Статті в журналах з теми "AFM cantilever"
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Dannberg, Oliver, and Thomas Fröhlich. "Steifigkeitsmessungen von AFM-Cantilevern." tm - Technisches Messen 88, s1 (August 24, 2021): s3—s7. http://dx.doi.org/10.1515/teme-2021-0046.
Повний текст джерелаSlattery, Ashley D., Adam J. Blanch, Cameron J. Shearer, Andrew J. Stapleton, Renee V. Goreham, Sarah L. Harmer, Jamie S. Quinton, and Christopher T. Gibson. "Characterisation of the Material and Mechanical Properties of Atomic Force Microscope Cantilevers with a Plan-View Trapezoidal Geometry." Applied Sciences 9, no. 13 (June 27, 2019): 2604. http://dx.doi.org/10.3390/app9132604.
Повний текст джерелаZhao, Yu Wen, Yun Peng Song, Sen Wu, and Xing Fu. "Accurate and Traceable Calibration of the Stiffness of Various AFM Cantilevers." Key Engineering Materials 645-646 (May 2015): 817–23. http://dx.doi.org/10.4028/www.scientific.net/kem.645-646.817.
Повний текст джерелаCho, Ki Ho, Hak Joo Lee, Jae Hyun Kim, Jong Man Kim, Yong Kweon Kim, and Chang Wook Baek. "A Study of Nano-Indentation Test Using Rhombus-Shaped Cantilever in Atomic Force Microscope." Key Engineering Materials 326-328 (December 2006): 207–10. http://dx.doi.org/10.4028/www.scientific.net/kem.326-328.207.
Повний текст джерелаDat, Le Tri, Ho Thanh Huy, and Nguyen Duy Vy. "A Theoretical Study of Deflection of AFM Bimaterial Cantilevers Versus Irradiated Position." Communications in Physics 28, no. 3 (November 14, 2018): 255. http://dx.doi.org/10.15625/0868-3166/28/3/12673.
Повний текст джерелаBoubekri, Rachida, Edmond Cambril, L. Couraud, Lorenzo Bernardi, Ali Madouri, David Martrou, and Sébastien Gauthier. "High Frequency 3C-SiC AFM Cantilever Using Thermal Actuation and Metallic Piezoresistive Detection." Materials Science Forum 711 (January 2012): 80–83. http://dx.doi.org/10.4028/www.scientific.net/msf.711.80.
Повний текст джерелаMordue, Christopher W., Jonathan M. R. Weaver, and Phillip S. Dobson. "Thermal induced deflection in atomic force microscopy cantilevers: analysis & solution." Measurement Science and Technology 34, no. 12 (August 25, 2023): 125013. http://dx.doi.org/10.1088/1361-6501/acf061.
Повний текст джерелаDamircheli, Mehrnoosh, and Babak Eslami. "Design of V-shaped cantilevers for enhanced multifrequency AFM measurements." Beilstein Journal of Nanotechnology 11 (October 6, 2020): 1525–41. http://dx.doi.org/10.3762/bjnano.11.135.
Повний текст джерелаLiu, Hao, Zuned Ahmed, Sasa Vranjkovic, Manfred Parschau, Andrada-Oana Mandru, and Hans J. Hug. "A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy." Beilstein Journal of Nanotechnology 13 (October 11, 2022): 1120–40. http://dx.doi.org/10.3762/bjnano.13.95.
Повний текст джерелаYeh, Meng Kao, Bo Yi Chen, Nyan Hwa Tai, and Chien Chao Chiu. "Force Measurement by AFM Cantilever with Different Coating Layers." Key Engineering Materials 326-328 (December 2006): 377–80. http://dx.doi.org/10.4028/www.scientific.net/kem.326-328.377.
Повний текст джерелаKWEON, HYUNKYU, and KIHO NAM. "MEASUREMENT OF AFM CANTILEVER SPRING CONSTANT BY USING THE SURFACE PROFILE." International Journal of Modern Physics B 24, no. 18 (July 20, 2010): 3597–606. http://dx.doi.org/10.1142/s0217979210054865.
Повний текст джерелаMoore, Steven Ian, Michael G. Ruppert, and Yuen Kuan Yong. "Multimodal cantilevers with novel piezoelectric layer topology for sensitivity enhancement." Beilstein Journal of Nanotechnology 8 (February 6, 2017): 358–71. http://dx.doi.org/10.3762/bjnano.8.38.
