Artigos de revistas sobre o tema "Interface measurements"
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Tomar, Vikas, e Ritesh Sachan. "Interface Strength Measurements". JOM 69, n.º 1 (26 de outubro de 2016): 12. http://dx.doi.org/10.1007/s11837-016-2158-9.
Texto completo da fonteArpaia, Pasquale, Lucio Fiscarelli e Giuseppe Commara. "Advanced User Interface Generation in the Software Framework for Magnetic Measurements at Cern". Metrology and Measurement Systems 17, n.º 1 (1 de janeiro de 2010): 27–37. http://dx.doi.org/10.2478/v10178-010-0003-y.
Texto completo da fonteAlfreider, Markus, Johannes Zechner e Daniel Kiener. "Addressing Fracture Properties of Individual Constituents Within a Cu-WTi-SiOx-Si Multilayer". JOM 72, n.º 12 (10 de novembro de 2020): 4551–58. http://dx.doi.org/10.1007/s11837-020-04444-6.
Texto completo da fonteJosell, D., J. E. Bonevich, I. Shao e R. C. Cammarata. "Measuring the interface stress: Silver/nickel interfaces". Journal of Materials Research 14, n.º 11 (novembro de 1999): 4358–65. http://dx.doi.org/10.1557/jmr.1999.0590.
Texto completo da fonteSchramm, Andreas Tobias, Frauke Kathinka Helene Gellersen e Karsten Kuhlmann. "Uncertainties of S-Parameter Measurements in Rectangular Waveguides at PTB". Advances in Radio Science 22 (8 de novembro de 2024): 35–45. http://dx.doi.org/10.5194/ars-22-35-2024.
Texto completo da fonteKakiuchi, Takashi, e Mitsugi Senda. "Polarizability and nonpolarizability of oil-water interfaces with relevance to a.c. impendance measurements". Collection of Czechoslovak Chemical Communications 56, n.º 1 (1991): 112–29. http://dx.doi.org/10.1135/cccc19910112.
Texto completo da fonteFujita, Yuki, Tadashi Ebihara, Naoto Wakatsuki, Yuka Maeda e Koichi Mizutani. "Acoustic probe for temperature measurement suitable for operation with audio interfaces having random input/output delays". Journal of the Acoustical Society of America 154, n.º 4_supplement (1 de outubro de 2023): A285. http://dx.doi.org/10.1121/10.0023539.
Texto completo da fonteRandall K. Wood e Eddie C. Burt. "Soil-Tire Interface Stress Measurements". Transactions of the ASAE 30, n.º 5 (1987): 1254–58. http://dx.doi.org/10.13031/2013.30554.
Texto completo da fonteFiorenza, Patrick, Filippo Giannazzo e Fabrizio Roccaforte. "Characterization of SiO2/4H-SiC Interfaces in 4H-SiC MOSFETs: A Review". Energies 12, n.º 12 (17 de junho de 2019): 2310. http://dx.doi.org/10.3390/en12122310.
Texto completo da fonteSakhawy, Nagwa R. El, e Tuncer B. Edil. "Behavior of Shaft-Sand Interface from Local Measurements". Transportation Research Record: Journal of the Transportation Research Board 1548, n.º 1 (janeiro de 1996): 74–80. http://dx.doi.org/10.1177/0361198196154800111.
Texto completo da fonteLanders, Alan T., David M. Koshy, Soo Hong Lee, Walter S. Drisdell, Ryan C. Davis, Christopher Hahn, Apurva Mehta e Thomas F. Jaramillo. "A refraction correction for buried interfaces applied to in situ grazing-incidence X-ray diffraction studies on Pd electrodes". Journal of Synchrotron Radiation 28, n.º 3 (15 de março de 2021): 919–23. http://dx.doi.org/10.1107/s1600577521001557.
Texto completo da fonteKalinin, Sergei V., e Dawn A. Bonnell. "Scanning Impedance Microscopy: From Impedance Spectra to Impedance Images". Microscopy Today 10, n.º 1 (fevereiro de 2002): 22–27. http://dx.doi.org/10.1017/s1551929500050471.
Texto completo da fonteWagener, Magnus C., R. H. Zhang, W. Zhao, M. Seacrist, M. Ries e George A. Rozgonyi. "Electrical Uniformity of Direct Silicon Bonded Wafer Interfaces". Solid State Phenomena 131-133 (outubro de 2007): 321–26. http://dx.doi.org/10.4028/www.scientific.net/ssp.131-133.321.
