Статті в журналах з теми "Atomic-resolution TEM"
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Bell, David C., Christopher J. Russo, and Dmitry V. Kolmykov. "40keV atomic resolution TEM." Ultramicroscopy 114 (March 2012): 31–37. http://dx.doi.org/10.1016/j.ultramic.2011.12.001.
Повний текст джерелаYagi, K., H. Sato, K. Kobayashi, Y. Nishiyama, and Y. Tanaka. "TEM study of Si surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 1 (August 1992): 280–81. http://dx.doi.org/10.1017/s0424820100121806.
Повний текст джерелаLee, Yangjin, Jun-Yeong Yoon, Hu Young Jeong, and Kwanpyo Kim. "Atomic-Resolution TEM Imaging of Phosphorene Protected by Graphene." Microscopy and Microanalysis 25, S2 (August 2019): 1696–97. http://dx.doi.org/10.1017/s1431927619009218.
Повний текст джерелаHashimoto, Hatsujiro. "Contribution of Atomic-Level TEM to Resolution of Structure." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 4–5. http://dx.doi.org/10.1017/s042482010017877x.
Повний текст джерелаCochrane, Heather D., John L. Hutchison, and Donald White. "Surface studies of catalytic ceria using atomic-resolution tem." Ultramicroscopy 31, no. 1 (September 1989): 138–42. http://dx.doi.org/10.1016/0304-3991(89)90044-2.
Повний текст джерелаKrakow, William, David P. Divincenzo, Peter A. Bancel, Eric Cockayne, and Veit Elser. "High-resolution TEM of Al-Cu-Fe quasicrystals." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 1 (August 1992): 118–19. http://dx.doi.org/10.1017/s0424820100120990.
Повний текст джерелаZhang, Xiao Feng, and Takeo Kamino. "Imaging Gas-Solid Interactions in an Atomic Resolution Environmental TEM." Microscopy Today 14, no. 5 (September 2006): 16–19. http://dx.doi.org/10.1017/s1551929500058600.
Повний текст джерелаKujawa, S., B. Freitag, and D. Hubert. "An Aberration Corrected (S)TEM Microscope for Nanoresearch." Microscopy Today 13, no. 4 (July 2005): 16–21. http://dx.doi.org/10.1017/s1551929500053608.
Повний текст джерелаZhang, Xiao Feng. "Enabling Lab-in-Gap Transmission Electron Microscopy at Atomic Resolution." Microscopy Today 24, no. 1 (January 2016): 24–29. http://dx.doi.org/10.1017/s1551929515000930.
Повний текст джерелаHasegawa, Tsuyoshi, Kunio Kobayashi, Nobuyuki Ikarashi, Kunio Takayanagi, and Katsumichi Yagi. "Atomic Resolution TEM Images of the Au(001) Reconstructed Surface." Japanese Journal of Applied Physics 25, Part 2, No. 5 (May 20, 1986): L366—L368. http://dx.doi.org/10.1143/jjap.25.l366.
Повний текст джерелаTakeda, Seiji, and Hideto Yoshida. "Atomic-resolution environmental TEM for quantitativein-situmicroscopy in materials science." Microscopy 62, no. 1 (January 16, 2013): 193–203. http://dx.doi.org/10.1093/jmicro/dfs096.
Повний текст джерелаKohno, Y., S. Morishita, and N. Shibata. "New STEM/TEM Objective Lens for Atomic Resolution Lorentz Imaging." Microscopy and Microanalysis 23, S1 (July 2017): 456–57. http://dx.doi.org/10.1017/s1431927617002963.
Повний текст джерелаSuenaga, K., T. Sasaki, and H. Sawada. "Low-Voltage TEM/STEM for Atomic Resolution Imaging and Spectroscopy." Microscopy and Microanalysis 19, S2 (August 2013): 1220–21. http://dx.doi.org/10.1017/s143192761300809x.
