Artigos de revistas sobre o tema "Reliability qualification"
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S., VELMOURUOGAN, DHAVACHELVAN P. e BASKARAN R. "Software Reliability Qualification Model". International Journal of Performability Engineering 8, n.º 4 (2012): 437. http://dx.doi.org/10.23940/ijpe.12.4.p437.mag.
Texto completo da fonteRegard, Charles, Christian Gautier, Hélène Fremont, Patrick Poirier, M. A. Xiaosong e Kaspar M. B. Jansen. "Fast reliability qualification of SiP products". Microelectronics Reliability 49, n.º 9-11 (setembro de 2009): 958–62. http://dx.doi.org/10.1016/j.microrel.2009.07.042.
Texto completo da fontePorter, Alex. "Accelerated Reliability Qualification in Automotive Testing". Quality and Reliability Engineering International 20, n.º 2 (25 de fevereiro de 2004): 115–20. http://dx.doi.org/10.1002/qre.619.
Texto completo da fonteReffiane, Fine, Choirul Huda, Mudzanatun Mudzanatun e Ferina Agustini. "ANALISIS DIFERENSIASI KARYA PADA KEMAMPUAN LITERASI SAINTEK MAHASISWA KEPENDIDIKAN UNIVERSITAS PGRI SEMARANG". Refleksi Edukatika : Jurnal Ilmiah Kependidikan 14, n.º 2 (28 de junho de 2024): 208–13. http://dx.doi.org/10.24176/re.v14i2.12498.
Texto completo da fonteHarry, C. C., e C. H. Mathiowetz. "ASIC reliability and qualification: a user's perspective". Proceedings of the IEEE 81, n.º 5 (maio de 1993): 759–67. http://dx.doi.org/10.1109/5.220906.
Texto completo da fonteRoush, M., e J. Maynes. "Saw devices: Space qualification and reliability issues". International Journal of Satellite Communications 7, n.º 4 (outubro de 1989): 361–71. http://dx.doi.org/10.1002/sat.4600070413.
Texto completo da fonteTIAN, XIJIN. "DC-DC CONVERTER RELIABILITY: DESIGN, COMPONENTS AND QUALIFICATION". International Journal of Reliability, Quality and Safety Engineering 12, n.º 05 (outubro de 2005): 459–74. http://dx.doi.org/10.1142/s021853930500194x.
Texto completo da fonteKlewer, Christian, Frank Kuechenmeister, Jens Paul, Dirk Breuer, Bjoern Boehme, Jae Kyu Cho, Simone Capecchi e Michael Thiele. "Package Qualification Envelope for 22FDX® Technology". International Symposium on Microelectronics 2019, n.º 1 (1 de outubro de 2019): 000169–75. http://dx.doi.org/10.4071/2380-4505-2019.1.000169.
Texto completo da fonteMikhaylenko, Leonid V., e Dmitry A. Shchelokov. "Digital discrete simulation model of profit formation taking into account the dynamics of cash flows, the level of reliability of launch vehicles and professional development of employees". Vestnik of Samara University. Economics and Management 14, n.º 4 (23 de janeiro de 2024): 221–31. http://dx.doi.org/10.18287/2542-0461-2023-14-4-221-231.
Texto completo da fonteDenney, Dennis. "Reliability Qualification Testing for Permanently Installed Wellbore Equipment". Journal of Petroleum Technology 52, n.º 10 (1 de outubro de 2000): 60–61. http://dx.doi.org/10.2118/1000-0060-jpt.
Texto completo da fonteChamberlain, Suzanne. "Qualification users’ perceptions and experiences of assessment reliability". Research Papers in Education 28, n.º 1 (fevereiro de 2013): 118–33. http://dx.doi.org/10.1080/02671522.2012.754231.
Texto completo da fonteIoannou, Dimitris P. "HKMG CMOS technology qualification: The PBTI reliability challenge". Microelectronics Reliability 54, n.º 8 (agosto de 2014): 1489–99. http://dx.doi.org/10.1016/j.microrel.2014.03.018.
Texto completo da fonteGoudard, JL, X. Boddaert, J. Périnet e D. Laffitte. "Reliability of optoelectronics components: towards new qualification practices". Microelectronics Reliability 43, n.º 9-11 (setembro de 2003): 1767–69. http://dx.doi.org/10.1016/s0026-2714(03)00297-x.
