Literatura científica selecionada sobre o tema "Secondary ion mass spectrometer"
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Artigos de revistas sobre o assunto "Secondary ion mass spectrometer"
Todd, Peter J., e T. Gregory Schaaff. "A secondary ion microprobe ion trap mass spectrometer". Journal of the American Society for Mass Spectrometry 13, n.º 9 (setembro de 2002): 1099–107. http://dx.doi.org/10.1016/s1044-0305(02)00434-8.
Texto completo da fonteOlthoff, J. K., I. A. Lys e R. J. Cotter. "A pulsed time-of-flight mass spectrometer for liquid secondary ion mass spectrometry". Rapid Communications in Mass Spectrometry 2, n.º 9 (setembro de 1988): 171–75. http://dx.doi.org/10.1002/rcm.1290020902.
Texto completo da fonteBaturin, V. A., S. A. Eremin e S. A. Pustovoĭtov. "Secondary ion mass spectrometer based on a high-dose ion implanter". Technical Physics 52, n.º 6 (junho de 2007): 770–75. http://dx.doi.org/10.1134/s1063784207060163.
Texto completo da fonteJiang, Jichun, Lei Hua, Yuanyuan Xie, Yixue Cao, Yuxuan Wen, Ping Chen e Haiyang Li. "High Mass Resolution Multireflection Time-of-Flight Secondary Ion Mass Spectrometer". Journal of the American Society for Mass Spectrometry 32, n.º 5 (20 de abril de 2021): 1196–204. http://dx.doi.org/10.1021/jasms.1c00016.
Texto completo da fonteHull, Robert, Derren Dunn e Alan Kubis. "Nanoscale Tomographic Imaging using Focused Ion Beam Sputtering, Secondary Electron Imaging and Secondary Ion Mass Spectrometry". Microscopy and Microanalysis 7, S2 (agosto de 2001): 934–35. http://dx.doi.org/10.1017/s1431927600030749.
Texto completo da fonteISHIKAWA, Shuji, e Yuko TAKEGUCHI. "Secondary Ion Mass Spectrometry". Journal of the Japan Society of Colour Material 86, n.º 10 (2013): 386–91. http://dx.doi.org/10.4011/shikizai.86.386.
Texto completo da fonteFUJITA, Koichi. "Secondary Ion Mass Spectrometry". Journal of the Japan Society of Colour Material 79, n.º 2 (2006): 81–85. http://dx.doi.org/10.4011/shikizai1937.79.81.
Texto completo da fonteWilliams, Peter. "Secondary Ion Mass Spectrometry". Annual Review of Materials Science 15, n.º 1 (agosto de 1985): 517–48. http://dx.doi.org/10.1146/annurev.ms.15.080185.002505.
Texto completo da fonteGriffiths, Jennifer. "Secondary Ion Mass Spectrometry". Analytical Chemistry 80, n.º 19 (outubro de 2008): 7194–97. http://dx.doi.org/10.1021/ac801528u.
Texto completo da fonteZalm, PC. "Secondary ion mass spectrometry". Vacuum 45, n.º 6-7 (junho de 1994): 753–72. http://dx.doi.org/10.1016/0042-207x(94)90113-9.
Texto completo da fonteTeses / dissertações sobre o assunto "Secondary ion mass spectrometer"
Freeman, Stewart Peter Hans Thielbeer. "The radiocarbon microprobe : an imaging secondary ion accelerator mass spectrometer". Thesis, University of Oxford, 1992. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.314932.
Texto completo da fonteLi, Libing. "Strategies for secondary ion yield enhancements in focused ion beam secondary ion mass spectrometry". Thesis, Imperial College London, 2010. http://hdl.handle.net/10044/1/11806.
Texto completo da fonteLemire, Sharon Warford. "Rigorous analytical applications of liquid secondary ion mass spectrometry/mass spectrometry". Diss., Georgia Institute of Technology, 1996. http://hdl.handle.net/1853/30026.
Texto completo da fonteJones, Brian N. "The development of MeV secondary Ion mass spectrometry". Thesis, University of Surrey, 2012. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.580361.
Texto completo da fonteHearn, M. J. "Polymer surface studies by Secondary Ion Mass Spectrometry". Thesis, De Montfort University, 1988. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.380743.
