Статті в журналах з теми "3-D metrology"
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Poon, Ting-Chung, Yaping Zhang, Liangcai Cao, and Hiroshi Yoshikawa. "Editorial on Special Issue “Holography, 3-D Imaging and 3-D Display”." Applied Sciences 10, no. 20 (October 11, 2020): 7057. http://dx.doi.org/10.3390/app10207057.
Повний текст джерелаHärter, Daniel. "3-D metrology system with internal calibration." Optical Engineering 50, no. 1 (January 1, 2011): 013604. http://dx.doi.org/10.1117/1.3530130.
Повний текст джерелаClarke, Tim, and Richard Gooch. "Real‐time 3‐D metrology for aerospace manufacture." Sensor Review 19, no. 2 (June 1999): 113–15. http://dx.doi.org/10.1108/02602289910266304.
Повний текст джерелаSid-Ahmed, M. A., and M. T. Boraie. "Dual camera calibration for 3-D machine vision metrology." IEEE Transactions on Instrumentation and Measurement 39, no. 3 (June 1990): 512–16. http://dx.doi.org/10.1109/19.106283.
Повний текст джерелаMurakami, Hiroshi, Akio Katsuki, Hiromichi Onikura, Takao Sajima, Norio Kawagoishi, Eiji Kondo, and Tomohiro Honda. "An Optical Fiber Probe for 3-D Micro Metrology." Key Engineering Materials 447-448 (September 2010): 524–28. http://dx.doi.org/10.4028/www.scientific.net/kem.447-448.524.
Повний текст джерелаValade, Charles, Jérôme Hazart, Sébastien Bérard-Bergery, Elodie Sungauer, Maxime Besacier, and Cécile Gourgon. "Tilted beam scanning electron microscopy, 3-D metrology for microelectronics industry." Journal of Micro/Nanolithography, MEMS, and MOEMS 18, no. 03 (August 19, 2019): 1. http://dx.doi.org/10.1117/1.jmm.18.3.034001.
Повний текст джерелаLiu, Xiao-li, A.-meng Li, Xiao-bo Zhao, Peng-dong Gao, Jin-dong Tian, and Xiang Peng. "Model-based optical metrology and visualization of 3-D complex objects." Optoelectronics Letters 3, no. 2 (March 2007): 115–18. http://dx.doi.org/10.1007/s11801-007-7018-y.
Повний текст джерелаZhang, Song, Rongguang Liang, and Lianxiang Yang. "Special Section Guest Editorial: High-Speed 3-D Optical Metrology and Applications." Optical Engineering 53, no. 11 (October 14, 2014): 112201. http://dx.doi.org/10.1117/1.oe.53.11.112201.
Повний текст джерелаZhang, Xianzhu. "Analysis of 3-D surface waviness on standard artifacts by retroreflective metrology." Optical Engineering 39, no. 1 (January 1, 2000): 183. http://dx.doi.org/10.1117/1.602350.
Повний текст джерелаShaw, Jonathan, Tuo-Hung Hou, Hassan Raza, and Edwin Chihchuan Kan. "Statistical Metrology of Metal Nanocrystal Memories With 3-D Finite-Element Analysis." IEEE Transactions on Electron Devices 56, no. 8 (August 2009): 1729–35. http://dx.doi.org/10.1109/ted.2009.2024108.
Повний текст джерелаLe Cunff, Delphine, Gilles Fresquet, Thierry Raymond, and Dirk K. de Vries. "Uniformity Control of 3-D Stacked ICs: Optical Metrology and Statistical Analysis." IEEE Transactions on Semiconductor Manufacturing 28, no. 4 (November 2015): 448–53. http://dx.doi.org/10.1109/tsm.2015.2468086.
Повний текст джерелаGroßmann, Constanze, Ute Gawronski, Martin Breitbarth, Judith Baumgarten, Gunther Notni, and Andreas Tünnermann. "18.3: 3-D Metrology System based on a Bi-directional OLED Microdisplay." SID Symposium Digest of Technical Papers 43, no. 1 (June 2012): 237–39. http://dx.doi.org/10.1002/j.2168-0159.2012.tb05757.x.
