Artigos de revistas sobre o tema "Grazing incidence X-ray diffraction (GIXD)"
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Takagi, Yasuo, e Masao Kimura. "Generalized grazing-incidence-angle X-ray diffraction (G-GIXD) using image plates". Journal of Synchrotron Radiation 5, n.º 3 (1 de maio de 1998): 488–90. http://dx.doi.org/10.1107/s090904959800123x.
Texto completo da fonteKainz, Manuel Peter, Lukas Legenstein, Valentin Holzer, Sebastian Hofer, Martin Kaltenegger, Roland Resel e Josef Simbrunner. "GIDInd: an automated indexing software for grazing-incidence X-ray diffraction data". Journal of Applied Crystallography 54, n.º 4 (30 de julho de 2021): 1256–67. http://dx.doi.org/10.1107/s1600576721006609.
Texto completo da fonteBreiby, Dag W., Oliver Bunk, Jens W. Andreasen, Henrik T. Lemke e Martin M. Nielsen. "Simulating X-ray diffraction of textured films". Journal of Applied Crystallography 41, n.º 2 (8 de março de 2008): 262–71. http://dx.doi.org/10.1107/s0021889808001064.
Texto completo da fonteKhasanah, Khasanah, Isao Takahashi, Kummetha Raghunatha Reddy e Yukihiro Ozaki. "Crystallization of ultrathin poly(3-hydroxybutyrate) films in blends with small amounts of poly(l-lactic acid): correlation between film thickness and molecular weight of poly(l-lactic acid)". RSC Advances 7, n.º 83 (2017): 52651–60. http://dx.doi.org/10.1039/c7ra10996b.
Texto completo da fonteHafidi, K., M. Azizan, Y. Ijdiyaou e E. L. Ameziane. "Ètude des interfaces SiO2/TiO2 et TiO2/SiO2 dans la structure SiO2/TiO2/SiO2/c-Si préparée par pulvérisation cathodique radio fréquence". Canadian Journal of Physics 85, n.º 7 (1 de julho de 2007): 763–76. http://dx.doi.org/10.1139/p07-053.
Texto completo da fonteIshida, Kenji, Akinori Kita, Kouichi Hayashi, Toshihisa Horiuchi, Shoichi Kal e Kazumi Matsushige. "Energy Dispersive Grazing Incidence X-ray Diffraction Study on Organic Thin Films EpitaxiaHy Grown on Crystalline Substrate". Advances in X-ray Analysis 39 (1995): 659–64. http://dx.doi.org/10.1154/s0376030800023090.
Texto completo da fonteGobato, Ricardo, Marcia Regina Risso Gobato, Alireza Heidari e Abhijit Mitra. "Unrestricted hartree-fock computational simulation in a protonated rhodochrosite crystal". Physics & Astronomy International Journal 3, n.º 6 (6 de novembro de 2019): 220–28. http://dx.doi.org/10.15406/paij.2019.03.00187.
Texto completo da fonteHolzer, Valentin, Benedikt Schrode, Josef Simbrunner, Sebastian Hofer, Luisa Barba, Roland Resel e Oliver Werzer. "Impact of sample misalignment on grazing incidence x-ray diffraction patterns and the resulting unit cell determination". Review of Scientific Instruments 93, n.º 6 (1 de junho de 2022): 063906. http://dx.doi.org/10.1063/5.0088176.
Texto completo da fonteYoshida, Masahiro, Yasunori Kutsuma, Daichi Dohjima, Kenji Ohwada, Toshiya Inami, Noboru Ohtani, Tadaaki Kaneko e Jun'ichiro Mizuki. "Development of the Compact Furnace for the In Situ Observation under Ultra-High Temperature by Synchrotron x-Ray Surface Diffraction". Materials Science Forum 858 (maio de 2016): 505–8. http://dx.doi.org/10.4028/www.scientific.net/msf.858.505.
Texto completo da fonteSilva, Gonçalo M. C., Pedro Morgado, Pedro Lourenço, Michel Goldmann e Eduardo J. M. Filipe. "Spontaneous self-assembly and structure of perfluoroalkylalkane surfactant hemimicelles by molecular dynamics simulations". Proceedings of the National Academy of Sciences 116, n.º 30 (5 de julho de 2019): 14868–73. http://dx.doi.org/10.1073/pnas.1906782116.
