Дисертації з теми "AFM cantilever"
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Dharmasena, Sajith Mevan. "A Multi-Channel Micromechanical Cantilever for Advanced Multi-Modal Atomic Force Microscopy." The Ohio State University, 2019. http://rave.ohiolink.edu/etdc/view?acc_num=osu1565883484835926.
Повний текст джерелаParkin, John D. "Microcantilevers : calibration of their spring constants and use as ultrasensitive probes of adsorbed mass." Thesis, University of St Andrews, 2013. http://hdl.handle.net/10023/3608.
Повний текст джерелаJarmusik, Keith Edward. "An Improved Model for Interpreting Molecular Scale Electrostatic Interactions." Case Western Reserve University School of Graduate Studies / OhioLINK, 2010. http://rave.ohiolink.edu/etdc/view?acc_num=case1275666964.
Повний текст джерелаArecco, Daniel. "Analysis and preliminary characterization of a MEMS cantilever-type chemical sensor." Digital WPI, 2004. https://digitalcommons.wpi.edu/etd-theses/806.
Повний текст джерелаJiao, Sai. "Etude de la croisssance CVD des films minces de 3C-SiC et élaboration du cantilever AFM en 3C-SiC avec pointe Si intégrée." Thesis, Tours, 2012. http://www.theses.fr/2012TOUR4021/document.
Повний текст джерелаAmong aIl the well known polytypes ofihe silicon carbide (SiC), the cubic polytype (3C-SiC) is the only one that min be grown on silicon substrates. This heterostructure 3C SiC/Si ta interesting not only for its low production cost but also for the design of tise Micro-Electro-Mechanical Systems (MEMS). The high value ofthe Young’s modulis the 3C-SiC, compared to the silicon, allows submicronic cantilevers, fabrmcated from tIse 3C-SiC thin filins, to resonate at ultra-high frequency (>100MHz). The high resonant frequency is the key to obtain s fast, ultra-sensitive non-contact AFM systein.However, there isn’t any SiC cantilevers available on the market because of the difficulty to elaborate gond quality 3C-SiC thin films, with tIse Chemical Vapor Deposition (CVD) technique being tIse most frequently used synthesis technology. Tise first reason of tIse difficulty with the CVD technology to obtain gond quality thin film rests essentially in the important lattice mismatch and the difference in thermal expansion coefficient existing between 3C SiC and Si which generate crystalline defects at the interface and propagating tilI the 3C-SiC filin surface, with the inost defective zone localizing near the interface……
Cate, Evan Derek. "Design, Implementation, and Test of a Micro Force Displacement System." DigitalCommons@CalPoly, 2014. https://digitalcommons.calpoly.edu/theses/1192.
Повний текст джерелаLee, Sunyoung S. M. Massachusetts Institute of Technology. "Chemical functionalization of AFM cantilevers." Thesis, Massachusetts Institute of Technology, 2005. http://hdl.handle.net/1721.1/34205.
Повний текст джерелаIncludes bibliographical references (p. 47-52).
Atomic force microscopy (AFM) has been a powerful instrument that provides nanoscale imaging of surface features, mainly of rigid metal or ceramic surfaces that can be insulators as well as conductors. Since it has been demonstrated that AFM could be used in aqueous environment such as in water or various buffers from which physiological condition can be maintained, the scope of the application of this imaging technique has been expanded to soft biological materials. In addition, the main usage of AFM has been to image the material and provide the shape of surface, which has also been diversified to molecular-recognition imaging - functional force imaging through force spectroscopy and modification of AFM cantilevers. By immobilizing of certain molecules at the end of AFM cantilever, specific molecules or functionalities can be detected by the combination of intrinsic feature of AFM and chemical modification technique of AFM cantilever. The surface molecule that is complementary to the molecule at the end of AFM probe can be investigated via specificity of molecule-molecule interaction.
(cont.) Thus, this AFM cantilever chemistry, or chemical functionalization of AFM cantilever for the purpose of chemomechanical surface characterization, can be considered as an infinite source of applications important to understanding biological materials and material interactions. This thesis is mainly focused on three parts: (1) AFM cantilever chemistry that introduces specific protocols in details such as adsorption method, gold chemistry, and silicon nitride cantilever modification; (2) validation of cantilever chemistry such as X-ray photoelectron spectroscopy (XPS), AFM blocking experiment, and fluorescence microscopy, through which various AFM cantilever chemistry is verified; and (3) application of cantilever chemistry, especially toward the potential of force spectroscopy and the imaging of biological material surfaces.
by Sunyoung Lee.
S.M.
Liu, Zhen. "Reconstruction and Control of Tip Position and Dynamic Sensing of Interaction Force for Micro-Cantilever to Enable High Speed and High Resolution Dynamic Atomic Force Microscopy." The Ohio State University, 2017. http://rave.ohiolink.edu/etdc/view?acc_num=osu1483629656167247.
Повний текст джерелаPUKHOVA, VALENTINA. "DYNAMIC ATOMIC FORCE MICROSCOPY RESOLVED BY WAVELET TRANSFORM." Doctoral thesis, Università degli Studi di Milano, 2015. http://hdl.handle.net/2434/259234.
