Artigos de revistas sobre o tema "Test signal generation"
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Burdiek, B., e W. Mathis. "Test signal generation for analog circuits". Advances in Radio Science 1 (5 de maio de 2003): 235–38. http://dx.doi.org/10.5194/ars-1-235-2003.
Texto completo da fonteDufils, M., J. L. Carbonero, P. Planelle e P. Raynaud. "Mixed-signal simulation and test generation". International Journal of Electronics 95, n.º 3 (março de 2008): 239–48. http://dx.doi.org/10.1080/00207210701827954.
Texto completo da fonteYin, Qizhang, William R. Eisenstadt e Tian Xia. "Wireless System for Microwave Test Signal Generation". IEEE Design & Test of Computers 25, n.º 2 (março de 2008): 160–66. http://dx.doi.org/10.1109/mdt.2008.57.
Texto completo da fonteUngermann, Michael, Jan Lunze e Dieter Schwarzmann. "Test signal generation for service diagnosis based on local structural properties". International Journal of Applied Mathematics and Computer Science 22, n.º 1 (1 de março de 2012): 55–65. http://dx.doi.org/10.2478/v10006-012-0004-y.
Texto completo da fonteHaurie, X., e G. W. Roberts. "Arbitrary-precision signal generation for mixed-signal built-in-self-test". IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing 45, n.º 11 (1998): 1425–32. http://dx.doi.org/10.1109/82.735354.
Texto completo da fonteŽivanović, Dragan, Milan Simić, Zivko Kokolanski, Dragan Denić e Vladimir Dimcev. "Generation of Long-time Complex Signals for Testing the Instruments for Detection of Voltage Quality Disturbances". Measurement Science Review 18, n.º 2 (1 de abril de 2018): 41–51. http://dx.doi.org/10.1515/msr-2018-0007.
Texto completo da fonteHuynh, S. D., Seongwon Kim, M. Soma e Jinyan Zhang. "Automatic analog test signal generation using multifrequency analysis". IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing 46, n.º 5 (maio de 1999): 565–76. http://dx.doi.org/10.1109/82.769805.
Texto completo da fonteKuang, Jiangyu, e Tao He. "Research on automatic test sequence generation method of computer interlocking test". Journal of Physics: Conference Series 2246, n.º 1 (1 de abril de 2022): 012072. http://dx.doi.org/10.1088/1742-6596/2246/1/012072.
Texto completo da fonteDufort, B., e G. W. Roberts. "On-chip analog signal generation for mixed-signal built-in self-test". IEEE Journal of Solid-State Circuits 34, n.º 3 (março de 1999): 318–30. http://dx.doi.org/10.1109/4.748183.
Texto completo da fonteLiu, Xin. "Conflict-Driven Learning in Test Pattern Generation". Advanced Materials Research 301-303 (julho de 2011): 1089–92. http://dx.doi.org/10.4028/www.scientific.net/amr.301-303.1089.
Texto completo da fonteShi, Dawei, Hongliang Zhao e Xiuwen Shao. "A Pipeline Leakage Signal Simulation and Generation System". E3S Web of Conferences 257 (2021): 03070. http://dx.doi.org/10.1051/e3sconf/202125703070.
Texto completo da fonteHurst, S. L. "Analog signal generation for built-in self-test of mixed-signal integrated circuits". Microelectronics Journal 27, n.º 1 (fevereiro de 1996): 103–4. http://dx.doi.org/10.1016/s0026-2692(96)90016-6.
Texto completo da fonteLoukusa, Veikko. "Behavioral test generation modeling approach for mixed-signal IC verification". Microelectronics Journal 34, n.º 10 (outubro de 2003): 907–12. http://dx.doi.org/10.1016/s0026-2692(03)00164-2.
Texto completo da fonteL'Esperance, Nicholai, Timothy Platt, Mustapha Slamani e Tian Xia. "OFDM Multitone Signal Generation Technique for Analog Circuitry Test Characterization". IEEE Transactions on Circuits and Systems II: Express Briefs 63, n.º 6 (junho de 2016): 583–87. http://dx.doi.org/10.1109/tcsii.2016.2531218.
Texto completo da fonteZhou, Qin Ling. "The Study on Electric Parameters Automatic Test System". Applied Mechanics and Materials 416-417 (setembro de 2013): 1068–71. http://dx.doi.org/10.4028/www.scientific.net/amm.416-417.1068.