Texto completo da fonteYazdanmehr, Amir, e Hamid Jahed. "On the Surface Residual Stress Measurement in Magnesium Alloys Using X-Ray Diffraction". Materials 13, n.º 22 (17 de novembro de 2020): 5190. http://dx.doi.org/10.3390/ma13225190.
Texto completo da fonteCyboroń, Jolanta. "Residual stress analysis after machining in composite materials based on aluminum alloy with ceramic additive". Mechanik 91, n.º 1 (8 de janeiro de 2018): 28–30. http://dx.doi.org/10.17814/mechanik.2018.1.4.
Texto completo da fonteTanigaki, Nobutaka, Chikayo Takechi, Shuichi Nagamatsu, Toshiko Mizokuro e Yuji Yoshida. "Oriented Thin Films of Insoluble Polythiophene Prepared by the Friction Transfer Technique". Polymers 13, n.º 15 (21 de julho de 2021): 2393. http://dx.doi.org/10.3390/polym13152393.
Texto completo da fonteForan, Garry J., Richard F. Garrett, Ian R. Gentle, Dudley C. Creagh, Jian Bang Peng e Geoffrey T. Barnes. "Focusing monochromator and imaging-plate camera for grazing-incidence diffraction studies of thin films". Journal of Synchrotron Radiation 5, n.º 3 (1 de maio de 1998): 500–502. http://dx.doi.org/10.1107/s0909049597017287.
Texto completo da fonteSimbrunner, Josef, Clemens Simbrunner, Benedikt Schrode, Christian Röthel, Natalia Bedoya-Martinez, Ingo Salzmann e Roland Resel. "Indexing of grazing-incidence X-ray diffraction patterns: the case of fibre-textured thin films". Acta Crystallographica Section A Foundations and Advances 74, n.º 4 (1 de julho de 2018): 373–87. http://dx.doi.org/10.1107/s2053273318006629.
Texto completo da fonteTakayama, Toru, e Yoshiro Matsumoto. "Effects of Refraction and Reflection on Analysis of Thin Films by the Grazing-Incidence X-ray Diffraction Method". Advances in X-ray Analysis 33 (1989): 109–20. http://dx.doi.org/10.1154/s0376030800019492.
Texto completo da fonteChang, Chenyuan, Zhenbo Wei, Hui Jiang, Hangjian Ni, Wentao Song, Jialian He, Simeng Xiang, Zhanshan Wang, Zhe Zhang e Zhong Zhang. "Effect of Annealing on Stress, Microstructure, and Interfaces of NiV/B4C Multilayers". Coatings 14, n.º 4 (20 de abril de 2024): 513. http://dx.doi.org/10.3390/coatings14040513.
Texto completo da fonteZhu, X., P. Predecki, M. Eatough e R. Goebner. "Residual Stress Depth Profiling on Ground and on Polished Surfaces of an Al2O3/SiC(w) Composite". Advances in X-ray Analysis 39 (1995): 371–80. http://dx.doi.org/10.1154/s0376030800022783.
Texto completo da fonteSuturin, S. M., V. V. Fedorov, A. M. Korovin, G. A. Valkovskiy, S. G. Konnikov, M. Tabuchi e N. S. Sokolov. "A look inside epitaxial cobalt-on-fluorite nanoparticles with three-dimensional reciprocal space mapping using GIXD, RHEED and GISAXS". Journal of Applied Crystallography 46, n.º 4 (7 de junho de 2013): 874–81. http://dx.doi.org/10.1107/s0021889813008777.
Texto completo da fonteBallard, B. L., P. K. Predecki e D. N. Braski. "Stress-Depth Profiles in Magnetron Sputtered Mo Films Using Grazing Incidence X-Ray Diffraction (GIXD)". Advances in X-ray Analysis 37 (1993): 189–96. http://dx.doi.org/10.1154/s0376030800015688.
