Literatura científica selecionada sobre o tema "Reliability qualification"
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Artigos de revistas sobre o assunto "Reliability qualification"
S., VELMOURUOGAN, DHAVACHELVAN P. e BASKARAN R. "Software Reliability Qualification Model". International Journal of Performability Engineering 8, n.º 4 (2012): 437. http://dx.doi.org/10.23940/ijpe.12.4.p437.mag.
Texto completo da fonteRegard, Charles, Christian Gautier, Hélène Fremont, Patrick Poirier, M. A. Xiaosong e Kaspar M. B. Jansen. "Fast reliability qualification of SiP products". Microelectronics Reliability 49, n.º 9-11 (setembro de 2009): 958–62. http://dx.doi.org/10.1016/j.microrel.2009.07.042.
Texto completo da fontePorter, Alex. "Accelerated Reliability Qualification in Automotive Testing". Quality and Reliability Engineering International 20, n.º 2 (25 de fevereiro de 2004): 115–20. http://dx.doi.org/10.1002/qre.619.
Texto completo da fonteReffiane, Fine, Choirul Huda, Mudzanatun Mudzanatun e Ferina Agustini. "ANALISIS DIFERENSIASI KARYA PADA KEMAMPUAN LITERASI SAINTEK MAHASISWA KEPENDIDIKAN UNIVERSITAS PGRI SEMARANG". Refleksi Edukatika : Jurnal Ilmiah Kependidikan 14, n.º 2 (28 de junho de 2024): 208–13. http://dx.doi.org/10.24176/re.v14i2.12498.
Texto completo da fonteHarry, C. C., e C. H. Mathiowetz. "ASIC reliability and qualification: a user's perspective". Proceedings of the IEEE 81, n.º 5 (maio de 1993): 759–67. http://dx.doi.org/10.1109/5.220906.
Texto completo da fonteRoush, M., e J. Maynes. "Saw devices: Space qualification and reliability issues". International Journal of Satellite Communications 7, n.º 4 (outubro de 1989): 361–71. http://dx.doi.org/10.1002/sat.4600070413.
Texto completo da fonteTIAN, XIJIN. "DC-DC CONVERTER RELIABILITY: DESIGN, COMPONENTS AND QUALIFICATION". International Journal of Reliability, Quality and Safety Engineering 12, n.º 05 (outubro de 2005): 459–74. http://dx.doi.org/10.1142/s021853930500194x.
Texto completo da fonteKlewer, Christian, Frank Kuechenmeister, Jens Paul, Dirk Breuer, Bjoern Boehme, Jae Kyu Cho, Simone Capecchi e Michael Thiele. "Package Qualification Envelope for 22FDX® Technology". International Symposium on Microelectronics 2019, n.º 1 (1 de outubro de 2019): 000169–75. http://dx.doi.org/10.4071/2380-4505-2019.1.000169.
Texto completo da fonteMikhaylenko, Leonid V., e Dmitry A. Shchelokov. "Digital discrete simulation model of profit formation taking into account the dynamics of cash flows, the level of reliability of launch vehicles and professional development of employees". Vestnik of Samara University. Economics and Management 14, n.º 4 (23 de janeiro de 2024): 221–31. http://dx.doi.org/10.18287/2542-0461-2023-14-4-221-231.
Texto completo da fonteDenney, Dennis. "Reliability Qualification Testing for Permanently Installed Wellbore Equipment". Journal of Petroleum Technology 52, n.º 10 (1 de outubro de 2000): 60–61. http://dx.doi.org/10.2118/1000-0060-jpt.
Texto completo da fonteTeses / dissertações sobre o assunto "Reliability qualification"
Matsumori, Barry Alan. "QUALIFICATION RESEARCH FOR RELIABLE, CUSTOM LSI/VLSI ELECTRONICS". Thesis, The University of Arizona, 1985. http://hdl.handle.net/10150/275313.
Texto completo da fonteDelage, Sylvain. "Développement d’une méthodologie de qualification de systèmes complexes par des essais de fiabilité". Thesis, Angers, 2018. http://www.theses.fr/2018ANGE0001/document.
