Artigos de revistas sobre o tema "Secondary low-energy electrons"
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Merli, P. G., e V. Morandi. "Low-Energy STEM of Multilayers and Dopant Profiles". Microscopy and Microanalysis 11, n.º 1 (28 de janeiro de 2005): 97–104. http://dx.doi.org/10.1017/s1431927605050063.
Texto completo da fonteHowie, A. "Threshold Energy Effects in Secondary Electron Emission". Microscopy and Microanalysis 6, n.º 4 (julho de 2000): 291–96. http://dx.doi.org/10.1017/s1431927602000521.
Texto completo da fonteHowie, A. "Threshold Energy Effects in Secondary Electron Emission". Microscopy and Microanalysis 6, n.º 4 (julho de 2000): 291–96. http://dx.doi.org/10.1007/s100050010042.
Texto completo da fonteHembree, G. G., J. Unguris, R. J. Celotta e D. T. Pierce. "Magnetic microstructure imaging by secondary electron spin polarization analysis". Proceedings, annual meeting, Electron Microscopy Society of America 44 (agosto de 1986): 634–35. http://dx.doi.org/10.1017/s0424820100144619.
Texto completo da fonteTivol, William F. "How to Calculate the Temperature Rise Due to Beam Heating". Microscopy Today 7, n.º 7 (setembro de 1999): 24–27. http://dx.doi.org/10.1017/s1551929500064774.
Texto completo da fonteCipriani, Maicol, Styrmir Svavarsson, Filipe Ferreira da Silva, Hang Lu, Lisa McElwee-White e Oddur Ingólfsson. "The Role of Low-Energy Electron Interactions in cis-Pt(CO)2Br2 Fragmentation". International Journal of Molecular Sciences 22, n.º 16 (20 de agosto de 2021): 8984. http://dx.doi.org/10.3390/ijms22168984.
Texto completo da fonteSuga, Hiroshi, Takafumi Fujiwara, Nobuhiro Kanai e Masatoshi Kotera. "Secondary Electron Image Contrast in the Scanning Electron Microscope". Proceedings, annual meeting, Electron Microscopy Society of America 48, n.º 1 (12 de agosto de 1990): 410–11. http://dx.doi.org/10.1017/s042482010018080x.
Texto completo da fonteMikmeková, Šárka, Haruo Nakamichi e Masayasu Nagoshi. "Contrast of positively charged oxide precipitate in out-lens, in-lens and in-column SE image". Microscopy 67, n.º 1 (8 de dezembro de 2017): 11–17. http://dx.doi.org/10.1093/jmicro/dfx117.
Texto completo da fonteTURTON, S., M. KADODWALA e ROBERT G. JONES. "POSSIBLE "HOT" MOLECULE DESORPTION BY ELECTRON STIMULATED DECOMPOSITION OF DIHALOETHANES ON Cu(111)". Surface Review and Letters 01, n.º 04 (dezembro de 1994): 535–38. http://dx.doi.org/10.1142/s0218625x94000606.
Texto completo da fonteHembree, Gary G., Frank C. H. Luo e John A. Venables. "Auger electron spectroscopy and microscopy in STEM". Proceedings, annual meeting, Electron Microscopy Society of America 49 (agosto de 1991): 464–65. http://dx.doi.org/10.1017/s0424820100086623.
Texto completo da fonteJoens, Steve. "Hitachi S-4700 ExB Filter Design and Applications". Microscopy and Microanalysis 7, S2 (agosto de 2001): 878–79. http://dx.doi.org/10.1017/s1431927600030464.
Texto completo da fontePanchenko, O. F., e L. K. Panchenko. "Relaxation of Highly Non Equilibrium Charge Carriers in Crystals by Low-Energy Electron Influence". Solid State Phenomena 115 (agosto de 2006): 261–66. http://dx.doi.org/10.4028/www.scientific.net/ssp.115.261.
Texto completo da fonteDrucker, J. S., M. Krishnamurthy, G. G. Hembree, Luo Chuan Hong e J. A. Venables. "High-spatial-resolution secondary and Auger imaging in a STEM". Proceedings, annual meeting, Electron Microscopy Society of America 47 (6 de agosto de 1989): 208–9. http://dx.doi.org/10.1017/s0424820100153014.
Texto completo da fonteHembree, Gary G., Frank C. H. Luo e John A. Venables. "Secondary and Auger Electron Spectroscopy and Energy-Selected Imaging in a UHV-STEM". Proceedings, annual meeting, Electron Microscopy Society of America 48, n.º 2 (12 de agosto de 1990): 382–83. http://dx.doi.org/10.1017/s0424820100135514.