Повний текст джерелаO'Keefe, MA, LF Allard, SJ Pennycook, and DA Blom. "Transcending the One-Ångström Atomic Resolution Barrier in the TEM." Microscopy and Microanalysis 12, S02 (July 31, 2006): 162–63. http://dx.doi.org/10.1017/s1431927606069625.
Повний текст джерелаTai, Kuo-Lun, Guan-Min Huang, Chun-Wei Huang, Tsung-Chun Tsai, Shih-Kuang Lee, Ting-Yi Lin, Yu-Chieh Lo, and Wen-Wei Wu. "Observing phase transformation in CVD-grown MoS2via atomic resolution TEM." Chemical Communications 54, no. 71 (2018): 9941–44. http://dx.doi.org/10.1039/c8cc05129a.
Повний текст джерелаKisielowski, Christian. "What Are Present Limits of Quantitative High Resolution Tem?" Microscopy and Microanalysis 3, S2 (August 1997): 935–36. http://dx.doi.org/10.1017/s1431927600011569.
Повний текст джерелаBoyes, E. D., J. Ringnalda, M. A. J. van der Stam, T. F. Fliervoet, and E. Van Cappellen. "A 2-2-2 200kv Field Emission STEM/TEM System." Microscopy and Microanalysis 7, S2 (August 2001): 232–33. http://dx.doi.org/10.1017/s1431927600027239.
Повний текст джерелаJosé-Yacamán, M., M. Marín-Almazo, and J. A. Ascencio. "High Resolution TEM Studies On Palladium, Rhodium Nanoparticles." Microscopy and Microanalysis 7, S2 (August 2001): 1100–1101. http://dx.doi.org/10.1017/s1431927600031573.
Повний текст джерелаHowe, J. M. "High-resolution tem of transformation interfaces in metals." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 284–87. http://dx.doi.org/10.1017/s0424820100126287.
Повний текст джерелаMurakoshi, H., M. Ichihashi, and H. Kakibayashi. "A 300-kV field-emission Transmission Electron Microscope." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 936–37. http://dx.doi.org/10.1017/s0424820100129310.
Повний текст джерелаMehraeen, Shareghe, Joseph T. McKeown, Pushkarraj V. Deshmukh, James E. Evans, Patricia Abellan, Pinghong Xu, Bryan W. Reed, Mitra L. Taheri, Paul E. Fischione, and Nigel D. Browning. "A (S)TEM Gas Cell Holder with Localized Laser Heating forIn SituExperiments." Microscopy and Microanalysis 19, no. 2 (March 4, 2013): 470–78. http://dx.doi.org/10.1017/s1431927612014419.
Повний текст джерелаBalmes, Olivier, Jan-Olle Malm, Niklas Pettersson, Gunnel Karlsson, and Jan-Olov Bovin. "Imaging Atomic Structure in Metal Nanoparticles Using High-Resolution Cryo-TEM." Microscopy and Microanalysis 12, no. 2 (December 9, 2005): 145–50. http://dx.doi.org/10.1017/s1431927606060119.
Повний текст джерелаKim, S., W. Wang, J. Phillips, and X. Pan. "Atomic Resolution TEM Study on Quantum Dots in ZnSe/ZnTe Heterostructure." Microscopy and Microanalysis 17, S2 (July 2011): 1646–47. http://dx.doi.org/10.1017/s143192761100910x.
Повний текст джерелаHashimoto, Ai, Hideki Sako, Junichiro Sameshima, Masayuki Nakamura, Takayuki Kobayashi, Shinichi Motoyama, and Yuji Otsuka. "Structural Characterization of a Ga2O3 Epitaxial Layer Grown on a Sapphire Substrate Using Cross-Sectional and Plan-View TEM/STEM Analysis." Materials Science Forum 1004 (July 2020): 505–11. http://dx.doi.org/10.4028/www.scientific.net/msf.1004.505.
Повний текст джерелаSchamp, C. T. "High-Resolution Metrology in the TEM." Microscopy Today 20, no. 3 (May 2012): 46–49. http://dx.doi.org/10.1017/s1551929512000363.
