Artigos de revistas sobre o tema "Thin film stacking"
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JIANG, B., J. L. PENG, L. A. BURSILL e H. WANG. "MICROSTRUCTURE AND PROPERTIES OF FERROELECTRIC Bi4Ti3O12 THIN FILMS". Modern Physics Letters B 13, n.º 26 (10 de novembro de 1999): 933–45. http://dx.doi.org/10.1142/s0217984999001147.
Texto completo da fonteLee, Jin Woo, Yun Hae Kim e Chang Wook Park. "Electrical and Optical Properties of ZnO:Ag Thin-Films Depend on Lamination Formation by DC Magnetron Sputtering". Advanced Materials Research 1110 (junho de 2015): 211–17. http://dx.doi.org/10.4028/www.scientific.net/amr.1110.211.
Texto completo da fonteArnold, Marcel, Z. L. Wang, W. Tong, B. K. Wagner, S. Schön e C. J. Summers. "Creation of Stacking Faults at Substrate Steps in Zns Thin Films Epitaxially Grown on GaAs (001)". Microscopy and Microanalysis 3, S2 (agosto de 1997): 633–34. http://dx.doi.org/10.1017/s1431927600010059.
Texto completo da fonteMcIntyre, P. C., e M. J. Cima. "Microstructural inhomogeneities in chemically derived Ba2YCu3O7−x thin films: Implications for flux pinning". Journal of Materials Research 9, n.º 11 (novembro de 1994): 2778–88. http://dx.doi.org/10.1557/jmr.1994.2778.
Texto completo da fonteLiu, Y., B. W. Robertson e D. J. Sellmyer. "HREM study of epitaxy in Co-Sm // Cr thin films". Proceedings, annual meeting, Electron Microscopy Society of America 53 (13 de agosto de 1995): 488–89. http://dx.doi.org/10.1017/s0424820100138816.
Texto completo da fonteNguyen, Thang, Walter Varhue, Edward Adams, Mark Lavoie e Stephen Mongeon. "Growth of heteroepitaxial GaSb thin films on Si(100) substrates". Journal of Materials Research 19, n.º 8 (agosto de 2004): 2315–21. http://dx.doi.org/10.1557/jmr.2004.0307.
Texto completo da fonteWang, Xintai, Sara Sangtarash, Angelo Lamantia, Hervé Dekkiche, Leonardo Forcieri, Oleg V. Kolosov, Samuel P. Jarvis et al. "Thermoelectric properties of organic thin films enhanced by π–π stacking". Journal of Physics: Energy 4, n.º 2 (23 de março de 2022): 024002. http://dx.doi.org/10.1088/2515-7655/ac55a3.
Texto completo da fonteTajari Mofrad, Mohammad Reza, Jaber Derakhshandeh, Ryoichi Ishihara, Alessandro Baiano, Johan van der Cingel e Kees Beenakker. "Stacking of Single-Grain Thin-Film Transistors". Japanese Journal of Applied Physics 48, n.º 3 (23 de março de 2009): 03B015. http://dx.doi.org/10.1143/jjap.48.03b015.
Texto completo da fonteWada, Takahiro, Takayuki Negami e Mikihiko Nishitani. "Growth defects in CuInSe2 thin films". Journal of Materials Research 9, n.º 3 (março de 1994): 658–62. http://dx.doi.org/10.1557/jmr.1994.0658.
Texto completo da fonteHua, Zhong, Xiangcheng Meng, Yaming Sun, Wanqiu Yu e Dong Long. "Properties of Cu2ZnSnS4 thin films prepared by magnetron sputtering and sulfurizing the precursors with different stacking sequences". Modern Physics Letters B 28, n.º 26 (10 de outubro de 2014): 1450210. http://dx.doi.org/10.1142/s0217984914502108.
Texto completo da fonteSeo, Soon-Min, Changhoon Baek e Hong H. Lee. "Stacking of Organic Thin Film Transistors: Vertical Integration". Advanced Materials 20, n.º 10 (19 de maio de 2008): 1994–97. http://dx.doi.org/10.1002/adma.200701770.
Texto completo da fonteWANG, Y. R., J. A. KUBBY e W. J. GREENE. "THIN FILM ELECTRON INTERFEROMETRY". Modern Physics Letters B 05, n.º 21 (10 de setembro de 1991): 1387–405. http://dx.doi.org/10.1142/s0217984991001696.
Texto completo da fonteKong, G., M. O. Jones, J. S. Abell, P. P. Edwards, S. T. Lees, K. E. Gibbons, I. Gameson e M. Aindow. "Microstructure of laser-ablated superconducting La2CuO4Fx thin films on SrTiO3". Journal of Materials Research 16, n.º 11 (novembro de 2001): 3309–16. http://dx.doi.org/10.1557/jmr.2001.0455.