Texto completo da fonteJaber, Ahmad M. D. (Assa’d), Ammar Alsoud, Saleh R. Al-Bashaish, Hmoud Al Dmour, Marwan S. Mousa, Tomáš Trčka, Vladimír Holcman e Dinara Sobola. "Electron Energy-Loss Spectroscopy Method for Thin-Film Thickness Calculations with a Low Incident Energy Electron Beam". Technologies 12, n.º 6 (7 de junho de 2024): 87. http://dx.doi.org/10.3390/technologies12060087.
Texto completo da fonteJung, Jiwon, Moo-Young Lee, Jae-Gu Hwang, Moo-Hyun Lee, Min-Seok Kim, Jaewon Lee e Chin-Wook Chung. "Low-energy electron beam generation in inductively coupled plasma via a DC biased grid". Plasma Sources Science and Technology 31, n.º 2 (1 de fevereiro de 2022): 025002. http://dx.doi.org/10.1088/1361-6595/ac43c2.
Texto completo da fonteEbel, Maria F., Robert Svagera, Horst Ebel, Robert Hobl, Michael Mantler, Johann Wernisch e Norbert Zagler. "Determination of Thickness and Composition of Thin AlxGa1-xAs Layers on GaAs by Total Electron Yield (TEY)". Advances in X-ray Analysis 38 (1994): 127–37. http://dx.doi.org/10.1154/s0376030800017729.
Texto completo da fonteAlizadeh, Elahe, Dipayan Chakraborty e Sylwia Ptasińska. "Low-Energy Electron Generation for Biomolecular Damage Inquiry: Instrumentation and Methods". Biophysica 2, n.º 4 (17 de novembro de 2022): 475–97. http://dx.doi.org/10.3390/biophysica2040041.
Texto completo da fonteCowley, J. M. "High Resolution Scanning Electron Microscopy of Surfaces". Proceedings, annual meeting, Electron Microscopy Society of America 48, n.º 1 (12 de agosto de 1990): 296–97. http://dx.doi.org/10.1017/s0424820100180239.
Texto completo da fonteThorman, Rachel M., Ragesh Kumar T. P., D. Howard Fairbrother e Oddur Ingólfsson. "The role of low-energy electrons in focused electron beam induced deposition: four case studies of representative precursors". Beilstein Journal of Nanotechnology 6 (16 de setembro de 2015): 1904–26. http://dx.doi.org/10.3762/bjnano.6.194.
Texto completo da fonteFeng, Guobao, Yun Li, Xiaojun Li, Heng Zhang e Lu Liu. "Characteristics of electron evolution during initial low-pressure discharge stage upon microwave circuits". AIP Advances 12, n.º 11 (1 de novembro de 2022): 115129. http://dx.doi.org/10.1063/5.0130735.
Texto completo da fonteBoamah, Mavis D., Kristal K. Sullivan, Katie E. Shulenberger, ChanMyae M. Soe, Lisa M. Jacob, Farrah C. Yhee, Karen E. Atkinson, Michael C. Boyer, David R. Haines e Christopher R. Arumainayagam. "Low-energy electron-induced chemistry of condensed methanol: implications for the interstellar synthesis of prebiotic molecules". Faraday Discuss. 168 (2014): 249–66. http://dx.doi.org/10.1039/c3fd00158j.
Texto completo da fonteMorgan, S. W., e M. R. Phillips. "Time Dependent Study of the Positive ion Current in the Environmental Scanning Electron Microscope (ESEM)". Microscopy and Microanalysis 7, S2 (agosto de 2001): 788–89. http://dx.doi.org/10.1017/s1431927600030014.
Texto completo da fonteBronold, F. X., e H. Fehske. "Invariant embedding approach to secondary electron emission from metals". Journal of Applied Physics 131, n.º 11 (21 de março de 2022): 113302. http://dx.doi.org/10.1063/5.0082468.
Texto completo da fonteLochmann, Christine, Thomas F. M. Luxford, Samanta Makurat, Andriy Pysanenko, Jaroslav Kočišek, Janusz Rak e Stephan Denifl. "Low-Energy Electron Induced Reactions in Metronidazole at Different Solvation Conditions". Pharmaceuticals 15, n.º 6 (2 de junho de 2022): 701. http://dx.doi.org/10.3390/ph15060701.
