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Статті в журналах з теми "Atomic Force Microscopy imaging"

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Автор: Grafiati

Опубліковано: 10 грудня 2022

Оновлено: 28 січня 2023

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1

Patel, Anisha N., and Christine Kranz. "(Multi)functional Atomic Force Microscopy Imaging." Annual Review of Analytical Chemistry 11, no. 1 (June 12, 2018): 329–50. http://dx.doi.org/10.1146/annurev-anchem-061417-125716.

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Incorporating functionality to atomic force microscopy (AFM) to obtain physical and chemical information has always been a strong focus in AFM research. Modifying AFM probes with specific molecules permits accessibility of chemical information via specific reactions and interactions. Fundamental understanding of molecular processes at the solid/liquid interface with high spatial resolution is essential to many emerging research areas. Nanoscale electrochemical imaging has emerged as a complementary technique to advanced AFM techniques, providing information on electrochemical interfacial processes. While this review presents a brief introduction to advanced AFM imaging modes, such as multiparametric AFM and topography recognition imaging, the main focus herein is on electrochemical imaging via hybrid AFM-scanning electrochemical microscopy. Recent applications and the challenges associated with such nanoelectrochemical imaging strategies are presented.

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2

Schwartz, Gustavo Ariel, and Jaume Navarro. "Imaging by touching: Atomic force microscopy." Philosophy of Photography 9, no. 1 (April 1, 2018): 41–52. http://dx.doi.org/10.1386/pop.9.1.41_7.

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3

Curtin Carter, Margaret M. "Imaging fibers by atomic force microscopy." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 14, no. 3 (May 1996): 1867. http://dx.doi.org/10.1116/1.588569.

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4

Müller, Daniel J., and Kurt Anderson. "Biomolecular imaging using atomic force microscopy." Trends in Biotechnology 20, no. 8 (August 2002): S45—S49. http://dx.doi.org/10.1016/s0167-7799(02)02000-0.

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5

Ghosal, Sayan, and Murti Salapaka. "Fidelity imaging for atomic force microscopy." Applied Physics Letters 106, no. 1 (January 5, 2015): 013113. http://dx.doi.org/10.1063/1.4905633.

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6

Siperko, L. M., and W. J. Landis. "Atomic force microscopy imaging of hydroxyapatite." Journal of Materials Science Letters 12, no. 14 (1993): 1068–69. http://dx.doi.org/10.1007/bf00420523.

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7

Kirby, Andrew R., A. Patrick Gunning, and Victor J. Morris. "Imaging polysaccharides by atomic force microscopy." Biopolymers 38, no. 3 (December 6, 1998): 355–66. http://dx.doi.org/10.1002/(sici)1097-0282(199603)38:3<355::aid-bip8>3.0.co;2-t.

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8

Magonov, Sergei. "Phase Contrast Imaging in Atomic Force Microscopy." Microscopy and Microanalysis 3, S2 (August 1997): 1275–76. http://dx.doi.org/10.1017/s143192760001326x.

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Анотація:

Phase detection in TappingMode™ enhances capabilities of Atomic Force Microscopy (AFM) for soft samples (polymers and biological materials). Changes of amplitude and phase changes of a fast oscillating probe are caused by tip-sample force interactions. Height images reflect the amplitude changes, and in most cases they present a sample topography. Phase images show local differences between phases of free-oscillating probe and of probe interacting with a sample surface. These differences are related to the change of the resonance frequency of the probe either by attractive or repulsive tip-sample forces. Therefore phase detection helps to choose attractive or repulsive force regime for surface imaging and to minimize tip-sample force. For heterogeneous materials the phase imaging allows to distinguish individual components and to visualize their distribution due to differences in phase contrast. This is typically achieved in moderate tapping, when set-point amplitude, Asp, is about half of the amplitude of free-oscillating cantilever, Ao. In contrast, light tapping with Asp close to Ao is best suited for recording a true topography of the topmost surface layer of soft samples. Examples of phase imaging of polymers obtained with a scanning probe microscope Nanoscope® IIIa (Digital Instruments). Si probes (225 μk long, resonance frequencies 150-200 kHz) were used.

