Статті в журналах з теми "AFM Modes"
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Cruz Valeriano, Edgar, José Juan Gervacio Arciniega, Christian Iván Enriquez Flores, Susana Meraz Dávila, Joel Moreno Palmerin, Martín Adelaido Hernández Landaverde, Yuri Lizbeth Chipatecua Godoy, Aime Margarita Gutiérrez Peralta, Rafael Ramírez Bon, and José Martín Yañez Limón. "Stochastic excitation for high-resolution atomic force acoustic microscopy imaging: a system theory approach." Beilstein Journal of Nanotechnology 11 (May 4, 2020): 703–16. http://dx.doi.org/10.3762/bjnano.11.58.
Повний текст джерелаEby, R. K., R. L. McEvoy, and S. Marchese-Ragona. "AFM of polymers using force spectroscopy modes." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 1076. http://dx.doi.org/10.1017/s042482010017311x.
Повний текст джерелаDillon, Eoghan, Kevin Kjoller, and Craig Prater. "Lorentz Contact Resonance Imaging for Atomic Force Microscopes: Probing Mechanical and Thermal Properties on the Nanoscale." Microscopy Today 21, no. 6 (November 2013): 18–24. http://dx.doi.org/10.1017/s1551929513000989.
Повний текст джерелаXia, Fangzhou, and Kamal Youcef-Toumi. "Review: Advanced Atomic Force Microscopy Modes for Biomedical Research." Biosensors 12, no. 12 (December 2, 2022): 1116. http://dx.doi.org/10.3390/bios12121116.
Повний текст джерелаIgnat, Ioan, Bernhard Schuster, Jonas Hafner, MinHee Kwon, Daniel Platz, and Ulrich Schmid. "Intermodal coupling spectroscopy of mechanical modes in microcantilevers." Beilstein Journal of Nanotechnology 14 (January 19, 2023): 123–32. http://dx.doi.org/10.3762/bjnano.14.13.
Повний текст джерелаPishkenari, Hossein Nejat, and Ali Meghdari. "Effects of higher oscillation modes on TM-AFM measurements." Ultramicroscopy 111, no. 2 (January 2011): 107–16. http://dx.doi.org/10.1016/j.ultramic.2010.10.015.
Повний текст джерелаPatel, Anisha N., and Christine Kranz. "(Multi)functional Atomic Force Microscopy Imaging." Annual Review of Analytical Chemistry 11, no. 1 (June 12, 2018): 329–50. http://dx.doi.org/10.1146/annurev-anchem-061417-125716.
Повний текст джерелаLi, Qing Fen, Li Zhu, Guo Jin, and Xiu Fang Cui. "3D-Modeling and Numerical Analysis of Fracture Behavior in AFM-Specimen on Mixed-Mode I-II Loading Condition." Advanced Materials Research 450-451 (January 2012): 1391–94. http://dx.doi.org/10.4028/www.scientific.net/amr.450-451.1391.
Повний текст джерелаGuzman, Horacio V., Pablo D. Garcia, and Ricardo Garcia. "Dynamic force microscopy simulator (dForce): A tool for planning and understanding tapping and bimodal AFM experiments." Beilstein Journal of Nanotechnology 6 (February 4, 2015): 369–79. http://dx.doi.org/10.3762/bjnano.6.36.
Повний текст джерелаStarodubtseva, M. N. "Atomic force microscopy of cells as a method for the study of the pathogenesis and AS THE basis for the development of methods of DISEASE DIAGNOSIS." Health and Ecology Issues, no. 4 (December 28, 2017): 99–106. http://dx.doi.org/10.51523/2708-6011.2017-14-4-21.
Повний текст джерелаTang, Deman, and Earl H. Dowell. "Reduced Order Model Analysis for Two-Dimensional Molecular Dynamic Chain Structure Attached to an Atomic Force Microscope." Journal of Dynamic Systems, Measurement, and Control 126, no. 3 (September 1, 2004): 531–46. http://dx.doi.org/10.1115/1.1789969.
Повний текст джерелаBlinov, Iliya V., Tatiana P. Krinitsina, Mikhail A. Milyaev, Vladimir V. Popov, and Vladimir V. Ustinov. "Unidirectional Anisotropy in Nanostructures with Antiferromagnetic NiFeMn Layer." Solid State Phenomena 233-234 (July 2015): 517–21. http://dx.doi.org/10.4028/www.scientific.net/ssp.233-234.517.
