Artigos de revistas sobre o tema "Metallized film capacitor"
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Jia Zhanqiang, 贾占强, 蔡金燕 Cai Jinyan, 梁玉英 Liang Yuying e 韩春辉 Han Chunhui. "Reliability assessment of metallized film pulse capacitor". High Power Laser and Particle Beams 23, n.º 1 (2011): 272–76. http://dx.doi.org/10.3788/hplpb20112301.0272.
Texto completo da fonteVuillermet, Y., O. Chadebec, J. M. Lupin, A. Saker, G. Meunier e J. L. Coulomb. "Optimization of Low-Voltage Metallized Film Capacitor Geometry". IEEE Transactions on Magnetics 43, n.º 4 (abril de 2007): 1569–72. http://dx.doi.org/10.1109/tmag.2007.892473.
Texto completo da fonteHo, Janet, T. Jow e Steven Boggs. "Implications of advanced capacitor dielectrics for performance of metallized film capacitor windings". IEEE Transactions on Dielectrics and Electrical Insulation 15, n.º 6 (dezembro de 2008): 1754–60. http://dx.doi.org/10.1109/tdei.2008.4712681.
Texto completo da fonteDu, Guoqiang, e Jie Zhang. "Capacitance Evaluation of Metallized Polypropylene Film Capacitors Considering Cumulative Self-Healing Damage". Electronics 13, n.º 14 (22 de julho de 2024): 2886. http://dx.doi.org/10.3390/electronics13142886.
Texto completo da fonteLi Hua, Lin Fuchang, Zhong Heqing, Dai Ling, Han Yongxia e Kong Zhonghua. "Study on Metallized Film Capacitor and Its Voltage Maintaining Performance". IEEE Transactions on Magnetics 45, n.º 1 (janeiro de 2009): 327–30. http://dx.doi.org/10.1109/tmag.2008.2008863.
Texto completo da fonteChen Yaohong, 陈耀红, 章妙 Zhang Miao, 李化 Li Hua, 林福昌 Lin Fuchang, 李智威 Li Zhiwei, 吕霏 Lü Fei e 刘德 Liu De. "Insulation resistance characteristics of metallized film capacitor under high electric field". High Power Laser and Particle Beams 24, n.º 4 (2012): 797–800. http://dx.doi.org/10.3788/hplpb20122404.0797.
Texto completo da fonteKong, M. G., e Y. P. Lee. "Impact of surface discharge plasmas on performance of a metallized film capacitor". Journal of Applied Physics 90, n.º 6 (15 de setembro de 2001): 3069–78. http://dx.doi.org/10.1063/1.1389072.
Texto completo da fonteLi, Hua, Yaohong Chen, Fuchang Lin, Bo Peng, Fei Lv, Miao Zhang e Zhiwei Li. "The capacitance loss mechanism of metallized film capacitor under pulsed discharge condition". IEEE Transactions on Dielectrics and Electrical Insulation 18, n.º 6 (dezembro de 2011): 2089–94. http://dx.doi.org/10.1109/tdei.2011.6118648.
Texto completo da fonteDai, Xiying, Zhaoliang Xing, Wei Yang, Chong Zhang, Fei Li, Xin Chen, Chen Li, Jianjun Zhou e Lin Li. "The Effect of Annealing on the Structure and Electric Performance of Polypropylene Films". International Journal of Polymer Science 2022 (8 de novembro de 2022): 1–12. http://dx.doi.org/10.1155/2022/5970484.
Texto completo da fonteYoon, Jung-Rag, Young-Kwang Kim, Serk-Won Lee e Heun-Young Lee. "The Design and Reliability Evaluation of Metallized Film Capacitor for Power Electronic Applications". Journal of the Korean Institute of Electrical and Electronic Material Engineers 24, n.º 5 (1 de maio de 2011): 381–86. http://dx.doi.org/10.4313/jkem.2011.24.5.381.
Texto completo da fontePeng, Bao Hua, J. L. Zhou e Jing Feng. "Product Reliability Assessment Method Combining Degradation Data and Lifetime Data". Advanced Materials Research 44-46 (junho de 2008): 795–802. http://dx.doi.org/10.4028/www.scientific.net/amr.44-46.795.
Texto completo da fonteTai, Yunxiao, Pengqi Chen, Yang Jian, Qingqing Fang, Dang Xu e Jigui Cheng. "Failure mechanism and life estimate of metallized film capacitor under high temperature and humidity". Microelectronics Reliability 137 (outubro de 2022): 114755. http://dx.doi.org/10.1016/j.microrel.2022.114755.
