Добірка наукової літератури з теми "Analysis by backscattered electron diffraction (EBSD)"

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Статті в журналах з теми "Analysis by backscattered electron diffraction (EBSD)"

1

Goehner, R. P., and J. R. Michael. "Microdiffraction phase identification in the scanning electron microscope (SEM)." Powder Diffraction 19, no. 2 (2004): 100–103. http://dx.doi.org/10.1154/1.1757450.

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Анотація:
The identification of crystallographic phases in the scanning electron microscope (SEM) has been limited by the lack of a simple way to obtain electron diffraction data of an unknown while observing the microstructure of the specimen. With the development of charge coupled device (CCD)-based detectors, backscattered electron Kikuchi patterns, alternately referred to as electron backscattered diffraction (EBSD) patterns, can be easily collected. Previously, EBSD has been limited to crystallographic orientation studies due to the poor pattern quality collected with video rate detector systems. W
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2

Hauegen, Christien G., Fabiane R. Freitas da Silva, Fernanda A. Sampaio da Silva, Jefferson Fabricio Cardoso Lins, and Marcos Flavio de Campos. "EBSD Texture Analysis of NdFeB Magnets." Materials Science Forum 727-728 (August 2012): 135–39. http://dx.doi.org/10.4028/www.scientific.net/msf.727-728.135.

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The crystallographical texture is relevant information for NdFeB magnets, since the maximum energy product is directly related to orientation of the crystals. EBSD (Electron Backscattered Diffraction) is a very suitable tool for preferred orientation measurement of NdFeB magnets. The advantages of EBSD against X-ray Diffraction (XRD) pole figures for texture determination are discussed. EBSD identifies misaligned grains, and this is not feasible with XRD pole figures. EBSD is also helpful on the identification of oxides.
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3

Wright, Stuart I., Matthew M. Nowell, and David P. Field. "A Review of Strain Analysis Using Electron Backscatter Diffraction." Microscopy and Microanalysis 17, no. 3 (2011): 316–29. http://dx.doi.org/10.1017/s1431927611000055.

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AbstractSince the automation of the electron backscatter diffraction (EBSD) technique, EBSD systems have become commonplace in microscopy facilities within materials science and geology research laboratories around the world. The acceptance of the technique is primarily due to the capability of EBSD to aid the research scientist in understanding the crystallographic aspects of microstructure. There has been considerable interest in using EBSD to quantify strain at the submicron scale. To apply EBSD to the characterization of strain, it is important to understand what is practically possible an
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4

Zhao, Shan-Rong, Chang Xu, and Chuan Li. "Identification of twins in muscovite: an electron backscattered diffraction study." Zeitschrift für Kristallographie - Crystalline Materials 234, no. 5 (2019): 329–40. http://dx.doi.org/10.1515/zkri-2018-2139.

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Abstract Twins in micas are difficultly identified due to mica’s hexagonal pseudosymmetry. Many theoretic studies on mica twins have been reported but experimental observations are very limited. In this paper, we present an electron backscattered diffraction analysis to identify twins in the muscovite in a quartz schist occurring in the UHP-HP metamorphic rock belt in Dabie Mountain, China. A trilling twin with twin law <310>/{110} is common in the muscovite. A six-couplet twin consisting of two trilling twins related by twin laws <110>/{130} and <001>/{001}(or <100>/{1
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5

Dimitrova, Rositza, Roumen Petrov, Pavel Kuzmanov, Аngel Velikov та Valentin Manolov. "Electron Microscopy Investigations of А356 Alloy Modified with Nanoparticles". Metals 9, № 12 (2019): 1294. http://dx.doi.org/10.3390/met9121294.

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Two types of A356 alloy castings in initial and modified with nanoparticles condition produced by gravitational casting were studied. Samples, as-cut from the castings, were subjected to light optical microscopy (LM), thermal analyses, Electron Backscattered Diffraction (EBSD) and Scanning Transmission Electron Microscopy (STEM) analyses. Results, obtained by EBSD, confirmed that there is grain refinement in samples from castings with added nanoparticles compared to the initial ones. STEM analysis shows agglomerates of nanoparticles in examined foils. Nanoparticles’ position in the microstruct
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6

Small, J., and J. Michael. "Phase Identification of Individual Particles by Electron Backscatter Diffraction (EBSD)." Microscopy and Microanalysis 5, S2 (1999): 226–27. http://dx.doi.org/10.1017/s1431927600014458.