Повний текст джерелаKlie, Robert F., Craig Johnson, and Yimei Zhu. "Atomic-Resolution STEM in the Aberration-Corrected JEOL JEM2200FS." Microscopy and Microanalysis 14, no. 1 (January 3, 2008): 104–12. http://dx.doi.org/10.1017/s1431927608080136.
Повний текст джерелаKryshtab, T., H. A. Calderon, and A. Kryvko. "Microstructure Characterization of Metal Mixed Oxides." MRS Advances 2, no. 64 (2017): 4025–30. http://dx.doi.org/10.1557/adv.2017.591.
Повний текст джерелаRadmilovic, Velimir, and Michael A. O'Keefe. "Fresnel effect in high-resolution TEM imaging of small particles." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 564–65. http://dx.doi.org/10.1017/s0424820100139196.
Повний текст джерелаCho, Philip, Aihua Wood, Krishnamurthy Mahalingam, and Kurt Eyink. "Defect Detection in Atomic Resolution Transmission Electron Microscopy Images Using Machine Learning." Mathematics 9, no. 11 (May 27, 2021): 1209. http://dx.doi.org/10.3390/math9111209.
Повний текст джерелаZhang, Daliang, Yihan Zhu, Lingmei Liu, Xiangrong Ying, Chia-En Hsiung, Rachid Sougrat, Kun Li, and Yu Han. "Atomic-resolution transmission electron microscopy of electron beam–sensitive crystalline materials." Science 359, no. 6376 (January 18, 2018): 675–79. http://dx.doi.org/10.1126/science.aao0865.
Повний текст джерелаMartis, Joel, Ze Zhang, Hao-Kun Li, Ann Marshall, Roy Kim, and Arun Majumdar. "Design and Construction of an Optical TEM Specimen Holder." Microscopy Today 29, no. 5 (September 2021): 40–44. http://dx.doi.org/10.1017/s1551929521001103.
Повний текст джерелаZhang, Zhenyu, Junfeng Cui, Bo Wang, Haiyue Jiang, Guoxin Chen, Jinhong Yu, Chengte Lin, et al. "In situ TEM observation of rebonding on fractured silicon carbide." Nanoscale 10, no. 14 (2018): 6261–69. http://dx.doi.org/10.1039/c8nr00341f.
Повний текст джерелаTakeguchi, M., T. Honda, Y. Ishida, M. Kersker, M. Tanaka, and K. Furuya. "Ultrahigh-Vacuum Field-Emission Electron Microscope as Applied to Observation and Analysis of Crystal Surface." Microscopy and Microanalysis 3, S2 (August 1997): 597–98. http://dx.doi.org/10.1017/s1431927600009879.
Повний текст джерелаLee, M. R. "Transmission electron microscopy (TEM) of Earth and planetary materials: A review." Mineralogical Magazine 74, no. 1 (February 2010): 1–27. http://dx.doi.org/10.1180/minmag.2010.074.1.1.
Повний текст джерелаLinck, Martin, Peter Hartel, Stephan Uhlemann, Frank Kahl, Heiko Müller, Joachim Zach, Johannes Biskupek, Marcel Niestadt, Ute Kaiser, and Max Haider. "Performance of the SALVE-microscope: Atomic-resolution TEM Imaging at 20 kV." Microscopy and Microanalysis 22, S3 (July 2016): 878–79. http://dx.doi.org/10.1017/s1431927616005237.
Повний текст джерелаSchabes-Retchkiman, P. S., and L. Rendon. "Observation of catalytic Cu in methanol synthesis catalysts by atomic-resolution TEM." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 4 (August 1990): 284–85. http://dx.doi.org/10.1017/s0424820100174552.
Повний текст джерелаGao, Wenpei, Jianbo Wu, Xiaofeng Zhang, Aram Yoon, J. Mabon, W. Swiech, W. L. Wilson, H. Yang, and Jian-Min Zuo. "Surface Atomic Diffusion Processes Observed at Milliseconds Time Resolution using Environmental TEM." Microscopy and Microanalysis 20, S3 (August 2014): 1590–91. http://dx.doi.org/10.1017/s1431927614009684.