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9

Johnson, Lili L. "Atomic Force Microscopy (AFM) for Rubber." Rubber Chemistry and Technology 81, no. 3 (July 1, 2008): 359–83. http://dx.doi.org/10.5254/1.3548214.

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Abstract In this review, first, the development of atomic force microscopy as an imaging technique, as a surface force apparatus, and as a nanoindenter was illustrated using experimental studies. The experimental analysis of atomic force microscopy emphasizes the empirical methods of achieving high resolution imaging through controlled forces between tip and sample interactions. Second, mapping mechanical properties on nanometer scale by atomic force microscopy is presented with both experimental investigations and selection of elastic models. Elastomer crosslink density was mapped using atomic force microscopy combined with elastic theories. The force — penetration depth investigation of crosslink density for elastomer by AFM shows linear correction with both experimental studies using Dynamic Mechanical Thermal Analysis (DMTA) and classic swelling method and calculation using statistical rubber elasticity theory. Last, the focus is on the understanding of atomic force microscopy for practical applications. Filler dispersion and blends structure are demonstrated for automotive applications. Micro phase separation was intensely studied for film industries. Morphology of composites is investigated for the applications of tire, automotive and foaming industries.

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10

Magonov, Sergei. "High-Resolution Imaging with Atomic Force Microscopy." Microscopy Today 12, no. 5 (September 2004): 12–15. http://dx.doi.org/10.1017/s1551929500056248.

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The invention of scanning tunneling microscopy (STM) in 1982 revolutionized surface analysis by providing atomic-scale surface imaging of conducting and semiconducting materials. Shortly after that, atomic force microscopy (AFM) was introduced as an accessory of STM for high-resolution imaging of surfaces independent of their conductivity. Mechanical force interactions between a sharp tip placed at one end of a micro fabricated cantilever and a sample surface were employed for imaging in this method. In the past decade, AFM has developed into a leading scanning probe technique applied in many fields of fundamental and industrial research. The progress of AFM has been made possible by implementation of an optical level detection scheme, which allows precise measuring of the cantilever deflection caused by the tip-sample forces, by mass microfabrication of probes consisting of cantilevers, and by developments of oscillatory imaging modes, particularly, Tapping ModeTM.

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11

Fisher, K. A., M. G. L. Gustafsson, M. B. Shattuck, and J. Clarke. "Cryogenic atomic force microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 54–55. http://dx.doi.org/10.1017/s0424820100084570.

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The atomic force microscope (AFM) is capable of imaging electrically conductive and non-conductive surfaces at atomic resolution. When used to image biological samples, however, lateral resolution is often limited to nanometer levels, due primarily to AFM tip/sample interactions. Several approaches to immobilize and stabilize soft or flexible molecules for AFM have been examined, notably, tethering coating, and freezing. Although each approach has its advantages and disadvantages, rapid freezing techniques have the special advantage of avoiding chemical perturbation, and minimizing physical disruption of the sample. Scanning with an AFM at cryogenic temperatures has the potential to image frozen biomolecules at high resolution. We have constructed a force microscope capable of operating immersed in liquid n-pentane and have tested its performance at room temperature with carbon and metal-coated samples, and at 143° K with uncoated ferritin and purple membrane (PM).

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12

Montelius, L. "Direct observation of the atomic force microscopy tip using inverse atomic force microscopy imaging." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 12, no. 3 (May 1994): 2222. http://dx.doi.org/10.1116/1.587746.

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13

Nievergelt, Adrian P., Jonathan D. Adams, Pascal D. Odermatt, and Georg E. Fantner. "High-frequency multimodal atomic force microscopy." Beilstein Journal of Nanotechnology 5 (December 22, 2014): 2459–67. http://dx.doi.org/10.3762/bjnano.5.255.

