Literatura científica selecionada sobre o tema "Microscopie à balayage à force"
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Artigos de revistas sobre o assunto "Microscopie à balayage à force"
Azzoug, Asma. "Elaboration et caractérisation des couches minces d'oxyde de cuivre : Application à la photo-dégradation de Méthyle Orange". Journal of Physical & Chemical Research 1, n.º 1 (1 de junho de 2022): 57–71. http://dx.doi.org/10.58452/jpcr.v1i1.32.
Texto completo da fonteFellah, Mamoun, Linda Aissani, Alain Iost, Amel Zairi, Alex Montagne e Alberto Mejias. "Comportement à l’usure et au frottement de deux biomatériaux AISI 316L et Ti-6Al-7Nb pour prothèse totale de hanche". Matériaux & Techniques 106, n.º 4 (2018): 402. http://dx.doi.org/10.1051/mattech/2018051.
Texto completo da fonteSchmid, Rudolf, J. Wuest, D. Jeanmonod, M. Figeat-Hug e R. Palese. "Morphologie florale: En microscopie electronique a balayage". Taxon 38, n.º 3 (agosto de 1989): 452. http://dx.doi.org/10.2307/1222292.
Texto completo da fonteLasquellec, V., J. Marcq, M. Sbaï, R. Filmon, T. Q. Nguyen, F. De Nardi e M. Pontié. "Nouvelle stratégie antibiofilm par dépôt LBL d’un polyélectrolyte cationique sur la membrane de dialyse anionique AN69". Revue des sciences de l'eau 20, n.º 2 (16 de maio de 2007): 175–83. http://dx.doi.org/10.7202/015811ar.
Texto completo da fonteSauvalle, A., e J. Izard. "Etude Comparee Du Meme Spermatozoide En Microscopie Optique Et En Microscopie Electronique A Balayage". Biology of the Cell 75, n.º 3 (janeiro de 1992): 266. http://dx.doi.org/10.1016/0248-4900(92)90183-2.
Texto completo da fonteBryon, P. A., R. Delorme e C. Souchier. "La microscopie confocale à balayage laser et ses applications hématologiques". Revue Française des Laboratoires 1995, n.º 275 (abril de 1995): 37–43. http://dx.doi.org/10.1016/s0338-9898(95)80059-x.
Texto completo da fonteRiviere, M., M. Rautureau, G. Besson, M. Steinberg e M. Amouri. "Complementarite des rayons X et de la microscopie electronique pour la determination des diverses phases d'une argile zincifere". Clay Minerals 20, n.º 1 (março de 1985): 53–67. http://dx.doi.org/10.1180/claymin.1985.020.1.05.
Texto completo da fonteFu, Bin, Huaye Jiang, Yanjun Che, Huilin Yang e Zongping Luo. "Microanatomie du corps vertébral lombaire au moyen de la microscopie électronique à balayage". Revue de Chirurgie Orthopédique et Traumatologique 106, n.º 4 (junho de 2020): 412. http://dx.doi.org/10.1016/j.rcot.2020.03.015.
Texto completo da fonteKahn, E. "Imagerie spectrale et analyse de séquences d’images en microscopie confocale à balayage laser". IRBM 28, n.º 3-4 (setembro de 2007): 107–16. http://dx.doi.org/10.1016/j.rbmret.2007.07.002.
Texto completo da fonteMortier, Eric, Stéphanie Jager, David Gerdolle e Abdesselam Dahoun. "La microscopie électronique à balayage environnementale : application à l’observation des tissus dentaires minéralisés". Actualités Odonto-Stomatologiques, n.º 255 (setembro de 2011): 221–29. http://dx.doi.org/10.1051/aos/2011305.
Texto completo da fonteTeses / dissertações sobre o assunto "Microscopie à balayage à force"
Lavigne, Claude. "Etude et réalisation d'un nouvel ensemble microscopique à effet tunnel et microscope à force atomique". Châtenay-Malabry, Ecole centrale de Paris, 1993. http://www.theses.fr/1993ECAP0334.
