Livros sobre o tema "Secondary ion mass spectrometer"
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van der Heide, Paul. Secondary Ion Mass Spectrometry. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2014. http://dx.doi.org/10.1002/9781118916780.
Texto completo da fonteL, Bentz B., e Odom R. W, eds. Secondary ion mass spectrometry. Amsterdam: Elsevier, 1995.
Encontre o texto completo da fonteWilson, R. G. Secondary ion mass spectrometry. Chichester: Wiley, 1989.
Encontre o texto completo da fonteMahoney, Christine M., ed. Cluster Secondary Ion Mass Spectrometry. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2013. http://dx.doi.org/10.1002/9781118589335.
Texto completo da fonteBenninghoven, Alfred, Richard J. Colton, David S. Simons e Helmut W. Werner, eds. Secondary Ion Mass Spectrometry SIMS V. Berlin, Heidelberg: Springer Berlin Heidelberg, 1986. http://dx.doi.org/10.1007/978-3-642-82724-2.
Texto completo da fonteC, Vickerman J., Brown A. Alan e Reed Nicola M, eds. Secondary ion mass spectrometry: Principles and applications. Oxford: Clarendon Press, 1989.
Encontre o texto completo da fonteA, Brown, e Vickerman J. C, eds. Handbook of static secondary ion mass spectrometry. Chichester [West Sussex]: J. Wiley, 1989.
Encontre o texto completo da fonteHearn, Martin John. Polymer surface studies by secondary ion mass spectrometry. Leicester: Leicester Polytechnic, 1988.
Encontre o texto completo da fonteG, Rüdenauer F., e Werner H. W, eds. Secondary ion mass spectrometry: Basic concepts, instrumental aspects, applications, and trends. New York: J. Wiley, 1987.
Encontre o texto completo da fonteInternational Conference on Secondary Ion Mass Spectrometry (11th 1997 Orlando, Fla.). Secondary ion mass spectrometry, SIMS XI: Proceedings of the Eleventh International Conference on Secondary Ion Mass Spectrometry, Orlando, Florida, September 7-12th, 1997. Editado por Gillen G. Chichester: Wiley, 1998.
Encontre o texto completo da fonteInternational Conference on Secondary Ion Mass Spectrometry (9th 1993 Yokahama). Secondary ion mass spectrometry: SIMS IX : proceedings of the Ninth International Conference on Secondary Ion Mass Spectrometry (SIMS IX)...,7-12 November 1993. Editado por Benninghoven A. 1932-. Chichester: Wiley, 1994.
Encontre o texto completo da fonteMai, H. Investigation of the sampling volume in secondary ion microanalysis. Dresden: Akademie der Wissenschaften der DDR, Zentralinstitut für Festkörperphysik und Werkstofforschung, 1986.
Encontre o texto completo da fonteInternational Conference on Secondary Ion Mass Spectrometry (8th 1991 Amsterdam,Netherlands). Secondary ion mass spectrometry: SIMS VIII : proceedings of the eighth International Conference on Secondary Ion Mass Spectrometry, Amsterdam, the Netherlands, September 15-20 1991. Editado por Benninghoven A. 1932-. Chichester: Wiley, 1992.
Encontre o texto completo da fonteInternational Conferenceon Secondary Ion Mass Spectrometry (7th 1989 California, USA). Secondary ion mass spectrometry SIMS VII: Proceedings of the seventh International Conference on Secondary Ion Mass Spectrometry (SIMS VII), Hyatt Regency Hotel, Monterey, California, USA, September 3rd-8th, 1989. Editado por Benninghoven A. 1932-. Chichester: Wiley, 1990.
Encontre o texto completo da fonteInternational Conference on Secondary Ion Mass Spectrometry (10th 1995 Muenster, Germany). Secondary ion mass spectrometry, SIMS X: Proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X), University of Muenster, Muenster, Germany, October 1-6th, 1995. Editado por Benninghoven A, Hagenhoff B e Werner H. W. Chichester: Wiley, 1997.
Encontre o texto completo da fonteG, Wilson Robert. Secondary ion mass spectrometry: A practical handbook for depth profiling and bulk impurity analysis. New York: Wiley, 1989.
Encontre o texto completo da fonteFayek, Mostafa. Secondary ion mass spectrometry in the earth sciences: Gleaning the big picture from a small spot. Toronto: Mineralogical Association of Canada, 2009.