Texto completo da fonteBora, Mumtaz Y. "Qualification of Automotive RF-IC Packages". International Symposium on Microelectronics 2014, n.º 1 (1 de outubro de 2014): 000820–25. http://dx.doi.org/10.4071/isom-thp23.
Texto completo da fonteFlaig, John J., e William C. Spencer. "Process Qualification". Quality Engineering 16, n.º 1 (9 de janeiro de 2003): 57–66. http://dx.doi.org/10.1081/qen-120020771.
Texto completo da fonteWaluyanti, Sri, e Herminarto Sofyan. "Tiered teacher competency qualification standards as CPD guide VHS teachers". Jurnal Pendidikan Vokasi 8, n.º 1 (28 de fevereiro de 2018): 97. http://dx.doi.org/10.21831/jpv.v8i1.18610.
Texto completo da fontehung, Ayes, Rose Imoniri Etuk, EtoroAbasi Ndia Offiong e Okoh Efanga. "TEACHER’S EXPERIENCE, EDUCATIONAL QUALIFICATION AND MASTERY OF DIFFICULT CONCEPTS IN PHYSICS IN CALABAR METROPOLIS, CROSS RIVER STATE, NIGERIA". Education, Sustainability & Society 5, n.º 1 (5 de janeiro de 2023): 16–19. http://dx.doi.org/10.26480/ess.01.2023.16.19.
Texto completo da fonteCleopas, Blessing Chinyere, e Favour Chigozirim Onwuchekwa. "Impact of chemistry teachers’ qualification and years of experience on academic performance of secondary school chemistry students in Ogbia local government area Bayelsa state". Contemporary Research in Education and English Language Teaching 6, n.º 1 (31 de julho de 2024): 62–72. http://dx.doi.org/10.55214/26410230.v6i1.1133.
Texto completo da fonteCalò, C., A. Lay-Ekuakille, P. Vergallo, C. Chiffi, A. Trotta, A. Fasanella e A. M. Fasanella. "Measurements and Characterization of Photovoltaic Modules for Tolerance Verification". International Journal of Measurement Technologies and Instrumentation Engineering 1, n.º 2 (abril de 2011): 73–83. http://dx.doi.org/10.4018/ijmtie.2011040106.
Texto completo da fontevan Hassel, J. G., G. A. D. Bock e G. van den Berg. "Failure mechanisms in advanced BCD technology during reliability qualification". Microelectronics Reliability 51, n.º 9-11 (setembro de 2011): 1697–700. http://dx.doi.org/10.1016/j.microrel.2011.07.043.
Texto completo da fonteRouse, Steven V. "Reliability of MTurk Data From Masters and Workers". Journal of Individual Differences 41, n.º 1 (janeiro de 2020): 30–36. http://dx.doi.org/10.1027/1614-0001/a000300.
Texto completo da fonteSUHAIMI, Suhaimi, Nagaliman NAGALIMAN e Sarmini SARMINI. "The Effect of Educational Qualifications, Loyalty, and Commitment on Career Development of Tanjung Batu Kundur Hospital Employees Through Work Placement". International Journal of Environmental, Sustainability, and Social Science 5, n.º 3 (31 de maio de 2024): 866–74. https://doi.org/10.38142/ijesss.v5i3.1130.
Texto completo da fonteWare, A. G., M. E. Nitzel e J. D. Page. "A Summary of NRC Generic Safety Issue 113: Dynamic Qualification and Testing of Large Bore Hydraulic Snubbers". Journal of Pressure Vessel Technology 116, n.º 2 (1 de maio de 1994): 85–95. http://dx.doi.org/10.1115/1.2929581.
Texto completo da fonteLambert, B., J. Thorpe, R. Behtash, B. Schauwecker, F. Bourgeois, H. Jung, J. Bataille et al. "Reliability data’s of 0.5μm AlGaN/GaN on SiC technology qualification". Microelectronics Reliability 52, n.º 9-10 (setembro de 2012): 2200–2204. http://dx.doi.org/10.1016/j.microrel.2012.06.098.
Texto completo da fonteTsuyuzaki, Eisuke. "New perspectives in reliability testing and performance qualification for wearables". OPE Journal 14, n.º 47 (2024): 22–23. http://dx.doi.org/10.51202/2366-8040-2024-47-022.
Texto completo da fonteWilliam Stoten, David. "The Extended Project Qualification". International Journal for Lesson and Learning Studies 3, n.º 1 (20 de dezembro de 2013): 66–77. http://dx.doi.org/10.1108/ijlls-06-2013-0035.