Texto completo da fonteThe heating, ventilation and air conditioning (HVAC) field, as any other large industry, must control the reliability of its products in order to guarantee an optimal service to customers, reduce development limits and master its costs. To achieve it, predicted, experimental and operational reliability tools should be known and well applied. Only a strong methodology leading to a qualification strategy can ensure the holding of the reliability target. The first part of this work defines reliability terms and inventories existing methods in related fields and specifically in HVAC. Following that, the qualification methodology is detailed, focusing on feedback, definition of reliability targets and possible test plans. Finally, specific examples implemented at CIAT (UTC) are detailed in final part
Rahko, M. (Matti). "A qualification tool for component package feasibility in infrastructure products". Doctoral thesis, Oulun yliopisto, 2011. http://urn.fi/urn:isbn:9789514296819.
Texto completo da fonteTiivistelmä Työn tarkoituksena oli esittää uusi kvalifiointityökalu (QT) infrastruktuurituotteiden komponenttikoteloiden käytettävyyden arviointiin. Laitevalmistajien kehittäessä uusia pienempiä, ympäristöystävällisempiä ja kustannustehokkaampia laitteita asettavat he samalla vastaavia vaatimuksia myös komponenttikoteloille. Vastaavasti komponenttien valmistajat joutuvat kehittämään komponentteja ottamalla käyttöön uusia materiaaleja ja kotelorakenteita ja kvalifioimaan niiden ominaisuuksia asiakkaiden vaatimuksien mukaisesti. Laitevalmistajien riski uusien komponenttikoteloiden käyttöönotossa pystytään minimoimaan, kun komponenttikoteloiden kvalifiointi tehdään mahdollisimman aikaisessa vaiheessa. Kvalifioinnit tehdään yleensä kvalifiointiasiantuntijoiden tietotaidon perusteella. Tämä prosessi on kuitenkin perinteisesti hidas, joten nopeammalle arviointimenetelmälle on selkeä tarve. Työssä kehitettyyn kvalifiointityökaluun määritettiin kahdeksan arviointialuetta. Lisäksi sitä voidaan käyttää kolmella eri kvalifiontiperiaatteella. Näiden arviointialueiden huomioiminen kvalifiointiprosessin aikana parantaa selkeästi tuloksen luotettavuutta ja todenmukaisuutta. Työkalu on määritetty siten, että sitä voivat käyttää asiantuntijat avustavana kvalifiointityökaluna sekä suunnittelijat / komponentti-insinöörit alustavana kvalifiointityökaluna. Lisäksi sitä voidaan myös käyttää asiakasvaatimusten määrityksessä ja tiedonvälityksessä asiakkaan ja toimittajan välillä. QT:n kvalifiointialueiden määrittelyn ja toiminnallisuuden rakentamisen jälkeen, hyväksyntäkriteerit tutkittiin ja arvioitiin käyttäen 44 erilaista kaupallista komponenttikoteloa työkalun lopullisen hienosäädön tekemiseksi. Koska kvalifioinnin tiedot tallennetaan QT:n tietokantaan, pystyy laitevalmistajat hyödyntämään aikaisemmat historiatiedot tulevissa kvalifioinneissa. QT on ennen näkemätön työkalu, sillä markkinoilla ei ole vastaavia avoimen lähdekoodin kvalifiointityökaluja tarjolla, jota voidaan räätälöidä asiakkaan omien tarpeiden mukaisesti
Sohoin, Koffisse rodrigue. "Définition d’une méthodologie d’estimation de fiabilité et de qualification de systèmes mécanique en phase de développement". Thesis, Angers, 2020. http://www.theses.fr/2020ANGE0001.
Texto completo da fonteIn order to guarantee performance under customer conditions, reliability estimation is essential in all phases of product development. This task can be long and costly in the absence of an optimized approach, especially in a context where products are various. The work of this thesis is part of an optimization of the procedure of estimation and qualification of reliability during the development phases of mechanical subassemblies developed by FAURECIA company. To obtain a realistic estimate at the design phase, the proposed methodology incorporates the existing data (RETEX) on reference products in the predictive reliability estimation of new designs, the latter being traditionally carried out using numerical structural reliability methods. The integration of RETEX is performed by two proposed approaches. One using a similarity factor between experimental and numerical reliability, and the other using a time transfer function between experimental and numerical reliability. The proposed methodology allows building a better predictive reliability function, for a new design at the earliest stage of the development process, even before the prototype manufacturing phase. This makes it possible to anticipate the performance of the new product in order to make modifications if necessary, or to build prior information that will be important in a Bayesian reliability qualification plan optimization for the new product
Indmeskine, Fatima-Ezahra. "Evaluation et qualification de la fiabilité des composants et des procédés d’assemblages électroniques pour applications médicales". Electronic Thesis or Diss., Angers, 2024. http://www.theses.fr/2024ANGE0029.
