Статті в журналах з теми "A-SiOx:H Thin Films"
Оформте джерело за APA, MLA, Chicago, Harvard та іншими стилями
Ознайомтеся з топ-50 статей у журналах для дослідження на тему "A-SiOx:H Thin Films".
Біля кожної праці в переліку літератури доступна кнопка «Додати до бібліографії». Скористайтеся нею – і ми автоматично оформимо бібліографічне посилання на обрану працю в потрібному вам стилі цитування: APA, MLA, «Гарвард», «Чикаго», «Ванкувер» тощо.
Також ви можете завантажити повний текст наукової публікації у форматі «.pdf» та прочитати онлайн анотацію до роботи, якщо відповідні параметри наявні в метаданих.
Переглядайте статті в журналах для різних дисциплін та оформлюйте правильно вашу бібліографію.
Alfonsetti, R., L. Lozzi, M. Passacantando, P. Picozzi, and S. Santucci. "Determination of stoichiometry of SiOx thin films using an Auger parameter." Thin Solid Films 213, no. 2 (June 1992): 158–59. http://dx.doi.org/10.1016/0040-6090(92)90276-h.
Повний текст джерелаZamchiy, Alexandr, Evgeniy Baranov, Sergey Khmel, and Marat Sharafutdinov. "Effect of annealing time on aluminum-induced crystallization of silicon suboxide thin films." EPJ Web of Conferences 196 (2019): 00039. http://dx.doi.org/10.1051/epjconf/201919600039.
Повний текст джерелаNagatomi, Y., S. Yoshidomi, M. Hasumi, T. Sameshima, and A. Kohno. "Formation of Aluminum Oxide Films on Silicon Surface by Aluminum Evaporation in Oxygen Gas Atmosphere." MRS Proceedings 1426 (2012): 421–26. http://dx.doi.org/10.1557/opl.2012.868.
Повний текст джерелаGlesener, J. W., J. M. Anthony, and A. Cunningham. "Photoluminescence investigation of a-C: H thin films." Diamond and Related Materials 2, no. 5-7 (April 1993): 670–72. http://dx.doi.org/10.1016/0925-9635(93)90201-c.
Повний текст джерелаLabrador, Natalie Yumiko, and Daniel V. Esposito. "(Invited) Multifunctional Membrane Coated Electrocatalysts." ECS Meeting Abstracts MA2018-01, no. 31 (April 13, 2018): 1875. http://dx.doi.org/10.1149/ma2018-01/31/1875.
Повний текст джерелаRahman, Mujib Ur, Yonghao Xi, Haipeng Li, Fei Chen, Dongjie Liu, and Jinjia Wei. "Dynamics and Structure Formation of Confined Polymer Thin Films Supported on Solid Substrates." Polymers 13, no. 10 (May 17, 2021): 1621. http://dx.doi.org/10.3390/polym13101621.
Повний текст джерелаVanek, J., V. Cech, R. Prikryl, J. Zemek, and V. Perina. "Basic characteristics of the a-SiOC∶H thin films prepared by PE CVD." Czechoslovak Journal of Physics 54, S3 (March 2004): C937—C942. http://dx.doi.org/10.1007/bf03166511.
Повний текст джерелаNagai, Hiroki, Naoki Ogawa, and Mitsunobu Sato. "Deep-Ultraviolet Transparent Conductive MWCNT/SiO2 Composite Thin Film Fabricated by UV Irradiation at Ambient Temperature onto Spin-Coated Molecular Precursor Film." Nanomaterials 11, no. 5 (May 20, 2021): 1348. http://dx.doi.org/10.3390/nano11051348.
Повний текст джерелаSingh, Sarab Preet, and Pankaj Srivastava. "Recent Progress in the Understanding of Si-Nanostructures Formation in a-SiNx:H Thin Film for Si-Based Optoelectronic Devices." Solid State Phenomena 171 (May 2011): 1–17. http://dx.doi.org/10.4028/www.scientific.net/ssp.171.1.