Texto completo da fonteRaciti, David, Brian Tackett, Angela Hight Walker, Gery Stafford e Thomas P. Moffat. "Insights into Electrocatalytic Surface Chemistry Via Operando Spectroscopy, Spectrometry and Stress Measurements". ECS Meeting Abstracts MA2022-02, n.º 56 (9 de outubro de 2022): 2166. http://dx.doi.org/10.1149/ma2022-02562166mtgabs.
Texto completo da fonteHohensee, Gregory T., Mousumi M. Biswas, Ella Pek, Chris Lee, Min Zheng, Yingmin Wang e Chris Dames. "Pump-probe thermoreflectance measurements of critical interfaces for thermal management of HAMR heads". MRS Advances 2, n.º 58-59 (2017): 3627–36. http://dx.doi.org/10.1557/adv.2017.503.
Texto completo da fonteAlexandris, Stelios, Daniel Ashkenazi, Jan Vermant, Dimitris Vlassopoulos e Moshe Gottlieb. "Interfacial shear rheology of glassy polymers at liquid interfaces". Journal of Rheology 67, n.º 5 (21 de agosto de 2023): 1047–60. http://dx.doi.org/10.1122/8.0000685.
Texto completo da fonteDutta, B., e M. K. Surappa. "Studies on age-hardening characteristics of ceramic particle/matrix interfaces in Al–Cu–SiCp composites using ultra low-load-dynamic microhardness measurements". Journal of Materials Research 12, n.º 10 (outubro de 1997): 2773–78. http://dx.doi.org/10.1557/jmr.1997.0369.
Texto completo da fonteYulkifli, Yulkifli, Fitri Afriani, Yohandri Yohandri e Ramli Ramli. "THE DESIGN OF DISPLAY DIGITAL DATA INTERFACE CLAMP-METER COMPLEMENTED BY SENSOR GMR (GIANT MAGNETORESISTANCE)". Spektra: Jurnal Fisika dan Aplikasinya 5, n.º 1 (30 de abril de 2020): 53–60. http://dx.doi.org/10.21009/spektra.051.06.
Texto completo da fonteKuzmych, L. V., D. P. Ornatskyi e V. P. Kvasnikov. "Simulation of the analogue interface for remote measurements". «System analysis and applied information science», n.º 2 (28 de agosto de 2019): 39–47. http://dx.doi.org/10.21122/2309-4923-2019-2-39-47.
Texto completo da fonteParnham, A. "Interface pressure measurements during ambulance journeys". Journal of Wound Care 8, n.º 6 (junho de 1999): 279–82. http://dx.doi.org/10.12968/jowc.1999.8.6.25891.
Texto completo da fonteNakayama, Yasuya. "Non-Stick Length of Polymer–Polymer Interfaces under Small-Amplitude Oscillatory Shear Measurement". Polymers 16, n.º 1 (26 de dezembro de 2023): 77. http://dx.doi.org/10.3390/polym16010077.
Texto completo da fonteHatakeyama, Tetsuo, Kazuto Takao, Yoshiyuki Yonezawa e Hiroshi Yano. "Pragmatic Approach to the Characterization of SiC/SiO2 Interface Traps near the Conduction Band with Split C-V and Hall Measurements". Materials Science Forum 858 (maio de 2016): 477–80. http://dx.doi.org/10.4028/www.scientific.net/msf.858.477.
Texto completo da fonteElfring, Gwynn J., L. Gary Leal e Todd M. Squires. "Surface viscosity and Marangoni stresses at surfactant laden interfaces". Journal of Fluid Mechanics 792 (4 de março de 2016): 712–39. http://dx.doi.org/10.1017/jfm.2016.96.
Texto completo da fonteIvanov, A. V., e S. R. Kopylova. "FEATURES OF THE STUDY OF DETECTION AND MEASUREMENT OF SIDE ELECTROMAGNETIC RADIATION OF BROADBAND SIGNALS ON THE EXAMPLE OF DISPLAYPORT INTERFACE". DYNAMICS OF SYSTEMS, MECHANISMS AND MACHINES 11, n.º 4 (2023): 109–14. http://dx.doi.org/10.25206/2310-9793-2023-11-4-109-114.
Texto completo da fonteHatakeyama, Tetsuo, T. Shimizu, T. Suzuki, Y. Nakabayashi, Hajime Okumura e K. Kimoto. "Deep-Level-Transient Spectroscopy Characterization of Mobility-Limiting Traps in SiO2/SiC Interfaces on C-Face 4H-SiC". Materials Science Forum 740-742 (janeiro de 2013): 477–80. http://dx.doi.org/10.4028/www.scientific.net/msf.740-742.477.
