Artigos de revistas sobre o tema "Electron probe microanalysis EPMA"
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Willich, Peter, e Kirsten Schiffmann. "Electron probe microanalysis of borophosphosilicate coatings". Proceedings, annual meeting, Electron Microscopy Society of America 48, n.º 2 (12 de agosto de 1990): 226–27. http://dx.doi.org/10.1017/s0424820100134739.
Texto completo da fonteLakis, Rollin E., Charles E. Lyman e Joseph I. Goldstein. "Electron-probe microanalysis of porous materials". Proceedings, annual meeting, Electron Microscopy Society of America 50, n.º 2 (agosto de 1992): 1660–61. http://dx.doi.org/10.1017/s0424820100132935.
Texto completo da fonteMerlet, C., X. Llovet, S. Segui, J. M. Fernández-Varea e F. Salvat. "Ionization Cross Sections for Quantitative Electron Probe Microanalysis". Microscopy and Microanalysis 7, S2 (agosto de 2001): 672–73. http://dx.doi.org/10.1017/s1431927600029433.
Texto completo da fonteGoresh, S. "Industrial Applications of Electron Probe Microanalysis (EPMA)". Microscopy and Microanalysis 17, S2 (julho de 2011): 616–17. http://dx.doi.org/10.1017/s1431927611003953.
Texto completo da fonteSomlyo, A. P., e Avril V. Somlyo. "Electron Probe Analysis and Cell Physiology". Proceedings, annual meeting, Electron Microscopy Society of America 43 (agosto de 1985): 2–5. http://dx.doi.org/10.1017/s0424820100117169.
Texto completo da fonteMatthews, Mike B., Ben Buse e Stuart L. Kearns. "Electron Probe Microanalysis Through Coated Oxidized Surfaces". Microscopy and Microanalysis 25, n.º 05 (16 de julho de 2019): 1112–29. http://dx.doi.org/10.1017/s1431927619014715.
Texto completo da fonteRo, Chul-Un. "Quantitative energy-dispersive electron probe X-ray microanalysis of individual particles". Powder Diffraction 21, n.º 2 (junho de 2006): 140–44. http://dx.doi.org/10.1154/1.2204068.
Texto completo da fonteSomlyo, Avril V., e Andrew P. Somlyo. "Electron probe x-ray microanalysis of subcellular ion transport in situ". Proceedings, annual meeting, Electron Microscopy Society of America 50, n.º 1 (agosto de 1992): 16–17. http://dx.doi.org/10.1017/s0424820100120485.
Texto completo da fonteTakahashi, Hideyuki, Toshiaki Suzuki e Charles Nielsen. "Application Ofthinfilm Method to Electronic Probe Microanalysis (EPMA)". Microscopy and Microanalysis 7, S2 (agosto de 2001): 686–87. http://dx.doi.org/10.1017/s1431927600029500.
Texto completo da fonteRobertson, Vernon. "What Are the Advantages of a FE-EPMA or FE-SEM (Even When Not Analyzing Submicron Features at Low kV and High Beam Current)?" Microscopy Today 31, n.º 6 (novembro de 2023): 10–16. http://dx.doi.org/10.1093/mictod/qaad080.
Texto completo da fonteTan, Shuhui, Rencheng Li, Richard S. Vachula, Xinyue Tao, Mengdan Wen, Yizhi Liu, Haiyan Dong e Lintong Zhou. "Electron probe microanalysis of the elemental composition of phytoliths from woody bamboo species". PLOS ONE 17, n.º 7 (5 de julho de 2022): e0270842. http://dx.doi.org/10.1371/journal.pone.0270842.
Texto completo da fonteRinaldi, Romano, e Xavier Llovet. "Electron Probe Microanalysis: A Review of the Past, Present, and Future". Microscopy and Microanalysis 21, n.º 5 (12 de maio de 2015): 1053–69. http://dx.doi.org/10.1017/s1431927615000409.
Texto completo da fonteSalvat, F., L. Sorbier, X. Llovet e E. Acosta. "X-Ray Microanalysis with Penelope". Microscopy and Microanalysis 7, S2 (agosto de 2001): 688–89. http://dx.doi.org/10.1017/s1431927600029512.