Повний текст джерелаBrook, Alexander J. "Micromachined III-V cantilevers for AFM-guided scanning Hall probe microscopy." Thesis, University of Bath, 2003. https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.425887.
Повний текст джерелаMeurk, Anders. "Force measurements using scanning probe microscopy : Applications to advanced powder processing." Doctoral thesis, Stockholm, 2000. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-3023.
Повний текст джерелаSarangapani, Krishna Kumar. "Characterizing selectin-ligand bonds using atomic force microscopy (AFM)." Diss., Georgia Institute of Technology, 2005. http://hdl.handle.net/1853/11650.
Повний текст джерелаLaurent, Justine. "Mesures de la force de Casimir à basse température." Phd thesis, Grenoble, 2010. http://www.theses.fr/2010GRENY070.
Повний текст джерелаThe Casimir force, named after the Dutch physicist who predicted in 1948 the existence of this attractive force in an ideal conguration of two perfectly conducting and parallel plates, is due to quantum-mechanical effects. It results from electromagnetic fluctuations of vacuum and cannot be neglected anymore in the performance of the nano-mechanical systems (NEMS), which are currently developed and could also revolutionize the microelectronics industry. However, the study of the corrections brought by the surface conductivity or by the dielectric stacks has just started. This thesis work presents the achievement of a new instrument dedicated to the measurement of the Casimir force between two surfaces at the micron scale. We have adapted the technique performed during the G. Jourdan's PhD thesis to a cryogenic environment in order to reach the sensitivity needed to investigate complex surfaces. The viscous damping of the force probe (AFM cantilever) due to the environmental fluid confined between the sphere glued at the tip of the AFM cantilever and a sample has been analysed. Measurements at 4K have revealed an opto-mechanical effect induced by laser noise. Finally, our first tests between two low rough gold surfaces have showed the presence of a parasite force. We have found out the origin of this force and succeeded to remove it. The first measurement of the Casimir force between a gold sphere and a silicon sample has been performed
Chen, Xiaomei [Verfasser], and Meinhard [Akademischer Betreuer] Schilling. "Atomic Force Microscope (AFM) Cantilevers as Encoder for Real-Time Displacement Measurements / Xiaomei Chen ; Betreuer: Meinhard Schilling." Braunschweig : Technische Universität Braunschweig, 2011. http://d-nb.info/1175824984/34.
Повний текст джерелаBellon, Ludovic. "Exploring nano-mechanics through thermal fluctuations." Habilitation à diriger des recherches, Ecole normale supérieure de lyon - ENS LYON, 2010. http://tel.archives-ouvertes.fr/tel-00541336.
Повний текст джерелаSaxena, Shubham. "Nanolithography on thin films using heated atomic force microscope cantilevers." Thesis, Available online, Georgia Institute of Technology, 2006, 2006. http://etd.gatech.edu/theses/available/etd-08302006-223629/.
Повний текст джерелаSalgar, Manojkumar Madhukar. "Dynamic Modeling of AFM Cantilever Probe Under Base Excitation system." Thesis, 2013. http://ethesis.nitrkl.ac.in/4880/1/211ME1155.pdf.
Повний текст джерелаvon, Schmidsfeld Alexander. "Interferometric detection and control of cantilever displacement in NC-AFM applications." Doctoral thesis, 2016. https://repositorium.ub.uni-osnabrueck.de/handle/urn:nbn:de:gbv:700-2016071114621.
Повний текст джерела"AFM Bi-material Cantilever Based Near-field Radiation Heat Transfer Measurement." Master's thesis, 2019. http://hdl.handle.net/2286/R.I.54941.
Повний текст джерелаDissertation/Thesis
Masters Thesis Mechanical Engineering 2019
Lübbe, Jannis Ralph Ulrich. "Cantilever properties and noise figures in high-resolution non-contact atomic force microscopy." Doctoral thesis, 2013. https://repositorium.ub.uni-osnabrueck.de/handle/urn:nbn:de:gbv:700-2013040310741.
Повний текст джерелаRuzicka, Frank Joseph. "Exploration of voltage controlled manganite phase transitions as probed with magnetic force microscopy." Thesis, 2010. http://hdl.handle.net/2152/ETD-UT-2010-05-1188.
Повний текст джерелаtext
Kim, Seonghwan. "Characterization of Dynamic Response of AFM Cantilevers for Microscale Thermofluidic and Biophysical Sensors." 2008. http://trace.tennessee.edu/utk_graddiss/458.
Повний текст джерелаSheng-KaiChuang and 莊勝凱. "Investigation of the optimal design of Torsional Resonance mode AFM cantilevers operated in fluids." Thesis, 2011. http://ndltd.ncl.edu.tw/handle/32615585158410013579.
Повний текст джерелаTremoço, Frederico Henriques Antão Mendes. "Heating of Atomic Force Microscopy (AFM) cantilevers operating in liquid media under intense optical illumination." Master's thesis, 2020. http://hdl.handle.net/10362/112988.
Повний текст джерела