Добірка наукової літератури з теми "Analysis by backscattered electron diffraction (EBSD)"

Оформте джерело за APA, MLA, Chicago, Harvard та іншими стилями

Оберіть тип джерела:

Ознайомтеся зі списками актуальних статей, книг, дисертацій, тез та інших наукових джерел на тему "Analysis by backscattered electron diffraction (EBSD)".

Біля кожної праці в переліку літератури доступна кнопка «Додати до бібліографії». Скористайтеся нею – і ми автоматично оформимо бібліографічне посилання на обрану працю в потрібному вам стилі цитування: APA, MLA, «Гарвард», «Чикаго», «Ванкувер» тощо.

Також ви можете завантажити повний текст наукової публікації у форматі «.pdf» та прочитати онлайн анотацію до роботи, якщо відповідні параметри наявні в метаданих.

Статті в журналах з теми "Analysis by backscattered electron diffraction (EBSD)"

1

Goehner, R. P., and J. R. Michael. "Microdiffraction phase identification in the scanning electron microscope (SEM)." Powder Diffraction 19, no. 2 (2004): 100–103. http://dx.doi.org/10.1154/1.1757450.

Повний текст джерела
Анотація:
The identification of crystallographic phases in the scanning electron microscope (SEM) has been limited by the lack of a simple way to obtain electron diffraction data of an unknown while observing the microstructure of the specimen. With the development of charge coupled device (CCD)-based detectors, backscattered electron Kikuchi patterns, alternately referred to as electron backscattered diffraction (EBSD) patterns, can be easily collected. Previously, EBSD has been limited to crystallographic orientation studies due to the poor pattern quality collected with video rate detector systems. With CCD detectors, a typical EBSD can now be acquired from a micron or submicron sized crystal using an exposure time of 1–10 s with an accelerating voltage of 10–40 kV and a beam current as low as 0.1 nA. Crystallographic phase analysis using EBSD is unique in that the properly equipped SEM permits high magnification images, EBSDs, and elemental information to be collected from bulk specimens. EBSD in the SEM has numerous advantages over other electron beam-based crystallographic techniques. The large angular view (∼70°) provided by EBSD and the ease of specimen preparation are distinct advantages of the technique. No sample preparation beyond what is commonly used for SEM specimens is required for EBSD.
Стилі APA, Harvard, Vancouver, ISO та ін.
2

Hauegen, Christien G., Fabiane R. Freitas da Silva, Fernanda A. Sampaio da Silva, Jefferson Fabricio Cardoso Lins, and Marcos Flavio de Campos. "EBSD Texture Analysis of NdFeB Magnets." Materials Science Forum 727-728 (August 2012): 135–39. http://dx.doi.org/10.4028/www.scientific.net/msf.727-728.135.

Повний текст джерела
Анотація:
The crystallographical texture is relevant information for NdFeB magnets, since the maximum energy product is directly related to orientation of the crystals. EBSD (Electron Backscattered Diffraction) is a very suitable tool for preferred orientation measurement of NdFeB magnets. The advantages of EBSD against X-ray Diffraction (XRD) pole figures for texture determination are discussed. EBSD identifies misaligned grains, and this is not feasible with XRD pole figures. EBSD is also helpful on the identification of oxides.
Стилі APA, Harvard, Vancouver, ISO та ін.
3

Wright, Stuart I., Matthew M. Nowell, and David P. Field. "A Review of Strain Analysis Using Electron Backscatter Diffraction." Microscopy and Microanalysis 17, no. 3 (2011): 316–29. http://dx.doi.org/10.1017/s1431927611000055.

Повний текст джерела
Анотація:
AbstractSince the automation of the electron backscatter diffraction (EBSD) technique, EBSD systems have become commonplace in microscopy facilities within materials science and geology research laboratories around the world. The acceptance of the technique is primarily due to the capability of EBSD to aid the research scientist in understanding the crystallographic aspects of microstructure. There has been considerable interest in using EBSD to quantify strain at the submicron scale. To apply EBSD to the characterization of strain, it is important to understand what is practically possible and the underlying assumptions and limitations. This work reviews the current state of technology in terms of strain analysis using EBSD. First, the effects of both elastic and plastic strain on individual EBSD patterns will be considered. Second, the use of EBSD maps for characterizing plastic strain will be explored. Both the potential of the technique and its limitations will be discussed along with the sensitivity of various calculation and mapping parameters.
Стилі APA, Harvard, Vancouver, ISO та ін.
4

Zhao, Shan-Rong, Chang Xu, and Chuan Li. "Identification of twins in muscovite: an electron backscattered diffraction study." Zeitschrift für Kristallographie - Crystalline Materials 234, no. 5 (2019): 329–40. http://dx.doi.org/10.1515/zkri-2018-2139.