Повний текст джерелаWoodward, John T. "Choosing a Cantilever for In Situ Atomic Force Microscopy." Microscopy Today 11, no. 2 (April 2003): 42–43. http://dx.doi.org/10.1017/s1551929500052500.
Повний текст джерелаSeewald, Lukas Matthias, Jürgen Sattelkow, Michele Brugger-Hatzl, Gerald Kothleitner, Hajo Frerichs, Christian Schwalb, Stefan Hummel, and Harald Plank. "3D Nanoprinting of All-Metal Nanoprobes for Electric AFM Modes." Nanomaterials 12, no. 24 (December 17, 2022): 4477. http://dx.doi.org/10.3390/nano12244477.
Повний текст джерелаMoore, Steven Ian, Michael G. Ruppert, and Yuen Kuan Yong. "Multimodal cantilevers with novel piezoelectric layer topology for sensitivity enhancement." Beilstein Journal of Nanotechnology 8 (February 6, 2017): 358–71. http://dx.doi.org/10.3762/bjnano.8.38.
Повний текст джерелаRussell, Phillip E., and A. D. Batchelor. "AFM and Other Scanned Probe Microscopies Tutorial." Microscopy and Microanalysis 4, S2 (July 1998): 878–79. http://dx.doi.org/10.1017/s143192760002451x.
Повний текст джерелаUlcinas, Arturas, and Valentinas Snitka. "Intermittent contact AFM using the higher modes of weak cantilever." Ultramicroscopy 86, no. 1-2 (January 2001): 217–22. http://dx.doi.org/10.1016/s0304-3991(00)00084-x.
Повний текст джерелаHo, Huddee J. "Near Contact Mode AFM: Overcoming Surface Fluid Layer In Air And Achieve Ultra-High Resolution." Microscopy Today 6, no. 8 (October 1998): 12–15. http://dx.doi.org/10.1017/s1551929500069170.
Повний текст джерелаSlattery, Ashley, Cameron Shearer, Joseph Shapter, Adam Blanch, Jamie Quinton, and Christopher Gibson. "Improved Application of Carbon Nanotube Atomic Force Microscopy Probes Using PeakForce Tapping Mode." Nanomaterials 8, no. 10 (October 9, 2018): 807. http://dx.doi.org/10.3390/nano8100807.
Повний текст джерелаMarcuello, Carlos. "Current and future perspectives of atomic force microscopy to elicit the intrinsic properties of soft matter at the single molecule level." AIMS Bioengineering 9, no. 3 (2022): 293–306. http://dx.doi.org/10.3934/bioeng.2022020.
Повний текст джерелаZhang, Suoxin, Jianqiang Qian, Yingzi Li, Yingxu Zhang, and Zhenyu Wang. "A Novel Method to Reconstruct the Force Curve by Higher Harmonics of the First Two Flexural Modes in Frequency Modulation Atomic Force Microscope (FM-AFM)." Microscopy and Microanalysis 24, no. 3 (June 2018): 256–63. http://dx.doi.org/10.1017/s1431927618000363.
Повний текст джерелаBoisgard, R., J. P. Aimé, and G. Couturier. "Dynamic operation modes of AFM: Non-linear behavior and theoretical analysis of the stability of the AFM oscillator." International Journal of Non-Linear Mechanics 42, no. 4 (May 2007): 673–80. http://dx.doi.org/10.1016/j.ijnonlinmec.2007.03.006.
Повний текст джерелаKalafut, Devin, Ryan Wagner, Maria Jose Cadena, Anil Bajaj, and Arvind Raman. "Cantilever signature of tip detachment during contact resonance AFM." Beilstein Journal of Nanotechnology 12 (November 24, 2021): 1286–96. http://dx.doi.org/10.3762/bjnano.12.96.
Повний текст джерелаMišić Radić, Tea, Petra Vukosav, Andrea Čačković, and Alexander Dulebo. "Insights into the Morphology and Surface Properties of Microalgae at the Nanoscale by Atomic Force Microscopy (AFM): A Review." Water 15, no. 11 (May 23, 2023): 1983. http://dx.doi.org/10.3390/w15111983.
Повний текст джерелаZhang, Rui, Evgeny Zhuravlev, René Androsch, and Christoph Schick. "Visualization of Polymer Crystallization by In Situ Combination of Atomic Force Microscopy and Fast Scanning Calorimetry." Polymers 11, no. 5 (May 15, 2019): 890. http://dx.doi.org/10.3390/polym11050890.
