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Статті в журналах з теми "AFM cantilever"
Dannberg, Oliver, and Thomas Fröhlich. "Steifigkeitsmessungen von AFM-Cantilevern." tm - Technisches Messen 88, s1 (August 24, 2021): s3—s7. http://dx.doi.org/10.1515/teme-2021-0046.
Повний текст джерелаSlattery, Ashley D., Adam J. Blanch, Cameron J. Shearer, Andrew J. Stapleton, Renee V. Goreham, Sarah L. Harmer, Jamie S. Quinton, and Christopher T. Gibson. "Characterisation of the Material and Mechanical Properties of Atomic Force Microscope Cantilevers with a Plan-View Trapezoidal Geometry." Applied Sciences 9, no. 13 (June 27, 2019): 2604. http://dx.doi.org/10.3390/app9132604.
Повний текст джерелаZhao, Yu Wen, Yun Peng Song, Sen Wu, and Xing Fu. "Accurate and Traceable Calibration of the Stiffness of Various AFM Cantilevers." Key Engineering Materials 645-646 (May 2015): 817–23. http://dx.doi.org/10.4028/www.scientific.net/kem.645-646.817.
Повний текст джерелаCho, Ki Ho, Hak Joo Lee, Jae Hyun Kim, Jong Man Kim, Yong Kweon Kim, and Chang Wook Baek. "A Study of Nano-Indentation Test Using Rhombus-Shaped Cantilever in Atomic Force Microscope." Key Engineering Materials 326-328 (December 2006): 207–10. http://dx.doi.org/10.4028/www.scientific.net/kem.326-328.207.
Повний текст джерелаDat, Le Tri, Ho Thanh Huy, and Nguyen Duy Vy. "A Theoretical Study of Deflection of AFM Bimaterial Cantilevers Versus Irradiated Position." Communications in Physics 28, no. 3 (November 14, 2018): 255. http://dx.doi.org/10.15625/0868-3166/28/3/12673.
Повний текст джерелаBoubekri, Rachida, Edmond Cambril, L. Couraud, Lorenzo Bernardi, Ali Madouri, David Martrou, and Sébastien Gauthier. "High Frequency 3C-SiC AFM Cantilever Using Thermal Actuation and Metallic Piezoresistive Detection." Materials Science Forum 711 (January 2012): 80–83. http://dx.doi.org/10.4028/www.scientific.net/msf.711.80.
Повний текст джерелаMordue, Christopher W., Jonathan M. R. Weaver, and Phillip S. Dobson. "Thermal induced deflection in atomic force microscopy cantilevers: analysis & solution." Measurement Science and Technology 34, no. 12 (August 25, 2023): 125013. http://dx.doi.org/10.1088/1361-6501/acf061.
Повний текст джерелаDamircheli, Mehrnoosh, and Babak Eslami. "Design of V-shaped cantilevers for enhanced multifrequency AFM measurements." Beilstein Journal of Nanotechnology 11 (October 6, 2020): 1525–41. http://dx.doi.org/10.3762/bjnano.11.135.
Повний текст джерелаLiu, Hao, Zuned Ahmed, Sasa Vranjkovic, Manfred Parschau, Andrada-Oana Mandru, and Hans J. Hug. "A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy." Beilstein Journal of Nanotechnology 13 (October 11, 2022): 1120–40. http://dx.doi.org/10.3762/bjnano.13.95.
Повний текст джерелаYeh, Meng Kao, Bo Yi Chen, Nyan Hwa Tai, and Chien Chao Chiu. "Force Measurement by AFM Cantilever with Different Coating Layers." Key Engineering Materials 326-328 (December 2006): 377–80. http://dx.doi.org/10.4028/www.scientific.net/kem.326-328.377.
Повний текст джерелаДисертації з теми "AFM cantilever"
Dharmasena, Sajith Mevan. "A Multi-Channel Micromechanical Cantilever for Advanced Multi-Modal Atomic Force Microscopy." The Ohio State University, 2019. http://rave.ohiolink.edu/etdc/view?acc_num=osu1565883484835926.
Повний текст джерелаParkin, John D. "Microcantilevers : calibration of their spring constants and use as ultrasensitive probes of adsorbed mass." Thesis, University of St Andrews, 2013. http://hdl.handle.net/10023/3608.