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Multifrequency atomic force microscopy imaging has been recently demonstrated as a powerful technique for quickly obtaining information about the mechanical properties of a sample. Combining this development with recent gains in imaging speed through small cantilevers holds the promise of a convenient, high-speed method for obtaining nanoscale topography as well as mechanical properties. Nevertheless, instrument bandwidth limitations on cantilever excitation and readout have restricted the ability of multifrequency techniques to fully benefit from small cantilevers. We present an approach for cantilever excitation and deflection readout with a bandwidth of 20 MHz, enabling multifrequency techniques extended beyond 2 MHz for obtaining materials contrast in liquid and air, as well as soft imaging of delicate biological samples.

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14

Schön, Peter. "Imaging and force probing RNA by atomic force microscopy." Methods 103 (July 2016): 25–33. http://dx.doi.org/10.1016/j.ymeth.2016.05.016.

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15

Eghiaian, Frédéric, Felix Rico, Adai Colom, Ignacio Casuso, and Simon Scheuring. "High-speed atomic force microscopy: Imaging and force spectroscopy." FEBS Letters 588, no. 19 (June 14, 2014): 3631–38. http://dx.doi.org/10.1016/j.febslet.2014.06.028.

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16

Prater, C. B. "New tools for Atomic Force Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 716–17. http://dx.doi.org/10.1017/s0424820100139950.

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Анотація:

The Atomic Force Microscope (AFM) has been widely used in the physics, chemistry, and materials science communities, and is becoming more common in life sciences research. To better serve the biological community, new instruments have been developed recently that combine AFM and various forms of optical microscopy including EPI-fluorescence, DIC, and confocal microscopy. In addition, new techniques like fluid Tapping Mode™ have been developed to allow gentle, non-destructive imaging of biological samples, including live specimens in physiological conditions. Other new techniques can provide information about sample elasticity or molecular adhesion along with nanometerscale topography measurements.Until recently, most AFMs scanned the sample under a stationary probe using a small piezoelectric scanner. This arrangement placed serious limits on the size and type of sample that could be used as a sample substrate. Now instruments have been developed that scan the AFM probe over a fixed sample that then allows imaging of larger, more convenient sample substrates, including cover slips, slides, and even petri dishes.

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17

FUNAMI, Takahiro. "Atomic Force Microscopy Imaging of Food Polysaccharides." Food Science and Technology Research 16, no. 1 (2010): 1–12. http://dx.doi.org/10.3136/fstr.16.1.

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18

Toh, Alexander Kang-Jun, and Vivian Ng. "Tomographic imaging using conductive atomic force microscopy." Materials Characterization 186 (April 2022): 111783. http://dx.doi.org/10.1016/j.matchar.2022.111783.

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19

Gonçalves, R. P. "Atomic Force Microscopy Imaging of Membrane Proteins." Acta Physica Polonica A 117, no. 2 (February 2010): 408–11. http://dx.doi.org/10.12693/aphyspola.117.408.

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20

Barrett, R. C., and C. F. Quate. "Imaging polished sapphire with atomic force microscopy." Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 8, no. 1 (January 1990): 400–402. http://dx.doi.org/10.1116/1.576406.

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21

Platz, Daniel, Erik A. Tholén, Carsten Hutter, Arndt C. von Bieren, and David B. Haviland. "Phase imaging with intermodulation atomic force microscopy." Ultramicroscopy 110, no. 6 (May 2010): 573–77. http://dx.doi.org/10.1016/j.ultramic.2010.02.012.

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22

Mazzola, L. T., and S. P. Fodor. "Imaging biomolecule arrays by atomic force microscopy." Biophysical Journal 68, no. 5 (May 1995): 1653–60. http://dx.doi.org/10.1016/s0006-3495(95)80394-2.

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23

de Pablo, Pedro J., and Mariano Carrión-Vázquez. "Imaging Biological Samples with Atomic Force Microscopy." Cold Spring Harbor Protocols 2014, no. 2 (February 2014): pdb.top080473. http://dx.doi.org/10.1101/pdb.top080473.