Повний текст джерелаVan Aert, S., A. J. den Dekker, and D. Van Dyck. "How to optimize the experimental design of quantitative atomic resolution TEM experiments?" Micron 35, no. 6 (August 2004): 425–29. http://dx.doi.org/10.1016/j.micron.2004.01.007.
Повний текст джерелаJinschek, Joerg R., Emrah Yucelen, Bert Freitag, Hector A. Calderon, and Andy Steinbach. "Still “Plenty of Room at the Bottom” for Aberration-Corrected TEM." Microscopy Today 19, no. 3 (April 28, 2011): 10–14. http://dx.doi.org/10.1017/s155192951100023x.
Повний текст джерелаLechner, Lorenz, Johannes Biskupek, and Ute Kaiser. "Improved Focused Ion Beam Target Preparation of (S)TEM Specimen—A Method for Obtaining Ultrathin Lamellae." Microscopy and Microanalysis 18, no. 2 (March 21, 2012): 379–84. http://dx.doi.org/10.1017/s1431927611012499.
Повний текст джерелаGai, PL. "Atomic Resolution In-situ Environmental (Scanning) TEM (ES/TEM) for Probing Gas-Solid Reactions: Applications and Opportunities." Microscopy and Microanalysis 12, S02 (July 31, 2006): 48–49. http://dx.doi.org/10.1017/s1431927606069546.
Повний текст джерелаChen, James. "Advancing Single-Particle EM towards Atomic Resolution." Acta Crystallographica Section A Foundations and Advances 70, a1 (August 5, 2014): C854. http://dx.doi.org/10.1107/s2053273314091451.
Повний текст джерелаIsabell, T., J. Brink, M. Kawasaki, B. Armbruster, I. Ishikawa, E. Okunishi, H. Sawada, et al. "Development of a 200kV Atomic Resolution Analytical Electron Microscope." Microscopy Today 17, no. 3 (May 2009): 8–11. http://dx.doi.org/10.1017/s1551929500050045.
Повний текст джерелаYu, Rong, Wei Zhan, Mo-Rigen He, Sirong Lu, and Jing Zhu. "Direct Atomic Imaging of Oxide Surfaces." Acta Crystallographica Section A Foundations and Advances 70, a1 (August 5, 2014): C1614. http://dx.doi.org/10.1107/s2053273314083855.
Повний текст джерелаKrakow, William. "In situ evaporation in a high-resolution TEM." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 446–47. http://dx.doi.org/10.1017/s0424820100086532.
Повний текст джерелаQian, M., M. Sarikaya, and E. A. Stern. "Local Temperature Determination Using Elfs Spectroscopy." Microscopy and Microanalysis 3, S2 (August 1997): 997–98. http://dx.doi.org/10.1017/s1431927600011879.
Повний текст джерелаCarlino, Elvio. "In-Line Holography in Transmission Electron Microscopy for the Atomic Resolution Imaging of Single Particle of Radiation-Sensitive Matter." Materials 13, no. 6 (March 20, 2020): 1413. http://dx.doi.org/10.3390/ma13061413.
Повний текст джерелаIshida, Y., Y. Bando, Y. Kitami, T. Tomita, and M. Kersker. "Development of a 300 kV field emission TEM." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 1080–81. http://dx.doi.org/10.1017/s0424820100151234.
Повний текст джерелаDeRose, J. A., and J. P. Revel. "Examination of Atomic (Scanning) Force Microscopy Probe Tips with the Transmission Electron Microscope." Microscopy and Microanalysis 3, no. 3 (May 1997): 203–13. http://dx.doi.org/10.1017/s143192769797015x.
Повний текст джерелаDeng, Yu, Ruopeng Zhang, Jim Ciston, Karen C. Bustillo, Colin Ophus, and Andrew Minor. "Atomic-resolution Probing of Anion Migration in Perovskites with In-situ (S)TEM." Microscopy and Microanalysis 27, S1 (July 30, 2021): 170–71. http://dx.doi.org/10.1017/s1431927621001215.
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