Повний текст джерелаJarmusik, Keith Edward. "An Improved Model for Interpreting Molecular Scale Electrostatic Interactions." Case Western Reserve University School of Graduate Studies / OhioLINK, 2010. http://rave.ohiolink.edu/etdc/view?acc_num=case1275666964.
Повний текст джерелаArecco, Daniel. "Analysis and preliminary characterization of a MEMS cantilever-type chemical sensor." Digital WPI, 2004. https://digitalcommons.wpi.edu/etd-theses/806.
Повний текст джерелаJiao, Sai. "Etude de la croisssance CVD des films minces de 3C-SiC et élaboration du cantilever AFM en 3C-SiC avec pointe Si intégrée." Thesis, Tours, 2012. http://www.theses.fr/2012TOUR4021/document.
Повний текст джерелаAmong aIl the well known polytypes ofihe silicon carbide (SiC), the cubic polytype (3C-SiC) is the only one that min be grown on silicon substrates. This heterostructure 3C SiC/Si ta interesting not only for its low production cost but also for the design of tise Micro-Electro-Mechanical Systems (MEMS). The high value ofthe Young’s modulis the 3C-SiC, compared to the silicon, allows submicronic cantilevers, fabrmcated from tIse 3C-SiC thin filins, to resonate at ultra-high frequency (>100MHz). The high resonant frequency is the key to obtain s fast, ultra-sensitive non-contact AFM systein.However, there isn’t any SiC cantilevers available on the market because of the difficulty to elaborate gond quality 3C-SiC thin films, with tIse Chemical Vapor Deposition (CVD) technique being tIse most frequently used synthesis technology. Tise first reason of tIse difficulty with the CVD technology to obtain gond quality thin film rests essentially in the important lattice mismatch and the difference in thermal expansion coefficient existing between 3C SiC and Si which generate crystalline defects at the interface and propagating tilI the 3C-SiC filin surface, with the inost defective zone localizing near the interface……
Cate, Evan Derek. "Design, Implementation, and Test of a Micro Force Displacement System." DigitalCommons@CalPoly, 2014. https://digitalcommons.calpoly.edu/theses/1192.
Повний текст джерелаLee, Sunyoung S. M. Massachusetts Institute of Technology. "Chemical functionalization of AFM cantilevers." Thesis, Massachusetts Institute of Technology, 2005. http://hdl.handle.net/1721.1/34205.
Повний текст джерелаIncludes bibliographical references (p. 47-52).
Atomic force microscopy (AFM) has been a powerful instrument that provides nanoscale imaging of surface features, mainly of rigid metal or ceramic surfaces that can be insulators as well as conductors. Since it has been demonstrated that AFM could be used in aqueous environment such as in water or various buffers from which physiological condition can be maintained, the scope of the application of this imaging technique has been expanded to soft biological materials. In addition, the main usage of AFM has been to image the material and provide the shape of surface, which has also been diversified to molecular-recognition imaging - functional force imaging through force spectroscopy and modification of AFM cantilevers. By immobilizing of certain molecules at the end of AFM cantilever, specific molecules or functionalities can be detected by the combination of intrinsic feature of AFM and chemical modification technique of AFM cantilever. The surface molecule that is complementary to the molecule at the end of AFM probe can be investigated via specificity of molecule-molecule interaction.
(cont.) Thus, this AFM cantilever chemistry, or chemical functionalization of AFM cantilever for the purpose of chemomechanical surface characterization, can be considered as an infinite source of applications important to understanding biological materials and material interactions. This thesis is mainly focused on three parts: (1) AFM cantilever chemistry that introduces specific protocols in details such as adsorption method, gold chemistry, and silicon nitride cantilever modification; (2) validation of cantilever chemistry such as X-ray photoelectron spectroscopy (XPS), AFM blocking experiment, and fluorescence microscopy, through which various AFM cantilever chemistry is verified; and (3) application of cantilever chemistry, especially toward the potential of force spectroscopy and the imaging of biological material surfaces.
by Sunyoung Lee.
S.M.
Liu, Zhen. "Reconstruction and Control of Tip Position and Dynamic Sensing of Interaction Force for Micro-Cantilever to Enable High Speed and High Resolution Dynamic Atomic Force Microscopy." The Ohio State University, 2017. http://rave.ohiolink.edu/etdc/view?acc_num=osu1483629656167247.
