1794/8588.
Повний текст джерелаHigh efficiency thin film solar cells have the potential for being a world energy solution because of their cost-effectiveness. Looking to the future of solar energy, there is the opportunity and challenge for thin film solar cells. The main theme of this research is to develop a detailed understanding of electronically active defect states and their role in limiting device performance in copper indium gallium diselenide (CIGS) solar cells. Metastability in the CIGS is a good tool to manipulate electronic defect density and thus identify its effect on the device performance. Especially, this approach keeps many device parameters constant, including the chemical composition, grain size, and interface layers. Understanding metastability is likely to lead to the improvement of CIGS solar cells. We observed systematic changes in CIGS device properties as a result of the metastable changes, such as increases in sub-bandgap defect densities and decreases in hole carrier mobilities. Metastable changes were characterized using high frequency admittance spectroscopy, drive-level capacitance profiling (DLCP), and current-voltage measurements. We found two distinctive capacitance steps in the high frequency admittance spectra that correspond to (1) the thermal activation of hole carriers into/out of acceptor defect and (2) a temperature-independent dielectric relaxation freeze-out process and an equivalent circuit analysis was employed to deduce the dielectric relaxation time. Finally, hole carrier mobility was deduced once hole carrier density was determined by DLCP method. We found that metastable defect creation in CIGS films can be made either by light-soaking or with forward bias current injection. The deep acceptor density and the hole carrier density were observed to increase in a 1:1 ratio, which seems to be consistent with the theoretical model of V Cu -V Se defect complex suggested by Lany and Zunger. Metastable defect creation kinetics follows a sub-linear power law in time and intensity. Numerical simulation using SCAPS-1D strongly supports a compensated donor- acceptor conversion model for the experimentally observed metastable changes in CIGS. This detailed numerical modeling yielded qualitative and quantitative agreement even for a specially fabricated bifacial CIGS solar cell. Finally, the influence of reduced hole carrier mobility and its role in limiting device performance was investigated.
Adviser: J. David Cohen
Kang, Jun. "Thin film CdTe as high energy x-ray detector material for medical applications." Connect to full text in OhioLINK ETD Center, 2008. http://rave.ohiolink.edu/etdc/view?acc_num=toledo1228060515.
Повний текст джерелаMuftah, G. E. A. "Research and development of CuInTe2 and CdTe based thin film PV solar cells." Thesis, Sheffield Hallam University, 2010. http://shura.shu.ac.uk/20098/.
Повний текст джерелаKung, Kenneth Ting-Yuan. "Polycrystalline Si thin films and devices : I. Seed selection through ion channeling II. Thin-film transistors." Thesis, Massachusetts Institute of Technology, 1988. http://hdl.handle.net/1721.1/69699.
Повний текст джерелаGarza, Ezra. "Pulsed Laser Deposition of Thin Film Heterostructures." ScholarWorks@UNO, 2011. http://scholarworks.uno.edu/td/459.
Повний текст джерелаRIMMAUDO, Ivan. "Study of structure and electronic properties of high performance CdTe solar cells by electrical investigation." Doctoral thesis, 2013. http://hdl.handle.net/11562/546550.