Texto completo da fonteLiao, Lida, e Qi Tan. "Study of the Tensile Damage of 321 Stainless Steel for Solar Thermal Power Generation by Acoustic Emission". International Journal of Photoenergy 2020 (10 de janeiro de 2020): 1–9. http://dx.doi.org/10.1155/2020/8450737.
Texto completo da fonteUngermann, Michael, Jan Lunze e Dieter Scharzmann. "Model-Based Test Signal Generation for Service Diagnosis of Automotive Systems". IFAC Proceedings Volumes 43, n.º 7 (julho de 2010): 117–22. http://dx.doi.org/10.3182/20100712-3-de-2013.00029.
Texto completo da fonteZarroo, M. B., e Zhao Zhi-fan. "Sequential Test Signal Generation for Parameter Estimation in Continuous-time Systems". IFAC Proceedings Volumes 21, n.º 9 (agosto de 1988): 903–11. http://dx.doi.org/10.1016/s1474-6670(17)54844-2.
Texto completo da fonteŽivanović, Dragan, Milan Simić, Dragan Denić e Živko Kokolanski. "SCRIPT FILES APPROACH IN THE POWER QUALITY EVENTS GENERATION". Facta Universitatis, Series: Automatic Control and Robotics 17, n.º 2 (28 de dezembro de 2018): 93. http://dx.doi.org/10.22190/fuacr1802093z.
Texto completo da fonteMeister, Michael, e Marco Reinhard. "A modular application specific active test environment for high-temperature wafer test up to 300 °C". Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2019, HiTen (1 de julho de 2019): 000122–25. http://dx.doi.org/10.4071/2380-4491.2019.hiten.000122.
Texto completo da fonteMartínez-Quintero, Juan Carlos, Edith Paola Estupiñán-Cuesta e Víctor Daniel Rodríguez-Ortega. "Raspberry PI 3 RF signal generation system". Visión electrónica 13, n.º 2 (26 de julho de 2019): 294–99. http://dx.doi.org/10.14483/22484728.15160.
Texto completo da fonteZhao, Yuan, Bingliang Hu, Zhen-An He, Wenjia Xie e Xiaohui Gao. "Generation and coherent detection of QPSK signal using a novel method of digital signal processing". Modern Physics Letters B 32, n.º 04 (9 de fevereiro de 2018): 1850103. http://dx.doi.org/10.1142/s0217984918501038.
Texto completo da fonteYU, Ying-yang, e Tong-min JIANG. "Generation of Non-Gaussian Random Vibration Excitation Signal for Reliability Enhancement Test". Chinese Journal of Aeronautics 20, n.º 3 (junho de 2007): 236–39. http://dx.doi.org/10.1016/s1000-9361(07)60038-7.
Texto completo da fonteNAHHAL, Tarik, e Thao Dang. "Test Generation for Analog and Mixed-Signal Circuits Using Hybrid System Models". International Journal of VLSI Design & Communication Systems 2, n.º 3 (30 de setembro de 2011): 21–38. http://dx.doi.org/10.5121/vlsic.2011.2302.
Texto completo da fonteXia, Tian, Rohit Shetty, Timothy Platt e Mustapha Slamani. "Low Cost Time Efficient Multi-tone Test Signal Generation Using OFDM Technique". Journal of Electronic Testing 29, n.º 6 (26 de outubro de 2013): 893–901. http://dx.doi.org/10.1007/s10836-013-5414-8.
Texto completo da fonteZhang, Peng, Hou Jun Wang, Li Li e Ping Wang. "Design and Implementation of Intermediate Frequency Generation and Analysis Module for Avionics Test". Advanced Materials Research 1049-1050 (outubro de 2014): 1147–53. http://dx.doi.org/10.4028/www.scientific.net/amr.1049-1050.1147.
Texto completo da fonteAl Hamadi, Hussam, Amjad Gawanmeh e Mahmoud Al-Qutayri. "Guided Test Case Generation for Enhanced ECG Bio-Sensors Functional Verification". International Journal of E-Health and Medical Communications 8, n.º 4 (outubro de 2017): 1–20. http://dx.doi.org/10.4018/ijehmc.2017100101.