Texto completo da fonteCoath, Christopher D. "A study of ion-optics for microbeam secondary-ion mass spectrometry". Thesis, University of Cambridge, 1990. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.335723.
Texto completo da fonteGilmore, Ian Stuart. "Development of a measurement base for static secondary ion mass spectrometry". Thesis, Loughborough University, 2000. https://dspace.lboro.ac.uk/2134/11110.
Texto completo da fonteJohn, Gareth David. "Secondary ion mass spectrometry and resonant ionisation mass spectrometry studies of nickel contacts to silicon carbide". Thesis, Swansea University, 2004. https://cronfa.swan.ac.uk/Record/cronfa42495.
Texto completo da fonteDe, Souza Roger A., e Manfred Martin. "Secondary ion mass spectrometry and its application to diffusion in oxides". Universitätsbibliothek Leipzig, 2015. http://nbn-resolving.de/urn:nbn:de:bsz:15-qucosa-186567.
Texto completo da fonteDe, Souza Roger A., e Manfred Martin. "Secondary ion mass spectrometry and its application to diffusion in oxides". Diffusion fundamentals 12 (2010) 9, 2010. https://ul.qucosa.de/id/qucosa%3A13868.
Texto completo da fonteLivros sobre o assunto "Secondary ion mass spectrometer"
van der Heide, Paul. Secondary Ion Mass Spectrometry. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2014. http://dx.doi.org/10.1002/9781118916780.
Texto completo da fonteL, Bentz B., e Odom R. W, eds. Secondary ion mass spectrometry. Amsterdam: Elsevier, 1995.
Encontre o texto completo da fonteWilson, R. G. Secondary ion mass spectrometry. Chichester: Wiley, 1989.
Encontre o texto completo da fonteMahoney, Christine M., ed. Cluster Secondary Ion Mass Spectrometry. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2013. http://dx.doi.org/10.1002/9781118589335.
Texto completo da fonteBenninghoven, Alfred, Richard J. Colton, David S. Simons e Helmut W. Werner, eds. Secondary Ion Mass Spectrometry SIMS V. Berlin, Heidelberg: Springer Berlin Heidelberg, 1986. http://dx.doi.org/10.1007/978-3-642-82724-2.
Texto completo da fonteC, Vickerman J., Brown A. Alan e Reed Nicola M, eds. Secondary ion mass spectrometry: Principles and applications. Oxford: Clarendon Press, 1989.
Encontre o texto completo da fonteA, Brown, e Vickerman J. C, eds. Handbook of static secondary ion mass spectrometry. Chichester [West Sussex]: J. Wiley, 1989.
Encontre o texto completo da fonteHearn, Martin John. Polymer surface studies by secondary ion mass spectrometry. Leicester: Leicester Polytechnic, 1988.
Encontre o texto completo da fonteG, Rüdenauer F., e Werner H. W, eds. Secondary ion mass spectrometry: Basic concepts, instrumental aspects, applications, and trends. New York: J. Wiley, 1987.
Encontre o texto completo da fonteInternational Conference on Secondary Ion Mass Spectrometry (11th 1997 Orlando, Fla.). Secondary ion mass spectrometry, SIMS XI: Proceedings of the Eleventh International Conference on Secondary Ion Mass Spectrometry, Orlando, Florida, September 7-12th, 1997. Editado por Gillen G. Chichester: Wiley, 1998.
Encontre o texto completo da fonteCapítulos de livros sobre o assunto "Secondary ion mass spectrometer"
Niehuis, E., T. Heller, H. Feld e A. Benninghoven. "High-Resolution TOF Secondary Ion Mass Spectrometer". In Springer Proceedings in Physics, 198–202. Berlin, Heidelberg: Springer Berlin Heidelberg, 1986. http://dx.doi.org/10.1007/978-3-642-82718-1_37.
Texto completo da fonteNiehuis, E., T. Heller, H. Feld e A. Benninghoven. "High Resolution TOF Secondary Ion Mass Spectrometer". In Springer Series in Chemical Physics, 188–90. Berlin, Heidelberg: Springer Berlin Heidelberg, 1986. http://dx.doi.org/10.1007/978-3-642-82724-2_48.
Texto completo da fonteBaker, Judith E. "Secondary Ion Mass Spectrometry". In Practical Materials Characterization, 133–87. New York, NY: Springer New York, 2014. http://dx.doi.org/10.1007/978-1-4614-9281-8_4.