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Backscattered electron Kikuchi patterns (BEKP) were first observed by Alam et al. in 1954. J.A. Venables and C.J. Harland made the initial observation of BEKP and in the scanning electron microscope in 1973. In 1996, Goehner and Michael developed an electron backscatter diffraction (EBSD) system that uses a 1024 × 1024 pixel CCD camera coupled to a thin scintillator rather than photographic film. In their system, the quality of the raw patterns is improved by the use of “flat fielding” which normalizes the raw image to a “flat field” reference image that contains the image artifacts, including
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7

Lee, Tae-Ho, Heon-Young Ha, Byoungchul Hwang, Sung-Joon Kim, Eunjoo Shin, and Jong Wook Lee. "Scale-Bridging Analysis on Deformation Behavior of High-Nitrogen Austenitic Steels." Microscopy and Microanalysis 19, S5 (2013): 77–82. http://dx.doi.org/10.1017/s1431927613012385.

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AbstractScale-bridging analysis on deformation behavior of high-nitrogen austenitic Fe–18Cr–10Mn–(0.39 and 0.69)N steels was performed by neutron diffraction, electron backscattered diffraction (EBSD), and transmission electron microscopy (TEM). Two important modes of deformation were identified depending on the nitrogen content: deformation twinning in the 0.69 N alloy and strain-induced martensitic transformation in the 0.39 N alloy. The phase fraction and deformation faulting probabilities were evaluated based on analyses of peak shift and asymmetry of neutron diffraction profiles. Semi in
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8

Zhang, Yucheng, Ping Lai, Huiping Jia, Xinhua Ju, and Guibin Cui. "Investigation of Test Parameters on EBSD Analysis of Retained Austenite in TRIP and Pipeline Steels." Metals 9, no. 1 (2019): 94. http://dx.doi.org/10.3390/met9010094.

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Анотація:
In this article we discuss the effect of different test parameters on the analysis of retained austenite in TRIP590, TRIP780 and X90 steels, by means of Electron Backscattered Diffraction (EBSD) and X-ray Diffraction (XRD), respectively. By analyzing the measuring retained austenite content under different conditions, the optimal test parameters were obtained. The retained austenite content measured both by the EBSD and XRD methods were also compared. The results showed that the test parameters had a great influence on the measured results of retained austenite content in steel by the EBSD met
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9

Osborn, William A., Mark J. McLean, and Brian Bush. "Selected Area Electron Beam Induced Deposition of Pt and W for EBSD Backgrounds." Microscopy and Microanalysis 25, no. 1 (2019): 77–79. http://dx.doi.org/10.1017/s1431927618016173.

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AbstractApplying high-resolution electron backscatter diffraction (HR-EBSD) to materials without regions that are amenable to the acquisition of backgrounds for static flat fielding (background subtraction) can cause analysis problems. To address this difficulty, the efficacy of electron beam induced deposition (EBID) of material as a source for an amorphous background signal is assessed and found to be practical. Using EBID material for EBSD backgrounds allows single crystal and large-grained samples to be analyzed using HR-EBSD for strain and small angle rotation measurement.
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10

Russakova, Alyona, Darya Alontseva, and Tatyana Kolesnikova. "The Effect of Deformation and Irradiation with High-Energy Krypton Ions on the Structure and Phase Composition of Reactor Steels." Advanced Materials Research 702 (May 2013): 88–93. http://dx.doi.org/10.4028/www.scientific.net/amr.702.88.

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The paper presents some results of a complex research of 12Cr18Ni10Ti stainless steel in the initial, deformed and irradiated ( 8436Kr+14, E=130MeV, Fmax=9x1015 ions/сm2) states using magnetometry, X-ray diffraction (XRD) and scanning electron microscopy (SEM) with electron backscattered diffraction (EBSD – analysis). Application of the EBSD method revealed differences between the non-irradiated and irradiated 12Cr18Ni10Ti steel specimens consisting in the fact that in the surface layer of an irradiated sample α-and ε - phases are formed. It was established that the fluence value affects the a
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