Texto completo da fonteZeng, Shuang, Jing Yang, Qingqing Liu, Jiawei Bai, Wei Bai, Yuanyuan Zhang e Xiaodong Tang. "Dielectric Spectroscopy of Non-Stoichiometric SrMnO3 Thin Films". Inorganics 12, n.º 3 (27 de fevereiro de 2024): 71. http://dx.doi.org/10.3390/inorganics12030071.
Texto completo da fonteYan, Y., K. M. Jones e M. M. Al-Jassim. "Transmission Electron Microscopy Study of Planar Defects in Polycrystalline CdTe Thin Films". Microscopy and Microanalysis 7, S2 (agosto de 2001): 556–57. http://dx.doi.org/10.1017/s1431927600028853.
Texto completo da fonteThanikaikarasan, S., T. Mahalingam, S. R. Srikumar, Tae Kyu Kim, Yong Deak Kim, Subramaniam Velumani e Rene Asomoza. "Microstructural Characterization of Electro-Deposited CdSe Thin Films". Advanced Materials Research 68 (abril de 2009): 44–51. http://dx.doi.org/10.4028/www.scientific.net/amr.68.44.
Texto completo da fonteHee, Kwon Ahn, Young Ho Kim, Keun Gil Sang, Soo Paik Dong e Dong Heon Kang. "Characteristics of Lead Free Ferroelectric Thin Films Consisted of (Na0.5Bi0.5)TiO3 and Bi4Ti3O12". Advanced Materials Research 684 (abril de 2013): 307–11. http://dx.doi.org/10.4028/www.scientific.net/amr.684.307.
Texto completo da fonteChakraborty, Jay, Tias Maity, Kishor Kumar e S. Mukherjee. "Microstructure, Stress and Texture in Sputter Deposited TiN Thin Films: Effect of Substrate Bias". Advanced Materials Research 996 (agosto de 2014): 855–59. http://dx.doi.org/10.4028/www.scientific.net/amr.996.855.
Texto completo da fonteHuang, T. C., A. Segmuller, W. Lee, V. Lee, D. Bullock e R. Karimi. "X-ray Diffraction Analysis of High Tc Superconducting Thin Films". Advances in X-ray Analysis 32 (1988): 269–78. http://dx.doi.org/10.1154/s0376030800020577.
Texto completo da fonteWen, J. G., C. Traeholt e H. W. Zandbergen. "Stacking sequence of YBa2Cu3O7 thin film on SrTiO3 substrate". Physica C: Superconductivity 205, n.º 3-4 (fevereiro de 1993): 354–62. http://dx.doi.org/10.1016/0921-4534(93)90402-c.
Texto completo da fonteLei, Chao, Shu Chen e Allan H. MacDonald. "Magnetized topological insulator multilayers". Proceedings of the National Academy of Sciences 117, n.º 44 (19 de outubro de 2020): 27224–30. http://dx.doi.org/10.1073/pnas.2014004117.
Texto completo da fonteZhou, Jing, Jie Zhu, Wen Chen, Jie Shen, Qiong Lei e Hui Min He. "Effect of Stacking Layers on the Structure and Properties of Ca(Mg1/3Nb2/3)O3 / CaTiO3 Thin Films". Key Engineering Materials 421-422 (dezembro de 2009): 115–18. http://dx.doi.org/10.4028/www.scientific.net/kem.421-422.115.
Texto completo da fonteRobertson, B. W., e Y. Liu. "Stacking sequences of the crystallites in Co-Sm films". Proceedings, annual meeting, Electron Microscopy Society of America 54 (11 de agosto de 1996): 714–15. http://dx.doi.org/10.1017/s0424820100166038.
Texto completo da fonteYoneya, Makoto, Satoshi Matsuoka, Jun’ya Tsutsumi e Tatsuo Hasegawa. "Self-assembly of donor–acceptor semiconducting polymers in solution thin films: a molecular dynamics simulation study". Journal of Materials Chemistry C 5, n.º 37 (2017): 9602–10. http://dx.doi.org/10.1039/c7tc01014a.
Texto completo da fonteNordin, Norfaizul Izwan, Rosminazuin Ab Rahim e Aliza Aini Md Ralib. "Flexible PVDF thin film as piezoelectric energy harvester". Bulletin of Electrical Engineering and Informatics 8, n.º 2 (1 de junho de 2019): 443–49. http://dx.doi.org/10.11591/eei.v8i2.1423.
Texto completo da fonteHsu, Chih-Chieh, Po-Tsun Liu, Kai-Jhih Gan, Dun-Bao Ruan e Simon M. Sze. "Oxygen Concentration Effect on Conductive Bridge Random Access Memory of InWZnO Thin Film". Nanomaterials 11, n.º 9 (27 de agosto de 2021): 2204. http://dx.doi.org/10.3390/nano11092204.