Повний текст джерелаKorayem, M. H., M. Taheri, and S. D. Ghahnaviyeh. "Sobol method application in dimensional sensitivity analyses of different AFM cantilevers for biological particles." Modern Physics Letters B 29, no. 22 (August 20, 2015): 1550123. http://dx.doi.org/10.1142/s0217984915501237.
Повний текст джерелаAgeev, Oleg A., Oleg I. Ilin, Alexei S. Kolomiytsev, Sergey A. Lisitsyn, Vladimir A. Smirnov, and Evgeny G. Zamburg. "Formation of High Aspect Ratio Nanostructures Using Focused Ion Beam Induced Deposition of Carbon." Applied Mechanics and Materials 752-753 (April 2015): 154–58. http://dx.doi.org/10.4028/www.scientific.net/amm.752-753.154.
Повний текст джерелаMishra, Rohit, Wilfried Grange, and Martin Hegner. "Rapid and Reliable Calibration of Laser Beam Deflection System for Microcantilever-Based Sensor Setups." Journal of Sensors 2012 (2012): 1–6. http://dx.doi.org/10.1155/2012/617386.
Повний текст джерелаDzedzickis, Andrius, Justė Rožėnė, Vytautas Bučinskas, Darius Viržonis, and Inga Morkvėnaitė-Vilkončienė. "Characteristics and Functionality of Cantilevers and Scanners in Atomic Force Microscopy." Materials 16, no. 19 (September 24, 2023): 6379. http://dx.doi.org/10.3390/ma16196379.
Повний текст джерелаLiang, Li-Na, Liao-Liang Ke, Yue-Sheng Wang, Jie Yang, and Sritawat Kitipornchai. "Flexural Vibration of an Atomic Force Microscope Cantilever Based on Modified Couple Stress Theory." International Journal of Structural Stability and Dynamics 15, no. 07 (August 31, 2015): 1540025. http://dx.doi.org/10.1142/s0219455415400258.
Повний текст джерелаGhatkesar, Murali Krishna, Hector Hugo Perez Garza, and Urs Staufer. "Hollow AFM cantilever pipette." Microelectronic Engineering 124 (July 2014): 22–25. http://dx.doi.org/10.1016/j.mee.2014.04.019.
Повний текст джерелаHosseini, Nahid, Matthias Neuenschwander, Oliver Peric, Santiago H. Andany, Jonathan D. Adams, and Georg E. Fantner. "Integration of sharp silicon nitride tips into high-speed SU8 cantilevers in a batch fabrication process." Beilstein Journal of Nanotechnology 10 (November 29, 2019): 2357–63. http://dx.doi.org/10.3762/bjnano.10.226.
Повний текст джерелаGanser, Christian, Gerhard Fritz-Popovski, Roland Morak, Parvin Sharifi, Benedetta Marmiroli, Barbara Sartori, Heinz Amenitsch, Thomas Griesser, Christian Teichert, and Oskar Paris. "Cantilever bending based on humidity-actuated mesoporous silica/silicon bilayers." Beilstein Journal of Nanotechnology 7 (April 28, 2016): 637–44. http://dx.doi.org/10.3762/bjnano.7.56.
Повний текст джерелаSone, Hayato, Shoichi Ichikawa, Yuji Matsubara, Mitsumasa Suzuki, Haruki Okano, Takashi Izumi, and Sumio Hosaka. "Prototype of Frame-Type Cantilever for Biosensor and Femtogram Detection." Key Engineering Materials 459 (December 2010): 134–39. http://dx.doi.org/10.4028/www.scientific.net/kem.459.134.
Повний текст джерелаLee, Hak Joo, Ki Ho Cho, Jae Hyun Kim, Seung Woo Han, Byung Ik Choi, Chang Wook Baek, Jong Man Kim, and Sung Hoon Choa. "Force-Calibrated AFM for Mechanical Test of Freestanding Thin Films." Key Engineering Materials 297-300 (November 2005): 275–79. http://dx.doi.org/10.4028/www.scientific.net/kem.297-300.275.
Повний текст джерелаMagonov, Sergei. "High-Resolution Imaging with Atomic Force Microscopy." Microscopy Today 12, no. 5 (September 2004): 12–15. http://dx.doi.org/10.1017/s1551929500056248.