Texto completo da fonteHu, X. Jack, Antonio A. Padilla, Jun Xu, Timothy S. Fisher e Kenneth E. Goodson. "3-Omega Measurements of Vertically Oriented Carbon Nanotubes on Silicon". Journal of Heat Transfer 128, n.º 11 (4 de novembro de 2005): 1109–13. http://dx.doi.org/10.1115/1.2352778.
Texto completo da fonteTang, Dajun, Brian Hefner, Kevin Williams e Eric Thorsos. "Measurements of interface roughness and examination of near bottom interface properties". Journal of the Acoustical Society of America 120, n.º 5 (novembro de 2006): 3144. http://dx.doi.org/10.1121/1.4787786.
Texto completo da fonteVenerus, David C. "A novel and noninvasive approach to study the shear rheology of complex fluid interfaces". Journal of Rheology 67, n.º 4 (27 de junho de 2023): 923–33. http://dx.doi.org/10.1122/8.0000649.
Texto completo da fonteKulhavy, David, I.-Kuai Hung, Daniel Unger e Yanli Zhang. "Student Led Area Measurement Assessments Using Virtual Globes and Pictometry Web-based Interface within an Undergraduate Spatial Science Curriculum". Journal of Education and Culture Studies 3, n.º 1 (25 de fevereiro de 2019): 53. http://dx.doi.org/10.22158/jecs.v3n1p53.
Texto completo da fonteHidalgo-López, José A., Óscar Oballe-Peinado, Julián Castellanos-Ramos e José A. Sánchez-Durán. "Two-Capacitor Direct Interface Circuit for Resistive Sensor Measurements". Sensors 21, n.º 4 (22 de fevereiro de 2021): 1524. http://dx.doi.org/10.3390/s21041524.
Texto completo da fonteCarroll, Gerard Michael, Gabriel M. Veith, Maxwell C. Schulze e Ryan Doeren. "Accelerating Measurement Times by Correlating Electrode/Electrolyte Interface Properties with Cycle and Calendar Lifetimes". ECS Meeting Abstracts MA2024-01, n.º 2 (9 de agosto de 2024): 329. http://dx.doi.org/10.1149/ma2024-012329mtgabs.
Texto completo da fonteSu, Liang Yu. "LabVIEW Applications for Fiber-Optic Remote Test and Fiber Sensor Systems". Applied Mechanics and Materials 610 (agosto de 2014): 216–20. http://dx.doi.org/10.4028/www.scientific.net/amm.610.216.
Texto completo da fonteGustavsson, M., Hideaki Nagai e Takeshi Okutani. "Characterization of Anisotropic and Irregularly-Shaped Materials by High-Sensitive Thermal Conductivity Measurements". Solid State Phenomena 124-126 (junho de 2007): 1641–44. http://dx.doi.org/10.4028/www.scientific.net/ssp.124-126.1641.
Texto completo da fonteMartinez, Alejandro, e Hans Henning Stutz. "Evolution of excess pore water pressure in undrained claystructure interface shear tests". E3S Web of Conferences 544 (2024): 01025. http://dx.doi.org/10.1051/e3sconf/202454401025.
Texto completo da fontePortavoce, Alain, Ivan Blum, Khalid Hoummada, Dominique Mangelinck, Lee Chow e Jean Bernardini. "Original Methods for Diffusion Measurements in Polycrystalline Thin Films". Defect and Diffusion Forum 322 (março de 2012): 129–50. http://dx.doi.org/10.4028/www.scientific.net/ddf.322.129.
Texto completo da fonteHowes, P. B., K. A. Edwards, J. E. Macdonald, T. Hibma, T. Bootsman, M. A. James e C. L. Nicklin. "The Atomic Structure of the Si(111)-Pb Buried Interface Grown on the ${\rm Si}(111)\mbox{-}(\sqrt{3}\times\sqrt{3})\mbox{-}{\rm Pb}$ Reconstruction". Surface Review and Letters 05, n.º 01 (fevereiro de 1998): 163–66. http://dx.doi.org/10.1142/s0218625x98000311.
Texto completo da fonteSATHER, A. P., A. K. W. TONG e D. S. HARBISON. "THE RELATIONSHIP OF LIVE ULTRASONIC PROBES TO CARCASS FAT MEASUREMENTS IN SWINE". Canadian Journal of Animal Science 68, n.º 2 (1 de junho de 1988): 355–58. http://dx.doi.org/10.4141/cjas88-040.