Texto completo da fonteBerezin, Andrei Vsevolodovich, Aleksandr Duhanin Aleksandr Duhanin, Oleg Sergeevich Kosarev, Mikhail Borisovich Markov, Sergey Vladimirovich Parot'kin, Yuri Viktorovich Pomazan e Ilya Alekseyevich Tarakanov. "On the simulation of gas ionization by fast electrons". Keldysh Institute Preprints, n.º 46 (2021): 1–12. http://dx.doi.org/10.20948/prepr-2021-46.
Texto completo da fonteKawata, Jun, e Kaoru Ohya. "Secondary Electron Emission from Rough-Textured Beryllium Surface under Oblique Incidence of Low-Energy Electrons". Journal of the Physical Society of Japan 63, n.º 10 (15 de outubro de 1994): 3907–8. http://dx.doi.org/10.1143/jpsj.63.3907.
Texto completo da fonteHembree, G. G., Luo Chuan Hong, P. A. Bennett e J. A. Venables. "Transfer optics for high spatial resolution electron spectroscopy". Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 666–67. http://dx.doi.org/10.1017/s0424820100105394.
Texto completo da fonteKumar, Anil, David Becker, Amitava Adhikary e Michael D. Sevilla. "Reaction of Electrons with DNA: Radiation Damage to Radiosensitization". International Journal of Molecular Sciences 20, n.º 16 (16 de agosto de 2019): 3998. http://dx.doi.org/10.3390/ijms20163998.
Texto completo da fonteVenables, J. A., G. G. Hembree e C. J. Harland. "Electron spectroscopy in SEM and STEM". Proceedings, annual meeting, Electron Microscopy Society of America 48, n.º 2 (12 de agosto de 1990): 378–79. http://dx.doi.org/10.1017/s0424820100135496.
Texto completo da fonteRigler, Mark, e William Longo. "High Voltage Scanning Electron Microscopy Theory and Applications". Microscopy Today 2, n.º 5 (agosto de 1994): 12–13. http://dx.doi.org/10.1017/s1551929500066256.
Texto completo da fonteFitting, H. J., E. Schreiber e I. A. Glavatskikh. "Monte Carlo Modeling of Electron Scattering in Nonconductive Specimens". Microscopy and Microanalysis 10, n.º 6 (dezembro de 2004): 764–70. http://dx.doi.org/10.1017/s1431927604040735.
Texto completo da fonteSanche, L�on. "Nanoscopic aspects of radiobiological damage: Fragmentation induced by secondary low-energy electrons". Mass Spectrometry Reviews 21, n.º 5 (setembro de 2002): 349–69. http://dx.doi.org/10.1002/mas.10034.
Texto completo da fonteZheng, Yi, e Léon Sanche. "Mechanisms of Nanoscale Radiation Enhancement by Metal Nanoparticles: Role of Low Energy Electrons". International Journal of Molecular Sciences 24, n.º 5 (28 de fevereiro de 2023): 4697. http://dx.doi.org/10.3390/ijms24054697.
Texto completo da fonteProto, Andrea, e Jon Gudmundsson. "The Influence of Secondary Electron Emission and Electron Reflection on a Capacitively Coupled Oxygen Discharge". Atoms 6, n.º 4 (28 de novembro de 2018): 65. http://dx.doi.org/10.3390/atoms6040065.
Texto completo da fonteFeng, Guobao, Huiling Song, Yun Li, Xiaojun Li, Guibai Xie, Jian Zhuang e Lu Liu. "Gas Desorption and Secondary Electron Emission from Graphene Coated Copper Due to E-Beam Stimulation". Coatings 13, n.º 2 (6 de fevereiro de 2023): 370. http://dx.doi.org/10.3390/coatings13020370.
Texto completo da fonteCochran, Raymond F. "Characterization of the low accelerating voltage performance of a microchannel plate based detector system for scanning microscopy". Proceedings, annual meeting, Electron Microscopy Society of America 49 (agosto de 1991): 364–65. http://dx.doi.org/10.1017/s042482010008612x.
Texto completo da fonteHauchard, Christelle, e Paul A. Rowntree. "Low-energy electron-induced decarbonylation of Fe(CO)5 films adsorbed on Au(111) surfaces". Canadian Journal of Chemistry 89, n.º 10 (outubro de 2011): 1163–73. http://dx.doi.org/10.1139/v11-073.