Texto completo da fonteZhang, Yong-Xin, Qi-Kun Feng, Shao-Long Zhong, Jia-Yao Pei, Fang-Yi Chen, Guan-Nan He e Zhi-Min Dang. "Digital twin accelerating development of metallized film capacitor: Key issues, framework design and prospects". Energy Reports 7 (novembro de 2021): 7704–15. http://dx.doi.org/10.1016/j.egyr.2021.10.116.
Texto completo da fonteLv, Chunlin, Jinjun Liu, Yan Zhang, Wanjun Lei e Rui Cao. "An improved lifetime prediction method for metallized film capacitor considering harmonics and degradation process". Microelectronics Reliability 114 (novembro de 2020): 113892. http://dx.doi.org/10.1016/j.microrel.2020.113892.
Texto completo da fonteQi, Xiaoguang, e Steven Boggs. "Electrothermal failure of metallized film capacitor end connections–computation of temperature rise at connection spots". Journal of Applied Physics 94, n.º 7 (outubro de 2003): 4449–56. http://dx.doi.org/10.1063/1.1602947.
Texto completo da fonteChen, Yaohong, Hua Li, Fuchang Lin, Fei Lv, Miao Zhang, Zhiwei Li e De Liu. "Study on Self-Healing and Lifetime Characteristics of Metallized-Film Capacitor Under High Electric Field". IEEE Transactions on Plasma Science 40, n.º 8 (agosto de 2012): 2014–19. http://dx.doi.org/10.1109/tps.2012.2200699.
Texto completo da fonteH. Lean, Meng, e Wei-Ping L. Chu. "Simulation of charge packet formation in layered polymer film". COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering 33, n.º 4 (1 de julho de 2014): 1396–415. http://dx.doi.org/10.1108/compel-09-2013-0291.
Texto completo da fonteQi, Xiaoguang, e Steven Boggs. "Transient finite element computation of the temperature rise in metallized film capacitor end connections caused by underdamped discharge". IEEE Transactions on Dielectrics and Electrical Insulation 15, n.º 1 (2008): 277–83. http://dx.doi.org/10.1109/t-dei.2008.4446761.
Texto completo da fonteDonhowe, Mark, Jeff Lawler, Sean Souffie e E. Lee Stein. "250°C Operating Temperature Dielectric Film Capacitors". Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2011, HITEN (1 de janeiro de 2011): 000201–6. http://dx.doi.org/10.4071/hiten-paper2-mdonhowe.
Texto completo da fonteRevenok, T. V., V. V. Sleptsov e A. O. Diteleva. "Research of electrode materials for the creation of multifunctional current sources with increased capacity as a components of the energy sector of an efficient urban environment". Construction Materials, n.º 9 (9 de outubro de 2024): 63–69. http://dx.doi.org/10.31659/0585-430x-2024-828-9-63-69.
Texto completo da fonteRytöluoto, Ilkka, Minna Niittymäki, Paolo Seri, Hadi Naderiallaf, Kari Lahti, Eetta Saarimäki, Timo Flyktman e Mika Paajanen. "Biaxially oriented silica–polypropylene nanocomposites for HVDC film capacitors: morphology-dielectric property relationships, and critical evaluation of the current progress and limitations". Journal of Materials Chemistry A 10, n.º 6 (2022): 3025–43. http://dx.doi.org/10.1039/d1ta10336a.
Texto completo da fonteLi Hua, 李化, 陈耀红 Chen Yaohong, 林福昌 Lin Fuchang e 彭波 Peng Bo. "Lifetime characteristics of metallized film pulsed capacitors". High Power Laser and Particle Beams 22, n.º 4 (2010): 773–76. http://dx.doi.org/10.3788/hplpb20102204.0773.
Texto completo da fonteJoubert, Ch, A. Béroual e G. Rojat. "Asymmetrical current distribution in metallized film capacitors". Journal of Applied Physics 95, n.º 11 (junho de 2004): 6420–25. http://dx.doi.org/10.1063/1.1712009.
Texto completo da fonteOstrowski, Jörg, Ralf Hiptmair e Henning Fuhrmann. "Electric 3D‐simulation of metallized film capacitors". COMPEL - The international journal for computation and mathematics in electrical and electronic engineering 26, n.º 2 (10 de abril de 2007): 524–43. http://dx.doi.org/10.1108/03321640710727836.
Texto completo da fonteBelko, Victor, Ivan Ivanov, Andrey Plotnikov e Valery Belanov. "Energy characteristics of self-healing process in metallized film capacitors". E3S Web of Conferences 140 (2019): 02006. http://dx.doi.org/10.1051/e3sconf/201914002006.