Texto completo da fonteMchedlidze, Teimuraz, Maximilian Drescher, Elke Erben e J. Weber. "Capacitance Transient Spectroscopy Measurements on High-k Metal Gate Field Effect Transistors Fabricated Using 28nm Technology Node". Solid State Phenomena 242 (outubro de 2015): 459–65. http://dx.doi.org/10.4028/www.scientific.net/ssp.242.459.
Texto completo da fonteHatakeyama, Tetsuo, Hirofumi Matsuhata, T. Suzuki, Takashi Shinohe e Hajime Okumura. "Microscopic Examination of SiO2/4H-SiC Interfaces". Materials Science Forum 679-680 (março de 2011): 330–33. http://dx.doi.org/10.4028/www.scientific.net/msf.679-680.330.
Texto completo da fonteLee, Kin Kiong, Gerhard Pensl, Maher Soueidan e Gabriel Ferro. "Electronic Properties of Thermally Oxidized Single-Domain 3C-SiC/6H-SiC Grown by Vapour-Liquid-Solid Mechanism". Materials Science Forum 556-557 (setembro de 2007): 505–8. http://dx.doi.org/10.4028/www.scientific.net/msf.556-557.505.
Texto completo da fonteLabed, V., O. Witschger, M. C. Robe e B. Sanchez. "222Rn Emission Flux and Soil-Atmosphere Interface: Comparative Analysis of Different Measurement Techniques". Radiation Protection Dosimetry 56, n.º 1-4 (1 de dezembro de 1994): 271–73. http://dx.doi.org/10.1093/oxfordjournals.rpd.a082469.
Texto completo da fonteNakanuma, Takato, Yu Iwakata, Arisa Watanabe, Takuji Hosoi, Takuma Kobayashi, Mitsuru Sometani, Mitsuo Okamoto, Akitaka Yoshigoe, Takayoshi Shimura e Heiji Watanabe. "Comprehensive physical and electrical characterizations of NO nitrided SiO2/4H-SiC(112̄0) interfaces". Japanese Journal of Applied Physics 61, SC (2 de março de 2022): SC1065. http://dx.doi.org/10.35848/1347-4065/ac4685.
Texto completo da fonteArmitage, Lucy, Angela Buller, Ginu Rajan, Gangadhara Prusty, Anne Simmons e Lauren Kark. "Clinical utility of pressure feedback to socket design and fabrication". Prosthetics and Orthotics International 44, n.º 1 (26 de novembro de 2019): 18–26. http://dx.doi.org/10.1177/0309364619868364.
Texto completo da fonteYang, Chunyu, Chieh-Tsung Lo, Ashraf F. Bastawros e Balaji Narasimhan. "Measurements of diffusion thickness at polymer interfaces by nanoindentation: A numerically calibrated experimental approach". Journal of Materials Research 24, n.º 3 (março de 2009): 985–92. http://dx.doi.org/10.1557/jmr.2009.0105.
Texto completo da fonteSingh, Ajay, A. K. Gupta, J. M. Keller e P. K. Dubey. "Hardware and Software Interface for Luminescence Measurements". International Journal of Computer Trends and Technology 9, n.º 7 (25 de março de 2014): 361–70. http://dx.doi.org/10.14445/22312803/ijctt-v9p166.
Texto completo da fonteMoritz, W., I. Gerhardt, D. Roden, M. Xu e S. Krause. "Photocurrent measurements for laterally resolved interface characterization". Fresenius' Journal of Analytical Chemistry 367, n.º 4 (7 de junho de 2000): 329–33. http://dx.doi.org/10.1007/s002160000409.
Texto completo da fonteMartelli, Faustino. "Photoluminescence measurements at the Si/SiO2 interface". Surface Science Letters 170, n.º 1-2 (abril de 1986): A259. http://dx.doi.org/10.1016/0167-2584(86)90628-6.
Texto completo da fonteMartelli, Faustino. "Photoluminescence measurements at the Si/SiO2 interface". Surface Science 170, n.º 1-2 (abril de 1986): 676–81. http://dx.doi.org/10.1016/0039-6028(86)91039-3.
Texto completo da fonteFinnie, Allson. "Interface pressure measurements in leg ulcer management". British Journal of Nursing 9, Sup1 (23 de março de 2000): S8—S18. http://dx.doi.org/10.12968/bjon.2000.9.sup1.6353.
Texto completo da fontevan Lent, D. Q., A. A. A. Molenaar, S. J. Picken e M. F. C. van de Ven. "Refractometric Measurements at the Bitumen–Aggregate Interface". Journal of Testing and Evaluation 42, n.º 5 (1 de julho de 2014): 20130250. http://dx.doi.org/10.1520/jte20130250.
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