Texto completo da fonteElectronics in AIMDs expose patients to risks in case of component failure. Unlike aeronautics, where redundancy is common, AIMDs face constraints like miniaturisation that hinder its application. Additionally, the "medical grade" of components lacks standardization, complicating qualification. The absence of specific standards and limited studies on AIMD environments makes mission profile development challenging. To address this, a state-of-the-art review defined a mission profile integrating environmental constraints critical for reliability tests, as these strongly influence component failures. A methodology based on the mission profile, FMMEA, experimental designs, and accelerated tests was developed to qualify SMD components, including resistors, ceramic capacitors, inductors, and integrated circuits. This solves two key issues: designing efficient accelerated tests to detect latent quality defects and demonstrating reliability aligned with the mission profile. This work is part of the R&D project "RECOME"
Ferraro, Rudy. "Development of Test Methods for the Qualification of Electronic Components and Systems Adapted to High-Energy Accelerator Radiation Environments". Thesis, Montpellier, 2019. http://www.theses.fr/2019MONTS118.
Texto completo da fonteThe Large Hadron Collider (LHC), the largest and most powerful in the world, started in 2008 and is the last stage of CERN's accelerator complex. The LHC consists in a 27-kilometer ring of superconducting magnets allowing to accelerate two beams up to 7 TeV before colliding them at 14 TeV in one of the five experiments monitoring the result of the collision. The LHC allowed notably the discovery of the Higgs boson and other baryonic particles predicted by the standard model. The radiation environment of the LHC and its injection lines is composed of different particles over a large spectrum of energies, from GeV level down to meV level (e.g. thermal neutron). The electronic equipment operating in such a harsh radiation environment, mostly based on Commercial Off The Shelf (COTS) components, can experience failures induced by radiation effects. The criticality of the equipment can be very high, in the best case, the failure of a control system can lead to a beam dump, which can drastically the availability of the beam for science and in the worst case, the failure of a safety system can lead to the destruction of part of the machine. The new upgrade of the LHC planned for 2025, the High Luminosity LHC (HL-LHC) will achieve an annual luminosity five time higher than the current version of the LHC. Consequently, the levels of the radiation generated by the operation of the machine will also drastically increase. With such high radiation levels, a significant number of COTS-based systems will be exposed to radiation levels they cannot withstand. This will imply to either design more robust tolerant COTS-based systems and/or substitute preventively systems before their end of life. Thus, while in the previous years the Single Event Effects (SEEs) where the dominant cause of failure, in the future, cumulative radiation effect will as well become a major preoccupation. While a huge effort has been done in the past on the qualification process against SEE-induced failures, the qualification process for cumulative radiation effects, remained mostly unchanged. The aim of this work was, therefore, to investigate how the CERN’s Radiation Hardness Assurance (RHA) could be improved to respond to this new challenge and ensure that no system failures will impact the LHC operations. This involved several activities; (i) the study of the particularities of the LHC radiative environment and its impact on the components and systems exposed to it, (ii) the study of the suitability of current qualification methods and the development of approaches adapted to CERN’s needs and (iii) the study of reliable system lifetime estimation methods
Croquet, Rémi. "Etude des dispersions et incertitudes en optimisation et dans l'analyse des valeurs propres". Phd thesis, INSA de Rouen, 2012. http://tel.archives-ouvertes.fr/tel-00740583.
Texto completo da fonteLivros sobre o assunto "Reliability qualification"
United States. Department of Defense., ed. Reliability testing for engineering development, qualification, and production. Washington, DC: Department of Defense, 1986.
Encontre o texto completo da fonteWohlgemuth, John. History of IEC qualification standards. Golden, Colo.]: National Renewable Energy Laboratory, 2011.