Повний текст джерелаPUKHOVA, VALENTINA. "DYNAMIC ATOMIC FORCE MICROSCOPY RESOLVED BY WAVELET TRANSFORM." Doctoral thesis, Università degli Studi di Milano, 2015. http://hdl.handle.net/2434/259234.
Повний текст джерелаBrook, Alexander J. "Micromachined III-V cantilevers for AFM-guided scanning Hall probe microscopy." Thesis, University of Bath, 2003. https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.425887.
Повний текст джерелаЧастини книг з теми "AFM cantilever"
Xia, Fangzhou, Ivo W. Rangelow, and Kamal Youcef-Toumi. "Nanofabrication of AFM Cantilever Probes." In Active Probe Atomic Force Microscopy, 109–50. Cham: Springer International Publishing, 2024. http://dx.doi.org/10.1007/978-3-031-44233-9_5.
Повний текст джерелаKiracofe, Daniel, John Melcher, and Arvind Raman. "Fundamentals of AFM Cantilever Dynamics in Liquid Environments." In Atomic Force Microscopy in Liquid, 121–55. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2012. http://dx.doi.org/10.1002/9783527649808.ch5.
Повний текст джерелаYeh, Meng Kao, Bo Yi Chen, Nyan Hwa Tai, and Chien Chao Chiu. "Force Measurement by AFM Cantilever with Different Coating Layers." In Experimental Mechanics in Nano and Biotechnology, 377–80. Stafa: Trans Tech Publications Ltd., 2006. http://dx.doi.org/10.4028/0-87849-415-4.377.
Повний текст джерелаLange, D., M. Zimmermann, C. Hagleitner, O. Brand, and H. Baltes. "CMOS 10-Cantilever Array for Constant-Force Parallel Scanning AFM." In Transducers ’01 Eurosensors XV, 1046–49. Berlin, Heidelberg: Springer Berlin Heidelberg, 2001. http://dx.doi.org/10.1007/978-3-642-59497-7_247.
Повний текст джерелаShie, N. C., T. L. Chen, and Kai Yuan Cheng. "Use of Fiber Interferometer for AFM Cantilever Probe Displacement Control." In Key Engineering Materials, 77–82. Stafa: Trans Tech Publications Ltd., 2005. http://dx.doi.org/10.4028/0-87849-977-6.77.
Повний текст джерелаPark, Jeong Woo, Deug Woo Lee, Noboru Takano, and Noboru Morita. "Diamond Tip Cantilever for Micro/Nano Machining Based on AFM." In Materials Science Forum, 79–84. Stafa: Trans Tech Publications Ltd., 2006. http://dx.doi.org/10.4028/0-87849-990-3.79.
Повний текст джерелаYabuno, Hiorshi, Masaharu Kuroda, and Takashi Someya. "Contact to Sample Surface by Self-excited Micro-cantilever Probe in AFM." In IUTAM Symposium on Dynamics Modeling and Interaction Control in Virtual and Real Environments, 27–33. Dordrecht: Springer Netherlands, 2011. http://dx.doi.org/10.1007/978-94-007-1643-8_4.
Повний текст джерелаChui, B. W., T. W. Kenny, H. J. Mamin, B. D. Terris, and D. Rugar. "Dual-Axis Piezoresistive AFM Cantilever for Independent Detection of Vertical and Lateral Forces." In Tribology Issues and Opportunities in MEMS, 301–12. Dordrecht: Springer Netherlands, 1998. http://dx.doi.org/10.1007/978-94-011-5050-7_22.
Повний текст джерелаKranz, Christine, Boris Mizaikoff, Alois Lugstein, and Emmerich Bertagnolli. "Integrating an Ultramicroelectrode in an AFM Cantilever: Toward the Development of Combined Microsensing Imaging Tools." In Environmental Electrochemistry, 320–33. Washington, DC: American Chemical Society, 2002. http://dx.doi.org/10.1021/bk-2002-0811.ch017.
Повний текст джерелаArinero, Richard, and Gérard Lévêque. "One-Dimensional Finite Element Modeling of AFM Cantilevers." In Acoustic Scanning Probe Microscopy, 101–22. Berlin, Heidelberg: Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-27494-7_4.