Texto completo da fonteJo, Yongjin, Jonghan Lee, Chaewon Kim, Junhyeok Jang, Inchan Hwang, John Hong e Mi Jung Lee. "Engineered molecular stacking crystallinity of bar-coated TIPS-pentacene/polystyrene films for organic thin-film transistors". RSC Advances 13, n.º 4 (2023): 2700–2706. http://dx.doi.org/10.1039/d2ra05924j.
Texto completo da fonteMarshall, A. F., K. Char, R. W. Barton, A. Kapitulnik e S. S. Laderman. "Microstructural interaction of Y2Ba4Cu8O16 stacking faults within YBa2Cu3O7−x". Journal of Materials Research 5, n.º 10 (outubro de 1990): 2049–55. http://dx.doi.org/10.1557/jmr.1990.2049.
Texto completo da fonteYuk, J. M., J. Y. Lee, T. W. Kim, D. I. Son e W. K. Choi. "Effects of thermal annealing on the microstructural properties of the lower region in ZnO thin films grown on n-Si (001) substrates". Journal of Materials Research 23, n.º 4 (abril de 2008): 1082–86. http://dx.doi.org/10.1557/jmr.2008.0141.
Texto completo da fonteHarada, T., T. Nagai, M. Oishi e Y. Masahiro. "Sputter-grown c-axis-oriented PdCoO2 thin films". Journal of Applied Physics 133, n.º 8 (28 de fevereiro de 2023): 085302. http://dx.doi.org/10.1063/5.0136749.
Texto completo da fonteHatton, Peter, Ali Abbas, Piotr Kaminski, Sibel Yilmaz, Michael Watts, Michael Walls, Pooja Goddard e Roger Smith. "Inert gas bubble formation in magnetron sputtered thin-film CdTe solar cells". Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences 476, n.º 2239 (julho de 2020): 20200056. http://dx.doi.org/10.1098/rspa.2020.0056.
Texto completo da fonteWalls, J. M., A. Abbas, G. D. West, J. W. Bowers, P. J. M. Isherwood, P. M. Kaminski, B. Maniscalco, W. S. Sampath e K. L. Barth. "The Effect of Annealing Treatments on Close Spaced Sublimated Cadmium Telluride Thin Film Solar Cells". MRS Proceedings 1493 (2013): 147–52. http://dx.doi.org/10.1557/opl.2012.1704.
Texto completo da fonteLee, Junho, Jaeyong Kim e Myeongkyu Lee. "High-purity reflective color filters based on thin film cavities embedded with an ultrathin Ge2Sb2Te5 absorption layer". Nanoscale Advances 2, n.º 10 (2020): 4930–37. http://dx.doi.org/10.1039/d0na00626b.
Texto completo da fonteHuo, Xiaoye, Zhenhai Wang, Mengqi Fu, Jiye Xia e Shengyong Xu. "A sub-200 nanometer wide 3D stacking thin-film temperature sensor". RSC Advances 6, n.º 46 (2016): 40185–91. http://dx.doi.org/10.1039/c6ra06353e.
Texto completo da fonteDel Caño, T., J. Duff e R. Aroca. "Molecular Spectra and Molecular Organization in Thin Solid Films of Bis(Neopentylimido) Perylene". Applied Spectroscopy 56, n.º 6 (junho de 2002): 744–50. http://dx.doi.org/10.1366/000370202760077478.
Texto completo da fonteRaineri, Vito, Corrado Bongiorno, Salvatore di Franco, Raffaella Lo Nigro, Emanuele Rimini e Filippo Giannazzo. "Surface Corrugation and Stacking Misorientation in Multilayers of Graphene on Nickel". Solid State Phenomena 178-179 (agosto de 2011): 125–29. http://dx.doi.org/10.4028/www.scientific.net/ssp.178-179.125.
Texto completo da fonteChen, Jihua, David C. Martin e John E. Anthony. "Morphology and molecular orientation of thin-film bis(triisopropylsilylethynyl) pentacene". Journal of Materials Research 22, n.º 6 (junho de 2007): 1701–9. http://dx.doi.org/10.1557/jmr.2007.0220.
Texto completo da fonteRoy, I., e S. Hazra. "Solvent dependent ordering of poly(3-dodecylthiophene) in thin films". Soft Matter 11, n.º 18 (2015): 3724–32. http://dx.doi.org/10.1039/c5sm00595g.