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24

Berquand, Alexandre, Charles Roduit, Sandor Kasas, Andreas Holloschi, Leslie Ponce, and Mathias Hafner. "Atomic Force Microscopy Imaging of Living Cells." Microscopy Today 18, no. 6 (November 2010): 8–14. http://dx.doi.org/10.1017/s1551929510000957.

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Over the last two decades, Atomic Force Microscopy (AFM) has emerged as the tool of choice to image living organisms in a near-physiological environment. Whereas fluorescence microscopy techniques allow labeling and tracking of components inside cells and the observation of dynamic processes, AFM is mainly a surface technique that can be operated on a wide range of substrates including biological samples. AFM enables extraction of topographical, mechanical and chemical information from these samples.

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25

Kuznetsov, Yu G., A. J. Malkin, R. W. Lucas, M. Plomp, and A. McPherson. "Imaging of viruses by atomic force microscopy." Journal of General Virology 82, no. 9 (September 1, 2001): 2025–34. http://dx.doi.org/10.1099/0022-1317-82-9-2025.

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26

Umemura, Kazuo. "Imaging of neurons by atomic force microscopy." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 12, no. 3 (May 1994): 1470. http://dx.doi.org/10.1116/1.587318.

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27

Paredes, J. I., A. Martinez-Alonso, and J. M. D. Tascon. "Adhesion artefacts in atomic force microscopy imaging." Journal of Microscopy 200, no. 2 (November 2000): 109–13. http://dx.doi.org/10.1046/j.1365-2818.2000.00755.x.

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28

Dang, J. M. C., and L. Copeland. "Imaging Rice Grains Using Atomic Force Microscopy." Journal of Cereal Science 37, no. 2 (March 2003): 165–70. http://dx.doi.org/10.1006/jcrs.2002.0490.

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29

Kirby, Andrew R., A. Patrick Gunning, and Victor J. Morris. "Imaging xanthan gum by atomic force microscopy." Carbohydrate Research 267, no. 1 (February 1995): 161–66. http://dx.doi.org/10.1016/0008-6215(94)00294-p.

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30

Yamada, H., S. Okada, T. Fujii, M. Kageshima, A. Kawazu, H. Matsuda, H. Nakanishi, and K. Nakayama. "Imaging of polydiacetylenes by atomic force microscopy." Applied Surface Science 65-66 (March 1993): 366–70. http://dx.doi.org/10.1016/0169-4332(93)90687-7.

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31

Centoni, S. A., L. S. Vanasupa, and P. S. Tong. "Atomic force microscopy for ultrafiltration membrane imaging." Scanning 19, no. 4 (June 1997): 281–85. http://dx.doi.org/10.1002/sca.4950190406.

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32

Fried, G., K. Balss, and P. W. Bohn. "Imaging Electrochemical Controlled Chemical Gradients Using Pulsed Force Mode Atomic Force Microscopy." Microscopy and Microanalysis 6, S2 (August 2000): 726–27. http://dx.doi.org/10.1017/s1431927600036126.

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Анотація:

The electrochemical formation of gradients in self assembled monolayers has been demonstrated recently [1]. The capacity to image these gradients provides useful information on the physical chemistry of electrochemical striping.Imaging chemical gradients requires the ability to sense the chemical moiety on the top of the self-assembled monolayer. This has been accomplished by derivatizing an atomic force microscope (AFM) tip with molecules selected to have specific interactions with the sample in a technique known as chemical force microscopy [2]. Typical tapping mode AFM is then used to image the sample; the tip is oscillated vertically above the sample and the tip-sample interaction modulates the amplitude of the tip.The sample adhesion, sample stiffness, and sample topography all influence the oscillation amplitude of the tip. Pulsed Force Mode (PFM) [3] is an extension for atomic force microscopes. The PFM electronics introduces a sinusoidal modulation to the z-piezo of the AFM with an amplitude between 10 to 500 nm at a user selectable frequency between 100 Hz and 2 kHz.