Повний текст джерелаEiríksson, E. R., J. Wilm, D. B. Pedersen, and H. Aanæs. "PRECISION AND ACCURACY PARAMETERS IN STRUCTURED LIGHT 3-D SCANNING." ISPRS - International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences XL-5/W8 (April 7, 2016): 7–15. http://dx.doi.org/10.5194/isprs-archives-xl-5-w8-7-2016.
Повний текст джерелаAmoah, Papa K., Christopher E. Sunday, Chukwudi Okoro, Jungjoon Ahn, Lin You, Dmitry Veksler, Joseph Kopanski, and Yaw Obeng. "(Invited) Towards the Physical Reliability of 3D-Integrated Systems: Broadband Dielectric Spectroscopic (BDS) Studies of Material Evolution and Reliability in Integrated Systems." ECS Meeting Abstracts MA2022-02, no. 17 (October 9, 2022): 859. http://dx.doi.org/10.1149/ma2022-0217859mtgabs.
Повний текст джерелаTai, Bruce L., David A. Stephenson, and Albert J. Shih. "Improvement of surface flatness in face milling based on 3-D holographic laser metrology." International Journal of Machine Tools and Manufacture 51, no. 6 (June 2011): 483–90. http://dx.doi.org/10.1016/j.ijmachtools.2011.02.006.
Повний текст джерелаStarikov, Alexander, and Yi-sha Ku. "Special Section Guest Editorial: Metrology and Inspection for 3-D Integrated Circuits and Interconnects." Journal of Micro/Nanolithography, MEMS, and MOEMS 13, no. 1 (March 25, 2014): 011201. http://dx.doi.org/10.1117/1.jmm.13.1.011201.
Повний текст джерелаTakacs, Peter Z., Haizhang Li, Xiaodan Li, and Manfred W. Grindel. "3‐D x‐ray mirror metrology with a vertical scanning long trace profiler (abstract)." Review of Scientific Instruments 67, no. 9 (September 1996): 3368–69. http://dx.doi.org/10.1063/1.1146917.
Повний текст джерелаOrtiz-Sanz, J. P., M. Gil-Docampo, T. Rego-Sanmartín, M. Arza-García, G. Tucci, E. I. Parisi, V. Bonora, and F. Mugnai. "D3MOBILE METROLOGY WORLD LEAGUE: TRAINING SECONDARY STUDENTS ON SMARTPHONE-BASED PHOTOGRAMMETRY." ISPRS - International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences XLIII-B5-2020 (August 24, 2020): 235–41. http://dx.doi.org/10.5194/isprs-archives-xliii-b5-2020-235-2020.
Повний текст джерелаPan, C. T., P. J. Cheng, Yeong-Maw Hwang, M. F. Chen, H. S. Chuang, and C. T. Yang. "Three-Dimensional Micro-Flow Measurement in a Capillary with a Diode Laser Micro-Particle Image Velocitometry." Materials Science Forum 505-507 (January 2006): 343–48. http://dx.doi.org/10.4028/www.scientific.net/msf.505-507.343.
Повний текст джерелаRuss, J. Christian, and John C. Russ. "3-D image analysis of serial focal sections from confocal scanning laser microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 152–53. http://dx.doi.org/10.1017/s0424820100152732.
Повний текст джерелаGong, Yuanzheng, Richard S. Johnston, C. David Melville, and Eric J. Seibel. "Axial-Stereo 3-D Optical Metrology for Inner Profile of Pipes Using a Scanning Laser Endoscope." International Journal of Optomechatronics 9, no. 3 (June 24, 2015): 238–47. http://dx.doi.org/10.1080/15599612.2015.1059535.
Повний текст джерелаXue, F., S. Filin, B. Elnashef, and W. Jin. "SHAPE FROM POLARIZATION FOR FEATURELESS AND SPECULAR OBJECTS." International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences XLVIII-2/W2-2022 (December 8, 2022): 143–48. http://dx.doi.org/10.5194/isprs-archives-xlviii-2-w2-2022-143-2022.