Повний текст джерелаLU, WANBING, SHAOGANG GUO, JIANTAO WANG, YUN LI, XINZHAN WANG, GENGXI YU, SHANSHAN FAN, and GUANGSHENG FU. "MICROSTRUCTURAL PROPERTIES OF NC-Si/SiO2 FILMS IN SITU GROWN BY REACTIVE MAGNETRON CO-SPUTTERING." International Journal of Nanoscience 11, no. 06 (December 2012): 1240035. http://dx.doi.org/10.1142/s0219581x12400352.
Повний текст джерелаBurlaka, Vladimir, Kai Nörthemann, and Astrid Pundt. "Nb-H Thin Films: On Phase Transformation Kinetics." Defect and Diffusion Forum 371 (February 2017): 160–65. http://dx.doi.org/10.4028/www.scientific.net/ddf.371.160.
Повний текст джерелаLoboda, M. J., C. M. Grove, and R. F. Schneider. "Properties of a ‐ SiO x : H Thin Films Deposited from Hydrogen Silsesquioxane Resins." Journal of The Electrochemical Society 145, no. 8 (August 1, 1998): 2861–66. http://dx.doi.org/10.1149/1.1838726.
Повний текст джерелаZhang, Xiao-Ying, Yue Yang, Zhi-Xuan Zhang, Xin-Peng Geng, Chia-Hsun Hsu, Wan-Yu Wu, Shui-Yang Lien, and Wen-Zhang Zhu. "Deposition and Characterization of RP-ALD SiO2 Thin Films with Different Oxygen Plasma Powers." Nanomaterials 11, no. 5 (April 29, 2021): 1173. http://dx.doi.org/10.3390/nano11051173.
Повний текст джерелаMarteau, Baptiste, Thibaut Desrues, Quentin Rafhay, Anne Kaminski, and Sébastien Dubois. "Passivating Silicon Tunnel Diode for Perovskite on Silicon Nip Tandem Solar Cells." Energies 16, no. 11 (May 26, 2023): 4346. http://dx.doi.org/10.3390/en16114346.
Повний текст джерелаPrado, R. J., D. R. S. Bittencourt, M. H. Tabacniks, M. C. A. Fantini, M. N. P. Carreño, and I. Pereyra. "Distribution of Pores in a-Si1−x C x :H Thin Films." Journal of Applied Crystallography 30, no. 5 (October 1, 1997): 659–63. http://dx.doi.org/10.1107/s0021889897001349.
Повний текст джерелаHattori, Yoshiaki, Takashi Taniguchi, Kenji Watanabe, and Masatoshi Kitamura. "Visualization of a hexagonal boron nitride monolayer on an ultra-thin gold film via reflected light microscopy." Nanotechnology 33, no. 6 (November 15, 2021): 065702. http://dx.doi.org/10.1088/1361-6528/ac3357.
Повний текст джерелаViard, J., E. Beche, J. Durand, and R. Berjoan. "SiH bonding environment in PECVD a-SiOxNy:H thin films." Journal of the European Ceramic Society 17, no. 15-16 (January 1997): 2029–32. http://dx.doi.org/10.1016/s0955-2219(97)00083-6.
Повний текст джерелаde O. Graeff, C. F., F. L. Freire, and I. Chambouleyron. "Hydrogen diffusion in RF-sputtered a-Ge: H thin films." Journal of Non-Crystalline Solids 137-138 (January 1991): 41–44. http://dx.doi.org/10.1016/s0022-3093(05)80052-3.
Повний текст джерелаEl Khakani, M. A., M. Chaker, A. Jean, S. Boily, J. C. Kieffer, M. E. O'Hern, M. F. Ravet, and F. Rousseaux. "Hardness and Young's modulus of amorphous a-SiC thin films determined by nanoindentation and bulge tests." Journal of Materials Research 9, no. 1 (January 1994): 96–103. http://dx.doi.org/10.1557/jmr.1994.0096.