Повний текст джерелаElectrical characterization is a powerful investigation method for semiconductor devices. Compared to other types of characterization, its main advantage consists in the possibility to analyze the finished devices. For many kinds of technologies this issue is mandatory to understand deeply the device structure, its operation mechanism and how the materials can change during the fabrication process. Therefore, electrical characterization techniques represent probably the most important feedback in the device development. In this thesis a possible methodology to investigate thin films solar cells by means of some electrical characterization techniques will be described. Moreover I will show how these methodologies have been used to extract important information for CdS/CdTe solar cells fabricated in our laboratories. This information has been very useful to develop and optimize a low temperature (< 450 °C) production process so to be able to achieve CdTe solar cells with efficiency exceeding 14 % (best cases over 15 %). In general, the investigations which constitute the chapters of this thesis, have been approached changing in reasonable manner important process parameters and, then, analyzing the resulting effects on the electronic and structural properties of the materials and consequently on the devices. It is known that CdTe needs a special “activation treatment” to perform high efficiency devices. This treatment has been studied to further assess the “magic” benefits on the CdTe semiconductor properties. Two different activation treatments have been optimized in our labs. The first is based on a mixture of gases Ar and difluorochlorometane (Freon®), already used by other researchers, who demonstrated its effectiveness on CdTe cells fabricated at high temperature. The second is based on the deposition of a liquid solution of CdCl2 in methanol and a subsequent annealing in air. Solar cells with CdTe treated in these two different ways were fabricated and analyzed also by means of electrical characterization. Results were compared also with cells fabricated at high temperature kindly provided by Parma University. CdCl2 treatment was able to recrystallize the low temperature deposited CdTe also by improving the electrical properties, while the gaseous treatment was demonstrated to be weak in increasing the carriers concentration but, at the same time, too invasive in affecting the intermixed layer at the CdS/CdTe interface, with an excess of sulfur diffusion. The treatment based on liquid CdCl2 has been further investigated modulating its effectiveness. Under-treated, sub-optimum, optimum and over-treated samples were prepared and analyzed, in order to address the changes involved by the activation treatment on the films composing the devices. It has been demonstrated that a strong connection between the treatment effectiveness and the defect concentration in CdTe polycrystals is present. The CdTe carrier concentration increases as treatment increases but at the same time recombination is also enhanced by the deep defects close to the junction, the optimum treatment represent the best tradeoff between this two phenomena. Another important issue in thin film devices is the absorber thickness, which is desired to be as small as possible. Unfortunately the scaling is usually challenging. By preparing several numbers of cells with different CdTe thickness, it has been demonstrated that the problems connected with thickness are not only light absorption and films homogeneity, but most important they are mainly generated by different materials composition and different transport mechanism. Within this study solar cells with 1.5 µm of CdTe and efficiency exceeding 10 % have been fabricated. Finally, the performance degradation of CdTe solar cells with Cu/Au back contact has also been investigated by electrical characterization. Identical samples were stressed for long time in different condition of light, temperature and electrical bias. Different Cu migration has been observed for the different kinds of stresses, excluding the hypothesis that at different stresses it corresponds just only a different diffusion speed. Moreover we conclude that probably Cu in our samples does not migrate as positively ionized like it has been proposed by other authors, but in negative or neutral configuration generating middle band defects, which enhance recombination.
Zan, Hsiao Wen, and 冉曉雯. "Unified Characterization of Polycrystalline Silicon Thin-Film Transistors and Novel Structures of Polycrystalline Silicon Thin-Film Transistors." Thesis, 2003. http://ndltd.ncl.edu.tw/handle/57597955664005905124.
Повний текст джерела國立交通大學
電子工程系
91
In this dissertation, the dimensional effects of polycrystalline silicon thin-film transistors (poly-Si TFTs) are studied. By fabricating and characterizing poly-Si TFTs with various channel geometry, different channel thickness, and different grain size. Short channel effects and narrow width effects are investigated and discussed carefully. A physically-based model describing the impact ionization effect is also established and compared with experiment results. In order to suppress the severe short channel effects of poly-Si TFTs, two kinds of novel structures are also proposed and demonstrated. They are found to exhibit better immunity to the kink effects and better performances than their conventional counterparts. Important characteristics such as parasitic effects and reliability issues of these novel poly-Si TFTs are also carefully investigated. First, we focus on studying the short channel effects of poly-Si TFTs. By extracting parameters such as threshold voltage, subthreshold swing, and field-effect mobility, typical short channel effects including threshold voltage roll-off and impact ionization effects under high electric field are discussed. The single transistor latch phenomenon is also observed in short-channel devices under high drain field, the underlying floating body mechanism and its hysteresis phenomenon can be suppressed for devices with narrow channel width. Moreover, the substrate current of devices with various channel length is measured directly