Повний текст джерелаGarrido-Castro, J. L., I. C. Aranda-Valera, P. Gardiner, P. Machado, J. Condell, C. Gonzalez-Navas, and E. Collantes Estevez. "POS0952 RESPONSIVENESS OF SPINAL MOBILITY MEASUREMENTS IN AXIAL SPONDYLOARTHRITIS USING CONVENTIONAL AND ADVANCED METROLOGY: A PILOT STUDY." Annals of the Rheumatic Diseases 80, Suppl 1 (May 19, 2021): 740.1–740. http://dx.doi.org/10.1136/annrheumdis-2021-eular.562.
Повний текст джерелаLenz, R. K., and R. Y. Tsai. "Techniques for calibration of the scale factor and image center for high accuracy 3-D machine vision metrology." IEEE Transactions on Pattern Analysis and Machine Intelligence 10, no. 5 (September 1988): 713–20. http://dx.doi.org/10.1109/34.6781.
Повний текст джерелаMehendale, M., L. Hou, R. Mair, M. Kotelyanskii, M. Liebens, J. Derakhshandeh, P. Mukundhan, A. Miller, E. Beyne, and T. Kryman. "Non-destructive In-line IMC Thickness Measurement Using Acoustic Metrology for 3D Stacking." International Symposium on Microelectronics 2019, no. 1 (October 1, 2019): 000274–79. http://dx.doi.org/10.4071/2380-4505-2019.1.000274.
Повний текст джерелаWolovich, William, Hassan Albakri, and Hulya Yalcin. "The Precise Measurement of Free-Form Surfaces1." Journal of Manufacturing Science and Engineering 124, no. 2 (April 29, 2002): 326–32. http://dx.doi.org/10.1115/1.1430677.
Повний текст джерелаZhang, Xi, Yuanzhi Xu, Haichao Li, Lijing Zhu, Xin Wang, and Wei Li. "Flexible method for accurate calibration of large-scale vision metrology system based on virtual 3-D targets and laser tracker." International Journal of Advanced Robotic Systems 16, no. 6 (November 1, 2019): 172988141989351. http://dx.doi.org/10.1177/1729881419893516.
Повний текст джерелаChe, Chenggang, and Jun Ni. "A ball-target-based extrinsic calibration technique for high-accuracy 3-D metrology using off-the-shelf laser-stripe sensors." Precision Engineering 24, no. 3 (July 2000): 210–19. http://dx.doi.org/10.1016/s0141-6359(00)00031-3.
Повний текст джерелаKumar, Upputuri Paul, U. Somasundaram, M. P. Kothiyal, and Nandigana Krishna Mohan. "Microscopic TV Holography for Microsystems Metrology." Defence Science Journal 61, no. 5 (August 30, 2011): 491. http://dx.doi.org/10.14429/dsj.61.908.
Повний текст джерелаDaakir, M., M. Pierrot-Deseilligny, P. Bosser, F. Pichard, C. Thom, and Y. Rabot. "STUDY OF LEVER-ARM EFFECT USING EMBEDDED PHOTOGRAMMETRY AND ON-BOARD GPS RECEIVER ON UAV FOR METROLOGICAL MAPPING PURPOSE AND PROPOSAL OF A FREE GROUND MEASUREMENTS CALIBRATION PROCEDURE." ISPRS - International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences XL-3/W4 (March 17, 2016): 65–70. http://dx.doi.org/10.5194/isprs-archives-xl-3-w4-65-2016.
Повний текст джерелаDaakir, M., M. Pierrot-Deseilligny, P. Bosser, F. Pichard, C. Thom, and Y. Rabot. "STUDY OF LEVER-ARM EFFECT USING EMBEDDED PHOTOGRAMMETRY AND ON-BOARD GPS RECEIVER ON UAV FOR METROLOGICAL MAPPING PURPOSE AND PROPOSAL OF A FREE GROUND MEASUREMENTS CALIBRATION PROCEDURE." ISPRS - International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences XL-3/W4 (March 17, 2016): 65–70. http://dx.doi.org/10.5194/isprsarchives-xl-3-w4-65-2016.