Encontre o texto completo da fonteC, Gupta D., Brown George A. 1937- e Conference on Gate Dielectric Integrity (1999 : San Jose, Calif.), eds. Gate dielectric integrity: Material, process, and tool qualification. West Conshocken, Pa: ASTM, 2000.
Encontre o texto completo da fonteUnited States. Department of Defense., ed. Military handbook: Reliability test methods, plans,and environments for engineering development, qualification,and production. Washington,D.C: Department of Defense, 1987.
Encontre o texto completo da fonteR, Lofaro, Brookhaven National Laboratory e U.S. Nuclear Regulatory Commission. Office of Nuclear Regulatory Research. Division of Engineering Technology., eds. Assessment of environmental qualification practices and condition monitoring techniques for low-voltage electric cables. Washington, DC: U.S. Nuclear Regulatory Commission, 2001.
Encontre o texto completo da fonteMyeyeryakova, Vyera, e Viktor Starodubov. CNC Metal-cutting Machines. ru: INFRA-M Academic Publishing LLC., 2015. http://dx.doi.org/10.12737/5721.
Texto completo da fonteFunctional issues and environmental qualification of digital protection systems of advanced light-water nuclear reactors. Washington, DC: Division of Engineering, Office of Nuclear Regulatory Research, U.S. Nuclear Regulatory Commission, 1994.
Encontre o texto completo da fonte(Editor), Dinesh C. Gupta, e George Albert Brown (Editor), eds. Gate Dielectric Integrity: Material, Process, and Tool Qualification (Astm Special Technical Publication// Stp) (Astm Special Technical Publication// Stp). ASTM International, 2000.
Encontre o texto completo da fonteTrepulė, Elena, Airina Volungevičienė, Margarita Teresevičienė, Estela Daukšienė, Rasa Greenspon, Giedrė Tamoliūnė, Marius Šadauskas e Gintarė Vaitonytė. Guidelines for open and online learning assessment and recognition with reference to the National and European qualification framework: micro-credentials as a proposal for tuning and transparency. Vytauto Didžiojo universitetas, 2021. http://dx.doi.org/10.7220/9786094674792.
Texto completo da fonteCapítulos de livros sobre o assunto "Reliability qualification"
Barman, Fariborz. "Reliability Qualification". In Semiconductor Product Engineering, Quality and Operations, 27–47. Cham: Springer International Publishing, 2022. http://dx.doi.org/10.1007/978-3-031-18030-9_2.
Texto completo da fonteHartzell, Allyson L., Mark G. da Silva e Herbert R. Shea. "Testing and Standards for Qualification". In MEMS Reliability, 215–52. Boston, MA: Springer US, 2010. http://dx.doi.org/10.1007/978-1-4419-6018-4_6.
Texto completo da fonteBirolini, Alessandro. "Qualification Tests for Components and Assemblies". In Reliability Engineering, 81–113. Berlin, Heidelberg: Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/978-3-662-05409-3_3.
Texto completo da fonteBirolini, Alessandro. "Qualification Tests for Components and Assemblies". In Reliability Engineering, 81–111. Berlin, Heidelberg: Springer Berlin Heidelberg, 2017. http://dx.doi.org/10.1007/978-3-662-54209-5_3.
Texto completo da fonteBirolini, Alessandro. "Qualification Tests for Components and Assemblies". In Reliability Engineering, 81–111. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-39535-2_3.
Texto completo da fonteBirolini, Alessandro. "Qualification Tests for Components and Assemblies". In Reliability Engineering, 81–113. Berlin, Heidelberg: Springer Berlin Heidelberg, 1999. http://dx.doi.org/10.1007/978-3-662-03792-8_3.
Texto completo da fonteBirolini*, Alessandro. "Qualification Tests for Components and Assemblies". In Reliability Engineering, 81–111. Berlin, Heidelberg: Springer Berlin Heidelberg, 2010. http://dx.doi.org/10.1007/978-3-642-14952-8_3.
Texto completo da fonteSmith, David J. "Design and Qualification Testing". In Reliability and Maintainability in Perspective, 72–79. London: Macmillan Education UK, 1988. http://dx.doi.org/10.1007/978-1-349-10140-5_8.