Повний текст джерелаCasuso, Ignacio, Lorena Redondo-Morata, and Felix Rico. "Biological physics by high-speed atomic force microscopy." Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences 378, no. 2186 (October 26, 2020): 20190604. http://dx.doi.org/10.1098/rsta.2019.0604.
Повний текст джерелаMeier, Dale J. "Application of various modes of scanning-probe microscopies in polymer systems." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 196–97. http://dx.doi.org/10.1017/s0424820100163447.
Повний текст джерелаChen, Ying, Ke Ma, Ting Hu, Bo Jiang, Bin Xu, Wenjing Tian, Jing Zhi Sun, and Wenke Zhang. "Investigation of the binding modes between AIE-active molecules and dsDNA by single molecule force spectroscopy." Nanoscale 7, no. 19 (2015): 8939–45. http://dx.doi.org/10.1039/c5nr01247c.
Повний текст джерелаGibson, Christopher T. "The Attachment of Carbon Nanotubes to Atomic Force Microscopy Tips Using the Pick-Up Method." Applied Sciences 10, no. 16 (August 12, 2020): 5575. http://dx.doi.org/10.3390/app10165575.
Повний текст джерелаDamircheli, Mehrnoosh, Amir F. Payam, and Ricardo Garcia. "Optimization of phase contrast in bimodal amplitude modulation AFM." Beilstein Journal of Nanotechnology 6 (April 28, 2015): 1072–81. http://dx.doi.org/10.3762/bjnano.6.108.
Повний текст джерелаKillgore, Jason P., William King, Kevin Kjoller, and René M. Overney. "Heated-Tip AFM: Applications in Nanocomposite Polymer Membranes and Energetic Materials." Microscopy Today 15, no. 1 (January 2007): 20–25. http://dx.doi.org/10.1017/s1551929500051142.
Повний текст джерелаSurtchev, Marko, Mark Wall, and Sergei Magonov. "Combined AFM/Raman Studies of Heterogeneous Polymer Materials." MRS Advances 1, no. 25 (2016): 1859–64. http://dx.doi.org/10.1557/adv.2016.412.
Повний текст джерелаStylianou, Andreas, Stylianos-Vasileios Kontomaris, Colin Grant, and Eleni Alexandratou. "Atomic Force Microscopy on Biological Materials Related to Pathological Conditions." Scanning 2019 (May 12, 2019): 1–25. http://dx.doi.org/10.1155/2019/8452851.
Повний текст джерелаLiu, Hao, Zuned Ahmed, Sasa Vranjkovic, Manfred Parschau, Andrada-Oana Mandru, and Hans J. Hug. "A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy." Beilstein Journal of Nanotechnology 13 (October 11, 2022): 1120–40. http://dx.doi.org/10.3762/bjnano.13.95.
Повний текст джерелаWilliams, R. E. "Acoustic Emission Characteristics of Abrasive Flow Machining." Journal of Manufacturing Science and Engineering 120, no. 2 (May 1, 1998): 264–71. http://dx.doi.org/10.1115/1.2830123.
Повний текст джерелаVilleneuve-Faure, Christina, Abdelhaq Boumaarouf, Vishal Shah, Peter M. Gammon, Ulrike Lüders, and Rosine Coq Germanicus. "SiC Doping Impact during Conducting AFM under Ambient Atmosphere." Materials 16, no. 15 (August 1, 2023): 5401. http://dx.doi.org/10.3390/ma16155401.
Повний текст джерелаOuyang, Qijian, Zhiwei Xie, Jinhai Liu, Minghui Gong, and Huayang Yu. "Application of Atomic Force Microscopy as Advanced Asphalt Testing Technology: A Comprehensive Review." Polymers 14, no. 14 (July 13, 2022): 2851. http://dx.doi.org/10.3390/polym14142851.
Повний текст джерелаCarmichael, Stephen W., and Julio M. Fernandez. "Unzipping a Membrane." Microscopy Today 8, no. 9 (November 2000): 3–7. http://dx.doi.org/10.1017/s1551929500059368.
Повний текст джерелаAbbasi, Mohammad, and Seyed E. Afkhami. "Resonant Frequency and Sensitivity of a Caliper Formed With Assembled Cantilever Probes Based on the Modified Strain Gradient Theory." Microscopy and Microanalysis 20, no. 6 (September 10, 2014): 1672–81. http://dx.doi.org/10.1017/s1431927614013117.