Повний текст джерела
Анотація:
Abstract Twins in micas are difficultly identified due to mica’s hexagonal pseudosymmetry. Many theoretic studies on mica twins have been reported but experimental observations are very limited. In this paper, we present an electron backscattered diffraction analysis to identify twins in the muscovite in a quartz schist occurring in the UHP-HP metamorphic rock belt in Dabie Mountain, China. A trilling twin with twin law <310>/{110} is common in the muscovite. A six-couplet twin consisting of two trilling twins related by twin laws <110>/{130} and <001>/{001}(or <100>/{100}) has been discovered. This six-couplet twin contains many cross-twin relationships among the most common mica twin laws <310>/{110}, <110>/{130} and <001>/{001}. The composition plane for twin laws <110>/{130} and <001>/{001} is {001} which is reasonable in mica structure to form a twin by rotation around twin axes, and that for twin law <310>/{110} is irregular based on EBSD resolution. A possible misindexation of a trilling twin or a 3T polytype during EBSD test is discussed, which is helpful to distinguish a twin from a polytype in micas. The occurring frequency of twin law <310>/{110} is higher than that of twin laws <110>/{130} and <001>/{001}, which is consistent to the deducing result from mica structure analysis. This research provides a convenient and effective EBSD method to identify mica twins and an experimental method to distinguish a twin from a polytype in micas, which is a problem confusing researchers for many years.
Стилі APA, Harvard, Vancouver, ISO та ін.
5

Dimitrova, Rositza, Roumen Petrov, Pavel Kuzmanov, Аngel Velikov та Valentin Manolov. "Electron Microscopy Investigations of А356 Alloy Modified with Nanoparticles". Metals 9, № 12 (2019): 1294. http://dx.doi.org/10.3390/met9121294.

Повний текст джерела
Анотація:
Two types of A356 alloy castings in initial and modified with nanoparticles condition produced by gravitational casting were studied. Samples, as-cut from the castings, were subjected to light optical microscopy (LM), thermal analyses, Electron Backscattered Diffraction (EBSD) and Scanning Transmission Electron Microscopy (STEM) analyses. Results, obtained by EBSD, confirmed that there is grain refinement in samples from castings with added nanoparticles compared to the initial ones. STEM analysis shows agglomerates of nanoparticles in examined foils. Nanoparticles’ position in the microstructure confirms the hypothesis that they act as nucleating sites during the alloy solidification, which is the reason for observed fine-grained microstructure.
Стилі APA, Harvard, Vancouver, ISO та ін.
6

Small, J., and J. Michael. "Phase Identification of Individual Particles by Electron Backscatter Diffraction (EBSD)." Microscopy and Microanalysis 5, S2 (1999): 226–27. http://dx.doi.org/10.1017/s1431927600014458.

Повний текст джерела
Анотація:
Backscattered electron Kikuchi patterns (BEKP) were first observed by Alam et al. in 1954. J.A. Venables and C.J. Harland made the initial observation of BEKP and in the scanning electron microscope in 1973. In 1996, Goehner and Michael developed an electron backscatter diffraction (EBSD) system that uses a 1024 × 1024 pixel CCD camera coupled to a thin scintillator rather than photographic film. In their system, the quality of the raw patterns is improved by the use of “flat fielding” which normalizes the raw image to a “flat field” reference image that contains the image artifacts, including background, but not the crystallographic information. Automated pattern analysis is carried out using a Hough transform to locate bands and band edges in the pattern. The resulting crystallographic information is coupled with the elemental information from energy or wavelength dispersive x-ray spectrometry and the phase is identified is made through a link to a database such as the Powder Diffraction Files published by ICDD. An indexed pattern of the suspected phase is then synthesized for comparison to the unknown. This system is marketed commercially by Noran Instruments and offers the first practical method for rapid identification of unknown crystallographic phases in the SEM.
Стилі APA, Harvard, Vancouver, ISO та ін.
7

Lee, Tae-Ho, Heon-Young Ha, Byoungchul Hwang, Sung-Joon Kim, Eunjoo Shin, and Jong Wook Lee. "Scale-Bridging Analysis on Deformation Behavior of High-Nitrogen Austenitic Steels." Microscopy and Microanalysis 19, S5 (2013): 77–82. http://dx.doi.org/10.1017/s1431927613012385.