Texto completo da fonteGrimblot, J., e M. Abon. "Secondary Ion Mass Spectrometry". In Catalyst Characterization, 291–319. Boston, MA: Springer US, 1994. http://dx.doi.org/10.1007/978-1-4757-9589-9_11.
Texto completo da fonteAsher, S. E. "Secondary Ion Mass Spectrometry". In Microanalysis of Solids, 149–77. Boston, MA: Springer US, 1994. http://dx.doi.org/10.1007/978-1-4899-1492-7_5.
Texto completo da fonteGardella, Joseph A. "Secondary ion mass spectrometry". In The Handbook of Surface Imaging and Visualization, 705–12. Boca Raton: CRC Press, 2022. http://dx.doi.org/10.1201/9780367811815-51.
Texto completo da fonteMichałowski, Paweł Piotr. "Secondary Ion Mass Spectrometry". In Microscopy and Microanalysis for Lithium-Ion Batteries, 189–214. Boca Raton: CRC Press, 2023. http://dx.doi.org/10.1201/9781003299295-7.
Texto completo da fonteFahey, Albert J. "Ion Sources Used for Secondary Ion Mass Spectrometry". In Cluster Secondary Ion Mass Spectrometry, 57–75. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2013. http://dx.doi.org/10.1002/9781118589335.ch3.
Texto completo da fonteGroenewold, Gary S., Anthony D. Appelhans, Garold L. Gresham e John E. Olson. "Measurements of Surface Contaminants and Sorbed Organics Using an Ion Trap Secondary Ion Mass Spectrometer". In Mass Spectrometry Handbook, 491–507. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2012. http://dx.doi.org/10.1002/9781118180730.ch22.
Texto completo da fonteIreland, Trevor R. "Secondary Ion Mass Spectrometry (SIMS)". In Encyclopedia of Scientific Dating Methods, 739–40. Dordrecht: Springer Netherlands, 2015. http://dx.doi.org/10.1007/978-94-007-6304-3_106.
Texto completo da fonteTrabalhos de conferências sobre o assunto "Secondary ion mass spectrometer"
Downey, Stephen W. "Comparison of secondary ion mass spectrometry and resonance ionization mass spectrometry". In OE/LASE '90, 14-19 Jan., Los Angeles, CA, editado por Nicholas S. Nogar. SPIE, 1990. http://dx.doi.org/10.1117/12.17881.
Texto completo da fonteGillen, Greg. "Cluster primary ion beam secondary ion mass spectrometry for semiconductor characterization". In The 2000 international conference on characterization and metrology for ULSI technology. AIP, 2001. http://dx.doi.org/10.1063/1.1354477.
Texto completo da fonteWang, Peizhi, Zemin Bao e Tao Long. "The Research of Secondary Neutral Particles Spatial Distribution of Secondary Ion Mass Spectrometry". In Goldschmidt2020. Geochemical Society, 2020. http://dx.doi.org/10.46427/gold2020.2747.
Texto completo da fonteAnderle, M. "Ultra Shallow Depth Profiling by Secondary Ion Mass Spectrometry Techniques". In CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY: 2003 International Conference on Characterization and Metrology for ULSI Technology. AIP, 2003. http://dx.doi.org/10.1063/1.1622547.
Texto completo da fonteAppelhans, Anthony D., Gary S. Groenewold, Jani C. Ingram, D. A. Dahl e J. E. Delmore. "Molecular beam static secondary ion mass spectrometry for surface analysis". In Photonics West '95, editado por Bryan L. Fearey. SPIE, 1995. http://dx.doi.org/10.1117/12.206432.
Texto completo da fonteVan Lierde, Patrick, Chunsheng Tian, Bruce Rothman e Richard A. Hockett. "Quantitative secondary ion mass spectrometry (SIMS) of III-V materials". In Symposium on Integrated Optoelectronic Devices, editado por Gail J. Brown e Manijeh Razeghi. SPIE, 2002. http://dx.doi.org/10.1117/12.467668.