Texto completo da fonteKramer, Jeffrey A., Emily O’Neill, Megan E. Phillips, Debra Bruce, Traci Smith, Melinda M. Albright, Sairam Bellum et al. "Early Toxicology Signal Generation in the Mouse". Toxicologic Pathology 38, n.º 3 (19 de março de 2010): 452–71. http://dx.doi.org/10.1177/0192623310364025.
Texto completo da fonteLu, Xu Guang, Ji Hua Tian, Xiao Han e Jin Ping Sun. "A High Bandwidth Signal Generation System Based on FPGA". Applied Mechanics and Materials 198-199 (setembro de 2012): 1743–47. http://dx.doi.org/10.4028/www.scientific.net/amm.198-199.1743.
Texto completo da fonteZhang, Xiao Long, Fan Li e Jian Hui Zhao. "New Test System of Infrared Earth Sensor". Applied Mechanics and Materials 789-790 (setembro de 2015): 536–39. http://dx.doi.org/10.4028/www.scientific.net/amm.789-790.536.
Texto completo da fonteZhao, Hong-Ze, Guang-Hui Wei, Xiao-Dong Pan, Xue Du e Xu-Xu Lyu. "Generation Mechanism and Characteristic Analysis of Dual-Frequency Pseudo-Signal Interference of the Swept-Frequency Radar". International Journal of Antennas and Propagation 2022 (20 de outubro de 2022): 1–14. http://dx.doi.org/10.1155/2022/2363224.
Texto completo da fontePETRACCHI, DONATELLA, MICHELE BARBI, SANTI CHILLEMI, ELENI PANTAZELOU, DAVID PIERSON, CHRIS DAMES, LON WILKENS e FRANK MOSS. "A TEST FOR A BIOLOGICAL SIGNAL ENCODED BY NOISE". International Journal of Bifurcation and Chaos 05, n.º 01 (fevereiro de 1995): 89–100. http://dx.doi.org/10.1142/s0218127495000077.
Texto completo da fonteHe, Fei, Jiabei Shen, Zhi Tang, Xiaomeiao Qi e Haoran Li. "Influencing Factors of Rock Electrical Signal Analysis Based on Artificial Intelligence". Mobile Information Systems 2021 (21 de outubro de 2021): 1–9. http://dx.doi.org/10.1155/2021/1165686.
Texto completo da fonteCoyette, Anthony, Baris Esen, Nektar Xama, Georges Gielen, Wim Dobbelaere e Ronny Vanhooren. "ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits". IEEE Design & Test 35, n.º 3 (junho de 2018): 24–30. http://dx.doi.org/10.1109/mdat.2018.2799800.
Texto completo da fonteTripathi, Gyanendra Nath, e Hiroaki Wagatsuma. "PCA-Based Algorithms to Find Synergies for Humanoid Robot Motion Behavior". International Journal of Humanoid Robotics 13, n.º 02 (25 de maio de 2016): 1550037. http://dx.doi.org/10.1142/s0219843615500371.
Texto completo da fonteLi, Huai Jian, Si Song Feng e Xin Bo Wu. "Research on the Design Method of the Navigation Message for GLONASS Signal Simulator". Applied Mechanics and Materials 568-570 (junho de 2014): 1312–17. http://dx.doi.org/10.4028/www.scientific.net/amm.568-570.1312.
Texto completo da fonteWei, Shuangjiao, Bin’ai Li, Min Xue, Wenbin Zhao, Zhenglan Bian e Fenghong Chu. "Research on An Improved Phase Generation Carrier Demodulation Algorithm". Journal of Physics: Conference Series 2219, n.º 1 (1 de abril de 2022): 012033. http://dx.doi.org/10.1088/1742-6596/2219/1/012033.
Texto completo da fonteBae, Youngseok, Sunghoon Jang, Sungjun Yoo, Minwoo Yi, Joonhyung Ryoo e Jinwoo Shin. "Automatic Bias Control Technique of Dual-Parallel Mach–Zehnder Modulator Based on Simulated Annealing Algorithm for Quadrupled Signal Generation". Photonics 8, n.º 3 (17 de março de 2021): 80. http://dx.doi.org/10.3390/photonics8030080.