Texto completo da fonteBirolini, Alessandro. "Qualification Tests for Components and Assemblies". In Quality and Reliability of Technical Systems, 81–113. Berlin, Heidelberg: Springer Berlin Heidelberg, 1997. http://dx.doi.org/10.1007/978-3-642-97983-5_3.
Texto completo da fonteMizuishi, K., T. Kato, H. Inoue e H. Ishida. "InP-Based 4 × 4 Optical Switch Package Qualification and Reliability". In Semiconductor Device Reliability, 329–42. Dordrecht: Springer Netherlands, 1990. http://dx.doi.org/10.1007/978-94-009-2482-6_18.
Texto completo da fonteTrabalhos de conferências sobre o assunto "Reliability qualification"
Janny, Stephen. "U.S. Army Helicopter Structural Reliability and Fleet Failure Rate Requirement". In Vertical Flight Society 80th Annual Forum & Technology Display, 1–14. The Vertical Flight Society, 2024. http://dx.doi.org/10.4050/f-0080-2024-1088.
Texto completo da fonteRadojcic, R. "Universal Qualification- A Qualification Strategy for SUPERASIC's". In International Report on Wafer Level Reliability Workshop. IEEE, 1992. http://dx.doi.org/10.1109/iwlr.1992.658005.
Texto completo da fontePreussger, Andreas. "Strategy of Future Reliability Qualification". In 2006 IEEE International Integrated Reliability Workshop Final Report. IEEE, 2006. http://dx.doi.org/10.1109/irws.2006.305253.
Texto completo da fontePompe, Guido, Aleksandar Opacic e Ton Bolhaar. "Reliability qualification of optical connectors". In Photonics Europe, editado por Hans G. Limberger e M. John Matthewson. SPIE, 2004. http://dx.doi.org/10.1117/12.555271.
Texto completo da fonteOlney, Andrew. "Evolving MEMS qualification requirements". In 2010 IEEE International Reliability Physics Symposium. IEEE, 2010. http://dx.doi.org/10.1109/irps.2010.5488824.
Texto completo da fonteHalfpenny, Andrew, e Balaje T. Thumati. "Accelerating Fatigue Qualification Tests". In 2022 Annual Reliability and Maintainability Symposium (RAMS). IEEE, 2022. http://dx.doi.org/10.1109/rams51457.2022.9893962.
Texto completo da fonteKhalilzadeh-Rezaie, Farnood, e Angelo Miele. "Silicon photonics reliability and qualification standards". In Smart Photonic and Optoelectronic Integrated Circuits 2024, editado por Sailing He e Laurent Vivien. SPIE, 2024. http://dx.doi.org/10.1117/12.3001055.
Texto completo da fonteDuvvury, Charvaka. "Paradigm shift in ESD qualification". In 2008 IEEE International Reliability Physics Symposium (IRPS). IEEE, 2008. http://dx.doi.org/10.1109/relphy.2008.4558855.
Texto completo da fonteAntanius, Ghadeer, Rutvi Trivedi e Robert Kwasnick. "Platform qualification methodology: Face recognition". In 2015 IEEE International Reliability Physics Symposium (IRPS). IEEE, 2015. http://dx.doi.org/10.1109/irps.2015.7112709.
Texto completo da fonteChaparala, Prasad, Erhong Li e Sameer Bhola. "Reliability qualification of photovoltaic smart panel electronics". In 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010). IEEE, 2010. http://dx.doi.org/10.1109/ipfa.2010.5531993.
Texto completo da fonteRelatórios de organizações sobre o assunto "Reliability qualification"
Tamizhmani, Govindasamy. Reliability Evaluation of Concentrator Photovoltaic Modules per IEC Qualification Specifications. Office of Scientific and Technical Information (OSTI), dezembro de 2012. http://dx.doi.org/10.2172/1353049.
Texto completo da fonteSkow. PR-244-093703-R01 Uncertainties of In-line Inspection Crack Detection Tools Phases 1-2. Chantilly, Virginia: Pipeline Research Council International, Inc. (PRCI), outubro de 2014. http://dx.doi.org/10.55274/r0010828.
Texto completo da fonte