Texto completo da fonteDandong Ge, Preu Harald, Gan Swee Lee e Liang Kng Ian Koh. "Semi-quantitative analysis of trace elements by Secondary Ion Mass Spectrometry". In 2010 12th Electronics Packaging Technology Conference - (EPTC 2010). IEEE, 2010. http://dx.doi.org/10.1109/eptc.2010.5702681.
Texto completo da fonteWilhelm, Gudrun. "Degeneration of Li-Ion batteries studied with a Field Emission Scanning Electron Microscope equipped with a Secondary Ion Mass Spectrometer". In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.234.
Texto completo da fonteSchnieders, A., e T. Budri. "Full wafer defect analysis with time-of-flight secondary Ion Mass Spectrometry". In 2010 21st Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC). IEEE, 2010. http://dx.doi.org/10.1109/asmc.2010.5551443.
Texto completo da fonteKhan, Parwaiz A. A., e Anand J. Paul. "Surface study of laser welded stainless steels using secondary ion mass spectrometry". In ICALEO® ‘93: Proceedings of the Laser Materials Processing Conference. Laser Institute of America, 1993. http://dx.doi.org/10.2351/1.5058637.
Texto completo da fonteRelatórios de organizações sobre o assunto "Secondary ion mass spectrometer"
Bavarian, Behzad. Acquisition of Secondary Ion Mass Spectrometer with Fracture Stage. Fort Belvoir, VA: Defense Technical Information Center, dezembro de 2002. http://dx.doi.org/10.21236/ada416275.
Texto completo da fonteGroenewold, G. S., A. D. Applehans, J. C. Ingram, J. E. Delmore e D. A. Dahl. In situ secondary ion mass spectrometry analysis. Office of Scientific and Technical Information (OSTI), janeiro de 1993. http://dx.doi.org/10.2172/6483751.
Texto completo da fonteGroenewold, G. S., A. D. Applehans, J. C. Ingram, J. E. Delmore e D. A. Dahl. In situ secondary ion mass spectrometry analysis. 1992 Summary report. Office of Scientific and Technical Information (OSTI), janeiro de 1993. http://dx.doi.org/10.2172/10150987.
Texto completo da fonteMacPhee, J. A., R. R. Martin e N. S. McIntyre. An investigation of coal using secondary ion mass spectrometry (SIMS). Natural Resources Canada/ESS/Scientific and Technical Publishing Services, 1985. http://dx.doi.org/10.4095/302550.
Texto completo da fonteStern, R. A., e N. Sanborn. Monazite U-Pb and Th-Ph geochronology by high-resolution secondary ion mass spectrometry. Natural Resources Canada/ESS/Scientific and Technical Publishing Services, 1998. http://dx.doi.org/10.4095/210051.
Texto completo da fonteHickmott, Donald D., e Lee D. Riciputi. Science of Signatures Workshop on Secondary Ion Mass Spectrometry (SIMS) Applications July 24, 2012. Office of Scientific and Technical Information (OSTI), julho de 2012. http://dx.doi.org/10.2172/1047099.
Texto completo da fonteJackman, J. A., P. A. Hunt, O. Van Breemen e R. L. Hervig. Preliminary Investigation On Spatial Distributions of Elements in Zircon Grains By Secondary Ion Mass Spectrometry. Natural Resources Canada/ESS/Scientific and Technical Publishing Services, 1987. http://dx.doi.org/10.4095/122740.
Texto completo da fonteHanrahan, R. J. Jr, S. P. Withrow e M. Puga-Lambers. Measurements of the diffusion of iron and carbon in single crystal NiAl using ion implantation and secondary ion mass spectrometry. Office of Scientific and Technical Information (OSTI), dezembro de 1998. http://dx.doi.org/10.2172/296786.
Texto completo da fonteRiciputi, Lee. Science of Signatures Workshop on Secondary Ion Mass Spectrometry (SIMS) Applications Some Nuclear and Geological Applications. Office of Scientific and Technical Information (OSTI), julho de 2012. http://dx.doi.org/10.2172/1047088.
Texto completo da fonteFrisbie, C. D., J. R. Martin, R. R. Duff, Wrighton Jr. e M. S. Use of High Lateral Resolution Secondary Ion Mass Spectrometry to Characterize Self-Assembled Monolayers on Microfabricated Structures. Fort Belvoir, VA: Defense Technical Information Center, fevereiro de 1992. http://dx.doi.org/10.21236/ada245797.
Texto completo da fonte