Повний текст джерелаZhou, Rui, Zhaoyang Zhao, Juanxia Wu, and Liming Xie. "Chemical Vapor Deposition of IrTe2 Thin Films." Crystals 10, no. 7 (July 3, 2020): 575. http://dx.doi.org/10.3390/cryst10070575.
Повний текст джерелаChen, Yuan-Tsung. "Nanoindentation and Adhesion Properties of Ta Thin Films." Journal of Nanomaterials 2013 (2013): 1–7. http://dx.doi.org/10.1155/2013/154179.
Повний текст джерелаShin, Dae Yong, and Kyung Nam Kim. "Effective of SiO2 Addition on the Self-Cleaning and Photocatalytic Properties of TiO2 Films by Sol-Gel Process." Materials Science Forum 620-622 (April 2009): 679–82. http://dx.doi.org/10.4028/www.scientific.net/msf.620-622.679.
Повний текст джерелаRüther, R., and J. Livingstone. "An infrared study of SiH cluster formation in a-Si: H thin films." Infrared Physics & Technology 37, no. 4 (June 1996): 533–37. http://dx.doi.org/10.1016/s1350-4495(95)00082-8.
Повний текст джерелаMisra, A., H. Kung, T. E. Mitchell, and M. Nastasi. "Residual stresses in polycrystalline Cu/Cr multilayered thin films." Journal of Materials Research 15, no. 3 (March 2000): 756–63. http://dx.doi.org/10.1557/jmr.2000.0109.
Повний текст джерелаKLAUS, J. W., O. SNEH, A. W. OTT, and S. M. GEORGE. "ATOMIC LAYER DEPOSITION OF SiO2 USING CATALYZED AND UNCATALYZED SELF-LIMITING SURFACE REACTIONS." Surface Review and Letters 06, no. 03n04 (June 1999): 435–48. http://dx.doi.org/10.1142/s0218625x99000433.
Повний текст джерелаLee, Hean Ju, Kyoung Suk Oh, and Chi Kyu Choi. "The mechanical properties of the SiOC(H) composite thin films with a low dielectric constant." Surface and Coatings Technology 171, no. 1-3 (July 2003): 296–301. http://dx.doi.org/10.1016/s0257-8972(03)00289-5.
Повний текст джерелаHASANAIN, S. K., and UZMA KHALIQUE. "FLUX DYNAMICS IN YBCO THIN FILMS." Modern Physics Letters B 14, no. 27n28 (December 10, 2000): 949–59. http://dx.doi.org/10.1142/s0217984900001099.
Повний текст джерелаWang, Xiao-Dong, K. W. Hipps, J. T. Dickinso, and Ursula Mazur. "Amorphous or nanocrystalline AlN thin films formed from AlN: H." Journal of Materials Research 9, no. 6 (June 1994): 1449–55. http://dx.doi.org/10.1557/jmr.1994.1449.
Повний текст джерелаMota-Santiago, P., A. Nadzri, F. Kremer, T. Bierschenk, C. E. Canto, M. D. Rodriguez, C. Notthoff, S. Mudie, and P. Kluth. "Characterisation of silicon oxynitride thin films and their response to swift heavy-ion irradiation." Journal of Physics D: Applied Physics 55, no. 14 (January 10, 2022): 145301. http://dx.doi.org/10.1088/1361-6463/ac45b1.
Повний текст джерелаTerekhov, Vladimir A., Evgeny I. Terukov, Yury K. Undalov, Konstantin A. Barkov, Igor E. Zanin, Oleg V. Serbin, and Irina N. Trapeznikova. "Structural Rearrangement of a-SiOx:H Films with Pulse Photon Annealing." Kondensirovannye sredy i mezhfaznye granitsy = Condensed Matter and Interphases 22, no. 4 (December 15, 2020): 489–95. http://dx.doi.org/10.17308/kcmf.2020.22/3119.