Texto completo da fonteSanche, Léon. "Role of secondary low energy electrons in radiobiology and chemoradiation therapy of cancer". Chemical Physics Letters 474, n.º 1-3 (maio de 2009): 1–6. http://dx.doi.org/10.1016/j.cplett.2009.03.023.
Texto completo da fonteZheng, Yi, Pierre Cloutier, Darel J. Hunting e Léon Sanche. "Radiosensitization by Gold Nanoparticles: Comparison of DNA Damage Induced by Low and High-Energy Electrons". Journal of Biomedical Nanotechnology 4, n.º 4 (1 de dezembro de 2008): 469–73. http://dx.doi.org/10.1166/jbn.2008.3282.
Texto completo da fonteRomand, K. J., F. Gaillard, M. Charbonnier e D. S. Urch. "Fundamentals of X-ray Spectrometric Analysis Using Low-Energy Electron Excitation". Advances in X-ray Analysis 34 (1990): 105–21. http://dx.doi.org/10.1154/s0376030800014373.
Texto completo da fonteMIKHAILOV, V. V. "LOW ENERGY ELECTRON AND POSITRON SPECTRA IN THE EARTH ORBIT MEASURED BY MARIA-2 INSTRUMENT". International Journal of Modern Physics A 17, n.º 12n13 (20 de maio de 2002): 1695–704. http://dx.doi.org/10.1142/s0217751x02011199.
Texto completo da fonteLiu, Yiheng, Kai He, Gang Wang, Guilong Gao, Xin Yan, Yanhua Xue, Ping Chen et al. "Simulation of the impact of using a novel neutron conversion screen on detector time characteristics and efficiency". AIP Advances 12, n.º 4 (1 de abril de 2022): 045206. http://dx.doi.org/10.1063/5.0073025.
Texto completo da fonteRodneva, S. M., e D. V. Guryev. "Theoretical Analysis of the Radiation Quality and the Relative Biological Efficiency of Tritium". MEDICAL RADIOLOGY AND RADIATION SAFETY 69, n.º 2 (abril de 2024): 65–72. http://dx.doi.org/10.33266/1024-6177-2024-69-2-65-72.
Texto completo da fonteMohamad Nor, Nurul Hidayah, Nur Afira Anuar, Wan Ahmad Tajuddin Wan Abdullah, Boon Tong Goh e Mohd Fakharul Zaman Raja Yahya. "A Geant4 Simulation on the Application of Multi-layer Graphene as a Detector Material in High-energy Physics". Sains Malaysiana 51, n.º 10 (31 de outubro de 2022): 3423–36. http://dx.doi.org/10.17576/jsm-2022-5110-25.
Texto completo da fonteAkhdar, Hanan, Reem Alanazi, Nadyah Alanazi e Abdullah Alodhayb. "Secondary Electrons in Gold Nanoparticle Clusters and Their Role in Therapeutic Ratio: The Outcome of a Monte Carlo Simulation Study". Molecules 27, n.º 16 (19 de agosto de 2022): 5290. http://dx.doi.org/10.3390/molecules27165290.
Texto completo da fonteH Kelley, Michael. "Uses of Spin-polarised Electrons in Fundamental Electron-Atom Collision Processes and the Analysis of Magnetic Microstructures". Australian Journal of Physics 43, n.º 5 (1990): 565. http://dx.doi.org/10.1071/ph900565.
Texto completo da fonteDo Rego, A. M. Botelho, M. Rei Vilar, J. Lopes da Silva, M. Heyman e M. Schott. "Electronic excitation and secondary electron emission studies by low-energy electrons backscattered from thin polystyrene film surfaces". Surface Science Letters 178, n.º 1-3 (dezembro de 1986): A653. http://dx.doi.org/10.1016/0167-2584(86)90161-1.
Texto completo da fonteDo Rego, A. M. Botelho, M. Rei Vilar, J. Lopes Da Silva, M. Heyman e M. Schott. "Electronic excitation and secondary electron emission studies by low-energy electrons backscattered from thin polystyrene film surfaces". Surface Science 178, n.º 1-3 (dezembro de 1986): 367–74. http://dx.doi.org/10.1016/0039-6028(86)90313-4.
Texto completo da fonteRosenberg, R. A., J. M. Symonds, K. Vijayalakshmi, Debabrata Mishra, T. M. Orlando e R. Naaman. "The relationship between interfacial bonding and radiation damage in adsorbed DNA". Phys. Chem. Chem. Phys. 16, n.º 29 (2014): 15319–25. http://dx.doi.org/10.1039/c4cp01649a.
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