Повний текст джерелаRahman, Anis, and Aunik K. Rahman. "Nanoscale Metrology of Line Patterns on Semiconductor by Continuous Wave Terahertz Multispectral Reconstructive 3-D Imaging Overcoming the Abbe Diffraction Limit." IEEE Transactions on Semiconductor Manufacturing 32, no. 1 (February 2019): 7–13. http://dx.doi.org/10.1109/tsm.2018.2865167.
Повний текст джерелаAmoah, Papa K., Engelbert Redel, Helmut Baumgart, and Yaw Obeng. "Impact of Flushing Agents in Broadband Dielectric Spectroscopy (BDS) Study of Ethanol Detection By HKUST-1 Metal-Organic Frameworks." ECS Meeting Abstracts MA2022-01, no. 52 (July 7, 2022): 2133. http://dx.doi.org/10.1149/ma2022-01522133mtgabs.
Повний текст джерелаChernyshenko, A. A., and Yu I. Kamenskikh. "Vacuum system of Watt-balance: development aspects." Measurement Standards. Reference Materials 17, no. 4 (January 17, 2022): 5–12. http://dx.doi.org/10.20915/2077-1177-2021-17-4-5-12.
Повний текст джерелаMURAKAMI, Hiroshi, Akio KATSUKI, Takao SAJIMA, and Mitsuyoshi FUKUDA. "S1320101 Development of a System for 3-D Micro Metrology Using an Ultra-Small Diameter Optical Fiber Probe : Influence of the surface force." Proceedings of Mechanical Engineering Congress, Japan 2015 (2015): _S1320101——_S1320101—. http://dx.doi.org/10.1299/jsmemecj.2015._s1320101-.
Повний текст джерелаChandler, Clive. "In Situ Delineation Etch Reveals Subtle Detail in SEM Images of Ion Milled Cross Sections Enabling In-Fab 3-D Metrology and Characterization." Microscopy Today 8, no. 2 (March 2000): 36–39. http://dx.doi.org/10.1017/s1551929500057497.
Повний текст джерелаGarrido-Castro, J. L., F. Torres Vidal, M. Ladehesa Pineda, M. D. C. Castro Villegas, I. C. Aranda-Valera, R. Ortega Castro, C. Gonzalez-Navas, and E. Collantes Estevez. "FRI0578 DEVELOPMENT OF A MOBILE APP AND WIRELESS SENSORS SYSTEM TO ASSESS SPINAL MOBILITY IN AXIAL SPONDYLOARTHRITIS: PRELIMINARY RESULTS." Annals of the Rheumatic Diseases 79, Suppl 1 (June 2020): 892.1–893. http://dx.doi.org/10.1136/annrheumdis-2020-eular.2137.
Повний текст джерелаNovak, James I., and Jonathon O’Neill. "A design for additive manufacturing case study: fingerprint stool on a BigRep ONE." Rapid Prototyping Journal 25, no. 6 (July 8, 2019): 1069–79. http://dx.doi.org/10.1108/rpj-10-2018-0278.
Повний текст джерелаPRETLOVE, J. R. G., and G. A. PARKER. "THE SURREY ATTENTIVE ROBOT VISION SYSTEM." International Journal of Pattern Recognition and Artificial Intelligence 07, no. 01 (February 1993): 89–107. http://dx.doi.org/10.1142/s0218001493000066.
Повний текст джерелаPustelny, Tadeusz Piotr. "Electroluminescent optical fiber sensor for detection of a high intensity electric field." Photonics Letters of Poland 12, no. 1 (March 31, 2020): 19. http://dx.doi.org/10.4302/plp.v12i1.980.