Повний текст джерелаТези доповідей конференцій з теми "AFM cantilever"
Chigullapalli, Aarti, and Jason V. Clark. "Modeling the Thermomechanical Interaction Between an Atomic Force Microscope Cantilever and Laser Light." In ASME 2012 International Mechanical Engineering Congress and Exposition. American Society of Mechanical Engineers, 2012. http://dx.doi.org/10.1115/imece2012-89215.
Повний текст джерелаMoeini, S. A., M. H. Kahrobaiyan, M. Rahaeifard, and M. T. Ahmadian. "Optimization of First Mode Sensitivity of V-Shaped AFM Cantilever Using Genetic Algorithm Method." In ASME 2009 International Mechanical Engineering Congress and Exposition. ASMEDC, 2009. http://dx.doi.org/10.1115/imece2009-12554.
Повний текст джерелаLee, Jungchul, Tanya L. Wright, Mark Abel, Erik Sunden, Alexei Marchenkov, Samuel Graham, and William P. King. "Characterization of Heated Atomic Force Microscope Cantilevers in Air and Vacuum." In ASME 2005 Pacific Rim Technical Conference and Exhibition on Integration and Packaging of MEMS, NEMS, and Electronic Systems collocated with the ASME 2005 Heat Transfer Summer Conference. ASMEDC, 2005. http://dx.doi.org/10.1115/ipack2005-73456.
Повний текст джерелаShen, Sheng, Avind Narayanaswamy, Shireen Goh, and Gang Chen. "Thermal Conductance of Bi-Material AFM Cantilevers." In ASME 2008 International Mechanical Engineering Congress and Exposition. ASMEDC, 2008. http://dx.doi.org/10.1115/imece2008-68078.
Повний текст джерелаRubio-Sierra, F. J., R. Vazquez, and R. W. Stark. "Transfer Function Analysis of Atomic Force Microscope Cantilevers." In ASME 2005 International Mechanical Engineering Congress and Exposition. ASMEDC, 2005. http://dx.doi.org/10.1115/imece2005-81156.
Повний текст джерелаSuter, Kaspar. "Tuning Fork AFM with Conductive Cantilever." In SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED TECHNIQUES: 12th International Conference STM'03. AIP, 2003. http://dx.doi.org/10.1063/1.1639700.
Повний текст джерелаDutta, Sudipta, Mahesh Kumar Singh, and M. S. Bobji. "PROBING ATOMIC LEVEL INTERACTIONS IN NI NANORODS AND AFM CANTILEVER USING ATOMIC FORCE MICROSCOPY BASED F–D SPECTROSCOPY." In BALTTRIB. Aleksandras Stulginskis University, 2017. http://dx.doi.org/10.15544/balttrib.2017.34.
Повний текст джерелаKumanchik, Lee, Tony Schmitz, Jon Pratt, and John Ziegert. "Full Field Displacement Measurements of AFM Cantilevers During Loading." In ASME 2007 International Manufacturing Science and Engineering Conference. ASMEDC, 2007. http://dx.doi.org/10.1115/msec2007-31041.
Повний текст джерелаKing, William P., Thomas W. Kenny, and Kenneth E. Goodson. "Comparison of Piezoresistive and Thermal Detection Approaches to Atomic Force Microscopy Topography Measurement." In ASME 2002 International Mechanical Engineering Congress and Exposition. ASMEDC, 2002. http://dx.doi.org/10.1115/imece2002-33295.
Повний текст джерелаChakraborty, Ishita, and Balakumar Balachandran. "Noise and Contact in Dynamic AFM Operations." In ASME 2011 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. ASMEDC, 2011. http://dx.doi.org/10.1115/detc2011-47955.
Повний текст джерелаЗвіти організацій з теми "AFM cantilever"
Gates, Richard S. Certification of Standard Reference Material® 3461 Reference Cantilevers for AFM Spring Constant Calibration. Gaithersburg, MD: National Institute of Standards and Technology, 2022. http://dx.doi.org/10.6028/nist.sp.260-227.
Повний текст джерелаGates, Richard S. Certification of Standard Reference Material® 3461 Reference Cantilevers for AFM Spring Constant Calibration. Gaithersburg, MD: National Institute of Standards and Technology, 2023. http://dx.doi.org/10.6028/nist.sp.260-227-upd1.
Повний текст джерела