Texto completo da fonteRehbach, Werner P., e Peter Karduck. "Quantitative electron probe microanalysis of high-Tc superconducting materials". Proceedings, annual meeting, Electron Microscopy Society of America 50, n.º 2 (agosto de 1992): 1768–69. http://dx.doi.org/10.1017/s0424820100133473.
Texto completo da fonteClaus, Tamme, Jonas Bünger e Manuel Torrilhon. "A Novel Reconstruction Method to Increase Spatial Resolution in Electron Probe Microanalysis". Mathematical and Computational Applications 26, n.º 3 (14 de julho de 2021): 51. http://dx.doi.org/10.3390/mca26030051.
Texto completo da fonteMcGee, James J. "Progress in Electron-Probe Microanalysis of Boron in Geologic Samples". Proceedings, annual meeting, Electron Microscopy Society of America 54 (11 de agosto de 1996): 696–97. http://dx.doi.org/10.1017/s042482010016594x.
Texto completo da fonteSomlyo, Andrew P. "The Impact of Biological Microanalysis on Analytical Electron Microscopy". Microscopy and Microanalysis 4, S2 (julho de 1998): 170–71. http://dx.doi.org/10.1017/s1431927600020973.
Texto completo da fonteTsuji, K., Y. Murakami, K. Wagatsuma e G. Love. "Surface studies by grazing-exit electron probe microanalysis (GE-EPMA)". X-Ray Spectrometry 30, n.º 2 (2001): 123–26. http://dx.doi.org/10.1002/xrs.480.
Texto completo da fonteKarduck, Peter, e Norbert Ammann. "ϕ(ρz)-Determination for Advanced Applications of Electron Probe Microanalysis". Proceedings, annual meeting, Electron Microscopy Society of America 48, n.º 2 (12 de agosto de 1990): 14–15. http://dx.doi.org/10.1017/s0424820100133667.
Texto completo da fonteLakis, R. E., E. P. Vicenzi e F. M. Allen. "Electron probe microanalysis of alumina-supported platinum catalysts". Proceedings, annual meeting, Electron Microscopy Society of America 54 (11 de agosto de 1996): 512–13. http://dx.doi.org/10.1017/s0424820100165021.
Texto completo da fonteLamontagne, Jérôme, Thierry Blay e Ingrid Roure. "Microbeam Analysis of Irradiated Materials: Practical Aspects". Microscopy and Microanalysis 13, n.º 3 (9 de maio de 2007): 150–55. http://dx.doi.org/10.1017/s143192760707033x.
Texto completo da fonteGoldstein, J. I. "Scanning Electron Microscopy And Electron Probe Microanalysis Of Extraterrestrial Materials". Microscopy and Microanalysis 5, S2 (agosto de 1999): 2–3. http://dx.doi.org/10.1017/s1431927600013337.
Texto completo da fonteMerlet, C., X. Llovet e F. Salvat. "Measurement And Simulation Of X-Ray Emission From Multilayered Structures In Electron Probe Microanalysis." Microscopy and Microanalysis 5, S2 (agosto de 1999): 78–79. http://dx.doi.org/10.1017/s1431927600013714.
Texto completo da fonteConty, Claude. "Today’s and Tomorrow’s Instruments". Microscopy and Microanalysis 7, n.º 2 (março de 2001): 142–49. http://dx.doi.org/10.1007/s100050010077.
Texto completo da fonteKubo, Yugo, e Koji Kuramochi. "Observation of Fine Distribution of Minor Dopants in an Erbium-Doped Fiber Core using a Sample Thinning Technique for Field Emission Electron Probe Microanalysis". Microscopy and Microanalysis 21, n.º 6 (17 de novembro de 2015): 1398–405. http://dx.doi.org/10.1017/s1431927615015445.
Texto completo da fonteBuse, Ben, e Stuart Kearns. "Quantification of Olivine Using Fe Lα in Electron Probe Microanalysis (EPMA)". Microscopy and Microanalysis 24, n.º 1 (fevereiro de 2018): 1–7. http://dx.doi.org/10.1017/s1431927618000041.