Повний текст джерелаShalyt, Eugene, Michael Pavlov, Danni Lin, Michael MacEwan, Helen Lu, and Paul Okagbare. "Process Control for Advanced Packaging Metallization." Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2019, DPC (January 1, 2019): 1–23. http://dx.doi.org/10.4071/2380-4491-2019-dpc-presentation_tha2_022.
Повний текст джерелаTai, C. K., R. Ahmad, H. M. Akil, and M. M. Ratnam. "Effect of Alkali Treatment and Molding Temperature on Flexural and Impact Properties of Coir-Fibre-Epoxy Composite." Advanced Composites Letters 24, no. 4 (July 2015): 096369351502400. http://dx.doi.org/10.1177/096369351502400403.
Повний текст джерелаTada, Eisuke. "Special Issue on Robotics and Mechatronics for Fusion Experimental Reactor (ITER)." Journal of Robotics and Mechatronics 10, no. 2 (April 20, 1998): 69–70. http://dx.doi.org/10.20965/jrm.1998.p0069.
Повний текст джерелаListewnik, Paulina, and Adam Mazikowski. "Automatic system for optical parameters measurements of biological tissues." Photonics Letters of Poland 10, no. 3 (October 1, 2018): 91. http://dx.doi.org/10.4302/plp.v10i3.846.
Повний текст джерелаLee, Dong Hun, Yuxuan Zhang, Kwangsoo No, Han Wook Song, and Sunghwan Lee. "(Digital Presentation) Multimodal Encapsulation of p-SnOx to Engineer the Carrier Density for Thin Film Transistor Applications." ECS Meeting Abstracts MA2022-02, no. 15 (October 9, 2022): 821. http://dx.doi.org/10.1149/ma2022-0215821mtgabs.
Повний текст джерелаLee, Sunghwan, Donghun Lee, Fei Qin, Yuxuan Zhang, Molly Rothschild, Han Wook Song, and Kwangsoo No. "(Invited) Oxide Electronics and Recent Progress in Bipolar Applications." ECS Meeting Abstracts MA2022-01, no. 19 (July 7, 2022): 1071. http://dx.doi.org/10.1149/ma2022-01191071mtgabs.
Повний текст джерелаÖz, N., A. Ozer, and M. T. Duruöz. "AB1064 THE RELATIONSHIP BETWEEN DISEASE ACTIVITY AND CENTRAL SENSITIZATION IN SPONDYLOARTHROPATHY PATIENTS RECEIVING BIOLOGICAL TREATMENT." Annals of the Rheumatic Diseases 82, Suppl 1 (May 30, 2023): 1753.2–1754. http://dx.doi.org/10.1136/annrheumdis-2023-eular.1785.
Повний текст джерелаSaraç, D. C., S. Bayram, N. G. Tore, F. Sarİ, D. Oskay, A. Avanoğlu Güler, and A. Tufan. "THU0633-HPR CORE MUSCLE ENDURANCE IN PATIENTS WITH ANKYLOSING SPONDYLITIS." Annals of the Rheumatic Diseases 79, Suppl 1 (June 2020): 561.2–562. http://dx.doi.org/10.1136/annrheumdis-2020-eular.5685.
Повний текст джерелаZhou, W., M. He, R. Zhao, C. Dong, and Z. Gu. "AB1331-HPR ACTIVE DISEASE ACTIVITY IN ANKYLOSIS SPONDYLITIS: WORSE OUTCOMES AND POORER HR-QOL." Annals of the Rheumatic Diseases 79, Suppl 1 (June 2020): 1954.2–1954. http://dx.doi.org/10.1136/annrheumdis-2020-eular.6288.
Повний текст джерелаHu, L., X. Ji, and F. Huang. "THU0389 OBESITY IS A STRONG PREDICTOR OF WORSE CLINICAL OUTCOMES AND TREATMENT RESPONSES TO BIOLOGICS IN PATIENTS WITH ANKYLOSING SPONDYLITIS." Annals of the Rheumatic Diseases 79, Suppl 1 (June 2020): 429.2–429. http://dx.doi.org/10.1136/annrheumdis-2020-eular.4445.
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