Повний текст джерелаBayley, P. A., and J. M. Marshall. "Transient photoconductivity in a-Si1−x C x :H thin films." Philosophical Magazine B 73, no. 3 (March 1996): 429–44. http://dx.doi.org/10.1080/13642819608239127.
Повний текст джерелаGuo, Zi-Hao, Na Ai, Connor Ryan McBroom, Tianyu Yuan, Yen-Hao Lin, Michael Roders, Congzhi Zhu, Alexander L. Ayzner, Jian Pei, and Lei Fang. "A side-chain engineering approach to solvent-resistant semiconducting polymer thin films." Polymer Chemistry 7, no. 3 (2016): 648–55. http://dx.doi.org/10.1039/c5py01669j.
Повний текст джерелаSong, Lin, Volker Körstgens, David Magerl, Bo Su, Thomas Fröschl, Nicola Hüsing, Sigrid Bernstorff, and Peter Müller-Buschbaum. "Low-Temperature Fabrication of Mesoporous Titania Thin Films." MRS Advances 2, no. 43 (2017): 2315–25. http://dx.doi.org/10.1557/adv.2017.406.
Повний текст джерелаHu, Chih-Wei, Yasusei Yamada, and Kazuki Yoshimura. "Fabrication of nickel oxyhydroxide/palladium (NiOOH/Pd) thin films for gasochromic application." Journal of Materials Chemistry C 4, no. 23 (2016): 5390–97. http://dx.doi.org/10.1039/c6tc01541g.
Повний текст джерелаYang, Chang Sil, Heon Ju Lee, and Chi Kyu Choi. "Formation and Characteristics of the Low Dielectric Carbon Doped Silicon Oxide Thin Film Deposited by MTMS/O2 – ICPCVD." Solid State Phenomena 107 (October 2005): 103–6. http://dx.doi.org/10.4028/www.scientific.net/ssp.107.103.
Повний текст джерелаMu, Wen Ning, Shuang Zhi Shi, and Xiu Yu Yang. "Preparation of TiO2 Nanometer Thin Film Deposited on Organic Templates by a Layer-by-Layer Self-Assembly Method." Advanced Materials Research 391-392 (December 2011): 432–36. http://dx.doi.org/10.4028/www.scientific.net/amr.391-392.432.
Повний текст джерелаRosaiah, P., and O. M. Hussain. "Microstructural and Electrochemical Properties of rf-Sputtered LiFeO2 Thin Films." Journal of Nanoscience 2014 (March 13, 2014): 1–6. http://dx.doi.org/10.1155/2014/173845.
Повний текст джерелаHellgren, Niklas, Nian Lin, Esteban Broitman, Virginie Serin, Stefano E. Grillo, Ray Twesten, Ivan Petrov, Christian Colliex, Lars Hultman, and Jan-Eric Sundgren. "Thermal stability of carbon nitride thin films." Journal of Materials Research 16, no. 11 (November 2001): 3188–201. http://dx.doi.org/10.1557/jmr.2001.0440.
Повний текст джерелаLai, Lu-Lu, and Jin-Ming Wu. "A facile solution approach to W,N co-doped TiO2 nanobelt thin films with high photocatalytic activity." Journal of Materials Chemistry A 3, no. 31 (2015): 15863–68. http://dx.doi.org/10.1039/c5ta03918e.
Повний текст джерелаHeita Shafudah, Natangue, Hiroki Nagai, Yutaka Suwazono, Ryuhei Ozawa, Yukihiro Kudoh, Taiju Takahashi, Takeyoshi Onuma, and Mitsunobu Sato. "Hydrophilic Titania Thin Films from a Molecular Precursor Film Formed via Electrospray Deposition on a Quartz Glass Substrate Precoated with Carbon Nanotubes." Coatings 10, no. 11 (October 29, 2020): 1050. http://dx.doi.org/10.3390/coatings10111050.