Texto completo da fonteSilvus, Stan, e Kenneth Cook. "Useful Technique for Analysis of Fluid-Filled Capacitors". EDFA Technical Articles 9, n.º 2 (1 de maio de 2007): 6–12. http://dx.doi.org/10.31399/asm.edfa.2007-2.p006.
Texto completo da fonteKong, M. G., e Y. P. Lee. "Electrically induced heat dissipation in metallized film capacitors". IEEE Transactions on Dielectrics and Electrical Insulation 11, n.º 6 (dezembro de 2004): 1007–13. http://dx.doi.org/10.1109/tdei.2004.1387824.
Texto completo da fonteTortai, J. H., A. Denat e N. Bonifaci. "Self-healing of capacitors with metallized film technology:". Journal of Electrostatics 53, n.º 2 (agosto de 2001): 159–69. http://dx.doi.org/10.1016/s0304-3886(01)00138-3.
Texto completo da fonteGodec, M., Dj Mandrino e M. Gaberšček. "Investigation of performance degradation in metallized film capacitors". Applied Surface Science 273 (maio de 2013): 465–71. http://dx.doi.org/10.1016/j.apsusc.2013.02.063.
Texto completo da fonteKim, Namhun, Changju Park, Sangshin Kwak e Jeihoon Baek. "Experimental Comparisons and Evaluations of Different Types of DC-link Capacitors for VSI-Based Electric Compressors in Battery Electric Vehicle Systems". Electronics 9, n.º 8 (8 de agosto de 2020): 1276. http://dx.doi.org/10.3390/electronics9081276.
Texto completo da fonteKong, Zhong Hua, Li Gang Wu, Chun Ya Tong e Zai Fei Luo. "Calculation of Self-Healing Contract Resistance of Metallized Film". Applied Mechanics and Materials 615 (agosto de 2014): 236–39. http://dx.doi.org/10.4028/www.scientific.net/amm.615.236.
Texto completo da fontePicci, G., e M. Rabuffi. "Pulse handling capability of energy storage metallized film capacitors". IEEE Transactions on Plasma Science 28, n.º 5 (2000): 1603–6. http://dx.doi.org/10.1109/27.901241.
Texto completo da fonteBelko, Victor, Dmitry Glivenko, Oleg Emelyanov, Ivan Ivanov e Andrey Plotnikov. "Current Pulse Polarity Effect on Metallized Film Capacitors Failure". IEEE Transactions on Plasma Science 45, n.º 6 (junho de 2017): 1020–25. http://dx.doi.org/10.1109/tps.2017.2703947.
Texto completo da fonteLi, Zhiwei, Hua Li, Fuchang Lin, Yaohong Chen, De Liu, Bowen Wang, Haoyuan Li e Qin Zhang. "Lifetime investigation and prediction of metallized polypropylene film capacitors". Microelectronics Reliability 53, n.º 12 (dezembro de 2013): 1962–67. http://dx.doi.org/10.1016/j.microrel.2013.06.005.
Texto completo da fonteNa, J. G. "New method to predict corrosion characteristics of Zn‐metallized thin films for film capacitors". Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 13, n.º 6 (novembro de 1995): 2739–41. http://dx.doi.org/10.1116/1.579697.
Texto completo da fonteXiao, Meng, Mengdie Zhang, Haoliang Liu, Boxue Du e Yawei Qin. "Dielectric Property and Breakdown Strength Performance of Long-Chain Branched Polypropylene for Metallized Film Capacitors". Materials 15, n.º 9 (23 de abril de 2022): 3071. http://dx.doi.org/10.3390/ma15093071.
Texto completo da fonteWang Wenjuan, 王文娟, 李化 Li Hua, 李智威 Li Zhiwei, 童勇 Tong Yong e 林福昌 Lin Fuchang. "Lifetime improvement of metallized film capacitors by inner pressure strengthening". High Power Laser and Particle Beams 26, n.º 4 (2014): 45015. http://dx.doi.org/10.3788/hplpb20142604.45015.
Texto completo da fonteBelko, Victor O., Oleg A. Emelyanov, Ivan O. Ivanov, Andrey P. Plotnikov e Efrem G. Feklistov. "Application of Numerical Simulation for Metallized Film Capacitors Electrodes Design". IEEE Access 9 (2021): 80945–52. http://dx.doi.org/10.1109/access.2021.3085695.