Encontre o texto completo da fonteInternational, Conference on Secondary Ion Mass Spectrometry (6th 1987 Versailles France). Secondary ion mass spectrometry: SIMS VI: proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry, Palais des Congrès, Versailles, Paris, France, September 13-18th, 1987. Chichester: Wiley, 1988.
Encontre o texto completo da fonteVargas-Aburto, Carlos. Development of a quadrupole-based secondary-ion mass spectrometry (SIMS) system at Lewis Research Center. [Washington, D.C.]: NASA, 1990.
Encontre o texto completo da fonteR, Aron Paul, Liff Dale Russell e United States. National Aeronautics and Space Administration., eds. Development of a quadrupole-based secondary-ion mass spectrometry (SIMS) system at Lewis Research Center. [Washington, D.C.]: NASA, 1990.
Encontre o texto completo da fonteFox, Harvey Stuart. A study of shallow implants in silicon by secondary ion mass spectrometry. [s.l.]: typescript, 1989.
Encontre o texto completo da fonteA, Hedin, Sundqvist B. U. R e Benninghoven A. 1932-, eds. Ion Formation from Organic Solids (IFOS V). Chichester: Wiley, 1990.
Encontre o texto completo da fonteInternational Conference on Secondary Ion Mass Spectrometry (5th 1985 Washington, D.C.). Secondary ion mass spectrometry: SIMS V : proceedings of the fifth international conference, Washington, DC, September 30-October 4, 1985. Editado por Benninghoven A. Berlin: Springer-Verlag, 1986.
Encontre o texto completo da fonteInternational Conference on Secondary Ion Mass Spectrometry. (7th 1989 Monterey, Calif.). Secondary ion mass spectrometry: SIMS VII: proceedings of the seventh International Conference on Secondary Ion Mass Spectrometry (SIMS VII), Hyatt Regency Hotel, Monterey, California, USA, September 3rd-4th, 1989. Editado por Benninghoven A, Huber Alfred 1918- e Werner H. W. Chichester: Wiley, 1990.
Encontre o texto completo da fonte1930-, Czanderna Alvin Warren, e Hercules David M, eds. Ion spectroscopies for surface analysis. New York: Plenum Press, 1991.
Encontre o texto completo da fonteIro, J. E. Static secondary ion mass spectrometry studies of complex toxic substances adsorbed on different subtrates. Manchester: UMIST, 1998.
Encontre o texto completo da fonteCooke, Graham Alan. The development of secondary ion mass spectrometry for two-dimensional impurity profiling in semiconductors. [s.l.]: typescript, 1992.
Encontre o texto completo da fonteCzanderna, A. W. Ion Spectroscopies for Surface Analysis. Boston, MA: Springer US, 1991.
Encontre o texto completo da fonteHeller-Krippendorf, Danica. Multivariate Data Analysis for Root Cause Analyses and Time-of-Flight Secondary Ion Mass Spectrometry. Wiesbaden: Springer Fachmedien Wiesbaden, 2019. http://dx.doi.org/10.1007/978-3-658-28502-9.
Texto completo da fonteA, Hedin, Sundqvist B. U. R, Benninghoven A, Naturvetenskapliga forskningsrådet (Sweden), Nordic Committee for Accelerator Based Research. e International Conference on Ion Formation from Organic Solids (5th : 1989 : Lövånger, Sweden), eds. Ion formation from organic solids (IFOS V): Proceedings of the fifth international conference, Lövånger, Sweden, June 18-21, 1989. Chichester [England]: Wiley, 1990.
Encontre o texto completo da fonteA, Benninghoven, ed. Ion formation from organic solids (IFOS III): Mass spectrometry of involatile material : proceedings of the third international conference, Münster, Fed. Rep. of Germany, September 16-18, 1985. Berlin: Springer-Verlag, 1986.
Encontre o texto completo da fonteInternational Conference On Ion Formation from Organic Solids(IFOS IV) (4th 1987 Münster). Ion formation from organic solids (IFOS IV): Mass spectrometry of involatile material : proceedings of the Fourth International Conference, Münster, Federal Republic of Germany,September 21-23, 1987. Editado por Benninghoven A. 1932-. Chichester: Wiley, 1989.