Texto completo da fonteAbdullaiev, A., S. Bozhko, V. Krasnorutskyi, R. Latorre, V. Tatarinov, N. Shumkova e A. Shepitchak. "Ukraine Nuclear Fuel Qualification Project (UNFQP)". Nuclear and Radiation Safety, n.º 4(76) (17 de novembro de 2017): 3–10. http://dx.doi.org/10.32918/nrs.2017.4(76).01.
Texto completo da fonteXie, Zong Ren, Jian Wei Lv e Zhong Hua Liu. "Research on Reliability Qualification Test of Mechanical and Electric Equipment Onboard". Advanced Materials Research 605-607 (dezembro de 2012): 708–12. http://dx.doi.org/10.4028/www.scientific.net/amr.605-607.708.
Texto completo da fonteDordlofva, Christo, Olivia Borgue, Massimo Panarotto e Ola Isaksson. "Drivers and Guidelines in Design for Qualification Using Additive Manufacturing in Space Applications". Proceedings of the Design Society: International Conference on Engineering Design 1, n.º 1 (julho de 2019): 729–38. http://dx.doi.org/10.1017/dsi.2019.77.
Texto completo da fonteMoreau, S., J. Jourdon, S. Lhostis, D. Bouchu, B. Ayoub, L. Arnaud e H. Frémont. "Review—Hybrid Bonding-Based Interconnects: A Status on the Last Robustness and Reliability Achievements". ECS Journal of Solid State Science and Technology 11, n.º 2 (1 de fevereiro de 2022): 024001. http://dx.doi.org/10.1149/2162-8777/ac4ffe.
Texto completo da fonteBoginskaya, Zoya, e Tatyana Gladkova. "Accounting Reliability Concept: Audit Practices". Auditor 7, n.º 10 (3 de novembro de 2021): 33–39. http://dx.doi.org/10.12737/1998-0701-2021-7-10-33-39.
Texto completo da fonteMadison, B. J. C. "Reliabilists Should Still Fear the Demon". Logos & Episteme 12, n.º 2 (2021): 193–202. http://dx.doi.org/10.5840/logos-episteme202112213.
Texto completo da fonteGreen, Ronald, Aivars J. Lelis e Daniel B. Habersat. "Charge Trapping in Sic Power MOSFETs and its Consequences for Robust Reliability Testing". Materials Science Forum 717-720 (maio de 2012): 1085–88. http://dx.doi.org/10.4028/www.scientific.net/msf.717-720.1085.
Texto completo da fonteMorris, Seymour, e Preston MacDiarmid. "Reliability Growth Testing Effectiveness". Journal of the IEST 28, n.º 4 (1 de julho de 1985): 21–28. http://dx.doi.org/10.17764/jiet.1.28.4.c353w77743v27v43.
Texto completo da fonteRobles, James A. "The Systems Engineering Relationship between Qualification, Environmental Stress Screening and Reliability". SAE International Journal of Aerospace 2, n.º 1 (10 de novembro de 2009): 268–74. http://dx.doi.org/10.4271/2009-01-3274.
Texto completo da fonteStoltz, M. P., P. Burgaud, F. Murgadella, J. P. Hirtz, P. Petit e A. Vervoitte. "Reliability and qualification methodology of 60 W QCW linear bar arrays". Microelectronics Reliability 38, n.º 4 (abril de 1998): 689–96. http://dx.doi.org/10.1016/s0026-2714(97)00202-3.
Texto completo da fonteThompson, P. "Reliability development and qualification of a low-cost PQFP-based MCM". IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A 18, n.º 1 (março de 1995): 10–14. http://dx.doi.org/10.1109/95.370728.
Texto completo da fonteBora, Mumtaz Y. "fcLGA Package Assembly Qualification for Mobile Applications". International Symposium on Microelectronics 2018, n.º 1 (1 de outubro de 2018): 000115–20. http://dx.doi.org/10.4071/2380-4505-2018.1.000115.
Texto completo da fonteAdebola, Oladiji Alaba, Ayobami Oyelade Anthonia, Rukayat Oyebola Iwintolu e Emmanuel Opeyemi Amusan. "Qualification and ICT Knowledge as Predictors of Technical Subject Teaching Competence of Teachers in Osun State, Nigeria". Kampala International University Journal of Education 3, n.º 2 (14 de dezembro de 2023): 9–20. http://dx.doi.org/10.59568/kjed-2023-3-2-02.