Texto completo da fonteM. Nanak Zakaria, Achmad Setiawan, Ahmad Wilda Y e Lis Diana Mustafa. "Gaussian Distributed Noise Generator Design Using MCU-STM32". Jurnal RESTI (Rekayasa Sistem dan Teknologi Informasi) 6, n.º 2 (20 de abril de 2022): 183–89. http://dx.doi.org/10.29207/resti.v6i2.3684.
Texto completo da fonteChen, Zhang Wei, Xiang Wen e Dong Jiao Chen. "Application Research for Super-Gaussian Random Vibration Test Control Strategy". Applied Mechanics and Materials 141 (novembro de 2011): 83–87. http://dx.doi.org/10.4028/www.scientific.net/amm.141.83.
Texto completo da fonteStryhun, V., R. Barvinok, O. Bilous e V. Tolmachov. "IMPROVEMENT OF METHODS FOR TESTING OF NAVIGATION USER EQUIPMENT OF GLOBAL NAVIGATION SATELLITE SYSTEMS USING A NAVIGATION SIGNAL SIMULATOR". Наукові праці Державного науково-дослідного інституту випробувань і сертифікації озброєння та військової техніки, n.º 6 (30 de dezembro de 2020): 95–102. http://dx.doi.org/10.37701/dndivsovt.6.2020.11.
Texto completo da fonteWang, Li, Wenli Chen, Kai Chen, Renjun He e Wenjian Zhou. "The Research on the Signal Generation Method and Digital Pre-Processing Based on Time-Interleaved Digital-to-Analog Converter for Analog-to-Digital Converter Testing". Applied Sciences 12, n.º 3 (7 de fevereiro de 2022): 1704. http://dx.doi.org/10.3390/app12031704.
Texto completo da fontePan, Zhong Liang, e Ling Chen. "Test Generation for Glitch Faults of Crosstalk Effects in Digital Circuits Based on Genetic Algorithm with Niche". Applied Mechanics and Materials 20-23 (janeiro de 2010): 647–52. http://dx.doi.org/10.4028/www.scientific.net/amm.20-23.647.
Texto completo da fonteKnappe, Sabine, Susanne Till, Gabriele Gerstenbauer, Friedrich Scheiflinger e Michael Dockal. "The Application of Thrombin Generation Test Is Compromised By Antithrombin III Deficiency". Blood 126, n.º 23 (3 de dezembro de 2015): 4663. http://dx.doi.org/10.1182/blood.v126.23.4663.4663.
Texto completo da fonteFlores, Maria da Glória, Marcelo Negreiros, Luigi Carro e Altamiro Susin. "A Noise Generator for Embedded Circuits Testing". Journal of Integrated Circuits and Systems 1, n.º 1 (16 de novembro de 2004): 38–43. http://dx.doi.org/10.29292/jics.v1i1.253.
Texto completo da fonteZhou, Jingyu, Shulin Tian, Chenglin Yang e Xuelong Ren. "Test Generation Algorithm for Fault Detection of Analog Circuits Based on Extreme Learning Machine". Computational Intelligence and Neuroscience 2014 (2014): 1–11. http://dx.doi.org/10.1155/2014/740838.
Texto completo da fonteLu, Yong Xing, e Jia Hua Guo. "Method Based on Bi-Spectrum Research on Driving Signal Generation in Multi Random Vibration Test". Applied Mechanics and Materials 543-547 (março de 2014): 2614–18. http://dx.doi.org/10.4028/www.scientific.net/amm.543-547.2614.
Texto completo da fonteZhong, Zijia, e Joyoung Lee. "Virtual Guide Dog: Next-generation pedestrian signal for the visually impaired". Advances in Mechanical Engineering 12, n.º 3 (março de 2020): 168781401988309. http://dx.doi.org/10.1177/1687814019883096.
Texto completo da fonteZmysłowski, Dariusz, e Jan M. Kelner. "Mobile Network Operators’ Assessment Based on Drive-Test Campaign in Urban Area for iPerf Scenario". Applied Sciences 14, n.º 3 (3 de fevereiro de 2024): 1268. http://dx.doi.org/10.3390/app14031268.
Texto completo da fonteLiu, G. P., P. H. Mu, G. Guo, X. T. Liu e G. S. Hu. "High-quality random bit generation based on a cascade-coupled nano-laser system". Laser Physics Letters 21, n.º 3 (29 de janeiro de 2024): 035206. http://dx.doi.org/10.1088/1612-202x/ad1f4f.
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