Texto completo da fonteHaenssler, Olaf Christian. "Multimodal sensing and imaging technology by integrated scanning electron, force, and near-field microwave microscopy and its application to submicrometer studies". Thesis, Lille, 2018. http://www.theses.fr/2018LIL1I006.
Texto completo da fonteVarious disciplines of micro- and nanotechnology requires combinatorial tools for the investigation, manipulation and transport of materials in the submicrometer range. The coupling of multiple sensing and imaging techniques allows for obtaining complementary and often unique datasets of samples under test. By means of an integrated microscopy technique with different modalities, it is possible to gain multiple information about nanoscale samples by recording at the same time. The expansion with nanorobotics and an open-source software framework, leads to a technology approach for semiconductor research and material science. This work shows the potential of such a multimodal technology approach by focusing on a demonstrator setup. It operates under high-vacuum conditions inside the chamber of a Scanning Electron Microscope and serves as a technology platform by fusing various microscopy modalities, techniques and processes. An Atomic Force Microscope based on a compact, optical interferometer performs imaging of surface topography, and a Scanning Microwave Microscope records electromagnetic properties in the microwave frequency domain, both operating inside an SEM. A software framework controls the instrument. The setup allows for observing with SEM, while imaging and characterizing with interacting evanescent microwaves and intermolecular forces simultaneously. In addition, a multimodal test standard is introduced and subsequently confirms the functionality of the demonstrator. Within this context, the work also includes an electrical analysis of micro-scale MOS capacitors, including an approximation for use in the calibration
Pascal, Hubert, e Jean-Michel Martin. "Modification des surfaces par frottement : apport des techniques de microscopie à force atomique et à balayage électronique". Ecully, Ecole centrale de Lyon, 1994. http://www.theses.fr/1994ECDL0042.
Texto completo da fonteThe atomic force (AFM) and lateral force microscope (LFM) allow respectively to achieve, in the real space, topographic images and lateral images of various materials. The resolution is uncommon and reach the atomic scale. This study has two main purposes. The first is to locale the AFM in comparison with others techniques of surfaces observation. The second is to use at room temperature a LFM as a micro-tribometer with in order to investigate the friction and wear phenomenas at nano-scale. First, from wear macroscopic tracks made by classic tribologic test on a ceramic (the polycristalline silicon carbide) and on a sputtered film (the molybdenum disulphide), we show that AFM confirms and completes the observations achieved by optical or electronic beam microscopy. The restored contrast by a technique allow to alleviate the artefacts and the doubt of each others. To understand the origin of the very weak coefficient of friction (0. 001) of MoS2 deposits, the investigations has been continued at atomic scale. They confirm certain hypothesis built up from thin films observations (TEM, HRTEM. . . ) concerning the role of the crystalline structure in superlubricity of MoS2. Second, the literature having revealed that the information is dependent on the apparatus (tip, lever,. . . ) and the physics of contact, we model the LFM mechanical structure to understand and to reduce the apparatus influence on the measurements, in order to focus them on the physics distortion. The contact study exhibits role of the surface morphology in lateral force measurements. This force is made of one interfacial component induced by friction and a local one linked to topography. This distinction is the starting point of two suggested calibration procedure in lateral force. After, we are interested in the friction component influence on the image resolution. For that, we modify the surface physicochemistry of pure silica and cobalt metallic deposit by working in liquid environment (water, oil, alcohol. . . ). A friction consequence is a very weak wear at nano-scale. To investigate the wear process at this scale, we adapt to LFM a triboscopic method
WANG, ZHONGHUAI. "Developpement d'un microscope a force atomique multifonctionnel associe a un microscope electronique a balayage". Reims, 1997. http://www.theses.fr/1997REIMS005.