Encontre o texto completo da fontePouch, John J. Auger electron spetroscopy, secondary ion mass spectrometry and optical characterization of a-C:H and BN films. [Cleveland, Ohio: National Aeronautics and Space Administration, Lewis Research Center, 1986.
Encontre o texto completo da fonteH, Zou, e AECL Research, eds. The solid solubility of Ni and Co in [alpha]-Zr: A secondary Ion mass spectrometry study. Chalk River, Ontario, Canada: Reactor Materials Research Branch, Chalk River Laboratories, 1995.
Encontre o texto completo da fonte1945-, Lyon Philip A., e American Chemical Society, eds. Desorption mass spectrometry: Are SIMS and FAB the same? Washington, D.C: American Chemical Society, 1985.
Encontre o texto completo da fonteHerridge, D. A static secondary ion mass spectrometry (SSIMS) investigation of hetrogeneous reactions on simulated polar stratospheric cloud particles. Manchester: UMIST, 1997.
Encontre o texto completo da fonteUnited States. National Aeronautics and Space Administration., ed. Analylsis of LDEF experiment AO137-2: Chemically and isotopic measurements of micrometeroids by secondary ion mass spectrometry. [Washington, DC: National Aeronautics and Space Administration, 1992.
Encontre o texto completo da fonteG, Newman John, e Hohlt Teresa A, eds. Static SIMS handbook of polymer analysis: A reference book of standard data for identification and interpretation of static SIMS data. Eden Prairie, Minn: Perkin-Elmer Corp., Physical Electronics Division, 1991.
Encontre o texto completo da fonteInternational Conference on Secondary Ion Mass Spectrometry (5th 1985 Washington, DC). Secondary ion mass spectrometry SIMS V: Proceedings of the Fifth International Conference, Washington, DC, September 30 - October 4, 1985. Berlin: Springer, 1986.
Encontre o texto completo da fonteJ, Verlinden, Commission of the European Communities. Directorate-General for Science, Research and Development. e Commission of the European Communities. Joint Research Centre., eds. Rhenium filaments: Investigation of their purity by spark source and secondary ion mass spectrometry, their purification by thermal treatment. Luxembourg: Commission of the European Communities Directorate-General Information Market and Innovation, 1985.
Encontre o texto completo da fonteGrasserbauer, M. Angewandte Oberflächenanalyse: Mit SIMS Sekundär-Ionen-Massenspektrometrie, AES Auger-Elektronen-Spektrometrie, XPS Röntgen-Photoelektronen-Spektrometrie. Berlin: Springer-Verlag, 1986.
Encontre o texto completo da fonteCherepin, Valentin Tikhonovich. Ionnyĭ mikrozondovyĭ analiz. Kiev: Nauk. dumka, 1992.
Encontre o texto completo da fonteSurface analysis of polymers by XPS and static SIMS. Cambridge, U.K: Cambridge University Press, 1998.
Encontre o texto completo da fonteUnited States. National Aeronautics and Space Administration., ed. Ion mass spectrometer experiment for ISIS-II spacecraft: Final report. [Washington, DC: National Aeronautics and Space Administration, 1987.
Encontre o texto completo da fonte(Editor), A. Benninghoven, C. A. Evans (Editor), K. D. McKeegan (Editor), H. A. Storms (Editor) e H. W. Werner (Editor), eds. Secondary Ion Mass Spectrometry. John Wiley and Sons Ltd, 1990.
Encontre o texto completo da fonteInternational Conference on Secondary Ion Mass Spectrometry (6th 1987 Versailles, France). Secondary ion mass spectrometry. Editado por Benninghoven A. 1932-, Huber Alfred 1918- e Werner H. W. Wiley, 1988.
Encontre o texto completo da fonteFEARN, Shard. Secondary Ion Mass Spectrometry Its Aphb. Institute of Physics Publishing, 2022.
Encontre o texto completo da fonte(Editor), A. Benninghoven, B. Hagenhoff (Editor) e H. W. Werner (Editor), eds. Secondary Ion Mass Spectrometry: SIMS X. John Wiley & Sons Ltd (Import), 1997.
Encontre o texto completo da fonteGillen, Edited by: G. Secondary Ion Mass Spectrometry SIMS XI. Wiley, 1998.
Encontre o texto completo da fonteBenninghoven, A., R. Shimizu e Y. Nihei. Secondary Ion Mass Spectrometry: SIMS IX. John Wiley & Sons, 1994.
Encontre o texto completo da fonte