Texto completo da fonteGidalevitz, D., R. Feidenhans'l e L. Leiserowitz. "Determination of the crystal growth units by grazing incidence X-ray diffraction (GIXD) and AFM". Acta Crystallographica Section A Foundations of Crystallography 52, a1 (8 de agosto de 1996): C514. http://dx.doi.org/10.1107/s0108767396079019.
Texto completo da fontePredecki, Paul, X. Zhu e B. Ballard. "Proposed Methods for Depth Profiling of Residual Stresses using Grazing Incidence X-Ray Diffraction (GIXD)". Advances in X-ray Analysis 36 (1992): 237–45. http://dx.doi.org/10.1154/s037603080001884x.
Texto completo da fonteCantelli, V., O. Geaymond, O. Ulrich, T. Zhou, N. Blanc e G. Renaud. "TheIn situgrowth of Nanostructures on Surfaces (INS) endstation of the ESRF BM32 beamline: a combined UHV–CVD and MBE reactor forin situX-ray scattering investigations of growing nanoparticles and semiconductor nanowires". Journal of Synchrotron Radiation 22, n.º 3 (9 de abril de 2015): 688–700. http://dx.doi.org/10.1107/s1600577515001605.
Texto completo da fonteZhu, Xiaojing, e Paul Predecki. "Development of a Numerical Procedure for Determining the Depth Profiles of X-Ray Diffraction Data". Advances in X-ray Analysis 37 (1993): 197–203. http://dx.doi.org/10.1154/s037603080001569x.
Texto completo da fonteHafidi, K., M. Azizan, Y. Ijdiyaou e E. L. Ameziane. "Déposition par Pulvé Risation Cathodique Radio Fréquence et Caracté Risation Électronique, Structurale et Optique de Couches Minces du Dioxyde de Titane". Active and Passive Electronic Components 27, n.º 3 (2004): 169–81. http://dx.doi.org/10.1080/08827510310001616885.
Texto completo da fonteMukhopadhyay, Arun Kumar, Avishek Roy, Gourab Bhattacharjee, Sadhan Chandra Das, Abhijit Majumdar, Harm Wulff e Rainer Hippler. "Surface Stoichiometry and Depth Profile of Tix-CuyNz Thin Films Deposited by Magnetron Sputtering". Materials 14, n.º 12 (9 de junho de 2021): 3191. http://dx.doi.org/10.3390/ma14123191.
Texto completo da fonteHąc-Wydro, Katarzyna, Michał Flasiński, Marcin Broniatowski, Patrycja Dynarowicz-Łątka e Jarosław Majewski. "Properties of β-sitostanol/DPPC monolayers studied with Grazing Incidence X-ray Diffraction (GIXD) and Brewster Angle Microscopy". Journal of Colloid and Interface Science 364, n.º 1 (dezembro de 2011): 133–39. http://dx.doi.org/10.1016/j.jcis.2011.08.030.
Texto completo da fonteNikolaev, K. V., I. A. Makhotkin, S. N. Yakunin, R. W. E. van de Kruijs, M. A. Chuev e F. Bijkerk. "Specular reflection intensity modulated by grazing-incidence diffraction in a wide angular range". Acta Crystallographica Section A Foundations and Advances 74, n.º 5 (1 de setembro de 2018): 545–52. http://dx.doi.org/10.1107/s2053273318008963.
Texto completo da fonteNakayama, Yasuo, Masaki Iwashita, Mitsuru Kikuchi, Ryohei Tsuruta, Koki Yoshida, Yuki Gunjo, Yusuke Yabara et al. "Electronic and Crystallographic Examinations of the Homoepitaxially Grown Rubrene Single Crystals". Materials 13, n.º 8 (23 de abril de 2020): 1978. http://dx.doi.org/10.3390/ma13081978.
Texto completo da fonteLandree, E., L. D. Marks e P. Zschack. "Structure of the TiO2(100)-1X3 Surface Determined by Direct Methods". Microscopy and Microanalysis 3, S2 (agosto de 1997): 1045–46. http://dx.doi.org/10.1017/s1431927600012113.