Повний текст джерела
Анотація:
AbstractScale-bridging analysis on deformation behavior of high-nitrogen austenitic Fe–18Cr–10Mn–(0.39 and 0.69)N steels was performed by neutron diffraction, electron backscattered diffraction (EBSD), and transmission electron microscopy (TEM). Two important modes of deformation were identified depending on the nitrogen content: deformation twinning in the 0.69 N alloy and strain-induced martensitic transformation in the 0.39 N alloy. The phase fraction and deformation faulting probabilities were evaluated based on analyses of peak shift and asymmetry of neutron diffraction profiles. Semi in situ EBSD measurement was performed to investigate the orientation dependence of deformation microstructure and it showed that the variants of ε martensite as well as twin showed strong orientation dependence with respect to tensile axis. TEM observation showed that deformation twin with a {111}⟨112⟩ crystallographic component was predominant in the 0.69 N alloy whereas two types of strain-induced martensites (ε and α′ martensites) were observed in the 0.39 N alloy. It can be concluded that scale-bridging analysis using neutron diffraction, EBSD, and TEM can yield a comprehensive understanding of the deformation mechanism of nitrogen-alloyed austenitic steels.
Стилі APA, Harvard, Vancouver, ISO та ін.
8

Zhang, Yucheng, Ping Lai, Huiping Jia, Xinhua Ju, and Guibin Cui. "Investigation of Test Parameters on EBSD Analysis of Retained Austenite in TRIP and Pipeline Steels." Metals 9, no. 1 (2019): 94. http://dx.doi.org/10.3390/met9010094.

Повний текст джерела
Анотація:
In this article we discuss the effect of different test parameters on the analysis of retained austenite in TRIP590, TRIP780 and X90 steels, by means of Electron Backscattered Diffraction (EBSD) and X-ray Diffraction (XRD), respectively. By analyzing the measuring retained austenite content under different conditions, the optimal test parameters were obtained. The retained austenite content measured both by the EBSD and XRD methods were also compared. The results showed that the test parameters had a great influence on the measured results of retained austenite content in steel by the EBSD method. The higher the indexing rate, the better the precision of the measured results. The step size used for EBSD analysis should not exceed 1/5 of the average grain size of retained austenite. The scanning area for EBSD retained austenite analysis in TRIP and pipeline steels should be no less than 0.068 mm2, which is recommended to be performed by multiple small fields.
Стилі APA, Harvard, Vancouver, ISO та ін.
9

Osborn, William A., Mark J. McLean, and Brian Bush. "Selected Area Electron Beam Induced Deposition of Pt and W for EBSD Backgrounds." Microscopy and Microanalysis 25, no. 1 (2019): 77–79. http://dx.doi.org/10.1017/s1431927618016173.

Повний текст джерела
Анотація:
AbstractApplying high-resolution electron backscatter diffraction (HR-EBSD) to materials without regions that are amenable to the acquisition of backgrounds for static flat fielding (background subtraction) can cause analysis problems. To address this difficulty, the efficacy of electron beam induced deposition (EBID) of material as a source for an amorphous background signal is assessed and found to be practical. Using EBID material for EBSD backgrounds allows single crystal and large-grained samples to be analyzed using HR-EBSD for strain and small angle rotation measurement.
Стилі APA, Harvard, Vancouver, ISO та ін.
10

Russakova, Alyona, Darya Alontseva, and Tatyana Kolesnikova. "The Effect of Deformation and Irradiation with High-Energy Krypton Ions on the Structure and Phase Composition of Reactor Steels." Advanced Materials Research 702 (May 2013): 88–93. http://dx.doi.org/10.4028/www.scientific.net/amr.702.88.

Повний текст джерела
Анотація:
The paper presents some results of a complex research of 12Cr18Ni10Ti stainless steel in the initial, deformed and irradiated ( 8436Kr+14, E=130MeV, Fmax=9x1015 ions/сm2) states using magnetometry, X-ray diffraction (XRD) and scanning electron microscopy (SEM) with electron backscattered diffraction (EBSD – analysis). Application of the EBSD method revealed differences between the non-irradiated and irradiated 12Cr18Ni10Ti steel specimens consisting in the fact that in the surface layer of an irradiated sample α-and ε - phases are formed. It was established that the fluence value affects the amount of magnetic α-phase. The study of the martensite α-phase morphology showed that in the deformed steel specimens there is αʹ- martensite of two scale levels.
Стилі APA, Harvard, Vancouver, ISO та ін.
Більше джерел
Ми пропонуємо знижки на всі преміум-плани для авторів, чиї праці увійшли до тематичних добірок літератури. Зв'яжіться з нами, щоб отримати унікальний промокод!

До бібліографії