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33

Sugawara, Yasuhiro, Hitoshi Ueyama, Takayuki Uchihashi, Masahiro Ohta, Seizo Morita, Mineharu Suzuki, and Shuzo Mishima. "True atomic resolution imaging with noncontact atomic force microscopy." Applied Surface Science 113-114 (April 1997): 364–70. http://dx.doi.org/10.1016/s0169-4332(96)00877-x.

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34

Yamanaka, Kazushi. "Ultrasonic Force Microscopy." MRS Bulletin 21, no. 10 (October 1996): 36–41. http://dx.doi.org/10.1557/s0883769400031626.

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As an imaging method of elastic properties and subsurface features on the microscopic scale, the scanning acoustic microscope (SAM) provides spatial resolution comparable or superior to that of optical microscopes. Nondestructive evaluation methods of defects and elastic properties on the microscopic scale were developed by using the SAM, and they have been widely applied to various fields in science and technology. One major problem in acoustic microscopy is resolution. The best resolution of SAM with water as the coupling fluid has been 240 nm at a frequency of 4.4 GHz. At a more conventional frequency of 1 GHz, the resolution is about 1 μm. Therefore the resolution of SAM is not always sufficient for examining nanoscale defects and advanced micro/nanodevices.For materials characterization on the nanometer scale, atomic force microscopy (AFM) was developed and extended in order to observe elastic properties in force-modulation mode. In the force-modulation mode, the sample is vibrated, and the resultant cantilever-deflection vibration is measured and used to produce elasticity images of objects. The lateral force-modulation AFM can evaluate the friction force or the shear elasticity in real time. However in the force-modulation mode, it is difficult to analyze stiff objects such as metals and ceramics.When the sample is vertically vibrated at ultrasonic frequencies much higher than the cantilever resonance frequency, the tip cannot vibrate due to the inertia of the cantilever. However by modulating the amplitude of the ultrasonic vibration, deflection vibration of the cantilever at the modulation frequency is excited due to the rectifier effect of the nonlinear force curves. Based on the tip-sample indentation during ultrasonic vibration, we developed ultrasonic force microscopy (UFM) for contact elasticity and subsurface imaging of rigid objects using a soft cantilever with a stiffness of the order of 0.1 N/m.

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35

Xia, Fangzhou, and Kamal Youcef-Toumi. "Review: Advanced Atomic Force Microscopy Modes for Biomedical Research." Biosensors 12, no. 12 (December 2, 2022): 1116. http://dx.doi.org/10.3390/bios12121116.

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Анотація:

Visualization of biomedical samples in their native environments at the microscopic scale is crucial for studying fundamental principles and discovering biomedical systems with complex interaction. The study of dynamic biological processes requires a microscope system with multiple modalities, high spatial/temporal resolution, large imaging ranges, versatile imaging environments and ideally in-situ manipulation capabilities. Recent development of new Atomic Force Microscopy (AFM) capabilities has made it such a powerful tool for biological and biomedical research. This review introduces novel AFM functionalities including high-speed imaging for dynamic process visualization, mechanobiology with force spectroscopy, molecular species characterization, and AFM nano-manipulation. These capabilities enable many new possibilities for novel scientific research and allow scientists to observe and explore processes at the nanoscale like never before. Selected application examples from recent studies are provided to demonstrate the effectiveness of these AFM techniques.

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36

Carmichael, Stephen W. "Atomic Resolution with the Atomic Force Microscope." Microscopy Today 3, no. 4 (May 1995): 6–7. http://dx.doi.org/10.1017/s1551929500063513.

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For biologic studies, atomic force microscopy (AFM) has been prevailing over scanning tunneling microscopy (STM) because it has the capability of imaging non-conducting biologic specimens. However, STM generally gives better resolution than AFM, and we're talking about resolution on the atomic scale. In a recent article, Franz Giessibl (Atomic resolution of the silicon (111)- (7X7) surface by atomic force microscopy, Science 267:68-71, 1995) has demonstrated that atoms can be imaged by AFM.