Texto completo da fonteCUI, S. F., Z. H. MAI, C. Y. WANG, L. S. WU, J. T. OUYANG e J. H. LI. "X-RAY ANALYSIS OF Si1−xGex/Si SUPERLATTICES". Modern Physics Letters B 05, n.º 23 (10 de outubro de 1991): 1591–97. http://dx.doi.org/10.1142/s0217984991001891.
Texto completo da fonteRavanbakhsh, Arsalan, Fereshteh Rashchi, M. Heydarzadeh Sohi e Rasoul Khayyam Nekouei. "Synthesis of Nanostructured Zinc Oxide Thin Films by Anodic Oxidation Method". Advanced Materials Research 829 (novembro de 2013): 347–51. http://dx.doi.org/10.4028/www.scientific.net/amr.829.347.
Texto completo da fonteYunin P. A., Nazarov A. A. e Potanina E. A. "Application of the GIXRD Technique to Investigation of Damaged Layers in NaNd(WO_4)-=SUB=-2-=/SUB=- and NaNd(MoO_4)-=SUB=-2-=/SUB=- Ceramics Irradiated with High-Energy Ions". Technical Physics 92, n.º 8 (2022): 956. http://dx.doi.org/10.21883/tp.2022.08.54556.69-22.
Texto completo da fonteGunjo, Yuki, Hajime Kamebuchi, Ryohei Tsuruta, Masaki Iwashita, Kana Takahashi, Riku Takeuchi, Kaname Kanai et al. "Interface Structures and Electronic States of Epitaxial Tetraazanaphthacene on Single-Crystal Pentacene". Materials 14, n.º 5 (26 de fevereiro de 2021): 1088. http://dx.doi.org/10.3390/ma14051088.
Texto completo da fonteMagdans, Uta, Hermann Gies, Xavier Torrelles e Jordi Rius. "Investigation of the {104} surface of calcite under dry and humid atmospheric conditions with grazing incidence X-ray diffraction (GIXRD)". European Journal of Mineralogy 18, n.º 1 (6 de março de 2006): 83–92. http://dx.doi.org/10.1127/0935-1221/2006/0018-0083.
Texto completo da fonteStabenow, Rainer, e Alfried Haase. "New Tools for Grazing Incidence Diffraction Measurements: Comparison of Different Primary and Secondary Beam Conditioners". Advances in X-ray Analysis 39 (1995): 87–94. http://dx.doi.org/10.1154/s0376030800022485.
Texto completo da fonteWang, Po-Wen. "Structural Characterization of Magnetic Recording Media by Using Grazing Incident and Conventional X-Ray Diffraction". Advances in X-ray Analysis 36 (1992): 197–202. http://dx.doi.org/10.1154/s0376030800018796.
Texto completo da fonteBallard, B. L., X. Zhu, P. K. Predecki, D. Albin, A. Gabor, J. Turtle e R. Noufi. "Determination of Composition and Phase Depth-Profiles in Multilayer and Gradient Solid Solution Photovoltaic Films Using Grazing Incidence X-ray Diffraction". Advances in X-ray Analysis 38 (1994): 269–76. http://dx.doi.org/10.1154/s0376030800017882.
Texto completo da fonteTakayama, Shinji. "Measurement of Internal Stresses Exerted in an Each Layer of Multiple Layer's Film with Temperature Using a Grazing Incidence X-Ray Diffraction". ECS Meeting Abstracts MA2022-01, n.º 23 (7 de julho de 2022): 1131. http://dx.doi.org/10.1149/ma2022-01231131mtgabs.
Texto completo da fonteAliouat, Mouaad Yassine, Dmitriy Ksenzov, Stephanie Escoubas, Jörg Ackermann, Dominique Thiaudière, Cristian Mocuta, Mohamed Cherif Benoudia, David Duche, Olivier Thomas e Souren Grigorian. "Direct Observations of the Structural Properties of Semiconducting Polymer: Fullerene Blends under Tensile Stretching". Materials 13, n.º 14 (10 de julho de 2020): 3092. http://dx.doi.org/10.3390/ma13143092.