from the body contact. Excluding the parasitic band-to-band tunneling current generated from the junction between inversion layer and body region, the electric-field dependent impact ionization current is observed and characterized. A physically-based model considering the vertical-field scattering effect is established to explain the behavior of impact ionization current. Good agreements are found between simulated and measured data through a wide range of gate voltage at various drain voltages. Then, the narrow channel effects are studied by using multichannel structures. The influences of side channel, RIE-induced edge defects and channel trap density are separately discussed by different groups of test devices. The RIE-induced edge defects are found to degrade devices performance when the channel width is wide. The trap density reduction with decreasing channel width, however, compensates this degradation and starts to enhance device performances when the channel width is scaled down to be comparable with the grain size. A novel poly-Si TFTs with ultrathin channel and tungsten-clad source/drain is then fabricated and demonstrated. Channel thickness of 30 nm is used to suppress the floating body effect by reducing body neutral region. To prevent the enormous parasitic source/drain resistance of ultrathin film from degrading device performances, tungsten film is deposited on the source/drain and gate regions by selectively deposition technology. The resulting parasitic resistance of proposed devices is then extracted by analyzing characteristics of devices with various channel length. It is compared with that of conventional ultrathin-channel devices and also the thick channel devices. It is found that the cladding tungsten film effectively reduce the source/drain resistance as expected. Then, a physically-based model describing the linear region transconductance including the parasitic resistance effects is derived. Simulated data are compared with measured data for devices with short channel length. Good agreements are obtained to verify the behavior of parasitic-resistance dominant transconductance as well as the parasitic-resistance dominant field effect mobility. Finally, the output resistance and voltage gain of proposed devices operated under high voltages are also investigated. Good performances are found to ensure the capability of applying the proposed TFTs on both high-speed and high-gain circuitry. Finally, a novel W-spacer short channel poly-Si TFT is fabricated. The W spacer is also formed by selectively W deposition at low temperature. No additional masks or RIE process is needed, leading to reduced production cost and less plasma damage. The spacer thickness can be controlled by changing deposition time. Generally, 600-nm-thick spacer is achievable since W deposition has a very long incubation time on oxide film. While compared with conventional TFTs, small-dimensional W-spacer TFTs have lower leakage current and comparable driving ability. This is because the LDD regions under W-spacers reduce the drain electric field and therefore lower the leakage current. When devices operated under ON state, the series resistance in the LDD region does not degrade the performance of W-spacer TFTs obviously since the W-spacer acts as a part of gate electrode to induce channel. To further study W-spacer TFTs, devices with different channel thickness, spacer thickness and LDD dopant density are fabricated and compared. It is found that W-spacer TFTs with thinner channel thickness have lower leakage current and less pronounced kink effect. This can be explained by the reduced leakage cross sectional area and smaller floating body region in thinner channel. When spacer thickness increases, the turn on current decreases slightly while the kink effect efficiently suppressed by the wider LDD region. The dopant density of LDD regions also influences the kink effect obviously. More lightly doped LDD region reduces drain electric field more efficiently. During plasma passivation process, it is also found that W film will block NH3 molecules from entering the channel region. Therefore, the passivaiton effect will be varied with different spacer thickness and various channel geometries. For devices with small dimension and thinner spacer thickness, devices exhibit better performance since they have better passivation condition. Finally, the hot-carrier reliability of W-spacer TFTs is also investigated by introducing hot-carrier stress. It is found that W-spacer TFTs have better reliability than conventional ones because they have lower drain electric field, which suppresses the impact ionization effect during hot-carrier stress.
Lien, Wen-Hung, and 連文宏. "Study of polycrystalline silicon thin film transistors." Thesis, 1995. http://ndltd.ncl.edu.tw/handle/57694513232941617495.
Повний текст джерела國立交通大學
應用化學系
83
The solid pases recrystallization of amorphous silicon ( α-Si ) films deposited by a low-pressure chemical vapor deposition system using disilane (Si2H6) gas at various annealing conditions are investigated. The grain sizes of recrystallized films formed from Si2H6 are larger than that formed from SiH4. The maximum grain size is obtained at the deposition temperature of 475℃, where the nucleation rate is minimum due to the maximum structural disorder of the Si network. The structural disorder increases not only by lowering the substrate temperature but also by increasing the deposition rate. A significant improvements concerning electrical characteristics are achieved due to the great grain size. A new method which combinates low-temperature furnace annealing and high-temperature rapid thermal annealing leads to obtained high- quality poly-Si films and to reduce the long annealing time for solid phase crystallization(SPC) of amorphous silicon films. The low temperature oxide films deposited at 200℃ by photochemical- assisted vapor deposition process can be used to combinate the recrystallized poly-Si films to achieve the low temperature fabrication of Poly-Si TFTs.We also obtaine excellent electrical characteristics, even though the maximum temperature during the TFT fabrication process is only 600 ℃.