Повний текст джерелаLEE, HAK-JOO, JAE-HYUN KIM, KIHO CHO, JAE-YOON KANG, CHANG-WOOK BAEK, JONG-MAN KIM, and SUNG-HOON CHOA. "SYMMETRIC AFM CANTILEVER FOR MECHANICAL CHARACTERIZATION OF Mo THIN FILM." International Journal of Modern Physics B 20, no. 25n27 (October 30, 2006): 3781–86. http://dx.doi.org/10.1142/s0217979206040362.
Повний текст джерелаCha, Wujoon, Matthew F. Campbell, Akshat Jain, and Igor Bargatin. "Hollow AFM Cantilever with Holes." Engineering Proceedings 4, no. 1 (April 14, 2021): 13. http://dx.doi.org/10.3390/micromachines2021-09544.
Повний текст джерелаTang, Chen Zhi. "A Method to Fabricate Thin Micro Silicon Cantilever Based on Optical Lithography with AZ 1518." Key Engineering Materials 645-646 (May 2015): 1093–98. http://dx.doi.org/10.4028/www.scientific.net/kem.645-646.1093.
Повний текст джерелаSchumacher, Zeno, Yoichi Miyahara, Laure Aeschimann, and Peter Grütter. "Improved atomic force microscopy cantilever performance by partial reflective coating." Beilstein Journal of Nanotechnology 6 (July 3, 2015): 1450–56. http://dx.doi.org/10.3762/bjnano.6.150.
Повний текст джерелаGrigoriadis, Kyriakos, Alexandros Palaiologos, Anastasios Zavos, and Pantelis G. Nikolakopoulos. "A Tribological Simulation for a Typical Carbon Coated AFM Cantilever Interacting with a Monolayer Graphene Sheet." MATEC Web of Conferences 188 (2018): 01029. http://dx.doi.org/10.1051/matecconf/201818801029.
Повний текст джерелаGiessibl, Franz. "Probing the Nature of Chemical Bonds by Atomic Force Microscopy." Molecules 26, no. 13 (July 3, 2021): 4068. http://dx.doi.org/10.3390/molecules26134068.
Повний текст джерелаZauscher, Stefan. "Putting a Sphere on an Atomic Force Microscope Cantilever Tip." Microscopy Today 5, no. 10 (December 1997): 6. http://dx.doi.org/10.1017/s155192950006065x.
Повний текст джерелаTortonese, M., and F. J. Giessibl. "Atomic-Force Microscopy with piezoresistive cantilevers." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 1064–65. http://dx.doi.org/10.1017/s0424820100173054.
Повний текст джерелаCleveland, Jason. "Anomalous Changes in Tip Height in Tapping AFM." Microscopy Today 8, no. 4 (May 2000): 36–37. http://dx.doi.org/10.1017/s155192950006346x.
Повний текст джерелаFicek, Mateusz, Maciej J. Głowacki, Krzysztof Gajewski, Piotr Kunicki, Ewelina Gacka, Krystian Sycz, Mariusz Mrózek, et al. "Integration of Fluorescent, NV-Rich Nanodiamond Particles with AFM Cantilevers by Focused Ion Beam for Hybrid Optical and Micromechanical Devices." Coatings 11, no. 11 (October 29, 2021): 1332. http://dx.doi.org/10.3390/coatings11111332.
Повний текст джерелаDillon, Eoghan, Kevin Kjoller, and Craig Prater. "Lorentz Contact Resonance Imaging for Atomic Force Microscopes: Probing Mechanical and Thermal Properties on the Nanoscale." Microscopy Today 21, no. 6 (November 2013): 18–24. http://dx.doi.org/10.1017/s1551929513000989.
Повний текст джерелаLopez-Ayon, G. Monserratt, David J. Oliver, Peter H. Grutter, and Svetlana V. Komarova. "Deconvolution of Calcium Fluorescent Indicator Signal from AFM Cantilever Reflection." Microscopy and Microanalysis 18, no. 4 (July 30, 2012): 808–15. http://dx.doi.org/10.1017/s1431927612000402.
Повний текст джерелаWu, Jianhua, Ying Fang, Dong Yang, and Cheng Zhu. "Thermo-Mechanical Responses of a Surface-Coupled AFM Cantilever." Journal of Biomechanical Engineering 127, no. 7 (August 15, 2005): 1208–15. http://dx.doi.org/10.1115/1.2073647.
Повний текст джерелаZhang, Gai Mei, Li Ping Yang, Chen Qiang, Yuan Wei, Jian Dong Lu, and Dong Sheng Jiang. "Analysis on the Contact Mechanics between Tip and Sample in Atomic Force Acoustic Microscope Method." Advanced Materials Research 800 (September 2013): 325–29. http://dx.doi.org/10.4028/www.scientific.net/amr.800.325.