Texto completo da fonteGrover, V., P. Sengupta, K. Bhanumurthy e A. K. Tyagi. "Electron probe microanalysis (EPMA) investigations in the CeO2–ThO2–ZrO2 system". Journal of Nuclear Materials 350, n.º 2 (abril de 2006): 169–72. http://dx.doi.org/10.1016/j.jnucmat.2006.01.001.
Texto completo da fonteHarries, Dennis. "Homogeneity testing of microanalytical reference materials by electron probe microanalysis (EPMA)". Geochemistry 74, n.º 3 (outubro de 2014): 375–84. http://dx.doi.org/10.1016/j.chemer.2014.01.001.
Texto completo da fonteWilliams, D. B. "The Impact of EDS In Materials Science Microanalysis". Microscopy and Microanalysis 4, S2 (julho de 1998): 168–69. http://dx.doi.org/10.1017/s1431927600020961.
Texto completo da fonteWalters, Jesse B. "MinPlot: A mineral formula recalculation and plotting program for electron probe microanalysis". Mineralogia 53, n.º 1 (1 de janeiro de 2022): 51–66. http://dx.doi.org/10.2478/mipo-2022-0005.
Texto completo da fonteCheng, Lining, Chao Zhang, Xiaoyan Li, Renat R. Almeev, Xiaosong Yang e Francois Holtz. "Improvement of Electron Probe Microanalysis of Boron Concentration in Silicate Glasses". Microscopy and Microanalysis 25, n.º 4 (18 de junho de 2019): 874–82. http://dx.doi.org/10.1017/s1431927619014612.
Texto completo da fonteBünger, Jonas, Silvia Richter e Manuel Torrilhon. "A Model for Characteristic X-Ray Emission in Electron Probe Microanalysis Based on the (Filtered) Spherical Harmonic () Method for Electron Transport". Microscopy and Microanalysis 28, n.º 2 (abril de 2022): 454–68. http://dx.doi.org/10.1017/s1431927622000083.
Texto completo da fonteNgo, H., J. Ruben, J. Arends, D. White, G. J. Mount, M. C. R. B. Peters, R. V. Faller e A. Pfarrer. "Electron Probe Microanalysis and Transverse Microradiography Studies of Artificial Lesions in Enamel and Dentin: A Comparative Study". Advances in Dental Research 11, n.º 4 (novembro de 1997): 426–32. http://dx.doi.org/10.1177/08959374970110040801.
Texto completo da fonteCochrane, Nathan J., Youichi Iijima, Peiyan Shen, Yi Yuan, Glenn D. Walker, Coralie Reynolds, Colin M. MacRae, Nicholas C. Wilson, Geoffrey G. Adams e Eric C. Reynolds. "Comparative Study of the Measurement of Enamel Demineralization and Remineralization Using Transverse Microradiography and Electron Probe Microanalysis". Microscopy and Microanalysis 20, n.º 3 (24 de abril de 2014): 937–45. http://dx.doi.org/10.1017/s1431927614000622.
Texto completo da fonteSchomisch Moravec, Christine, e Meredith Bond. "Subcellular Calcium (Ca2+) Redistribution During Cardiac Muscle Contraction by Electron Probe Microanalysis (EPMA)". Proceedings, annual meeting, Electron Microscopy Society of America 48, n.º 2 (12 de agosto de 1990): 136–37. http://dx.doi.org/10.1017/s0424820100134272.
Texto completo da fonteNihtianova, D. D., I. T. Ivanov, J. J. Macicek e I. K. Georgieva. "Crystallographic data for BaMnSiO4: A new phase in the system BaO-MnO-SiO2". Powder Diffraction 12, n.º 3 (setembro de 1997): 167–70. http://dx.doi.org/10.1017/s0885715600009659.
Texto completo da fonteChong, Saehwa, Jared O. Kroll, Jarrod V. Crum e Brian J. Riley. "Synthesis and crystal structure of a neodymium borosilicate, Nd3BSi2O10". Acta Crystallographica Section E Crystallographic Communications 75, n.º 5 (25 de abril de 2019): 700–702. http://dx.doi.org/10.1107/s2056989019005024.