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37

Hues, Steven M., Richard J. Colton, Ernst Meyer, and Hans-Joachim Güntherodt. "Scanning Probe Microscopy of Thin Films." MRS Bulletin 18, no. 1 (January 1993): 41–49. http://dx.doi.org/10.1557/s088376940004344x.

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Atomic force microscopy (AFM) was invented in 1986 by Binnig, Quate, and Gerber as “a new type of microscope capable of investigating surfaces of insulators on an atomic scale.” Stemming from developments in scanning tunneling microscopy (STM), it became possible to image insulators, organic and biological molecules, salts, glasses, and metal oxides — some under a variety of conditions, e.g., ambient pressure, in aqueous or cryogenic liquids, etc. In 1987, Mate and co-workers introduced a new application for AFM where atomic-scale frictional forces could be measured. Likewise, in 1989, Burnham and Colton used the AFM to measure the surface forces and nano-mechanical properties of materials. Today, there are many examples of using AFM as a high-resolution profilometer, surface force probe, and nanoindentor. Several new imaging techniques have been introduced; each depending on the type of force measured, e.g., magnetic, electrostatic, and capacitative. Because of the diverse nature of the field and instrumentation, the names “scanned probe microscopy” and “XFM” (where X stands for the force being measured, e.g., MFM is magnetic force microscopy) have been adopted.

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38

Moreno-Madrid, Francisco, Natalia Martín-González, Aida Llauró, Alvaro Ortega-Esteban, Mercedes Hernando-Pérez, Trevor Douglas, Iwan A. T. Schaap, and Pedro J. de Pablo. "Atomic force microscopy of virus shells." Biochemical Society Transactions 45, no. 2 (April 13, 2017): 499–511. http://dx.doi.org/10.1042/bst20160316.

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Анотація:

Microscopes are used to characterize small objects with the help of probes that interact with the specimen, such as photons and electrons in optical and electron microscopies, respectively. In atomic force microscopy (AFM), the probe is a nanometric tip located at the end of a microcantilever which palpates the specimen under study just as a blind person manages a walking stick. In this way, AFM allows obtaining nanometric resolution images of individual protein shells, such as viruses, in a liquid milieu. Beyond imaging, AFM also enables not only the manipulation of single protein cages, but also the characterization of every physicochemical property capable of inducing any measurable mechanical perturbation to the microcantilever that holds the tip. In the present revision, we start revising some recipes for adsorbing protein shells on surfaces. Then, we describe several AFM approaches to study individual protein cages, ranging from imaging to spectroscopic methodologies devoted to extracting physical information, such as mechanical and electrostatic properties. We also explain how a convenient combination of AFM and fluorescence methodologies entails monitoring genome release from individual viral shells during mechanical unpacking.

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39

Kim, Byung I., and Ryan D. Boehm. "Imaging stability in force-feedback high-speed atomic force microscopy." Ultramicroscopy 125 (February 2013): 29–34. http://dx.doi.org/10.1016/j.ultramic.2012.09.012.

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40

Magonov, Sergei, and John Alexander. "Multifrequency Atomic Force Microscopy: Compositional Imaging with Electrostatic Force Measurements." Microscopy and Microanalysis 17, no. 4 (July 19, 2011): 587–97. http://dx.doi.org/10.1017/s1431927611000122.

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AbstractWe demonstrate that single-pass Kelvin force microscopy (KFM) and dC/dz measurements in different environments expand the compositional imaging with atomic force microscopy. The KFM and dC/dz studies were performed in the intermittent contact mode with force gradient detection of tip-sample electrostatic interactions. Both factors contribute to sensitive measurements of the surface potential and capacitance gradient with nanometer-scale spatial resolution as it was verified on a broad range of materials: metal alloys, polymers, organic layers, and liquid-like objects. For many samples the surface potential and dC/dz variations complement each other in identification of individual components of heterogeneous materials. In situ imaging in different humidity or vapors of various organic solvents further facilitate recognition of the constituents of multicomponent polymer samples due to selective swelling of components.