Texto completo da fonteFriedt, Jean-Michel. "Etude et réalisation d'un micro-nano manipulateur avec retour de force : contribution à son intégration dans une plate-forme multicapteurs". Besançon, 2000. https://tel.archives-ouvertes.fr/tel-00509641.
Texto completo da fonteDeumié-Raviol, Carole. "Ellipsométrie sur champ diffus et analyse multi-échelle de la microstructure des multicouches optiques : diffusion lumineuse, microscopie à force atomique, microscopie à effet tunnel optique". Aix-Marseille 3, 1997. http://www.theses.fr/1997AIX30087.
Texto completo da fonteRastei, Mircea-Vasile. "Assembly of controlled-size Co nanoparticles on surfaces and their local characterisation by means of field-dependent magnetic force microscopy and scanning tunnelling spectroscopy". Université Louis Pasteur (Strasbourg) (1971-2008), 2006. http://www.theses.fr/2006STR13139.
Texto completo da fonteTison, Yann. "Chimie d'insertion et de substitution dans les disulfures de métaux de transition : études expérimentales (spectroscopie photoélectronique à rayonnement X, microscopies à champ proche) et théoriques". Chimie Physique, 2003. http://www.theses.fr/2003PAUU3025.
Texto completo da fonteIn this work, the study of model structure aims to contribute to a better understanding of insertion and substitution in solid-state chemistry. Our approach is based on the analysis of data provided by X-ray photoelectron spectroscopy and scanning probe microscopy, with the help of electronic structure calculations. The first part of this document is devoted to the inserted compounds M1/4TiS2 (M = Fe, Co, Ni). We show that their electronic structure strongly depends on the nature of the inserted species. These different behaviours are due to different guest-host interactions, according to the nature of the inserted metal. In the second part, we present the study of the solid solutions TixTa1-xS2 (0RxR1). The obtained results lead us to propose: - A random dispersion of the minor metal for the low-substituted compounds (xR0. 2 or xS0. 8); - An organization in domains of TiS2 and TaS2 for the intermediate compositions
Crouzier, Loïc. "Développement d'une nouvelle approche hybride combinant AFM et MEB pour la métrologie dimensionnelle des nanoparticules". Thesis, Poitiers, 2020. http://www.theses.fr/2020POIT2260.
Texto completo da fonteIn order to take advantages of remarkable properties of the nanomaterials related to their size but also assess their potential risks, industrial actors need to rely on robust measurement methods that provide all the required dimensional information. However, there is no instrument capable of measuring a nanoparticle in all three dimensions of space with controlled uncertainty. The aim of this work is to combine diameter measurements by scanning electron microscopy (SEM) with height measurements by atomic force microscopy (AFM). The use of silica particles, supposedly spherical, allows to validate this hybrid approach combining AFM and SEM. First, the uncertainty budget associated with the measurement of nanoparticles by SEM was established. We have demonstrated that the main contribution to the uncertainty budget is the size of the electron beam, which is difficult to measure. Two methods, based on Monte Carlo modelling, have been developed to evaluate the influence of this parameter on the SEM measurement. The first is based on the comparison between experimental and simulated signals. The second is based on the segmentation of the SEM images using a remarkable point, not influenced by the dimensions of the electron beam. These two methods have shown that the error related to the beam size is largely overestimated using conventional image segmentation tools. From these results, a direct comparison of AFM and SEM measurements was performed on the same particles. A systematic discrepancy was observed between the two techniques for the smallest particles related to their non-sphericity. The use of a third technique, transmission electron microscopy (TEM), confirms these observations. Finally, the hybrid approach has been implemented for measuring the three characteristic dimensions of the complex-shaped nano-objects with very non-spherical morphology
Braga, Delfin. "Etude des phénomènes de charge des matériaux isolants sous faisceau d'électrons de basse énergie (200 eV-30 keV)". Paris 11, 2003. https://tel.archives-ouvertes.fr/tel-00004341.