Texto completo da fonteRamesham, Rajeshuni, Justin N. Maki e Gordon C. Cucullu. "Qualification Testing of Engineering Camera and Platinum Resistance Thermometer (PRT) Sensors for MSL Project Under Extreme Temperatures to Assess Reliability and to Enhance Mission Assurance". Journal of Microelectronics and Electronic Packaging 6, n.º 2 (1 de abril de 2009): 125–34. http://dx.doi.org/10.4071/1551-4897-6.2.125.
Texto completo da fonteBensoussan, Alain. "Microelectronic reliability models for more than moore nanotechnology products". Facta universitatis - series: Electronics and Energetics 30, n.º 1 (2017): 1–25. http://dx.doi.org/10.2298/fuee1701001b.
Texto completo da fonteIzvekov, Yu A., e M. Yu Narkevich. "QUALIFICATION METHOD FOR QUALITY ASSESSMENT OF METALLURGICAL FACILITIES". Izvestiya of Samara Scientific Center of the Russian Academy of Sciences 23, n.º 2 (2021): 42–45. http://dx.doi.org/10.37313/1990-5378-2021-23-2-42-45.
Texto completo da fonteNa, Ji-Hyun, e Chun-Sung Youn. "Perception of Waxing Practitioner Licensing System". Korean Society of Beauty and Art 21, n.º 3 (20 de setembro de 2020): 181–200. http://dx.doi.org/10.18693/jksba.2020.21.3.181.
Texto completo da fonteSuwanroj, Thamasan, Orawan Saeung, Punnee Leekitchwatana e Kanaporn Kaewkamjan. "Qualifications Framework of Essential Learning Outcomes for Computer Innovation and Digital Industry Professionals". International Journal of Information and Education Technology 13, n.º 2 (2023): 266–78. http://dx.doi.org/10.18178/ijiet.2023.13.2.1804.
Texto completo da fonteIbnatur Husnul, Nisak Ruwah, e Vivi Iswanti Nursyirwan. "GAMIFICATION-BASED ASSISTED LEARNING VIDEO DEVELOPMENT IN BASIC STATISTICS FOR DEAF STUDENTS". Daya Matematis: Jurnal Inovasi Pendidikan Matematika 10, n.º 3 (25 de dezembro de 2022): 185. http://dx.doi.org/10.26858/jdm.v10i3.37853.
Texto completo da fonteKim, Yong Sik, Seung Han Yang, Byung Sik Yoon e Hee Jong Lee. "Comparison between Conventional and Performance Demonstration UT Method by Round Robin Test". Key Engineering Materials 321-323 (outubro de 2006): 1754–57. http://dx.doi.org/10.4028/www.scientific.net/kem.321-323.1754.
Texto completo da fonteBack, Seung Jun, Young Kap Son, Jun Hee Kim e Jong Cheol Lee. "Reliability Qualification Test of a Unmanned Control Robot System for an Excavator". Transactions of the Korean Society of Mechanical Engineers A 39, n.º 4 (1 de abril de 2015): 397–403. http://dx.doi.org/10.3795/ksme-a.2015.39.4.397.
Texto completo da fonteTripathi, Shivendra, Hitesh M. Patel, Shrikant A. Patil, Deep Kumar Pandey, Ishwar Lal Prajapati, Chandresh N. Joshi, Rakesh S. Sharma e Rajkumar Arora. "Ceramic Column Grid Array Assembly Qualification and Reliability Analysis for Space Missions". IEEE Transactions on Components, Packaging and Manufacturing Technology 5, n.º 2 (fevereiro de 2015): 279–86. http://dx.doi.org/10.1109/tcpmt.2014.2383172.
Texto completo da fonteSamuel, Mathews P., Aditya Kumar Mishra e R. K. Mishra. "Additive Manufacturing of Ti-6Al-4V Aero Engine Parts: Qualification for Reliability". Journal of Failure Analysis and Prevention 18, n.º 1 (10 de janeiro de 2018): 136–44. http://dx.doi.org/10.1007/s11668-018-0393-9.
Texto completo da fonteHakim, Edward B. "DoD microcircuit qualification innovation–QML". Quality and Reliability Engineering International 6, n.º 1 (janeiro de 1990): 47–50. http://dx.doi.org/10.1002/qre.4680060109.
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