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41

Albrecht, T. R., and C. F. Quate. "Atomic resolution imaging of a nonconductor by atomic force microscopy." Journal of Applied Physics 62, no. 7 (October 1987): 2599–602. http://dx.doi.org/10.1063/1.339435.

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42

Gigler, Alexander M., Christian Dietz, Maximilian Baumann, Nicolás F. Martinez, Ricardo García, and Robert W. Stark. "Repulsive bimodal atomic force microscopy on polymers." Beilstein Journal of Nanotechnology 3 (June 20, 2012): 456–63. http://dx.doi.org/10.3762/bjnano.3.52.

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Анотація:

Bimodal atomic force microscopy can provide high-resolution images of polymers. In the bimodal operation mode, two eigenmodes of the cantilever are driven simultaneously. When examining polymers, an effective mechanical contact is often required between the tip and the sample to obtain compositional contrast, so particular emphasis was placed on the repulsive regime of dynamic force microscopy. We thus investigated bimodal imaging on a polystyrene-block-polybutadiene diblock copolymer surface and on polystyrene. The attractive operation regime was only stable when the amplitude of the second eigenmode was kept small compared to the amplitude of the fundamental mode. To clarify the influence of the higher eigenmode oscillation on the image quality, the amplitude ratio of both modes was systematically varied. Fourier analysis of the time series recorded during imaging showed frequency mixing. However, these spurious signals were at least two orders of magnitude smaller than the first two fundamental eigenmodes. Thus, repulsive bimodal imaging of polymer surfaces yields a good signal quality for amplitude ratios smaller than A 01 /A 02 = 10:1 without affecting the topography feedback.

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43

Silva, Luciano. "Imaging Proteins with Atomic Force Microscopy: An Overview." Current Protein & Peptide Science 6, no. 4 (August 1, 2005): 387–95. http://dx.doi.org/10.2174/1389203054546389.

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Martin, Yves, and H. Kumar Wickramasinghe. "Method for imaging sidewalls by atomic force microscopy." Applied Physics Letters 64, no. 19 (May 9, 1994): 2498–500. http://dx.doi.org/10.1063/1.111578.

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45

Broekmaat, Joska, Alexander Brinkman, Dave H. A. Blank, and Guus Rijnders. "High temperature surface imaging using atomic force microscopy." Applied Physics Letters 92, no. 4 (January 28, 2008): 043102. http://dx.doi.org/10.1063/1.2836943.

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46

Plodinec, M., M. Loparic, and U. Aebi. "Imaging Fibroblast Cells Using Atomic Force Microscopy (AFM)." Cold Spring Harbor Protocols 2010, no. 10 (October 1, 2010): pdb.prot5500. http://dx.doi.org/10.1101/pdb.prot5500.

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47

Plodinec, M., M. Loparic, and U. Aebi. "Imaging Collagen II Using Atomic Force Microscopy (AFM)." Cold Spring Harbor Protocols 2010, no. 10 (October 1, 2010): pdb.prot5501. http://dx.doi.org/10.1101/pdb.prot5501.

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48

Spanakis, E., A. Chimmalgi, E. Stratakis, C. P. Grigoropoulos, C. Fotakis, and P. Tzanetakis. "Atomic force microscopy based, multiphoton, photoelectron emission imaging." Applied Physics Letters 89, no. 1 (July 3, 2006): 013110. http://dx.doi.org/10.1063/1.2219120.

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49

Lyubchenko, Yuri L., Luda S. Shlyakhtenko, and Toshio Ando. "Imaging of nucleic acids with atomic force microscopy." Methods 54, no. 2 (June 2011): 274–83. http://dx.doi.org/10.1016/j.ymeth.2011.02.001.

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50

Evans, John J., James J. Muys, and Maan M. Alkaisi. "Atomic force microscopy technique for imaging pituitary cells." Frontiers in Neuroendocrinology 27, no. 1 (May 2006): 118. http://dx.doi.org/10.1016/j.yfrne.2006.03.333.

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