Texto completo da fonteBelko, V. O., D. Y. Glivenko, O. A. Emelyanov e I. O. Ivanov. "INVESTIGATION OF DEGRADATION IN ELECTRODE CONTACTS OF METALLIZED FILM CAPACITORS". St. Petersburg State Polytechnical University Journal 254, n.º 4 (fevereiro de 2017): 69–76. http://dx.doi.org/10.5862/jest.254.8.
Texto completo da fonteLi, Hua, Wenjuan Wang, Zhiwei Li, Haoyuan Li, Bowen Wang, Fuchang Lin e Zhijian Xu. "Polarization characteristics of metallized polypropylene film capacitors at different temperatures". IEEE Transactions on Dielectrics and Electrical Insulation 22, n.º 2 (abril de 2015): 682–88. http://dx.doi.org/10.1109/tdei.2015.7076763.
Texto completo da fonteZhao, Jianyin, e Fang Liu. "Reliability assessment of the metallized film capacitors from degradation data". Microelectronics Reliability 47, n.º 2-3 (fevereiro de 2007): 434–36. http://dx.doi.org/10.1016/j.microrel.2006.05.013.
Texto completo da fonteMcCluskey, F. P., N. M. Li e E. Mengotti. "Eliminating infant mortality in metallized film capacitors by defect detection". Microelectronics Reliability 54, n.º 9-10 (setembro de 2014): 1818–22. http://dx.doi.org/10.1016/j.microrel.2014.07.090.
Texto completo da fonteMakdessi, M., A. Sari e P. Venet. "Metallized polymer film capacitors ageing law based on capacitance degradation". Microelectronics Reliability 54, n.º 9-10 (setembro de 2014): 1823–27. http://dx.doi.org/10.1016/j.microrel.2014.07.103.
Texto completo da fonteValentine, Nathan, Michael H. Azarian e Michael Pecht. "Metallized film capacitors used for EMI filtering: A reliability review". Microelectronics Reliability 92 (janeiro de 2019): 123–35. http://dx.doi.org/10.1016/j.microrel.2018.11.003.
Texto completo da fonteEl-Husseini, M. H., P. Venet, G. Rojat e C. Joubert. "Thermal simulation for geometric optimization of metallized polypropylene film capacitors". IEEE Transactions on Industry Applications 38, n.º 3 (maio de 2002): 713–18. http://dx.doi.org/10.1109/tia.2002.1003421.
Texto completo da fonteLi, Zhiwei, Hua Li, Fuchang Lin, Yaohong Chen, De Liu, Bowen Wang, Qin Zhang e Wei He. "Lifetime Prediction of Metallized Film Capacitors Based on Capacitance Loss". IEEE Transactions on Plasma Science 41, n.º 5 (maio de 2013): 1313–18. http://dx.doi.org/10.1109/tps.2013.2243476.
Texto completo da fonteLi, Zhiwei, Hua Li, Fuchang Lin, De Liu, Bowen Wang, Ling Dai, Haoyuan Li, Qin Zhang e Yaohong Chen. "Lifetime Improvement of Metallized Film Capacitors by Inner Pressure Strengthening". IEEE Transactions on Plasma Science 41, n.º 10 (outubro de 2013): 3063–68. http://dx.doi.org/10.1109/tps.2013.2279140.
Texto completo da fonteLi, Zhiwei, Hua Li, Xiang Huang, Haoyuan Li, Wenjuan Wang, Bowen Wang, Fuchang Lin e Qin Zhang. "Temperature Rise of Metallized Film Capacitors in Repetitive Pulse Applications". IEEE Transactions on Plasma Science 43, n.º 6 (junho de 2015): 2038–45. http://dx.doi.org/10.1109/tps.2015.2429144.
Texto completo da fonteGreenbank, William, e Thomas Ebel. "Layer-by-layer printable nano-scale polypropylene for precise control of nanocomposite capacitor dielectric morphologies in metallised film capacitors". Power Electronic Devices and Components 4 (março de 2023): 100025. http://dx.doi.org/10.1016/j.pedc.2022.100025.
Texto completo da fonteLi Hua, 李化, 李智威 Li Zhiwei, 王国帅 Wang Guoshuai, 林福昌 Lin Fuchang, 刘德 Liu De, 王博闻 Wang Bowen, 李浩原 Li Haoyuan e 张钦 Zhang Qin. "Lifetime prediction of metallized polypropylene film capacitors in pulsed power applications". High Power Laser and Particle Beams 26, n.º 4 (2014): 45016. http://dx.doi.org/10.3788/hplpb20142604.45016.
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