Повний текст джерелаRabe, U., S. Hirsekorn, M. Reinstädtler, T. Sulzbach, Ch Lehrer, and W. Arnold. "Influence of the cantilever holder on the vibrations of AFM cantilevers." Nanotechnology 18, no. 4 (December 12, 2006): 044008. http://dx.doi.org/10.1088/0957-4484/18/4/044008.
Повний текст джерелаLiu, Shujie, Shuichi Nagasawa, Satoru Takahashi, and Kiyoshi Takamasu. "Development of a Multi-Ball-Cantilever AFM for Measuring Resist Surface." Journal of Robotics and Mechatronics 18, no. 6 (December 20, 2006): 698–704. http://dx.doi.org/10.20965/jrm.2006.p0698.
Повний текст джерелаDai, Gao Liang, F. Pohlenz, H. U. Danzebrink, and L. Koenders. "Dimensional Measurements for Micro- and Nanotechnology." Key Engineering Materials 381-382 (June 2008): 7–10. http://dx.doi.org/10.4028/www.scientific.net/kem.381-382.7.
Повний текст джерелаDannberg, Oliver, Michael Kühnel, and Thomas Fröhlich. "Entwicklung einer Cantileverkalibriereinrichtung." tm - Technisches Messen 87, no. 10 (October 25, 2020): 622–29. http://dx.doi.org/10.1515/teme-2020-0064.
Повний текст джерелаLindsay, S. M. "Direct Magnetic Excitation of Cantilevers for Dynamic Force Microscocopy in Liquids." Microscopy and Microanalysis 5, S2 (August 1999): 1002–3. http://dx.doi.org/10.1017/s143192760001833x.
Повний текст джерелаStappers, Linda, and Jan Fransaer. "Colloidal Probe AFM Measurements of the Electrophoretic Force." Key Engineering Materials 314 (July 2006): 1–6. http://dx.doi.org/10.4028/www.scientific.net/kem.314.1.
Повний текст джерелаGibson, Christopher T., Brandon L. Weeks, Chris Abell, Trevor Rayment, and Sverre Myhra. "Calibration of AFM cantilever spring constants." Ultramicroscopy 97, no. 1-4 (October 2003): 113–18. http://dx.doi.org/10.1016/s0304-3991(03)00035-4.
Повний текст джерелаRichter, C., P. Weinzierl, W. Engl, C. Penzkofer, B. Irmer, and T. Sulzbach. "Cantilever probes for high speed AFM." Microsystem Technologies 18, no. 7-8 (February 29, 2012): 1119–26. http://dx.doi.org/10.1007/s00542-012-1454-8.
Повний текст джерелаGuerre, Roland, Ute Drechsler, and Daniel Jubin et Michel Despont. "Low-cost AFM cantilever manufacturing technology." Journal of Micromechanics and Microengineering 18, no. 11 (September 26, 2008): 115013. http://dx.doi.org/10.1088/0960-1317/18/11/115013.
Повний текст джерелаXie, H. Y. "Frequency shifts of cantilever in AFM." Applied Surface Science 252, no. 2 (October 2005): 372–78. http://dx.doi.org/10.1016/j.apsusc.2005.01.014.
Повний текст джерелаLübbe, Jannis, Matthias Temmen, Philipp Rahe, Angelika Kühnle, and Michael Reichling. "Determining cantilever stiffness from thermal noise." Beilstein Journal of Nanotechnology 4 (March 28, 2013): 227–33. http://dx.doi.org/10.3762/bjnano.4.23.
Повний текст джерелаBeltrán, F. J. Espinoza, J. Muñoz-Saldaña, D. Torres-Torres, R. Torres-Martínez, and G. A. Schneider. "Atomic force microscopy cantilever simulation by finite element methods for quantitative atomic force acoustic microscopy measurements." Journal of Materials Research 21, no. 12 (December 2006): 3072–79. http://dx.doi.org/10.1557/jmr.2006.0379.
Повний текст джерелаXie, Ping, Lei Zhang, and Qing Ze Zou. "Resonance Suppression on Nanoscale Viscoelasticity Measurement." Advanced Materials Research 528 (June 2012): 75–79. http://dx.doi.org/10.4028/www.scientific.net/amr.528.75.
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