Texto completo da fonteSchulz, Bernhard, Joachim Krause e Wolfgang Dörr. "A Protocol for Electron Probe Microanalysis (EPMA) of Monazite for Chemical Th-U-Pb Age Dating". Minerals 14, n.º 8 (12 de agosto de 2024): 817. http://dx.doi.org/10.3390/min14080817.
Texto completo da fonteNachlas, William, Suzanne Baldwin, Jay Thomas e Michael Ackerson. "Investigation of N in Ammonium-bearing Silicates with Electron Probe Microanalysis (EPMA)". Microscopy and Microanalysis 26, S2 (30 de julho de 2020): 42–43. http://dx.doi.org/10.1017/s1431927620013203.
Texto completo da fonteTsuji, Kouichi. "Grazing-exit electron probe X-ray microanalysis (GE-EPMA): Fundamental and applications". Spectrochimica Acta Part B: Atomic Spectroscopy 60, n.º 11 (novembro de 2005): 1381–91. http://dx.doi.org/10.1016/j.sab.2005.08.013.
Texto completo da fonteDuque, Laura, Fernanda Guimarães, Helena Ribeiro, Raquel Sousa e Ilda Abreu. "Elemental characterization of the airborne pollen surface using Electron Probe Microanalysis (EPMA)". Atmospheric Environment 75 (agosto de 2013): 296–302. http://dx.doi.org/10.1016/j.atmosenv.2013.04.040.
Texto completo da fonteTormey, J. McD, e E. S. Wheeler-Clark. "Electron Probe X-Ray Microanalysis of Cardiac Muscle: Progress Report". Proceedings, annual meeting, Electron Microscopy Society of America 43 (agosto de 1985): 18–21. http://dx.doi.org/10.1017/s0424820100117200.
Texto completo da fonteCazaux, Jacques. "About the Mechanisms of Charging in EPMA, SEM, and ESEM with Their Time Evolution". Microscopy and Microanalysis 10, n.º 6 (dezembro de 2004): 670–84. http://dx.doi.org/10.1017/s1431927604040619.
Texto completo da fonteRemond, G., R. H. Packwood, C. Gilles e S. Chryssoulis. "Layered and ion implantation specimens as possible reference materials for the electron-probe microanalysis". Proceedings, annual meeting, Electron Microscopy Society of America 50, n.º 2 (agosto de 1992): 1652–53. http://dx.doi.org/10.1017/s0424820100132893.
Texto completo da fonteChia, V. K. F., R. J. Bleiler, C. L. Anderson e R. W. Odom. "Quantitative Trace Element Analysis of Micro-Samples by SIMS". Proceedings, annual meeting, Electron Microscopy Society of America 48, n.º 2 (12 de agosto de 1990): 360–61. http://dx.doi.org/10.1017/s042482010013540x.
Texto completo da fonteKeil, K., R. Fitzgerald e KFJ Heinrich. "Celebrating 40 years of energy dispersive X-ray spectrometry in electron probe microanalysis (EPMA)". Microscopy and Microanalysis 14, S2 (agosto de 2008): 1152–53. http://dx.doi.org/10.1017/s1431927608081221.
Texto completo da fonteCarpenter, PK. "Electron-Probe Microanalysis (EPMA): An Overview for Beginners and a Status Report for Experts". Microscopy and Microanalysis 14, S2 (agosto de 2008): 1150–51. http://dx.doi.org/10.1017/s1431927608088806.
Texto completo da fonteSong, Jian Li, Qi Lin Deng, C. Y. Chen e De Jin Hu. "Experimental Study on the Laser Direct Fabrication of Stainless Steel Components". Key Engineering Materials 315-316 (julho de 2006): 239–43. http://dx.doi.org/10.4028/www.scientific.net/kem.315-316.239.
Texto completo da fonteSomlyo, A. P. "Where Art Thou, Calcium?" Microscopy and Microanalysis 3, S2 (agosto de 1997): 913–14. http://dx.doi.org/10.1017/s1431927600011454.
Texto completo da fonteVykhodets, V. B., Tatiana Eugenievna Kurennykh e N. U. Tarenkova. "Study of Distribution of Impurity Atoms in Metallurgical Macrodefects". Defect and Diffusion Forum 273-276 (fevereiro de 2008): 707–12. http://dx.doi.org/10.4028/www.scientific.net/ddf.273-276.707.
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