Повний текст джерелаRamana, K. Venkata, M. Chandra Shekar, and V. Madhusudhana Reddy. "Characterization of Blended Polymer Electrolyte Thin Films Based on PVDF + PEG Doped with Nano SiO2." Oriental Journal Of Chemistry 38, no. 4 (August 31, 2022): 924–28. http://dx.doi.org/10.13005/ojc/380412.
Повний текст джерелаMiceli, P. F., H. Zabel, J. A. Dura, and C. P. Flynn. "Anomalous lattice expansion of metal-hydrogen thin films." Journal of Materials Research 6, no. 5 (May 1991): 964–68. http://dx.doi.org/10.1557/jmr.1991.0964.
Повний текст джерелаAzmi, Fahmida, Brahim Ahammou, Paramita Bhattacharyya, and Peter Mascher. "Optical and Mechanical Properties of Europium-Doped Silicon Oxynitride Thin Films." ECS Meeting Abstracts MA2022-01, no. 20 (July 7, 2022): 1093. http://dx.doi.org/10.1149/ma2022-01201093mtgabs.
Повний текст джерелаSarbu, Alexandru, Laure Biniek, Jean-Michel Guenet, Philippe J. Mésini, and Martin Brinkmann. "Reversible J- to H-aggregate transformation in thin films of a perylenebisimide organogelator." Journal of Materials Chemistry C 3, no. 6 (2015): 1235–42. http://dx.doi.org/10.1039/c4tc02444c.
Повний текст джерелаYamauchi, H., R. J. White, M. Ayukawa, T. C. Murray, and J. W. Robinson. "The structure of thin films sputter deposited from a Ba2 Si2TiO8 ceramic target." Journal of Materials Research 3, no. 1 (February 1988): 105–11. http://dx.doi.org/10.1557/jmr.1988.0105.
Повний текст джерелаLiu, Dage, Hongxi Zhang, Zhong Wang, and Liancheng Zhao. "Preparation and Characterization of Pb(Zr0.52Ti0.48)O3 Powders and Thin Films by a Sol-gel Route." Journal of Materials Research 15, no. 6 (June 2000): 1336–41. http://dx.doi.org/10.1557/jmr.2000.0194.
Повний текст джерелаZhou, Weikun, Wenqiao Han, Yihao Yang, Liang Shu, Qinggui Luo, Yanjiang Ji, Cai Jin, et al. "Synthesis of freestanding perovskite oxide thin films by using brownmillerite SrCoO2.5 as a sacrificial layer." Applied Physics Letters 122, no. 6 (February 6, 2023): 062901. http://dx.doi.org/10.1063/5.0131056.
Повний текст джерелаFoschini, Cesar, Bruno Hangai, Paulo Ortega, Elson Longo, Mário Cilense, and Alexandre Simões. "Evidence of ferroelectric behaviour in CaCu3Ti4O12 thin films deposited by RF-sputtering." Processing and Application of Ceramics 13, no. 3 (2019): 219–28. http://dx.doi.org/10.2298/pac1903219f.
Повний текст джерелаMohammed Al-Ansari, Ramiz A. "The effect of annealing temperatures on the optical parameters of NiO0.99Cu0.01 thin films." Iraqi Journal of Physics (IJP) 14, no. 29 (February 3, 2019): 73–81. http://dx.doi.org/10.30723/ijp.v14i29.223.
Повний текст джерелаLemonds, A. M., K. Kershen, J. Bennett, K. Pfeifer, Y.-M. Sun, J. M. White, and J. G. Ekerdt. "Adhesion of Cu and low-k Dielectric Thin Films with Tungsten Carbide." Journal of Materials Research 17, no. 6 (June 2002): 1320–28. http://dx.doi.org/10.1557/jmr.2002.0197.
Повний текст джерела