Texto completo da fonteChen, H. J. H., B. B. L. Yeh, H. C. Pan e J. S. Chen. "ZnO transparent thin-film transistors with HfO2/Ta2O5 stacking gate dielectrics". Electronics Letters 44, n.º 3 (2008): 186. http://dx.doi.org/10.1049/el:20083215.
Texto completo da fonteYoo, Su-Hyun, Keith T. Butler, Aloysius Soon, Ali Abbas, John M. Walls e Aron Walsh. "Identification of critical stacking faults in thin-film CdTe solar cells". Applied Physics Letters 105, n.º 6 (11 de agosto de 2014): 062104. http://dx.doi.org/10.1063/1.4892844.
Texto completo da fonteDing, Q., W. Tian, M. K. Lee, E. B. Eom e X. Q. Pan. "Interfacial Structure of Metastable 4H-BaRuO3 Thin Film on (111) SrTiO3 Substrate". Microscopy and Microanalysis 6, S2 (agosto de 2000): 1066–67. http://dx.doi.org/10.1017/s143192760003782x.
Texto completo da fonteMamidi, Narsimha, Ramiro Velasco Delgadillo, Aldo Gonzáles Ortiz e Enrique Barrera. "Carbon Nano-Onions Reinforced Multilayered Thin Film System for Stimuli-Responsive Drug Release". Pharmaceutics 12, n.º 12 (13 de dezembro de 2020): 1208. http://dx.doi.org/10.3390/pharmaceutics12121208.
Texto completo da fonteGwaydi, January S., Hezekiah B. Sawa, Egidius R. Rwenyagila, Nathanael R. Komba, Talam E. Kibona, Nuru R. Mlyuka, Margaret E. Samiji e Lwitiko P. Mwakyusa. "Influence of Stacking Order on the Structural and Optical Properties of Cu2ZnSnS4 Absorber Layer Prepared from DC-Sputtered Oxygenated Precursors". Tanzania Journal of Science 50, n.º 1 (30 de abril de 2024): 115–25. http://dx.doi.org/10.4314/tjs.v50i1.9.
Texto completo da fonteQin, Houyun, Chang Liu, Chong Peng, Mingxin Lu, Yiming Liu, Song Wei, Hongbo Wang, Nailin Yue, Wei Zhang e Yi Zhao. "Rapid-deposited high-performance submicron encapsulation film with in situ plasma oxidized Al layer inserted". Applied Physics Express 15, n.º 4 (22 de março de 2022): 046503. http://dx.doi.org/10.35848/1882-0786/ac44cc.
Texto completo da fonteTaoka, Yuki, Terumichi Hayashi, Pasomphone Hemthavy, Kunio Takahashi e Shigeki Saito. "Development of a bipolar electrostatic chuck with a compliant beam-array assembly having four 3D-printed layers for large film handling". Engineering Research Express 4, n.º 1 (21 de janeiro de 2022): 015010. http://dx.doi.org/10.1088/2631-8695/ac4a49.
Texto completo da fonteCho, Hae Seok, Min Hong Kim e Hyeong Joon Kim. "Preferred orientation and microstructure of Ni-Zn-Cu ferrite thin films deposited by rf magnetron sputtering". Journal of Materials Research 9, n.º 9 (setembro de 1994): 2425–33. http://dx.doi.org/10.1557/jmr.1994.2425.
Texto completo da fonteWilliams, B. E., e J. T. Glass. "Characterization of diamond thin films: Diamond phase identification, surface morphology, and defect structures". Journal of Materials Research 4, n.º 2 (abril de 1989): 373–84. http://dx.doi.org/10.1557/jmr.1989.0373.
Texto completo da fonteNam, Sung Pill, Sung Gap Lee, Seong Gi Bae e Young Hie Lee. "Electrical Properties BaTiO3 Thick Films with an Interlayer SrTiO3 Thin Films". Solid State Phenomena 124-126 (junho de 2007): 659–62. http://dx.doi.org/10.4028/www.scientific.net/ssp.124-126.659.
Texto completo da fonteJana, Santanu, Rodrigo Martins e Elvira Fortunato. "Stacking-Dependent Electrical Transport in a Colloidal CdSe Nanoplatelet Thin-Film Transistor". Nano Letters 22, n.º 7 (28 de março de 2022): 2780–85. http://dx.doi.org/10.1021/acs.nanolett.1c04822.
Texto completo da fonteXiao, Yiqun, Jun Yuan, Guodong Zhou, Ka Chak Ngan, Xinxin Xia, Jingshuai Zhu, Yingping Zou, Ni Zhao, Xiaowei Zhan e Xinhui Lu. "Unveiling the crystalline packing of Y6 in thin films by thermally induced “backbone-on” orientation". Journal of Materials Chemistry A 9, n.º 31 (2021): 17030–38. http://dx.doi.org/10.1039/d1ta05268c.
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