Texto completo da fonteBallard, B. L., P. K. Predecki, T. R. Watkins, K. J. Kozaczek, D. N. Braski e C. R. Hubbard. "Depth Profiling Biaxial Stresses in Sputter Deposited Molybdenum Films; Use of the Cos2φ Method". Advances in X-ray Analysis 39 (1995): 363–70. http://dx.doi.org/10.1154/s0376030800022771.
Texto completo da fonteEatough, Michael O., e Raymond P. Gochner. "The Effects of Using Long Soller Slits as “Parallel Beam Optics” for Gixrd on Diffraction Data". Advances in X-ray Analysis 37 (1993): 167–73. http://dx.doi.org/10.1154/s0376030800015652.
Texto completo da fonteAchilli, Elisabetta, Filippo Annoni, Nicola Armani, Maddalena Patrini, Marina Cornelli, Leonardo Celada, Melanie Micali, Antonio Terrasi, Paolo Ghigna e Gianluca Timò. "Capabilities of Grazing Incidence X-ray Diffraction in the Investigation of Amorphous Mixed Oxides with Variable Composition". Materials 15, n.º 6 (15 de março de 2022): 2144. http://dx.doi.org/10.3390/ma15062144.
Texto completo da fonteSuturin, S. M., V. V. Fedorov, A. M. Korovin, N. S. Sokolov, A. V. Nashchekin e M. Tabuchi. "Epitaxial Ni nanoparticles on CaF2(001), (110) and (111) surfaces studied by three-dimensional RHEED, GIXD and GISAXS reciprocal-space mapping techniques". Journal of Applied Crystallography 50, n.º 3 (16 de maio de 2017): 830–39. http://dx.doi.org/10.1107/s160057671700512x.
Texto completo da fonteHuang, Wenjie, Meng Sun, Wen Wen, Junfeng Yang, Zhuoming Xie, Rui Liu, Xianping Wang, Xuebang Wu, Qianfeng Fang e Changsong Liu. "Strain Profile in the Subsurface of He-Ion-Irradiated Tungsten Accessed by S-GIXRD". Crystals 12, n.º 5 (12 de maio de 2022): 691. http://dx.doi.org/10.3390/cryst12050691.
Texto completo da fonteVeder, Jean-Pierre, Ayman Nafady, Graeme Clarke, Roland De Marco e Alan M. Bond. "A Combined Voltammetric and Synchrotron Radiation-Grazing Incidence X-ray Diffraction Study of the Electrocrystallization of Zinc Tetracyanoquinodimethane". Australian Journal of Chemistry 65, n.º 3 (2012): 236. http://dx.doi.org/10.1071/ch11361.
Texto completo da fonteWroński, S., K. Wierzbanowski, A. Baczmański, A. Lodini, Ch Braham e W. Seiler. "X-ray grazing incidence technique—corrections in residual stress measurement—a review". Powder Diffraction 24, S1 (junho de 2009): S11—S15. http://dx.doi.org/10.1154/1.3139054.
Texto completo da fonteGrossner, Ulrike, Marco Servidori, Marc Avice, Ola Nilsen, Helmer Fjellvåg, Roberta Nipoti e Bengt Gunnar Svensson. "X-Ray and AFM Analysis of Al2O3 Deposited by ALCVD on n-Type 4H-SiC". Materials Science Forum 556-557 (setembro de 2007): 683–86. http://dx.doi.org/10.4028/www.scientific.net/msf.556-557.683.
Texto completo da fonteNovák, Patrik, Aleksandr Gokhman, Edmund Dobročka, Jozef Bokor e Stanislav Pecko. "Investigation Of Helium Implanted Fe–Cr Alloys By Means Of X–Ray Diffraction And Positron Annihilation Spectroscopy". Journal of Electrical Engineering 66, n.º 6 (1 de novembro de 2015): 334–38. http://dx.doi.org/10.2478/jee-2015-0055.
Texto completo da fonteYi, Jian, Xiao Dong He, Yue Sun, Zhi Peng Xie, Wei Jiang Xue e Fen Yan Cao. "GIAXD and XPS Characterization of sp3C Doped SiC Superhard Nanocomposite Film". Key Engineering Materials 512-515 (junho de 2012): 971–74. http://dx.doi.org/10.4028/www.scientific.net/kem.512-515.971.
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