Literatura científica selecionada sobre o tema "Nanofocused X-Ray diffraction"
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Artigos de revistas sobre o assunto "Nanofocused X-Ray diffraction"
Ren, Zhe, Francesca Mastropietro, Anton Davydok, Simon Langlais, Marie-Ingrid Richard, Jean-Jacques Furter, Olivier Thomas et al. "Scanning force microscope forin situnanofocused X-ray diffraction studies". Journal of Synchrotron Radiation 21, n.º 5 (6 de agosto de 2014): 1128–33. http://dx.doi.org/10.1107/s1600577514014532.
Texto completo da fonteHruszkewycz, S. O., M. V. Holt, J. Maser, C. E. Murray, M. J. Highland, C. M. Folkman e P. H. Fuoss. "Coherent Bragg nanodiffraction at the hard X-ray Nanoprobe beamline". Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences 372, n.º 2010 (6 de março de 2014): 20130118. http://dx.doi.org/10.1098/rsta.2013.0118.
Texto completo da fonteNicolas, Jan-David, Tobias Reusch, Markus Osterhoff, Michael Sprung, Florian J. R. Schülein, Hubert J. Krenner, Achim Wixforth e Tim Salditt. "Time-resolved coherent X-ray diffraction imaging of surface acoustic waves". Journal of Applied Crystallography 47, n.º 5 (4 de setembro de 2014): 1596–605. http://dx.doi.org/10.1107/s1600576714016896.
Texto completo da fonteChayanun, Lert, Susanna Hammarberg, Hanna Dierks, Gaute Otnes, Alexander Björling, Magnus T. Borgström e Jesper Wallentin. "Combining Nanofocused X-Rays with Electrical Measurements at the NanoMAX Beamline". Crystals 9, n.º 8 (20 de agosto de 2019): 432. http://dx.doi.org/10.3390/cryst9080432.
Texto completo da fonteZaluzhnyy, Ivan, Ruslan Kurta, Marcus Scheele, Frank Schreiber, Boris Ostrovskii e Ivan Vartanyants. "Angular X-ray Cross-Correlation Analysis (AXCCA): Basic Concepts and Recent Applications to Soft Matter and Nanomaterials". Materials 12, n.º 21 (23 de outubro de 2019): 3464. http://dx.doi.org/10.3390/ma12213464.
Texto completo da fonteAbbey, Brian, Ruben A. Dilanian, Connie Darmanin, Rebecca A. Ryan, Corey T. Putkunz, Andrew V. Martin, David Wood et al. "X-ray laser–induced electron dynamics observed by femtosecond diffraction from nanocrystals of Buckminsterfullerene". Science Advances 2, n.º 9 (setembro de 2016): e1601186. http://dx.doi.org/10.1126/sciadv.1601186.
Texto completo da fonteBussone, Genziana, Rüdiger Schott, Andreas Biermanns, Anton Davydok, Dirk Reuter, Gerardina Carbone, Tobias U. Schülli, Andreas D. Wieck e Ullrich Pietsch. "Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beams". Journal of Applied Crystallography 46, n.º 4 (7 de junho de 2013): 887–92. http://dx.doi.org/10.1107/s0021889813004226.
Texto completo da fonteLi, Qian, Samuel D. Marks, Sunil Bean, Michael Fisher, Donald A. Walko, Anthony D. DiChiara, Xinzhong Chen et al. "Simultaneous scanning near-field optical and X-ray diffraction microscopy for correlative nanoscale structure–property characterization". Journal of Synchrotron Radiation 26, n.º 5 (15 de agosto de 2019): 1790–96. http://dx.doi.org/10.1107/s1600577519008609.
Texto completo da fonteWallentin, Jesper, Daniel Jacobsson, Markus Osterhoff, Magnus T. Borgström e Tim Salditt. "Bending and Twisting Lattice Tilt in Strained Core–Shell Nanowires Revealed by Nanofocused X-ray Diffraction". Nano Letters 17, n.º 7 (21 de junho de 2017): 4143–50. http://dx.doi.org/10.1021/acs.nanolett.7b00918.
Texto completo da fonteMarçal, Lucas A. B., Eitan Oksenberg, Dmitry Dzhigaev, Susanna Hammarberg, Amnon Rothman, Alexander Björling, Eva Unger, Anders Mikkelsen, Ernesto Joselevich e Jesper Wallentin. "In Situ Imaging of Ferroelastic Domain Dynamics in CsPbBr3 Perovskite Nanowires by Nanofocused Scanning X-ray Diffraction". ACS Nano 14, n.º 11 (19 de outubro de 2020): 15973–82. http://dx.doi.org/10.1021/acsnano.0c07426.
Texto completo da fonteTeses / dissertações sobre o assunto "Nanofocused X-Ray diffraction"
Anjum, Taseer. "Nanomechanics : mechanical response analysis of semiconductor GaAs nanowires by using finite element method and x-ray diffraction techniques". Electronic Thesis or Diss., Aix-Marseille, 2021. http://www.theses.fr/2021AIXM0173.