Texto completo da fonteCharging phenomena of insulating materials were studied thanks to a scanning electron microscope which allows the injection of few electrons doses in a large domain of energies and the measurements of the secondary electron emission and the induced current created in the sample holder by the charges generated in the sample. The results shown that the secondary electron emission yield is a very sensitive parameter to characterise the charging state of an insulator and they allowed to class these materials in two groups relatively to their ability to relax the generated charges: the "trapping insulators", presenting high resistivities, in which the charges are trapped in a stable way during several months and the "conductive insulators", presenting lower resistivities than the "trapping" ones, in which the charges relaxation occurs more or less rapidly depending on the density and the mobility of intrinsic charges of the material. The fundamental parameter controlling the charging kinetic is the current density J0. For "trapping insulators", different regimes (self-regulated, ageing, degradation) function of J0 and the domain of energy considered were observed. The study of "conductive insulators" revealed that a permanent current exist in these materials which is characterised by a steady state yield [sigma]∞ which fix the maximum value of J0 withstanding by a "conductive" without charge accumulation beneath its surface. These results allowed to define what kind of materials should be used from an electrical angle to reduce indeed to cancel the deviation of electrons due to spacers in field emission displays, and also to introduce a new characterisation process of the internal field created by thermal poling in glasses samples. We also developed a new exploration way of spatial and time evolution of trapped charges in "trapping insulators" thanks to an electrostatic force microscope. Firsts results show the very high stability of trapped charges in these materials
Livros sobre o assunto "Microscopie à balayage à force"
Scanning force microscopy: With applications to electric, magnetic, and atomic forces. New York: Oxford University Press, 1991.
Encontre o texto completo da fonteSarid, Dror. Scanning force microscopy: With applications to electric, magnetic, and atomic forces. New York: Oxford University Press, 1994.
Encontre o texto completo da fonteJ, Bard Allen, e Mirkin Michael V. 1961-, eds. Scanning electrochemical microscopy. New York: Marcel Dekker, 2001.
Encontre o texto completo da fonteJ, Drelich, e Mittal K. L. 1945-, eds. Atomic force microscopy in adhesion studies. Utrecht: VSP, 2005.
Encontre o texto completo da fonteM, Motta Pietro, e Malpighi Marcello 1628-1694, eds. Cells and tissues: A three-dimensional approach by modern techniques in microscopy : a celebrative symposium--the Opera omnia of Marcello Malpighi : proceedings of the VIIIth International Symposium on Morphological Sciences, held in Rome, Italy, July 10-15, 1988. New York: Liss, 1989.
Encontre o texto completo da fonteReimer, Ludwig. Scanning electron microscopy: Physics of image formation and microanalysis. 2a ed. Berlin: Springer, 1998.
Encontre o texto completo da fonteScanning electron microscopy: Physics of image formation and microanalysis. Berlin: Springer-Verlag, 1985.
Encontre o texto completo da fonteR, Oltra, European Federation of Corrosion e Institute of Materials, Minerals, and Mining., eds. Local probe techniques for corrosion research. Cambridge: Woodhead for European Federation of Corrosion on behalf of Institute of Materials, Minerals & Mining, 2007.
Encontre o texto completo da fonteScanning probe microscopes: Applications in science and technology. Boca Raton, FL: CRC Press, 2002.
Encontre o texto completo da fonteScanning electrochemical microscopy. 2a ed. Boca Raton, FL: CRC Press, 2012.
Encontre o texto completo da fonteCapítulos de livros sobre o assunto "Microscopie à balayage à force"
Brisset, François, Florence Robaut, Guillaume Wille, Philippe Jonnard, Jacky Ruste, Denis Boivin, Georges Slodzian, D. Blavette e E. Cadel. "16 . Division Groupement National de Microscopie Électronique à Balayage et microAnalyse (GN-MEBA)". In Les 150 ans de la Société Française de Physique, 257–65. EDP Sciences, 2023. http://dx.doi.org/10.1051/978-2-7598-3076-3.c017.
Texto completo da fonte