Повний текст джерелаCastanié, Fabien, Laurent Nony, Sébastien Gauthier, and Xavier Bouju. "Graphite, graphene on SiC, and graphene nanoribbons: Calculated images with a numerical FM-AFM." Beilstein Journal of Nanotechnology 3 (April 2, 2012): 301–11. http://dx.doi.org/10.3762/bjnano.3.34.
Повний текст джерелаLi, Qing Fen, Li Zhu, Sheng Yuan Yan, and Xiao Nan Zhang. "Computational Analysis of the AFM Specimen on Mixed-Mode I+II+III Fracture." Key Engineering Materials 488-489 (September 2011): 258–61. http://dx.doi.org/10.4028/www.scientific.net/kem.488-489.258.
Повний текст джерелаKheirodin, Mohsen, Hossein Nejat Pishkenari, Ali Moosavi, and Ali Meghdari. "Study of Biomolecules Imaging Using Molecular Dynamics Simulations." Nano 10, no. 07 (October 2015): 1550096. http://dx.doi.org/10.1142/s1793292015500964.
Повний текст джерелаCoq Germanicus, R., and U. Lüders. "Electrical Characterizations Based on AFM: SCM and SSRM Measurements with a Multidimensional Approach." EDFA Technical Articles 24, no. 3 (August 1, 2022): 24–31. http://dx.doi.org/10.31399/asm.edfa.2022-3.p024.
Повний текст джерелаDorozhkin, P., E. Kuznetsov, A. Schokin, S. Timofeev, and V. Bykov. "AFM + Raman Microscopy + SNOM + Tip-Enhanced Raman: Instrumentation and Applications." Microscopy Today 18, no. 6 (November 2010): 28–32. http://dx.doi.org/10.1017/s1551929510000982.
Повний текст джерелаJazvinšćak Jembrek, Maja, Goran Šimić, Patrick R. Hof, and Suzana Šegota. "Atomic force microscopy as an advanced tool in neuroscience." Translational Neuroscience 6, no. 1 (January 1, 2015): 117–30. http://dx.doi.org/10.1515/tnsci-2015-0011.
Повний текст джерелаBoussu, K., B. Van der Bruggen, A. Volodin, J. Snauwaert, C. Van Haesendonck, and C. Vandecasteele. "Roughness and hydrophobicity studies of nanofiltration membranes using different modes of AFM." Journal of Colloid and Interface Science 286, no. 2 (June 2005): 632–38. http://dx.doi.org/10.1016/j.jcis.2005.01.095.
Повний текст джерелаGENG, Y. L., and Z. H. SUN. "GROWTH MODES AND DEFECTS OF MANGANESE MERCURY THIOCYANATE CRYSTALS OBSERVED BY AFM." Surface Review and Letters 16, no. 01 (February 2009): 19–22. http://dx.doi.org/10.1142/s0218625x09012238.
Повний текст джерелаXie, Xian Ning, Hong Jing Chung, Dipankar Bandyopadhyay, Ashutosh Sharma, Chorng Haur Sow, Andrew Anthony Bettiol, and Andrew Thye Shen Wee. "Two Coexisting Modes in Field‐Assisted AFM Nanopatterning of Thin Polymer Films." Macromolecular Chemistry and Physics 209, no. 13 (July 3, 2008): 1358–66. http://dx.doi.org/10.1002/macp.200800074.
Повний текст джерелаRodriguez, D. J., A. V. Kotosonova, H. A. Ballouk, N. A. Shandyba, O. I. Osotova, and A. S. Kolomiytsev. "Fabrication of probe tips via the FIB method for nanodiagnostics of the surface of solids by atomic force microscopy." Journal of Physics: Conference Series 2086, no. 1 (December 1, 2021): 012204. http://dx.doi.org/10.1088/1742-6596/2086/1/012204.
Повний текст джерелаMusa, Ishaq, Naser Qamhieh, Khadija Said, Saleh T. Mahmoud, and Hussain Alawadhi. "Fabrication and Characterization of Aluminum Nitride Nanoparticles by RF Magnetron Sputtering and Inert Gas Condensation Technique." Coatings 10, no. 4 (April 21, 2020): 411. http://dx.doi.org/10.3390/coatings10040411.
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