Texto completo da fonteDuring the last two decades, tremendous advances have been made in the miniaturization of opto-electronic devices and sensor-based nano-electromechanical systems by the integration of quasi one-dimensional nanowires. The present work focuses on the mechanical response analysis of semiconductor gallium arsenide (GaAs) nanowires grown on silicon substrate via molecular beam epitaxy. The mechanical behavior of the nanowires is characterized via in-situ bending tests in a scanning electron microscope and in combination with x-ray diffraction. The aim of this work is to identify the anelastic strain relaxation of the nanowires which was observed as a direct consequence of cantilever bending tests and buckling tests on free standing Be-doped GaAs nanowires. The anelastic strain is derived by using a digital image correlation algorithm. The agreement between FEM simulations and measured data conclusively relate the anelastic relaxation in the investigated nanowires to the Gorsky effect, i.e. the coupling between point defects diffusion and stress gradient. Be doped GaAs nanowires are further examined in the lateral three-point bending configuration by employing the Scanning Force Microscope for in situ Nanofocused X-ray diffraction (SFINX) and x-ray diffraction at beamline P23 at PETRA III. The bending of the nanowires was induced by the lateral movement of the tip of SFINX . The nanowires demonstrate elastic deformation, plastic deformation, and time-dependent anelastic relaxation. The anelastic relaxation yields a diffusion coefficient of 2.71 x 10 puissance -13 cm puissance 2 and is consistent with a Gorsky effect
Henkel, Thilo Johannes. "Strain-related phenomena in (In,Ga)N/GaN nanowires and rods investigated by nanofocus x-ray diffraction and the finite element method". Doctoral thesis, Humboldt-Universität zu Berlin, 2018. http://dx.doi.org/10.18452/18707.
Texto completo da fonteIn this thesis, nanofocus x-ray diffraction and the finite element method are applied to analyze the local strain field in (In,Ga)N/GaN nanowires and micro-rods which are discussed as candidates for a plethora of future optoelectronic applications. However, to improve and tailor their properties, a fundamental understanding on the level of individual objects is essential. In this spirit, the dependence of the vertical normal component, epsilon_zz, of the elastic strain tensor on the geometry of an axial (In,Ga)N/GaN nanowire is systematically analyzed using the finite element method. Hereby, it is found that if the ratio of nanowire radius and (In,Ga)N segment length approaches unity, a significantly negative epsilon_zz value is observed. This stands in stark contrast to naive expectations and shows that the common knowledge about planar systems where epsilon_zz would always be greater or equal zero cannot easily be translated to nanowires with an equivalent material sequence. As the origin of this effect significant shear strains are discussed which go along with a convex deformation of the outer surface resulting in a highly complex strain distribution. The increased active area of core-shell (In,Ga)N/GaN micro-rods makes them promising candidates for next-generation light emitting diodes. However, it is found that the emission wavelength is significantly red-shifted along the rod height. To shed light on the origin of this phenomenon, nanofocus x-ray diffraction is applied to analyze the local strain field. Due to the high spatial resolution it is possible to investigate the strain field within individual side-facets and to detect a significant gradient along the rod height. Based on the deformation field simulated using the finite element method and subsequent kinematic scattering simulations it is possible to translate the strain state into an In content.
Henkel, Thilo Johannes [Verfasser], Henning [Gutachter] Riechert, Thomas [Gutachter] Schröder e Martin [Gutachter] Schmidbauer. "Strain-related phenomena in (In,Ga)N/GaN nanowires and rods investigated by nanofocus x-ray diffraction and the finite element method / Thilo Johannes Henkel ; Gutachter: Henning Riechert, Thomas Schröder, Martin Schmidbauer". Berlin : Humboldt-Universität zu Berlin, 2018. http://d-nb.info/1185579362/34.
Texto completo da fonteHenkel, Thilo [Verfasser], Henning [Gutachter] Riechert, Thomas [Gutachter] Schröder e Martin [Gutachter] Schmidbauer. "Strain-related phenomena in (In,Ga)N/GaN nanowires and rods investigated by nanofocus x-ray diffraction and the finite element method / Thilo Johannes Henkel ; Gutachter: Henning Riechert, Thomas Schröder, Martin Schmidbauer". Berlin : Humboldt-Universität zu Berlin, 2018. http://d-nb.info/1185579362/34.
Texto completo da fonteTrabalhos de conferências sobre o assunto "Nanofocused X-Ray diffraction"
Lidzey, David G. "Mapping structural properties of lead halide perovskites by scanning nanofocus x-ray diffraction (Conference Presentation)". In Organic, Hybrid, and Perovskite Photovoltaics XVIII, editado por Kwanghee Lee, Zakya H. Kafafi e Paul A. Lane. SPIE, 2017. http://dx.doi.org/10.1117/12.2275741.
Texto completo da fonte